Deltascope FMP10 Isoscope FMP10 Dualscope FMP20: Operators Manual

Operators Manual
DELTASCOPE FMP10
ISOSCOPE FMP10
DUALSCOPE FMP20
Coating Thickness Material Analysis Microhardness Material Testing

Order number: Version 1.1
902-093 09/08
DELTASCOPE FMP10
ISOSCOPE FMP10
DUALSCOPE FMP20
Operators Manual
Non-destructive measurement on
magnetic and non-magnetic
metallic base materials
2008 Copyright by
Helmut Fischer GmbH
Institut fr Elektronik und Messtechnik, Sindelfingen.
All rights reserved. No part of this manual may be reproduced by any
means (print, photocopy, microfilm, or any other method) or processed,
multiplied or distributed by electronic means without the written consent
of Helmut Fischer GmbH Institut fr Elektronik und Messtechnik.
Operators Manual FMP10 / FMP20 Page 1

Table of Contents
1 Important Information . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.1 Trademarks and Liabilities . . . . . . . . . . . . . . . . . . . . . . . 7
1.2 Symbols and Conventions Used in the Manual . . . . . . . 7
1.3 Intended Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
1.4 General Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
1.5 Requirements on the Operating Personnel . . . . . . . . . . 8
1.6 Environmental Conditions . . . . . . . . . . . . . . . . . . . . . . . 9
1.7 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.8 Handling, Storage and Transport of Calibration
Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.9 Instrument Repairs . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
1.10 Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2 Description of the Instrument . . . . . . . . . . . . . . . . . . 13

2.1 LCD Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.2 Control panel key functions . . . . . . . . . . . . . . . . . . . . 16
2.3 Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.3.1 Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.3.2 Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . 20
2.4 Technical Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.5 Contents of Shipment and Options . . . . . . . . . . . . . . . 23
2.5.1 Standard Contents of Shipment of the Instrument . . . 23
2.5.2 Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3 Measurement Methods for Coating Thickness

Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.1 Magnetic Induction Method . . . . . . . . . . . . . . . . . . . . . 26
3.2 Eddy Current Method . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.3 Measurements With DUAL Probes . . . . . . . . . . . . . . 26
Page 2 Operators Manual FMP10 / FMP20

4 System Setup, Maintenance and Cleaning . . . . . 27
4.1 Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
4.1.1 Installing or Replacing Batteries . . . . . . . . . . . . . . . . 28
4.2 Connecting Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
4.3 Turning the Instrument On/Off . . . . . . . . . . . . . . . . . . 33
4.3.1 Measurement Method of the Connected Probe . . . . 33
4.3.2 Power Up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
4.3.3 Measuring Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
4.3.4 Turning Off the Instrument . . . . . . . . . . . . . . . . . . . . 35
4.4 Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
5 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
5.1 Handling During Measurements . . . . . . . . . . . . . . . . . 37
5.2 Assigning a New Probe . . . . . . . . . . . . . . . . . . . . . . 38
5.3 Setting Up the Dual Mode for DUAL Probes . . . . . . . 39
6 Normalization, Calibration and Master

Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
6.1 Information Regarding Normalization, Calibration
and Master Calibration . . . . . . . . . . . . . . . . . . . . . . . . . 42
6.1.1 Recommended Number of Single Readings During
a Normalization, Calibration and Master Calibration . 43
6.2 Specific Features of DUAL Probes . . . . . . . . . . . . . . 44
6.3 Reference Measurements . . . . . . . . . . . . . . . . . . . . . 44
6.4 Normalization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
6.4.1 Normalization Procedure . . . . . . . . . . . . . . . . . . . . . 45
6.5 Corrective Calibration . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.5.1 Selecting the Calibration Standards for the
Corrective Calibration . . . . . . . . . . . . . . . . . . . . . . . . 47
6.5.2 Corrective Calibration Procedure . . . . . . . . . . . . . . . 48
6.5.3 Deleting a Corrective Calibration . . . . . . . . . . . . . . . . 52
6.6 Calibration on a Coating . . . . . . . . . . . . . . . . . . . . . . . 53
6.6.1 Procedure for a Calibration on Coating . . . . . . . . . . . 53
6.7 Master Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
6.7.1 Selecting the Calibration Standards . . . . . . . . . . . . . 58
6.7.2 Performing a User Master Calibration . . . . . . . . . . . . 58
6.7.3 Master Calibration Procedure . . . . . . . . . . . . . . . . . 59

6.7.4 Displaying Xn Ranges for Calibration Standards
for the Master Calibration . . . . . . . . . . . . . . . . . . . . 63
6.8 Determination of the Normalized Countrate Xn of
a Calibration Standard During a Master Calibration . 65
7 Measuring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
7.1 Preparing for a Measurement . . . . . . . . . . . . . . . . . . 66
7.2 Influencing Parameters . . . . . . . . . . . . . . . . . . . . . . . . 66
7.3 Making a Measurement . . . . . . . . . . . . . . . . . . . . . . . 67
7.3.1 Measurement Acquisition . . . . . . . . . . . . . . . . . . . . 69
7.3.2 Measurements With External Start Enabled . . . . . . . 70
7.3.3 Audible signals After the Measurement Acquisition . 71
7.3.4 Display of the measurement method in use
when making measurements with dual probes . . . . 71
7.4 Erroneous Readings . . . . . . . . . . . . . . . . . . . . . . . . . . 72
7.4.1 Deleting Erroneous Readings . . . . . . . . . . . . . . . . . 72
7.5 Measurements in the Free-Running Display Mode . . 72
7.5.1 Turning the Free-Running Display Mode On/Off . . . . 73
7.5.2 Procedure For Making Measurements in the
Free-Running Display Mode . . . . . . . . . . . . . . . . . . 74
7.5.3 Measurements In the Free-Running Display Mode
Using Dual Probes . . . . . . . . . . . . . . . . . . . . . . . . . . 75
8 Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
9 Data Transfer Using USB . . . . . . . . . . . . . . . . . . . . . 78

9.1 USB Connection to a PC . . . . . . . . . . . . . . . . . . . . . . 79
9.2 Installing the USB Driver . . . . . . . . . . . . . . . . . . . . . . . 79
9.3 Transfer of the Measurement Data to the Computer . 80
9.3.1 Online Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
9.3.2 Offline Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
9.4 Transmission from the PC to the Instrument . . . . . . . . 81
9.4.1 Transfer Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
9.4.2 Control Commands . . . . . . . . . . . . . . . . . . . . . . . . . . 81

10 Instrument Settings in the Service Function
Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
10.1 Service Menu Overview . . . . . . . . . . . . . . . . . . . . . . . . 84
10.2 System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
10.2.1 Language . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
10.2.2 Contrast . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
10.2.3 Lighting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
10.2.4 Automatic Switch Off . . . . . . . . . . . . . . . . . . . . . . . . 89
10.2.5 Re-Initialization of the Instrument . . . . . . . . . . . . . . . 90
10.3 USB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
10.3.1 Send Free-Running Mode . . . . . . . . . . . . . . . . . . . . 91
10.4 Instrument Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
10.4.1 Restricted operating mode . . . . . . . . . . . . . . . . . . . . 92
10.5 Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
10.5.1 Audible Signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
10.5.2 Measurement Effect . . . . . . . . . . . . . . . . . . . . . . . . . 95
10.5.3 External Start . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
10.5.4 Measurement Display Resolution . . . . . . . . . . . . . . 98
10.5.5 Measured Variable . . . . . . . . . . . . . . . . . . . . . . . . . 99
10.5.6 Dual Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
10.6 Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
10.7 Storage Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
10.8 Performing a Master Calibration . . . . . . . . . . . . . . . . 102
10.9 About ... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
11 Malfunctions and Messages . . . . . . . . . . . . . . . . . . 104

11.1 Malfunctions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
11.2 Messages on the LCD Display . . . . . . . . . . . . . . . . . 108
12 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143

1 Important Information
Important Information
1.1 Trademarks and Liabilities
DUALSCOPE, DELTASCOPE and ISOSCOPE are registered trade-
marks of Helmut Fischer GmbH Institute for Electronics and Metrology.
The fact that the trademark characters and may be missing
does not indicate that a name is a free trademark.
Great care has been exercised in creating this operator's manual. The Helmut Fis-
cher GmbH Institute for Electronics and Metrology assumes no liability for po-
tentially remaining erroneous or incomplete statements and their results. We
would, however, appreciate if you can make us aware of potentially existing er-
rors or incomplete information.
1.2 Symbols and Conventions Used in the Manual

The following symbols and conventions are used in this manual:
Indicates safety information referring to danger for per-

sons and warnings regarding damage to the measuring
instrument or to accessories.
Indicates particularly important information and hints.
Indicates a reference to a page or chapter in this manual.
1. Operation to be carried out by the operator at the instrument.
z Listing.
ENTER Writing convention for instrument keys and command buttons on the
display.

1.3 Intended Use
The instrument is to be used for coating thickness measurements on steel and iron
base materials as well as on non-ferromagnetic, electrically conducting base ma-
terials.
Only accessories recommended and approved by Helmut Fischer GmbH ( be-
ginning on Page 19) may be connected to this instrument.
1.4 General Information
The values shown for the measured coating thicknesses and the texts of
the information lines of the LCD display serve as examples for possible
displays. It is entirely possible that different values appear on the LCD
display or in the printout without having made any mistakes.
1.5 Requirements on the Operating Personnel
The instrument should be operated only by staff trained for

this purpose!
In addition, basic knowledge of metrology according to DIN 1319 is essential for

performing correct coating thickness measurements and evaluations.
Basic computer knowledge regarding configuration, operation and programing

as well as knowledge of the software in use, which may be obtained from respec-
tive instruction manuals, is required when using the instrument in conjunction
with a computer.

1.6 Environmental Conditions
EMC
The instrument complies with the laws concerning electromagnetic compatibility
of instruments (2004/108/EC). The measured coating thickness values are not in-
fluenced by the highest level of interference mentioned in the EN 61000-6-2
Standard (which references the Standards EN 61000-4-2, EN 61000-4-3 and EN
61000-4-4).
In particular, the instrument is shielded effectively from strong electromagnetic
fields (e.g., motors, power lines, radio transmission towers).
Low Voltage
The instrument adheres to the Low Voltage Directive 2006/95/EC.
Ambient Temperature Range During Operation: +10C ... 40C
Temperature Range During Storage and Transport: +5C ... 60C
Temperature behind glass panes (e.g., in cars) in direct sun-

light easily rise above 60C!
To avoid damage from heat, do not store the instrument or
accessories in such places.
The instrument and accessories (in particular the AC

adapter) must not come in direct contact with water! Risk of
electrical shorts! Instruments or accessories may be oper-
ated, kept or stored only in places, where the relative humid-
ity is between 30% and 90% (non-condensing).
Because the instrument and accessories are not acid resis-

tant, avoid direct contact with acid or acidic liquids.
The instrument and accessories are not suited for operation

in explosion-hazard areas!
Protect the instrument and accessories from static charges!

Electrical discharges may damage internal components or
delete internal memories.

1.7 Probe Handling
To avoid breakage of the wiring, do not bend the probe con-

nector cable! The radius of rolled up probe connector cables
should always be at least 50 mm!
Probe-
connector ca-
ble
R 50 mm !
Fig. 1-1 Probe handling
During the measurement, the magnetic poles of the probes are placed directly
onto the specimen. Observe the following to keep wear of the magnetic poles dur-
ing the contacting measurement to a minimum:
Place the probes speedily yet gently on the specimen sur-

face! Avoid hard impacts!
Do not drag the probe across the specimen surface.
Do not place standard probes on hot or acid-wetted sur-

faces; do not immerse them in liquids. Special probe models
are available for such applications (ref. the probe data
sheets of the brochure Measurement Probes and Measure-
ment Aids - Optimized Probes - The Key to Successful Coat-
ing Thickness Measurements). You can obtain this
brochure from the Helmut Fischer GmbH Institute for Elec-
tronics and Metrology or from your authorized supplier.

1.8 Handling, Storage and Transport of Calibration
Standards
The instrument is calibrated using calibration standards in the form of foils or
hard paper with various thicknesses.
Proper condition of the calibration standards is an important prerequisite for a
correct calibration, and thus for a correct measurement.
Observe the following to ensure the proper condition of the calibration standards:
To keep wear of the calibration standards during the contacting mea-
surements to a minimum, use the calibration standards for the calibration
only and not for test measurements!
Do not soil, bend or scratch calibration standards!

Replace soiled, bent, scratched or cracked calibration standards or
those with strong indentations with non-damaged standards. In particular
foils with thicknesses of less than 50 m are subject to rapid wear. Rec-
ommendation: Replace foils after no more than 100 to 200 measure-
ments!
To protect the calibration standards from dirt or damage, keep them in

their supplied case for transporting and storing.
1.9 Instrument Repairs

No repairs should be performed on the instrument.
The instrument may be opened only for replacing recharge-

able or regular batteries ( Page 28). Other service opera-
tions on the instrument or the accessories must be
performed only by technical personnel authorized by Helmut
Fischer GmbH.

1.10 Warranty
The Helmut Fischer GmbH Institute for Electronics and Metrology will assume
no warranties in the following instances:
z Use of instrument or accessories for purposes other than the intended use.
z Connection of accessories not recommended or approved by the Helmut Fis-

cher GmbH Institute for Electronics and Metrology.
z Repairs or structural changes to the instrument or accessories that have not
been carried out by authorized persons.
z Improper handling of instrument or accessories (e.g., use in explosion-haz-
ard or very hot environments).
z Disregard of information in this operator's manual.

2 Description of the Instrument
Description of the Instrument

1
1 Probe connector socket,
Page 30
2 LCD Display, Page 14
2 3 Keys for directly retrieving

functions, Page 16
4 USB port for connecting a

PC
3
4 5 ON/OFF key to turn the in-
5 strument on or off,
Page 33
6 6 Cover; additional function
keys can be found under the
cover, Page 16
7 Non-slip rubber supports
8 Foldable instrument stand
7 9 Battery compartment,
Page 28
Fig. 2-1 Front and rear view of the instrument, connections

2.1 LCD Display
The LCD display consists of several display elements. When powering up the in-
strument using ON/OFF ( Page 33), all display elements will appear briefly at
the same time.
Display elements of the LCD display after power up (example)
Display element Explanation
A normalization is performed (on the uncoated specimen

= base material)
( beginning on Page 45).
A calibration is carried out

The measurement uses the magnetic induction method.
The measurement uses the eddy current method.
Padlock:
is enabled, i.e., the keys ZERO and CAL are not active,
the service functions cannot be retrieved, applications
cannot be deleted

Display element Explanation
Arrow circle:
Free-running display is enabled, measurements are
displayed continuously when the probe is placed on the
specimen
Alternatively:
Display for area measurement
Display for automatic measurement
-8.8.8.8 Numeric elements for presenting readings, errors and

warning messages.
Unit of measurement for the displayed reading.
Battery:
The battery must be replaced or the rechargeable bat-
tery must be charged because the voltage dropped be-
low a minimum value ( beginning on Page 27).
Hourglass:
Measurements are currently not possible because an in-
strument-internal routine is running.
Information lines:
...SCOPE ... Instrument type:
FKA... Instrument-internal software version

2.2 Control panel key functions
For easier opening:
1. Press on the corners of the cover

and then
2. slide the cover downwards.
Fig. 2-2 Opening the cover of the control panel keys
The overview on the following pages provides a brief description of the functions
of the individual control panel keys:
Key Function
DEL Deletes the last measured reading

2 x DEL: Deletes all readings
.. during normalization:
1x DEL - Deletes the last reading,
2x DEL - Deletes the measurement series of the base material
.. during calibration:
1x DEL - Deletes the last reading,
2x DEL - Deletes the measurement series of the current cali-
bration standard.
Repeated pressing of DEL: Deletes the measurement series
of the previous calibration standards ( beginning on
Page 72).
.. in all menus:
DEL - Returns to the previous menu or cancels the procedure.

Key Function
FINAL-RES Retrieving the final result ( beginning on Page 75)
Repeated pressing of FINAL-RES:

Displays the individual components of the final result (mean
value, standard deviation, etc.) in succession.
.. and then ENTER:

Ends the display of the final result (return to the measurement
screen) and deletes the stored values.
.. and then :
Ends the display of the final result (return to the measurement
screen) without deleting the stored values.
.. during calibration or normalization:

Enables or disables the free-running display mode (display of
the normalized countrates of the readings; readings will not be
stored and will not be integrated in the calibration or normaliza-
tion).
ON/OFF Turns the instrument on and off ( beginning on Page 33)
ZERO Retrieves the normalization ( beginning on Page 45)
CAL Retrieves the corrective calibration ( beginning on
Page 47)
.. and then CAL:
Cancels the corrective calibration.
.. and then DEL:

Deletes the corrective calibration.
.. and then ZERO:

Retrieves the calibration on the coating (possible only for mag-
netic induction probes and the magnetic induction channel of
dual probes).
.. and then ZERO:

Retrieves the calibration on coating.

Key Function
With the calibration: Sets the target value of the used calibra-
tion standard that will be displayed after the CAL Target noti-
fication.
With parameter selection: Selects the desired parameters.
The display will change faster if is pressed for longer than 3

seconds.
Turns the free-running display mode on/off.
With the calibration: Sets the target value of the used calibra-
tion standard that will be displayed after the CAL Target indi-
cator.
With parameter selection: Selects the desired parameters.
The display will change faster if is pressed for longer than 3

seconds.
SEND Transfers the values to a connected computer.
ENTER Confirms entries
5 x ENTER:
Calls the service functions
The instrument settings in the Service Functions menu are
password-protected. 157 will be displayed after pressing EN-
TER 5 times. Press , 2 times to increase this value to the fac-
tory-default password 159 and confirm the entry with
ENTER.

