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Yes - run a rail analysis tool - then update your power mesh + decap fillers until your target
IR drop is met.
What if I have congestion problem, then power mesh and decap fillers affect to congestion
problem. doesn't it ?
It sure does, that is why you have to try to address GLOBAL IR drop as soon as possible by
proper sizing/frequency of the power rings and stripes. Some local IR drop issues can be
fixed later with decaps.
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maulin sheth
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maulin sheth
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Hi,
I agree with all these copilation and elaboratin happens in the simulations side but once the
snapshot is ready the simulator starts feeding the vectors to the DUT the same way the ATE
also feeds the vectors to DUT. Here on ATE just applying vectors and checking for the
expected results. Still we see the differences in the time on ATE it is too fast but on the
simulation environment it is taking more hrs to complete. You think its bcoz of clock running
at speed in post silicon thats where the post silicon testing is quicker than the simulation
environment.
See when we are doing simulation.at that time, in any path for applying patterns,the
module/cell comes into path,so simulator have to find that particular cell from huge cell
library..so its take more time.
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sta setup
report_constraint -max_delay for setup
report_constranit -min_delay for hold
Best Regards!
9th April 2004, 10:40
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setup/hold time
If you use Synopsys PT(primetime) or Cadence Buildtgate
you can get more information then DC
or you can reference the eBook which I upload
: http://www.elektroda.pl/eboard/ftopic73639.html
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clock uncertainty vs clock jitter | [STA] Multi-clock + PLL Timing Analysis -> How to solve
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