The de-facto standard for nano- and microscale

image processing and 3D visualization

Download free copy now at:

www.imagemet.com

Image Metrology
Image Metrology was founded in 1998. Today, we are
a world wide leading supplier of software for nanoand microscale image processing. Our mission is to
provide our customers with state-of-the-art image
processing software for microscopy, including:
Correction tools for creating the most accurate
presentation of the true surface
Automated analysis techniques ensuring high accuracy, quality and cost efciency
Visualization and reporting tools enabling convincing and impressive communication of results

Jan F. Jrgensen, PhD. CEO and founder of Image Metrology.

We are a highly innovative company constantly developing new solutions meeting the demands from our
customers. We supply our products directly to end
users and through our global distribution network.
Over the years, the Scanning Probe Image Processor,
SPIP, has become the de-facto standard for image
processing at nanoscale. SPIP was rst released in
1995. However, the founder of Image Metrology, Dr.
Jan F. Jrgensen, started developing the software 5
years earlier as part of his industrial PhD project in
cooperation with IBM Denmark, the Danish Institute
of Fundamental Metrology, and the Technical University of Denmark.

Image Metrology A/S

Lyngs All 3A
2970 Hrsholm
Denmark
www.imagemet.com
info@imagemet.com
Phone: +45 469 234 00
Fax: +45 469 234 01

The Scanning Probe Image

P r o c e s s o r, S P I P
Leading research institutes and high-tech companies
in more than 42 countries use SPIP for image processing applications within semiconductor inspection,
physics, material science, chemistry, biology, metrology, and nano technology.
SPIP supports a variety of microscope types and
their le formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning
Electron Microscopes (SEM), confocal microscopes,
optical microscopes, and prolers. Whether you are
an expert user or new to the eld of image processing, SPIP lets you produce the results you need with
just a few mouse clicks.
SPIP is a modular software package offered as a basic module and 13 optional add-on modules. The Basic
Module includes essential features such as le reading, proling, and plane correction. The add-on modules are dedicated to specic purposes within calibration, noise reduction, analysis, and 3D visualization.
On the following pages you will nd a description of
each module and learn how you can improve the efciency and quality of your work.

Scanning Probe Microscopes

(SPM)
Scanning Electron Microscopes
(SEM)
Transmission Electron
Microscopes (TEM)
Interferometers
Confocal Microscopes
Prolers

S P I P m o d u l e s
Get Started
- Basic, 6
Calibrate and Characterize
- Calibration, 10
- Tip Characterization, 12
Reduce Noise and Enhance Features
- Correlation Averaging, 14
- Filter, 16
- Extended Fourier Analysis, 18
Measure and Analyze
- Grain Analysis, 20
- Roughness & Hardness Analysis, 22
- Force Curve Analysis, 24
- CITS Continuous Imaging Tunneling Spectroscopy, 26
Visualize
- 3D Visualization Studio, 28
- Movie & Time Series Analysis, 30
Gain Productivity
- Batch Processor & Active Reporter, 32
Organize
- ImageMet Explorer, 34
Customize
- Plug-in Interface, 36

W hat our customers say

I am pleased with the SPIP
package, especially, with the
fact that SPIP not only reads and
processes images from commercial
atomic force microscopes, but also
reads and processes images from
common white light interference
microscopes. This dramatically
increases the exibility and wide
scale usage of SPIP.
Louis Hector, Jr., Dr. , General Motors R&D

I think SPIP is very user friendly

and versalite software. Ive used
other commercial softwares also,
but the options available in SPIP are
simply immense.

I rely heavily on SPIP and

appreciate the support that I and
my students have received from
Image Metrology. The availablility
of the SPIP software has played
a crucial role in enabling me to
extract the kind of quantitative
information that I really want out
of my AFM images.
Harry J. Ploehn, Prof. , University of South Carolina,
Department of Chemical Engineering

Great software - very powerful

and versatile.
Kevin Robbie, Assistant Prof. and Canada Research
Chair in Nanostructured Materials, Queens University

Loveleen Kaur Brar, Indian Institute of Science

SPIP is a good software and it is

easy to work with it.
Bernard Desbat, Directeur de Recherche, Centre
National de la Recherche Scientique (CNRS)

SPIP is the standard program for

processing and presenting AFM
data in our lab since 4 years. We
appreciate that SPIP is frequently
updated and that our suggestions
and requirements were integrated
in SPIP.
Hermann Schillers, Dr. , Westflische WilhelmsUniversitt Mnster, Institute of Physiology II

S P I P m o d u l e s
Basic
The Basic Module covers features that are essential
to most professionals working with microscopy. The
Basic Module is the backbone of SPIP, and it is therefore required for any conguration of the software.