2.3 Accessories

2.3.1 Probes
All probes that can be connected to the instrument are equipped

with a memory chip, a so-called EEPROM, in their connector
plug. Probe-specific information (such as probe type, produc-
tion number, measurement method or coefficients of the master
characteristic, for example) is stored permanently - even with-
out power supply - in this memory chip, which can be overwrit-
ten as many times as desired.
When powering up the instrument, this information is automat-
ically retrieved and processed by the instrument; the instru-
ment "recognizes" the connected probe.
Correct coating thickness measurements can be performed

only if a probe that fits the measurement is used ( Chapter
5.2 Assigning a New Probe, beginning on Page 38).
Fig. 2-3
Probe plug of an
FGAB 1.3 probe
Various probe models are available for measurements on objects with different
shapes and different surface properties. Special probes with different measure-
ment ranges are available for the following areas of application, for example:
z particularly rough or abrasive surfaces
z Particularly soft surfaces
z damp, acidic contamination on the surface
z particularly thick or thin coatings
z hot surfaces
z Coatings in pipes and bore holes
For available probe models and the probe model best suited for your application,
see the respective probe data sheets of the brochure Measurement Probes and
Measurement Aids - Optimized Probes - The Key to Successful Coating Thick-
ness Measurements. You can obtain this brochure from Helmut Fischer GmbH
Institute for Electronics and Metrology or from your authorized supplier.

2.3.2 Calibration Standards
Calibration standards (in the form of foils or hard paper with different thickness-
es) are used for the calibration; the standards are placed on the uncoated specimen
in order to simulate a coating with a known thickness.
A probe-specific calibration standard set for the master calibration (can be or-
dered as an option) and a probe-specific calibration standard set for the corrective
calibration (included with the probe) are available for each probe model and have
been compiled specifically for this probe model.
You can obtain additional calibration standards of various thicknesses on request
from Helmut Fischer GmbH Institute for Electronics and Metrology or from your
authorized supplier.
Reference area
Order
number
of the cali
bration foil
Foil thick- 75.0
Guaranteed Masterfolie 2
error limit
Fig. 2-4 Calibration foil (example) and master foil (example)
At Helmut Fischer GmbH Institute for Electronics and Metrology, the foil thick-
nesses of the calibration standards are determined using a mechanical axial cali-
per. The function of the axial caliper has been verified using gauge blocks of the
accuracy class I, which have been verified according to national standards.
The guaranteed error limits stated on the calibration standards refer only to the
identified reference area.
Due to the smaller error caused by deformation when compared to plas-

tic foils, copper beryllium foils should be used for calibration standards
with thicknesses of less than 30 m.
Because copper beryllium is an electrically conducting material, CuBe

standards may be used only for calibrating magnetic induction probes
and/or for calibrating the magnetic induction channel of dual probes.

When measuring the thickness of foils with the same thickness but made
of different materials (e.g., a 12 m thick CuBe foil and a 12 m thick
plastic foil) on rough specimens, the values measured on these two foils
may deviate by 1 - 2 m from each other, depending on the roughness.
This deviation is caused by the greater rigidity of the CuBe foil. (The rigid
CuBe foil rests relatively plane on the roughness peaks while the soft
plastic foil adjusts somewhat to the roughness due to the pressure force
of the probe tip.)
For this reason, the same foil material that is used for the calibration
should also be used for the test measurements!
Certification of the Calibration Standards

Certificates for the calibration standards are available upon request from your au-
thorized supplier or directly from the Helmut Fischer GmbH Institute for Elec-
tronics and Metrology.
2.4 Technical Data
Instrument model DUALSCOPE FMP20

DELTASCOPE FMP10
ISOSCOPE FMP10
Display Graphical backlit LCD display

Measurable coat- z Non-ferromagnetic coatings (NF) on steel or iron
ings (Fe)
z Electrically non-conducting coatings (Iso) on non-
ferromagnetic metallic base materials (NF)
Measuring modes z Magnetic induction measurement method
z Amplitude-sensitive eddy current method
Dimensions z Instrument: 170 mm x 90 mm x 35 mm (L x W x H)
z LCD display: 44 mm x 57 mm (L x W)
Weight approx. 340 g (without probe, ready to operate)
Permissible ambi- +10 C ... +40 C
ent temperature
during operation

Permissible stor- 5 ... 60 C
age temperature
Permissible rela- 30 ... 90% (non-condensing)
tive air humidity
Power z 4 x 1.5 V batteries with about 50 h service life,
supply (Size AA or Mignon) or
z 4 x 1.5 V NiMH rechargeable batteries with about
45 h service life at 2100 mAh, (Size AA or Mignon)
Power consump- z 0.3 W with the LCD display not illuminated
tion z 0.5 W with the LCD display illuminated
Connectors z Probe:10-pin round plug
z Mini USB port
USB Mini AB
port
Minimum About 0.2 seconds in the free-running mode
time between two
measurements
Minimum Dependant on the measurement range of the con-
lift-off distance nected probe; at least 3 to 4 times the max. measur-
between two mea- able coating thickness
surements
Measurement Depends on the connected probe
range, trueness (These and other probe characteristics can be ob-
and repeatability tained from the brochure Measurement Probes and
precision Measurement Aids - Optimized Probes - The Key to
Successful Coating Thickness Measurements) of
Helmut Fischer GmbH Institute for Electronics and
Metrology or can be requested from your authorized
supplier or directly from Helmut Fischer GmbH Insti-
tute for Electronics and Metrology.)

2.5 Contents of Shipment and Options

After receiving the shipment, packaging and contents should be checked for po-
tential damage. If the packaging, the contents or the accessories show signs of
damage, retain the packaging. It might be needed to assert a claim for damages
versus the shipping company.
It is also advisable to keep the packaging for future transport.
Also verify that all components of the standard contents of the shipment and all
ordered options are present. Notify your authorized supplier or the Helmut Fis-
cher GmbH Institute for Electronics and Metrology if this is not the case.
2.5.1 Standard Contents of Shipment of the Instrument

The standard contents of shipment of the instrument includes:
z Instrument
z Batteries
z Interface cable FMP/PC,
z Carrying and storage case, carrying strap
z Mini CD with USB driver
z Operator's Manual
z Short form operator's manual
2.5.2 Options
Available options are:
z Various measurement probes
z Foils - also with certificate - for the calibration and for verifying the
calibration
z Probe-specific calibration standard set for the master calibration -
also with certificate
z Charger for NiMh battery
z Support stand V12 for reproducible positioning of measurement
probes on the specimen
z Jig for angle probes for use in the support stand V12 (e.g., for probe
FGABW 1.3)

z Jig for inside probes for use in the support stand V12 (e.g., for probe
FGABI 1.3-150 mm)
z Support stand V12-AM for motor-controlled touch-down and lift-off
of measurement probes
z Piston ring measuring stage V4FKB4 for measuring, for example,
chrome coatings on piston rings and oil wiper rings
z Guide device V5GW2/TW3 for angle probes for measurements at
recessed or hard to reach areas
z PC-Datex software for transferring measurement data from the instru-
ment to a Microsoft Excel spreadsheet (add-in module for Micro-
soft Excel beginning with Version 95 under Windows 95 to
Windows Vista)

3 Measurement Methods for Coating Thick-
Measurement Methods for Coating Thickness Measurements

ness Measurements
The following table shows an exemplary listing of FMP instruments and probes
as well as the measuring application for which they can be used and the measure-
ment method employed to measure the coating thickness.
Instrument Probe model Area of application Measurement method

DELTASCOPE FMP 30
FGAB1.3 Determination of the thickness of Magnetic Induction Method

DELTASCOPE FMP10
non-magnetic coatings on steel or According to DIN EN ISO

iron. E.g, chrome, copper, zinc as 2178.
well as paint, lacquer, enamel or
plastic coatings on steel or iron.
FTA3.3 Determination of the thickness of Amplitude-Sensitive Eddy

electrically non-conducting, non- Current Method According to
ISOSCOPE FMP 30
ISOSCOPE FMP10
magnetic coatings on non-ferro- DIN EN ISO 2360.

magnetic electrically conducting
base materials. Paint, lacquer or
plastic coatings on, for example,
aluminum, copper, zinc, etc as
well as anodized coatings on alu-
minum.
FD10 Determination of the thickness of Magnetic Induction Method
non-magnetic coatings on steel or According to DIN EN ISO
iron. E.g, chrome, copper, zinc as 2178.
well as paint, lacquer, enamel or
DUALSCOPE FMP20
DUALSCOPE FMP40
plastic coatings.
Determination of the thickness of Amplitude-Sensitive Eddy
electrically non-conducting, non- Current Method According to
magnetic coatings on non-ferro- DIN EN ISO 2360.
magnetic electrically conducting
base materials. Paint, lacquer or
plastic coatings on, for example,
aluminum, copper, zinc, etc as
well as anodized coatings on alu-
minum.

3.1 Magnetic Induction Method
Measurement Methods for Coating Thickness Measurements
Contacting measurement method. The excitation current generates a low-fre-

quency magnetic field with a strength that is dependent on the distance between
the measurement probe and the base material. The magnetic field is measured by
means of the measuring coil. The obtained measurement signal is converted in
the instrument to a coating thickness value via the characteristic probe output
function.
Glossary
3.2 Eddy Current Method

The excitation current generates a high-frequency magnetic field that induces
eddy currents in the material. The development of these eddy currents depends
on the distance (coating thickness) between the measurement probe and the base
material. The measurement signal, which captures the reaction of the magnetic
field of the eddy currents on the original magnetic field, is converted into a read-
ing that is proportional to the coating thickness.
Glossary
3.3 Measurements With DUAL Probes

Dual probes (e.g., FD10) combine the magnetic induction and the eddy current
methods. Thus, these probes can be used to measure both non-magnetic coatings
or insulating coatings on steel or iron as well as insulating coatings on non-ferro-
magnetic, electrically conducting base materials.

4 System Setup, Maintenance and Clean-
System Setup, Maintenance and Cleaning

ing
To avoid electrical discharge, inserting a battery should be

carried out only with the unit turned off! Even a small electri-
cal discharge can delete the instruments memory.
The information in Chapter 1 Important Information must be observed!
System setup consists of the following steps:

z Providing the power supply for the instrument
( 4.1 Power Supply, beginning on Page 27)
z Connecting a measurement probe to the instrument
( 4.2 Connecting Probes, beginning on Page 30)
z Connecting a computer (if desired) to the instrument
( 9 Data Transfer Using USB, beginning on Page 78)
z Selecting the language for the instrument if your language has not been set
when the instrument was shipped
( 10.6 Units, beginning on Page 101)
4.1 Power Supply

Electrical power can be supplied to the instrument in the following ways:
z 4 x 1.5 V batteries (AA or mignon) or
z 4 x 1.5 V NiMh rechargeable batteries, 2100 mAh (AA or mignon).

4.1.1 Installing or Replacing Batteries
Indicator for battery replacement. Batteries or rechargeable bat-

teries should be replaced.
If the battery voltage is too low, the instrument will turn

off automatically.
Procedure Battery Replacement
1. Use ON/OFF ( Page 33) to switch the instrument off (if not yet done).
2. Place the instrument with its back pointing up on the table. Open and
remove the battery compartment cover on the rear of the instrument as
depicted below.
Fig. 4-1 Opening the battery compartment cover
3. If old batteries are in the instrument, remove them from the unit. Other-
wise, install new batteries directly; observe the correct polarity of the bat-
teries
Disposal: Do not dispose of batteries with regular household waste!
Place damaged or used batteries / rechargeable batteries in designated
collection containers! Please observe the guidelines in your region con-
cerning proper handling of waste electrical and electronic equipment and
accessories.

4. Close the battery compartment cover.

Observe the cor-
rect polarity when
installing the bat-
teries.
- - -
-
LR6 1.5V
LR6 1.5V
+
LR6 1.5V
LR6 1.5V
+ + +
Fig. 4-2 Inserting the batteries and closing the battery compartment cover
Use only type MIGNON, 1.5 V, LR6 - AA - AM3 - MN1500 batteries or 4

individual rechargeable batteries 1.2 V 2400 mAh Type AA.
Using other batteries may lead to instrument damage.
Use only non-damaged batteries.

4.2 Connecting Probes
A measurement probe must be connected to the instrument to make coating thick-

ness measurements. This must be an appropriate probe suitable for the base ma-
terial.
Connect probes only when the instrument is off!

To turn the instrument off: Press the ON/OFF key on the right side of the
control panel. The LCD display is not lit and no characters are visible.
Protect the instrument and accessories from electrostatic

charges!
Electrical discharges may damage internal components or
delete internal memories.
Such discharges may occur, for example, when connecting the probe to
the instrument. Thus, please ensure that the person connecting a probe
is properly grounded.
It is recommended to store the instrument with the connected probe.
1. Use ON/OFF ( Page 33) to switch the instrument off (if not yet done).
2. If the probe connected to the instrument is to be replaced, unscrew the

knurled nut of the probe plug completely and pull the probe plug carefully
from the connector socket of the instrument.
3. Plug the probe plug of the new probe into the probe connector socket of
the instrument.

When inserting the plug, ensure that the key of the plug fits
into the groove of the socket. Otherwise, an erroneous con-
nection between the instrument and the plug may occur or
the contact pins of the probe plug may be damaged.
Key (plug) Groove (socket)
Fig. 4-3 Probe plug and probe connector socket
4. Tighten the knurled nut of the probe plug.

Hold the plug tight to avoid an unintentional turning of the probe plug.
To avoid damage to the contact pins of the probe plug, only

the knurled nut may be turned! The probe plug must not be
turned in the connector socket.

1. 2.
Probe connector plug
Connector socket
Instrument
Fig. 4-4 Connecting a probe
5. Use ON/OFF to turn the instrument on again. The instrument automati-

cally recognizes the type of probe connected to it.
Exception: A flashing symbol for the measurement method on the LCD display
indicates that the instrument does not recognize the connected probe. In such a
case:
z The probe must be assigned to the instrument ( 5.2 Assigning a New
Probe, beginning on Page 38)
A new corrective calibration must be performed after the probe has been
assigned ( Page 47)!

4.3 Turning the Instrument On/Off

To avoid erroneous readings, no metallic objects must be in close
proximity to the probe tip when powering up the instrument. The
minimum distance to be kept is probe-specific (Guideline: Five times the
upper measurement range limit, i.e., a minimum distance of 25 mm
should be maintained for a probe with the measurement range 0...5
mm).
4.3.1 Measurement Method of the Connected Probe

After instrument power-up, the LCD display shows the measurement method of
the connected probe or the measurement method of the last measurement carried
out.
With dual probes, the dual method set in the open Application will be displayed
as well (For an explanation of the dual method: 5.3 Setting Up the Dual
Mode for DUAL Probes, beginning on Page 39 / 10.5.6 Dual Method, begin-
ning on Page 100).
Display Explanation
[NF/Fe] Magnetic induction probe connected.

[NC/NF] Eddy current probe connected.
[NF/Fe NC/NF] Dual probe connected and dual method set to [both] (i.e.,
in the open application, both methods can be used to
make measurements).
[NF/Fe NC/NF] Dual probe connected and dual method set to [NF/Fe]
(i.e., in the open application, only the magnetic induction
method can be used to make measurements).
Or:
The last time the probe has been placed on Fe material.
[NF/Fe NC/NF] Dual probe connected and dual method set to [NC/NF]
(i.e., in the open application, only the eddy current meth-
od can be used to make measurements).
Or:
The last time the probe has been placed on NF material.

4.3.2 Power Up
Key se- Detail of the LCD Explanation

quence display
ON/OFF Press the ON/OFF key to power up the in-
strument.
You will hear an audible signal.
A monitoring routine will run automatically.

All display elements of the LCD display will
appear briefly at the same time
( Page 14).
At the end of the monitoring routine, the in-

strument is ready to make measurements.
The icon of the measurement method of
the connected probe is displayed
( Page 33).
[m] or [mm] or [mils]:

Unit of measurement for the displayed
reading
[Thickn.]: Measurement program Coating

thickness ( 10.5.5 Measured Vari-
able, beginning on Page 99)
[n=]: Number of the stored measurements
This error message appears briefly after

power-up if no probe is connected to the
instrument, if the probe is not connected
properly or if the connected probe is defec-
tive. It is not possible to make measure-
ments without a connected probe.
( 4.2 Connecting Probes, beginning on
Page 30).

Key se- Detail of the LCD Explanation
quence display
This warning appears briefly after power-

up if a probe other than the last one used
is connected to the instrument.
( 5.2 Assigning a New Probe, begin-
ning on Page 38).
4.3.3 Measuring Modes

( Chapter 10.5.5 Measured Variable, beginning on Page 99)
Depending on the set measuring mode, one of the following can appear after
power-up of the instrument:
z a coating thickness reading d,
z a normalized countrate Xn
z a countrate X
z d and Xs (countrate for a lifted-off probe) or
z Xn and Xs
.
4.3.4 Turning Off the Instrument

Press the ON/OFF key to turn the instrument off manually.
The instrument shuts down automatically if for about 5 minutes no measurements

are made or no key is pressed.

