General Information

Report Title PTP_SYNCE_TEST_TP2700

Report Description
Company
User Name
Network Operator
Test Location
Report Date 2017-01-26 16:09:49
Beginning of Test 2017-01-26 10:45:44
End of Test 2017-01-26 14:45:46
Instrument Type Sentinel
Instrument Serial Number 291113
Test Duration 00:04:00:02
Channel C
Version 1.15.2106-20150907
Mask results:

All Mask Results Fail

Mask A MTIE Result Pass

Mask A TDEV Result Pass
Mask C MTIE Result Pass
Mask C TDEV Result Pass
Mask C Time Error Result Fail
Mask C Avg Time Error (cTE) Result Fail
Mask C Dynamic TE LF Result Pass
Mask C Dynamic TE HF Result Pass
Mask C Dynamic MTIE LF Result Fail
Mask C Dynamic TDEV LF Result Pass

Test Configuration

Network/Device Under Test

Frequency Reference Internal

Source

Measurement Sample/Pkt Rate Physical Medium/Line

Rate
Channel A E1 TIE 0.033
Channel C SyncE TIE 0.033
Channel C 2Way 62.8 1GbE SFP

Initial ESMC
Channel C No ESMC

Master Address Slave Address Domain VLAN Id

Channel C 20.20.20.1 20.20.20.2 0

PTP TwoStep Initial Clock Unicast/Multicast Encapsulation

Class
Channel C False 6 Multicast Ethernet

Page 1 of 13
Results
E1 TIE Measurement

Channel A
Description
Measurement Start 2017-01-26 10:45:44
Measurement Stop 2017-01-26 14:45:46
Mask MTIE G.8262 Wander Generation EEC Op1
Mask MTIE Result Pass
Mask TDEV G.8262 Wander Generation EEC Op1
Mask TDEV Result Pass

TIE Analysis

Freq Offset Removal Off

Frequency Offset 0 ppm

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MTIE Analysis

Page 3 of 13
TDEV Analysis

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SyncE TIE Measurement

Channel C
Description
Physical Medium
Line Rate
Measurement Start 2017-01-26 10:45:44
Measurement Stop 2017-01-26 14:45:46
Mask MTIE G.8262 Wander Generation EEC Op1
Mask MTIE Result Pass
Mask TDEV G.8262 Wander Generation EEC Op1
Mask TDEV Result Pass

TIE Analysis

Freq Offset Removal Off

Frequency Offset 0 ppm

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MTIE Analysis

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TDEV Analysis

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2Way Measurement

Channel C
Description
Physical Medium
Line Rate
Measurement Start 2017-01-26 10:45:44
Measurement Stop 2017-01-26 14:45:44
Mask Time Error 0.1 s
Mask Result Fail
Mask Avg Time Error (cTE) 0.1 s
Mask Result Fail
Mask Dynamic TE LF 1.1 s
Mask Result Pass
Mask Dynamic TE HF 0.2 s
Mask Result Pass
Mask Dynamic MTIE LF G.8273.2 dTE Gen Const Temp
Mask Dynamic MTIE LF Result Fail
Mask Dynamic TDEV LF G.8273.2 dTE Gen Const Temp
Mask Dynamic TDEV LF Result Pass

Time Error Analysis

Include Correction Field On

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Avg Time Error (cTE) Analysis

Averaging Period 100 s

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Dynamic TE LF Analysis

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Dynamic TE HF Analysis

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MTIE LF Analysis

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TDEV LF Analysis

Page 13 of 13