Beruflich Dokumente
Kultur Dokumente
refrigeration
A. Bradeko, . Jurii, M. Santo Zarnik, B. Mali, Z. Kutnjak, and T. Rojac
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APPLIED PHYSICS LETTERS 109, 143508 (2016)
Electrocaloric (EC) cooling technology has the potential removal of the electric field (adiabatic depolarization), the
for a broad range of applications, such as on-chip cooling heat must be absorbed from the heat source. Jia and
and body-worn chillers, due to its high efficiency and scal- Sungtaek Ju8 for example, separated the EC heat flux by
ability. The main problem of putting EC refrigeration into attaching an EC element to a motorized z-stage, which was
practice is the small temperature change typically induced in moved vertically to achieve thermal contacts with the heat
bulk EC materials (DTEC 3 K).13 The temperature change sink and the heat source during the EC cycle. This mechani-
(or span) in an EC-based cooling device, however, can be cal motion of the EC material separated the heat flows during
made larger than the EC effect of the material itself, leading the EC cooling cycle; however, the authors stressed the criti-
to an effective regenerative process.4 Several studies have cal importance of the thermal contact resistance. Ju9 further
reported EC coolers with significant regeneration and, conse- developed the idea of introducing electrostatic elements to
quently, an increased temperature span in the device relative mechanically displace a plate with EC elements, with which
to the adiabatic EC temperature change induced by the EC they separated the heat flows and created a temperature span
material. For example, Gu et al.5 reported on an EC oscilla- in the device.
tory refrigeration (ECOR) device in which the EC elements, In this study, we propose the coupled use of the EC and
driven by a stepper motor, slide laterally on a substrate, cre- electromechanical (EM) properties of a material in a device.
ating a temperature span in the substrate. Numerical studies The application of an electric field to these materials simulta-
of the ECOR cooler revealed a temperature span of 52 K neously induces the EC and EM effects, and thus enables the
with a DTEC 16 K (regeneration factor DT/DTEC 3.3). separation of the adiabatic polarization and depolarization by
Plaznik et al.6 demonstrated a cooling device with active EC displacing or bending the material and making a contact with
regeneration (AER).7 The device exhibited a regeneration the heat source or heat sink during the EC cycle. The concept
factor of 3.7, which is currently the largest measured value would in principle allow the heat flow in the device without
reported in the literature. external mechanical motions as previously suggested.5,810
The key problem that needs to be addressed in order to Examples of materials that exhibit high EC and EM effects
achieve a large temperature span in cooling devices is the are polymers11,12 and ceramics13,14 belonging to the group of
effective separation of the heat flows during an EC cycle. ferroelectrics and relaxor-ferroelectrics.1517 The ceramic
When the EC material is heated by DTEC as a result of the 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-35PT) is an
applied electric field (adiabatic polarization), the generated example of such a material with large measured EC and EM
heat must be directed to the heat sink. On the other hand, effects.18,19
when the EC material is cooled by DTEC as a result of the The concept of the device on which we demonstrate our
idea is shown schematically in Fig. 1. The device consists of
a)
andraz.bradesko@ijs.si PMN-35PT elements in a form of cantilevers (one-side
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143508-2 Bradesko et al. Appl. Phys. Lett. 109, 143508 (2016)
clamped) that exhibit both EC and EM (i.e., piezoelectric) in contact Rcontact ; if itc < t < i 1tc
Ri
properties.2022 When an electric field is applied to such a can- not in contact infinite R; else;
tilever, it will simultaneously heat up by DTEC and bend (1)
because of the EC and piezoelectric responses, respectively.
Then, when the electric field is removed, the cantilever will where i is the cantilever number, counted from the bottom to
return to its initial position and cool down by DTEC.23 This the top of the array, and tc is the time during which the two
means that by using an array of such cantilevers and by pro- cantilevers are in contact.
viding periodic contacts between them, the device can, in Depending on the position in the array (number i), it is
principle, transfer the heat generated during adiabatic polari- assumed that the cantilever can be in three different states. If
zation through the device, leading to a temperature span larger the simulation time (t) matches the elements time interval
than DTEC between the ends of the device. between itc and itc tp, during which the EC cycle begins,
We investigated the time-dependent behavior of the the cantilever generates the EC heat (Qeci). This step simu-
device with finite-element modelling using the commercial lates the adiabatic polarization of the material. After a cer-
software COMSOL Multiphysics.24 The devices geometry tain time tc, the adiabatic depolarization follows. In the time
was considered to be two dimensional as temperature varia- between (i 1)tc and (i 1)tc tp the material cools down.
tions are only expected in two directions. The cantilever ele- Before and after these two steps, there is no heat generation
ments, clamped on one side onto Al holders, were 20 mm or termination in the material. These steps of the devices
long and consisted of a 50-lm-thick EC layer, i.e., PMN- operation were described with Eq. (2)
35PT, and a 10-lm-thick bottom Pt electrode.20 The upper 8
electrode of the cantilever is sputtered Au and was thus < mcp DTEC ;
> if itc < t < itc tp
neglected in the model due to its small thickness (200 nm). Qeci mcp DTEC ; if i 1tc < t < i 1tc tp
To avoid a multi-field description of the device, we >
:
0; else;
modelled only its thermal aspects. The contacts between the
cantilevers were described as thin resistive layers that work (2)
as thermal switches. This means that in the time frame of the where m is the mass of the EC layer, tp is the time duration
mechanical contact between the cantilevers, the thermal con- of the heat generation or termination, cp is the specific heat
tact (R) was assumed to have a finite thermal resistance capacity, and DTEC is the EC temperature change induced by
(Rcontact), while in the absence of a mechanical contact, the the cantilever.
