Test & Measurement Handbook 2017 PDF

How to reduce oscilloscope noise during measurements Page 6 Simplifying signal generation using arbitrary waveform generators Page 10
June 2017
Test & e n t
Measu r e m
H A N D B OO K
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TEST & MEASUREMENT HANDBOOK
SEEN A GHOST? BLAME

LEE TESCHLER
EXECUTIVE EDITOR
ELECTROMAGNETIC FIELDS
WED like to think that the average viewer who tunes
into a TV show on the SciFy channel called Ghost
Hunters might get a laugh out watching investigators
claimed to get nocturnal visits from the Holy Spirit.
Persingers group found that an electric clock near the
17-year-olds bed generated electromagnetic pulses with
prowl around places that are reported to be haunted. But waveforms resembling those found to trigger epileptic
the show participants seem to be completely serious and seizures. Removing the clock stopped the girls visions.
unconcerned about the fact they find essentially nothing Persinger theorized that the clock, in combination
week after week. with mild brain damage that the girl had sustained at
Our own impression of the show is that the producers birth, were likely contributing to the perceived ghostly
are quite lucky that average TV viewers dont understand experiences.
the workings of either gauss meters or RF power meters. Persinger has done a lot of research on how
Unsurprisingly, not much happens on Ghost Hunters. electromagnetic stimulation of the frontal lobes of
Investigators set up electronic equipment in what are the brain can induce feelings of a sensed presence.
supposedly paranormal hotspots. They then spend several However, the field levels involved must be pretty high and
hours taking electromagnetic field and temperature are usually generated by having a subject wear special
readings, recording audio, and filming with digital video headgear sometimes dubbed a God helmet. Experiments
cameras. with lower levels of EM stimulation, as might arise when
Perhaps to make up for the lack of action, show someone wanders around a room, have been somewhat
investigators have tended toward instrumentation that controversial. Research groups have mostly been unable to
provides more audiovisual interest than just numbers see any ghostly hallucinations under such circumstances
on a display. They have used an EMF meter on which though Persinger claims some success in this area.
LEDs, rather than a number on an LCD, give a measure Getting back to Ghost Hunters, investigators on the
of field strength. Theyve also employed a custom- show seem to act as though fluctuations on their gauss
made geophone (normally used for detecting seismic meters may indicate a ghostly presence. If Persinger is
disturbances) which flashes LEDs in proportion to the correct, a noteworthy reading on a gauss meter is more
intensity of vibrations. Another EMF detector they use likely an indication of hallucinations rather than any
buzzes when it detects an electromagnetic field. spiritual activity.
The fact that Ghost Hunters uses EMF detectors And theres no reason spirit hunters on the show need
in any capacity might lead the average viewer to think special instruments to see magnetic fields. There are some
that ghosts are some how expected to generate pretty nifty apps for the iPhone that will use the phones
electromagnetic energy. But a better grasp of the origin Hall sensors to read out not only the magnitude but also
of this idea could pour even more cold water on the the direction of magnetic fields on the order of 25 to 65
proceedings in the show. mT range as created by the earth.
The connection between ghostly appearances and Of course, waving around an iPhone rather than a
EMFs was theorized by Michael Persinger, a neuroscientist gauss meter probably doesnt look particularly convincing
at Laurentian University in Canada. In one of his studies if you are playing to an audience hoping to see evidence
he describes the experiences of a teenager who in 1996 of ghosts.
2 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com
Commentary T&M Handbook 6-17 V1.indd 2 6/13/17 8:52 AM

CHARGE UP
YOUR SUMMER
b a t t e r y h o l d e r s . c o m
MPD
m e m o ry p r o t e c t i o n d e v i c e s
mpd | t&m 5.17.indd 3 6/12/17 11:46 AM

INSIDE THE TEST & MEASUREMENT HANDBOOK
23
10
16
02 Seen a ghost? Blame electromagnetic fields
06 How to reduce oscilloscope

noise during measurements
Several tricks can help reveal small signals that are obscured
by measurement system noise.
10 Simplifying signal generation using

arbitrary waveform generators
New instruments excel at constructing super-complicated
waveforms that once took a lot of time to create.
16 Better testing with well-controlled ac power

Modern ac power supplies are adept at cleaning up line FIND IT ONLINE:
conditions that can lead to garbled electrical test results.
OSCILLOSCOPE BUYERS GUIDE
23 The case for dc power quality measurements Our oscilloscope buyers guide gives
New instruments excel at constructing super-complicated instrument users a handy way to compare
waveforms that once took a lot of time to create. scope offering and make side-by-side
comparisons. This online guide will help
you become familiar with different types of
27 Safer testing with dynamic power supplies scopes, common accessories and features.
It can be easier to use programmable auto-ranging power
supplies as alternatives to fuel-cell power sources that would
PRODUCTS.DESIGNWORLDONLINE.COM
otherwise force the installation of safety and compliance /PRODUCTS/OSCILLOSCOPES
equipment just to run a few characterization tests.
Contents & Staff T&M 6-2017 V1.indd 4 6/13/17 8:22 AM

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Contents & Staff T&M 6-2017 V1.indd 5 6/9/17 4:05 PM

HOW TO REDUCE OSCILLOSCOPE
TEST & MEASUREMENT
NOISE DURING MEASUREMENTS

Several tricks can help reveal small signals that
are obscured by measurement system noise.
H A N D B O O K
KENNY JOHNSON
KEYSIGHT TECHNOLOGIES, INC.
THERE is a need to observe

small signal details
in many modern applications.
Transducers, biomedical
sensors, high energy physics,
power integrity, and high-speed
digital designs are examples
of situations where details can
be obscured by measurement
system noise. Measurement
system noise is the noise of
the oscilloscope, probes and
connection method that is
superimposed on the signal of
interest.
When the signal being
observed is small, like the ac
ripple and noise on a power
supply, the signal presented on
the screen of the oscilloscope
The baseline noise of the 50-
may only vaguely represent what is A measurement
input (top) and 1-M input of
real if care is not taken to reduce measurement of the baseline noise a Keysight DSOS054A High-
system noise. The complete elimination of of the oscilloscope Definition Oscilloscope (500MHz,
measurement system noise is not a realistic measurement system four channels).
goal though there are some practical steps that is a sanity check similar
can be taken to substantially reduce it. to shorting the leads
One obvious suggestion is to choose the together on a DMM
low-noise path. Unfortunately, many users before making a continuity or resistance
stumble here, not knowing they may have measurement. It is a good practice to perform
even better options available to them. The whats called a null measurement on the
oscilloscope measurement path consists of complete oscilloscope measurement system
the oscilloscope being used and the scope including probe and connection accessoriesto
input termination50 or 1 M. For many be confident that the oscilloscope, probe and
oscilloscopes, the 50- input is a lower-noise connection method are appropriate for the
path than the 1-M path. measurement about to be undertaken.
Keysight 2 T&M 6-17 V2.indd 6 6/12/17 9:08 AM

HOW TO REDUCE OSCILLOSCOPE NOISE
To make a null measurement simply configure the TABLE 1. NULL MEASUREMENT

oscilloscope and probes as they will be used during the
measurement, including sensitivity (volts/division) and
time base (time/division), then short the probe input to BANDWIDTH V pp Vr m s
ground (or short the inputs together on a differential
2 GHz 1,040 V 110 V
probe) and measure the noise. If the results from the null
measurement are not acceptable, it may mean that a 1 GHz 860 V 90 V
different oscilloscope, probe, or connection method needs
500 MHz 800 V 80 V
to be used.
20 MHz 460 V 60 V
Bandwidth limits Table 1. Null measurements taken with a Keysight MSO-
More bandwidth is better, right? Not always. The noise 804A oscilloscope (8 GHz, 10-bit ADC, 20 GSa/sec) with an
voltage of an oscilloscope, probe, and connection accessory N7020A Power Rail probe (2 GHz, 1:1 attenuation).
are a function of frequency. Limiting the used bandwidth to
only the amount necessary for the given measurement will bandwidth. The signal bandwidth can be calculated from the
reduce the amount of oscilloscope, probe and connection rise time of the signal: signal bandwidth = 0.5/rise time.
noise that shows up in the measurement. If the signal of interest is not digital or is of an unknown
Oscilloscope manufacturers recognize the need to source, like noise on a power rail, theres an alternative
adjust bandwidth to make different measurements and approach. In this case, the signal is probed at the full
have provided a variety of bandwidth limit presets. Some bandwidth of the measurement system and observed in
manufacturers also provide the ability to set any bandwidth the frequency domain via an FFT (Fast Fourier transform) to
limit to further tailor the limits to the measurement. If see the frequency at which the signal content diminishes.
a desired preset or adjustment is not available a math A bandwidth limit can then be set at or near the frequency
function can be implemented to filter the signal, though observed with the FFT.
this can reduce throughput because there are calculations Oscilloscope probes can have an impact on noise.
performed on each acquisition. Probes come in a variety of attenuation ratios. Probably
To use this filtering technique, one must know the most familiar is the 10:1 passive probe. One benefit of
amount of bandwidth necessary for the signal of interest. using a 10:1 probe is that it allows the measurement of
There are resources available on oscilloscope manufacturer signals that otherwise would exceed that maximum input to
websites that explain, in depth, how to determine the the oscilloscope. The down side of attenuation is that the
needed bandwidth. In summary, for digital signals, scope noise relative to the size of the signal being measured
the necessary oscilloscope bandwidth is 2X the signal increases proportionally to the attenuation ratio.
Fill the screen