File Reading
With the Basic Module you can open all the le formats supported by SPIP. The le formats are listed
on page 38.
You can even open les that are not directly supported by SPIP. The Heuristic File Importer guesses
the le structure and allows you to provide additional
information about the format. This way, you will be
able to read almost any image le.

Data courtesy of Interdisciplinary Nanoscience Center (iNANO)

and Institute of Physics and Astronomy, University of Aarhus.
Data also used for cover page.

Image Processing
The Basic Module includes a wide range of image processing features. The following list shows some of the
most important features:

Plane Correction (Flattening)

Cross-section Prole Analysis
Histogram Analysis
Fourier Transform
Auto Correlation
Cross Correlation
Gradient Images
Image Arithmetic
Color Manipulation
Contrast Enhancement
Zoom
Mirror and Rotation
Copy, Print, and Save
Area of Interest (AOI)
XY Scaling Tool
Customizable User Interface
Sniffer for Opening New Files Automatically

The Color Scale Editor allows you to easily dene your own
surface colors which will be used in both images and histograms.

Basic
Plane correction (attening)

Proling
With the proling tools you can perform detailed
measurements interactively using multiple cursors.
The Curve Fitting tools enable you to t a curve to
your prole and subtract it automatically. Furthermore, you can perform 1D Fourier analysis and interactively t cone angle and radius of curvature on your
proles.
Using the Average Prole tool you can average any
number of scan lines in your prole.
The Multi-proling facilities enables detailed comparison of images by monitoring proles at the exact
same positions while moving the cross section line.

Cross-section prole analysis

Histogram analysis
Fourier transform
Auto and cross correlation
Image arithmetic
Color manipulation
Zoom, mirror, rotate, copy,
print, and save functions
Sniffer for opening new les
automatically

Cone angle tting and prole measurements by dimension

readout.

Display and t multiple proles in one window.

Fourier transform and wavelength detection of prole.

Fitting of multiple proles and calculation of Mean prole.

S P I P m o d u l e s
Plane Correction (Flattening)
Plane correction or attening is one of the most important aspects of SPM image analysis, in particular,
when performing Z-calibration and Roughness Analysis.
This is due to the fact that several distortion phenomenons can be of the same or even higher magnitude
than the surface corrugations.
SPIP includes a set of powerful plane correction
tools that allow automated correction of plane distortions by polynomial functions and elimination of
z-offset errors for single scan lines.
The example on these pages demonstrates the plane
correction effect on a distorted image.
In the upper left image, there is signicant bow and
z-offset errors which are reected in the prole. The
histogram indicates the two levels, but they cannot
be estimated accurately.
In the corrected image on the right, the histogram
peaks are sharp and it is easy to determine the step
height precisely.
You can perform the plane correction by a single
mouse click, and it is fully supported by the Batch
Processor & Active Reporter.

Before

Basic
After

S P I P m o d u l e s
Calibration
Calibration can be a complicated affaire. By use of
the Calibration Module and calibration samples it is
done easily.
In addition, the Calibration Module enables you to
perform measurements with sub-pixel accuracy.

Vertical Calibration
Step heights can be measured very accurately and a
proper correction factor for the Z-dimension is calculated. The measurements can be based on automated
histogram analysis or the ISO 5436 standard method.

Critical Dimensions

Z-Measurement and Calibration by an ISO 5436 Based Algorithm

The philosophy behind the ISO 5436 standard is to measure
the average heights at plateaus with some distance from the
edges and thereby achieve robust results not inuenced by the
edges. For line and groove structures the active measurement
areas are indicated as A, B, and C. These areas are found and
measured automatically by SPIP.

In addition to delivering a robust step height measurement the ISO 5436 method can also deliver Critical Dimensions such as line width and side wall angles.

Lateral Calibration
The lateral calibration is done in three easy steps:
Acquire an image by your instrument
Load the image le into SPIP
Enter the reference values

Critical Dimensions
The upper and lower width are calculated together with the
sidewall slopes measured in degrees.

and with a few mouse clicks you will have the most
accurate calculations of a comprehensive set of correction parameters, including scaling factors, the X-Y
coupling factor, and linearity parameters described
by third order polynomials.
Advanced sub-pixel Fourier and correlation algorithms ensure the highest accuracy.
You can apply the parameters for off-line correction
or transfer them to your instrument for on-line correction.

