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ARTICLE 4
2013 SECTION V
MANDATORY APPENDIX V
PHASED ARRAY E-SCAN AND S-SCAN LINEAR SCANNING
EXAMINATION TECHNIQUES
V-410
SCOPE
V-420
GENERAL
Table V-421
Requirements of a Phased Array Linear
Scanning Examination Procedure Using
Linear Arrays
V-422
SCAN PLAN
V-467
ENCODER CALIBRATION
Essential
Variable
Nonessential
Variable
...
...
...
X
X
...
...
...
X
X
X
...
...
...
X
X
...
...
...
NOTE:
(1) Effective height is the distance measured from the outside edge of
the first to last element used in the focal law.
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ARTICLE 4
(a) 0.04 in. (1 mm) for material < 3 in. (75 mm) thick
(b) 0.08 in. (2 mm) for material 3 in. (75 mm) thick
(b) The examination angle(s) for E-scan and range of angles for S-scan shall be appropriate for the joint to be
examined.
(c) Scanning speed shall be such that data drop-out is
less than 2 data lines per inch (25 mm) of the linear scan
length and that there are no adjacent data line skips.
(d) For E-scan techniques, overlap between adjacent active apertures (i.e., aperture incremental change) shall be
a minimum of 50% of the effective aperture height.
(e) For S-scan techniques, the angular sweep incremental change shall be a maximum of 1 deg or sufficient to assure 50% beam overlap.
(f) When multiple linear scans are required to cover the
required volume of weld and base material, overlap between adjacent linear scans shall be a minimum of 10%
of the effective aperture height for E-scans or beam width
for S-scans.
V-492
EXAMINATION RECORD
77
2013 SECTION V