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Abstract
Highly structured ZnO layers comprising well-shaped hexagonal rods were prepared by spray pyrolysis deposition of zinc chloride aqueous
solutions in the temperature range of 490560 C. The layers were characterised by SEM, XRD and SAED. A flat ZnO film evolves into the
structured layer consisting of single crystalline hexagonal elongated prisms at growth temperatures close to 500 C and above. The rise of both the
growth temperature and solution concentration increases rod dimensions. The deposition of the 0.1 mol/l solution at 500 C results in crystals
with a diameter of 200300 nm and length of 800 nm. However, the rods grown at 560 C indicate a width in the range of 400600 nm and a
length of up to 2500 nm. The deposition of the 0.05 mol/l solution at 560 C results in the rods with a diameter of 100300 nm and a length of
1500 nm. The increase of the concentration up to 0.2 mol/l results in branched crystals, mainly tripods with a similar leg size of 600700 nm in
width and 3000 nm in length. According to XRD, the ZnO layers grown from the 0.1 mol/l solution in the temperature range of 450560 C are c-
axis-oriented, independent of morphology. The XRD peaks intensities ratio (I002/I101) of the samples deposited at 560 C changes from 9 to 1.3 by
an increase in the solution concentration from 0.05 to 0.2 mol/l and indicates that c-axis orientation vanishes at higher concentrations. We showed
that ZnO nanorods with the length to diameter ratio of 30 can be prepared by spray technique using indium tin oxide-covered glass substrates
instead of bare glass.
2006 Elsevier B.V. All rights reserved.
Keywords: Spray pyrolysis; Electron diffraction; Nanostructures; Surface morphology; Zinc oxide scanning electron microscopy
Table 1
The ratio of intensities of the (002) and (101) reflections (I002/I101) in XRD
pattern and the diameter (d), length (L), aspect ratio (L/d) of ZnO nanorods on
glass substrates depending of the deposition temperature (Ts) and zinc chloride
concentration in solution (C)
C (mol/l) Ts (C) I002/I101 d (nm) L (nm) L/d
Effect of Ts 0.10 450 7.7 500 1000 2
0.10 490 8.6 200300 700800 2.54
0.10 540 6.0 400600 15002000 24
Effect of 0.05 560 9.0 100300 1500 515
concentration 0.10 560 5.5 400600 20002500 36
0.20 560 1.3 600700 3000 45
Fig. 2. SEM surface views of ZnO layers deposited from zinc chloride aqueous solutions with concentration of 0.1 mol/l onto glass substrates at temperatures (Ts) of (a)
400 C, (b) 450 C, (c) 490 C and (d) 540 C.
M. Krunks et al. / Thin Solid Films 515 (2006) 11571160 1159
Fig. 5. SEM cross-sectional micrograph of the ZnO layer deposited onto ITO-
covered glass at substrate temperature of 560 C using zinc chloride aqueous
solution with concentration of 0.1 mol/l.
Fig. 3. XRD patterns of ZnO layers deposited onto glass substrate at 560 C
from zinc chloride solutions with concentration of (1) 0.05 mol/l, (2) 0.1 mol/l, in the MOCVD process [5]. Both technologies are characterised
and (3) 0.2 mol/l. by the c-axis anisotropic growth of ZnO at higher temperatures.
In the MOCVD process, ZnO gradually evolves from flat to
substrates by microwave activation in aqueous solutions [8]. The pillar and finally to needle-shaped crystals by changing the
film deposited around 540 C consists of rods with diameters of growth temperature in the range of 300600 C [5]. In the spray
400600 nm (Fig. 2d) and lengths of up to 2.0 m. Thus, process, a flat film evolves also into nanocolumns but both, rod
deposition at higher temperatures increases the size of the rods diameter and length on glass substrates increases with the
and leads to lower substrate coverage. The results of the SEM temperature rising.
study are summarised in Table 1.
XRD patterns of flat films and structured layers deposited 3.2. Effect of solution concentration
from the solution with concentration of 0.1 mol/l at tempera-
tures 400560 C, are similar. The X-ray diffractogram of the To study the effect of solution concentration on the
structured layer deposited at 560 C is presented as graph 2 in development of nanorod morphology, the growth temperature
Fig. 3. The strong (002) reflection and weak reflections of the was fixed at 560 C. The Zn2+ concentration of 0.02 mol/l in the
(101) and (102) planes of the wurtzite (PDF 36-1451) can be spray solution leads to the formation of separate crystals with a
detected in the diffractogram. The ratio of the intensities of size about of 200 200 nm2 on a glass substrate. The use of
(002) and (101) reflections (I002/I101) between 5.5 and 8.6 is more concentrated solutions of 0.05 mol/l results in elongated
characteristic of the samples consisting of well-shaped crystals with the diameter of 100300 nm and the length of up
hexagonal columns (Table 1). For a powder sample, the I002/ to 1.5 m (Table 1). Raising the solution concentration from 0.1
I101 is 0.44. Thus, according to XRD, ZnO crystals in the films to 0.2 mol/l, the diameter of the columns increases from 400
are c-axis-oriented. 600 up to 600700 nm and crystals length increases from about
Our results show that the spray pyrolysis technique can be 2 to 3 m (see Fig. 4a and b, respectively).
applied to grow ZnO nanorods at temperatures higher than those SEM study also shows that solution concentration has a
used to deposit ZnO flat films. The mechanism of highly c-axis- significant influence on the shape and alignment of the rods.
oriented ZnO flat film development into mainly c-axis-oriented Almost vertically standing columns can be deposited from
ZnO nanocolumns by increasing the growth temperature is not solutions with concentrations of 0.050.1 mol/l (Fig. 4a). The
yet clear. To some extent, it can be compared to nanorods growth deposition of more concentrated solutions (0.2 mol/l) results in
Fig. 4. SEM micrographs of ZnO layers deposited at substrate temperature of 560 C onto the glass substrates using zinc chloride aqueous solutions with concentration
of (a) 0.1 mol/l, a cross-sectional view; (b) 0.2 mol/l, a plane view.
1160 M. Krunks et al. / Thin Solid Films 515 (2006) 11571160
4. Conclusions