Oscilloscope noise, resolution, and accuracy are
a function of the full-screen voltage or volts-per-
division. It is a good practice, then, to always
expand the signal being measured to fill the
whole screen of the oscilloscope. This not only
minimizes the amount of oscilloscope noise but
also improves accuracy and resolution.
Noise comparison of a 1:1 and 10:1 probe measuring a 50

mVpp sine wave. Both a 10:1 probe and a 1:1 probe measure
the same signal, simultaneouslya 20-MHz 50 mVpp sine
wave. The only difference between the two measurements is
the attenuation ratio. The 1:1 measurement is 52 mVpp while
the 10:1 measurement is 65 mVpp. The higher attenuation
ratio overstates the measurement by at least 25% due to
the reduced signal-to-noise ratio resulting from the higher
attenuation. This illustrates that with small signals where
oscilloscope and probe noise can problematic, it is best to use
as small an attenuation ratio as possible to minimize noise.
Keysight 2 T&M 6-17 V2.indd 7 6/12/17 3:09 PM

TABLE 2. SCOPE NOISE
VERUS SENSITIVITY
TEST & MEASUREMENT
Accuracy is commonly 1-2% of the full screen voltage. RMS NOISE

Taking an eight-bit A/D as an example, the resolution is the VERTICAL
FLOOR (V rms AC)
full-screen voltage divided by 256 (28). A bad habit that many SENSITIVITY
users have is when viewing more than one signal on-screen, ON 50- INPUTS
they will scale each signal so the signals do not overlap and 1 mV/div 260 V
are easier to see rather than creating individual windows or
2 mV/div 260 V
graticules for each waveform.
Noise can impact probe use in another way: Oscilloscope 5 mV/div 320 V
probes usually come with a wide variety of connection
10 mV/div 390 V
accessories to accommodate various targets and improve ease-
of-use. For example, probes come with a variety of ground 20 mV/div 620 V
leads and ground clips. The long ground leads are included 50 mV/div 1.4 mV
H A N D B O O K
as a way of making convenient qualitative measurements

like checking that data lines are toggling or that a supply is 100 mV/div 3.1 mV
up. When making important, quantitative measurements like 200 mV/div 6.4 mV
rise time, overshoot, ripple, et cetera, the shortest ground
500 mV/div 13.3 mV
connection possible should be used. External noise sources can
couple in the loop of the ground connection. The smaller the 1 V/div 24.1 mV
loop area of the ground connection the less susceptible it is to Table 2. The baseline noise of a Keysight
picking-up external noise. DSO-S804, 8-GHz oscilloscope at different
If the signal of interest is repetitive and there is no desire to vertical sensitivities (volts per division).
capture transient events, then averaging is an effective method
of reducing noise. Averaging is an acquisition mode where the
oscilloscope overlays or averages a predetermined number of acquisitions into one
waveform. Over multiple acquisitions, random noise will be averaged-out resulting in
a crisp view of the signal.
Another noise-reduction option available on some oscilloscopes is high-
resolution mode. This mode is like averaging in the way it reduces noise, yet it can
be used on non-repetitive signals. High-resolution mode averages together multiple
Consider the waveforms of an FPGA core supply (top trace) and FPGA data line (bottom trace) measured on a Keysight
MSO-S804 (8-GHz Mixed Signal Oscilloscope). Visually, the information presented to the users eye looks the same yet
any measurements made on the waveforms on the left side screen will have half the oscilloscope noise, twice the vertical
accuracy and twice the resolution as measurements made on the waveforms on the right-side screen. This is because the
signals on the left are expanded to fill the screen (there are two screens or graticules placed side-by-side) while the signals
on the right only fill half the screen. Considering the top trace, FPGA core voltage, the screen on the left is 100 mV/div
versus 200 mV/div on the right. From Table 1, we see the oscilloscope noise is 3.1 mVrms vs 6.4 mVrms (left/right respectively).

HOW TO REDUCE OSCILLOSCOPE NOISE
SIMPLE SCOPE BLOCK DIAGRAM

A BRIEF LES S ON IN S C OPE N OI S E :
There are two primary sources of noise in an
oscilloscope-and-probe system. The input amplifier
and buffer circuits in the scope contribute some
noise, and the probe amplifier of an active probe
has its own noise. Scopes use an attenuator to vary
the vertical scale factor. The scopes noise arises
after this attenuation. When the attenuator is set
to something greater than 1:1 (the scopes most
sensitive hardware range) the noise will appear to be larger relative to the signal at the input connector of the scope.
Consider a scope that has a basic sensitivity of 5 mV/div with no attenuation inserted (1:1). For this example, we will say
this scope has a noise floor of 500 Vrms at 5 mV/div. If we change the sensitivity to 50 mV/div the scope inserts a 10:1
attenuation in series with the input. The noise then appears as if it were 5 mVrms relative to the input (500 V10). The
same thing happens when a probe with attenuation is attached to the scope. The scope noise appears larger relative to
the signal at the input to the probe by the amount of the attenuation.
adjacent sample points of a single acquisition to create

a single sample point. In this way, it averages out the
effects of random noise on the signal captured by the
oscilloscope. The limitation to high-resolution mode is
that it reduces the bandwidth of the measurement.
For example, if an oscilloscope sampled data at 8
GSa/sec its Nyquist bandwidth would be 4 GHz. If the
same oscilloscope averaged together four adjacent
points to create one new point in high-resolution
mode, its effective sample rate would be 2 GSa/sec
and its Nyquist bandwidth would be 500 MHz.
In a nutshell, there are multiple, easy-to-implement
techniques available to help measure small signals
or signals where measurement system noise can be
troublesome. Sometimes only one or two techniques
-- like filling the screen or limiting bandwidth -- are
enough. However, it is good to be aware of all these
techniques for occasions when more challenging
conditions present themselves.
REFERENCES
HOW TO DETERMINE HOW MUCH BANDWIDTH YOUR SCOPE
NEEDS,
www.youtube.com/watch?v=ZuhLDAPH7FE
www.keysight.com/main/redirector.jspx?action=ref&cname=
EDITORIAL&ckey=509008&lc=eng&cc=US&nfr=-11143.0.00
EVALUATING OSCILLOSCOPE BANDWIDTHS FOR YOUR

APPLICATION
http://literature.cdn.keysight.com/litweb/pdf/5989-5733EN.
pdf?id=885255
6 2017 DESIGN WORLD EE Network 9

SIMPLIFYING SIGNAL GENERATION
TEST & MEASUREMENT
USING ARBITRARY WAVEFORM

GENERATORS
H A N D B O O K
New instruments excel at

constructing super-complicated
ITS hard to beat arbitrary waveform generators (AWG) for
convenience and flexibility when it comes to generating
signals for test applications. If a waveform can be defined or
waveforms that once took a lot of captured, chances are good that an AWG can generate it. Whats
more, the last few years have seen significant advances in digital-to-
time to create. analog converter (DAC) technology, making it possible to directly
generate high-bandwidth, high-frequency signals with high fidelity.
As DAC technology and AWG instruments have become more
CHRISTOPHER SKACH capable, so too have the techniques for designing the various
SAHAND NOORIZADEH waveform types necessary for radar and electronic warfare (EW)
TEKTRONIX or for a variety of applications in verification, characterization,
and stress/margin testing. The traditional approach has involved
defining waveforms in software programs such as Excel or Matlab
or even in simple .txt text files and importing them into the AWG.
This approach offers flexibility but also requires in-depth knowledge
about the waveforms in question, and it can be tedious and time
consuming. To improve efficiency and
INSIDE AN AWG productivity, AWG vendors are now
adopting a modular software-based
Int. or Ext. plug-in architecture that allows for
Noise Source
point-and-click waveform design.
Out AWG trends

