IEEE Guide For Fault Current Limiter (FCL) Testing of FCLs Rated Above - 1000 V AC PDF

IEEE Guide for Fault Current Limiter
(FCL) Testing of FCLs Rated above

1000 V AC
IEEE Power and Energy Society
Sponsored by the
Switchgear Committee
IEEE
3 Park Avenue IEEE Std C37.302-2015
New York, NY 10016-5997
USA
Authorized licensed use limited to: University of Florida. Downloaded on June 01,2016 at 14:07:03 UTC from IEEE Xplore. Restrictions apply.
IEEE Std C37.302-2015

1000 V AC
Sponsor
Switchgear Committee
of the
IEEE Power and Energy Society
Approved 5 December 2015
IEEE-SA Standards Board
Abstract: The testing of fault current limiters (FCLs) operating on condition-based impedance
increase for AC systems 1000 V and above is described in this guide. Constant impedance series
reactors and single fuses are not included in this guide.
Keywords: asymmetrical short-circuit current, continuous current, electromagnetic compatibility,

FCL testing, IEEE C37.302, insertion impedance, insulation resistance, inter-turns insulation,
lightning impulse/BIL, lightning impulse voltage, loss measurement, partial discharge, peak
withstand current, power frequency voltage withstand, recovery, short-circuit current limitation,
short-time withstand current, temperature rise.
The Institute of Electrical and Electronics Engineers, Inc.

3 Park Avenue, New York, NY 10016-5997, USA
Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc.

All rights reserved. Published 18 May 2016. Printed in the United States of America.
IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by The Institute of Electrical and Electronics
Engineers, Incorporated.
PDF: ISBN 978-1-5044-0831-8 STD20883

Print: ISBN 978-1-5044-0832-5 STDPD20883
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Participants
At the time this IEEE guide was completed, the AdsCom - FCL Testing Working Group had the following
membership:
Michael Steurer, Chair

Frank Lambert, Vice Chair
Ram Adapa Jerry Earl Isidor Sauers

Michael Andrus Ken Edwards Christian Schacherer
Simon Bird Jim Houston Gerald Schoonenberg
Curtis Birnbach Joanne Hu Judith Schramm
Joachim Bock Swarn Kalsi Mario Sciulli
Andreas Brandt John Kappenman Tushar Shah
Landi Carfi Dvir Landwer David Syracuse
Gilbert Carmona Paul Leufkens Passinam Tatcho
Tim Chiocchio Tim MacDonald Alexander Usoskin
Mark D'Agostino Franco Moriconi Yoram Valent
Francisco DeLaRosa Frank Muench James van de Ligt
Prafulla Deo Frank Mumford Paul Williams
Patrick DiLillo Raj Nayar Jan Zawadzki
Harsha Ravindra
The Editorial Board of the AdsCom - FCL Testing Working Group had the following membership:
Ram Adapa Francisco DeLaRosa Christian Schacherer

Michael Andrus Jerry Earl Judith Schramm
Joachim Bock Frank Lambert Mario Sciulli
Andreas Brandt Paul Leufkens Michael Steurer
Gilbert Carmona Franco Moriconi Passinam Tatcho
Tim Chiocchio Harsha Ravindra James van de Ligt
The following members of the individual balloting committee voted on this guide. Balloters may have
voted for approval, disapproval, or abstention.
Katrin Baeuml Ajit Gwal David Nichols

Robert Behl David Harris T. W. Olsen
Andreas Brandt Jeffrey Helzer Mirko Palazzo
Ted Burse Lee Herron Christopher Petrola
Eldridge Byron Gary Heuston Michael Roberts
Thomas Callsen Werner Hoelzl Oleg Roizman
Paul Cardinal John Kay Vincent Saporita
Suresh Channarasappa Yuri Khersonsky Bartien Sayogo
J. Arturo DelRio Joseph L. Koepfinger Thomas Schossig
Carlo Donati Jim Kulchisky Devki Sharma
Gary Donner Marc Lacroix Jerry Smith
Randall Dotson Chung-Yiu Lam Michael Steurer
Edgar Dullni Frank Lambert Michael Swearingen
Jerry Earl Michael Lauxman Passinam Tatcho
Marcel Fortin Roger Lawrence Eric Udren
Fredric Friend John Leach James van de Ligt
Frank Gerleve Albert Livshitz John Vergis
Mietek Glinkowski Homer Alan Mantooth Jane Verner
Robert Goodin Daleep Mohla Mark Waldron
Edwin Goodwin Georges Montillet John Webb
Randall Groves Arun Narang Larry Yonce
Michael Newman
vi
Copyright 2016 IEEE. All rights reserved.
When the IEEE-SA Standards Board approved this guide on 5 December 2015, it had the following
membership:
John D. Kulick, Chair

Jon Walter Rosdahl, Vice Chair
Richard H. Hulett, Past Chair
Konstantinos Karachalios, Secretary
Masayuki Ariyoshi Joseph L. Koepfinger* Stephen J. Shellhammer

Ted Burse David J. Law Adrian P. Stephens
Stephen Dukes Hung Ling Yatin Trivedi
Jean-Philippe Faure Andrew Myles Philip Winston
J. Travis Griffith T. W. Olsen Don Wright
Gary Hoffman Glenn Parsons Yu Yuan
Michael Janezic Ronald C. Petersen Daidi Zhong
Annette D. Reilly
*Member Emeritus
vii
Introduction
This introduction is not part of IEEE Std C37.302-2015, IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs
Rated above 1000 V AC.
Significant developments in the area of fault current limiters (FCLs) operating on the principle of
condition-based impedance increase have resulted in products emerging on the market in the last decade.
There are, however, no guidelines on how to test these new FCL technologies. Therefore, in June 2010 the
IEEE Switchgear Committee established WG PC37.302 to develop such a guide.
This Working Group was co-sponsored by the IEEE Power and Energy Society/Substations (PE/SUB) and
the IEEE Power Electronics Society/Standards Committee (PEL/SC). This guide takes a technology-
independent black-box approach and intentionally avoids stating any performance criteria. It provides,
however, a newly developed set of parameters (not values) to fully describe the behavior of any FCL for
testing purposes. Overall, this guide has been written to inform the stakeholder community about all the
aspects of testing FCLs.
viii
Contents
1. Overview .................................................................................................................................................... 1
1.1 Scope ................................................................................................................................................... 1
1.2 Purpose ................................................................................................................................................ 2
2. Normative references.................................................................................................................................. 2
3. Definitions, acronyms, and abbreviations .................................................................................................. 3

3.1 General FCL definitions ...................................................................................................................... 3
3.2 Definitions related to voltages observed during fault current limitation ............................................. 4
3.3 Definitions related to prospective short-circuit currents ...................................................................... 5
3.4 Definitions related to initiation of CCL transition ............................................................................... 5
3.5 Definitions related to currents without limitation by an FCL .............................................................. 6
3.6 Fault currents or over-currents with limitation by an FCL .................................................................. 6
3.7 FCL recovery processes and associated times ..................................................................................... 7
4. FCL technical principles ............................................................................................................................. 9

4.1 Type A FCLs ......................................................................................................................................10
4.2 Type B FCLs ......................................................................................................................................13
5. Sample specification parameters ...............................................................................................................16

5.1 Electrical performance ........................................................................................................................16
5.2 Rated fault current limitation voltage .................................................................................................18
5.3 Rated maximum prospective short-circuit current ..............................................................................18
5.4 Rated minimum prospective short-circuit current ..............................................................................18
5.5 Withstand current ratings in C mode ..................................................................................................19
5.6 CCL Initiation criteria.........................................................................................................................19
5.7 Current ratings with FCL limitation ...................................................................................................20
5.8 Insertion impedance ............................................................................................................................20
5.9 Physical and operational .....................................................................................................................21
5.10 Environmental ..................................................................................................................................21
5.11 Safety ................................................................................................................................................22
6. Design tests................................................................................................................................................22
6.1 Aspects of FCL behavior ....................................................................................................................22
6.2 Power frequency voltage withstand test .............................................................................................24
6.3 Lightning impulse voltage ..................................................................................................................25
6.4 Switching impulse voltage ..................................................................................................................26
6.5 Chopped-wave lightning impulse voltage ..........................................................................................27
6.6 Surge current test (alternate) ...............................................................................................................27
6.7 Partial discharge .................................................................................................................................27
6.8 Control circuit design test ...................................................................................................................28
6.9 Rated continuous current ....................................................................................................................28
6.10 Short-time withstand current and peak withstand current tests ........................................................30
6.11 Harmonic distortion ..........................................................................................................................33
6.12 Short-circuit current limitation tests .................................................................................................33
6.13 Current interruption ..........................................................................................................................38
6.14 Recovery ...........................................................................................................................................38
6.15 Electromagnetic compatibility EMC ................................................................................................39
6.16 Audible sound ...................................................................................................................................39
6.17 Seismic tests .....................................................................................................................................40
6.18 Visual inspection ..............................................................................................................................40
ix
6.19 FCL technology-specific tests ..........................................................................................................40
7. Production (routine) tests...........................................................................................................................41

7.1 Power frequency voltage withstand test .............................................................................................41
7.2 Other voltage withstand tests ..............................................................................................................42
7.3 Partial discharge .................................................................................................................................42
7.4 Control circuit voltage and wiring checks ..........................................................................................42
7.5 Visual inspection ................................................................................................................................42
7.6 Considerations to assess essential FCL functionality .........................................................................43
7.7 FCL technology-specific tests ............................................................................................................43
8. Field inspection, testing, and commissioning of fault current limiter and ancillary systems ....................44
8.1 General ...............................................................................................................................................44
8.2 Field inspection and installation verification ......................................................................................44
Annex A (informative) Example of FCL ratings ...........................................................................................46
Annex B (informative) List of variables ........................................................................................................47
Annex C (informative) Bibliography.............................................................................................................50
x
1000 V AC
IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health,
or environmental protection, or ensure against interference with or from other devices or networks.
Implementers of IEEE Standards documents are responsible for determining and complying with all
appropriate safety, security, environmental, health, and interference protection practices and all
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This IEEE document is made available for use subject to important notices and legal disclaimers.
These notices and disclaimers appear in all publications containing this document and may
be found under the heading Important Notice or Important Notices and Disclaimers
Concerning IEEE Documents. They can also be obtained on request from IEEE or viewed at
http://standards.ieee.org/IPR/disclaimers.html.
1. Overview
1.1 Scope
This guide describes the testing of fault current limiters (FCLs) operating on condition-based impedance
increase for AC systems 1000 V and above. This guide does not include constant impedance series reactors
and single fuses. (For standards specific to these fault current limiting devices, see IEEE Std C57.16 1,2,3
and IEEE Std C37.46 [B14] 4).
NOTETesting of FCL load current interrupting capabilities are not addressed in this guide and may be discussed
5
between user and manufacturer.
1
Information on normative references can be found in Clause 2.
2
IEEE publications are available from the Institute of Electrical and Electronics Engineers (http://standards.ieee.org/).
3
The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc.
4
The numbers in brackets correspond to those of the bibliography in Annex C.
5
Notes in text, tables, and figures of a standard are given for information only and do not contain requirements needed to implement
this standard.
1
IEEE Std C37.302-2015
IEEE Guide for Fault Current Limiter (FCL) Testing of FCLs Rated above 1000 V AC
1.2 Purpose
This guide provides guidelines for testing of fault current limiters (FCLs) operating on condition-based
impedance increase for AC systems 1000 V and above.
2. Normative references
The following referenced documents are indispensable for the application of this document (i.e., they must
be understood and used, so each referenced document is cited in text and its relationship to this document is
explained). For dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments or corrigenda) applies.
ANSI C57.12.55, American National Standard for TransformersUsed in Unit Installations, Including
Unit Substations-Conformance Standard. 6
IEC 60060-1, High-voltage test techniquesPart 1: General definitions and test requirements. 7
IEC 60076-3, Power transformersPart 3: Insulation levels, dielectric tests and external clearances in air.
IEC 60076-4, Power transformersPart 4: Guide to the lightning impulse and switching impulse testing
Power transformers and reactors.
IEC 60076-6, Power transformersPart 6: Reactors.
IEC 60255-26, Electrical relaysPart 26: Electromagnetic compatibility requirements for measuring relays
and protection equipment.
IEC 60270-2000-12, High voltage test techniquesPartial discharge measurements.
IEC 60282-1, High-voltage fusesPart 1: Current-limiting fuses.
IEC 62271-1, High-voltage switchgear and controlgearPart 1: Common specifications.
IEC 62271-100, High-voltage switchgear and controlgearPart 100: High-voltage alternating-current
circuit-breakers.
IEEE Std 4, IEEE Standard Techniques for High-Voltage Testing.
IEEE Std 118, IEEE Standard Test Code for Resistance Measurement.
IEEE Std 693, IEEE Recommended Practice for Seismic Design of Substations.
IEEE Std C37.09, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a
Symmetrical Current Basis.
IEEE Std C37.60, IEEE High-voltage switchgear and controlgearPart 111: Automatic circuit reclosers
and fault interrupters for alternating current systems up to 38 kV.
IEEE Std C37.100.1, IEEE Standard of Common Requirements for High Voltage Power Switchgear
Rated Above 1000 V.
IEEE Std C37.122, IEEE Standard for High Voltage Gas-Insulated Substations Rated Above 52 kV.
IEEE Std C37.301, IEEE Standard for High-Voltage Switchgear (Above 1000 V) Test Techniques
Partial Discharge Measurements.
IEEE Std C57.12.00, IEEE Standard for General Requirements for Liquid-Immersed Distribution,
Power, and Regulating Transformers.
6
ANSI publications are available from the American National Standards Institute (http://www.ansi.org/).
7
IEC publications are available from the International Electrotechnical Commission (http://www.iec.ch/). IEC publications are also
available in the United States from the American National Standards Institute (http://www.ansi.org/).
2
IEEE Std C37.302-2015
IEEE Std C57.12.90, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and
Regulating Transformers.
IEEE Std C57.12.91, IEEE Standard Test Code for Dry-Type Distribution and Power Transformers.
IEEE Std C57.16, IEEE Standard for Requirements, Terminology, and Test Code for Dry-Type Air-Core
Series-Connected Reactors.
IEEE Std C57.98, IEEE Guide for Transformer Impulse Tests.
IEEE Std C62.11, IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).
3. Definitions, acronyms, and abbreviations