10

Analysis of Entire Image

Height measurements for all horizontal cross-sections of an
image as shown can be performed automatically. This will
generate a mean step height value with a low uncertainty.

C alib r atio n
Vertical calibration
Lateral calibration
Off-line or on-line correction
Automatic measurement of critical
dimensions including step height,
width, and side wall angle
Advanced sub-pixel Fourier and
correlation algorithms ensure the
highest accuracy
Linearity Distortion
The image shows a wafe calibration structure with the best
tting lattice grid super imposed. A careful inspection reveals
that the grid does not t perfectly due to linearity distortion
of the scanner. The red arrows are error vectors pointing in
the direction of the lateral distortion and their sizes indicate
the relative magnitude of the errors.

Distortion in X and Y

Distortion after Correction

The graphs show how the error relates to the position in the
image. The upper graph shows how the distortion in the x-direction relates to the x-position while the lower graph shows
the distortion for the y-direction. It is seen that the errors are
within a few pixels, but that there is a systematic behavior
which can be modeled well by third order polynomials.

These graphs show the distortion after correction on the same

scale as before. There is a signicant improvement, and all
errors are now in the sub-pixel range

11

S P I P m o d u l e s
Tip Characterization
The Tip Characterization Module allows you to characterize the tip or stylus used for scanning and to
compensate for tip shape artifacts by Tip Deconvolution.
The tip is the most critical part of scanning probe instruments, and knowledge about its form is essential
for any evaluation of a surface image.
The full geometry of the tip is calculated with a few
mouse clicks. The tip radius and cone angle are extracted automatically.
When combined with the 3D Visualization Studio,
the calculated tip can be shown in 3D view in 1:1:1
aspect ratio to give a correct impression of the tip
geometry.

Calculate the full geometry of

the tip, including tip radius and
cone angle
Compensate for tip shape
artifacts by Tip Deconvolution
Algorithm based on a Blind Tip
Reconstruction method
Works on most images of
surfaces containing slopes
steeper than the tip
No precise knowledge of the
surface required

The tip characterization algorithm is based on a

Blind Tip Reconstruction method. Therefore, no
precise knowledge of the surface is required. The algorithm works on most images of surfaces containing
slopes steeper than the tip.
The example on the right page shows a successful calculation of the tip used for scanning and reduction of
the tip artifact by Tip Deconvolution.
The tip characterization algorithm has been veried
by SEM images as seen in the example images on this
page.

SEM image of an AFM Si3N4 tip used for scanning a TGT01 silicon based tip characterizer from
Mikromasch.

SEM data courtesy of the Danish Institute of Fundamental Metrology.

Tip calculated by SPIP. Note that the shape is in

good agreement with the SEM image.

12

Tip Character ization

The original image shown in 3D. The structure is a TGT01 silicon based tip characterizer from Mikromasch. Note the double
tip created artifact.

Calculated tip. The tip is shown in 1:1:1 aspect ratio to provide

the correct geometrical understanding. Note the double tip.

The reconstructed surface. Note that the double tip artifact

has been removed.

X-prole of the tip. The tip is shown in 1:1 aspect ratio to get
the correct impression of the geometry. The estimated cone
angle and tip radius are shown.

The illustrations on the right describe the imaging

process, and how the tip shape will inuence the resulting image. Note how the scanning of steep slopes
reveal parts of the tip shape.

13

S P I P m o d u l e s
Correlation Averaging
The Correlation Averaging Module allows you to enhance weak structures in repeated patterns, such
as atomic crystals, self assembled molecules, and
etched patterns.
When measuring on the nanometer scale the signalto-noise ratio is often very small. Traditional lters
cannot remove random noise without removing parts
of the real surface structure.

Enhance weak structures in

repeated patterns
Reduce non-correlated
noise and enhance repeated
structures at the same time

However, by the advanced Correlation Averaging

technique it is possible to reduce non-correlated
noise and enhance repeated structures at the same
time.
In the example shown on these pages, a self-assembled Didodecyl-benzene molecules from an STM
image have been averaged.
The Average Image exhibits ner details of the inner
molecular structure.
The Standard Deviation image has the lowest values
on the right side of the benzene ring reecting the
least dynamic part of the molecule and revealing how
it is attached to the graphite substrate.
The technique can be performed by a single mouse
click, and it can be advantageous to combine it with
different types of measurements, for example stepheight and uniformity evaluations.

STM image of self-assembled Didodecyl-benzene molecules.

Model of the Didodecyl-benzene molecule.