Analog Fundamentally, an AWG is a
Waveform Shift
DAC Output sophisticated playback system that
Memory Register
Circuit
delivers waveforms based on stored
digital data. The digital data describes
the constantly changing voltage
levels of an arbitrary signal. An AWG
starts with a digital representation
Memory of waveforms that are either defined
Address From Ext. Trigger
mathematically or derived from
Control measurements made on actual signals
and then stored as waveform files.
These files are then played back from
memory. As you might expect, this
Clock Oscillator From Ext. Clock A simplified block diagram practice makes memory a valuable
of an AWG architecture.
commodity for AWGs. The more
Tektronix T&M 6-17 V2.indd 10 6/12/17 3:10 PM

I N T E R C O N N E C T C O m P O N E N T S & h a R d wa R E
Battery Clips, Contacts & Holders Fuse Clips & Holders Terminals and Test Points
Spacers & Standoffs Plugs & Jacks Multi-Purpose Hardware
Its whats on the InsIde that counts

E L E C T R O N I C S C O R P.
www.keyelco.com (718) 956-8900 (800) 221-5510
EE-T&M-THiNK
keystone | t&m 5.17.indd
Corp 6-17.indd
11 1 6/12/17
5/4/17 11:47
4:10 PM
AM
memory available, the longer the run times for signal details accurately. Expressed by the number
TEST & MEASUREMENT
generated waveforms. of binary word samples, memory can range from 2

Sample rate, usually specified in terms of Gsamples for mid-range AWGs to 16 Gsamples for high-
megasamples (MS/sec) or gigasamples per second end instruments. For reference, 2 Gsamples of waveform
(GS/sec), denotes the maximum clock or sample rate memory can play 400 msec of data at 5 GS/sec, which is
at which the instrument can operate. The sample rate sufficient for most applications.
affects the frequency and fidelity of the main output An instruments bandwidth is independent of
signal. The Nyquist criterion states that the sampling the sample rate. The analog bandwidth of a signal
frequency, or clock rate, must be more than twice generators output circuitry must be sufficient to handle
that of the highest spectral frequency component the maximum frequency that its sample rate will support.
of the generated signal to ensure accurate signal In other words, there must be enough bandwidth to
reproduction. To generate a 1-MHz sine wave signal, pass the highest frequencies and transition times that
for instance, it is necessary to produce sample points can be clocked out of the memory, without degrading
at a frequency of more than 2 MS/sec. Although the signal qualities.
H A N D B O O K
Nyquist is usually cited as a guideline for acquisition, Another important AWG consideration is vertical
as with an oscilloscope, its pertinence to signal resolution. It pertains to the binary word size, in bits,
generators is clear: Stored waveforms must have of the instruments DAC. The vertical resolution of the
enough points to faithfully retrace the details of the DAC defines the amplitude accuracy and distortion
desired signal. of the reproduced waveform. A DAC with inadequate
Modern, high-performance AWGs offer deep resolution contributes to quantization errors, causing
memory depth and high sample rates. These imperfect waveform generation. While more is better, in
instruments can store and reproduce complex the case of AWGs, higher-frequency instruments usually
waveforms such as pseudo-random bit streams. have lower resolution. Taking advantage of the latest
Similarly, these fast sources with deep memory can advances in DAC technology, AWGs are now appearing
generate extremely brief digital pulses and transients. on the market with an impressive combination of
Memory depth plays an important role in signal 16-bit resolution and a 10 GS/sec sample rate. AWGs
fidelity at many frequencies because it determines with higher sample rates in the 50 GS/sec range or so
how many points of data can be stored to define typically have 8- or 10-bit vertical resolution.
a waveform. Particularly in the case of complex A growing number of applications require multiple
waveforms, memory depth is critical to reproducing output channels that must be precisely synchronized.
THE COMPLEX PATH FROM WAVEFORM MEMORY TO ANALOG OUTPUT
As this simplified block diagram of the

DAC in a Tektronix AWG5200 illustrates,
modern DACs incorporate digital signal
processing and conditioning.
Tektronix T&M 6-17 V2.indd 12 6/12/17 9:14 AM

SIMPLFYING SIGNAL GENERATION
The ability of AWGs to work in one of several DAC

modes allows instrument users to output signals at the
For obvious reasons, anti-lock braking systems in cars require four stimulus cleanest portion of the DAC bandwidth and frequency
signals. Biophysical research applications call for multiple generators to roll-off positions.
simulate various electrical signals the human body produces. Quantum
computing applications push multi-channel output requirements to new
levels. These applications involve sending dozens or even hundreds of features enable direct generation of complex RF and
synchronized signals to manipulate q-bits. Another extreme example is other signals in an efficient and compact way.
that of occupied spectrum measurements where designers must try to AWGs that incorporate these highly-integrated
simulate an environment filled with RF/microwave signals from military and DACs offer such features as a digital complex
commercial radar and radios as well as countless consumer devices. For modulator and multi-rate interpolation. With
these measurements, the more test sources the better. internal quadrature (also called IQ) modulation, IQ
To meet multi-channel signal generation requirements, the latest mismatches often attributed to external modulators
AWGs offer up to eight analog output channels per instrument, and and mixers are eliminated. (IQ imbalances arise
multiple instruments can be synchronized to create large systems with 32+ from mismatches between the parallel sections of
channels. In the case of the Tektronix AWG5200 introduced earlier this the receiver chain dealing with the in-phase (I) and
year, each of the instruments eight independent channels provide less than quadrature (Q) signal paths.) Also, there is no in-
10 psec channel-to-channel skew. Each of the channels have independent band carrier feed-through, and there are no images.
paths out, individual amplification, separate sequencing, up-conversion, Built-in interpolators also support the ability to create
dedicated memory, and can be controlled independently with minimized waveforms more efficiently. This feature reduces
cross talk or limitations on performance. The only common factor is that waveform size and compilation times and extends
all channels share a common clock or, if the user chooses, can share an playback time as well.
externally supplied reference clock. DACs offer a variety of familiar modes including
non-return-to-zero (NRZ) mode, return-to-zero (RZ)
Advancing DACs and mix-mode. AWGs provide access to these modes
The push to reduce the size and cost of telecommunication and military to ensure signals are output at the cleanest portion of
systems is driving manufacturers to integrate more functions into a single the DAC BW and frequency roll-off positions.
DAC chip. Some advanced high-speed DACs also incorporate digital
signal processing and conditioning functions such as digital interpolation, Creating Waveforms
complex modulation, and numerically controlled oscillators (NCO). These It has always been a significant design challenge

TEST & MEASUREMENT
to create stimulus signals that can fully exercise a prototype. In the case add appropriate stresses and impairments
of RF applications, complex high-frequency modulated signals with jitter, needed to simulate real-world conditions.
spread-spectrum clocking, and other time-variant effects have traditionally To speed the process of creating
required a benchtop of pulse, function, modulation and RF generators. waveforms for specific applications
Compared to these alternatives, an AWG provides finer control, or to simulate complex real-world
granularity and repeatability for the signals and stresses being generated. environments, AWGs are now available
The wide variety of different waveforms that AWGs create can ultimately with a special plug-in architecture.
lead to thousands of different test scenarios. Additionally, the AWGs It integrates into the AWGs GUI, or
sequencing abilities can be helpful. Sequencing means iterating over can be run on a PC and be moved to
several segments with each segment comprised of several samples. AWGs the AWG over an Ethernet LAN. The
may support several stored sequences and may also allow programmatic library of available plug-ins continues
control of the sequences using external triggers. Sequencing allows users to grow. If plug-ins are available for a
to sweep through a wide range of voltage values and stresses. The AWG particular application area of interest,
H A N D B O O K
generates multiple waveforms and sequences them so they emulate the the plug-in should be considered the
effect of turning the knob to dial-in jitter. go-to starting point. The plug-in can
Another advantage of AWGs is their ability to save waveforms, edit always be complemented with waveforms
them offline, then share them with teams globally. This can help to isolate created externally or imported from a test
bugs early in the development cycle for globally dispersed teams, for instrument such as an oscilloscope.
example. Heres a rundown on some of
For many users, the default approach for generating signals is to use the more common plug-ins and their
MathWorks Matlab and the Signal Processing Toolbox, which provides a capabilities:
broad set of functions and apps to generate, measure, transform, filter and Generic precompensation Users
visualize signals. The Instrument Control Toolbox lets users then configure today need the cleanest signals
and control AWGs in Matlab. and the lowest EVMs possible. The
For users who fall short of Matlab guru status, however, it can be precompensation plug-in simplifies the
a challenge to create the signals needed for complex applications, process of generating correction factors
particularly if there are many subtleties and changes that must be made and applying them to get the best signals
quickly for what-if analysis. It can be time consuming, for example, to use and cleanest performance from an AWG.
Matlab in applications such as the testing of receivers for compliance to For instance, when creating
complex standards such as MIPI D-PHY or PCIe Express. The process will waveforms that test wideband receivers,
involve painstakingly walking through the standards test documentation to it is important that the AWG signals have
0
R
The importance of precompensation for correcting AWG signals is evident in

this correction example using a 16 QAM 32-Gbaud waveform.

