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1998
TO-254 PKG Series (100,130, 200,250, 500V)
08 for Domestic
QML Parts
SMD-PKG Series (100,130, 200,250, 500V)
09 for Oversea
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Performance
Ron: Fujis 2nd Generation MOSFET Technology
On-sate Resistance
d-
Ra 17th MEWS, 2004.
en ral
st G e ne MOS
1 G se
50 r po 0.18/ 500V device
Pu
250V MOS 38m/ 250V device
rd 26m/ 200V device
200V MOS d- Ha
Ra
G en 17m/ 130V device
100V MOS 2nd it 13m/ 100V device.
im
on L
S il i c
0
100 150 200 250 300 350
BVDSS [V]
BVDSS dependence of RDS(on)
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3
250
@Id=1mA, Vds=5V
2
BVdss(V)
@Id=1mA
Vgs(th)(V)
1
200 BIAS
(a):VGS=+20V 0 BIAS
(b):VGS=-20V (a):VGS=+20V
(c):VDS=200V (b):VGS=-20V
-1 (c):VDS=200V
150 -2
0 5000 10000 0 5000 10000
Total Dose(Gy) Total Dose(Gy)
Total dose dependence of BVDSS Total dose dependence of VGS(th)
SEE-SOA (SEB/SEGR)
Single Event Effect Safe Operating Area
Single Event Burnout / Single Event Gate Rupture
300
250
200
LET: 40.1MeV/(mg/cm2)
VDS (V)
Ion: 89Y
150
Energy: 928 MeV
Range: 102m
TA=25+/-5oC 100
Fluence: 3E5+/- 5% ions/cm2
Irradiation angle: Perpendicular to die surface 50
Test Sample: JAXA R 2SK4158 (250V)
0
0 -5 -10 -15 -20 -25
VGS (V)
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QT
Qualification Test
QT
The QT in accordance with the JAXA-QTS-2030/101A*), 102, and 103
had been successfully performed by FDT and certified by JAXA. And the
devices were listed in the QML on May 2008.
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QCI
Quality Conformance Inspection
These features come from the wafer lot consisting of dice with
various voltage ratings and sizes designed with the same rule.
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Wafer Lot
250V 200V
130V 100V
One wafer lot consists of 1 to 4 rated voltage
types of Si wafer and three kinds of die size
(1/1, 1/2, and 1/4 sizes).
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1/1 size
2SK4185 2SK4188
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Conclusions
We have developed the rad-hard and low Ron power
MOSFETs in the rated voltage range of 100V to 500V.
Some of products are now supplied for domestic and
oversea customers.
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Matsumoto Castle
Matsumoto, Nagano Pref.
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