14

Co r rel atio n Ave r ag in g

Raw zoom.

Average image.

Standard deviation image.

15

S P I P m o d u l e s
Filter
The Filter Module provides a comprehensive set of
tools for designing dedicated spatial lters. Use the
lters to eliminate noise and get robust measurements and correct representations of your images.
Examples of supported lter types:

Low-Pass (smoothing)
High-Pass
Sharpening
Laplacian of Gaussian
ISO 11562 Gaussian
ISO 13565 Filtering of Deep Valleys
Median
Statistical Difference
Edge Enhancement (Roberts, Prewitt, Sobel)
Unsharp Masking
Outlier Filter

Large set of tools for designing

dedicated spatial lters
Eliminate noise and get robust
measurements and nice
presentations of your images
Easy customization of lters
Monitor the ltered result while
changing the lter parameters
in almost real-time
Waviness ltering

Filters can be customized easily by a few mouse

clicks.
While modifying the lter parameters you can monitor the ltered result in almost real-time, and it is
optional to view the difference image and the lter
kernel in 3D simultaneously.

Outlier Filtering
Before

After
The image on the left contains a ber structure suffering from contamination particles.
On the right side, an interpolation method
has been applied to change the values of the
contamination pixels, and it is seen that the
particles have been successfully removed
with very little or no damage to the surrounding data.

16

Filte r
Filtering Directional Noise
Before

After

The image contains horizontal scanning artifacts observed as white stripes.

The median lter has successfully removed the

line artifacts.

The difference image between the original and

the lter result documents which parts of the
image have changed. It is seen that main difference is the horizontal line artifacts.

Waviness Filtering for Roughness Analysis

Raw Image

Waviness

Roughness

The example shows how an image can be separated into Waviness and Roughness images by
use of a large Gaussian Filter kernel. This is
often desirable when measuring roughness in
a specic wavelength interval.

The smoothening effect of the large lter creates the Waviness image where only the long
waves are seen.

The difference between the original image and

the Waviness image is the Roughness image
where only the short waves are seen.
It is often desirable to measure the roughness
on the roughness image rather than the raw
image, which can be dominated by the long
waves.

17

S P I P m o d u l e s
Extended Fourier Analysis
The Fourier Analysis Module enables you to detect
and quantify repetitive patterns, such as atomic lattice structures, and to perform advanced ltering.
Fourier spectrums contain important information
about surface structures and distortion phenomena,
but they can be difcult to interpret.
By a sub-pixel Fourier algorithm SPIP provides accurate information about selectable Fourier peaks, including wavelengths and the corresponding frequencies in Hz. This is particularly useful for diagnosing
noise and vibration problems.

Automatically detect and

quantify repetitive patterns
Calculate spatial unit cells
Perform advanced ltering
Sub-pixel Fourier algorithm
Edit spectrum, perform Fourier
ltering, and learn how Fourier
components correspond to
image structures

By dening a pair of Fourier peaks associated with

the reciprocal unit cell, the spatial unit cell can be
calculated automatically.
It is possible to edit the spectrum, perform Fourier
ltering and learn how Fourier components correspond to image structures.
Thus, in addition to being a strong analytical tool,
the Extended Fourier Analysis Module can bring new
understanding to the relation between the spatial domain and the Fourier domain and serve as an educational toolbox.
On this page, it is shown how to calculate different
unit cells simply by marking the corresponding peaks
in the Fourier image. SPIP nds the peak positions
at sub-pixel level to assure the highest accuracy and
draws the lattice structure. The image contains Ag on
Ni(111), 7 nm x 7 nm.
The example on the right page demonstrates an interactive ltering process of a Highly Oriented Pyrolytic
Graphite image where Fourier components not associated with the atomic lattice structure are removed.

18

Data courtesy of Interdisciplinary Nanoscience Center (iNANO)

and Institute of Physics and Astronomy, University of Aarhus.
Data also used for cover page.

E x tended Four ier A nalysis

Raw STM image of graphite.

The ltered result is obtained by inverse Fourier transform

of the Fourier image.

In this image, three Fourier components associated with the

HOPG lattice are marked.

Fourier Image after ltering. All the unmarked Fourier

components have now been removed. Note that the mirror
points of the marked areas are preserved.