SIMPLFYING SIGNAL GENERATION
a flat frequency and linear phase response. Users can compensate for the first and schemes can be defined with a variety of
second Nyquist zones of the AWG. Users can define the LO frequency and choose preloaded modulation formats including
to get correction coefficients for either the lower or upper side bands as well as BPSK, QPSK, OQPSK, OOK, NRZ, up
define the carrier frequency. Users can also define the bandwidth of compensation to 8 PAM and QAM8. Baseband data
either by specifying start and end frequencies (RF & IF) or bandwidth (in IQ/IQ with can be selected from several predefined
modulator). patterns, user-defined patterns, or from
High-speed serial High-speed serial data signals continue to grow more a pseudorandom binary sequence (PRBS)
complex. The plug-in for high-speed serial simplifies signal creation and jitter 31 generator, and each N-bit word can be
simulations to reduce overall development and test time. It can be used to create defined with symbols from N unique data
the waveforms required for thorough and repeatable design validation, margin/ streams.
characterization and conformance testing. Whether you use one of the above
Specific capabilities include generation of jitter (random, periodic (sinusoidal), plug-ins standalone or design waveforms
inter-symbol interference (ISI), and duty cycle distortion (DCD) as well as spread- using other software tools like Matlab
spectrum clocking (SSC), pre-emphasis, and noise addition. A combination of or Excel, it has never been easier to
various impairments can be created simultaneously to stress the receiver. The input generate high-fidelity signals for test and
data pattern can be scrambled by defining a polynomial. The pattern duty cycle can measurement applications in conjunction
also be defined using pulse-width modulation (PWM), which allows for alternatively with a modern AWG.
encoding the bit stream at up to 16-PAM.
Multi-tone and chirp This plug-in is useful for military, aerospace, and RF
applications where creating and generating tones are part of a successful mission.
Tones can be created for various applications, including noise power ratio (NPR),
with a set of desired start and end frequencies, spacing or the number of tones.
Frequencies can be notched out by setting the start and end frequency of choice.
When generating chirps, the user can decide between high-to-low or low-to-high
frequency sweeps and define chirp qualities by sweep time or by sweep rate.
While creating waveforms for testing wideband receivers, it is important that
the test equipment generate signals with flat frequency and linear phase response.
REFERENCES
In this regard, correction files can be directly applied to tones or chirp waveforms
while they are being compiled. TEKTRONIX INC., AWG5200,
www.tek.com/datasheet/arbitrary-
Optical High-speed telecommunications networks are moving toward faster
waveform-generators-1
and more complex modulated signals. The optical plug-in simplifies waveform
creation to reduce design iteration intervals. Single or dual-polarization modulation
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BETTER TESTING WITH
TEST & MEASUREMENT
WELL-CONTROLLED AC POWER
Modern ac power supplies are adept at cleaning up line
conditions that can lead to garbled electrical test results.
H A N D B O O K
STEVE BOEGLE
BEHLMAN ELECTRONICS, INC.
IF you plug your products power cord into any unregulated standard
factory ac main, there is a possibility that the power you are using
could corrupt any testing you do. The quality of ac power can degrade
One example of an ac supply
and frequency converter is the
Behlman Model P1351, a 1.2-kVA
single-phase bench-top (or rack-
the performance of equipment being tested. Corrupted ac power can mount) instrument that delivers
make equipment appear to be on-spec when it is off-spec, or off-spec clean regulated ac power in a
when it is on-spec. Either way, bad test results can be costly. They can (2U) 3.5-in.-high and (3U) 5.25-in.-
bring unnecessary engineering time spent fixing non-problems, or worse, high form factor. The P Series can
simulate power from any utility
result in costly fixes of faulty units in the field, with a simultaneous loss of
as well as aircraft and shipboard
customer confidence. power.
Simply put, plugging sensitive instruments to be tested into your
factory ac mains is a gamble not worth the risk.
Commercially generated electricity is distributed at high voltages
over long distances by power utilities. At local substations, that electricity
is stepped down onto lower-voltage power lines. (Note that some large
power users such as iron smelting facilities may have what amounts to their
own substation inside the walls of the plant.) Power from the substation
routes to distribution transformers at each residence and commercial
Behlman T&M 6-17 V2.indd 16 6/12/17 10:15 AM

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TEST & MEASUREMENT
building. These transformers step

the voltage down to 120 Vac. But
outside factors can cause sags or
spikes in the electricity available from
the ac socket. For example, consider
the effects of a brownout, a drop
in voltage on an electrical power
distribution system. Brownouts can
last for seconds, minutes or hours.
There are also short-term voltage
sags (dips). Even under normal
conditions, variations of 5% at the
H A N D B O O K
point of service are within typical

power utility specifications.
A problem faced by equipment
manufacturers and testing facilities is
that they can never be 100% certain
that the voltage from their ac mains
is at exactly the right level. In fact,
their ac mains power may not be
sufficiently predictable for accurate,
repeatable testing. In addition, their
inability to control the voltage and
frequency may also cause other
problems.
Fortunately, a regulated electronic
ac supply can solve power quality
issues as well as provide additional
testing flexibility.
Even occasional, self-inflicted
power quality issues can disrupt
operations. A typical production
facility may experience voltage
fluctuations caused by heavy loads
switching on during a typical day.
In addition to voltage fluctuations
and distortion, there is also the
possibility of high-voltage, high-
TOP: Small shop vacuum started with
frequency transients from nearby load switching, lightning,
a Behlman Model P1350 power supply.
and electromagnetic interference from faulty or improperly This illustrates the use of a supply able
installed devices connected to the same line. to provide a temporary high output
The layout of the facility distribution system wiring will for starting. Note the maximum RMS
also affect the voltage delivered to any individual outlet. current value exceeds the units 10-A
rating. (Top trace = 100 V/div; bottom
Three-phase systems may additionally suffer from phase
trace = 20 A/div)
imbalance caused by poorly distributed single-phase loads.
Any voltage fluctuations at the point of testing become more BOTTOM: Small shop vacuum soft-
apparent as the power level of the product being tested started with a Behlman model P1350
rises. For these reasons, testing facilities may use electronic power supply. The voltage was set to
zero, and then adjusted to 115 V using
supplies like the Behlman P1351 series which can reduce
the front panel control.
voltage variations to below 1% over specified line and load
conditions.

BETTER TESTING
Harmonic distortion and deviations in voltage can have specifications can cause problems for manufacturers.
a large negative impact on test results. During efficiency In addition to adding engineering costs and delaying
measurements, for example, variations in the applied products, inaccurate measurements could bring reliability
voltage over time can degrade results. Power factor and and safety ramifications. Ultimately, customer satisfaction
in-rush current measurements will be affected by line suffers.
impedance. In a typical factory, this impedance varies over Electronic ac power supplies can help evaluate
time and with location within the facility (distance to service components and sub-assemblies. They can also help verify
entrance). Varying line impedance can also be a problem the performance of items like transformers, fans, relays,
when performing certain commercial product tests, where actuators, and other ac-operated components. These power
the impedance must be known or measured. Use of a supplies can additionally play a role in what-if scenarios for
regulated ac supply can allow for standardization of tests design changes. Many include meters to monitor voltage,
results. current, power, and frequency. Just like a dc bench supply,
a bench-top or rack-mounted ac power supply can be an
Product design and development asset to any engineering or test department.
Product development often requires testing beyond Many commercial safety test standards require the
operating limits. The inability to accurately measure application of operating voltages and frequencies above or
incremental differences in design changes or verify product below normal limits. Its possible to adjust voltages using
BEHLMAN P SERIES AC POWER SUPPLIES / FREQUENCY CONVERTERS
POWER OUTPUT VOLTS OUTPUT OUTPUT INPUT VOLTS DIMENSIONS

MODEL FREQUENCY STANDARD FEATURES
(VA) VAC (RMS) (AMPS) (HZ) 10 VAC (19-IN. RACH MOUNT)
Fixed at 50, 60 Three fixed frequencies