For the purposes of this document, the following terms and definitions apply. The IEEE Standards
Dictionary Online should be consulted for terms not defined in this clause. 8
3.1 General FCL definitions
branches (of FCL): One or more intentional current paths through an FCL. Figure 1 illustrates n number
of current branches through a single-phase FCL.
FCL
Controllable current limiting branch 1
Controllable current limiting branch 2

Phase A Phase A
IN OUT
Single phase Single phase
non-limited fault Controllable current limiting branch (n-1) limited fault
current current
Controllable current limiting branch n
Figure 1Current branches in an FCL
C mode: The (normal) conducting mode of an FCL (i.e., the FCL is in its low impedance state).
CCL transition: The transition from C mode to CL mode.
CL mode: The current limiting mode of an FCL (i.e., generally, the FCL is in its high impedance state
while in CL mode. However, some technologies may transit back and forth between high and low
impedance states during the current limiting phase in order to limit the fault current).
CLC transition: The transition from CL mode to C mode.
8
IEEE Standards Dictionary Online subscription is available at: http://ieeexplore.ieee.org/xpls/dictionary.jsp.
3
IEEE Std C37.302-2015
CLI transition: The transition from CL mode to Interrupting mode.
fault current limiter (FCL): A device or apparatus that limits the first peak and the subsequent rms short-
circuit (i.e., fault) current in an alternating current power system to the specified value by providing a
condition-based increase in resistive and/or reactive impedance between normal conducting mode and
current limiting mode. The FCL may consist of discrete, functionally integrated, and spatially separated
equipment.
IC transition: The transition from Interrupting mode to C mode.
insertion impedance: The impedance presented by the FCL in C mode at power frequency which may be
constant or a current-dependent function.
interrupting mode: The interruption mode of an FCL (i.e., the FCL has interrupted the fault current flow).
Not all FCLs have an Interrupting mode.
voltages across an FCL: The voltages across an FCL are defined in Figure 2. They include the voltage
differences between the voltage on each phase terminal on one side of the FCL and the voltage on the
terminal of the same phase on the other side of the FCL. The voltages across the FCL depend on the current
flowing through each phase of the FCL and the impedance of the FCL in that phase.
VA12, or VB12, or VC12
Side 1
Side 2
VCA1 VCA2
VA12, or VB12, or VC12 are the voltages across the FCL
Figure 2FCL voltages
3.2 Definitions related to voltages observed during fault current limitation
For the purpose of characterizing the voltages observed across the FCL during fault current limitation, the
following definitions apply.
fault current limitation voltage: The voltage across the terminals of the FCL from the beginning of the
CL mode to fault interruption. This voltage may be considered in two successive intervals of time, one
during which a transient voltage exists, followed by a second one during which the power frequency or the
steady-state voltage alone exists. The voltage after the CLI transition should be less than or equal to the
highest voltage that the FCL will be exposed to in the system.
NOTE 1The corresponding voltage for a non-current limiting device with current interruption at current-zero is the
TRV defined in IEEE Std C37.46 [B14] .
4
IEEE Std C37.302-2015
NOTE 2For FCL limitation of the rated symmetrical prospective fault current, refer to the circuit breaker standard
IEEE Std C37.09.
maximum fault current limitation voltage: The maximum instantaneous value of fault current limitation
voltage over any portion of its waveform, regardless whether it is periodic in nature or not. The symbol
used for this value is uk,CL,max.
RMS fault current limitation voltage: The rms fault current limitation voltage is defined by the two rms
values of the fault current limitation voltage waveform that occur during its first- and last three half-cycles
(i.e., U k ,CL, B and U k ,CL, E ).
NOTEThe first- and the last three half-cycles are each a period equal to the time required for three half-cycles of the
power frequency symmetrical waveform. For voltages, the first period begins at the first zero crossing of the fault
current limitation voltage after the CCL transition. The second period ends at the last zero crossing of the fault current
limitation voltage before current interruption. For currents, the first period begins at the first zero crossing of the
current after the CCL transition. The second period ends at current interruption. This concept is illustrated in Figure 6.
transient fault current limitation voltage (TLV) : The fault current limitation voltage during the time in
which it has a significant transient component. It may be oscillatory or non-oscillatory or a combination of
these depending on the characteristics of the circuit and the FCL.
3.3 Definitions related to prospective short-circuit currents
For FCLs, two prospective short-circuit current values are defined.
maximum prospective short-circuit current: The maximum prospective fault current for which the FCL
has been designed. The two aspects are:
peak short-circuit current, and

symmetrical short-circuit rms current.
NOTEThe maximum symmetrical fault current may not be the most critical current for testing some FCL
technologies. The most critical value should be discussed between the user and manufacturer.
minimum prospective short-circuit current for CCL transition: The minimum prospective fault current
for which the FCL is designed to transition out of C mode.
NOTEThe minimum symmetrical fault current for CCL transition might not be the most critical current for testing
some FCL technologies. The most critical value should be discussed between the user and manufacturer.
3.4 Definitions related to initiation of CCL transition
The CCL transition may be initiated by current magnitude, rate-of-current rise, external initiation signal, or
other quantities.
CCL initiation criteria: The quantity which causes the CCL transition.
NOTEFor purposes of this testing guide, initiation criteria based on current, on rate-of-current rise, and on external
initiation signals are considered. The user is invited to discuss testing of any other type of CCL initiation criterion with
the manufacturer.
5
IEEE Std C37.302-2015
CCL initiation current: The instantaneous value of current which will initiate the CCL transition. It may
need to be considered in combination with rate-of-current rise.
CCL initiation delay: The time delay from fault inception to reach the initiation criteria.
NOTECCL Initiation delay is a measured value of the test waveform or of the external initiation signal, not a
characteristic of the FCL. The initiation delay includes system effects such as the time it takes the system fault current
waveform to reach CL initiation conditions. The user is invited to consider that short-circuit conditions may arise at any
time in the waveform. Therefore the measurements should include the point on the prospective fault current waveform
when the short-circuit conditions are imposed and the time constant is of the prospective fault current. Accurately
measuring this delay may be difficult for some FCLs.
CCL initiation rate-of-current rise: The initiation rate-of-current rise (i.e., gradient), is the rate-of-current
rise which will initiate the CCL transition. It may need to be considered in combination with initiation
current.
3.5 Definitions related to currents without limitation by an FCL
This clause pertains to currents at levels above the rated continuous current that do not meet the initiation
criteria of an FCL.
branch short-time withstand current: The rms value of the current that a specific branch of the FCL can
carry in the C mode, evaluated during the first- and last three full half-cycles under prescribed conditions of
use and behavior without limitation by the FCL.
NOTEThe branch ID number is denoted by the value of the subscript n.
peak withstand branch current: The peak current associated with the first major loop of the short-time
withstand current that a specific branch of the FCL can carry in the C mode.
peak withstand current: The peak current associated with the first major loop of the short-time withstand
current.
short-time withstand current in C mode: The rms value of the current that the FCL can carry in the C
mode.
NOTEThe actual current is expected to stay within the bounds of the two rated short-time withstand current values.
3.6 Fault currents or over-currents with limitation by an FCL
This clause pertains to currents at levels that meet the initiation criteria of an FCL.
limited short-circuit withstand branch current: The rms value of the current that a specific branch path
of the FCL can carry with the FCL in CL mode, evaluated out of the first- and last three full half-cycles.
limited short-circuit withstand current: The rms value of the current that the FCL can carry in the CL
mode, evaluated during the first- and last three full half-cycles, under prescribed conditions of use and
behavior.
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IEEE Std C37.302-2015
peak let-through current: The peak let-through current, i p , LT is the instantaneous value of the current
attained during the fault current limitation operation of the FCL at the rated prospective fault current
condition (rated power frequency, voltage, etc.). Figure 3 illustrates an FCLs peak let-through current
relative to the unimpeded flow of fault current.
Figure 3Peak let-through current
NOTEFor FCLs which result in a maximum value not during rated maximum prospective short-circuit current
conditions, the user and the manufacturer should discuss this. The peak let-through current may depend on many
parameters (e.g., prospective fault current, power frequency, power factor, settings or design of FCL, and others).
Therefore, usually one FCL type has more than one value of peak let-through current. The manufacturer of the FCL
usually performs tests to verify some representative peak let-through current values and derives all others by
calculations in accordance with specified application data. As described above, it is not practical or necessary to
perform FCL testing of all arrangements that exhibit a different value of peak let-through current.
peak let-through time: The time from fault inception to the instant when the current through the FCL
reaches its specified value of peak let-through current, under specified conditions. This is a measured value,
not a rating.
peak limited short-circuit withstand current: The peak value of the limited short-circuit withstand
current through the FCL in CL mode.
peak limited, withstand short-circuit branch current: The peak value of the limited withstand short-
circuit current for each FCL branch.
3.7 FCL recovery processes and associated times
C mode recovery status: The FCL being in C mode after a fault event and regaining rated current limiting
but reduced continuous current carrying capability. See also: FCL recovery process.
NOTESee Figure 4 in FCL recovery processes and associated times.
C mode recovery time: tr is the amount of time required between the clearing of a rated fault event to
the moment when the FCL regains C mode recovery status. See also: FCL recovery process.
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IEEE Std C37.302-2015
FCL recovery process: The process between clearing of the fault and the FCL regaining fault current
limitation capability as illustrated in Figure 4 along with additional transitions until the FCL is back in C
mode and able to carry full rated current.
NOTE 1Each of the specific times identified in the Figure 4, and defined in the text that follows, may be negated
depending on the technology employed.
NOTE 2The recovery process may occur with or without load current flow. If the FCL has to be isolated from the
system to recover, it either needs a manual service (human intervention) before returning to service or it recovers
automatically.
FCL is C mode
Fault recovered
inception Fault cleared
FCL is CL FCL is CL mode FCL is fully
mode rated recovered recovered
recovered
FCL in C mode, ready to
recovery process
FCL in CL mode, ready to limit

process
rated fault current limit rated fault current

FCL in CL
FCL in C mode
and enter CCL transition

mode and ready to
bo loadrecovery
and ready to carry and ready to and ready

limiting fault carry below
current up to rated carry below to carry up
rated
continuous rated to rated
continuous
FCL in current continuous continuous
Partial
current
C mode current current
ready to
limit
tpr
tprR
tda
tr
tk,CL
trR
with without
load with fault
load
current current with load current
current
Time
Figure 4Summary of FCL recovery process and subsequent transitions
full recovery status: The FCL being in C mode after a fault event and regaining continuous current
capability and full rated short-circuit current limitation capability. See also: FCL recovery process.
partial recovery time: t pr is the time from the clearing of a fault event to the end of the no load
recovery process. See also: FCL recovery process.
rated full recovery time: trR is the time from the clearing of a rated fault event to the moment when the
FCL regains full recovery status. See also: FCL recovery process.
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IEEE Std C37.302-2015
rated partial recovery time: t prR is the time from the clearing of a maximum rated fault event to the
moment when the FCL regains rated fault current limitation capabilities without resetting to C mode while
allowing rated continuous current flow, putting the FCL into the state CL mode rated recovered. See also:
FCL recovery process.
recovery process without load current: The process of regaining rated current limiting capability after a
rated fault event with rated or reduced continuous current capability, putting the FCL into the state CL
mode recovered. The associated allowable current flow needs to be given, too. See also: FCL recovery
process.
reduced continuous current capability: The ability of the FCL to carry continuous current below the
rated current. See also: FCL recovery process.
4. FCL technical principles