19

S P I P m o d u l e s
Grain Analysis
The Grain Analysis Module contains powerful tools
for detecting and quantifying grains (particles) and
pores, even in situations with background waviness.
The Grain Analysis Module offers a very fast threshold method for detecting segments by their height
values. In addition, you can apply the advanced Watershed Multi Scale Segmentation for more complex
images.
The results are shown graphically, and the detected
segments can be discriminated interactively based on
their size and shape.
Numerical results include the surface coverage ratio
and more than 40 parameters quantifying the individual grains and pores, for example, the area and
perimeter.
In addition, most parameters can be presented graphically in histograms.

Particle size distribution analysis

Detect and quantify grains
(particles) and pores
Fast threshold method for
detecting segments by their
height values
The advanced Watershed Multi
Scale Segmentation for complex
images
More than 40 parameters
quantifying the individual grains
and pores
Parameters can be presented
graphically in histograms
Interactive handling of detected
segments

Raw Image with Particles

Contour Image

The Segment Image

The particles are located at different height

levels which makes the detection complex.

The detected particles are indicated by contour lines in different colors.

In this image, the detected particles are lled

by high contrast colors for easy identication.

20

Grain A nalysis

Results
More than 40 parameters are calculated for each segment. Results are shown in a spread sheet
style grid and in histograms.

Area histogram.

Volume histogram.

21

S P I P m o d u l e s
Roughness Analysis
With the Roughness & Hardness Analysis Module you
can characterize images and cross section proles by
more than 30 parameters and visualize the results by
several graphs.
If you think it takes more than simple rst order statistics to describe a surface, you might choose the
built-in Birmingham 14 parameter set.
The Fourier angular spectrum is shown in a polar plot
for an easy evaluation of the isotropy of the surface.
Likewise, a polar plot is applied to show the fractal
dimension as function of direction.
Calculation of 1D roughness parameters from image
cross sections or prolometer curves can be done in
agreement with ISO standards when combined with
the Filter Module.
In combination with the ImageMet Explorer it is possible to save the results automatically into the database so that you can retrieve, report and compare
results any time later.

Validated to be consistent with

NIST calculations
Characterize images and cross
section proles by more than 30
parameters
Several graphs for visualization
of results
2D roughness calculations
on images based on the
Birmingham 14 parameter set
Calculation of 1D roughness
parameters on proles according
to ISO standards
Measurement of Vickers,
Contact, and Indentation
hardness

By combining the Roughness Analysis Module with the

Batch Processor & Active Reporter you can save a lot
of time, analyze large series of image les, and report the results to HTML or Microsoft Word format.

Hardness Analysis
With just a single mouse click you can detect indentation marks and automatically measure Vickers, Contact, and Indentation hardness for your experiments.

Indentation Experiment
Indentations are easily detected by a single mouse click.

22

Roughness & Hardness

A nalysis

Abbott Curve

Raw Image

The Abbott shows the height distribution of the surface and

is traditionally used by the automotive and similar industries.
Several roughness parameters are deduced from the Abbott
curve.

The image contains a surface of molded polymer and is dominated by a directional structure created by the original polishing process of the mold.

Roughness Chart

Isotropic Area Power Spectral Density

Different roughness parameters can be shown in a chart where

the colors indicate whether or not tolerance values are met.
You can dene your own tolerances for each parameter in the
roughness chart.

In this angular average of the 2D power spectrum the rms

roughness can be directly calculated for wavelengths between
the cursors.

Angular Spectrum

Fractal Dimension

The angular spectrum is shown in a polar plot for easy evaluation of the isotropy of the surface.

The fractal dimension is calculated as a function of angle. The

result is shown in a polar plot.

23

S P I P m o d u l e s
Force Curve Analysis
The Force Curve Analysis Module has strong tools for
analyzing, transforming and reporting force curves
and force volume images.
SPIP automatically detects the maximum loading
and pulling force, the point of detachment and ts
various models to the data.
In pulling experiments the Worm Like Chain Model
can be tted to each rupture event.
SPIP can calculate Youngs modulus from indentation
curves using either the sphere-at Hertz model or the
cone-at Sneddon model.
In addition to analyzing individual curves or average
curves from force volume images SPIP can create adhesion maps, Youngs modulus maps, stiffness maps,
constant force maps and many more.
Results from individual force curves are shown with
statistics, which can easily be exported to other programs.

Transformation of deection vs.

height into force vs. separation
Automatic event detection
Worm Like Chain Model t
including measurement of
unloading rate
Youngs modulus using Hertz
and Sneddon indentation models
Automatic t or full user control
Collection of results for multiple
force curves
Batch processing of large
number of les
Force volume image analysis
includes Youngs modulus
mapping, constant force
mapping and more

Raw Force Curve

Force vs. Separation

Recorded force curve of protein unfolding events

The raw data has been baseline and hysteresis corrected and
transformed into force vs. separation. Thereafter, the Worm
Like Chain model has been tted.