P1350 1,350 0-135, 0-270 10, 5 120 3.5 in. H x 17.5 in. D
and 400 and variable voltage
Variable voltage and
P1351 1,350 0-135, 0-270 10, 5 45-500 120 3.5 in. H x 17.5 in. D
frequency
Programmable voltage
P1352* 1.350 0-135, 0-270 10, 5 45-500 120 3.5 in. H x 17.5 in. D and frequency, plus
RS-232
P2001 2,000 0-135, 0-270 45-500 45-500 120 5.25 in. H x 17.5 in. D
frequency
Programmable voltage
P2002* 2,000 0-135, 0-270 15, 7.5 45-500 120 5.25 in. H x 17.5 in. D and frequency, plus
RS-232
Three fixed frequencies
PF1350 1,350 0-135, 0-270 10, 5 Fixed at 50 95-270 3.5 in. H x 21 in. D and variable voltage
with CE mark
PF1351 1, 350 0-135, 0-270 10, 5 45-500 95-270 3.5 in. H x 21 in. D
frequency with CE mark
PF1352* 1,350 0-135, 0-270 10, 5 45-500 95-270 3.5 in. H x 21 in. D frequency with CE mark,
plus RS-232
*P1352, P2002, and PF1352 also offer Option U, which includes USB, Ethernet, and RS-232 Interface using SCPI protocol. (This option enables
faster communication speed, power supply programming from greater distances, and compatibility with newer computer systems.) Optional IEEE-
488 is also available on the Behlman P1351, P1352, P2002, PF1351, and PF1352.
Examples of ac power supplies sporting variable frequencies and output parameters

optimized for specialized testing as often arises in motors.

TEST & MEASUREMENT
H A N D B O O K
Three-phase ac power supply models from 1 20 kVA.
simple tapped transformers and variable auto-transformers. The problem Other considerations involve
is such components suffer from poor voltage regulation with load and line the type of test performed. Simple
changes. This makes the adjustment of the test voltage like trying to shoot functional tests generally need
a moving target. simpler supplies than tests aimed at
In addition, the cost of high-quality adjustable auto-transformers, also qualifying a product for efficiency or
known as Variacs, has risen dramatically in recent years. (Instrument Service making power factor measurements.
Equipment now owns the Variac trademark but the word has become For example, certain IEC test
generic for hand-variable autotransformers.) Another disadvantage of specifications spell out how to verify
autotransformers is that they cannot vary the ac line frequency. Products the short circuit current available
intended for international sales generally must operate over a frequency from the ac power source. The
range of 47 to 63 Hz per IEC (International Electrotechnical Commission) specification attempts to provide
test specifications. For the aviation industry, frequencies in the range of some sort of standardization so test
360 to 880 Hz are common. results can be compared. One such
Electronic ac supplies are well suited for production line testing. They test would be the quantification
can be used to provide bulk-regulated ac to test stands and fixtures. of in-rush current or motor-locked
Automated control features like computer or analog control via PLCs rotor current. If the ac supply used
are available to suit most needs. Control via RS-232, IEEE-488, USB and does not have sufficient transient
Ethernet interfaces are common. Single-phase systems in the range of capability, the test can be invalid.
500 VA to 40 kVA and three-phase systems in the 1 kVA to 120 kVA range A high source impedance during
are available from various suppliers. These supplies range from reference testing can mask the true in-rush
quality instruments to modified UPS units. current experienced when the
product serves in its intended
Selecting the right ac supply application.
When it comes to purchasing an ac power supply, obvious factors like The implication here is that
output voltage, current, and frequency range are determined by user certain tests are better served by
needs and/or third-party test specifications. Additional considerations over-sizing the supply to provide a
include surge currents and possible non-linear currents associated with the low source impedance. Consultation
tested products. Products that incorporate pumps, compressors or other with the manufacturers engineering
motor-driven loads can have high starting currents. These currents can staff can help with sizing the power
present issues that can cause test failures. Products with non-linear input source for a particular test.
currents can also distort the ac output.

BETTER TESTING
Tests of ac motors can pose special challenges for ac supplies. The most common type of
single-phase ac motor is the induction motor with capacitive starting. Induction motors that
operate from three-phase power need no capacitors for starting. Here locked rotor current
(or LRA for locked rotor amps) is the worst-case current the induction motor draws. LRA is
generally measured with the rotor anchored so it cant spin. As the motor starts turning, the
rotor current drops and continues dropping until the rotor hits full or rated speed. At this
point the current is at minimum. Rated speed is slightly less than the speed of the rotating
magnetic field and depends on how much torque the motor must produce to
turn the load.
The duration of the LRA current depends on the motor construction and
the mechanical load at start-up. Air conditioning compressors and liquid
pumps are some worst-case examples of start-current duration. Their LRA
can range from several cycles of the ac waveform to several seconds. Motor
manufacturers normally rate their product to either IEC or NEMA (National
Electrical Manufacturers Association) standards. IEC standards provide
values for typical start currents depending on induction motor size. NEMA
tables provide this information in the form of volt-amps during startup. This
information, along with the type of test to be conducted, should be known
before selecting the ac power source.
It is common practice to specify ac supplies around LRA demands. But
for a typical functional or burn-in test, the power supply need only be rated
for the continuous current. And several methods could be used for motor
starting that would reduce the overall continuous power requirement.
Some power supplies offer a motor-test option. These units feature
oversized output devices that allow much higher transient currents than a
standard model while maintaining the size and pricing of a unit rated to only
supply the run current. Some power supplies also provide a constant-current
mode. This mode will automatically reduce the output voltage to limit current
while maintaining a sinusoidal current waveform. This action will allow the
motor to soft start.
Soft starting is often used for induction motors. A soft
starter initially applies a reduced voltage to get the rotor
spinning. Once the rotor is up to speed, applied voltage is
allowed to reach the rated running value. This method works
well for both single- and three-phase motors that do not have
a substantial mechanical load at startup (low starting torque).
Commercial motor starters can be as simple as a fixed
resistor in series with the motor winding that is switched out
once the motor has started. More sophisticated versions
allow for adjustable starting voltages as well as adjustable
timing. Timing and voltage levels are determined from motor
specifications or empirical testing.
The constant-current mode that some power supplies
provide creates soft starting automatically. Soft starting can
also make testing safer as the motor housing will not tend
to move when the motor starts. In one case, a manufacturer
of vacuum cleaner motors experienced this problem: Its test
stands started motors directly from the ac line. High torque
during starting could make a motor leap or roll off the test Three-phase ac
power supply m
stand. The addition of a power supply having a constant- odels from 1
20 kVA.
current mode eliminated the need for restraining the motor.

TEST & MEASUREMENT
H A N D B O O K
Three-phase ac power supply

This change reduced the test set-up time as well as nuisance fuse models from 1 20 kVA.
tripping in the test stand. The start current exceeded 20 A when
connected directly to the ac line, But the 10-A-rated power supply soft-
started the motor and brought the nominal run current to about 5 A.
There is a type of soft start called ramp-up soft start. Here, the test
voltage is applied by connecting the motor to a supply that ramps the
voltage up to the run value. This technique works well for applications
requiring a bit more control of starting torque. Power supplies can
be modified to apply ramp-up voltage for starting compressors
and pumps using smaller power supplies than would be necessary
otherwise. For really tough products like high-pressure pumps, the
voltage and frequency can both be ramped. This method resembles
what takes place in VFD (variable frequency drive) circuits and allows
for controlled torque and acceleration. To perform this type of test, a
power supply with either analog remote control or computer remote
control would be useful.
However, some products are designed with control circuits that
do not respond well to reduced operating voltages. In addition, some
motor tests do not allow for limited current or voltage during starting.
This might be the case, for example, in a test that attempts to quantify
a products maximum start current. In these cases, the ac power supply
must have enough transient power capacity to get the load started.
Power supplies having a Motor Test option provide this kind of
temporary high output. These models are designed to allow high
short-term output currents for periods typically on the order of 500
msec. Supplies with a motor-test option have over-sized output
amplifiers (using IGBTs in these models) and tailor the current-limit
response to allow a particular starting transient. In some cases, the
ac supplies are tailored to a particular motor or product. Again,
consultation with the ac power supply manufacturer is a good place to
begin.
Once the requirements are understood, a discussion with a power REFERENCES
supply manufacturer should be able to pinpoint the correct model to BEHLMAN ELECTRONICS, INC.,
achieve consistent, reliable results. www.behlman.com