4.4 Cleaning
To avoid damage to the instrument due to electrical shock, the line

plug of the AC adapter must be pulled before cleaning the instru-
ment or the accessories!
Soiled instruments or accessories should be cleaned using a plastic care product

and a soft cloth.
The following should be observed during cleaning:
Risk of electrical shorts!

Water or other liquids must not enter the instrument or the acces-
sories! Do not immerse or place the instrument or accessories into
liquids to loosen dirt through soaking! Do not pour liquids on the
instrument or accessories!
Wipe off dirt immediately to avoid it from drying onto the surface!
Do not use aggressive agents to clean the instrument or the accessories

because they could attack the plastic housing!
To prevent damage, avoid scraping as a means of cleaning off dirt, in

particular in the area of the probe tip.
Do not use aggressive agents to clean the calibration standards because

they could damage the calibration standard! The use of damaged cali-
bration standards (e.g., dirty or scratched standards) will lead to wrong
measurement results! (For additional information: 1.8 Handling, Stor-
age and Transport of Calibration Standards, beginning on Page 11)

5 Probe Handling
Probe Handling
5.1 Handling During Measurements
Example:
Probe
FGAB1.3
z Always hold the probe at its grip sleeve (right fig- Grip sleeve
ure).
Specimen
z Always place the probe gently and at a right angle
on the specimen surface.
z Slide the grip sleeve to the specimen surface such
that the sleeve rests on the specimen (center and bot-
tom Figure, right).
z With the default setting, a beep will signal the mea-
surement capture.
z Lift the probe off the specimen before making the
next measurement.
Avoid hard impacts.

Do not allow the probe to hover directly above the surface. Doing so
will lead to erroneous readings.
Do not bend the probe connector cable! Doing so can lead to broken
wires.

5.2 Assigning a New Probe
Probe Handling
The instrument recognizes if the probe connected to the unit is different than the
one expected according to the probe identification in the current Application.
Reason: Each individual probe has a name consisting of the identification num-
ber and the model designation (e.g., FGAB 1.3). The probe must be registered
in the instrument under this name.
Potential Causes of Problems:

z The probe received a different identification number after a repair.
z A newly purchased probe has not yet been assigned.
z If a user has more than one probe of the same probe model, a problem occurs
if a not yet assigned probe is connected to the instrument. In such a case, it is
advisable to identify the probes and/or instruments with numbers.
If the instrument is powered up and a probe other than the one used last is con-
nected, the following display will appear:
Key sequ./ Detail of the LCD Explanation

Action display
This warning appears briefly after power-

up if a probe other than the last one used
is connected to the instrument.
After a bief time, the display shown to the

left will appear.
Example: FD10 = Name of the connected
probe
DEL: Probe assignment starts
ENTER: Probe will not be assigned, mea-
surement method display flashes
DEL DEL: All stored readings will be deleted.

ENTER: The probe will not be assigned,
measurement method display continues to
flash

Probe Handling
Action display
ZERO and CAL appear on the display.

A normalization and a corrective calibra-
tion must be performed ( beginning on
Page 45).
ENTER: The normalization will be skipped.
Only a corrective calibration will be per-
formed.
DEL (2x): The existing corrective calibra-
tion will be deleted.
CAL: The action will be canceled. Neither
the normalization nor the corrective cali-
bration will be carried out.
5.3 Setting Up the Dual Mode for DUAL Probes

If a DUAL probe is connected to the instrument, the menu Dual method will
appear additionally in the menu Service Functions / Measurement
( 10.5.6 Dual Method, beginning on Page 100). Select the measurement
method from this menu:
Detail of the LCD

Explanation
display
NF/Fe: Measurements using the magnetic induction

method
NC/NF: Measurements using the eddy current method
both: Measurements are possible using the eddy current
or the magnetic induction methods
Use the error keys or to make the selection.

Confirm the selection by pressing ENTER.

If a dual probe is connected to the instrument, the dual method that has been set
Probe Handling
up will be displayed on the LCD display after power-up ( 4.3.1 Measurement
Method of the Connected Probe, beginning on Page 33):
The measurement uses the magnetic induction method.
The measurement uses the eddy current method.
The dual method can be set up separately for each Application. The
dual method settings of the other Applications will not be affected.
If the dual method is set to both, both measurement methods can be used to make
measurements. When the probe is placed on the specimen, the correct measure-
ment method will be selected automatically.
If the dual method is set to NC/NF or NF/Fe, only the respective selected mea-
surement method can be used to make measurements. This can ensure, for exam-
ple, that only the coating of interest of a multi-coating system is determined.
For example, to measure the thickness of the Iso coating from Fig. 5-1, the NF
coating must have a certain minimum thickness (e.g., for zinc
about 60 m) and the dual method must be set to NC/NF:
Insulating coating (Iso coating)

Non-ferromagnetic metal (NF coating)
Ferromagnetic base material
Fig. 5-1 Sample structure of a multi-coating system
If the setting is NF/Fe, the ferromagnetic base material will be taken into account
and the thickness of the Iso coating plus the NF coating will be determined.
However, if the setting is both, either the Iso coating alone (for relative thick NF
coatings) or the thickness of the Iso coating plus the NF coating (for relatively
thin NF coatings) will be determined depending on the thickness and electrical
conductivity of the NF coating.

6 Normalization, Calibration and Master
Normalization, Calibration and Master Calibration

Calibration
Many factors influence the readings of a coating thickness measurement
(7.2 Influencing Parameters, beginning on Page 66). These influences can be
corrected through a normalization and a calibration.
A normalization is sufficient if these properties change only slightly. As a rule,

a normalization should be performed in the uncoated reference area of the current
specimen.
A corrective calibration is required if the changes in shape, magnetic perme-

ability or electrical conductivity are greater and can no longer be corrected with
a normalization.
With the same type of specimen, a new normalization, corrective

calibration or master calibration should be performed only if inad-
missible deviations from a control sample are present. Most often,
these deviations are caused by probe tip wear.
A master calibration must be performed if the changes to the aforementioned

properties are extremely large.
For the normalization, corrective calibration and master calibration,

an uncoated material must be used that corresponds to the speci-
mens to be measured in its base material and shape! The supplied
reference part (Fe or Al base) must not be used for the normaliza-
tion or calibration because its material properties do, as a rule, not
correspond to those of the specimen. (It may be used for a function
check, for example.)
If an uncoated specimen is not a available, a Calibration on coating, i.e., a cal-

ibration on a coated specimen can be performed. Only minor changes in speci-
men shape can be corrected with a calibration on coating.
A calibration on coating can be performed only with magnetic induc-

tion probes or the magnetic induction channel of dual probes. A cal-
ibration in coating is not possible with eddy current probes or the
eddy current channel of dual probes.

6.1 Information Regarding Normalization, Calibration
and Master Calibration
z The information in Chapter 1 Important Information, beginning on
Page 7 should be observed with every normalization, calibration and master
calibration!
z All measurements should be performed with great care! Only in this manner
can the trueness specified for the used probe be ensured during the subse-
quent measurements.
z Reference measurements should be performed after every normalization and
calibration to verify the normalization and calibration.
z CuBe calibration standards must be used for the calibration of magnetic
induction probes or for the calibration of the magnetic induction channel of
dual probes only, because the thickness of the CuBe standards can be mea-
sured only with the magnetic induction method.
z The information in Chapter 6.2 Specific Features of DUAL Probes,
beginning on Page 44 should be observed when performing normalizations
and calibrations that have been set up using a dual probe!
z It is not possible to start a normalization, corrective calibration, calibration
on coating or a master calibration as long as the restricted operating mode is
enabled (indicated by on the LCD display) ( 10.4.1 Restricted operat-
ing mode, beginning on Page 92)!
z With external start enabled, a measurement acquisition can be triggered dur-
ing a normalization or calibration by:
- Pressing the FINAL-RES key,
- Transmitting one of the ASCII characters G0, ES, EN or
- the control character ESC? via the USB port (ESC = ASCII27).
Enabling externally triggered measurement acquisition: 10.5.3 External
Start, beginning on Page 96; 9.4.2 Control Commands, beginning on
Page 81

6.1.1 Recommended Number of Single Readings During a Nor-

malization, Calibration and Master Calibration
In addition to the measurement probe, the number of individual measurements to
be carried out depends to a great extent also on the specimen. The following pro-
cedures are recommended:
z A minimum of 5 single readings with typical (not very rough) technical sur-
faces and only slightly curved measurement locations.
z With rough surfaces, strongly curved measurement locations, soft coatings,
inhomogeneous base materials, etc., individual measurements should be per-
formed until the displayed standard deviation s is less than 1/20 of the tol-
erance limit spread of the coating to be measured.
Example of a zinc coating:

Upper Specification Limit USL: 25 m (Upper Tolerance Limit)
Lower Specification Limit LSL: 15 m (Lower Tolerance Limit)
Specification limit spread = USL - LSL = 10 m
Max. admissible standard deviation s = 0.5 m
If the standard deviation s is still greater than admissible even after
5 - 10 single readings, either probe positioning aids (prisms, support
stands, etc.) should be used or a probe that is better suitable for the
measuring application should be selected.

6.2 Specific Features of DUAL Probes
The first measurement performed during a normalization or calibration with a

dual probe determines the channel of the dual probe that is normalized or cali-
brated (indicated on the display with Fe or NF). For example, if the first mea-
surement for a normalization is performed on a ferromagnetic specimen, the
magnetic induction channel of the dual probe will be normalized during the sub-
sequent normalization.
6.3 Reference Measurements

During a reference measurement, readings are obtained on a reference specimen.
If the deviations of these readings exceed the limit values specified by the com-
pany, the normalization or calibration that is checked using the reference mea-
surement must be performed again.
A reference sample (coated specimen with a known thickness that corresponds to

the parts to be measured in base material, coating material and shape) is required
for a reference measurement.
Reference specimens are subject to wear caused by the contacting
measurement. Reference specimens must be checked regularly
and replaced by new reference specimens if wear is too great.

6.4 Normalization

With the normalization, a new zero point is established for the calibration curve
and stored in the instrument.
Required materials
Reference part: Uncoated part from the production.
6.4.1 Normalization Procedure

Action display
ZERO Use ZERO to start the normalization.

ZERO appears and remains on the LCD
display while the normalization is per-
formed.
[s]: Standard deviation

[n]: Number of measurements
[Base material (Fe/NF)]: Measurements
should be performed on an uncoated spec-
imen (Fe or NF display for the type of base
material).
When using dual probes, the type of base
material will be displayed only after the 1st
measurement is completed.
[Cancel: ENTER]: Using ENTER cancels

the normalization.

Action display
Perform measurements on the uncoated

specimen (base material).
Perform the number of individual measure-
ments recommended in Chapter 6.1.1,
Page 43 at various points of the reference
area.
The mean value of all readings obtained
for the normalization will be displayed.

[Base material]: Measurements should be

performed on an uncoated specimen. The
base material (NF) or (Fe) will be dis-
played.
[Delete: DEL]: Use DEL to delete the last
measurement, 2x DEL to delete all read-
ings obtained for the normalization.
[OK: ENTER]: Using ENTER ends the
normalization.
ENTER A confirmation indicating that the normal-

ization has been carried out successfully
appears.
Pressing ENTER confirms the message.
ENTER The new characteristic will be computed

automatically and stored. The instrument
is again ready to make measurements.
2.1 LCD Display, beginning on Page 14).
z Perform several check measurements by measuring the thickness of a cali-

bration standard placed on the uncoated reference area in order to verify a
correct normalization. The thickness of the standard should be close to the
nominal thickness value of the coating to be measured.

z if the obtained mean value is with the guaranteed error limits stated on the

foil, delete the readings of the reference measurement before starting with
the measurements on your specimens.
z If the mean value is not within the guaranteed error limits, perform a correc-
tive calibration.
6.5 Corrective Calibration
With a corrective calibration, a new zero point and one additional point (one-
point calibration with one calibration standard) or two additional points (two-
point calibration with two calibration standards) are established for the calibra-
tion curve and are stored in the instrument.
Required materials
z Reference part (uncoated part from the production)
z Calibration foils
6.5.1 Selecting the Calibration Standards for the Corrective Calibra-

tion
A corrective calibration using the calibration standards included with the probe
shipment provides the best measuring precision for the entire measurement range
of the probe. To enhance the measuring precision in a certain thickness range, a
foil with a thickness in this specific range may be used as well. However, the
measuring precision outside of this particular thickness range will not be as good
as with the corrective calibration using the probe-specific calibration standards.

6.5.2 Corrective Calibration Procedure

Action display
CAL Use CAL to start the corrective calibration.

CAL appears and remains on the LCD dis-
play while the corrective calibration is per-
formed.

[Base material (Fe/NF)]: Measurements

should be performed on an uncoated spec-
imen (Fe or NF display for the type of base
material), i.e., a Normalization is carried
out.
When using dual probes, the type of base
material will be displayed only after the 1st
measurement is completed.
[CAL-Delete: DEL]: Using DEL deletes

the corrective calibration ( Page 52).
[Skip: ENTER]: Using ENTER skips the

normalization (the stored normalization is
retained unchanged).
[Cancel: CAL]: Using CAL cancels the

corrective calibration (the stored corrective
calibration is retained unchanged).
ZERO: Pressing ZERO starts the calibra-

tion on coating procedure ( Page 53).

Action display

specimen (base material) (normalization).
area.


performed on an uncoated specimen, i.e.,
a normalization is carried out. The used
played.
[OK: ENTER]: Using ENTER ends and
stores the normalization.
ENTER [Entry: ]: Use the arrow keys to set the

nominal thickness value of the calibration
standard. The rated value is printed onto
the calibration standard.
The rated value can be set faster if a mea-
surement is performed on the calibration
standard and then the rated value is cor-
rected using the arrow keys.
[CAL-rat.1: 23.70]: Display of the set rated

value for the thickness of the calibration
standard (Example: 23.7 m)

the calibration procedure

Action display
Place the calibration standard 1 (in the ex-

ample with a thickness of 23.7 m) on the
uncoated specimen and perform measure-
ments.
area.
Displayed is the mean value of all mea-
surements performed for this step.

or [Entry: ]: Use the arrow keys to set the

standard. The rated value is printed on the
calibration standard. The rated value can
be set faster if a measurement is per-
formed on the calibration standard and
then the rated value is corrected using the
arrow keys.
This step is not required if - as shown in

the example - the rated value for the thick-
ness of the calibration standard coincides
with the stored thickness.
[OK: ENTER]: Using ENTER ends the cur-

rent calibration step.
ENTER If a corrective calibration is desired with 2

standards, proceed in the same manner
with calibration standard #2.
Otherwise: Use ENTER to end the correc-
tive calibration.
The new characteristic will be computed
automatically and stored.
The instrument is again ready to make
measurements.

Action display
ENTER A confirmation indicating that the correc-

tive calibration has been carried out suc-
cessfully appears.
Calibration standards are included with the probe shipment.

To obtain a high measuring precision, it is recommended to select
two standards for the corrective calibration as follows:
1st calibration standard: The thickness corresponds approximately
to the upper limit of the measurement range.
2nd calibration standard: The thickness corresponds approximately
to the lower tolerance limit of the measurement range.
A corrective calibration with only one calibration standard is suffi-
cient if coating thickness measurements are performed that are nar-
rowly around a target value. In such cases, the thickness of the
calibration standard should correspond approximately to the target
coating thickness value.
z Perform several reference measurements by measuring the thickness of the

standards used for the calibration on the uncoated reference area in order to
verify a correct corrective calibration.
z If the obtained mean value is within the guaranteed error limits stated on the
foil, delete the readings of the reference measurement before starting with
the measurements on your specimens.
z If the mean value is not within the guaranteed error limits, repeat corrective
calibration.

6.5.3 Deleting a Corrective Calibration
When deleting the corrective calibration of a dual probe, only the

corrective calibration of the currently active channel will be deleted.

Action display
CAL Use CAL to start the corrective calibration.
[CAL-Delete: DEL]: Using DEL deletes

the corrective calibration.

corrective calibration (the stored corrective
calibration is retained unchanged).
DEL [Yes: DEL]: The corrective calibration will

be deleted.
[No: ENTER]: Cancels the delete proce-
dure.
DEL The corrective calibration will be deleted.

measurements.

6.6 Calibration on a Coating

With a calibration on coating, an adjustment for the base material is made
through an existing coating by making measurements on a calibration standard
(included in the probe shipment) placed on this coating.
When should it be performed

z A calibration on coating is necessary when no uncoated specimen is avail-
able as a reference part, e.g., during the receiving inspection or for measure-
ments on site.
Please note that a Calibration on coating does not provide as good an
adjustment for the base material as a calibration with an uncoated refer-
ence part. The additionally encountered measurement error depends on
the coating thickness that is present during the calibration and on the
thickness of the used calibration standard; for this reason, it is not possi-
ble to provide a generally applicable value for this additional measure-
ment error.
If at all possible, an uncoated reference part should be used for the cali-
bration.
Required materials
z Reference part (coated part from the production)
z Calibration standards (included with the probe shipment)
6.6.1 Procedure for a Calibration on Coating

A normalization is required before a calibration on coating can be performed
( Page 45).
The following error message appears if a normalization has not yet been per-
formed:

Action display
CAL + ZERO Use CAL + ZERO to start the calibration

on coating.
ZERO + CAL appear and remain on the
LCD display while the calibration on coat-
ing is performed.

