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Materials"Science and EngineeringA, 102 (1988) L1 -L4 L1

Letter

An ImprovedBridgman-Stockbarger isotherms between the hot and cold zones and


Crystal-Growth System allowed for much better control over the shape of
the melt interface. The gradient between zones is
directly dependent on this isolation [6, 7].
D. NICOAR~ and l. NICOARJk The relatively high axial temperature gradient
Department of Physics, Universityof Timi~oara, 1900 necessary in order to obtain crystals with large
Timi~oara (Romania) diameters (~b> 20 mm) cannot be obtained by means
(Received February 2, 1987; in revised form April 7, 1988) of a single heating element; two independently con-
trolled heaters, between which a high temperature
gradient is obtained, are necessary. Difficulties arise
when ordinary resistance heating (kanthal, for in-
stance) can no longer be used in the process of
Abstract growing crystals with melting points above 1300 C,
A n improved type of heater for crystal growth, when graphite, molybdenum, silicon carbide etc.
using the vertical Bridgman technique, is presented. heaters must be used. The use of graphite heaters in
With its help, C a ~ single crystals of good optical the vertical Bridgman technique is not new [8-11]
quality were obtained. but the high temperature gradient necessary at the
crystallization interface is obtained either by sup-
plementary heaters [8, 11], by thermic screen trans-
The use of the vertical Bridgman technique [1] lation [9] or by using two heaters with a moving
for the production of single crystals is based in part temperature gradient and a stationary crucible [ 10].
on its simplicity, the relative ease with which com- Taking into consideration the analysis of Jasinski
plete automation can be achieved, and also on its et al. [5], which recommends a certain proportion
applicability to a wide range of materials. The main between the lengths of the three zones -- hot, cold
problems involved in crystal growth are polycrystal- and gradient zone -- relative to the diameter and
linty, cracking and variable optical quality. The the length of the crystal, several types of graphite
analysis of heat flow in directional solidification and heaters have been designed [12-14] whose char-
crystal growth by Bridgman-type processes has acteristics would satisfy the above-mentioned
recently received considerable attention [2-5]. The demands.
shape of the solid-liquid interface is an important In the present paper we propose a new type of
factor in this type of growth since it influences the graphite heater which eliminates the need to use
stress, the incidence of polycrystallinity, the chemi- two heating elements independently controlled and
cal perfection of doped crystals and the optical with an intermediate diaphragm as recommended in
quality of transparent crystals. the Bridgman technique; this heater can produce
In the design of vertical Bridgman-type direc- temperatures of up to 2200C in a vacuum of
tional solidification experiments it is important to 10-4_10 5 Torr. The model contains an "isolated"
predict the thermal profiles in the specimen. The zone and a booster-heater zone that can be used to
position and shape of the solidification interface increase the thermal gradient near the solidification
and the axial thermal gradients on each side of the interface. A scheme of the Bridgman-type furnace
interface are of particular interest in controlling the used in the present study is shown in Fig. 1. For a
process. working temperature of 1400C the electrical
Fu and Wilcox [3] investigated the possibility of a power is 4.2 kW with a voltage supply of 16 V and
three-zone furnace, i.e. one in which the hot and 50 Hz, and is about 8 kW for a temperature of
cold zones were separated by a short "isolated" 2200 C; an electronic control and automation sys-
zone, their computer modelling using a finite differ- tem ensures the thermal stability of the furnace. In
ence scheme. It was shown that the use of an iso- order to eliminate the vibration produced by the
lated zone significantly reduced the curvature of the lowering system a magnetofluidic fitting is used.

