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Letter
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g l ix.\ I
I
I
I
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m 1200 1250130013501400
Temperature (C)
Fig. 2. Longitudinal section of the three types of heaters and
the temperature distributions along them.
well chosen. Curve I in Fig. 2 represents the tem- tions offered by the simplest construction of the
perature distribution in the type I furnace when no type III heater (Fig. 2)), the temperature profile
crystal is grown. The temperature distribution being obtained by choosing the correct wall thick-
within the furnace is measured by means of a ness for the heating element and the appropriate
P t - R h - P t thermocouple which is moved along the screens. Since the necessary temperature gradient is
furnace axis. During crystal growth, the tempera- reached under the E zone the crucible is positioned
ture is also measured by placing the thermocouple in such a way as to obtain the optimum conditions
within the lower part of the crucible, about 1 mm for crystal growth.
from the starting part of the growing crystal; curve (ii) The type Ii furnace is used in order to pro-
I a is the temperature recorded during the growth of duce crystals 12-26 mm in diameter with the same
a crystal 30 mm in diameter at a growth rate of 4 dislocation density of 104 cm-2; since a higher tem-
nun h- 1 using the type I furnace. By comparing the perature gradient (10-15 K cm -I) is necessary, the
two curves I and I a one can see that the furnace crucible position is determined accordingly by the
parameters were well chosen, the axial temperature fact that the above-mentioned temperature gradient
distribution remaining approximately stable, which is reached within and under the E zone (Fig. 2,
ensures proper conditions for crystal growth. curve II).
By using all three types of heater mentioned (iii) The type III heaters are useful when crystals
above, fluoride single crystals with a diameter of up of large diameter (~b>26 mm) are grown with a
to 50 mm and 150 nun in length were obtained (Fig. pulling rate of about 3-5 mm h-1 and a tempera-
3). For crystals with diameters less than 20 mm, ture gradient of 20 K cm-1. According to the
type 1I or type HI heaters could be employed, the screens used this temperature gradient is obtained
temperature distribution along the furnace being starting from the mid-part of the C zone and up to
appropriate. In order to grow crystals up to 10 mm the E zone.
in diameter the meander zone C is not necessary,
the temperature profile being realized by wall-
thickness modification of the heating element. 25 5 I0 2 . 5 ~.m
I 00 ~ ~ -v------'--"- ~--'~ '
The quality of the crystals was studied by exam-
ining the dislocation-density distribution using a 8O
method described elsewhere [15]. Dislocation dis-
tribution analysis taken at different levels of the
etched cross-section of crystals grown under differ- ~ 4 0
_ _ "
The crystals were grown from "ultrarein" C a F 2 supply is gradually lowered. From our experiments
from Merck Co., Darmstadt, ER.G. Using the con- it can be concluded that the use of these types of
ditions mentioned above the crystals have no twins heaters (built as a single body) in the vertical Bridg-
or voids but are clear, colourless and have good man technique to obtain high quality fluoride crys-
cleavage surfaces. The transmission coefficient was tals is advantageous because the same heater can be
measured by Specord UV-VIS and Specord type- used for about one hundred growth cycles, the
C, Zeiss-Jena spectrophotometers. Regardless of process being reproducible and easy to control.
the crystal diameter, for a cleaved slide 1 m m thick,
the transmission coefficient is about 98% in both
visible and IR regions up to 9 p m for CaFz and References
1 2 / t m for B a F 2 (Fig. 4). 1 E W. Bridgrnan, Proc. Am. Acad. Arts Sci., 60 (1925)
The dislocation density of the crystals, on aver- 305.
age 104 cm -2, was determined by employing the 2 C. E. Chang and W. R. Wilcox, J. Cryst. Growth, 21
above-mentioned method [15]; sometimes in crys- (1974) 135.
tals of large diameter ( 4 > 35 nun) the dislocation 3 T. W. Fu and W. T. Wilcox, J. Cryst. Growth, 48 (1980)
416.
density reaches 105-106 cm -2. The typical disloca- 4 R.I. Naumann, J. Cryst. Growth, 58 (1982) 554.
tion distribution on a (111) cleavage surface is 5 T. Jasinski, W. M. Rohsenow and A. E Witt, J. Cryst.
shown in Fig. 5 with the etch conditions being 2N Growth, 61 (1983) 339.
HC1 at 30C for 1 h. By examination b e t w e e n 6 I.C. Mikkelsen, Jr., Rev. Sci. lnstrum., 51 ( 198 O) 1564.
crossed polars, the birefringence of crystals up to 7 S. C. Sabharwal, T. Mirza, S. C. Karandikar and B.
Ghosh, Cryst. Res. Technol., 20 (1985) 837.
30 m m in diameter is about 20 nm cm -1 and 8 D. C. Stockbarger, J. Opt. Soc. Am., 39 (1949) 731.
reaches 30 nm cm-~, owing to thermal stresses, in 9 H. LeGal and Y. Grange, J. Cryst. Growth, 47 (1979)
the case of crystals of larger diameters. 449.
The major advantage of these types of heaters is 10 W. A. Gault, E. M. Monberg and J. E. Clemans, J. Cryst.
in the complete automation of the growth process, Growth, 74 (1986) 491.
11 D. A. Jones, R. V. Jones and R. W. H, Stevenson, Proc.
because the axial temperature distribution is Int. Conf. on Crystal Growth, Boston, 1966, Phys. Chem.
reproducible if the power supply is constant. At the Solids Suppl., (1966) 57.
same time, it is possible to reduce the thermal 12 D. Nicoarh, Romanian Patent 62842, 1975.
stresses by subsequent heating of the crystal within 13 D. Nicoarh and I. Nicoar~, Romanian Patent 85993,
the same set-up and allowing it a more gradual 1984.
14 D. Nicoarh, I. Nicoarh and Z. Schlett, Romanian Patent
cooling rate to room temperature. After the crystal 88497, 1985.
pulling is finished, the crucible is raised in the B - C 15 I. Nicoar~, O. F. G. Aczel, D. Nicoarh and Z. Schlett,
zone and by using an automatic system the power Cryst. Res. Tech., 21 (1986)647.