THE CASE FOR DC POWER INTEGRITY MEASUREMENTS
THE CASE FOR DC POWER INTEGRITY

MEASUREMENTS KENNY JOHNSON
KEYSIGHT TECHNOLOGIES, INC.
New instruments excel at

constructing super-complicated
WITH the continual rise in circuit density and performance of modern
electronics there has been a proportional increase in the
scrutiny applied to the dc power supplies within these devices. The
waveforms that once took a lot of term applied to the study of this dc power is power integrity (PI). PI is
the analysis of how effectively power is converted and delivered from
time to create.
the source to the load within a system. The power is delivered through
a power distribution network (PDN) that consists of passive components
and interconnects from the source to the load. The PDN includes
device packaging as well as the semiconductor. And it typically spans
measurements made from dc to the multi-gigahertz range.
Product functional reliability is proportional to the quality of the
dc powering the product. Because modern products have many more
capabilities than previous generations, more can go wrong with them
if they lack quality dc power. Thus, there is more emphasis on PI than
ever.
Common PI measurements include:

PARDPeriodic and random deviation is the deviation of the dc
output from its average value with all other parameters constant.
It is a measure of the undesirable ac and noise components that
remain in the dc output after the regulation and filtering circuitry.
It is measured in rms or peak-to-peak, the latter being more
common; over a bandwidth range of 20 Hz to 20 MHz. PARD-like
variations that arise below 20 Hz are usually called drift.
AN ILLUSTRATION OF PARD
Load ResponseThis can refer to a static or transient load and is

a measure of a supplys ability to remain within specified output
limits for a predetermined load. Load response usually includes
Keysight T&M 6-17 V3.indd 23 6/12/17 3:12 PM

TEST & MEASUREMENT
a measurement of the transient recovery time of the supply.

This is the time needed to settle within a predefined band in
response to a load change.
NoiseThis is a deviation of the dc supply from its nominal
value. Noise can include random noise, like thermal noise,
and spurious signals such as switching waveforms coupling in
from adjacent circuits or PARD and load response.
PDN Impedance This is the impedance-versus-frequency of
the PDN, with or without the dc/dc converter. Often a target A simple example showing the effects
impedance is determined during the design phase based on of power supply jitter (PSIJ) on an FPGA
acceptable voltage variation, and then it is measured on the data line. This data was captured using
actual target. a Keysight S-Series oscilloscope and
N7020A Power Rail probe. The target
H A N D B O O K
The idea of analyzing the power distribution path is not novel. initially supplied the FPGA core with
Engineers have been working with the concept of measuring a 5% variation in core voltage. An eye
voltages and currents on power lines since the 1920s. What, then, diagram was constructed on one of the
has led to the current urgency to make PI measurements? FPGA data lines and shows an eye width
As IC gate density rises, so does the power density of ICs. of ~73 psec. Engineers cleaned up the
supply and reduced the variation to <1%.
More gates in a smaller space result in more current consumed A new eye diagram on the same data line
in that same small space. Even if the current draw of each gate reveals that the eye width is nearly 55%
is reduced, the higher number of gates in that small area offsets wider (~114 psec). The only difference
the savings. Power, being the product of voltage and current, will between these two measurements is
therefore rise. This higher power consumption can lead to thermal the amount of noise on the dc supply.
Such improvements are not limited to
failures, reduced battery life, a larger environmental footprint, the core voltages of microprocessors,
and higher product costs from bigger/more power supplies, more microcontrollers and FPGAs. Sensors,
cooling fans, more heat sinks, and larger enclosures. radios and displays will also provide poor
To reduce power demands, designers have dropped operating service if there is excessive dc supply
voltages. As silicon geometries have shrunk, IC operating voltages variation.

THE CASE FOR DC POWER INTEGRITY MEASUREMENTS
have dropped as well to prevent their damage. Core that of a digital line and its associate switching load on the
voltages for microcontrollers, FPGAs, and memory ranged supply. As the digital line goes from low to high it creates
from 3.3 to 5 V twenty years ago and have steadily declined. a sudden current load that may result in a temporary dip in
Modern microcontrollers and FPGAs have a Vcore of 0.9 to supply voltage. When the same line goes from high to low
1.3 V while some LPDDR4 memories have a 0.6-V supply. it releases the load on the supply that potentially results in a
Simply reducing dc voltages is not enough. Previous- momentary spike on the supply.
generation products with 5-V supplies commonly had What happens if dc is not in spec? A loss or compromise
a tolerance of 250 to 500 mV. That same leeway on a of functions is at stake if the dc supply variation is not
modern microcontroller or FPGA would equate to 25 controlled. Excessive noise on the power bus may degrade
to 50% tolerance on a 1-V supply leaving such a device operation and cause data corruption. Device delay is
inoperable. Supply tolerances have shrunk along with affected by variations in the dc supplying that device. As
operating voltages and today they are typically 1 to 3% (10 the supply voltage drops theres more delay through the
to 30 mV for a 1-V Vcore ). These tolerances include the dc gates of that device and vice versa. Thus, variations in
level and static and dynamic transient current response of supply voltage translate into timing jitter, referred to as
the supply. As the amount of acceptable dc supply variation power supply induced jitter (PSIJ). Power supply noise is
has shrunk, it has become increasingly important to verify one of the major sources of timing jitter. For example, it is
the PDN performs as needed to prevent product failures. possible to see up to a 50% wider eye diagram on signals
Transient current loads challenge the dc supply to from FPGAs if core voltage variations are reduced from 5%
maintain voltages within the specified limits, from dc up to below 1%.
to the bandwidth of the switching current, typically above The need for PI is compounded by the growing number
1 GHz. The classic example of a transient current load is of dc supplies inside products today that must be measured
you could incorporate the switch

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TEST & MEASUREMENT
Schematic illustration of digital switching

loads on dc supplies (L) and actual
switching loads of an IoT development
H A N D B O O K
board captured using a Keysight S-Series

oscilloscope and N7020A power rail probe.
The adjacent screen shot depicts switching
loads of an IoT development board. As
the digital line goes from low to high it
creates a sudden current load resulting in a temporary dip in supply voltage. When the same line goes from high to low it
releases the load on the supply resulting in a momentary spike on the supply. The scope screen shot shows the IoT device
in three different modes, idle, simple three-bit counter counting up and four lines simultaneously switching. The digital
lines of the microcontroller are connected to the MSO channels of the oscilloscope and 3.3-V supply is being probed by
the Keysight N7020A power rail probe. The baseline supply ripple, while the device is idle, is a small 6 mVp-p. During
the counting up operation, the switching currents increase the supply noise nearly 3X, and simultaneously switching four
lines boosts the noise nearly 7X. The IoT device being used has 16 digital data lines, and the switching noise will increase
proportionally with more lines active. This illustrates the burden that switching currents place on dc supplies.
and verified. Solid-state drives typically have 12 or more dc REFERENCES

supplies while entry level tablets have about 24 dc supplies. KEYSIGHT TECHNOLOGIES
Modern test equipment like oscilloscopes have about 75 dc www.keysight.com
supplies, and next-generation mobile products are approaching
DIBENE, J. T. II FUNDAMENTALS OF
200 supplies.
POWER INTEGRITY FOR COMPUTER
There are usually only a handful of unique dc voltages inside PLATFORMS AND SYSTEMS. JOHN
a product. The supply count rises because many products carry WILEY & SONS, 2014
multiple copies of common dc supply voltages. There may be www.wiley.com/WileyCDA/WileyTitle/
productCd-1118091434.html
several different functional blocks inside a product that operate
from the same voltages, but each block is given its own supply BOGATIN, E. SIGNAL AND POWER
to prevent interaction or supply contamination from the dynamic INTEGRITYSIMPLIFIED, 2ND ED.,
loads constituted by the other functional blocks. PRENTICE HALL, 2010.
www.amazon.com/Signal-Power-
For example, when a Bluetooth module begins to transmit
Integrity-Simplified-2nd/dp/0132349795
data it will present a sudden load on the supply because of
inrush current. If another resource shares that supply, the WANG, XINJIE - REDUCTION OF
compounded supply load may degrade its operation. To avoid POWER SUPPLY INDUCED JITTER
WITH APPLICATIONS TO DDR
the problem, it is common to arrange things so subcircuits have
CONTROLLER. A THESIS SUBMITTED
their own dc/dc converters acting as a buffer to prevent the TO THE FACULTY OF GRADUATE AND
loading of other subcircuits. POSTDOCTORAL AFFAIRS, CARLETON
In all, modern life is filled with electronic products which all UNIVERSITY. 2016.
www.curve.carleton.ca/system/
depend on the prosaic dc supply to function properly. Engineers
files/etd/b281b419-abb5-4179-8b36-
and technicians responsible for bringing these products to c14963ad4d00/etd_pdf/4e191bf57f073a
market must ensure these products have dc supplies that meet 569fc9913eab2bfc03/wang-reductiono
specifications under all operating conditions. fpowersupplyinducedjitterwithapplica
tions.pdf
Keysight T&M 6-17 V3.indd 26 6/12/17 10:30 AM

