AdvDistance1:

Test Object - Device Settings

Substation/Bay:
Substation: Substation address:
Bay: Bay address:

Device:
Name/description: Manufacturer:
Device type: Device address:
Serial/model number:
Additional info 1:
Additional info 2:

Nominal Values:
f nom: 60.00 Hz Number of phases: 3
V nom (secondary): 115.0 V V primary: 138.0 kV
I nom (secondary): 5.000 A I primary: 2.000 kA

Residual Voltage/Current Factors:

VLN / VN: 1.732 IN / I nom: 1.000

Limits:
V max: 200.0 V I max: 50.00 A

Debounce/Deglitch Filters:
Debounce time: 3.000 ms Deglitch time: 0.000 s

Overload Detection:
Suppression time: 50.00 ms

Test Object - Other RIO Functions

CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Distance Settings

System parameters:
Line length: 1.245 Line angle: 81.22
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:

Tolerances:
Tol. T rel.: 5.000 %
Tol. T abs. +: 50.00 ms Tol. T abs. -: 0.000 s
Tol. Z rel.: 5.000 % Tol. Z abs.: 50.00 m
Grounding factor:
kL mag.: 0.191000 kL angle: -28.250000
Separate arc no
resistance:

Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1 All Tripping All 0.000 s 5.000 % 50.00 ms 0.000 s 5.000 % 50.00 m
Z2 All Tripping All 500.0 ms 5.000 % 50.00 ms 0.000 s 5.000 % 50.00 m
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 5.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 115.00 V RIO/Device/Nominal Values/V nom

Comment

Test Module
Name: OMICRON Advanced Distance Version: 3.10
Test Start: 17-Jun-2017 21:25:16 Test End: 17-Jun-2017 21:25:16
User Name: Manager:
Company:

Test Settings

Test model:
Test model: constant test current ITest 10.00 A
Allow reduction of no kS = kL: no
ITest/VTest:
ZS mag.: 0.000 ZS angle: 0.00
kS mag.: 1.000 kS angle: 0.00
Fault Inception:
Mode: random
DC-offset: no

Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception

Other:
Extended zones: not active Switch off at zero crossing: yes
Load current enabled: no Load current:: n/a

Search Settings:
Search res. rel.: 1.000 % Search res. abs.: 50.00 m
Ignore nominal no
characteristics:
Search interval: 200.0 m

Auxiliary Binary Outputs:

Fault inception
Name Slope Trip Delay time Slope
Delay time
Ext. zones active n/a Open n/a Open

Test Results

Shot Test: Fault Type L1-E

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 2.489 ms 2.489 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 549.3 ms 9.858 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Test: Fault Type L2-E

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 3.871 ms 3.871 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 484.1 ms -3.18 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Test: Fault Type L3-E

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 22.87 ms 22.87 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 511.1 ms 2.222 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Test: Fault Type L1-L2

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 34.99 ms 34.99 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 533.5 ms 6.694 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Test: Fault Type L2-L3

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 1.485 ms 1.485 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 549.6 ms 9.928 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Test: Fault Type L3-L1

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 13.06 ms 13.06 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 517.6 ms 3.517 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Test: Fault Type L1-L2-L3

|Z| Phi % % of t nom t act. Dev. ITest Result
806.7 m 71.44 n/a 0.000 s 25.39 ms 25.39 ms 10.00 A Passed
1.279 74.48 n/a 500.0 ms 491.8 ms -1.636 % 10.00 A Passed
X/

1.75

1.50

1.25

1.00

0.75

0.50

0.25

0.00

-0.25

-0.50

-0.75

-1.5 -1.0 -0.5 0.0 0.5 1.0

R/

Shot Details:
Parameters:
Fault Type: L1-E
| Z |: 1.206 Phi: 62.93
R: 548.7 m X: 1.074
%: n/a % of:
ITest 10.00 A

Results:
t act.: n/a Assessment: Not tested
t nom: 500.0 ms Dev.:
t min: 475.0 ms t max: 550.0 ms

Fault Quantities (natural): Fault Quantities (symmetrical):

VL1: 14.13 V 0.00 V0: 17.42 V 180.00
VL2: 66.40 V -120.00 V1: 48.97 V 0.00
VL3: 66.40 V 120.00 V2: 17.42 V 180.00
IL1: 10.00 A -58.51 I0: 3.333 A -58.51
IL2: 0.000 A n/a I1: 3.333 A -58.51
IL3: 0.000 A n/a I2: 3.333 A -58.51
VFault: 14.13 V 0.00
IFault: 10.00 A -58.51

V/V

75

50

25 t/s
-0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 -0.0 0.1 0.2 0.3 0.4
0

-25

-50

-75

-100
VL1 VL2 VL3

I/A
12.5
10.0
7.5
5.0
t/s
2.5 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 -0.0 0.1 0.2 0.3 0.4
0.0
-2.5
-5.0
-7.5
-10.0
-12.5
-15.0
IL1 IL2 IL3

Trip
Start

-0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 -0.0 0.1 0.2 0.3 0.4
t/s
Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 5.000 s <none> n/a
C2 - C1 5.000 s n/a

Test State:
Test passed
Test performed offline: Test results are simulated!