0921-5093/88/$3.50 Elsevier Sequoia/Printed in The Netherlands


L2

N I

g l ix.\ I

I
I
I
, I
m 1200 1250130013501400
Temperature (C)
Fig. 2. Longitudinal section of the three types of heaters and
the temperature distributions along them.

zone B-C, necessary for the melting of the sub-


stance. The booster heater (C zone for type I) is
designed as a meander-type resistance heater by
means of which the maximum temperature is
obtained in the upper zone of the heater. The D
zone is inserted for heat-transfer improvement to-
wards the upper part of the heater, while the E
zone, which consists of a wall thickening, acts as an
"isolated" zone, necessary to produce the high tem-
perature gradient. In order to avoid thermal losses,
the graphite heater is surrounded by a set of con-
centric screens made of molybdenbum, graphite
and stainless steel. The necessary temperature
gradient during crystal growth is obtained in the
D - E zone; when the type I furnace is used the tem-
perature distribution inside it is such that the
desired temperature gradient is obtained starting
from the mid-part of the C zone.
Taking into account the analysis made by Jasinski
et al. [5], the length of the zones is chosen according
Fig. 1. Scheme of the crystal growth apparatus: (1) water- to the characteristics of the crystal which is to be
cooled wall; (2) crucible; (3) screens; (4) graphite heater; (5)
to vacuum pump; (6) water-cooled power line; (7) lowering grown (diameter, length, heat capacity, thermal con-
mechanismwith a magnetofluidicfitting. ductivity), ensuring the necessary dimension of the
temperature-gradient zone for obtaining an approx-
imately flat solid-melt interface during crystal
Figure 2 illustrates the longitudinal section of the growth. By decanting experiments the melt-solid
three types of heaters and the corresponding axial interface shape was studied and shown to be
temperature distribution. The type HI furnace pro- approximately flat which demonstrates that the fur-
duces a relatively fiat temperature profile in the hot nace characteristics and growth parameters were
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well chosen. Curve I in Fig. 2 represents the tem- tions offered by the simplest construction of the
perature distribution in the type I furnace when no type III heater (Fig. 2)), the temperature profile
crystal is grown. The temperature distribution being obtained by choosing the correct wall thick-
within the furnace is measured by means of a ness for the heating element and the appropriate
P t - R h - P t thermocouple which is moved along the screens. Since the necessary temperature gradient is
furnace axis. During crystal growth, the tempera- reached under the E zone the crucible is positioned
ture is also measured by placing the thermocouple in such a way as to obtain the optimum conditions
within the lower part of the crucible, about 1 mm for crystal growth.
from the starting part of the growing crystal; curve (ii) The type Ii furnace is used in order to pro-
I a is the temperature recorded during the growth of duce crystals 12-26 mm in diameter with the same
a crystal 30 mm in diameter at a growth rate of 4 dislocation density of 104 cm-2; since a higher tem-
nun h- 1 using the type I furnace. By comparing the perature gradient (10-15 K cm -I) is necessary, the
two curves I and I a one can see that the furnace crucible position is determined accordingly by the
parameters were well chosen, the axial temperature fact that the above-mentioned temperature gradient
distribution remaining approximately stable, which is reached within and under the E zone (Fig. 2,
ensures proper conditions for crystal growth. curve II).
By using all three types of heater mentioned (iii) The type III heaters are useful when crystals
above, fluoride single crystals with a diameter of up of large diameter (~b>26 mm) are grown with a
to 50 mm and 150 nun in length were obtained (Fig. pulling rate of about 3-5 mm h-1 and a tempera-
3). For crystals with diameters less than 20 mm, ture gradient of 20 K cm-1. According to the
type 1I or type HI heaters could be employed, the screens used this temperature gradient is obtained
temperature distribution along the furnace being starting from the mid-part of the C zone and up to
appropriate. In order to grow crystals up to 10 mm the E zone.
in diameter the meander zone C is not necessary,
the temperature profile being realized by wall-
thickness modification of the heating element. 25 5 I0 2 . 5 ~.m
I 00 ~ ~ -v------'--"- ~--'~ '
The quality of the crystals was studied by exam-
ining the dislocation-density distribution using a 8O
method described elsewhere [15]. Dislocation dis-
tribution analysis taken at different levels of the
etched cross-section of crystals grown under differ- ~ 4 0

ent conditions indicates that crystals of different


2O
diameter, but with about the same dislocation den-
sity of 1 0 4 cm -2, can be obtained by taking into 0 ,
40 ~o 2'o 5
consideration the following conditions. x I 0 0 cm - I
(i) For crystals with small diameters ( 4 = 6 - 1 2 Fig. 4. IR transmission of a C a F 2 crystal 1 m m thick.
nun) the necessary temperature gradient is 7-10 K
cm 1 for pulling rates of about 5-6 mm h - 1 (condi-