SAFER TESTING
SAFER TESTING WITH DYNAMIC

POWER SUPPLIES
It can be easier to use programmable auto-ranging power ERIC TURNER
supplies as alternatives to fuel-cell power sources that would INTEPRO SYSTEMS
otherwise force the installation of safety and compliance
equipment just to run a few characterization tests.
ANATOMY OF A HYDROGEN FUEL CELL

ONE of the most challenging aspects of configuring a
test system is that the test rig must be better
than the situation being simulated. If a device is rated to a
certain temperature level or vibration standard or moisture
resistance, the test systems involved must exceed the test
parameters or the test may not effectively represent real-
world performance.
This relationship between test systems and the things they
test is extremely important when it comes to characterizing
power systems. Improper characterization of power system
performance can result in a product that fails to perform at
the edges of its envelope of operational tolerances, often
with catastrophic results. This failure to perform is especially
an issue with power systems driven by alternate energy
sources like solar panels and fuel cells.
In particular, the simulation of a fuel-cell-based power
system is more complex than just attaching a dc source to the
circuit. Polymer electrolytic membrane fuel cells and related
chemical energy harvesting systems, like reflow batteries
and such, dont generate power with a perfect consistency.
The loads that the fuel cell powers must be able to handle
variations efficiently and effectively. Individual cells in a stack
can receive fuel inconsistently, and thermal issues also impact
fuel-cell performance.
Fuel cells come in many varieties but all
Several issues arise when running a real fuel cell in
work in the same general way. Chemical
a real test environment. One of the biggest challenges is reactions take place at the interfaces of
instrumenting a lab that meets all the regulations and safety concerns that the anode, cathode, and electrolyte. The
arise when working with devices that use hazardous materials. Fuel cells reactions consume fuel (often hydrogen
commonly used in transportation systems, for example, normally have in the case of land or air vehicles) and
create water and carbon-dioxide as an
pressurized hydrogen as a fuel source. Labs working with pressurized
exhaust as well as electricity.
hydrogen must adhere to safety standards associated with the handling of
these pressurized tanks.
Intepro T&M 6-17 V3.indd 27 6/12/17 11:26 AM

POWER SUPPLY FUEL CELL SETUP
VALUE RANGE DESCRIPTION

TEST & MEASUREMENT
Point 1: Uoc 0 V... UN om Open circuit voltage at no load
Point 2+3: U 0 V... UN om Voltage and current define the position of

these two points in the U-I coordinate system,
which represent two supporting points on the
Point 2+3: I 0 A... IN om curve to be calculated
Point 4: Isc 0 A... IN om DC output current at the MPP
Data points entered into a table to describe the V-1 inflection points on a fuel cell performance curve.
H A N D B O O K
U
TYPICAL FUEL CELL A typical polarization curve for a hydrogenoxygen
POLARIZATION CURVE polymer electrolyte membrane fuel cell. Most fuel
cells have the three operating ranges visible here: The
activation polarization region (left-most part of the curve),
the ohmic polarization region (linear middle portion),
and the mass transfer limited region (far right). The
polarization curve is obtained by varying the external load
P2
resistance. This curve is what simulators set up to mimic
fuel cells must reproduce.
Uoc
simulates a fuel cell or fuel cell stack output voltage.

P3
The fuel cell table function is used to prescribe
the voltage and current qualities of a fuel cell. The
procedure consists of first setting up the parameters
I
that define points on a typical fuel cell curve.
Ioc This information is used to calculate a voltage-
current table that is passed to the internal function
generator. The emulator function includes a set-up
Consequently, it is often advantageous to emulate the feature that walks the user through the process of
fuel cell with a programmable power source for testing entering four V-I support points. When finished,
purposes, rather than use real cells. In addition, a testing these points will be used to calculate the curve.
setup should enable devices and components to be easily The fuel cell emulator is an application-specific
tested under a wide range of parameters. And tests can implementation of an FPGA-based function
proceed more quickly than when using a live fuel cell. generator. The function generator uses a table-
Another advantage to having a dynamic testing setup based regulation circuit for the simulation of non-
is being able to test the system beyond the limits of the linear internal resistances. Complex progressions
fuel cell, to create simulation profiles for circumstances can be created by linking together several differently
when the fuel cell is not working properly, and to test the configured sequences. Smart configuration of the
systems end-of-life qualities. Emulation greatly reduces arbitrary generator can be used to match triangular,
time and cost of research and development testing, sine, rectangular or trapezoidal wave functions to
production testing, and certification testing. Highly create, for example, a sequence of rectangular
advanced, programmable power sources should have the waves with differing amplitudes or duty cycles.
programming capability to perform this type of emulation
for testing dc/dc convertors or ac inverters. Programmable Power Sources
For example, the Intepro Systems PSI 9000 series of Fuel cell simulation is just one of myriad scenarios
fast-response dc sources includes just such a fuel-cell needed in both design and production testing of
emulator creating a non-linear voltage output that power conversion devices. Tools like the Intepro PSI
Intepro T&M 6-17 V3.indd 28 6/12/17 3:14 PM

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TEST & MEASUREMENT
Series specifically target difficult test situations COMPARING OUTPUT CURVES FOR AUTO-
resembling those involving fuel cells. They also RANGING AND CONVENTIONAL SUPPLIES
are important in similar applications demanding
fast response times, advanced power simulation
modes, and precision control. Advanced
programmable supplies should always include
an integrated function generator that allows
creation of arbitrary disturbances for complex
testing. They should also include a galvanically-
isolated analog interface for voltage, current,
and power programming and monitoring.
Another useful feature in some
H A N D B O O K
programmable supplies (such as the Intepro PSI

9000) is auto-ranging, which allows for more
voltage and current combinations in the output.
This feature allows you to put out maximum
power in more ways than a traditional power
supply. A traditional supply generally puts out
its rated wattage only when it simultaneously
generates both its rated maximum voltage and
rated maximum current.
Auto-ranging output provides wider operating range
Auto-ranging dc power systems are
than avaliable in conventional supplies. Ordinary
typically a bit more costly than conventional power supplies provide max power only at one voltage
supplies with the same power rating. The price and current. Auto-ranging supplies provide max power
difference is mostly because the output stages over a range of voltages and currents, yielding a
of auto-ranging systems must be designed to power curve like this one.
operate reliably over a wider range of output
voltages and currents. But the real cost is lower
because one auto-ranging unit can be used to Using a regenerative load
replace multiple conventional units. Each chassis features The programmable source used to emulate the
a controller which brings the flexibility of separating the output of fuel cells, in our example, draws its
instrument into individual sources or sources that are power directly from the ac line. The power source
paralleled for high-power applications. output is applied as the input to the device
There are several features under test. By using a programmable electronic
that are increasingly considered regenerative load, a high percentage of the power
must haves for advanced output from the DUT can be regenerated and
power sources. For example, returned to the ac line. This has the exceptional
they should be equipped with benefit of dramatically reducing the direct energy
common communications costs plus reducing the need to expensive, noisy
protocols enabling remote and energy-consuming cooling systems.
programming and operation. In As a quick review, an electronic regenerative
nearly all testing applications, load redirects the power it receives back to the
users should also look for utility by using an internal micro-inverter stage
remote sensing to compensate that is synchronized to the power line input. Use
for voltage drops along the of a regenerative load can reduce the amount
load cables. The power supply of energy that would otherwise be dissipated
automatically detects whether by up to 93%. And it doesnt take much to cool
the sensing input is connected a regenerative load. A 10-kW regenerative load
and will stabilize the voltage dissipates just 700 W of heat, about as much as a
A PSI9000 auto-ranging power supply and the directly at the load. typical hair dryer.
power output curve it typically produces.
Intepro T&M 6-17 V3.indd 30 6/12/17 3:15 PM