24

Force Cur ve A nalysis

Force volume image (deection at xed height). The crosses

represent the positions of the force curve pairs shown below.
All force curves within the box are averaged into a single pair.

Youngs modulus map created from the force volume image by

tting the Hertz model (sphere-on-plane) to all force curves.

Multiple force curve pairs from the same force volume image.
The orange curve represents the calculated mean pair from
the box in the force volume image.

Youngs modulus calculated from a fully automatic t using the

Hertz model (hard sphere versus soft at) after transforming
the deection vs. height data to force vs. separation. Note:
Separation is equivalent to negative indentation with an offset.

Data Courtesy of:

Page 24: Dr. D. A Smith, Dr. J. Clarkson, Dr. D. Brockwell, Professor S. E. Radford, Professor G. Beddard, Professor J. Trinick, Department of Physics, Biochemistry and Molecular Biology, Chemistry and Human Biology, University of Leeds, UK.
Page 25: Dr. Terry McMaster, Reader in Physics and Admissions
Tutor, H.H. Wills Physics Laboratory and IRC in Nanotechnology, Tyndall Avenue, Bristol, BS8 1TL

25

S P I P m o d u l e s
CITS Continuous Imaging Tunneling
Spectroscopy

Visualize and analyze CITS

volume data

The CITS Continuous Imaging Tunneling Spectroscopy

Module is used for visualization and analysis of CITS
volume data.

Extract current images for

selected bias voltages

The CITS module enables you to visualize and handle

I/V volume data where multiple I/V curves have been
measured at different surface positions.
You can extract individual I/V curves by selecting positions in the topographic image or in the CITS volume
image.
The I/V data can be transferred into conductivity or
Density of State values.
Different current images can be selected easily by
mouse movements, and individual I/V spectroscopy
data can be extracted by clicking at the positions
where the I/V curves were obtained.

26

Extract individual I/V curves

Average seperate curves and all
curves within selected regions
Calculate conductivity, density
of states, and more ...

CIT S Continuous Imaging

Tu n n e l i n g S p e c t r o s c o p y

Topographic image.

Current image for a selected bias voltage. The IV curves are

averaged within each selection.

IV Curves

Density of states are calculated by a single mouse click.

27

S P I P m o d u l e s
3D Visualization Studio
With the 3D Visualization Studio you can generate
spectacular 3D images and animations.
The 3D Visualization Studio enables you to inspect
image details by interactive rotation, positioning and
scaling of your images.
You can work interactively with the surface colors.
Use the SPIP color bar, a xed color, or overlay the
colors from another image on your 3D surface. In addition, you can add a wireframe to enhance certain
features.
Create spectacular images and reveal otherwise hidden features by use of multiple light sources interacting with surface color properties.
By dening a set of key frames, you can easily create
impressive 3D animations. These can be exported to
AVI and MPEG les.
SPIP will take full advantage of 3D graphics cards,
and the intuitive mouse interface provides the feeling
of real-time control.

Data Courtesy of:

Page 28 (bottom): Diedrich Schmidt Olmstead Research Group,
University of Washington, Seattle, WA.
Page 29 (bottom): Interdisciplinary Nanoscience Center (iNANO) and Institute of Physics and Astronomy, University of Aarhus. Data also used for back cover page.

28

3D Vis u aliz atio n Stu dio

Use image overlays, wireframes,
color schemes, and interactive
light sources to enhance your 3D
visualizations
Inspect image details by
interactive rotation, positioning,
and scaling of images
Create impressive 3D animations in
AVI and MPEG format
Intuitive mouse interface provides
the feeling of real-time control

29

S P I P m o d u l e s
Movie & Time Series Analysis
The Movie & Time Series Analysis Module enables you
to combine image series into drift corrected movies
and study time dependent behavior.
Time series of images are best presented as movies,
but due to drift and long acquisition time, direct creation may cause undesired results. However, with the
Movie & Time Series Analysis Module you can achieve
drift free results.

Study time dependent behavior

Achieve drift free results by
SPIPs correction functions
Combine different views into the
movies
Export your movies to AVI and
MPEG

You can combine different views into the movies: Top

view image, difference image, and 3D view. The movies can be exported to AVI or MPEG including single
windows or screen dumps containing multiple views.
The screen dumps may include zooms, cross section
proles, histograms, and cross section Fourier.
The images on the next page show four sets of STM
frames from a movie where the stability and dynamics
of Pt dimers on Pt(110)-(12) are studied. The frames
have been plane corrected and drift compensated in
x and y by SPIP.
The left column shows the individual drift compensated topographic frames. The middle column shows
the difference image between the actual and the
previous frame. The prole windows show the average cross-section of 7 parallel lines and their Fourier
transform. The Fourier graphs show the most signicant peaks and their calculated wave length.