_ _ "

Fig. 5. Typical dislocation distribution on a (111) cleavage


surface of C a F 2 crystals. T h e etch conditions were 2 N HC1
Fig. 3. P h o t o g r a p h of various C a F 2 crystals. at 30 C for 1 h.
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The crystals were grown from "ultrarein" C a F 2 supply is gradually lowered. From our experiments
from Merck Co., Darmstadt, ER.G. Using the con- it can be concluded that the use of these types of
ditions mentioned above the crystals have no twins heaters (built as a single body) in the vertical Bridg-
or voids but are clear, colourless and have good man technique to obtain high quality fluoride crys-
cleavage surfaces. The transmission coefficient was tals is advantageous because the same heater can be
measured by Specord UV-VIS and Specord type- used for about one hundred growth cycles, the
C, Zeiss-Jena spectrophotometers. Regardless of process being reproducible and easy to control.
the crystal diameter, for a cleaved slide 1 m m thick,
the transmission coefficient is about 98% in both
visible and IR regions up to 9 p m for CaFz and References
1 2 / t m for B a F 2 (Fig. 4). 1 E W. Bridgrnan, Proc. Am. Acad. Arts Sci., 60 (1925)
The dislocation density of the crystals, on aver- 305.
age 104 cm -2, was determined by employing the 2 C. E. Chang and W. R. Wilcox, J. Cryst. Growth, 21
above-mentioned method [15]; sometimes in crys- (1974) 135.
tals of large diameter ( 4 > 35 nun) the dislocation 3 T. W. Fu and W. T. Wilcox, J. Cryst. Growth, 48 (1980)
416.
density reaches 105-106 cm -2. The typical disloca- 4 R.I. Naumann, J. Cryst. Growth, 58 (1982) 554.
tion distribution on a (111) cleavage surface is 5 T. Jasinski, W. M. Rohsenow and A. E Witt, J. Cryst.
shown in Fig. 5 with the etch conditions being 2N Growth, 61 (1983) 339.
HC1 at 30C for 1 h. By examination b e t w e e n 6 I.C. Mikkelsen, Jr., Rev. Sci. lnstrum., 51 ( 198 O) 1564.
crossed polars, the birefringence of crystals up to 7 S. C. Sabharwal, T. Mirza, S. C. Karandikar and B.
Ghosh, Cryst. Res. Technol., 20 (1985) 837.
30 m m in diameter is about 20 nm cm -1 and 8 D. C. Stockbarger, J. Opt. Soc. Am., 39 (1949) 731.
reaches 30 nm cm-~, owing to thermal stresses, in 9 H. LeGal and Y. Grange, J. Cryst. Growth, 47 (1979)
the case of crystals of larger diameters. 449.
The major advantage of these types of heaters is 10 W. A. Gault, E. M. Monberg and J. E. Clemans, J. Cryst.
in the complete automation of the growth process, Growth, 74 (1986) 491.
11 D. A. Jones, R. V. Jones and R. W. H, Stevenson, Proc.
because the axial temperature distribution is Int. Conf. on Crystal Growth, Boston, 1966, Phys. Chem.
reproducible if the power supply is constant. At the Solids Suppl., (1966) 57.
same time, it is possible to reduce the thermal 12 D. Nicoarh, Romanian Patent 62842, 1975.
stresses by subsequent heating of the crystal within 13 D. Nicoarh and I. Nicoar~, Romanian Patent 85993,
the same set-up and allowing it a more gradual 1984.
14 D. Nicoarh, I. Nicoarh and Z. Schlett, Romanian Patent
cooling rate to room temperature. After the crystal 88497, 1985.
pulling is finished, the crucible is raised in the B - C 15 I. Nicoar~, O. F. G. Aczel, D. Nicoarh and Z. Schlett,
zone and by using an automatic system the power Cryst. Res. Tech., 21 (1986)647.

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