[Coating Sample]: Measurements should

be performed on the uncoated specimen.

the current calibration step.
Perform measurements on the coated

area.
The mean value of all readings obtained in
this step will be displayed.

[CBase material.]: Measurements shall

be performed on the coated specimen.
The used base material (NF) or (Fe) will be
displayed.

[OK: ENTER]: Use ENTER to end and

store the calibration step.

Action display
ENTER [ ]: Use or to set the rated value for

the foil thickness (value printed on the cor-
rection foil).
This step is not required if the rated value
for the foil thickness coincides with the
stored foil thickness.
[Cancel: ENTER]: Use ENTER to cancel

the calibration step.
Place the calibration standard on the coat-

ed specimen and perform measurements.
area.
The mean value of all readings obtained in
this step will be displayed.
[Entry: ]: Use the arrow keys to set the



ings obtained for the calibration.

Action display
ENTER A confirmation indicating that the calibra-

tion on coating has been carried out suc-
cessfully appears.
z To verify the calibration on coating proceed as follows:
1. Through several reference measurements ( Glossary), determine the

mean value of the thickness of the reference coating.
2. Through several reference measurements, determine the mean value of the

total thickness, comprised of the calibration standard used for the calibra-
tion and the reference coating.
3. Compute the difference of the two coatings. It must correspond to the

engraved value of the calibration standard.
z If the computed difference (thickness of the calibration standard) is within
the guaranteed error limits stated on the standard, delete the readings of the
reference measurements before starting with the measurements on your
specimens.
z If the computed difference is not within the guaranteed error limits, perform
an additional calibration on coating.

6.7 Master Calibration

The master calibration determines the coefficients of the master characteristic
and stores them in the EEPROM of the probe plug. These coefficients determine
the master characteristic, i.e.; the correlation between the measurement signal of
the probe and the coating thickness.
The EEPROM in the probe plug contains memories for the coefficients of two
master calibrations. These two master calibrations differ from each other in the
following manner:
Factory Master Calibration

One master calibration (factory master calibration) is performed at the facility of
the Helmut Fischer GmbH Institute for Electronics and Metrology with a very
high precision and, depending on the probe type, using at least 8 or more calibra-
tion standards. It cannot be deleted or overwritten by the user.
User Master Calibration

You can set up the user master calibration by yourself using 4 - 8 calibration stan-
dards. This memory is empty when a new probe is supplied. Once the user has
set up his own master calibration in the manner described below, he can over-
write or even delete this calibration, if needed.
At least 4 calibration standards are required to set up a user master calibration.
They are part of the optional probe-specific master calibration standard set. The
Xn value of one of these calibration standards must be within the prescribed Xn
range of the master calibration for all 4 Xn ranges to be occupied.
To increase the measuring precision in a certain measurement interval of the
probe, up to 4 additional calibration standards with thicknesses in this interval
can be used. This means that max. 5 calibration standards can be in an Xn range
of the user master calibration.
If the user master calibration is deleted and an new one is not set up, the factory
master calibration will be used automatically to make measurements.
An existing corrective calibration will be deleted after a user master

calibration is set up or deleted. This means that after deleting the
user calibration and continued measurement with the factory master
calibration, a new corrective calibration should be performed - if
necessary.

6.7.1 Selecting the Calibration Standards
For the user master calibration, it is essential to use the probe-specific

calibration standard set that is associated with the connected probe!
Only in this manner can the trueness specified for the used probe be
ensured during the subsequent measurements.
During the user master calibration, the master characteristic can be determined
only if suitable calibration standards are used. The calibration standards are suit-
ed for the user master calibration only if their normalized countrates Xn are with-
in pre-established probe-specific Xn ranges. The Xn values can be displayed after
the 1st step of the user master calibration (normalization) (Query of the probe-
specific limits of the Xn ranges for the connected probe during the master cali-
bration: Page 63.)
6.7.2 Performing a User Master Calibration
A user master calibration (hereafter simply referred to as a master cali-

bration) must be performed only by experienced users.
z If a dual probe is connected, only the normalization and corrective calibra-

tion of the measuring method in which the new master calibration has been
performed will be deleted.
Required materials
z Uncoated specimen with base material and shape that correspond to those of
the actual parts to be measured
z Probe-specific calibration standard set (master foils)

6.7.3 Master Calibration Procedure

The master calibration is retrieved from the Service function menu
( 10.8 Performing a Master Calibration, beginning on Page 102).

Action display
5 x ENTER Press ENTER 5 times to retrieve the Ser-

2x vice Function menu and set the identifica-
tion number 159 of the Service Functions
using the arrow key .
Retrieve the master calibration from the
Service Functions menu and use ENTER
to start the procedure.
ENTER ZERO + CAL appear and remain on the

LCD display while the master calibration is
performed.

[MCL Delete: DEL]: Use DEL to delete an

existing master calibration (appears only if
a master calibration has already been per-
formed). Use CAL if you do not wish to de-
lete the master calibration.

master calibration.
If you press DEL again after deleting the master calibration in order to
exit the menu, subsequent measurements will be made with the factory
master calibration - without a corrective calibration.

Action display

area.


performed on an uncoated specimen, i.e.,
a normalization is carried out. The used
played.


store the normalization. The previous nor-
malization will be overwritten

Action display
ENTER [Entry: ]: Use the arrow keys to set the



the calibration procedure
Pressing FINAL-RES:
Determination of the Normalized Countrate
Xn of a Calibration Standard During a Mas-
ter Calibration Page 65.
Pressing ZERO:
Displaying Xn Ranges for Calibration Stan-
dards for the Master
Calibration Page 63.

Action display
Place the calibration standard 1 (in the ex-

ample with a thickness of 23.7 m) on the
uncoated specimen and perform measure-
ments.
area.
Displayed is the mean value of all mea-
surements performed for this step.




store the calibration step.
or Use or to set the rated value for the

foil thickness (value printed on the correc-
tion foil).
This step is not required if the rated value
for the foil thickness coincides with the
stored foil thickness.
[OK: ENTER]: Using ENTER ends the cur-

rent calibration step.
ENTER Proceed with calibration standard #2 (mas-

ter foil #2) in the same as described for
calibration standard #1. The same for all
subsequent calibration steps.

Action display
ENTER After the last calibration step has been

concluded using ENTER, the new calibra-
tion curve will be computed automatically
and stored, and a confirmation indicating
that the master calibration has been car-
ried out successfully appears.
Please note the information regarding the number of calibration stan-

dards under 6.7 on Page 57.
z Perform several reference measurements by measuring the thickness of the

master foils used for the calibration on the uncoated reference area in order
to verify a correct master calibration. If the obtained mean values are outside
the guaranteed error limits stated on the foils, the master calibration must be
repeated.
Now, it is possible to make measurements. Delete the readings of the reference

measurement before starting with the measurements on your specimens.
6.7.4 Displaying Xn Ranges for Calibration Standards for the

Master Calibration
During the master calibration, the master characteristic can be determined only if
suitable calibration standards are used.
The calibration standards are suited for the master calibration only if their nor-
malized countrates Xn are within pre-established probe-specific Xn ranges. The
probe-specific limits of the Xn ranges for the connected probe can be queried dur-
ing the master calibration without affecting the calibration.

Action display
5 x ENTER Retrieve the master calibration from the

2x Service Functions menu and use ENTER
to start the procedure. Relevant explana-
tions beginning on Page 59.
ZERO Using ZERO displays the probe-specific

Xn range for calibration standard #1 (mas-
ter foil #1).
[0.0300<Xn<0.1500]: Xn range limits, the
normalized countrates Xn of calibration
standard #1 must be within this range.
The specific limits for the probe FD10 are
shown here as an example.

Xn range for calibration standard #2
(master foil #2) [0.1500<Xn<0.3500].

(master foil #3) [0.5000<Xn<0.8000].

(master foil #4) [0.8000<Xn<0.9800].
ZERO Use ZERO to end the display of the probe-

specific Xn range.
It is now possible to continue the master
calibration.
Or: Press CAL + DEL to return to the mea-
suring mode.

6.8 Determination of the Normalized Countrate Xn of a

Calibration Standard During a Master Calibration
The normalized countrate Xn of a calibration standard can be determined as de-
scribed below during a master calibration without affecting the calibration.
Because FINAL-RES triggers a measurement acquisition if external
measurement acquisition is enabled, is not possible to determine the
normalized countrate if external start is enabled during a calibration!

Action display
FINAL-RES Retrieve the master calibration from the

Service Functions menu and use ENTER
to start the procedure. Relevant explana-
tions beginning on Page 59.
Press FINAL-RES to start the procedure.
Place the probe whose normalized coun-

trate Xn is to be determined on the calibra-
tion standard. The normalized countrate
Xn of the calibration standard will be dis-
played (the normalized countrate will not
be stored!).
FINAL-RES [off: FINAL-RES]: Using FINAL-RES re-

turns the free-running display mode to the
disabled state.
It is now possible to continue the calibra-
tion.

7 Measuring
Measuring
The information stated in Chapter 1 Important Informa-

tion, beginning on Page 7 must be observed when making
measurements!
7.1 Preparing for a Measurement

The instrument and the measurement area must be prepared in the following
manner before measurements can be made:
z Agreement on the reference areas (determination on where several single
readings are to be taken), according to DIN EN ISO 2064.
z Ensuring that the reference areas are free of interfering contaminants (e.g.,
moisture, dirt or grease) and are not damaged.
z Carrying Out the System Setup ( Page 27).
z Switching on the instrument ( Page 34).
z Determining the instrument configuration ( Page 83).

z Verifying the normalization and calibration through reference measurements
on an uncoated specimen and on a specimen with a known coating thickness
( Page 44).
7.2 Influencing Parameters

The following factors influence the readings of a coating thickness measurement:
z Geometry of the specimen (size of the reference area = measurement area,
curvature, surface roughness, base material thickness)
z Magnetic permeability or electrical conductivity of the specimen
z Probe handling by the operator, in particular during probe placement

The influences of these factors can be corrected through a normalization ( be-
ginning on Page 41) or a calibration ( beginning on Page 47, Page 57).

7.3 Making a Measurement
Measuring
To make a measurement, place the probe at a right angle on the specimen surface
( Page 37). The probe can be lifted off after measurement acquisition, i.e., af-
ter the reading appears on the display. The instrument is ready to make measure-
ments.
Observe the following during the measurement:

z Measurements should be made within the reference area.
z To avoid erroneous readings, do not allow the probe to hover above the spec-
imen.
z How high the probe should be lifted off depends on the measurement range
of the probe. To obtain a correct air value, the distance to the specimen
should be at least 3 to 4 times the max. measurable coating thickness.
z To allow sufficient time for a measurement acquisition, the time between
individual measurements must be greater than 0.5 seconds.
1. Place the probe: 2. Lift the probe off:
Measurement Object
Fig. 7-1 Measurement using an axial probe
1. Place the probe: 2. Lift the probe off:
Measurement Object
Fig. 7-2 Measurement using an angle probe

In addition, the following should be observed when using two-tip
Measuring
probes for the measurements:
z With cylindrical specimens:
Place the probe tips parallel to the longitudinal axis!
z Place both probe tips simultaneously and with the same pressure on the spec-
imen!
z For specimens with a base material exhibiting a preferred magnetic direc-
tion, it is recommended to generate the measured value from two averaged
readings with the probe being rotated by 90 after the first measurement. A
preferred magnetic direction may be created through specimen processing
(e.g., rolling or drawing of sheet metal).
Measurements using two-tip angle probes on specimens with a preferred magnet-

ic direction:
1. Place the probe 4. Place the probe
2. Lift the probe off
5. Lift the probe off
3. Rotate the probe
90
6. Rotate the probe
90
Specimen with a preferred

magnetic direction
Fig. 7-3 Measurements using two-tip probes

7.3.1 Measurement Acquisition
Measuring
Measurement acquisition occurs automatically immediately after the probe is
placed on the specimen.
An audible signal will sound after the measurement acquisition (unless it has
been disabled) ( 7.3.3 Audible signals After the Measurement Acquisition,
beginning on Page 71).
With the free-running display mode on, measurement acquisition can be trig-
gered in the following manner ( 7.5 Measurements in the Free-Running Dis-
play Mode, beginning on Page 72):
z Pressing the ENTER key
z Transmitting one of the ASCII characters G0, ES, EN or
z Transmitting the control character ESC? via the USB port (ESC =
ASCII27)
( 9.4.2 Control Commands, beginning on Page 81)
Regardless of how the measurement acquisition occurred, the reading will appear
on the LCD display following the measurement acquisition.

7.3.2 Measurements With External Start Enabled
Measuring
When an automatic measurement acquisition is not desired, e.g., when making
measurements in pipes, boreholes or grooves, external start should be enabled
and automatic measurement acquisition disabled. (Enabling externally triggered
measurement acquisition and disabling automatic measurement acquisition:
Page 96)
With external start enabled, the measurement acquisition can be triggered manu-
ally in the following ways once the probe is positioned on the measurement loca-
tion:
z Press the key
(not with a normalization or calibration)
z Press the FINAL-RES key
(only during a normalization or calibration)
z Transmitting the ES command via the USB port
( 9.4.2 Control Commands, beginning on Page 81)
With externally triggered measurement acquisition, the measurement

acquisition can be delayed by up to 2.5 sec ( 10.5.3 External Start,
beginning on Page 96)

7.3.3 Audible signals After the Measurement Acquisition
Measuring
An audible signal will sound after the measurement acquisition (unless it has
been disabled). The measurement acquisition signal indicates that a signal arriv-
ing from the probe has been recognized and that the probe can be lifted off the
specimen.
As an option, the measurement acquisition signal can be disabled
( 10.5.1 Audible Signal, beginning on Page 94).
The other audible signals cannot be disabled!
7.3.4 Display of the measurement method in use when making

measurements with dual probes
After powering up the instrument, the measurement method of the connected
probe appears on the LCD display ( 4.3.4 Turning Off the Instrument, begin-
ning on Page 35).
In addition, with dual probes, the measurement method used for the last per-
formed measurement will be indicated.
Display Explanation
[NF/Fe NC/NF] The magnetic induction method was used for the mea-
surement with the dual probe.
[NF/Fe NC/NF] The eddy current method was used for the measurement
with the dual probe.

7.4 Erroneous Readings
Measuring
7.4.1 Deleting Erroneous Readings

If an erroneous reading is recognized directly after measurement acquisition, the
reading can be deleted by pressing DEL.
Pressing DEL twice will delete all readings.
7.5 Measurements in the Free-Running Display Mode

When making measurements in the free-running display mode, the coating
thickness distribution across the surface can be determined simply by moving the
probe along the surface. In the free-running display mode,
z the readings are displayed continuously, and
z the readings are not accepted and stored automatically,
z the data are output continuously via the USB port only if [Free-running
transmit on] has been selected from the Service functions.
Measurements that are outside the measurement range, e.g., when the
probe is lifted off the surface, are also output to the USB port.
z As long as the free-running mode is on, measurements acquisition can be

triggered using ENTER.

7.5.1 Turning the Free-Running Display Mode On/Off
Measuring
To enable the free-running display mode: Press the arrow key.
z The free-running display mode remains enabled until it is disabled; i.e., it
does not need to be enabled every time the instrument is powered up.
To disable the free-running display mode: Press the arrow key again.
As long as the free-running display mode is enabled,

z will appear on the LCD display,
z the acquisition of a reading can be triggered using ENTER or by transmit-
ting one of the ASCII characters G0, ES, EN or the control charac-
ter ESC? (ESC = ASCII27) via the USB port ( 9.4.2 Control
Commands, beginning on Page 81),
z the acquisition of reading can be triggered using if externally triggered
measurement acquisition is enabled,
z it is not possible to retrieve the service functions!

7.5.2 Procedure For Making Measurements in the Free-Running
Measuring
Display Mode
The magnetic poles are subject to increased wear when moving the
probe across a surface.

Action display
Press the arrow key to enable the free-

running display mode.
will appear on the LCD display.
[Thickn.]: Displays the coating thickness

readings (measurement program
10.5.5 Measured Variable, beginning
on Page 99)
[n= ]: Number of measurements
Place the probe on the specimen and

move it across the surface of the specimen
to determine the coating thickness distribu-
tion.
Lift the probe off the specimen.
Use to disable the free-running display

mode.

7.5.3 Measurements In the Free-Running Display Mode Using
Measuring
Dual Probes
The last measurement that has been made with a dual probe prior to turning on
the free-running display mode determines the measurement method that will be
used for the measurement in the free-running display mode.
The last used measurement method is shown on the LCD display
( 7.3.4 Display of the measurement method in use when making measure-
ments with dual probes, beginning on Page 71).
Automatic base material detection and selection of the correct measure-
ment method is not enabled for measurements in the free-running dis-
play mode.
If the magnetic induction method was used before the free-running display
mode was turned on, the measurements in the free-running mode will be made
according to the magnetic induction method as well. The dual probe will then
measure only on ferromagnetic base materials. The probe will not measure on
other base materials, i.e., [- - - -] will remain on the LCD display.
If the eddy current method was used before the free-running display mode was
turned on, the measurements in the free-running mode will be made according to
the eddy current method as well. The dual probe will make correct measurements
only on non-ferromagnetic base materials; erroneous measurements will be taken
on ferromagnetic base materials.
If no measurements were made before the free-running display mode is turned
on, the measurements in the free-running mode will be made according to the
magnetic induction method.

