Solar Cell Evaluation System

Model UV-Visible-NIR Spectrophotometer

 With the Model U-4100 Spectrophotometer, you can select an optimal
the transmittance and reflectance of various materials that compose

Solid Sample Measurement System

This system is designed for transmittance/reflectance measurement of solid samples. You can build a system
that is well-suited for a particular measurement purpose by combining the system with a variety of accessories,
such as a specular reflection device.

System Spectrometer: prism-grating. Sample compartment: standard sample compartment.

Detector: standard integrating sphere. Measurement wavelength range: 240 to 2,600 nm.
Configuration
Maximum sample size: 200 200 mm.

Optical axis
Reference
beam

Sample
beam Sample compartment (side view)

Sample compartment (top view)

Large Sample Measurement System

This system affords the non-destructive transmittance/reflectance measurement of various optical
and electronic materials, including large-sized glass, silicon wafers, and liquid crystal substrates,
beyond the measurement of solar cell components.

System Spectrometer: prism-grating. Sample compartment: large-size compartment.

Detector: standard integrating sphere. Measurement wavelength range: 240 to
Configuration
2,600 nm. Maximum sample size: 430 430 mm.

Reference
beam Optical axis

Sample
beam

Sample compartment (side view)

Sample compartment (top view)

Ultraviolet Region Measurement System

This system is designed for sample measurement in the UV region. The system uses a light source, a grating,
and an integrating sphere that are specifically designed for UV measurements, and provides measurements
with a superior S/N ratio in the UV region when compared with other systems.
Through a nitrogen purge of the photometer, the deep UV region starting at 175 nm can also be measured. In
addition, because it does not require a nitrogen purge of the sample compartment, the system eliminates the
wait time for re-purging after a sample is replaced, which allows for the measurement of multiple samples in a
short period of time.

System Spectrometer: grating/grating. Sample compartment: standard compartment.

Detector: high-sensitivity integrating sphere. Measurement wavelength range: 175 to 2,600 nm.
Configuration
Maximum sample size: 200 200 mm.

Optical axis
Reference
beam

Sample
beam Sample compartment (side view)

Sample compartment (top view)

1
system for the measurement of 5 deg. specular reflectance accessory
solar cells. (absolute)

Top-mount transmittance/
reflectance measurement unit

Variable-angle transmittance
measurement accessory

Variable-angle absolute
reflectance accessory
(10 deg. step type)

Variable-angle absolute reflectance accessory

(fully variable type)
U-4100 Spectrophotometer
(Large Sample Measurement System)

Choose from a wide range of accessories to configure a system

best suited for your application.
System applied to
Accessory Example
Solid Large UV
Measures the reflectance and transmittance at a 5 deg. incident angle and
5 deg. specular reflectance
verifies the effect of an anti-reflection film or calculate1 the rate of absorption
accessory (absolute) from reflectance measurements (see P. 3).
(134-0102)

Top-mount transmittance/ Measures the reflectance and transmittance of large samples up to 300 300
reflectance measurement unit mm. Allows the evaluation of in-plane transmittance and reflectance of glass
(134-0107 (0 deg. transmittance, 5 deg. reflectance)) substrates and transparent conductive films for solar cells.
(134-0108 (0 deg. transmittance, 12 deg. reflectance))
Measures transmittance by changing the incidence angle. Allows the
Variable-angle transmittance measurement of change in transmittance characteristics of a solar cell
measurement accessory substrate by varying the incident angle.
(134-0200)

Variable-angle absolute reflectance
accessory (10 deg. step type)
(134-0116 (10-60 deg. reflectance))
(134-0117 (15-65 deg. reflectance))
Variable-angle absolute reflectance
accessory (fully variable type)
(134-0115 (20-60 deg. reflectance))
Measures reflectance and transmittance at 10 deg. intervals by varying the
incident angle and verifies the effect of an anti-reflection film, or calculate1 the
rate of absorption from transmittance or reflectance measurements (see P. 4).
Measures reflectance and transmittance at any angle between 20 and 60 deg.
by changing the incidence angle.
Allows the measurement of distribution of scattering angles on light transmitted
by glass substrates and other objects having a texture structure (see P. 5).