There are a wide variety of technical principles which can achieve limiting of fault currents in power
systems. Conventionally, the methods include splitting bus bars, introducing a higher voltage range,
employing high impedance transformers, current-limiting reactors, and current-limiting fuses. This guide,
however, focuses mostly on emerging principles which operate on the principle of a condition-based
increase of impedance (see Figure 5). These emerging principles are encircled in Figure 5. The definition of
FCL in this guide is more restrictive than the CIGREs definition in CIGRE Technical Brochure [B3]. All
of the FCLs for which this guide was written have in common that they present a relatively low impedance
during normal system operating conditions. When a fault occurs and the fault current rises, the FCL
increases its impedance significantly, causing an increased voltage drop across the device. This in turn
limits the fault current. A large number of technical approaches exist to achieve such behavior. The
interested reader should refer to the many publications which provide FCL technology overviews and
describe specific technologies in great detail. A more complete description of a wide variety of FCL
technologies can be found in CIGRE Technical Brochure [B3].
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IEEE Std C37.302-2015
Permanent impedance increase Condition based impedance increase

during nominal and fault conditions Small impedance at nominal load
fast increase of impedance at fault
Splitting into High

sub grids impedance Fuse based Emerging Concepts
transformers devices
Introducing a Superconductors
Stand alone
higher voltage Current IV
HV fuses
fuse Solid-State Devices
range limiting Sequential Commutating
reactors tripping Magnetic Effects
Splitting of Current
bus bars Limiters Hybrid Systems
Fault Current Limiters in C37.302
Topological Apparatus Topological Apparatus

measures measures measures measures
Fault Current Limiting Devices
Figure 5Overview of fault current limiting measures

(adapted from Figure 3.1 in IEEE Std C37.46 [B14])
This guide was written with a black-box approach in mind and remains, for the most part, technology-
independent. Therefore, in accordance with CIGRE Technical Brochure 497 [B3], this guide distinguishes
between two types of FCL behavior: Type A is a FCL without current interruption and Type B is a FCL
with current interruption.
4.1 Type A FCLs
Type A FCLs consist of two sub-types:
Type A1 FCLs: After transitioning into current-limiting mode, this type of FCL demonstrates
behavior that can be accurately described by inserting a linear (e.g., resistive) impedance into the
circuit at the location of the FCL.
Type A2 FCLs: After transitioning into current-limiting mode, this type of FCL demonstrates
behavior that can be accurately described by inserting a non-linear (e.g., inductive) impedance
into the circuit at the location of the FCL.
Example plots of the prospective- and limited short-circuit fault currents and corresponding voltages for a
Type A1 FCL are given in Figure 6. Example plots of Type A1 (highly) inductive type FCL short circuit
fault current is given in Figure 7. Detail of Figure 7 showing voltage waveform of Type A FCL is shown in
Figure 8. The current and voltage responses of a Type A2 FCL are presented in Figure 9. This figure also
highlights with boxes the beginning- and ending three-half cycle portions of the waveform that define
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IEEE Std C37.302-2015
its rms fault current limitation voltage introduced in 3.2 (i.e., U k ,CL, B and U k ,CL, E ) shows the transient
fault current limitation voltage produced by a Type A FCL.
X X
X X X X
X X X X
X
X
X X X X X
X X X X X X
X X X X X X X X X
X
X X X
X X X X X X
X X X
X
Figure 6Example of Type A1 resistive-type FCL short-circuit current waveforms (top)

and corresponding voltage waveforms (bottom)
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IEEE Std C37.302-2015
ip,max
Prospective current
X Limited current
ip,LT
X X
X X X
X X X X X
X
X
X X X
X X X
tLT
tk,CL
Fault Current Limitation Voltage
Reference voltage
X Limitation voltage
X X X X X
XX X X X
X X X
X X X X X X X X
X X
Figure 7Example of Type A1 (highly) inductive type FCL short circuit fault current
Transient Fault Current Limitation Voltage TLV

Commutation voltage depends on
X Parasitic inductance of shunt
X
Commutation speed
X
X
X
X X
Figure 8Detail of Figure 7 showing voltage waveform of Type A FCL
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IEEE Std C37.302-2015
X X X X X
X
X
X
X
X X X X
X X X X
X
X X X
X X
X X
X
Figure 9Example of Type A2 FCL short-circuit current waveforms (top) and

corresponding voltage waveforms (bottom)
4.2 Type B FCLs
Type B FCLs are FCLs that also provide current-interruption capability, thus having a CLI transition. Type
B1 FCL performs like an A1 FCL until it interrupts the current. Example of prospective and limited short-
circuit fault currents and voltages waveforms for a type B1 FCLB/E (see Figure 10) may apply. Example of
prospective and limited short-circuit fault current and voltage waveforms for a type B2 FCL are given in
Figure 11. The transient fault current limitation voltage (TLV) and transient recovery voltage (TRV)
associated with the aforementioned waveforms are shown in Figure 12. Note that the interruption is within
the first current loop, although this may not always be the case. The example of B2 shown in Figure 11
shows a non-linear FCL which interrupts.
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IEEE Std C37.302-2015
Prospective current
ip,max Limited current
X
ip,LT
X X X X X
tLT
tk,CL
Reference voltage
X Limitation voltage
X X X X X X X X X
X
X X X
X X X X X X X X X X
Figure 10Example of Type B1 FCL short-circuit fault current waveforms (top) and
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IEEE Std C37.302-2015
x x
x x x x x x x x x x x
x

Reference voltage
x Limitation voltage
x x x
x x x x x x
x x x
x x
x x x x x x x x
x x x
Figure 11Example of Type B2 FCL short-circuit fault current waveforms (top) and
Transient Fault Current Limitation Voltage TLV
X X
X
X TRV
X Commutation voltage depends on

Parasitic inductance of shunt
Commutation speed
Figure 12Example voltage waveform of Type B FCL showing the TLV and TRV
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IEEE Std C37.302-2015
5. Sample specification parameters

This guide is for testing and not for an FCL specification. Therefore, specification information provided
below are for illustrative purposes only and might not be applicable to all FCL technologies.
Users focus mostly on the following issues:
Electrical performance,
Physical and operational parameters,
Environmental aspects,
Safety, and
Lifetime.
5.1 Electrical performance
The electrical performance of the FCL can be described by the following system and device parameters.
5.1.1 System
5.1.1.1 Prospective fault current

The prospective fault current, Figure 13, can be described in several ways. IEEE Std 141 [B5] and IEEE
Std 142 [B9] define I k and I p as the rms- and peak prospective fault currents, respectively. I r is
defined in 5.1.2.2 of this standard.
ip,max
Ir
tk
Figure 13Example prospective short-circuit current waveform
In the IEEE/ANSI standards, the prospective fault current is described in terms of the symmetrical rms fault
current that would flow in the event of a fault at a bus without the FCL in the circuit (IEEE Std C37.46
[B14]). If applicable, the user needs to consider the possibility of several fault scenarios with different
prospective currents because FCL performance might not scale linearly with prospective fault current
levels.
Special consideration should be given to applications near a generation source.
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IEEE Std C37.302-2015
5.1.1.2 AC source impedance

An important parameter related to the performance of an FCL is the source impedance, which might be
different for different fault scenarios and prospective currents. It is commonly expressed in terms of source
resistance (R) and reactance (X).
5.1.2 FCL device

An example of FCL ratings can be found in Annex A.
5.1.2.1 Rated maximum voltage

The rated maximum voltage, U, which is an rms value, indicates the upper limit of the highest voltage of
the system for which the FCL is intended.
5.1.2.2 Rated continuous current

The rated continuous or nominal current I r is the maximum rms current value at rated power frequency
that the FCL is designed to carry continuously under specified conditions of use and behavior.
5.1.2.3 Rated power frequency

The rated power frequency f r is the frequency that the FCL is designed to operate at, typically either
50 Hz or 60 Hz.
5.1.2.4 Rated steady-state voltage drop

The rated steady-state voltage drop U sd , is the rms voltage that appears across the FCL at rated continuous
current in C mode. The steady-state voltage drop may be of concern to the customer who may specify
acceptable limits. The voltage drop across the FCL may not necessarily be the reduction in voltage
magnitude downstream of the FCL.
5.1.2.5 Rated power losses

The rated losses Ploss include Joule heating due to resistive components, eddy current and hysteresis losses
in magnetic materials, as well as power for auxiliary systems such as control electronics, dc power supplies,
and cooling systems including cryogenic systems at rated voltage and current conditions in C mode.
5.1.2.6 Sequence of operations

The sequence of operations defines minimum intervals between short-circuit events and number of short-
circuit events with maximum prospective short-circuit current for which the FCL is designed. Such
sequence is typically agreed upon between the customer and manufacturer
The sequence of operations is defined by a series of time intervals:
tso1 , tso 2 , tsoi
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IEEE Std C37.302-2015
5.1.2.6.1 Sequence of operations with full recovery

The sequence of operations with full recovery is characterize by full recovery between short-circuit events:
tso r1 , tso r 2 , tso ri
5.1.2.6.2 Sequence of operations with partial recovery

The sequence of operations with partial recovery is characterize by partial recovery between short-circuit
events:
tso pr1 , tso pr 2 , tso pri
5.2 Rated fault current limitation voltage
The rated fault current limitation voltage is the fault current limitation voltage for which the FCL has been
designed and is given by the two values U k ,CL, B and U k ,CL, E evaluated as rms values during the first- and
last three half-cycles of the fault current limitation voltage waveform. The first- and the last three half-
cycles are each a period equal to the time required for three half-cycles of the power frequency symmetrical
waveform. For voltages, the first period begins at the first zero crossing of the fault current limitation
voltage after the CCL transition. The second period ends at the last zero crossing of the fault current
limitation voltage before current interruption. For currents, the first period begins at the first zero crossing
of the current after the CCL transition. The second period ends at current interruption.
The rated peak fault current limitation voltage is the corresponding peak fault current limitation voltage.
5.3 Rated maximum prospective short-circuit current
The rated maximum prospective short-circuit current is the maximum prospective fault current for which
the FCL has been designed. The corresponding parameters are:
I p ,max : Rated maximum prospective peak short-circuit current
I k ,max : Rated maximum prospective, symmetrical, rms short-circuit current 9
5.4 Rated minimum prospective short-circuit current
The rated minimum prospective fault current is represented by two parameters:
I p ,min : for the rated minimum prospective peak short-circuit current
I k ,min : for the rated minimum prospective, rms, symmetrical, short-circuit current
9
The maximum symmetrical fault current might not be the most stressful condition for some FCL technologies. In such cases, most
stressful condition should be discussed between the user and manufacturer.
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IEEE Std C37.302-2015
5.5 Withstand current ratings in C mode
5.5.1 Rated short-time withstand current in C mode

The short-time withstand current parameter I k ,C is used to represent the short-time withstand current rating
in C mode.
5.5.2 Rated short-time non-limited withstand branch current