8 Evaluation
Evaluation
The following parameters will be determined from the readings during the eval-
uation and can be displayed:
z Number of evaluated readings
z Mean value th. ,
z Standard deviation s ,
z Lowest reading,
z Highest reading, and
z Range.
More detailed information about the individual computed parame-

ters can be obtained from the Glossar.

Action display
FINAL-RES Use FINAL-RES to start the evaluation.
[Info: CAL]: Press CAL to display an ex-

planation of the computed parameter:
[n]: Number of evaluated readings.

[th.]: Mean value th.
[s]: Standard deviation s
[min]: Minimum value
[max]: Maximum value
[R]: Range
[Leave open: ]: Press to end the

evaluation without deleting the readings.

Evaluation
Action display
ENTER + Use ENTER + DEL to end the evaluation

DEL and delete the readings.
[No: ENTER ]: Ends the evaluation with-

out deleting the readings.

measurements.

9 Data Transfer Using USB
Data Transfer Using USB
Basic computer knowledge regarding configuration, operation and pro-

graming as well as knowledge of the software in use, which may be
obtained from respective instruction manuals, is required when using the
instrument in conjunction with a computer.
The USB port for the instrument is on the unit's rear side. Bi-directional data ex-
change occurs via the USB interface.
The following operations are possible when the USB port is connected to a com-
puter (PC):
z Transfer of the readings and the characteristic statistical data from the instru-
ment to the PC.
z Remote control of the instrument by sending commands from the PC to the
instrument.
z Requesting measurement data and other data (e.g., the name of the current
Application) by sending commands from the PC to the instrument.
z Transfer of data (e.g., designations for Applications) from the PC to the
instrument by sending commands from the PC to the instrument.
Both commercial or one's own data processing programs can be used to process
the data exported by the instrument. Information regarding import and processing
of the data using such programs may be obtained from the respective manuals for
these programs.
Use the USB to

z transfer measurement data and additional information in the ASCII format,
e.g., using PC-DATEX (additional information about the PC-DATEX pro-
gram is available from Helmut Fischer GmbH or your authorized system
supplier) directly into an EXCEL spreadsheet, and
z transmit commands and data, e.g., via Windows Hyper Terminal (only up
to version Windows XP), from the PC to the instrument.

9.1 USB Connection to a PC

Connect the USB port of the instrument with the USB port of the PC.
Use the USB cable supplied with the instrument.
Fig. 9-1 Side view of the instrument with the USB port
9.2 Installing the USB Driver

If there is no USB driver installed for the USB connection on your PC, proceed
as follows:
If the USB driver was downloaded from a Website of Helmut Fis-

cher GmbH: Before installing the driver, extract the downloaded driver
file into a folder on your PC (e.g., C:\Programme\USB-Treiber\FMP-
USB).
1. Connect the instrument to the USB port of your PC. The Found New
Hardware Wizard opens.
2. Follow the instructions of the Windows wizard. If the driver is not found
automatically, select or enter the source to search for the USB driver (e.g.,
CD-ROM drive. removable media (CD, diskettes, ...) or local path).
Windows XP:
Ignore the message for the Windows Logo Test (Window Hardware
Installation). Click the Continue Installation button and continue the
installation.
The successful installation of the USB driver can be verified in the Windows De-
vice Manager.
z Open the Device Manager: Start/Control Panel/System, Hardware tab,
Device Manager button.

z You will find an additional COM port under Ports (COM & LPT), e.g.,
USB Driver for FMP (COM3) if the instrument is connected to the PC via
the USB interface.
9.3 Transfer of the Measurement Data to the Computer
Knowledge regarding operation of the computer and the software in use,

which may be obtained from respective instruction manuals, is required.
1. Establish the USB connection: Page 79.
2. Select the data for online export: 10.4 Instrument Mode, beginning
on Page 92.
3. Data transfer from the instrument to the PC

.. during the measurement (online operation): 9.3.1,
.. after the measurement (offline operation) Page 80.
4. Control the instrument from the PC: Page 81.
9.3.1 Online Operation

For transferring measurement data during online operation, the instrument is con-
nected to the computer during the measurement and the data are output immedi-
ately (online) via the USB port.
9.3.2 Offline Operation

With offline operation, the data stored in the instrument are output at a later time
(offline) via the USB port. The data output is triggered by pressing SEND.

9.4 Transmission from the PC to the Instrument

9.4.1 Transfer Formats
z All input and output data are transferred as ASCII-Strings followed by a CR
and a LF control character (Carriage Return Line Feed; CR = ASCII13, LF =
ASCII10).
z The max length of data received by the instrument is 20 characters.
9.4.2 Control Commands

The instrument can be remote controlled and can request readings and other data
by sending the control commands from the PC to the instrument. The requested
readings or the data, respectively, are then transmitted by the instrument via the
USB port and received by the PC.
If sending the commands DAM, DAT, GAN, GBN, SAN, SBN,
SGS or SWA results in an error, i.e., the respective function cannot be ex-
ecuted, the instrument will return the ASCII character NAK via the USB port
to the computer.
Response: ACK (ASCII6)
Response in case of an error: NAK (ASCII21)
Command Function
STATE Requests information on the current state of the instrument. 1

is output if the instrument is ready to make measurements. 0
is output if the current Application has not been set up. -1 is
output for any other state (e.g., if the service functions are
called at the particular time).
G0 or Triggers the measurement acquisition
ES or Measurement data are output by the instrument via the USB
EN or port.
ESC?
XX or Requests the current count rate
z Outputs the current count rate
but does not store it in the instrument.

Command Function
XN or Requests the current normalized countrate.

y Outputs the current normalized countrate,
but does not store it in the instrument.
SAM Requests all measurement data.
ESC0 Operates the DEL key
ESC1 Operates the FINAL-RES key
ESC3 Operates the ON/OFF key
ESC4 Operates the ZERO key
ESC5 Operates the CAL key
ESC6 Operates the key
ESC7 Operates the key
ESC: Operates the SEND key
ESC; Operates the ENTER key
SER Requests the serial number of the instrument.
VV Requests the version designation of the
instrument internal software (e.g., RBA12)
For information about operation, maintenance and care of the printer,

consult the instruction manual of the printer.

10 Instrument Settings in the Service Func-
Instrument Settings in the Service Function Menu

tion Menu
The instrument settings described below are configured from the Service func-
tion menu.
How to access the Service functions menu:

Action display
ON/OFF Use ON/OFF to turn the instrument on

5 x ENTER After pressing ENTER 5 times, the identifi-
cation number 157 appears on the LCD
display.
2x Enter the identification number 159 by

pressing the arrow key 2 times.
Use ENTER to confirm the setting.
ENTER The Service settings menu will be dis-

played.
Press the arrow keys or to select the
desired service function.
How to exit the Service functions menu:
Key sequ./ Explanation

Action
DEL Press the DEL key to exit the Service func-

tions menu.
The instrument is ready to make measure-
ments.

A re-initialization will reset the settings in the service functions to the default set-
tings ( Page 90). However, language are not reset by the re-initialization!
The descriptions below assume that the service functions have

been retrieved and not yet exited.
10.1 Service Menu Overview
Start on
Service menu Functions
Page
System Language 85
Contrast 86
Lighting 87
Autom. off 89
Initialization 90
USB Send free-running mode 91
Instrument mode Limited mode 92
Measurement audible signal 94

Measurement effect 95
External start 96
Measured variable 99
Dual method 100
Units metric/imperial 101
Storage mode save/don't save/delete on off 102
About ... Information about the instrument configura- 103
tion

10.2 System

10.2.1 Language
Do not select a language for which you do not understand the charac-
ters, e.g., Cyrillic! You might have difficulty returning to a language that is
familiar to you!

Action display
Select System from the service menu.

Use ENTER to confirm the selection.
ENTER Select the Language by pressing the ar-

row key or and confirm the selection
with ENTER.
ENTER Select the desired language by pressing

the arrow key or and confirm the se-
lection with ENTER.

10.2.2 Contrast
Use the contrast setting to adjust the LCD display brightness continuously. The
contrast value can be between 0 (brightest LCD display) and 99 (darkest LCD
display). The default contrast setting is 60.

Action display

ENTER Select the Contrast by pressing the arrow

key or and confirm the selection with
ENTER.
ENTER Use ENTER to confirm the Contrast se-

lection, or
or specify a new value by pressing the arrow
key or , then confirm the entry with EN-
TER.
Use DEL at any time to cancel the proce-

dure.

10.2.3 Lighting

The following options are available for the light setting
z off after n sec: The light turns off after n seconds.
z always off: The light is always off.
z always on: The light is always turned on.

Action display

ENTER Select Light by pressing the arrow key

or and confirm the selection with EN-
TER.
ENTER Select the desired setting by pressing the

arrow key or .
Use ENTER to confirm the desired setting.

dure.
or off after n sec

Enter Use ENTER to confirm the value, or:
specify a new value by pressing the arrow
key or .
Pressing ENTER returns you to the menu
in order to enter additional settings.
or always off
Enter After confirming the selection always off
with ENTER you are immediately returned
to the menu in order to enter additional set-
tings.

Action display
or always on
Enter After confirming the selection always on
with ENTER, you are immediately returned
to the menu in order to enter additional set-
tings.

10.2.4 Automatic Switch Off

Action display

ENTER Select Auto. switch off by pressing the ar-

with ENTER.
ENTER Select the desired mode by pressing the

arrow key or and confirm the selection
with ENTER.
[off]: The instrument does not switch off

automatically. The switch-off mode is dis-
abled.
[on]: The instrument switches off automati-

cally if for about 5 minutes no measure-
ments are made or no key is pressed. The
switch-off mode is enabled.

dure.

10.2.5 Re-Initialization of the Instrument
The restoration of the default settings of the instrument is called re-initialization.
With a re-initialization of the instrument,
z all readings are deleted,
z all settings in the service functions are reset to the default settings (i.e., to the
factory settings) (exception: language); thus, if necessary the settings will
have to be made again.
z the coefficients of the master characteristic that is stored in the EEPROM of
the probe plug are not changed because the re-initialization concerns only
the memory of the instrument.

Action display

ENTER Select the Initialization by pressing the ar-

with ENTER.
ENTER [Yes: DEL]: Press DEL to carry out the re-

initialization.
[No: ENTER]: Press ENTER to not carry

out the re-initialization.
Press DEL only if the re-initialization is indeed desired!
DEL [Continue: ENTER]: Press ENTER to re-

turn to the System menu.

10.3 USB

10.3.1 Send Free-Running Mode

Action display
Select USB from the service menu.

ENTER
Select the desired free-running mode by
pressing the arrow key or and confirm
the selection with ENTER.
[off]: Measurement data that have been

taken using the free-running display
mode will not be transmitted via the USB
port.
[on]: Measurement data that have been

taken using the free-running display
mode will be transmitted via the USB port.

dure.

10.4 Instrument Mode
10.4.1 Restricted operating mode

When the restricted operating mode is enabled, only the keys necessary for mea-
surement and evaluation are active. This avoids erroneous measurements due to
unintentional adjustments of instrument parameters.
The following keys are not active in the restricted operating mode:
z ZERO
z CAL
No actions are triggered and the LCD display will not change when pressing
these keys while in restricted operating mode.
As long as the restricted operating mode is enabled, the LCD dis-

play will show .
The restricted operating mode will remain enabled even after the instrument is
switched off and on.

Action display
Select the Device Mode by pressing the

with ENTER.

Action display
Select the desired operating mode by

[off]: The restricted operating mode is dis-

abled, i.e., all functions are enabled ac-
cording to their settings.
[on]: The restricted operating mode is en-

abled.

dure.

10.5 Measurement
10.5.1 Audible Signal

The audible signal, i.e., the measurement acquisition signal that sounds after ev-
ery measurement can be disabled.

Action display
Select Measurement by pressing the ar-

with ENTER.
ENTER Select Audible signal by pressing the ar-

with ENTER.
Select the desired mode by pressing the

ENTER
with ENTER.
[off]: No audible signal sounds when the

probe is placed on the specimen.
[on]: An audible signal sounds when the

probe is placed on the specimen.

dure.

10.5.2 Measurement Effect

Action display

with ENTER.
ENTER Select Meas. signal by pressing the arrow

ENTER.
Select the desired measurement effect

ENTER
by pressing the arrow key or and con-
firm the selection with ENTER.
[off]: Measurement effect disabled, i.e.,

the reading will not be acquired automati-
cally (automatic measurement acquisition
disabled).
[on]: Measurement effect enabled, i.e., the

reading will be acquired automatically
once the probe is placed on the specimen
(automatic measurement acquisition en-
abled).

dure.

10.5.3 External Start

Action display

with ENTER.
ENTER Select Extern start by pressing the arrow

ENTER.
Select Extern Start on or Extern Start off

ENTER
by pressing the arrow key or and con-
firm the selection with ENTER.
[off]: External start is not possible (Exter-

nal start disabled)
[on]: External start is possible (enabled),

i.e., external measurement acquisition can
be triggered by pressing the key (or FI-
NAL-RES during a normalization or cali-
bration).

dure.

Action display
Select the desired delay by pressing the
ENTER
with ENTER.
[0 ms]: no pause after external start
[100 ms]: 100 ms pause after external

start
to
[2500 ms]: 2500 ms pause after external
start
[Page : CAL]: Press CAL to leaf through

the pages.

dure.
The combination measurement effect off and external start off is

not permissible because it would not allow for a measurement
acquisition. If this combination is set, the instrument will automati-
cally reset the parameters to measurement effect on and external
start off.

10.5.4 Measurement Display Resolution
The measurement display resolution specifies the resolution for displaying the
readings on the LCD display.
Example: Measured value 18.61

Display with resolution setting low:19
Display with resolution setting medium: 18.6
Display with resolution high: 18.61
Resolution 0.0 ...999 1.0 ...9.99 10 ...99.99 100 ...999.9 1000 ...9999
low 0.9 9.9 99 999 9999

medium 0.99 9.9 99.9 999 9999
high 999 9.99 99.99 999.9 9999

Action display
Select Disp. resolution by pressing the

with ENTER.
or Use the arrow keys or to select the

desired resolution.
ENTER Press ENTER to confirm the selection and

return to the menu to enter additional set-
tings.
Press DEL to return to the measurement
screen.
ments.

10.5.5 Measured Variable

Action display

with ENTER.
ENTER Select Meaured variable by pressing the

with ENTER.
ENTER Select the measurement data type by

The readings will be presented on the LCD

display corresponding to the selected
measurement data type
( 4.3.3 Measuring Modes, beginning on
Page 35).

dure.
With every modification of the type of mea-

surement data, a prompt for deleting read-
ings that are already stored in the
Application will appear because it is not
possible to evaluate different types of mea-
surement data statistically. This prevents
erroneous interpretations of the measure-
ment results.
[Yes: DEL]: Press DEL to delete all read-

ings that have been stored thus far.
[No: ENTER]: Press ENTER to cancel the
procedure.

10.5.6 Dual Method
The menu option Dual method appears only if a dual probe is connected.

Action display

with ENTER.
ENTER Select Dual method by pressing the arrow

ENTER.
ENTER Select the desired dual method by press-

ing the arrow key or and confirm the
selection with ENTER.
[NF/Fe]: In the open application, only the

magnetic induction method can be used to
make measurements.
[NC/NF]: In the open Application, only the

eddy current method can be used to make
measurements.
[both]: In the open Application, only the

two methods can be used to make mea-
surements.
ENTER Use DEL at any time to cancel the proce-

dure.
Press ENTER to confirm and store the
measuring mode settings.
ments.

10.6 Units

Action display
Select Units by pressing the arrow key

TER.
ENTER Select the desired units by pressing the ar-

with ENTER.
[metric]: Units of measurement in m or

mm
[inch units]: Units of measurement in mils

dure.

10.7 Storage Mode

Action display
Select Storage mode by pressing the ar-

with ENTER.
ENTER Select the desired mode by pressing the

with ENTER.
[store]: The readings are stored and will

be retained even after the instrument is
switched off
[do not store]: The readings will be dis-

played but not stored
[delete at off]: All readings will be deleted

when the instrument is switched off

dure.
10.8 Performing a Master Calibration

Action display
Select Master Calibration by pressing the

with ENTER.
Performing the master calibration: 6.7 Master Calibration, beginning on

Page 57.

10.9 About ...

Action display
Select About ... by pressing the arrow key

TER.
ENTER Displays the software version, the internal

state and the name of the connected
probe.
Pressing ENTER repeatedly displays the
instrument configuration in succession (cv.
11 Malfunctions and Messages, begin-
ning on Page 104).

