Design V

C&C I.D Constraints/Criteria

prevent falling chips, coolant fluids

1 and foreign objects from reaching the
guide rail
 Design Verification Plan (DVP) matrix
Verification
Test description Test measurable
method (T/A/I/D)

Chips are slowly dropped on

the testing plates. The chips
that would go on the Amount of chips
T - Bench test
conveyor belt, behind the by mass
wiper, and under the bottom
plate
VP) matrix

Acceptance criteria Responsibility Start date End date Pass/Fail

Less than 0.5% get

past gutter. Particles
of size 10 microns Pablo/ James 07.05.2011 07.10.2011 Pass
or less are
considered
negligible
Remarks

-NIL-
 Trade-off Analysis Matrix
Tests
C&C Severity
T1 T2 T3 T4

Column total
Cost/test
Lead time/test
Performance indicator
alysis Matrix
Verification complexity
Ranking
index (VCI)
 Trade-off Analysis Matrix
Verification
Tests
C&C Severity complexity index
T1 T2 T3 T4 (VCI)
1 9 5 2 =9 x (5 x 9 +2 x 9)

Column total
Cost/test 3 3
Lead time/test 3 3
Performance indicator 9 9
Ranking
 Trade-off Analysis Matrix
Verification
Tests
C&C Severity complexity index
T1 T2 T3 T4 (VCI)
1 9 5 2 567
2 3 1 2 63
3 3 2 54
4 3 2 54
5 9 1 243
Column total 5 1 1 8
Cost/test 3 3 3 3
Lead time/test 3 1 9 3
Performance indicator 9 3 27 9
Ranking

1
3
4
4
2