1: Not applicable to samples having a light-scattering property.

2
 1
Incident light
Measurement of an Anti-Reflection Film
Reflected light

Anti-reflection film In order to enhance the efficiency of power generation, polysilicon solar cells incorporate
anti-reflection films designed to efficiently direct sunlight onto the power generation
n-type silicon layer of the semiconductor so that the light will not escape as reflected rays.
The use of a 5 deg. specular reflectance accessory permits the verification of the effect of
an anti-reflection film at an incident angle close to perpendicular with respect to the sample.
p-type silicon
The graphs shown below represent measurements of reflection spectra from substrates
provided with visible and NIR-region anti-reflection films. Both cases indicate the
presence of a wavelength region with an extremely low reflectance. It is clear that in the
wavelength region very little light is lost due to reflection.
The U-4100 Spectrophotometer, incorporating an optical system optimized for the prism
grating spectrometer, is capable of accurately measuring spectra while minimizing noise.

Polysilicon solar cell

15 10
For visible light region For NIR region
Reectance (%R)

Reectance (%R)
10

0 0
400 500 600 700 800 1,000 1,250 1,500 1,750 2,000
Wavelength (nm) Wavelength (nm)
5 deg. specular spectrum for a substrate provided with an anti-reflection film

Measurement mode: reflectance, transmittance

Incident angle: 5 deg.
Sample size: reflectance (25 to 50 mm diameter, 25 25 to W100 H150 mm)
transmittance (25 to 45 mm diameter, 25 25 to W45 H150 mm)
Wavelength range: 240 to 2,600 nm

5 deg. specular reflectance accessory (absolute)

(134-0102)
Mirror A
Irradiation Irradiation
light Mirror B light

Mirror B
Detector Detector
Sample Sample

Mirror A
Optical system for
Transmittance measurement the 5 deg. specular accessory Reflectance measurement

The 5 deg. specular accessory, through the adoption of an optical system called the V-N process, can measure both transmittance and reflectance of the same
spot on a given sample, which makes it well-suited for the measurement of transmittance and reflectance on the same spot in a sample characterized by
surface irregularities. The ability to take measurements on the same spot permits the accurate determination of the absorbency1 of the sample from
transmittance/reflectance measurement results.
1: Not applicable to samples having a light-scattering property.

3
2 Measurement of a Substrate with a Transparent conductive Film
20 100
Incident light
40

Transmittance (%T)
80

60
60

40

20
20 40
60
0
400 600 800 1,000 1,200 1,400 1,600 1,800 2,000
Substrate with a transparent Wavelength (nm)
conductive film
Transmittance spectrum for a transparent conductive film substrate
Transmitted light

20 100
Incident light 20
40 80 40
Reflected light

Reflectance (%R)
60
60
60

40

20

0
400 600 800 1,000 1,200 1,400 1,600 1,800 2,000
Substrate with a transparent Wavelength (nm)
conductive film
Reflectance spectrum for a transparent conductive film substrate

The thin-film silicon solar cell uses transparent conductive films as electrodes. In order to extract electricity, the transparent conductive film must have
desired conductivity and light transmittance.
Sunlight is subject to change in incident angle according to time of the day or seasons. Critical to the evaluation of light transmittance is the ability to
perform evaluations by varying the incident angle. The table on the right shows the results of calculation2 of solar radiation transmittance and reflectance
from measurements of transmittance and reflectance spectra by varying the incident angle over a range from 20 to 60 deg., using a substrate with a
transparent conductive film as a sample.
Calculation of solar radiation transmittance and reflectance2
The results indicate that the solar radiation transmittance diminishes as the
Incident Solar radiation Solar radiation
incident angle increases, and the solar radiation reflectance increases. In this
angle transmittance reflectance
manner, the use of a variable-angle absolute reflection accessory (the 10 deg.
20 deg. 77.9 14.2
step type) provides the quantitative measurement of transmittance and
reflectance characteristics with varying incident angles. 40 deg. 76.9 15.1
2: The calculation of solar radiation transmittance and reflectance requires a separate optional package. 60 deg. 70.5 20.2