The parameters I kn,C , B and I kn,C , E are used to represent the short-time non-limited withstand current
rating of branch n of the FCL for the first three full, half-cycles and the last three full, half cycles,
respectively.
5.5.3 Rated peak non-limited withstand current

The parameter i p ,c represents the rated peak non-limited withstand current of the FCL.
5.5.4 Rated peak non-limited withstand branch current

The parameter i pnC represents the rated peak non-limited withstand current of branch n of the FCL.
5.5.5 Rated duration of short-time non-limited withstand current

The parameter tkC represents the rated duration of short-time non-limited withstand current.
5.6 CCL Initiation criteria
The CCL initiation may be characterized by the three parameters described below.
5.6.1 Initiation current

The parameter ia ,max represents the maximum CCL initiation current value.
5.6.2 Initiation rate-of-current-rise

The parameter didt Init _ max represents the maximum CCL initiation rate-of-current-rise value.
5.6.3 Initiation delay

The parameter tda represents the CCL initiation delay.
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IEEE Std C37.302-2015
5.7 Current ratings with FCL limitation
5.7.1 Rated short-time limited withstand current

The parameters I k ,CL, B and I k ,CL, E represent the rated short-time, limited, withstand current of the FCL in
CL mode, evaluated out of the first- and last three full half-cycles, respectively.
The corresponding maximum duration of the rated short-time, limited, withstand current is tk ,CL (s).
Note that for certain FCL technologies longer durations may be acceptable at reduced withstand currnet
values.
5.7.2 Rated peak limited short-circuit withstand current

The parameter i p ,CL represents the rated peak limited short-circuit withstand current.
5.7.3 Rated short-time limited short-circuit withstand branch current

The rated short-time limited short-circuit withstand branch current I kn,CL, B / E is the rated short-time
withstand current of a specific branch path of the FCL in CL mode, evaluated out of the first- and last three
full half-cycles.
The corresponding maximum duration of the rated short-time, limited, short-circuit withstand branch
current may be different from tkn,CL (s).
Only if branches are to be tested separately from the entire FCL do these values become important.
5.7.4 Rated peak limited short-circuit withstand branch current

The rated peak limited short-circuit withstand branch current i pn,CL is the rated peak withstand current of a
specific branch path of the FCL in CL mode; n defines the branch by number.
5.7.5 FCL Behaviour upon loss of auxiliaries

Upon loss of power to auxiliaries, some FCL technologies might change to C mode, CL mode, or I mode.
Other FCL technologies might be largely unaffected. For some applications it might be critical to specify
the acceptable behaviour when auxiliaries lose power. In many cases it will be important for the user to
know the effect of the loss of power to auxiliaries and the associated timing. The user might want to discuss
the FCLs behaviour with the manufacturer and any associated testing.
5.8 Insertion impedance
The symbol used in this guide for the rated insertion impedance is Z FCL C .
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IEEE Std C37.302-2015
5.9 Physical and operational
The physical and operational aspects of the FCL can be described by the following parameters:
Footprint,
Height,
Weight,
System maintenance (i.e., period between maintenance & effort required),
Auxiliary power backup,
Enclosure protection class,
Auxiliary equipment,
Grounding,
Nameplate,
Standard Interlocks, and
Status Indication.
ANSI C57.12.55 addresses the issues of tank/enclosure finish for indoor and outdoor applications,
respectively.
5.10 Environmental
Some important environmental parameters for FCLs are listed below:
For outdoor applications, the FCL might be tested in accordance to pass the spray test and
corrosion-resistance test specified in ANSI C57.12.55,
For indoor applications: as defined, for example, in ANSI C37.20.2 [B12],
Maximum audible sound at the substation fence,
Proper thermal performance,
Temperature regulation for electronics,
Transport conditions,
Storage, and
Installation.
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IEEE Std C37.302-2015
5.11 Safety
The FCL is assumed to have incorporated safety in its design.
6. Design tests
It is common practice for some power equipment (e.g., transformers, circuit breakers, etc.) to allow design
tests to be performed using several units separately. It may be acceptable to adopt a similar approach to test
the entire FCL or its discrete components separately if all critical components of the complete FCL are
represented in detail. This means the FCL and its auxiliary equipment are mounted/installed in all
significant respects as in service respectively as documented in the manual.
For these design tests, the FCL device to be tested is handled as a black box, usually with incoming
terminals, outgoing terminals (minimum 3 each for a three-phase device), and, possibly, some control
terminals. In general, polarity is not expected to be of concern. If the manufacturer and/or user think
otherwise, then a test can be devised.
6.1 Aspects of FCL behavior
The FCL design is intended to demonstrate compliance with the relevant standards, when available,
regarding the following aspects:
Power frequency withstand voltage (see 6.2),
Lightning impulse voltage or basic insulation level (BIL) (see 6.3),
Partial discharge level (see 6.7),
Rated continuous current (see 6.9),
Short-time withstand and peak withstand current (see 6.10),
Short-circuit current limitation (see 6.12),
Recovery (see clause 3.7 and clause 6.14),
Electromagnetic compatibility (see 6.15), and
Transient Recovery Voltage (only applies during CLI transition) (see 6.14).
Table 1 depicts a list of the industry standards generally applicable to the testing of the aspects of FCLs.
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IEEE Std C37.302-2015
Table 1Typical standards involved in testing of FCLs
Design Test Type Sub-test type Specification

IEEE Std 4
Power frequency voltage withstand IEC 60060-1
IEEE Std C37.100.1
IEEE Std 4
IEC 60060-1
IEEE Std C37.100.1
IEC 60076-6
CEI IEC 289
Lightning impulse/BIL
IEEE C62.11
Lightning impulse voltage
IEC 60076-4
IEEE Std C57.12.90
IEEE Std C57.12.91
IEC 60076-3
Inter-turns insulation
IEC 60076-6
IEC 60076-3
IEEE Std 4
Partial discharge Partial discharge
IEC 60270
IEEE Std C37.301
IEEE Std C37.100.1
IEEE Std C57.16
IEC 62271-1
Continuous current
Loss measurement IEEE Std C57.16
IEEE Std C57.16
Temperature rise
IEC 62271-1
Short-time withstand and peak IEEE Std C37.100.1
withstand current tests IEC 62271-1
IEEE Std. C57.12.00
Asymmetrical short-circuit
IEC 62271-100
Short-circuit current limitation tests current
IEC 60282-1
Insulation resistance IEEE Std 118
IEC 62271-1
Electromagnetic compatibility
IEC 60255-26
23
IEEE Std C37.302-2015
6.2 Power frequency voltage withstand test
6.2.1 Test setup
Power frequency voltage withstand may be performed in compliance with IEEE Std C37.100.1 or IEC
60060-1-2010.
The user may make reference to IEEE Std 4 regarding standard reference atmospheric conditions and
atmospheric correction factors.
The user may wish to make reference to the equipment conditions in 6.2.3 of IEEE Std C37.100.1 for any
of the dielectric tests.
Additional considerations for FCL testing beyond IEEE Std 4 may include:
a) FCLs are typically tested at their rated fundamental frequency. Other frequencies may be used in
specific tests.
b) For FCLs using cryogenic systems, the temperature and pressure of the cryogenic environment
should be recorded before and after testing.
c) For gas insulated FCLs, such as SF6, pressure and temperature should be recorded before and after
testing.
d) For oil insulated FCLs, temperature should be recorded before and after testing.
6.2.2 Test procedure
FCLs may be subjected to power-frequency voltage withstand tests in accordance with the applicable
clauses of IEEE Std 4 and IEEE Std C37.100.1.
With the FCL in C mode, apply the test voltage to phase A while the other terminals are grounded. Repeat
for phase B and for phase C. If MOVs are integral to the FCL design, they may clip the prescribed test
voltages.
FCL installations are intended to protect other equipment (circuit breakers, transformers, etc.) from
exposure to current flow which may otherwise exceed the rated capacity of such equipment. While it is
desirable to validate the insulation system of an FCL while the FCL is in CL mode, it is recognized that it
may not be possible to perform such a test for all types of FCLs. Should such a methodology become
available, the following guidelines are included for consideration:
a) To verify the phase to ground and phase to phase insulation systems in CL mode, apply the test
voltages to both terminals simultaneously for phase A while the other terminals are grounded.
Repeat for phase B and for phase C.
b) To verify the adequacy of the insulation system to withstand the voltage drop across the FCL in CL
mode, careful consideration should be given to select appropriate testing for the specific FCL
technology.
In FCL devices consisting of a large external impedance which is bypassed while in C mode, it is advised
to disconnect the external impedance and then separately test the bypass system insulation at its
corresponding design voltage and the external impedance element at its own insulation ratings. An
alternative testing method without disconnecting the external impedance may be to apply a higher voltage
24
IEEE Std C37.302-2015
during the FCL fault current tests but of reduced duration to prevent overheating or other forms of
damage.10
Note that some condition-based FCLs achieve their condition-based performance using techniques which
can be left out or otherwise modified to enable power frequency voltage withstand tests to be performed as
part of the set of design tests. For example, the dc bias winding between of the saturated core technologies
could be left with zero current through it. Also, for the radial magnetized magnetic material based
technologies the material might be left in a different magnetic state corresponding to the CL mode. For
these design tests the insulation is being tested not the current limiting properties or the magnetic or
other properties.
Other condition-based FCLs may achieve their performance based on material or other properties which
will require testing under fault current conditions. In those cases the user may require the manufacturer to
test or otherwise prove the adequacy of their insulation under CL conditions.
If the FCL has an Interrupting mode, test voltages as per Table 9 in 6.2.5.1 of IEEE Std C37.100.1 may be
applied to confirm the adequacy of the insulation in the Interrupting mode. However, the voltage criteria
should be adjusted to correspond to the voltage level the FCL interrupter is required to meet.
6.2.3 Test criteria

The criteria for passing power frequency withstand voltage on a FCL is when no disruptive discharge
occurs and the test voltage is therefore sustained throughout the test period according to the corresponding
standard.
The rated insulation level of the FCL may be selected from the values given in Table 1a, Table 1b,
Table 2a, and Table 2b of IEEE Std C37.100.1. In these tables, it is important to note that the withstand
voltage applies at the standardized reference atmosphere [temperature (20 C), pressure (101.3 kPA), and
absolute humidity (11 g/m3)] specified in IEEE Std 4 since the insulation withstand capability of the air
around the FCL is affected by altitude. The rated values for lightning impulse withstand voltage (Up),
switching impulse voltage (Us), (when applicable), and power frequency withstand voltage (Ud) should be
selected without crossing the horizontal marked lines in the first three columns of Table 1a, and the first
two columns of Table 1b, Table 2a, and Table 2b.
6.3 Lightning impulse voltage
6.3.1 Introduction
The variety of FCL technologies may respond to lightning impulses in different ways. Some FCLs may
behave similar to circuit breakers, others similar to transformers, others to a combination of circuit breaker
and transformers, and still others may respond in another way altogether.
The user may want to consider carefully which of the following are most applicable to the FCL for the
lightning impulse voltage test may be performed with respect to the standards IEEE Std C57.12.01 [B18],
IEEE Std 4, IEC 60076-6, IEEE Std C62.11 [B19], IEEE Std C57.12.90, IEEE Std C57.12.91, and IEEE
Std C57.98.
6.3.2 FCL testing considerations

Some considerations specific to testing FCLs may include:
10
Note that this may result in substantially increased electromechanical forces within the FCL.
25
IEEE Std C37.302-2015
FCLs might include integrated MOVs which may present difficulties to provide an adequate
impulse source (see 6.6). The user might want to consider 4.3 of IEEE Std C57.12.91.
FCLs may present low impedance to impulse tests. The user may want to consider the test
procedures in 10.3.1.1.b of IEEE Std C57.12.90 or 8.9.9 of IEC 60076-4.
The possibility of resonances may need to be considered.
Testing the insulation integrity from one side to other of the FCL while in CL mode may present
the additional challenges.
Unlike a circuit breaker in the open state, the FCL in CL mode may be non-linear.
Some FCLs might not be able to be placed into CL mode except during current limiting
condition. The imposition of high currents simultaneous with high voltage impulses is anticipated
to present significant difficulties.
For those FCLs which use dc bias circuits to maintain the FCL in C mode, the effects of the
impulse tests on those bias currents might need to be considered.
6.4 Switching impulse voltage
Established practices for power system equipment require switching impulse testing for voltages above a
nominal voltage level for equipment. However, standards for FCLs have not been developed yet.
Therefore, manufacturers may advise the user about the impact of switching impulse voltages on their FCL.
6.4.1 Test methodology

Generally a switching impulse voltage can be applied to each terminal when the FCL is in C mode.
However, for some FCL technologies, their integrated MOV elements may make it impractical to impose
voltage impulses across the FCL while in CL mode (see 6.6). Current impulses defined in IEEE Std 4 may
be used instead.
If the FCL is adequately protected by a surge arrester across the device, it may have been designed for a
reduced insulation level. For such cases, the insulation level across the FCL may be one of the standardized
levels in Table 6 of IEEE Std C57.16 and may be at least 1.25 times the 8/20 s, 10 kA protective level of
the surge arresters connected between terminals. Refer to pp. 3947 of IEC 60076-4 for more information
on the testing of low impedance windings.
6.4.2 Test setup

Refer to IEEE Std 4 for a description of a general switching impulse test setup.