11 Malfunctions and Messages
Malfunctions and Messages
11.1 Malfunctions
Malfunction/Mes- Cause Correction from

sage Page
No display Instrument not switched Use ON/OFF to turn 33
on. the instrument on.
Instrument has Use ON/OFF to turn 33
switched off automati- the instrument on.
cally.
Battery discharged. Replace the recharge- 28
able or regular battery
with a new one.
No change on the restricted operating Use ON/OFF + ENTER 92
display for mode is enabled. to disable the restricted
ZERO or CAL operating mode with
the instrument
switched off before-
hand.
Unable to retrieve Free-running display Use to disable the 72
the service functions mode is enabled. free-running display
mode.
Probe does not mea- Measurement acquisi- Repeat measurement. 37
sure tion did not occur be-
cause the previous
measurement acquisi-
tion was less than two
seconds earlier.
Computing the coating Use a different speci- --
thickness is not possi- men.
ble because the coat-
ing is too thick.

sage Page
Probe does not mea- Wrong probe connect- Connect the correct 30
sure ed. probe or assign a new 38
The indicator for the probe.
measurement method
flashes on the LCD dis-
play.
Wrong base material Use a specimen with a --
(measurements with ferromagnetic base
magnetic induction material.
probes are possible on-
ly on ferromagnetic
base materials).
(measurements in the ferromagnetic base
free-running display material.
mode using a dual
probe are not possible
on base materials made
of non-ferrous metal if
the last measurement
prior to enabling the
'free-running display
mode was carried out
on a ferromagnetic
base material).
Wrong dual method set- Use a specimen with a 100
ting. A measurement ferromagnetic base
with a dual probe on material, or
non-ferromagnetic base Set the dual method
materials is not possible (both) in the service
if the dual method (NF/ function.
Fe) was set in the ser-
vice function.

sage Page
Probe does not mea- Automatic Enable automatic mea- 98
sure measurement acquisi- surement acquisition
tion disabled. from the service func-
tions or trigger the ex-
ternal measurement
acquisition by pressing
the key (or FINAL-
RES during the nor-
malization or calibra-
tion).
Probe defective. Use properly function- --
ing probe.
Wrong readings Probe placed on speci- Place probe on speci- 37
men incorrectly (e.g., men correctly and ob-
probe hovers over serve the minimum lift-
specimen). off distance when lifting
off the probe.
(correct measurements non-ferromagnetic
with eddy current base material.
probes are possible on-
ly on non-ferromagnet-
ic base materials).
(correct measurements non-ferromagnetic
in the free-running dis- base material.
play mode using a dual
probe are possible on
non-ferrous base mate-
rials only if the last mea-
surement prior to
enabling the 'free-run-
ning display mode was
carried out on a non-fer-
romagnetic base mate-
rial).

sage Page
Wrong readings Conducting metal close Use a specimen with- --
to the measurement lo- out a conducting metal.
cation when making
measurements using
eddy current probes.
(e.g., on the back side
of a pc-board).
Wrong dual method set- Use a specimen with a 100
ting (A correct measure- non-ferromagnetic
ment with a dual probe base material or set the
on ferromagnetic base dual method (both) in
materials is not possible the service function.
if the dual method (NC/
NF) was set in the ser-
vice function.
Incorrect normalization Perform a correct nor- 41
or calibration. malization or calibra-
tion.
Probe tip worn. Use a probe with a --
proper probe tip.

11.2 Messages on the LCD Display
The error messages (E***) and warning messages (W***) that may occur during
instrument operation are contained in the overview on the following pages.

sage Page
Reading cannot be dis- Perform the measure- 37

---- played (because the ment correctly (e.g., do
value is greater than not allow the probe to
9999 or smaller than hover over the speci-
- 9999) men before or after the
Cause: Measurement measurement; ob-
carried out incorrectly. serve the minimum lift-
off distance!)
Cause: Eddy current Continue normaliza- 45

probe that is currently tion.
normalized on a non-
ferromagnetic base ma-
terial has previously
been normalized on a
ferromagnetic base ma-
terial.
Instrument is not ready Use ZERO to start and 45

to make measure- perform the normaliza-
ments. tion.
Cause: Re-initialization
was carried out and the
instrument was then
switched off.
Instrument-internal er- Use ON/OFF to turn 33

E 001 ror. the instrument off and
then again on.
Math Error !
If this error occurs re-
peatedly: Inform cus-
tomer service.

sage Page
The internal instrument Delete the stored mea- 72

E 004 memory is full. surement data.
Appl. memory
overflow !
Unable to perform the Perform a calibration 53

E 005 computation for the cali-
bration on coating be-
on coating with a suit-
able calibration stan-
Unable to det.
introuvable ! cause the thickness of dard (the used
the used calibration calibration standard
standard is insufficient. should have a thick-
ness of at least 50% of
the coating thickness
of the coated specimen
that is used for the cali-
bration on coating).
Unable to display read- Perform measure- --

E 006 ing because it is out of
the probe's measure-
ments on specimens
with coatings that can
Measurements
out of range ! ment range. be measured with the
Cause: Coating too connected probe or
thick. use a different probe.
Cause: Measurement Perform the measure- 37
carried out incorrectly. ment correctly (e.g., do
not allow the probe to
hover over the speci-
men before or after the
measurement; ob-
serve the minimum lift-
off distance!)
Cause: Measurement Perform a normaliza- 45
with eddy current probe tion with the eddy cur-
on a non-ferromagnetic rent probe on a non-
base material after a ferromagnetic base
normalization on a fer- material and repeat the
romagnetic base mate- measurement.
rial.

sage Page
Cause: ENTER was Place the probe on the 72

E 006 pressed during the
measurement in the
specimen and then
press ENTER to trigger
Measurements
out of range ! free-running display the measurement ac-
mode while the probe quisition.
was lifted off.
Outlier measurement Repeat the calibration 37

E 007 recognized during nor-
malization or calibra-
step and perform the
calibration measure-
Measurements
invalid ! tion. ment correctly (e.g., do
Cause: Measurement not allow the probe to
on calibration standard hover over the stan-
carried out incorrectly. dard before or after the
measurement; ob-
off distance!)
Cause: Measurement Repeat the calibration 47
performed on a wrong step and make the cali-
calibration standard bration measurement
(e.g., a measurement on a correct standard.
on an uncoated base
material instead of a
calibration standard).
Connected probe not Connect a suitable 30

E 010 suitable or not support- probe.
ed (measurement meth-
Meas. method
not supported ! od of the connected
probe does not fit the in-
strument).
Probe defective. Connect a properly 30
functioning probe.

sage Page
Unable to complete cor- Repeat the corrective 47

E 011 rective calibration.
Cause: Measurement
calibration and per-
form the calibration
Measurements out
of interval ! carried out incorrectly. measurement correct-
ly (e.g., do not allow
the probe to hover over
the standard before or
after the measurement;
observe the minimum
lift-off distance!)
Cause: Calibration Repeat the corrective 47
standards used that did calibration with correct
not exhibit the required and good calibration
coating thickness or are standards.
defective.
Cause: Normalization Repeat the corrective 45
carried out on calibra- calibration and per-
tion standard instead of form the normalization
on uncoated specimen. on the uncoated speci-
men.
Calibration standards Repeat the corrective 47

E 012 were measured out of
sequence during the
calibration and mea-
sure the standards in
Invalid std.
sequence ! corrective calibration the correct sequence.
(standard 1 mixed up
with standard 2) and
foil thickness was not
adjusted correspond-
ingly using the arrow
keys.

sage Page
Unable to complete the Repeat the master cali- 57

E 013 master calibration.
Cause: Measurement
bration and perform the
calibration measure-
Countrate out
of interval ! carried out incorrectly. ment correctly (e.g., do
not allow the probe to
hover over the stan-
dard before or after the
measurement; ob-
off distance!)
Cause: Calibration Repeat the master cali- 57
standards used that did bration with correct and
not exhibit the required good calibration stan-
coating thickness or are dards.
defective.
Cause: Normalization Repeat the master cali- 45
carried out on calibra- bration and perform the 57
tion standard instead of normalization on the
on uncoated specimen. uncoated specimen.
Instrument-internal er- Repeat the master cali- 57

E 014 ror: Unable to compute
the coefficients of the
bration.
If this error occurs re-
Unable to calc.
parameters ! master characteristic peatedly: Inform cus-
(original master charac- tomer service.
teristic will be retained).
Unable to store master Plug probe in and tight- 30

E 015 characteristic.
Cause: Probe not
en properly; repeat the
master calibration.
Unable to store
cal. in probe ! plugged in and tight-
ened properly.
Cause: Probe defective. Connect a properly 30
functioning probe and if 57
applicable repeat the
master calibration.

sage Page
The stored foil thick- Repeat the master cali- 57

E 016 nesses do not corre-
spond to the measured
bration and measure
the standards in the
Std. and meas.
not matching ! standards. correct sequence.
Cause: Calibration
standards were mea-
sured out of sequence
during the master cali-
bration (standard 1
mixed up with standard
2) and foil thickness
was not adjusted corre-
spondingly using the ar-
row keys.
Unable to perform cor- Set the rated values for 47

E 021 rective calibration with
the set foil thickness
the used calibration
standard and continue
Entered Standard
invalid ! (e.g., because [Stan- with the corrective cali-
dard 2: 0] was set). bration.
No probe connected. Connect a probe. 30

E 022 Probe not connected Connect probe correct- 30
Missing probe ! correctly. ly.
Probe defective. Use properly function- 30
ing probe.
Unable to perform a cal- Connect a suitable 53

E 026 ibration on coating with probe and repeat the
the connected probe (a calibration on coating.
Cal. on coating
not supported ! calibration on coating
can be performed only
with magnetic induction
probes or the magnetic
induction channel of du-
al probes).

sage Page
Probe contents does Inform customer ser- --

E 030 not correspond to the
test value.
vice.
Probe damaged !
Electric consumption of Check and/or replace --

E 031 a connected USB de-
vice too high (max. 100
connected USB device.
USB overcurrent !
mA permitted).
The measurement elec- Inform customer ser- --

E 032 tronics has not been
balanced properly. Be-
vice.
Measurem. equip.
not adjusted ! cause of this, measure-
ment data may be
incorrect.
Internal write/read error. Inform customer ser- --

E 033 vice.
Device damaged !
The probe contains an Perform a software up- --

E 034 unknown data format. date.
Unsupported
Probe format !
Unable to compute a Perform a normaliza- 45

E 035 measurement because tion.
a normalization has not
Please perform
a normalization ! been carried out on the
current base material.
Internal instrument er- Inform customer ser- --

E 999 ror. vice.
System error !!!

sage Page
Instrument corrected -- --
W 003 faulty settings autono-
mously.
Options
corrected !
A procedure was can- Repeat the procedure --

W 004 celed (e.g., the correc-
tive calibration was
if necessary.
Action
canceled ! canceled using EN-
TER).
Two-point calibration Repeat the corrective 47

W 005 performed with calibra-
tion standards with
calibration with suitable
calibration standards.
1-Point
calibration ! thicknesses that are not The difference of the
sufficiently far apart (will normalized count rates
be considered a one- Xn of the two calibra-
point calibration). tion standards must be
greater than 0.1:
Xn Calibration standard 2
- Xn Calibration standard 1
Xn > 0,1
A probe of the same -- 30

W 006 type but with a different
serial number has been
Probe changed !
connected.


12 Glossary
Glossary
Terms and Formulas
Adjustments Calibration
Application
Measurement Application of the User.
The instrument memory, where the coefficients from the corrective cali-
bration/normalization (adjustment of the measurement system to the spec-
imen / coating/base material adjustment, system adjustment), the param-
eter settings and the measurement data for a certain measuring application
of the user are stored is called an application.
Application Selection
Menu page(s) in the instrument, where all Applications are listed that have
been set up thus far. Use the command button APPL or use
File/Open to select an Application.
Application Memory
The instrument memory contains all data and measurements that are rele-
vant to a measuring application.
Outliers
Readings that are significantly lower or higher than the other readings of
a measurement series and that can, therefore, be considered unexpected
and not acceptable.
Outlier Rejection
Is used to prevent the distortion of measurement results by Outliers. Out-
lier rejection can be carried out using the Grubbs-Test or Sigma- Outlier
Rejection (specification of a known spread). Measurements that are rec-
ognized as outliers during outlier rejection are not included in the statisti-
cal evaluations.
Evaluation
Computation of statistical parameters such as mean value, standard devi-
ation, etc. as well as the graphical presentation of the measurements, e.g.,
in a sum frequency chart.

Glossary Evaluation Menu
Selection menu for the evaluation and presentation of the measurements
as well as for exporting the measurements, evaluations and presentations
via the USB-port to a USB-stick or a printer. Use the EVALUATE button
or
Eval/Final result to call the evaluation menu.
Automatic Block Creation

A block closure is carried out automatically each time a specified number
of measurements is reached. In statistical evaluations, the block mean val-
ues will be used instead of the single readings.
Baud
Unit of the speed for transferring information (data). 1 Baud corresponds
to a transfer rate of one bit per second.
Baud Rate
Data transfer rate. Used mainly in connection with terminal programs for
data transfer. Since data are transferred via a serial port, the transfer rate
is calculated in bits per second.
Bidirectional Data Exchange

Data can be transmitted and received by both participants (for example,
from the instrument to the PC and from the PC to the instrument).
Bit
(Binary Digit), binary number. 1 bit is the smallest unit in the binary num-
ber system. The value of a bit is 0 or 1. Being the smallest unit of infor-
mation in a computer, a bit forms the basis of every computer system. 8
bits are combined to a byte and several bytes to a word.
Block
Grouping of single readings. Several measurements are combined into a
block. A key symbol on the display indicates the end of each block (con-
clusion of a block).
End of Block
Mark after n single readings. As a rule, a key symbol on the display indi-
cates the end of a block.
Block Result
Statistical evaluation of the measurement data of a block. E.g., mean val-
ue, standard deviation, coefficient of variation, range, minimum value,
maximum value, number of single readings per block.

Block Size
Glossary
Number of single readings that are combined to form a block.
Block Mean Value d. or , d
Block, open
Group of single readings for which the block has not yet been ended.
Carriage Return (CR)

CR is a character of the ASCII-character set (ASCII13) and has the fol-
lowing function: When data or commands are entered, the line one is cur-
rently working on will be closed by pressing the CR-key (Enter or Return
key on the PC keyboard) and the information that has been entered will be
processed accordingly. The curser is again placed at the beginning of the
line. CR is usually used together with the LF (Line Feed) character to start
the next line at the beginning of the line.
Chi-Squared-Test
Statistical mathematical test method to determine an existing normal dis-
tribution of the measurements (for more than 30 measurements).
Cp: Capability Indexes
Cpk: Capability Indexes
CR: Carriage Return (CR)
Cu
Copper
S1

Glossary d. or d
Arithmetic mean value of the single readings, called arithmetic mean val-
ue (d., d ). The arithmetic mean value d. is the sum of all single readings
di of a measurement series (of a block), divided by the number of measure-
ments.
n d. Mean value (block mean val-
d 1 + d 2 + d 3 + ... + d n
di
1
- = ---
d. = -------------------------------------------------- ue)
n n
i=1 n Number of single readings (in
a block)
di Single readings (of a block)
2
d..
Mean value of the block mean values of selected blocks. Analogous to the
arithmetic mean value (d.), the block mean values are added up and divid-
ed by the number of evaluated blocks nBl.
n Bl
d.i
1
d.. = -------
n Bl d.. Mean value of the block mean values
i=1
nBl Number of blocks
d.i Block mean values
DUALSCOPE
Protected brand name of Helmut Fischer GmbH for the measuring instru-
ment.
Standard Calibration Standard
Single Reading
Measurement result that is displayed or printed after a single measurement
at the measurement location.
Final Result
Evaluation of all measurements or selected blocks of an Application (mea-
surement application memory).
External Start
A setting in the menu function File/Properties/Measurement Accep-
tance.
Measurement Acceptance can be initiated by tapping the menu function
Meas/Initiate External Start, the command button Ext, by transmitting
commands from a connected PC.
Excess Curvature

Capability Indexes
Glossary
The process capability is evaluated using the factors Cp and Cpk.
The capability index Cp is a measure for the spread of a process and its
ability for continuously producing parts according to specifications.
The capability index Cpk takes the position of the mean value in relation
to set specification limits into account.
OGW UGW OGW d.. d.. UGW
Cp = ----------------------------------- and Cpk = --------------------------- ; ---------------------------
6 3 3
d..: Average of all group mean values n Bl
si
1 2
: Estimated value for the theoretical standard deviation = -------
nBl: Number of blocks n Bl
i=1
si: Standard deviation of the individual blocks
USL: Upper specification limit
LSL: Lower specification limit
FDD Evaluation
Graphical presentation of the mean values of the measurement blocks (=
Features) in an ascending rank order.
Application:
By using the FDD, existing systematic differences of coatings can be
shown quickly and clearly in a graphical format
Example 1:
When painting car bodies, the desired homogeneous coating distribution
is not achieved if the settings of one or more spray robots is wrong or dis-
turbed. If the readings of one feature (e.g, the hood) are combined into one
measurement block, then the systematic differences between various fea-
tures (hood, roof, doors, trunk lid, etc.) can be recognized quickly using
FDD, and corrective measures can be initiated promptly.
Example 2:
When electroplating racks, parts may be coated inadequately due to erro-
neous current contacting or shadowing of flux lines. If the readings of ad-
jacent parts of the rack are combined into one measurement block, then
the groups, which statistically do not fit together with the other groups,
i.e., which exhibit systematic differences, are identified clearly in the
FDD evaluation. This allows for easy localization of the source of the
error.
Fe
Magnetizable material made of steel or iron.
Error Cone Confidence Borders

Glossary Free-Running Mode
With the probe placed on the specimen, measurements are displayed con-
tinuously. Use the menu function Meas/Free-Running to enable the
free-running mode.
Gaussian Normal Distribution Normal Distribution
Gaussian Probability Paper Sum Frequency Chart
Gaussian Distribution Normal Distribution
Accuracy
Qualitative designation for the degree of approximation of a measurement
result to the true value. Usually, the accuracy is divided into Trueness
and Precision.
Bell Curve Normal Distribution
Specification Limits
The upper specification limit (USL) is the highest reading and the lower
specification limit (LSL) is the lowest reading allowed at the measurement
location.
Maximum Value
Maximum value measured in a test series.
Grubbs Test
Test method for outlier rejection. A method developed by Grubbs to test,
whether the highest or lowest single reading should be considered an out-
lier.
Population
All pieces or specimens to be measured. In practical applications, for ex-
ample, all parts of a production unit, batch, etc.
Group Separator
Mark for the end of a block that can be transferred together with the mea-
surement data to the PC. Default setting ASCII character 29.
Frequency Distribution Histogram

Histogram
Glossary
Graphical presentation of all readings of an Application (measuring appli-
cation memory) according to their portions in classes (e.g., coating thick-
ness ranges), where the class frequencies are illustrated by the contents of
rectangles. The class widths should be of equal size. Among other criteria,
the informational value of statistical results depends on the shape of this
distribution curve.
Interface Interface,
Iso
Insulating material, electrically non-conducting, non-magnetizable.
Calibration Curve
(Characteristic, master characteristic) Quantitative relationship between
the signal of the probe and a scale for the coating thickness as represented
by the calibration standards.
log d
The coating thickness d is presented as a
calibration curve as a function of the nor-
malized count rate Xn. The mid portion of
the calibration curve approaches a
straight line and constitutes the range
with the lowest relative measurement er-
ror.
Xn
0 1
As long as no normalization (coating/base material adjustment, measuring

system adjustment) or corrective calibration (adjustment of the measuring
system to the specimen) has been performed, the calibration curve is iden-
tical with the master characteristic. During a normalization or corrective
calibration, the calibration curve is adjusted to the individual measuring
application. The coefficients of the normalization or corrective calibration
are stored in the active Application (measurement application memory).
Calibration
In this manual, the term calibration is used as a comprehensive term for
the adjustment and the calibration: Adjustment of the instrument using
calibration standards to adapt the measuring system (instrument and
probe) to the measuring application.

