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pattern generator (ATPG). High fault coverage able to generate a precomputed set of
and short testing times can be achieved. But the deterministic test vectors obtained with an ATPG
area overhead introduced by this method is in tool [6]. It provides a relatively simple way of
general prohibitive for practical applications. generating deterministic test vectors without
having to use complex procedures. It is also able
In counter-based architectures, the test
patterns are generated by a counter, which to produce the all-zero's test vector without the
introduces a small area penalty. The main need for additional circuitry (unlike conventional
disadvantage of this method is that long test LFSR). However, the use of LFSROM requires
sequences may be required to achieve an extra circuitry, especially for the MUX and its
related selector circuitry. Once implemented, the
acceptable fault coverage, which results in longer
testing time. set of test patterns produced is fixed and
unchangeable except by rewiring the OR gates
The most used BIST architectures are the
LFSR based architectures [4]. For these network. This means that once embedded in the
architectures, good fault coverage can be chip, the test patterns cannot be changed.
achieved in most cases and several techniques Shi and Zhang presents a reseeding
have been proposed to reduce the test time or to technique for LFSR-based test pattern
increase the fault coverage of LFSR based generation, which can generate pseudorandom
architectures. vectors in normal mode while also being able to
This paper is organized in the followingproduce the seed of a group of test vectors in
way. A brief review on previous architectures ofjumping mode [7].
LFSR based TPG is presented in part II. The Wang and Lee present an LFSR-based
proposed architecture of an LFSR-based TPG TPG that can accelerate the application of
that is used to generate pseodorandom patterns isdeterministic patterns from the LFSR to a scan
chain. The target scan chain is divided into
presented in part III. Initial experimental results
are explained in part IV. Future work is multiple sub-chains and an LFSR-based multiple
highlighted in part V and conclusion in part VI. sequence generator is used to generate all the
subsequences required by the sub-chains. A
II. PREVIOUS WORK generalized relationship between the bits in the
original scan chain and the state of the LFSR is
Wang and McCluskey discussed the derived such that the bits generated by an LFSR
theory of both standard and modular LFSRs. A in any future clock cycle can be pre-generated by
hybrid TPG design of standard and modular the proposed TPG [8].
LFSRs is also proposed. This design is used to
generate maximum length sequences and can be III. PROPOSED ARCHITECTURE
reconfigured to include the all zeros state for
exhaustive testing. Compared to the standard or
modular LFSR that uses m 2-input XOR gates,
the hybrid design uses only (m+l)/2 XOR gates
[5].
Chen and Gupta proposed a TPG design
called "input reduction". The proposed design
partitions the inputs of a CUT into groups,
similar to pseudo-exhaustive testing, where each
group corresponds to a test signal. However,
unlike pseudo-exhaustive testing, which only Rn-I Rn2 RIR1
combines unrelated inputs (inputs that are not in Fig. 1 Generic block diagram of proposed TPG
the same cone) into a test signal, the proposed structure.
technique analyzes the CUT to determine
compatible inputs to be combined into a test The proposed TPG structure is presented
signal, even if the inputs belong to the same cone in Figure 1. The structure is based on that of a
[1]. conventional LFSR signature analyzer. The TPG
Dufaza and Chevalier presents a TPG operates on two clock signals; one is the normal
design composed of a simplified LFSR clock for the LFSR registers and another clock
associated with an OR network and a set of signal, which is connected to the input D(X). The
multiplexers, called an LFSROM. The design is
D(X) clock is set at a lower frequency from the The test patterns in Table I are generated
register clock. by a TPG using a standard LFSR with a
One characteristic of this TPG structure characteristic polynomial of X3+X2+1 and a
is that it can generate longer sequences of the seed value of Q2QlQo = 100. The frequency of
same set of pseudorandom test pattems. A TPG the D(X) clock is half of the register clock (f= 1/2
with an n stage LFSR can generate a maximum or t =2).
set of 2" _ 1 number of test vectors. In From the table, we see that the maximum
conventional LFSR TPGs, this set of test vectors length sequence of the conventional LFSR is 7
will then produces a maximum sequence length vectors. For the proposed TPG, the sequence
of 2" - 1 patteins, before the sequence repeats extends to a total of 14 vectors before the
itself. In the proposed TPG, this maximum sequence repeats itself.
length sequence can be extended to beyond 2" -1 Another thing to note is that the
patterns with the manipulation of the D(X) clock. proposed TPG is able to generate the all zeros
The total number of test vectors is still a state autonomously and is not stuck in the all
maximum of 2" -1, but there will be a duplicate zeros state.
of certain vectors within the same sequence.
Table I shows an example of the simulated IV. PRELIMINARY RESULTS
sequence generated by a conventional LFSR as
compared to the proposed TPG. Preliminary testing has revealed a
LFSR Conventional Proposed TPG
-[ S-
10 01 1 R Sequence length
11 I101 Conventional LFSR 7
2 14
123 -0 10 3 21
_14 ~ ~~100 10 0 I
4 28
15 1 10 010 5 35
16 1 1 1 011 6 - 42
17 011 101 7 14
18 101 1 10 8 56
19 010 I 11 10 70
20 00 1 1 1 1 14 14
21 1 00 011 21 21
22 1 10 001 28 28
23 I 1 1 100 Table 2: Different values of r and their respective
24 01 1 010 sequence lengths
25 101 00 1
26 010 000 Preliminary results suggest that for
27 001 000 values of r that is not multiples of 7 (the
Table 1 Maximum length sequences generated maximum length of a conventional sequence),
by TPG the corresponding sequence length is a multiple
of r and 7, which is the length of the
conventional sequence. For r - 7, the sequence
LFSR register clock and the input signal to the Width Compression in BIST", Proceedings of
analyzer. the 1999 IEEE International Symposium on
Circuits and Systems, 1999. ISCAS '99, Volume:
ACKNOWLEDGEMENT 1, pp. 114 -118 vol.1 (1999)
[51 L.-T. Wang and E.J. McCluskey, "Hybrid
Thank you to Intel Penang for providing research designs generating maximum-length sequences",
fund and professional guidance. IEEE Transactions on Computer-Aided Design
of Integrated Circuits and Systems, Volume:
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