Data courtesy of Interdisciplinary Nanoscience Center (iNANO)

and Institute of Physics and Astronomy, University of Aarhus.

30

M ov ie and Time S er ie s A naly sis

31

S P I P m o d u l e s
Batch Processor & Active Reporter
The Batch Processor & Active Reporter Module is the
perfect tool and time saver for analyzing large series
of data les and creating impressive reports.
Design your own processing sequences easily by
mouse clicks and apply them on hundreds of images.
There are no programming skills required.
Create customized Microsoft Word reports with full
layout control by the Active Reporter.

The perfect tool and time saver

for analyzing large series of data
les and creating impressive
reports
No programming skills required
Create customized Microsoft
Word or HTML reports
Use predened batch sequences
for various common tasks

Generate HTML reports ready for web publication including graphical outputs, individual image results,
and statistics.
The Batch Processor & Active Reporter Module comes
with predened batch sequences for various tasks,
such as calibration, pitch and step height measurements, roughness analysis, force curve analysis, and
printed output.
The reports shown on next page were generated by
the Batch Processor and the Active Reporter. The top
pages show the result from a roughness batch analysis. The report on the bottom of the right hand page
is a HTML reports for a batch of force curve experiments.

Create your own processing sequence from a list of available functions.

32

Batch Processor & Active

Reporter

Microsoft Word roughness report.

HTML force curve report.

33

S P I P m o d u l e s
Imagemet Explorer
Imagemet Explorer is a le and data management
tool.

Integrated database allows you

to browse quickly through your
data les

It contains an integrated database that allows you to

browse quickly through your data les and view them
as thumbnails together with numerical results.

Important analytical results

from SPIP can be stored
automatically in the database

Image characteristics can be entered to the database

from where they can be retrieved on the y while
browsing your les.

Enter descriptions, assign

categories, and create
hyperlinks to individual les

Important analytical results from SPIP can be automatically stored in the database for easy retrieval of
results.
You have the exibility to enter descriptions, assign
categories, and create hyperlinks to individual les.
ImageMet Explorer automatically recognizes all the
le formats supported by SPIP and displays them as
thumbnails of optional size.

Three Programs in One

ImageMet Explorer integrates three sub-programs
sharing the common database:
ImageMet Browser
Manage and browse your les with thumbnail view
and send images to the SPIP main program.
ImageMet Finder
Search the database for les with certain characteristics or numerical results within dened ranges.
ImageMet Reporter
Create image lists in HTML format containing optional
characteristics stored in the data base.

34

I m a g e M e t E x p l o r e r

ImageMet Browser.

ImageMet Finder.

ImageMet Reporter.

35

S P I P m o d u l e s
Plug-in Interface
The Plug-in Interface Module is included free of
charge with Basic Module. It allows you to program
your own plug-in programs for SPIP.
In case you want to perform some dedicated analysis, you can use the Plug-in Interface library to create
your own code and interface it to SPIP.
You will get all the advantages of the SPIP processing features, including le handling and visualization
tools while you concentrate on your own specialized
data processing and data creation functions.

// Variables that will keep track of the averaging data

CSpipExchange *AverageData = NULL;
int AverageCnt = 0;
IM _ PWIN AverageWindow = NULL;
//---------------------------------------------------------extern C _ declspec(dllexport)
int Average()
// Read the data of the current data window and include it
// in the average calculation then show the result in the
// AverageWindow.
// To perform multiple averages the user clicks on
// <User Prog->Average Functions->Average> for each window
// to be included.
// After the rst average calculation the function can
// conveniently be repeated for other windows by clicking
// Shift+Ctrl+Y

The plug-ins can invoke predened batch processes

and may integrate with automated acquisition systems.