Glossary Calibration Standard
(Standards) Object with essentially the same attributes as the specimen,
which differs only in the coating thickness and with a coating thickness
that has been determined with a very accurate measurement method. May
also be a foil.
Calibration Standards Calibration Standard
Characteristic Calibration Curve
Class
Range between a lower and an upper class boundary (limit values). The
readings of a measurement series can be sorted according to such classes
if they cover the entire measurement range without gaps. The class con-
tents (frequency or number of measurements per class) plotted over the
classes is called a histogram.
Minimum Value
Minimum value measured in a test series.
Kolmogoroff Smirnoff Test

Statistical mathematical test method to determine the normal distribution
of the readings (for 5 to 30 measurements).
System Check
A significant part of monitoring the measurement devices. Calibration
standards or better yet, reference samples are used to check the calibra-
tion and to ensure the measurement stability.
Corrective calibration
One-point or two-point calibration. Adjustment of the instrument using 1
or 2 calibration standards. The corrective calibration includes calibration
and adjustment.
During the corrective calibration, the master characteristic (calibration
curve) is adjusted to the individual measuring application. The obtained
coefficients are stored in the active Application (measuring application
memory). The master characteristic itself remains unchanged.
Kurtosis Curvature
LF Line Feed

Line Feed
Glossary
LF line feed. Advances the printer paper by one line. Is usually used to-
gether with the CR (carriage return) character to start the next line at the
beginning.
Magnetic induction measurement method (DIN EN ISO 2178, ASTM B499)

Contacting measurement method. The excitation current generates a low-
frequency magnetic field with a strength that is dependent on the distance
between the measurement probe and the base material. The magnetic field
is measured by means of the measuring coil. The obtained measurement
signal is converted in the instrument to a coating thickness value via the
characteristic probe output.
-
Excitation
current Soft iron core of the probe
Low frequency alternating magnetic
field
U = f(d)
Measurement
signal
Coating material
ferrous base material
Operating principle of the magnetic induction measuring method
Unit of Measurement
Unit for displaying measurement data. In coating thickness measurement,
the common units are m and mils. 100 m = 3.9 mils.
Master characteristic
(Characteristic probe output function) Original characteristic of the mea-
surement system. The master characteristic is the basis for determining
the measurements because it represents the relationship between the probe
signal and the coating thickness. The coefficients of the master character-
istic are stored in the probe plug.
Max
Highest measured value of a test series.
Maximum Max

Glossary Measuring
To measure means to compare!
The probe signal generated at the measuring position is compared to the
probe signal on the calibration standard. Using the calibration curve, the
instrument converts the probe signal to the measurement result, which is
presented in the specified unit of measurement.
Measuring Application
Properties of the test specimen with regard to measurement quantity, ge-
ometry, geometric dimensions, permeability, etc. The test method, the
measurement display mode, the probe and the type of instrument are all
determined by the measurement application.
Measurement Range
The range between two limit values within which a measurement is pos-
sible at a specified trueness and precision. In a narrower sense, it refers to
the range of the scale of an analog instrument. The measurement range de-
pends on the measurement method, the design of the probe and the mea-
suring application.
Measurement Error
The difference between the actual and the measured value of a measured
quantity. For measuring instruments, there is a distinction between ran-
dom (unpredictable) and systematic (correctable) measurement errors.
Random errors determine the repeatability precision. Systematic errors
affect the trueness and the reproducibility. Systematic measurement er-
rors are far more prevalent in practical applications. Systematic measure-
ment errors can be traced back to 1. faulty calibration, 2. operating or per-
sonal errors and 3. deviations in the test conditions (inhomogeneities,
instabilities, material aging, etc.). They tend to lean in one direction. With
appropriate care, the influences 1. and 2. can usually be avoided or cor-
rected or taken into account in the result.
Measurement Accuracy Accuracy
Instrument Memory Application

Monitoring of the Test Equipment
Glossary
A quality assurance task. It consists of ensuring at specified intervals that
the test equipment (instrument, probe) is still operating properly and cal-
ibrated correctly, and to take corrective measures, if necessary (recalibra-
tion or repair of the instrument). System Check
Measuring Mode
This is the condition in which the instrument can capture and display mea-
surement data. The display mode is determined by the respective mea-
surement display settings.
Measurement Object
Object on whose surface the measurements are performed to determine
the coating thickness.
Measurement Series
A series of single readings between two block or final results.
Measurement Probe Probe
Measurement Location
A limited and clearly defined location within a reference area of the spec-
imen, where the coating thickness is to be determined.
Measurement Uncertainty u
Measurement Method
A procedure and process for obtaining information from the specimen
concerning its properties. The measurement method is based on scientific
knowledge and is determined by the measuring application.
Reading
Numeric reading of an instrument supplemented by the unit of measure-
ment. The measurement can be obtained from the result of a single read-
ing or from the arithmetic mean of several single readings (for example
for the averaged display value (i individual values)).
Measurement Data Presentation

Refers to the manner of presentation and evaluation of measurement data.
In the FMP100, 3 presentation modes are available: Statistics display, his-
togram display and specification limit display.
Min
Lowest measured value of a test series.

Glossary Minimum Min
Mean Value d. or
Mean Value of the Block Mean Values d..
Mean Range R.
NF Metals
Non-ferrous, non-magnetizable metals.
NF
Non-magnetizable material.
Ni
Nickel
Standard Calibration Standard
Normal Distribution
Gaussian normal distribution, Gaussian distribution, bell curve.
Probability distribution discovered by C. F. Gau in 1794.
If a quantity X is classified as having normal distribution, 68.3 % of the
observed values X are within the -interval of the spread, around the
mean value of the quantity X. I.e., the following applies to 68.3 % of the
observed values: X + . In the following figure, this interval is
identified by the gray areas underneath the curve.
Probability distribution
P(X) of a quantity X
with a normal distribu-
Probability P(X)
tion.
- + X

The probability distribution P(X) is symmetrical around the mean value
Glossary
of the quantity X with normal distribution. Skewness and Curvature
equal zero for the normal distribution.
The populations that are examined for technical purposes often can be
classified as having normal distribution. However, the following fact is
of great significance: If several random samples of equal extent are
drawn from any population (blocks) and their mean values (block mean
values) are determined, these mean values will always have normal dis-
tribution (central limits theorem).
The mean value of these random sample mean values (block mean val-
ues) is an estimated value ( = d.) for the mean value of the popula-
tion. Due to the normal distribution, the measurement uncertainty u can
be calculated using the standard deviation of the random sample mean
values.
The sum frequency chart shows, whether a quantity has normal distribu-
tion, with a straight line indicating normal distribution.
In the instrument, the test, whether the measurements at hand (random
samples) have a normal distribution is carried out using the Kolmogoroff
Smirnoff Test (for up to 30 readings) and the Chi-Squared Test (30 read-
ings and up).
Normalized Count Rate Count Rate
Normalization
Adjustment of the instrument to the material properties of the coating and/
or the base material (probe dependent). Thus, the normalization essential-
ly defines the zero point or end point, respectively. A normalization is cru-
cial for correct measurements due to the electrical conductivity and the
permeability of the specimen materials. The coefficients of the adapted
calibration plot are stored in the active Application (measurement appli-
cation memory).
Offline
State of a peripheral device (printer or PC) connected to the instrument
that does not allow it to receive data.
Open Block
Group of readings for which the block has not yet been closed.
USL
The upper specification limit (USL) is the highest reading allowed at the
measurement location.

Glossary Online
State of a peripheral device (printer or PC) connected to the instrument
that allows it to receive data. In this state, the device is ready for operation.
Parity)
An error check method for data transmission, where the cross-sum of all
error-free transmitted bit groups must always be even or odd. During data
transfer, the parity bits are linked to the data bits of each character or byte
to be transferred. In every word, this bit is set such that the sum of the
Ones of a byte are always an even or odd number. This corresponds to an
even or odd parity. The type of parity requirement must be defined prior
to data transfer. By checking the parity, the recipient can determine if bit
transfer errors occurred.
Precision
Agreement between the individual measurement results under precisely
defined test conditions; the precision is comprised of reproducibility and
repeatability precision.
Specimen Measurement Object
Quality Assurance
All measures taken in a plant that are concerned with ensuring that a con-
trolled production within established quality requirements can take place.
One partial aspect of it is quality monitoring of which coating thickness
measurement is a part.
R
The range R equals the difference between the highest reading (Maxi-
mum) dmax and the lowest reading (Minimum) dmin of a measurement se-
ries.
R = dmax - dmin

R.
Glossary
Mean range of all block ranges.
R.: Mean range
R. = d 2
: Estimated standard deviation of the population
d2: Factor, depends on the random sample size, can be obtained
from popular published tables.
Range R
Reference Area
A defined partial area of the specimen surface with a known coating thick-
ness.
Trueness
Agreement between the true value and the mean value of a measure-
ment result generally obtained under practical circumstances. The true
value is considered a value known based on mathematical theoretical ap-
proaches. Since such values are rarely available, a value traced to national
or international standards is generally assumed to be correct. This cor-
rect value is often called the true value.
USB Port
Interface that is used for connecting instruments with PCs, printers, USB
sticks and USB keyboards.
SS
Estimated value for the standard deviation of the population. Is output
only in the final result for Applications (measurement application memo-
ries), for which automatic block creation has been enabled.
: Estimated value of the standard deviation of the population
= R.
----- R. Mean range
d2
d2: Factor, depends on the random sample size, can be obtained from
popular published tables.
or for preset specification limits:

Glossary
: Estimated standard deviation of the population
OGW UGW
= ----------------------------------- USL: Upper Specification Limit
6 Cp
LSL: Lower Specification Limit
Cp: Capability factor (default setting 1.33)
s
The standard deviation s is a measure for the spread of the single readings
of a measurement series from their common mean value. It is equal to the
mean square deviation of the single readings from the mean value and is
calculated in the following manner:
s: Standard deviation
n

1 2 d.: Mean value across all single readings
s = ------------ ( d. d i )
n1
i=1 n: Number of single readings
d i: Single readings
The following figure points out that two very different measurement
series can have different standard deviations even with the same mean
value.
Measurement series with the same mean value d. and different

standard deviations
sa
Spread of the mean values of various groups (Blocks Block), corrected
with regard to the spread of the single readings. To be able to calculate sa,
the spread of the group mean values SII must be significantly greater than
the spread of the single values SI within the group.
If, for example, the same number of measurements per measurement spot
is performed at several measurement spots, and the measurements per
spot are combined in one group (block), then SI is a measure for the instru-

ment spread and sa is the product spread adjusted by the instrument
Glossary
spread.
F beo 1
sa = S I ------------------
-
n Bl
2
S II
- (
F beo = -------
2
Variance-analytical evaluation)
SI
sa: corrected spread of the block mean values

S I: Spread of the single readings
SII: Spread of the group mean values
nBl: Number of measurement data groups
Fbeo: Check value for decisions regarding the question
Estimated Value for the Coefficient of Variation V VDach
Estimated Value for the Standard Deviation SS
Skewness
Measure for the asymmetry of a single-peak probability distribution
around its mean value. A positive skewness indicates a distribution with a
peak that stretches more toward values that are greater than the mean val-
ue. A negative skewness indicates a distribution with a peak that stretches
more toward values that are smaller than the mean value. The skewness
for a symmetric distribution (normal distribution) is zero.
Interface
Transfer or connecting point between components, circuits or programs.
A data exchange is carried out via the interface. With serial interfaces, the
data are transferred in individual bits (i.e., one bit after another), with par-
allel interfaces, several bits are transferred simultaneously.
Sigma Limits Around a Regression Line

The sigma limits around the regression line constitute the confidence in-
terval around the straight line, where the straight line is located at a con-
fidence level of 95% (the value 95% is defined internally in the FMP100
unit).

Glossary Supervisor Code
Password for a menu function to prevent unintended changes of the pa-
rameter settings.
Factory default password: 159
The user can change the factory default password.
Probe
Transducer that delivers an electrical signal to the instrument based on a
particular measurement method. This signal is proportional to the coating
thickness and is converted in the instrument into a corresponding coating
thickness value according to the master characteristic and the normaliza-
tion and calibration coefficients of the open Application (measurement
application memory). All probes of Helmut Fischer GmbH have been
master-calibrated in the plant.
Probe Frequency
A generator feeds the measurement probe with an alternating current of a
certain frequency. The applied frequency is determined by the measuring
application and the probe type.
Probe Characteristic Master characteristic
Range R
Standard Deviation s
Start Bit
With asynchronous serial data transfer, a start bit is transmitted before the
data word to be transferred. With the logic One to logic Zero transition of
the start bit, the receiver can be synchronized to the subsequent data bits.
Statistics
The result of a measurement series, i.e., the compilation of a large number
of single readings into a few characteristic quantities (e.g., mean value,
standard deviation, etc.)
Statistical Evaluation
Calculation using the measurement data according to statistical mathe-
matical methods.

Random Sample
Glossary
Some parts of the population. In practical applications, a small part of a
production batch taken from the production according to random sam-
pling methods; the results of the random sample are extrapolated to the en-
tire batch (lot, production unit).
Stop Bit
With asynchronous serial data transfer, the stop bit is added to the data
word to be transferred. 1 to 2 bit logic Ones are used. After the stop bit,
the transmitter remains at logic One until the start bit of the next character
arrives.
Spread of the Block Mean Values sa
Student Factor t
Sum Frequency
The sum frequency is that portion of parts (in percent), where the coating
thickness is smaller or equal to a particular measurement. In a sum fre-
quency chart, the sum frequency can be viewed referenced to the coating
thickness. Example: One realizes that 9% of the parts exhibit a coating
thickness of less than or equal to 39 m (1.56 mils).
Sum Frequency Chart

Graphical presentation method that can be used to check the measure-
ments for normal distribution. A straight line in the sum frequency chart
indicates a normal distribution.
Systematic Measurement Error Measurement Error
t
The student factor t can be obtained from popular published tables (e.g.,
Graf, Henning, Stange, Wilrich: Formeln und Tabellen der angewandten
mathematischen Statistik [Formulas and Tables in Applied Mathematical
Statistics by Graf, Henning, Stange and Wilrich]; Springer-Verlag) and is
stated as follows:
t Example for a confidence level of 95 % and n > 200 (and thus, de-
1 --- ;f
2 gree of freedom 199, since f = n - 1) the student factor is
t97.5; 199 = 1.96.
Part Specimen

Glossary Specification Limits Specification Limits
u
Every instrument is subject to random measurement errors
( Accuracy). With a certain probability (the confidence level), the pre-
sumed true value () of the measured quantity lies within an interval
around the measured mean value d. of a measurement series. The interval
is also refereed to as confidence interval. The boundaries of this interval
are at a distance u, the measurement uncertainty, from the mean value .
d. u d. + u
For a population with normal distribution, the measurement uncertainty

u for a set confidence level (1 - ) is calculated according to the follow-
ing formula: u is
ts t: Student factor (can be obtained from popular published tables,

u = -------- e.g., Formeln und Tabellen der angewandten mathematisch-
n en Statistik [Formulas and Tables in Applied Mathematical
Statistics] by Graf, Henning, Stange and Wilrich). For exam-
ple, at a 95% confidence level and n > 200, the student factor
is t97.5; 199 = 1.96.
s: Standard deviation
n: Number of measurements
By entering the coefficient of variation V in the equation, the relative
measurement uncertainty urel in % is obtained.
tV
u rel = --------- [ % ]
n
Transfer Rate Baud Rate
LSL
Lower specification limit; is the smallest reading allowed at the measure-
ment location.
u-Scale
Scale on the right ordinate in the printout of the sum frequency chart. Lin-
ear transformation of the measurements into standardized features u. The
transformation serves comparison and analysis purposes. The standard-
ized feature values are without dimension; their arithmetic mean u is Zero
and their standard deviation (u) is always 1.