Measurement mode: reflectance, transmittance

Incident angle: 10 to 60 deg. (134-0116, in 10 deg. steps)
15 to 65 deg. (134-0117, in 10 deg. steps)
Sample size: reflectance (8 8 to W90 H100 mm3)
transmittance (8 8 to W90 H100 mm3)
Wavelength range: 240 to 2,600 nm
3: At the 60 deg. and 65 deg. incident angles, the sample size will be 2121 to W90H100 mm.
Variable-angle absolute reflectance accessory
Measurement requires a separately purchased polarizer.
(10 deg. step type)
(134-0116, 134-0117)

The adoption of the V-N process permits the measurement of both transmittance and reflectance on the same spot.
Measurement of transmittance and reflectance with varying incident angle is possible, from the UV region (240 nm) and beyond.

4
 3 Measurement of Textured Glass

Measuring Transmittance in All Directions

In order to increase power generation efficiency, a fine pyramid structure called the
Light irradiation inside
a solar cell texture structure is formed on the light-receiving surface of monosilicon and the glass
panel of a solar cell. The formation of this structure causes the light entering the power
Glass generation layer to repeatedly undergo transmission, reflection, and scattering. As a
result, more light can be directed to the power generation layer when compared with a
Transparent conductive film
flat surface, thus enhancing power generation efficiency.
r

Such a structure must satisfy the requirements of light diffusion and high transmittance.
ye
la

Critical to the accurate measurement of the transmittance is the tight adhesion of the
i.H
.S

sample to the integrating sphere. The use of a transmission holder (tight adhesion)
permits the strong adhesion of the sample to the integrating sphere and the
measurement of transmittance including diffusion transmittance.
Example of a solar cell with a texture structure

Incident light

100
Sample tightly attached to the
integrating sphere
80 Sample off the integrating sphere
Sample
Transmittance (%)

60

40

Transmitted light
20

0
Detector 500 1,000 1,500 2,000 2,500
(integrating sphere) Wavelength (nm)

Measuring transmittance including diffusion transmission Measuring the transmittance of a glass panel

By tightly attaching the sample to the integrating sphere, it is possible to
measure transmittance including diffusion transmittance.
The above graph shows the measurement of the transmittance of a glass panel
having a light-diffusion structure in two situations: with a sample tightly attached
to the integrating sphere and a sample off the integrating sphere. The results
indicate that the tight adhesion of the sample produces high transmittance, and
permits measurements including diffusion transmittance.

Sample Detector (integrating sphere)

Incident light
Measurement mode: Transmittance
(permits measurements including
diffusion transmittance)
Transmission holder
Sample size: 30 30 to 100 100 mm
(tight attachment)
Wavelength range: The same as the specifications for Model
U-4100 systems

Transmission holder (tight attachment)

(1J0-0202)

5
 Measuring the Angle Distribution of Diffusion Transmission Light
The evaluation of the angle distribution of diffusion transmission light has a great impact on the evaluation of a sample having a texture structure.
The variable-angle absolute reflection device (the fully variable type), which permits changing angles centered on the sample position, allows the user to measure the
distribution of the extent to which the diffusion transmission spreads. In particular, this device, which is designed to directly detect diffusion transmission light without
the use of a mirror, can accurately perform measurements in tenuous detection light regions.