SAFER TESTING
THE REGENERATION LOOP
Internally, the dc energy that goes to the

regenerative load flows into a dc-dc converter
which is tied into a dc-ac inverter. The output of the
inverter synchronizes with the utility grid to recycle
the energy. The regenerative load must also include
an automated grid monitoring system that detects
the phase voltage and frequency that is used for grid
synchronization. If the grid drops out, so does the
regenerative load. The unit simply shuts down and
waits for the operator to turn it back on. In general,
savings through reduced energy costs will pay for a
regenerative load in about three years.
All in all, proper system setup when testing power The ultimate energy-saving test setup includes a
systems is more critical than ever, as energy densities regenerative electronic load which recycles energy normally
dissipated in a load back to the ac mains through use of a
rise and power requirements rise. The performance
dc/ac converter synchronized to the ac line frequency.
of the power system is directly linked to effective
thermal management as well as safety and reliability,
so it is not an area to indulge in half measures. The REFERENCES
right emulation system will give the best test results, INTEPRO SYSTEMS,
and your products will reflect the effort. www.inteproate.com
1700V and 2500V XPT IGBTs

For high-voltage, high-speed power conversion applications
FEATURES APPLICATIONS
Thin wafer XPT technology Pulser circuits
Low on-state voltages VCE(sat) Laser and X-ray generators
Co-packed fast recovery diodes High-voltage power supplies
Positive temperature coecient of VCE(sat) High-voltage test equipment
International standard size high-voltage packages Capacitor discharge circuits
AC switches
VCE(sat)
IC25 IC110
VCES max Package
Part Number TC=25C TC=110C Conguration
(V) TJ=25C Style
(A) (A)
(V)
TO-247 TO-268HV IXYH10N170C 1700 36 10 3.8 Single TO-247
IXYH10N170CV1 36 10 3.8 Copacked TO-247
IXYH16N170CV1 40 16 3.8 Copacked TO-247
IXYH24N170C 58 24 4 Single TO-247
IXYX30N170CV1 108 30 3.7 Copacked PLUS247
IXYN50N170CV1 120 50 3.7 Copacked SOT-227
IXYX50N170C 178 50 3.7 Single PLUS247
TO-247HV TO-247PLUS-HV IXYH8N250C 2500 29 8 4 Single TO-247
IXYH8N250CV1HV 29 8 4 Copacked TO-247HV
IXYH12N250CV1HV 28 12 4.5 Copacked TO-247HV
IXYH16N250C 35 16 4 Single TO-247
IXYL40N250CV1 70 38 4 Copacked ISOPLUS i5-Pak
IXYX40N250CHV 70 40 4 Single TO-247PLUS-HV
IXYT25N250CHV 95 25 4 Single TO-268HV
PLUS247 SOT-227B IXYX25N250CV1 95 25 4 Copacked PLUS247
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EUROPE: IXYS GmbH, marcom@ixys.de, +49 (0) 6206-503-249 | USA: IXYS Power, sales@ixys.com, +1 408-457-9042 | ASIA: IXYS Taiwan/IXYS Korea, sales@ixys.com.tw, sales@ixyskorea.com | www.ixys.com
Intepro T&M 6-17 V3.indd 31 6/12/17 11:28 AM

AD INDEX TEST & MEASUREMENT HANDBOOK
Allied Electronics ............................................................................... 29 IXYS ................................................................................................... 31

Anritsu ............................................................................................. IBC Keystone Electronic Corp. ................................................................. 11
Chroma Systems Solutions ............................................................... BC Marathon Special Products ................................................................ 25
Coilcraft ............................................................................................. 15 Memory Protection Devices, Inc. ......................................................... 3
Digi-Key ................................................................................ Cover, IFC Rigol Technologies, Inc. ....................................................................... 1
Equipto ................................................................................................ 9 WAGO Corp. ..................................................................................... 17
SALES LEADERSHIP TEAM
Mike Caruso David Geltman Publisher

mcaruso@wtwhmedia.com dgeltman@wtwhmedia.com Mike Emich
469.855.7344 516.510.6514 memich@wtwhmedia.com
@wtwh_david 508.446.1823
Garrett Cona @wtwh_memich
gcona@wtwhmedia.com Neel Gleason
213.219.5663 ngleason@wtwhmedia.com Managing Director
312.882.9867 Scott McCafferty
Jessica East @wtwh_ngleason smccafferty@wtwhmedia.com
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@DESIGNWORLD
630.488.9029
32 DESIGN WORLD EE Network 4 2017 eeworldonline.com|designworldonline.com
Ad Index T&M 6-2017 v1.indd 32 6/13/17 9:23 AM

Higher Data Rates Require
Accurate Measurements
A Guide to Making RF
Measurements for Signal
Integrity Applications
SHORTEN DESIGN TIMES. FIND OUT HOW IN OUR NEW PAPER
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ENSURE SUCCESS.
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engineers to take into account the analog and RF performance of the channels to a much greater degree
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anritsu | t&m 5.17.indd 33 6/12/17 11:52 AM

Simulate DC Transients 62000P Programmable DC Power Supplies
Program DC transient waveforms to simulate

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Chromas 62000P series of programmable DC power supplies allows devices to be verified under a wide
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Due to their constant power operating envelope the P-series power supplies are uniquely suited for test
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Chromas 62012P-80-60 thereby reducing the number of supplies needed in typical applications. The 62000P Series also includes
Conventional power supply
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Chroma Systems Solutions, Inc. All rights reserved.
Chroma System_1-17.indd 1 6/12/17 11:56 AM

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How to reduce oscilloscope noise during measurements Page 6 Simplifying signal generation using arbitrary waveform generators Page 10

Final Cover T&M 2017.indd 1 6/14/17 3:43 PM

rigol | t&m 5.17.indd 1 6/12/17 11:44 AM

SEEN A GHOST? BLAME

2 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com

Commentary T&M Handbook 6-17 V1.indd 2 6/13/17 8:52 AM

mpd | t&m 5.17.indd 3 6/12/17 11:46 AM

06 How to reduce oscilloscope

10 Simplifying signal generation using

16 Better testing with well-controlled ac power

4 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com

Contents & Staff T&M 6-2017 V1.indd 4 6/13/17 8:22 AM

Accounts Receivable Specialist

testandmeasurementtips.com|designworldonline.com 6 2017 DESIGN WORLD EE Network 5

Contents & Staff T&M 6-2017 V1.indd 5 6/9/17 4:05 PM

NOISE DURING MEASUREMENTS

THERE is a need to observe

6 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com

Keysight 2 T&M 6-17 V2.indd 6 6/12/17 9:08 AM

To make a null measurement simply configure the TABLE 1. NULL MEASUREMENT

Fill the screen

Noise comparison of a 1:1 and 10:1 probe measuring a 50

testandmeasurementtips.com|designworldonline.com 6 2017 DESIGN WORLD EE Network 7

Keysight 2 T&M 6-17 V2.indd 7 6/12/17 3:09 PM

Accuracy is commonly 1-2% of the full screen voltage. RMS NOISE

as a way of making convenient qualitative measurements

8 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com

Keysight 2 T&M 6-17 V2.indd 8 6/12/17 9:09 AM

SIMPLE SCOPE BLOCK DIAGRAM

adjacent sample points of a single acquisition to create

EVALUATING OSCILLOSCOPE BANDWIDTHS FOR YOUR

6 2017 DESIGN WORLD EE Network 9

Keysight 2 T&M 6-17 V2.indd 9 6/13/17 8:51 AM

USING ARBITRARY WAVEFORM

New instruments excel at

Out AWG trends

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Tektronix T&M 6-17 V2.indd 10 6/12/17 3:10 PM

Spacers & Standoffs Plugs & Jacks Multi-Purpose Hardware

Its whats on the InsIde that counts

www.keyelco.com (718) 956-8900 (800) 221-5510

generated waveforms. of binary word samples, memory can range from 2

THE COMPLEX PATH FROM WAVEFORM MEMORY TO ANALOG OUTPUT

As this simplified block diagram of the

12 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com

Tektronix T&M 6-17 V2.indd 12 6/12/17 9:14 AM

The ability of AWGs to work in one of several DAC

testandmeasurementtips.com|designworldonline.com 6 2017 DESIGN WORLD EE Network 13

Tektronix T&M 6-17 V2.indd 13 6/12/17 9:24 AM

The importance of precompensation for correcting AWG signals is evident in

14 DESIGN WORLD EE Network 6 2017 testandmeasurementtips.com|designworldonline.com

Tektronix T&M 6-17 V2.indd 14 6/13/17 9:01 AM

0402DF Series Chip Inductors for

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Behlman T&M 6-17 V2.indd 16 6/12/17 10:15 AM

Compact Splicing Connectors

Request a sample at www.wago.us/221sample

221 - Design World - Print.indd 1 5/25/17 11:24 AM

wago | t&m 5.17.indd 17 6/12/17 11:49 AM

building. These transformers step

point of service are within typical

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Behlman T&M 6-17 V2.indd 18 6/12/17 10:15 AM