Refer to IEEE Std 4 for a description of a test procedure for a general switching impulse test.
6.4.4 Test criteria

Refer to IEEE Std 4 for a description of a test procedure for a general switching impulse test.
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IEEE Std C37.302-2015
6.5 Chopped-wave lightning impulse voltage
A chopped-wave lightning impulse voltage test is applied to insulation systems to predict the flashover of
bushings on a transformer or a circuit breaker that uses mineral oil as an insulating fluid. The electric
impulse withstand of the insulating fluid is directly proportional to the rate-of-rise of the leading edge of
the impulse waveshape. Established practices for power system equipment require chopped-wave lightning
impulse voltage testing for voltages above a given threshold.
In a dry-type, or solid insulation system, the withstand strength of the insulation is not measurably
impacted by the rated-of-rise of the leading edge of the lightning impulse voltage waveshape. Therefore, it
is not necessary to perform a chopped-wave lightning impulse voltage test on all types of equipment. For
more information see IEC 60099-4 [B5], IEC 60099-5 [B6], and IEEE Std C62.11.
6.5.1 Test methodology

A chopped lightning impulse is a prospective full lightning impulse during which any type of discharge
causes a rapid collapse of the voltage. A chopped wave impulse can be made on each terminal of the FCL.
It is reasonable for the values for the crest and the minimum time to spark over to follow those specified in
Table 5 of IEEE Std C57.16, especially for inductive type FCLs.
6.5.2 Test setup

Refer to IEEE Std 4 for a general description of the test setup.

Refer to IEEE Std 4 for a general description of the test procedure.
6.6 Surge current test (alternate)
For some FCL technologies, their integrated MOV elements may make it impractical to impose voltage
impulses on the FCL while in CL mode. Current impulses used to test surge arresters might be adapted to
this purpose.
As any other equipment or element in a power system exposed to the flow of line current, a fault current
limiter should possess the capability to withstand any foreseeable amount of surge current passing through
it. This requirement applies to both the C mode and CL mode.
Given the complexity of design aspects involved in different FCL technologies, it is not easy to devise a
conventional way to test for this condition. Therefore, manufacturers are invited to develop a test technique
that exposes the FCL or at least the relevant FCL components to such conditions. Such a test would be used
to demonstrate that the FCL can safely withstand the overvoltage and current typically observed in
substations. This test would be done considering testing resources. FCL simulation models could also be
considered.
6.7 Partial discharge
Partial discharge (PD) activity may develop when there is some weakness in the design, processing, or
manufacturing of the insulation system. PD tests are an excellent tool to identify incipient abnormal
27
IEEE Std C37.302-2015
discharge activity in the insulation. Therefore PD testing may be done before and after current limiting
testing. Acceptable PD levels for FCLs have not been established.
In order to obtain reproducible results, careful control of all relevant factors is necessary. The PD
measurement system should be calibrated in accordance with the relevant standards, IEEE Std 4, and
Clause 5 of IEC 60270-2000-12 prior to testing. IEC 60076-3 specifies PD on transformers with system
voltages higher than 72.5 kV.
6.8 Control circuit design test
Often design tests of auxiliary control functions implemented using auxiliary components, for purposes
such as fan control, are not performed as part of the design tests of the main apparatus. Instead, their proper
function is checked or confirmed as part of the routine tests.
For those control or auxiliary functions specific to the FCL technology the design tests for the internal
control circuits of an FCL may be prescribed by the manufacturer.
Guidance for such tests might be found in IEEE Std C37.90.1 [B15], IEEE Std C37.90.2 [B16], and IEEE
Std C37.90.3 [B17].
6.9 Rated continuous current
6.9.1 Introduction
The goal of this test is to assess stable and adequate performance of the FCL during steady-state (C mode).
There are at most three operational aspects to be addressed by continuous current testing of FCLs: power
loss, temperature rise, and voltage drop.
Power loss is the amount of heat produced in the device due to the continuous flow of current. Removing
these losses may require auxiliary systems, such as fans or cryogenic coolers.
In non-superconducting and in some superconducting FCLs, the temperature rise is typically measured
directly at the conductor or current carrying elements. In superconducting FCLs that carry the load current,
the temperature rise of the superconductor is typically indirectly measured. However, temperatures at key
locations determined by the manufacturer may be measured.
Voltage drop, an important measure of the electric performance of the device, is defined as the voltage
across the FCL during C mode.
FCLs with a continuous current rating in CL mode may also be tested in a similar way in CL mode as
outlined for C mode. The user may wish to discuss this with the manufacturer.
6.9.2 General requirements

The FCL to be tested should be a known good unit. Continuous current tests are conducted at low voltage
and therefore the installation of high voltage bushings may not be needed if they do not play a role in the
thermal management of the entire device. The auxiliary equipment for the FCL, if required for normal
operation, should be available and operational.
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IEEE Std C37.302-2015
6.9.3 Test requirements

The FCL should be tested at a laboratory with an adequate supply for the FCL operation in C mode and
with instrumentation to measure temperature, current, voltage drop, and power factor of the insertion
impedance.
Requirements for the temporary connections to the device under test can be found in IEEE Std C37.100.1
and IEC 62271-10.

Temperature, current, and voltage drop are recorded simultaneously. The test is conducted by passing
current at rated power frequency through the FCL until the measured quantities have stabilized. The
criterion for temperature stabilization and tolerances on current magnitude and frequency as specified in
IEC 62271-1 0, IEEE Std C37.100.1, and Clause 11 of IEEE Std C57.12.90-2010 may be employed. For
superconducting FCLs, the pressure and the temperature of the cryogen are the significant quantities for
ensuring stable operation. The manufacturer should provide the threshold and tolerance values for those
quantities.
A sufficient number of current values should be employed in order to characterize the current-level
dependency.
Losses of the FCL are measured at all selected current values. Losses of auxiliary equipment may be
recorded separately.
If significant coupling between phases for a three-phase FCL is expected, a three-phase test would be
preferable.
6.9.4.1 Ambient temperature

Ambient temperature is the surrounding temperature recorded in the test room with restricted air flow
during these tests. Ambient temperature tolerances are given in IEC 62771-1.
6.9.4.2 Hottest spot determination

The temperature of the various parts for which temperature limits are specified should be measured at the
point where the highest temperature is expected, based on manufacturers description.
6.9.4.3 Limits of temperature rise

The temperature rise limits specified by the manufacturer or applicable standards can be used. For example,
Table 4 in IEEE Std C57.16, Table 3 in IEC 62271-1, and Table 3 in IEEE Std C37.100.1 provide limits for
dry-type air-core series reactors and switchgear equipment.
6.9.4.4 Insertion impedance

The insertion impedance is calculated by dividing the measured voltage drop across the FCL by the
measured current.
6.9.4.5 DC resistance measurement

DC resistance is measured before and after the continuous current test to assess the integrity of the FCL.
29
IEEE Std C37.302-2015
The test performed with dc current is typically in the range of tens of amps up to the rated continuous
current IEEE Std C37.100.1 and IEC 62271-1. Special attention should be given to testing superconducting
and electronic FCLs with dc current to avoid damage.
6.9.5 Test criteria

All measured and derived quantities are expected to stay within the values specified by the manufacturer.
6.10 Short-time withstand current and peak withstand current tests
6.10.1 Introduction
Short-time withstand current and peak withstand current tests on the main circuits and, where applicable,
the grounding circuits, may be performed to prove the ability of the FCL to safely withstand the dynamic
and thermal stresses due to short-time current exposure. This test is typically conducted with the peak and
short-time current withstand parameters provided by the manufacturer.
When performing these design tests on FCLs to demonstrate the rated capabilities, the user must be aware
that the short-time withstand current and the peak withstand current capability can be adversely affected by
the cumulative effects of repeated mechanical and thermal stressing produced by the different tests. It is not
feasible to continuously monitor and quantitatively evaluate the degrading effects of such tests.

Short-time withstand current and peak withstand current tests require the application of high current over a
defined duration. Some of the instructions from 6.6 of IEC 62271-1 0 and respectively IEEE Std C37.100.1
are generally applicable and may be referred to. The test voltage should be sufficient to provide the test
current at rated frequency and should be below the rated voltage of the FCL. If feasible some tests can be
combined directly with the short-circuit limitation tests (see 6.12). In these cases, the tests have to be
carried out in accordance with 6.12 using the most severe limitation settings, at rated voltage, rated power
frequency, rated maximum prospective fault current, and rated duration.
6.10.2.1 Conditions of the FCL under test

The FCL and auxiliary equipment would typically be mounted in all significant respects as in service and
protected against undue external heating or cooling.
Refer to 6.12.2.7.
6.10.2.2 Test circuit

The test circuit provided in 6.12.3.1 may be utilized. The tests are usually carried out at lower voltages than
the rated voltage, or alternatively an impedance, is inserted in series with the short-circuit circuit breaker to
limit the current to the rated peak and short-time withstand current.
6.10.2.3 Rating of the source

The source should be sufficient to provide the rated peak and short-time withstand parameters for both
C mode and CL mode.
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IEEE Std C37.302-2015
6.10.3 Measurement and recording devices

When measuring the FCL performance, a minimum of three signals per phase may be specified to be
recorded digitally: the test current, the line-to-ground voltage, and the differential voltage across the FCL
terminals. 11
The measurements may be used to derive or verify the insertion impedance of the FCL at current values
above rated continuous current.
Current and voltage measurement devices should have appropriate ranges. Recording devices are expected
to have adequate bandwidth and resolution to record the peaks and transients properly.
6.10.3.1 Test arrangement

Arrange the connections to the terminals of the FCL in such a way as to avoid unrealistic stressing of the
terminals. Ensure that the distance between the terminals and the nearest supports of the conductors on both
sides of the FCL are in accordance with the instructions of the manufacturer.
Note the test arrangement in the test report.
Carry out the test on all three phases for three-phase devices and on a single phase for single-phase devices.
The test may be made three-phase or single-phase. In the case of a single-phase test on a three-phase FCL,
perform the test on two adjacent poles in series. In the case of FCLs with separated poles, perform the test
either on two adjacent poles or on one pole with the return conductor at phase distance.
If the distance between poles is not fixed by the design, carry out the test at the minimum distance indicated
by the manufacturer.
6.10.4.1 C mode
Calibrate the test circuit to verify that the current does not exceed the rated peak and short-time withstand
parameters for C mode: i p ,C , I k ,C , tk ,C .
Insert the FCL and perform the test.
If an FCL has an adjustable initiation criterion, set the level such that the FCL does not have a transition to
CL mode during the test.
6.10.4.2 CL mode
Calibrate the test circuit to verify that the current does not exceed the rated peak and short-time withstand
parameters for CL mode: i p ,CL , I k ,CL , tk ,CL .
Insert the FCL and perform the test.
11
If dv/dt values or the peak voltage after the CCL transition exceed those of the source voltage manufacturers and users should
consult about the waveforms
31
IEEE Std C37.302-2015
6.10.4.3 Test current and duration