{
CSpipExchange WindowData;
if (!WindowData.Get _ ImageData())
{::AfxMessageBox(No data in window,MB _ OK,NULL); return
0;}
if (!AverageData){
AverageData = new CSpipExchange;
if (!AverageData>Create _ ImageData(WindowData.SizeX,WindowData.SizeY))
{::AfxMessageBox(No Average Data Created,MB _ OK,NULL);
return 0;}
for (int i=0;i<AverageData->SizeTotal; i++)
AverageData->Data[i] = WindowData.Data[i];
AverageCnt = 1;
}
else {
if (AverageData->SizeX != WindowData.SizeX ||
AverageData->SizeY != WindowData.SizeY )
{::AfxMessageBox(Data is not of same form,MB _ OK,NULL);
return 0;}for (int i=0;i<AverageData->SizeTotal; i++)
AverageData->Data[i] = (AverageData->Data[i]*AverageCnt +
+ WindowData.Data[i])/(AverageCnt+1);
AverageCnt++;
}
char Caption[30];
sprintf(Caption, Average %d, AverageCnt );
AverageData->Put _ Filename( Caption );
AverageData->Show _ ImageData(&AverageWindow, Caption,0);
return true;
}

36

Plu g-in Inter face

Code your own plug-in programs
for SPIP
Invoke predened batch
processes
Integrate with automated
acquisition systems
Built-in wizards for Visual Basic
and C++ projects
Create Your Own Dialogs
You can create your own dialogs to control your
plug-ins. In this case the user implemented a
tab dialog with various features for creating
articial images.

=
Image Stitching
With this plug-in the user added the ability to
stich two images into one image.

37

Supp or ted File For mat s

SPIP is unmatched when it comes to supporting different le formats. We are very eager to maintain this
leadership.
Therefore, we offer to implement generally used
le formats for FREE, if they are sufciently documented.
File formats not yet implemented in SPIP may be
imported by the built-in Heuristic File Importer.
You will nd an up-to-date list of supported le formats at www.imagemet.com.

SPIP currently supports le formats from these instrument manufacturers:

38

A.P.E. Research
Aarhus University
ADE Phase Shift
Agilent Technologies
Ambios Technology
Anfatec
Asylum Research
ATOS GmbH
Dektak
Digital Instruments
Digital Surf
DME Danish Micro Engineering
EXFO Burleigh
FOGALE nanotech
GFMesstechnik
Hitachi Kenki FineTech
Hysitron, Inc.
IBM
JEOL
JPK Instruments
KLA-Tencor

Molecular Imaging
MTS Nano Instruments
NanoFocus
NanoMagnetics
Nanonics Imaging
Nanonis
Nanosurf
Nanotec Electronica
NT-MDT
Omicron NanoTechnology
Oxford Instruments
Pacic Nanotechnology
Park Scientic
Park Systems
PSIA Corporation
Quesant Instrument
RHK Technology
Sensofar
Shimadzu Corporation
SII Nano Technology
SNU Precision

Surface Imaging Systems (S.I.S.)

Taylor Hobson
ThermoMicroscope
TopoMetrix
Toray Engineering
Unisoku
Veeco Instruments
VTS-CreaTec
Wyko
Zygo Corporation
and more ...

SPIP supports these

generic le formats:

ASCII
BCR
Bitmap
JPEG
SDF
TIFF

D o w n l o a d Fr e e Ev a l u a t i o n
Ve r s i o n
Please visit our website and download a free evaluation version of SPIP:

www.imagemet.com/download

Free Support and Software Updates

Requirements

One year of free support and software updates are

included with every SPIP license. The software also
comes with on-line help and a printed manual. The
SPIP Online pane in SPIP brings you more than 30
video tutorials on SPIP.

SPIP will run on most standard PCs running Windows

NT/2000/XP/2003/Vista.

Our experienced Customer Service and Technical

Support team is available to answer any queries you
may have. We speak English, German, Japanese, and
Danish.

CPU Speed:
Memory:
Graphics Card:

However, we recommend the following minimum

conguration:

Hard Disk:

1 GHz
1 GB
3D accelerated,
1024x768 pixels resolution
100 MB free

Network Installation
With more users in the same group, you can obtain
extensive multi-user discounts on your SPIP license.
In addition, you can install a multi user license as a
client/server solution. This makes is easy to maintain
the license, as most updates only have to be installed
on the server.

In order to generate reports using Microsoft Word in the

Batch Processor & Active Reporter Module you need
to have Word 2000 or later installed.

39

SPIP modules:
Basic Module with Plug-In Interface
Calibration
Tip Characterization
Correlation Averaging
Filter
Extended Fourier Analysis
Grain Analysis
Roughness & Hardness Analysis
Force Curve Analysis
CITS Continuous Imaging Tunneling Spectroscopy
3D Visualization Studio
Movie & Time Series Analysis
Batch Processing
Imagemet Explorer

www.imagemet.com