Incident light
100
Glass A
Glass B Sample
10 Glass C

Detected light (%)

Sample
1

0.1

Transmitted light
0.01

Movable Detector 0.001

(integrating sphere) 0 10 20 30 40 50 60 70 80 90
Angle of direction of detection ()

Measuring the angle distribution of diffusion

Measuring the angle distribution of diffusion transmission light
By moving the detector with an integrating sphere mounted and measuring
the amount of light detected, the user can measure the distribution of the
extent to which the diffusion transmission spreads.
transmitted light from various glass panels
The above graph shows the measurement of angle distribution of diffusion
transmitted light from three types of glass panels. It is clear that Glass A
produces the diffusion of transmitted light to the highest angle of direction.

Sample holder Transmittance, reflectance

Incident angle: 0 to 60 deg. (transmission)
Incident 20 to 60 deg. (reflection)
light
Angle distribution of diffusion transmitted light
Incident angle of sample: 0 to 60 deg.
Detection angle: 0 to 140 deg.
Movable
Sample size: 30 30 to 90 90 mm
Wavelength range: 340 to 2,600 nm
Detector Measurement requires a separately purchased polarizer.
(integrating sphere)

Variable-angle absolute reflectance accessory (fully variable type)

(134-0115)

(1) Permits the measurement of transmittance and reflectivity by varying the incident angle
(2) Permits the measurement of the angle distribution of diffusion transmitted light
The accessory, which is designed to directly detect diffusion transmitted light through the use of an integrating sphere without using a mirror between the sample and
the integrating sphere, can accurately measure the angle distribution of diffusion transmitted light.
(3) Capable of stable measurement for long hours
Because it incorporates an optical system that detects sample light and reference light in the same integrating sphere, the accessory permits stable measurements for long hours.

6
 Fluorescence Spectrophotometer for Solar Applications
Measuring the fluorescent characteristics of fluorescent (photovoltaic) materials

Solar cell modules using silicon crystals, which are currently in the mainstream,
principally use light from the visible to the near-infrared region for power generation.
However, sunlight contains a considerable amount of rays in the UV region, which are
not suitable for power generation. As an approach to circumventing this problem,
efforts are under way to improve the power generation efficiency by converting UV light
into visible light by using fluorescent materials.
The F-7000 is a highly sensitive fluorescence spectrophotometer with the world's top
scanning speed in its class. For the evaluation of the fluorescent characteristics of
materials, the F-7000 rapidly measures both excitation and emission spectra. In
Model F-7000 Fluorescence Spectrophotometer addition, for the assessment of the fluorescence conversion efficiency of a given
fluorescent material, the system can accommodate the measurement of the quantum
yield of fluorescent materials.
Excitation spectrum Emission spectrum
(absorbed light) Conversion (converted light)
1,000 500

Excitation wavelength (nm)

Fluorescence intensity

0 230
250 750 550 750
Wavelength Emission wavelength (nm)

Excitation/emission spectra of Eu 3D spectra of Eu

Measurements of the excitation and emission spectra of an Eu fluorescent material used as a UV light conversion material (left figure) clearly indicate that the material
converts UV light near 250 to 400 nm to red light approximately 600 nm in wavelength.
The figure on the right shows a 3D fluorescence spectrum, plotting the excitation wavelength on the vertical axis, the emission wavelength on the horizontal axis, and
the fluorescence intensity in contour lines. Because of its high scan speed (60000 nm/min), which is among the highest in the world, the F-7000 is capable of
high-speed measurement of 3D fluorescence spectra. These spectra can be a powerful aid in the assessment of fluorescence characteristics at various excitation
wavelength, such as for searching for peaks in an excitation or emission wavelength of an unknown sample.

NOTICE: For proper operation, follow the instruction manual when using the instrument.
Specifications in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latest
technologies and products for our customers.

For further information, please contact

Tokyo, Japan your nearest sales representative.
http://www.hitachi-hitec.com/global/science/
24-14 Nishi-Shimbashi 1-chome, Minato-ku, Tokyo, 105-8717, Japan
Tel: +81-3-3504-7211 Fax: +81-3-3504-7123

Printed in Japan (H) HTB-E062 2010.1