Glossary
u: Feature value
d
u = ------------ d: Measured value

: Mean value of the population
: Standard deviation of the population
V
Coefficient of variation. The spread of a measurement series in percent,
i.e., the standard deviation in reference to the mean value. V [%] is a char-
acteristic process constant. A sudden change in V [%] indicates a change
in the process conditions. V is calculated in the following manner:
s V: Coefficient of variation
V = ---- 100 [ % ]
d. s: Standard deviation
d. Mean value
V VDach
Estimated value of the coefficient of variation.
V : Estimated value of the coefficient of variation
V = ------ 100 [ % ]
d.. : Estimated value of the standard deviation of the popula-
tion
d.. Mean value across the block mean values
Variance
Mean squared deviation. The square root of the variance is called standard
deviation (s).
n s2: Variance

2 1 2
s = ------------ ( d i d. ) d.: Mean value of the single readings
n1
i=1
d i: Single readings
n Number of measurements
Variance-Analytical Evaluation
Statistical method for checking the mean values of various random sam-
ples to determine, whether they are comparable or exhibit significant dif-
ferences. The spreads of the group mean values is compared to the mean
spread of the single readings within the groups.
The check value Fbeo is determined ( sa) and based on a comparison

Glossary with the table value FTab, a determination is made, whether a significant
difference between the measurement groups exists.
Example: Variance analytical evaluation when measuring k random sam-

ples (groups, Blocks Block), each with n single readings.
k
SI2: Mean value of the squared group spreads sj2
sj
2 1 2
S I = ---
k k: Number of random samples
j=1
SII2: Squared spread of the group mean values
k
( xj x )
2 n 2 x j: Group mean value of the group
S II = -----------
k1 n Number of single readings per group
j=1
x Mean value of the group mean values
k

1
with: x = ---
k
xj
j=1
2
S II
F beo = -------
- Fbeo Check value for deciding the answer to the question
2
SI (in the instrument possibly designated with Fb)
If the condition Fbeo FTab is met, the mean values of the random samples
belong to a common population. If Fbeo > FTab, then the mean values are
significantly different. The characteristic value sa ( sa) states the
spread of the mean values corrected with regard to the spread of the single
readings.
FTab Table value of the F-distribution with Ff1, f2, 1-
f Degrees of freedom with f1 = (k-1) and f2 = k (n-1)
Significance level
Coefficient of Variation V
Reproducibility
Term for the differences of the individual measurement results under re-
producibility conditions. Reproducibility conditions refer to measure-
ments on a specimen according to a specified method, e.g., at different
times or with different instruments or with different observers or at differ-
ent locations. Measurement results that have been obtained by different
persons using different instruments at different locations on the identical
specimen must be comparable. The reproducibility is the basis for com-
puting the confidence interval for the expected value.
Confidence Interval u

Confidence Borders
Glossary
An area of the sum frequency chart, where the sum plot can be found.
With 95% certainty (confidence level), the true portion following below
the respective feature value (e.g., coating thickness) can be found within
these borders. For a normal distribution, the confidence borders ptop and
pbottom are calculated as follows:
d-------------
d. 2
d d. 1
p unten = ------------- 1,96 --- + ----------------------
n 2n 2

pbottom: Lower confidence border

ptop: Upper confidence border
d: Measured value
d. Mean value
n: Number of all single readings
d-------------
d. 2
d d. 1
p oben = ------------- + 1,96 --- + ----------------------
n 2n 2

: Estimated value for the stan-

dard deviation for the popu-
lation
For measurements not having normal distribution, the confidence bor-

ders are entered into the sum frequency chart as a polygon plot and com-
puted as follows:
yp(i): y-Values of the polygon (sum
1- ( y p ( i ) )
2
curve when the measure-
p unten ( i ) = y p ( i ) 1,96 -- + ------------------- ments do not have normal dis-
n 2n 2
tribution) where i = 1 to n - 1.
1 ( y p ( i ) ) -
2
p oben ( i ) = y p ( i ) + 1,96 --- + ------------------
n 2n 2
Confidence Level u
True Value Trueness

Glossary Probability Chart Sum Frequency Chart
Repeatability Repeatability Precision

Repeatability Precision
Glossary
Repeated measuring under consistent conditions at the same measurement
location leads to random deviations of the measurement data. Consistent
conditions means the same observer performing measurements according
to a specified method on an identical specimen within short periods using
the same instrument at the same location. The standard deviation of the
measurement data obtained under repeatability conditions is a measure for
the repeatability precision. A large standard deviation or measurement un-
certainty of an instrument indicates a poor repeatability precision. The
smaller the standard deviation, the better the repeatability precision. The
repeatability precision is dependent on the measurement method and the
properties of the instrument but also on the properties of the specimen.
The repeatability precision can be improved by generating mean values of
the measurement series (i single readings).
Eddy Current Method, Amplitude-Sensitive (DIN EN ISO 2360)

The excitation current generates a high-frequency magnetic field that in-
duces eddy currents in the material. The development of these eddy cur-
rents depends on the distance (coating thickness) between the measure-
ment probe and the base material. The measurement signal, which
captures the reaction of the magnetic field of the eddy currents on the orig-
inal magnetic field, is converted into a reading that is proportional to the
coating thickness.
Ferrite core of the probe

Excitation
current High frequency alternating magnet-
U = f(d) ic field
Measure-
ment signal
Coating material
d base material
induced eddy currents
Principle of the amplitude sensitive eddy current method
Curvature
The curvature is a measure for how pointed (Excess) or how flat (Kurto-
sis) a distribution is compared to a normal distribution. A positive curva-

Glossary ture is an indication for a relatively narrow and pointed distribution. A
negative curvature indicates a relatively flat and wide distribution. The
curvature for a normal distribution is Zero.
X Count Rate
XN Count Rate
Count Rate
X (Phi). Probe signal displayed as a number of electrical impulses. Phi
corresponds directly to the measured quantity. The Phi values range be-
tween the two extremes Xmin and Xmax.
In general, displaying the count rate X serves the purpose of determining
whether a noticeable measurement effect is present for a particular mea-
suring application.
The numeric values for the normalized count rate XN are between 0
and 1 and are calculated according to the following equation:
XN: normalized count rate

X X0
XN = -------------------- X: Count rate for the reading
XS X0
X0: Count rate of the pure, solid coating material
XS: Count rate in air (= no electrical conductivity)
Random Measurement Error Measurement Error
Two-Point Calibration Corrective calibration

Index Block mean values 91
Block Range 130
A Block Result 118
Accessoires 19 Block Size 119
Accuracy 122
Acoustic signals 71, 94
C
Air humidity 22 Calibration 123
Corrective Calibration 124
Ambient Temperature 9
deleting 52
Amplitude-Sensitive Eddy Current Master calibration 57
Method 141
Calibration Curve 123
Application 117
Calibration on coating 41, 53
Save 41
Calibration Standard 124
Application Memory 117
Certification 21
Application Selection 117
Calibration Standards 11, 20,
Arithmetic Mean Value 120 124
Automatic Block Creation 118 Capability Index 121
Capability Indexes
B Cp, Cpk 121
Battery Carriage Return 119
Battery compartment 13
Characteristic 123
Battery compartment cover 28
Battery replacement 28 Chi-Squared-Test 119
Symbol 15 Class 124
Baud 118 Coefficient of Variation 137
Baud Rate 118 Confidence Borders 139
Bell Curve 122, 128 Confidence Interval u 138
Bidirectional Data Exchange 118 Confidence Level u 139
Bidirectional data exchange Contents of Shipment 23
Control commands 81 Contrast 86
Bit 118 Control commands 81
Block 118 Copper beryllium 20
Block Mean Value 119 Corrective Calibration 124
Block Result 118
Corrective calibration 41, 47,
Block Size 119
48
End 118
Open 119 Corrective Calibration deleting 52
open 129 Count Rate 142
Block Creation Cp 121
automatic 118 Cpk 121
Block Mean Value 119, 120 CR 119
Operators Manual FMP10 /FMP20 Page 143

Curvature 141 Free-running display 15
FreeRunning Mode 122
D Free-running mode 91
Data Exchange Frequency Distribution 122
bidirectional 118
Data transfer G
virt. COM-Port 80 Gaussian Distribution 128
Description Gaussian Normal Distribution
Technical Terms 117 122, 128
Device mode 92 Gaussian Probability Paper 122
Display 99 Glossary 117
free-running 15
Group Separator 122
Driver installation 79
Group separator 91
DUAL
Grubbs Test 122
DUAL probe 26, 44
Setting dual mode 39
H
Dual method 100
Histogram 123
Dual probe
Measurement method 71
I
E Instrument
Contents of Shipment 23
Eddy Current Method
Dimensions 21
amplitude-sensitive 141
On/Off 33
EEPROM 19 Options 23
Eingeschrnkter Bedienmodus Power Connection 27
14 Power consumption 22
EMC 9 Repairs 11
End of Block 118 Warrantee 12
Weight 21
Environmental Conditions 9
Instrument configuration 103
Error mesages 108
Instrument mode 92
Estimated Value 131
Instrument setting 83
Evaluation 117
Service functions 83
statistical 134
variance analytical 137 Instrument settings
Contrast 86
External Start 96, 120
Display 99
Dual method 100
F
External Start 96
FDD Evaluation 121 Instrument mode 92
Fe 121 Language 85
Final Result 120 Lighting 87
Limited operating mode 92
Page 144 Operators Manual FMP10 /FMP20

Master calibration 102 M
Measurement acquisition signal
m 125
94
Measurement effect 95 Magnetic Induction Measuring Me-
Measurement output 91 thod 125
Measuring mode 99 Making measurements
Re-initialization 90 acoustic signals 71
Storage mode 102 Malfunctions 104, 108
Switch off mode 89 Master Calibration
Unit of Measurement 101 Normalized Countrate Xn of a Ca-
Insulating Material 123 libration Standard 65
Intended Use 8 Xn Ranges for Calibration Stan-
Iso 123 dards 63
Master calibration 41, 57,
K 59, 102
Keys 13 Master Characteristic 123, 125
Arrow down 18 Master foil 20
Arrow up 18 Mean Value 120
CAL 17 Block Mean Value 120
DEL 16 mean Value
ENTER 18 arithmetic 120
FINAL-RES 17
Measurement
ON/OFF 13, 17
Influencing parameters 66
SEND 18
Making 67
ZERO 17
Preparation 66
Kolmogoroff Smirnoff Test 124
Measurement Acquisition 69
L Measurement Data Presentation
127
Language 85
Measurement Display Resolution
LCD Display 13, 14 98
LCD display Measurement effect 95
Contrast 86
Measurement Error 126
Lighting 87
Measurement Location 127
LF 125
Measurement Method 33, 127
Lift-off distance 22
Amplitude-sensitive eddy current
Lighting 87 method 141
Limited operating mode 92 Measurement method 25
Line Feed 125 Amplitude-sensitive eddy current
Low Voltage 9 method 25, 26
LSL 122, 136 Magnetic induction 25, 26
Measurement Object 127
Measurement output 91

Measurement Range 126 Precision 130
Measurement Series 127 Probe 19, 134
Measuring Application 126 Angle probe 67
Measuring Method axial 67
magnetic induction 125 Connection 30
Connector Socket 13
Measuring Mode 127
Handling 10, 37
Measuring mode 99 Two-tip 68
Measuring modes 21, 35 probe
Messages 108 assigning 38
mils 125 Probe Characteristic 125
Monitoring of the Test Equipment Probe connector 30
127 Probe connector socket 31
Probe Frequency 134
N
Probe plug 19, 31
Normal Distribution 128
Gaussian 122, 128 Q
Normalization 41, 45, 129
Quality Assurance 130
Normalized Countrate Xn 65
R
O R 130
Offline 129
R. 130
Offline operation 80
Random Sample 135
On/Off 33
Range 130
One-Point Calibration 124 R 130
Online 130 R. 130
Online operation 80 Reading 127
Open Block 119, 129 Single Reading 120
Operating Personnel 8 Readings
Options 23 Transfer to PC 80
Outlier rejection 117 Rechargeable battery 28
Outliers 117 Reference Area 131
Reference Measurements 44
P Regression Line 133
Parity 130 Reinigung 36
Peep tone 71, 94 Re-initialization 90
Population 122 Repairs 11
Power Connection 9, 27 Repeatability 130
Power consumption 22 Repeatability Precision 141
Power-Up 34 Reproducibility 130, 138

S Supervisor Password 134
s 132 Switch off mode 89
Service function Switch on 34
Contrast 86 System Check 124
Display 99
Dual method 100 T
External Start 96 t 135
Instrument mode 92 Technical Data 21
Language 85
Technical Terms 117
Lighting 87
Master calibration 102 Temperature
Measurement effect 95 Operation 21
Measurement output 91 Storage 22
Measuring mode 99 Temperature Range During Storage
Re-initialization 90 and Transport 9
Storage mode 102 Transfer formats 81
Switch off mode 89 Trueness 131
Unit of Measurement 101
Turning Off the Instrument 35
Service functions 83
Two-Point Calibration 124
Sigma Limits 133
Single readigngs 91 U
Single Reading 120 u 138, 139
Skewness 133 Unit of Measurement 101, 125
Specification Limit USB
LSL 122, 136 Connection 79
USL 122 Connector 13, 22, 78
Spread 132 Driver 79
s 132 Port 79
Standard Deviation 132 USB connection 78
Estimated Value 131 USB Port 131
Start Bit 134 u-Scale 136
Statistical Evaluation 134 USL 122
Statistics 134 Specification Limit
Stop Bit 135 USL 129
Storage mode 102
V
Student Factor
t 135 v 137
Student factor 135 Variance 137
Sum Frequency 135 Variance Analytical Evaluation
137
Sum Frequency Chart 135
Voltage supply 22
Supervisor Code 134

W
Warning messages 108
Warrantee 12
Weight 21
X
Xn 65

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Deltascope FMP10 Isoscope FMP10 Dualscope FMP20: Operators Manual

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Deltascope FMP10 Isoscope FMP10 Dualscope FMP20: Operators Manual

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Operators Manual

Coating Thickness Material Analysis Microhardness Material Testing

Operators Manual FMP10 / FMP20 Page 1

2 Description of the Instrument . . . . . . . . . . . . . . . . . . 13

3 Measurement Methods for Coating Thickness

Page 2 Operators Manual FMP10 / FMP20

6 Normalization, Calibration and Master

Operators Manual FMP10 / FMP20 Page 3

9 Data Transfer Using USB . . . . . . . . . . . . . . . . . . . . . 78

Page 4 Operators Manual FMP10 / FMP20

11 Malfunctions and Messages . . . . . . . . . . . . . . . . . . 104

Operators Manual FMP10 / FMP20 Page 5

1.2 Symbols and Conventions Used in the Manual

Indicates safety information referring to danger for per-

Indicates particularly important information and hints.

Indicates a reference to a page or chapter in this manual.

1. Operation to be carried out by the operator at the instrument.

Operators Manual FMP10 / FMP20 Page 7

1.4 General Information

1.5 Requirements on the Operating Personnel

The instrument should be operated only by staff trained for

In addition, basic knowledge of metrology according to DIN 1319 is essential for

Basic computer knowledge regarding configuration, operation and programing

Page 8 Operators Manual FMP10 / FMP20

Ambient Temperature Range During Operation: +10C ... 40C

Temperature Range During Storage and Transport: +5C ... 60C

Temperature behind glass panes (e.g., in cars) in direct sun-

The instrument and accessories (in particular the AC

Because the instrument and accessories are not acid resis-

The instrument and accessories are not suited for operation

Protect the instrument and accessories from static charges!

Operators Manual FMP10 / FMP20 Page 9

To avoid breakage of the wiring, do not bend the probe con-

Fig. 1-1 Probe handling

Place the probes speedily yet gently on the specimen sur-

Do not drag the probe across the specimen surface.

Do not place standard probes on hot or acid-wetted sur-

Page 10 Operators Manual FMP10 / FMP20

Do not soil, bend or scratch calibration standards!

To protect the calibration standards from dirt or damage, keep them in

1.9 Instrument Repairs

The instrument may be opened only for replacing recharge-

Operators Manual FMP10 / FMP20 Page 11

z Connection of accessories not recommended or approved by the Helmut Fis-

Page 12 Operators Manual FMP10 / FMP20

Description of the Instrument

2 LCD Display, Page 14

2 3 Keys for directly retrieving

4 USB port for connecting a

7 Non-slip rubber supports

8 Foldable instrument stand

Fig. 2-1 Front and rear view of the instrument, connections

Operators Manual FMP10 / FMP20 Page 13

Display elements of the LCD display after power up (example)

Display element Explanation

A normalization is performed (on the uncoated specimen

A calibration is carried out

The measurement uses the magnetic induction method.

The measurement uses the eddy current method.

Page 14 Operators Manual FMP10 / FMP20

-8.8.8.8 Numeric elements for presenting readings, errors and

Unit of measurement for the displayed reading.

Operators Manual FMP10 / FMP20 Page 15