Test the FCL as a whole system (between incoming and outgoing terminals) at its withstand current ratings
as specified by the manufacturer.
If required, different FCL current branches may be tested separately as discussed between the user and the
manufacturer.
The current branches without limitation by the FCL characteristic can be tested in C mode with the
maximum rated withstand current rating, means maximum in respect of thermal and dynamic stress. i pn,C ,
I kn,C , tkn,C .
The current branches with limitation may be tested in the CL mode with the limited rated withstand current
rating. i pn,CL , I kn,CL , tkn,CL .
If the current is interrupted during the tests, the FCL may have reached its CLI transition already. Some
FCLs might have no stable CL mode and therefore will always come to the CLI transition (e.g., behaves
like a fuse). These FCLs have no rated withstand current ratings in CL mode, but rated withstand current
ratings in C mode and short-circuit current limitation ratings.
The FCL or its current branches with limitation may additionally be tested with all critical overcurrent
ratings, which are either withstand ratings in respect of thermal stress (duration) or in respect of dynamic
stress (peak and short-time current). Therefore, tests with different current ratings and different durations
should be considered as there are different stress factors to be verified.
If the FCL has different adjustable initiation criteria and limitation timings, all rated withstand tests may be
carried out in accordance to the maximum allowed settings (maximum current and maximum duration).
Some of the above described short-time withstand current tests (STCs) may also be directly carried out
within the limitation/interruption tests (see 6.12) (e.g., FCLs, which require a transition to CL mode to enter
a stable CL mode).
The ratings validated by STC tests should be applied on the nameplate respectively the ratings applied on
the nameplate have to be validated by STC test.
For test current requirements, such as:
Limitations on the maximum peak of the test current,
Limitations on the power frequency of the test current,
Limitations on the rms values of the test currents,
Limitations on the asymmetry of the test currents in the three-phases, and
Rated durations.
Section 6.6 from IEC 62271-1 and IEEE Std C37.100.1 respectively, are generally applicable and may be
referred to.
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IEEE Std C37.302-2015
6.10.4.4 Behavior of FCL during test

The FCL should be capable of carrying all applicable rated peak withstand current and all applicable rated
short-time withstand current without causing mechanical or thermal damage to any of its components.
No temperature-rise limits are specified for the short-time current withstand tests as per IEC 62271-1.
However, the maximum temperature reached should not be sufficient to cause significant damage to
adjacent parts.
6.10.4.5 Conditions of the FCL after test

After the test, the FCL should not show any obvious signs of unanticipated deterioration and it should be
capable of operating normally. If a mechanical switching device is integrated, a no-load operation of this
device shall be performed immediately after the test, and the contacts shall open at the first attempt.
Additionally the FCL shall be capable of carrying its rated continuous current without exceeding the
temperature-rise limits as described in 6.9 and capable of withstanding the power frequency withstand test
specified in 7.2.
The following is sufficient to check these requirements:
Visual check may be based on photos before and after tests,
Measurement of the resistance of the main circuit in C mode before and after the tests and
comparison with values from the temperature rise tests. If the resistance has increased
significantly, and if it is not possible to confirm the proper condition, it may be appropriate to
perform an additional temperature-rise test, and
Dielectric tests as in 6.2.
6.11 Harmonic distortion
In order to characterize possible nonlinear interactions from FCLs, any distortions of voltage and current
waveforms may be extracted during continuous current test (see 6.9), short-time withstand tests (see 6.10),
and current-limiting tests (see 6.12).
6.12 Short-circuit current limitation tests
6.12.1 Introduction
These tests are designed to verify the ability of the FCL to withstand the electrical, mechanical, and thermal
stresses which may be produced by the prospective fault current conditions specified by the user and the
highest stress conditions defined by the manufacturer during the transition to CL mode and subsequent CL
mode operation. The external short circuits may include the following faults: three-phase ungrounded,
single line-to-ground, double line-to-ground, and line-to-line faults on any one set of terminals at a time.
When performing design tests on FCLs to demonstrate the fault current limiting capabilities, the user must
be aware that short-circuit withstand capability can be adversely affected by the cumulative effects of
repeated mechanical and thermal stressing produced by fault currents. It is not feasible to continuously
monitor and quantitatively evaluate the degrading effects of such short-circuit tests.
33
IEEE Std C37.302-2015
Coupling between phases in FCLs may result in different limiting performances and stress levels depending
on the type of fault applied. The user is encouraged to consult with the manufacturer to determine the stress
level.

Short-circuit current limitation tests usually require the simultaneous application of high current and high
voltage. It is preferable that the FCL be tested at full rated voltage, at rated power frequency, at rated load
current, rated prospective fault current, and rated duration. If however laboratory capabilities cannot
provide these conditions simultaneously, the following compromises may be acceptable:
Tests without load current,
Tests at reduced voltage, and
Tests of individual phases separately.
6.12.2.1 Fault location and type

Typically, a make switch downstream of the FCL will be applied.
If the user requires the FCL to make a transition to CL mode upon energization with the fault already
applied downstream of the FCL, the user may consult the manufacturer to clarify the corresponding stress
levels.
Depending on the operating mode and transitions to be tested, a sequence of operations may be required as
described in 5.1.2.6.
The type of faults for fault current limiting tests will be dependent on the type of FCL (single-phase or
three-phase) and on the available energy source.
6.12.2.2 Prospective short-circuit current

The FCL should be tested with rated maximum and minimum prospective short-circuit current levels and
durations as described in 3.3 and 3.4.
6.12.2.3 Limited fault current

The limited fault current should be the rated short-time limited short-circuit withstand current and durations
as described in 3.7.
6.12.2.4 Source voltage

If possible, the source voltage should be the rated voltage of the FCL.
If the capacity of the lab is a limiting factor, a source voltage lower than the rated voltage may be used,
provided that the voltage across the FCL after the transition to CL mode is sufficient to allow the rated
limited fault current to flow through the FCL. In this case, the prospective short-circuit current will be
above the rated maximum prospective fault current. Furthermore, for FCLs with CLI transition, the voltage
after the CLI transition should be the rated voltage.
34
IEEE Std C37.302-2015
6.12.2.5 Number of tests

The number of tests should be at least representative of the rated sequence of operations.
For single phase test, at least one symmetrical and one asymmetrical test should be performed. If polarity
may affect the performance of the FCL, the manufacturer should provide guidance on additional test
requirements.
6.12.2.6 Duration of short-circuit events

The duration of short-circuit events should be representative of rated values.
If the FCL is capable of CLI transition, an appropriate duration of subsequent rated voltage is
recommended to be applied to prove the dielectric withstand capability.
6.12.2.7 Conditions of the FCL under test

The FCL under test should be complete with all the auxiliary systems connected and energized and if
applicable, filled with the appropriate liquid or gas at the functional pressure (or density) for insulation or
cooling prior to the test.
If the FCL has adjustable settings, the settings that produce the most severe stresses should be selected.
6.12.3.1 Test circuit

The configuration of the test circuit can be utilized as per Figure 14. The external bypass switch is closed
when testing the circuit for prospective fault current levels. Other circuits and instrumentation
arrangements may be used. Additional isolations or protecting devices may be added as supervisory or
safety circuits without interfering with test duration or test parameters. The test may be considered invalid
if these safety or supervisory circuits interrupt the test prematurely.
External
bypass Switch
Line Switch CT
G FCL Load
Generator
PT PT
Short Circuit
Switch
Digital recorder
`
Figure 14Test circuit schematic
35
IEEE Std C37.302-2015
6.12.3.2 Fault application

In order to produce the desired asymmetry of the prospective fault current waveform as illustrated in Figure
13, the short-circuit switch in Figure 14 should have low variations in closing times.
6.12.3.3 Calibration tests

Calibration tests of the test circuit depicted in Figure 14 are performed prior to testing the FCL to verify
that the prospective fault current waveform meets requirements. In addition, the rated continuous current
level before and after the fault is verified for recovery tests as illustrated in the example shown in Figure
15. In particular, load current after the fault would be typically verified in accordance with IEEE C37.60.
60
55
50
45
40
35
30
25
, kA
Current[pu]
20
15
LineCurrent
10
5
0
Line
-5
-10
-15
-20
-25
-30
0.000
0.020
0.040
0.060
0.080
0.100
0.120
0.140
0.160
0.180
0.200
0.220
0.240
0.260
0.280
0.300
0.320
0.340
0.360
0.380
0.400
0.420
0.440
Time [sec]
Figure 15Example of a single-phase calibration test
6.12.4 Integrity check of the FCL

Prior to current limiting testing the following tests and inspections may be performed to validate the
integrity of the FCL and to provide a benchmark for post-performance test comparisons:
DC resistance (see 6.9.4.5),
Insulation resistance (see 6.10.4.5),
Insertion impedance (see 5.8 and 6.9.4.4),
Losses (see 5.1.2.5),
Voltage withstand [power frequency (see 6.2) and/or lightning impulse (see 6.3)], and
Visual inspection (see 6.18)
36
IEEE Std C37.302-2015
6.12.5 Measurement and recording devices

With reference to the circuit schematic in Figure 14, the external bypass switch is open and the FCL is
inserted in the circuit. When connecting the FCL in the circuit, particular attention should be paid in
maintaining the calibration circuit parameters constant. No additional impedances, other than the terminal
impedance of the FCL, should be added. The electrical connections to the bypass switch, or the connections
used to short circuit the line during calibration, should be made as short as possible and be of negligible
impedance. The test laboratory operator should verify that the short-circuit trials be performed with the
same timing and point-on-wave used for the calibration trials.
When measuring the FCL performance, a minimum of four signals per phase may be specified to be
recorded digitally: the short-circuit current, the load current, the line-to-ground voltage, and the differential
voltage across the FCL terminals.
Current and voltage measurement devices should have appropriate ranges. Recording devices are expected
to have adequate bandwidth and resolution in order to properly record the peaks and transients.
6.12.6 Behavior of the FCL during test and proof of performance

The FCL is expected to limit the peak and rms current as per the manufacturers specifications and
withstand the limited current without sustaining mechanical or thermal damage to any part. During testing
performance characteristics are expected to stay within the range specified by the manufacturer.
When the tests and inspections described in 6.12.4 have been performed with satisfaction, it is probable that
the FCL has sustained no mechanical or thermal damage during the test. A composite evaluation of the
degree to which all criteria have been met may indicate the need for a greater or lesser degree of visual
inspection to confirm satisfactory performance. The evidence may be sufficient to permit a judgment of
satisfactory performance to be made without complete dielectric tests. A decision to waive all or part(s) of
the visual inspection or dielectric test criteria should be based on discussion and negotiation of all parties
involved in specification and performance of short-circuit tests.
6.12.7 Sequence of tests

The sequence of tests for an FCL may vary depending on the technology of the FCL. Table 2 shows an
example of a sequence of tests for an FCL that recovers under load.
Table 2Sequence of test for an FCL that recovers under load
Test
Applied current condition Duration Remark
number
1 Rated continuous current of 3 second To verify the expected insertion
FCL ( I r ) minimum impedance.
2 Rated maximum prospective 10 cycles To verify the rated limited short-circuit
short-circuit current of FCL withstand current of the FCL during
( i p ,max , I k ,max ) peak and rms current limiting action.
3 Rated continuous current of Twice the To verify the recovery time. The
FCL ( I r ) expected duration should be long enough for the
recovery time FCL to recover.
4 Rated maximum prospective 10 cycles To repeat test 2.
short-circuit current of FCL
( i p ,max , I k ,max )
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IEEE Std C37.302-2015
Table 3 shows an example of a sequence of tests for an FCL with a specific triggering level.
Table 3Sequence of test for an FCL with a specific triggering level
Test Applied current

Duration Remark
number condition
1 Rated continuous current 3 second minimum To verify the expected insertion
of FCL ( I r ) impedance.
2 Initiation criteria of the 10 cycles To verify the initiation criteria of the
FCL as specified by the FCL.
manufacturer.
3 Rated continuous current Twice the expected To verify the recovery time as specified
of FCL ( I r ) recovery time by the manufacturer. The duration
should be long enough for the FCL to
recover.
6.13 Current interruption
It may be possible to adapt circuit breaker testing standards, (e.g. IEEE Std C37.09, IEEE Std C37.41
[B13], IEV ref. 441-17-01 [B20], IEEE Std C37.46 [B14]) or current-limiting fuse testing standards IEEE
Std C37.46 [B14] and IEC 60282-1 to function as a guide for testing current interrupting behavior of those
FCLs which actually interrupt current. The user would need to account for the waveforms present during
the interruption, such as the transient recovery process, which may differ significantly due to the current
limiting action of the FCL.
Once the interruption is complete, those clauses which apply to open circuit breakers or current limiting
fuses, such as voltage withstand across the open circuit, may apply without any major modifications.
It is beyond the scope of this document to provide detailed guidance regarding testing current limiting in
combination with current interruption.
The FCL interruption performance may be tested as part of the current limitation test.
6.14 Recovery