thermal contact resistivity was set to be infinitely high. Thus, The time tc was determined based on the thermal time
the thermal resistivity of the contacts between the cantilevers constant (s), which is the time necessary for two cantilevers
along the structure was mathematically described using the to stabilize their temperatures. The time constant s was esti-
following expressions: mated using an equivalent thermal circuit of two cantilevers
in contact25
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143508-4 Bradesko et al. Appl. Phys. Lett. 109, 143508 (2016)
FIG. 4. Simulated temperature span (DT) between the first and last elements
in the cantilever array as a function of the number of elements (n) in the EC
device for ideal (full line connecting circles) and realistic (dashed line con- FIG. 5. Ratio of the temperature span between the first and the last element
necting squares) operating conditions. The lines are drawn as a guide to the in the array for a finite contact resistance (DT) and that of the ideal contact
eye. The insets show the temperature distribution in the devices with 10 ele- with no resistance (DTic) as a function of the contact resistance (Rcontact)
ments for ideal and realistic operating conditions. For the realistic device, between the cantilevers. On the secondary x-axis, the corresponding change
the temperature profiles for the first and last element are plotted above and of tc with the Rcontact is shown. The dependence of the regeneration factor on
below the elements. The temperature profile across the center of the ele- the contact resistance (Rcontact) is shown on the secondary (right) axis. The
ments is shown on the right side. dashed line is drawn as a guide to the eye. The schematic shows Pt and
PMN-35PT in contact with the indicated Rcontact.
of these effects provide sufficient time for heat exchange to method, we apply an electric field first to the odd and then, in
occur with the cantilever holders and air, which reduces the the second step, to the even elements (see inset of Fig. 6).
effectiveness of the refrigerator. The partial element overlap- Using such an odd/even excitation, the DT increases com-
ping during contact, on the other hand, leads to an inhomoge- pared to the periodic excitation. As shown in Fig. 6, the
neous distribution of the temperature in the elements along device with 15 elements excited with the odd/even method
the lateral direction (compare the temperature distribution in shows a DT 1.87 K (Fig. 6, diamonds), while the periodic
the insets of Fig. 4), so reducing the effective cooling area. excitation results in a DT 1.42 K (Fig. 4, squares).
To reveal the important features of the realistic device, For use in commercial applications, DT must be increased
we further introduced in the realistic model, the contact resis- further. This can be done either by increasing the number of
tance between the elements as a critical parameter that deter- elements in the device and/or by replacing the EC material. To
mines the performance of the device. In the literature, we study both possibilities, we simulated the behavior of the
found values for the contact resistances (in the case of low- device as a function of the number of elements using PMN-
pressure contacts) ranging from 102 m2K/W to 106 m2K/ 10PT as the EC material, which in bulk form exhibits a high
W.3033 We used these values in our model as Rcontact (see EC effect and better energy efficiency (DTEC 1.2 K at 57 kV/
Equation (1)) and simulated the temperature span (DT) at a cm).22,34 The comparison with PMN-35PT (DTEC 0.2 K at
finite contact resistivity, which is plotted in Fig. 5 as the ratio 25 kV/cm) is shown in Fig. 6. The device with fifteen elements
to the ideal, zero contact resistivity (DTic, as calculated in the
previous example with ten elements; Fig. 4, squares). By
using a contact resistance of 106 m2K/W, no differences
were observed as compared to the ideal case; the regeneration
factor (DT/DTEC) is approximately 6. By increasing Rcontact,
the DT/DTic ratio reduces; at 103 m2K/W, the values fall
drastically below 0.2 and the regenerative factor falls to 1.
Thus, liquid interfaces, carbon-nanotube coatings and other
surface-engineering methods that ensure a good thermal con-
tact should be considered when designing this type of
refrigerator.
We next address the problem of the smaller increase in
DT(n) by increasing the number of elements, n, to more than
ten (Fig. 4, squares), while assuming an engineered contact
thermal resistivity between the elements of 106 m2K/W. As
this effect is related to the long idle time of individual ele- FIG. 6. Comparison of temperature span evolution as a function of the num-
ber of cycles between the 15-element device with PMN-35PT and PMN-
ments, excited sequentially along the array, we introduce a
10PT EC materials.34 The simulations were performed by driving the ele-
different excitation procedure that increases the working time ments with the optimum odd/even excitation method, as indicated in the
of the elements during a single EC cycle. With this excitation inset.
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143508-5 Bradesko et al. Appl. Phys. Lett. 109, 143508 (2016)
6
of PMN-10PT achieves a DT of 12.6 K (Fig. 6, circles), which U. Plaznik, A. Kitanovski, B. Rozic, B. Malic, H. Ursic, S. Drnovsek, J.
Cilensek, M. Vrabelj, A. Poredos, and Z. Kutnjak, Appl. Phys. Lett. 106,
is almost seven-times larger than the DT with PMN-35PT ele-
043903 (2015).
ments (Fig. 6, diamonds).This value is high enough to be used 7
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In conclusion, we propose an EC solid-state refrigerator E. Schwartz, Appl. Phys. Lett. 107, 134103 (2015).
consisting of an array of elements that employs both EM and 11
X. Li, X. Qian, S. G. Lu, J. Cheng, Z. Fang, and Q. Zhang, Appl. Phys.
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12
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18
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22
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financial support in the frame of the Doctoral Project No. 30
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