Introduction

(This introduction is not part of IEEE Std 400-2001, IEEE Guide for Field Testing and Evaluation of the Insulation
of Shielded Power Cable Systems.)

This is a new omnibus Guide that has been in preparation for nine years. It provides an overview of known
techniques for performing electrical tests in the field on shielded power cable systems. It is intended to help
the reader select a test that is appropriate for a specific situation of interest. It provides a brief description of
all the known sources used to perform field tests with a short discussion of specific tests. The material pre-
sented is descriptive and tutorial and does not address the evaluation of test results nor the specification of
test voltage levels nor time of application.

Additional details will be provided in point documents (that are presently under preparation), such as
IEEE P400.1, direct voltage testing; IEEE P400.2 , very low frequency testing; and IEEE P400.3 ,
dissipation factor testing.

Participants

At the time this Guide was completed, the Working Group on Field Testing and Evaluation of Shielded
Power Cable Systems had the following membership. Voting members at the time of publication are marked
with an asterisk (*).

William A. Thue, Chair

Ben Lanz, Vice-Chair
T. A. Balaska, Vice-Chair

Torben Aabo
Jorma Haapanen Shantanu Nandi*
Michael G. Bayer
Kenneth Hancock Shigeki Osawa
Martin Baur*
Richard L. Harp Robert A. Resuali
Bruce S. Bernstein Wolfgang Haverkamp Peter Reynolds*
Glen J. Bertini Stanley R. Howell Ray E. Saccany
Larry G. Bonner Carlos Katz C. Saldivar-Cantu
Willem W. Boone* Frank J. Krajick Nagu N. Srinivas*
Robert L.Cunningham Howard W. Lewis J. P. Steiner*
Eugene Favrie Russell D. Lowe William Torok
Stephen L. Fitzhugh
John M. Makal Milan Uzelac
Robert E. Flemming
Matthew S. Mashikan* Fred H. von Hermann
Phillip J. George
James D. Medek* T. Shayne Wright
Hans R. Gnerlich*
C. David Mercier Nickolas A. Zemyan

iii Copyright 2002 IEEE. All rights reserved.

The following members of the balloting committee voted on this standard. Balloters may have voted for
approval, disapproval, or abstention.
Torben Aabo
Robert B. Gear Dennis C. Pratt
Roy W. Alexander
Kenneth Hancock Peter Ralston
R. W. Allen
Richard L. Harp Darrell E. Sabatka
Theodore A. Balaska
Stanley V. Heyer Gilbert L. Smith
Martin Baur
Lauri J. Hiivala Henry J. Soleski
Michael G. Bayer
John W. Hoffman Peter W. Spencer
M. Thomas Black
Stanley R. Howell Orloff W. Styve
David T. Bogden
Richard A. Huber John Tanaka
Harvey L. Bowles
C. Katz William A. Thue
Kent W. Brown
Lawrence J. Kelly Don Tomaszewski
Paul S. Cardello
Carl Landinger Daniel J. Ward
Jack E. Cherry
Mark E. Lowell Roland H. W. Watkins
John H. Cooper
Glenn J. Luzzi Carl J. Wentzel
James M. Daly
John M. Makal William D. Wilkens
Swarn S. Dhillon
Matthew S. Mashikian William G. Wimmer
Arthur R. Fitzpatrick
John E. Merando, Jr. Joseph T. Zimnoch

When the IEEE-SA Standards Board approved this standard on 6 December 2001, it had the following
membership:
Donald N. Heirman,
Chair James T. Carlo, Vice
Chair Judith Gorman,
Secretary

James H. Gurney James W. Moore

Satish K. Aggarwal Richard J. Holleman Robert F. Munzner
Mark D. Bowman Lowell G. Johnson Ronald C. Petersen
Gary R. Engmann Robert J. Kennelly Gerald H. Peterson
Harold E. Epstein Joseph L. Koepfinger* John B. Posey
H. Landis Floyd Peter H. Lips Gary S. Robinson
Jay Forster* L. Bruce McClung Akio Tojo
Howard M. Frazier Daleep C. Mohla Donald W. Zipse
Ruben D. Garzon

*Member Emeritus

Also included is the following nonvoting IEEE-SA Standards Board liaison:

Alan Cookson, NIST Representative

Donald R. Volzka, TAB Representative

Don Messina
IEEE Standards Project Editor
Copyright 2002 IEEE. All rights reserved. v
EE. All rights reserved.