Both cases mentioned in 3.7, namely recovery without load and recovery under load, may be considered for
testing.
6.14.2 Recovery under load

In case of recovery under load, it is necessary to verify that the FCL can limit a new fault event during both
partial recovery and full recovery status.
A specific type-test has to ascertain the FCL behavior, if a fault event during recovery occurs. The exact
test-setup depends on the specific FCL type and should be defined with close cooperation of the FCL
manufacturer and the operator.
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IEEE Std C37.302-2015
6.14.3 Recovery without load

In case of recovery without load, it is necessary to verify recovery before switching the device back to the
circuit. If the system is not fully recovered, it does not operate in a well-defined state and the FCL cannot
sustain a new fault event.
A specific type-test has to prove the operational status of the FCL. In some cases it can be sufficient to
prove that the relevant operating parameters for the FCL are regained. The exact test-setup depends on the
specific FCL type and should be defined with close cooperation of the FCL manufacturer and the user.
6.15 Electromagnetic compatibility EMC
6.15.1 Main circuits

EMC emission tests (radio interference voltage test, or RIV) from main circuits of the FCL may be
performed based on 6.9.1.1 of IEC 62271-1.
6.15.2 Electronic controls

EMC tests for electronic controls of the FCL may be performed based on IEC 60255-26. This document
specifies all of the requirements for electromagnetic compatibility in a single document. It is considered as
an overview document. The detailed test procedures are given in other referenced standards.
6.15.2.1 Emission
The object of IEC 60255-26 standard is to specify limits and test methods, for measuring relays and
protection equipment in relation to electromagnetic emissions which may cause interference in other
equipment.
NOTEThese emission limits represent electromagnetic compatibility requirements and have been selected to verify
that the disturbances generated by measuring relays and protection equipment, operated normally in substations and
power plants, do not exceed a level which could prevent other equipment from operating as intended. Test requirements
are specified for the enclosure and power supply ports.
6.15.2.2 Immunity
The object of IEC 60255-26 standard is to specify the immunity test requirements for measuring relays and
protection equipment in relation to continuous and transient conducted and radiated disturbances, including
electrostatic discharges. These test requirements represent the electromagnetic compatibility immunity
requirements and have been selected so as to verify an adequate level of immunity for measuring relays and
protection equipment.
6.16 Audible sound
Due to the inherent design and construction of some FCLs, which primarily rely on variable reactances to
limit current, FCLs emit acoustic noise originating from the periodic cycling of electromechanical forces in
the equipment. These forces cause the windings of the reactance, core, and FCL enclosure to vibrate with
respect to one another. Magnetostrictive forces also cause the reactance core to vibrate and result in
radiated audible noise. Noise levels of the FCL may be measured in the lab using transducers and signal
processing equipment to rank order noise source when there is background noise. Lab may also use other
noise measuring instruments in anechoic chambers to lower background noise. Decibel levels can be
weighted with the A-scale to determine the level of loudness and irritation to the human ear. The A-scale
39
IEEE Std C37.302-2015
attenuates very low and very high frequency sounds which are difficult to hear and amplifies mid-range
frequencies.
FCLs should be operated over their full operating range and during their switching modes to assess their
audible sound levels. Audible sound levels during mode transitions might be higher than during steady
state. Applicable testing procedures may be found in NEMA Std ST-20 [B21].
Manufacturers of substation equipment are typically required to incorporate in their design and construction
means to attenuate acoustic noise levels using vibration isolation pads and special low noise enclosure.
Users may mitigate acoustic noise by proper grounding, and using flexible metallic conduit.
6.17 Seismic tests
6.17.1 Methodology
Seismic tests or analysis on FCLs may be performed based on IEEE Std 693. The recommended practice
outlined in IEEE Std 693 is intended to establish standard methods of providing and validating the seismic
withstand capability of electrical substation equipment. It provides detailed test and analysis methods for
each type of major equipment or component found in electrical substations.
Three qualification levels are defined in this document: low, moderate, and high. The user may determine
the desired qualification level when purchasing the equipment.
IEEE Std 693 provides a flow chart where the reader can locate the clauses and annexes that apply to the
type of equipment that is of interest.
6.18 Visual inspection
Visual inspection of the FCL internal components (cores, coils, windings, etc.) should give no indication
that any change in mechanical condition has occurred that will impair the function of the FCL. For FCLs
with constructions similar to a transformer, further information may be found in 12.6 of IEEE
Std C57.12.91. The extent of the visual inspection should be established on the basis of combined evidence
obtained from previously conducted tests. When these test results give indication of an adverse change in
condition, external inspection of the FCL components may be necessary.
6.19 FCL technology-specific tests
6.19.1 LN2 based insulation systems

Some of the above described FCL types use the transition of superconducting elements from
superconducting state (low resistance) to normal conducting state (high resistance) to limit fault currents.
These superconducting elements have to be cooled using liquid or gaseous cryogens. In case of HTS (high
temperature superconductors), this is typically achieved using liquid nitrogen (LN2) with a boiling point of
77 K at atmospheric pressure. Operating temperatures are usually chosen between the triple point of LN2
(i.e., 63.2 K) and 77 K.
Pure LN2 (77 K, normal pressure) has a homogeneous field dielectric strength of approximately 10 kV/mm.
Significantly reduced values apply to boiling liquid nitrogen due to bubble formation. In case of a limiting
event, bubble formation may occur during and after the transition from the superconducting to the normal
40
IEEE Std C37.302-2015
conducting state as energy is released into the liquid nitrogen. The pressure inside the cryostat may also rise
due to LN2 boil off.
The voltage drop across the FCL during CL mode and superimposed internal and external transient
overvoltages may pose a challenge to the dielectric insulation under bubble formation. A common solution
to address these challenges is to use sub-cooled nitrogen inside the cryogenic system. The insulation system
can also be designed with focus on the specific situation (e.g., live tank).
The objective of any type test is to verify the integrity of the insulation system under the highest expected
stress. For air insulated systems, it appears that switching impulse waveforms (which demonstrate
significantly lower rise times than lightning impulse waveforms) become the dominant challenge to
systems designed for voltages above a certain threshold. Therefore, devices for such voltage classes are
required to pass switching impulse testing. However, at this time, there is not enough scientific evidence
that clearly suggests voltage waveform dependencies of withstand capabilities for LN2 based insulation
systems. Therefore, the application of switching impulse waveforms for testing the integrity of the LN2-
based insulation system of high voltage FCLs may need to be further investigated. More details on LN2-
based insulations systems can found in IEV ref. 441-17-01, [B20] and Potential of Cryogenic Liquids for
Future Power Equipment Insulation in the Medium High Voltage Range (Gerhold [B4]).
6.19.2 Inductive type with significant mutual coupling between phases

In the case of a three-phase inductive-type FCL, where the effect of mutual inductances may not be
neglected, it is recommended that the type of fault to be applied be the one that results in the least fault
current limiting capability of the device
7. Production (routine) tests

Given the limited industry experience with FCLs, it may be desirable to perform one or more of the tests
described below at appropriate stages of the manufacturing process. The suggested production testing may
be performed until industry achieves a satisfactory level of confidence in this advanced technology.
Production tests are normally made by the manufacturer at the factory as part of the production process. If
the FCL is completely assembled prior to shipment, some of the production tests are made after final
assembly, but other tests can often be made more effectively on components and subassemblies during or
after manufacture.
If the FCL is not completely assembled at the factory prior to shipment, appropriate tests on component
parts may be made to check the quality of workmanship and uniformity of material used and to assess
satisfactory performance when properly assembled at its destination. This performance may be verified by
making tests after delivery.
This is a testing guide, so only some of the production routine tests discussed below are suggested. The rest
are tests that the user may choose to discuss with the manufacturer, if needed.
7.1 Power frequency voltage withstand test
Production testing of power frequency voltage withstand may be performed in compliance with 5.16 of
IEEE Std C37.100.1, IEEE Std 4, and/or IEC 60060-1. However, refer to 6.2 of this document for
consideration of the conditions specific to FCLs.
41
IEEE Std C37.302-2015
7.2 Other voltage withstand tests
Other voltage withstand tests might be part of the suite of the production tests.
The user of this guide may want to consider the following in discussions between user and manufacturer:
Whether the tests are necessary in light of the FCL application and the specific FCL technology,
Whether the design tests are already sufficient,
Whether the criteria the FCL must meet, and
Whether 6.3, 6.4, and 6.5 of this document, may be adapted for procedures.
7.3 Partial discharge
For some FCLs, PD tests may be performed to provide baseline data which the user can use later to
compare to the results of PD tests at various times in the service life of the FCL.
Refer to 6.7 for more information.
7.4 Control circuit voltage and wiring checks
Connections and control circuit withstand may be tested on each FCL unit as part of routine tests.
Secondary wiring may be checked to verify that all connections were made in accordance with the wiring
diagram. Relays and other devices may be checked by actual operation, if feasible. Those circuits for which
operation is not feasible may be checked for continuity.
A check may be made for proper sequence of operation of mechanically operated auxiliary switches and
devices, if any.
For further information the user may want to consider:
5.2, 5.10, and 5.17 of IEEE Std C37.09,
8.2.4 of IEEE Std C57.12.00, and
7.2 of IEEE Std C37.122.
7.5 Visual inspection
If specified by the user, the FCL may be visually inspected to verify completeness and a correspondence
between the FCL and the approved design documents.
42
IEEE Std C37.302-2015
7.6 Considerations to assess essential FCL functionality 12
In some cases, the design tests might be considered sufficient to assess the functional performance of the
end product. For others the manufacturers quality control procedures may be sufficient. In still others,
specific tests may be required.
One or more of the following properties might be considered essential in some FCL applications. The user
may choose to discuss with the manufacturer how the manufacturer verifies that these properties will be
met by the FCLs to be supplied.
FCL performance while in C mode:
voltage drop,
harmonic content,
power losses other than auxiliary, and
short-time and peak current withstand capability.
FCL performance while in CL mode:
impedance,
voltage drop, and
harmonic content.
Recovery performance:
Current breaking capability of the FCL (if applicable), and
Auxiliary power losses.
7.7 FCL technology-specific tests
The user may consider discussing other productions tests proposed by the manufacturer to verify other
aspects specific to their FCL technology.
12
It was the opinion of the working group at the time of writing this document that for many FCL technologies there was insufficient
industry experience to define production tests suitable for essential FCL functionalities.
43
IEEE Std C37.302-2015
8. Field inspection, testing, and commissioning of fault current limiter and

ancillary systems
8.1 General
This clause establishes general guidelines for field inspection, testing, and commissioning to verify the
integrity of the installed FCL. It should be recognized that there are many ways in which a particular FCL
may be commissioned and also that it is not the purpose of this guide to endorse a specific procedure to the
exclusion of other methods.
The main objective is to help users of FCLs carry out commissioning and subsequent field testing. Such
testing typically includes the following:
a) Separate testing, if possible, of the various sub-systems that comprise the FCL, for example:
1) Trip circuits,
2) Cryogenic or cooling systems,
3) Disconnect or other switches,
4) Dielectric integrity of the main circuit, and
5) Continuity check of the main circuit.
b) Commissioning tests of the complete FCL installed in the system as specified in the commissioning
plan agreed upon between the user and manufacturer.
Note that performance testing of the FCL core functionality (i.e., current limiting) in the field may not be
practical since it requires staging of a fault.
8.2 Field inspection and installation verification
The following list contains general guidelines of inspection that apply before the equipment is installed:
Inspect components for physical and structural damage, unusual physical conditions, defects, and
signs of corrosion,
Inspect equipment and components to be assembled for correct shipped parts,
Inspect equipment for cleanliness and being free of dents, scratches or missing parts,
Inspect wiring for insulation damage, broken leads, tightness of connections, and proper
crimping,
Verify equipment nameplates and identification labels against drawings, and
Verify removal of shipping braces.
The following list contains general guidelines of installation checks that apply after equipment is installed:
Verify equipment grounding for adjustment and alignment,
44
IEEE Std C37.302-2015
Verify installation of component assemblies and their mounting supports for conformance to
manufacturers drawings and recommendations,
Verify equipment has been secured and anchored to its foundation in accordance with
manufacturers recommendations and seismic considerations,
Verify that installed materials other than those supplied or specified have not been substituted,
and
Verify the installation of equipment or function of a component in the system for not being in
compliance with contract documents, or with manufacturers installation instructions, or with
generally accepted industry standards.
45
IEEE Std C37.302-2015
Annex A
(informative)
Example of FCL ratings
Table A.1 shows an example of possible FCL ratings, including the typical ratings based on IEEE Std
C37.100.1.
Table A.1Example of possible parameters that could be listed for an FCL
Abbreviation Unit Remarks:

Manufacturer
Type designation and
serial number
Rated maximum voltage U kV
Rated lightning impulse withstand Voltage Up kV
Rated frequency fr Hz
Rated continuous current Ir A
Rated steady-state voltage drop U sd V
Rated maximum prospective i p ,max / ik ,max kA Peak value/rms value

short-circuit fault current
Rated minimum prospective i p ,min / ik ,min kA Peak value/rms value
fault current
Rated limited short-time withstand current in i p ,CL / I k ,CL , B / E kA Peak value/rms value, if
CL mode applicable
Rated duration of limited short-time tk ,CL S if applicable
withstand current in CL mode
Rated short-time withstand current in C i p ,C / I k ,C , B / E kA Peak value/rms value
mode
Rated duration of short-time withstand tk ,C S
current in C mode
Rated filling pressure prm MPa if applicable
for operation
Rated supply voltage Ua V
of auxiliary circuits
Rated supply frequency fa Hz
of auxiliary circuits
Mass (including m Kg
liquids or gas)
Year of manufacture
Temperature class min./max. (e.g.,
-5 C / + 40C indoor
-25 C / +55C outdoor)
Instruction book
reference
46
IEEE Std C37.302-2015
Annex B
(informative)
List of variables
Table B.1 is an alphabetical list of all variables used in this standard. It provides a short description of each
variable and specifies the document subclause in which it is first defined or referenced.
Table B.1Index to initial appearance of variables cited
Symbol/
Description Subclause
abbreviation
C mode Conducting mode 3.1
CCL C mode to CL mode transition 3.1
CL mode Current limiting mode 3.1
CLC CL mode to C mode transition 3.1
CLI CL mode to Interrupting (I) mode transition 3.1
didt Init _ max Initiation rate-of-current-rise 5.6.2
FCL Fault Current Limiter 3.1
fr Rated power frequency 5.1.2.3
ia ,max Initiation current 5.6.1
IC I mode to C mode transition 3.1
Ik Prospective rms fault current 5.1.1.1
I k ,C , B / E Maximum short-time withstand current 5.5.1
I k ,CL, B Rated limited, rms, short-circuit withstand current (at beginning

5.7.1
of its definition period)
I k ,CL, E Rated limited, rms, short-circuit withstand current (at end of its
5.7.1
definition period)
I k ,max Maximum prospective rms short-circuit current 5.1.1.1
I k ,min Rated minimum prospective short-circuit current 5.4
I kn,CL, B and I kn,CL, E Rated short-time, short-circuit withstand branch current 5.5.2
Ip Prospective peak fault current 5.1.1.1
i p ,c Rated peak withstand current 5.5.3

i p ,CL Rated peak, limited, short-circuit withstand current 5.7.2
i p , LT Peak let-through current 3.6
I p ,max Rated maximum prospective peak short-circuit current 5.3
47
IEEE Std C37.302-2015
Table B.1Index to initial appearance of variables cited (continued)
Symbol/
abbreviation
i p ,max Rated maximum prospective symmetrical short-circuit current 5.3
i pnC Rated peak withstand branch current 5.5.4
i pn,CL Rated peak, limited, short-circuit withstand branch current 5.7.2
Ir Rated continuous current 5.1.2.2

PD Partial Discharge 6.7
Ploss Rated power loss 5.1.2.5
tda Initiation delay 5.6.3
t k ,C Rated duration of short-time withstand current 5.5.5
tk ,CL Max. duration of limited short-circuit withstand current 5.7.1
tkn,CL Max. duration of limited short-circuit withstand branch current 5.7.3
t LT Peak let-through time 3.6
TLV Transient fault current limitation voltage 3.2
U Rated maximum voltage 5.1.2.1
Ud Power frequency withstand voltage 6.2.3
U k ,CL, B rms fault current limitation voltage, definition period beginning

5.2
value
U k ,CL, E rms fault current limitation voltage, definition period ending

5.2
value
uk ,CL,max Maximum fault current limitation voltage 3.2
Up Lightning impulse withstand voltage 6.2.3
Us Switching impulse voltage 6.2.3

U sd Rated steady-state voltage drop 5.1.2.4
U sd Rated voltage drop Annex B
Z FCL C Rated insertion impedance 5.8
t pr No-load recovery process time 3.7
t prR Time after clearing fault until FCL is in CL mode and ready to
3.7
carry below rated continuous current
tr Time after clearning fault until FCL is in CL mode and ready to

3.7
carry up to rated continuous current
trR Time after clearning fault until FCL is fully recovered 3.7
48
IEEE Std C37.302-2015
Table B.1Index to initial appearance of variables cited (continued)
Symbol/
abbreviation
tso pr1 , tso pr 2 ,
Sequence of operations with partial recovery 5.1.2.6.2
tso pri
tso r1 , tso r 2 ,
Sequence of operations with full recovery 5.1.2.6.1
tso ri
49
IEEE Std C37.302-2015
Annex C
(informative)
Bibliography
Bibliographical references are resources that provide additional or helpful material but do not need to be
understood or used to implement this standard. Reference to these resources is made for informational use
only.
[B1] Ahmed, N. H. and Srinivas N. N., On-Line Partial Discharge Detection in Transformer,
Conference Record of the 1998 IEEE International Symposium in Electrical Insulation, Arlington, VA,
June 710. 1998.
[B2] ANSI C57.12.55, American National Standard for Transformers Used in Unit Installations,
Including Unit Substations-Conformance Standard.
[B3] CIGRE Technical Brochure 497, Application and Feasibility of Fault Current Limiters in Power
Systems, WG A3.23; 2012.
[B4] Gerhold, J., Potential of Cryogenic Liquids for Future Power Equipment Insulation in the Medium
High Voltage Range, IEEE Transactions on Dielectrics and Electrical Insulation Vol. 9, No. 6, Dec 2002,
pp. 878890.
[B5] IEC 60099-4, Surge arresters Part 4: Metal-oxide surge arresters without gaps for a.c. systems.
[B6] IEC 60099-5, Surge arresters Part 5: Selection and application recommendations.
[B7] IEC 60909-0, Short-circuit currents in three-phase a.c. systems Part 0: Calculation of currents.
[B8] IEEE Std 141, IEEE Recommended Practice for Electric Power Distribution for Industrial Plants.
[B9] IEEE Std 142, IEEE Recommended Practice for Grounding of Industrial and Commercial Power
Systems.
[B10] IEEE Std 519, IEEE Recommended Practice and Requirements for Harmonic Control in Electrical
Power Systems.
[B11] IEEE Std C37.010, IEEE Application Guide for AC High-Voltage Circuit Breakers Rated on a
Symmetrical Current Basis.
[B12] IEEE Std C37.20.2, IEEE Standard for Metal-Clad Switchgear.
[B13] IEEE Std C37.41, IEEE Standard Design Tests for High Voltage Fuses, Distribution Enclosed
Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories.
[B14] IEEE Std C37.46, IEEE Standard Specifications for High-Voltage (>1000 V) Expulsion and
Current-Limiting Power Class Fuses and Fuse Disconnecting Switches.
[B15] IEEE Std C37.90.1, IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and
Relay Systems Associated with Electric Power Apparatus.
[B16] IEEE Std C37.90.2, IEEE Standard for Withstand Capability of Relay Systems to Radiated
Electromagnetic Interference from Transceivers.
[B17] IEEE Std C37.90.3, IEEE Standard Electrostatic Discharge Tests for Protective Relays.
[B18] IEEE Std C57.12.01, IEEE Standard General Requirements for Dry-Type Distribution and Power
Transformers Including Those with Solid-Cast and/or Resin Encapsulated Windings.
[B19] IEEE Std C62.11, IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).
50
IEEE Std C37.302-2015
[B20] IEV ref. 441-17-01, Definitions of characteristic quantities of switchgear, controlgear and fuses, i.e.
prospective current.
[B21] NEMA Std ST-20: Dry-type Transformers for General applications.
[B22] Noe, M., K.-P. Jngst, S., Elschner, J., Bock, F., Breuer, R., Kreutz, M., Kleimaier, K.-H., Weck, N.,
Hayakawa, High voltage requirements and test of a 10 MVA superconducting fault current limiter, IEEE
Transactions on Applied Superconductivity, Vol. 15, No. 2, June 2005, pp. 20822085.
51
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IEEE Guide for Fault Current Limiter

(FCL) Testing of FCLs Rated above

IEEE Power and Energy Society

IEEE Guide for Fault Current Limiter

Approved 5 December 2015

IEEE-SA Standards Board

Keywords: asymmetrical short-circuit current, continuous current, electromagnetic compatibility,

The Institute of Electrical and Electronics Engineers, Inc.

Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc.

PDF: ISBN 978-1-5044-0831-8 STD20883

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Laws and regulations

Michael Steurer, Chair

Ram Adapa Jerry Earl Isidor Sauers

Ram Adapa Francisco DeLaRosa Christian Schacherer

Katrin Baeuml Ajit Gwal David Nichols

John D. Kulick, Chair

Masayuki Ariyoshi Joseph L. Koepfinger* Stephen J. Shellhammer

3. Definitions, acronyms, and abbreviations .................................................................................................. 3

4. FCL technical principles ............................................................................................................................. 9

5. Sample specification parameters ...............................................................................................................16

7. Production (routine) tests...........................................................................................................................41

Annex A (informative) Example of FCL ratings ...........................................................................................46

Annex B (informative) List of variables ........................................................................................................47

Annex C (informative) Bibliography.............................................................................................................50

3. Definitions, acronyms, and abbreviations

3.1 General FCL definitions

Controllable current limiting branch 2

Controllable current limiting branch n

Figure 1Current branches in an FCL

CCL transition: The transition from C mode to CL mode.

CLC transition: The transition from CL mode to C mode.

CLI transition: The transition from CL mode to Interrupting mode.

IC transition: The transition from Interrupting mode to C mode.

VA12, or VB12, or VC12 are the voltages across the FCL

Figure 2FCL voltages

3.2 Definitions related to voltages observed during fault current limitation

3.3 Definitions related to prospective short-circuit currents

For FCLs, two prospective short-circuit current values are defined.

peak short-circuit current, and

3.4 Definitions related to initiation of CCL transition

3.5 Definitions related to currents without limitation by an FCL

NOTEThe branch ID number is denoted by the value of the subscript n.

3.6 Fault currents or over-currents with limitation by an FCL

Figure 3Peak let-through current

3.7 FCL recovery processes and associated times

NOTESee Figure 4 in FCL recovery processes and associated times.

NOTESee Figure 4 in FCL recovery processes and associated times.

FCL in CL mode, ready to limit

rated fault current limit rated fault current

and enter CCL transition

and ready to carry and ready to and ready

NOTESee Figure 4 in FCL recovery processes and associated times.

NOTESee Figure 4 in FCL recovery processes and associated times.

NOTESee Figure 4 in FCL recovery processes and associated times.

NOTESee Figure 4 in FCL recovery processes and associated times.

NOTESee Figure 4 in FCL recovery processes and associated times.

NOTESee Figure 4 in FCL recovery processes and associated times.

4. FCL technical principles

Permanent impedance increase Condition based impedance increase

Splitting into High