Beruflich Dokumente
Kultur Dokumente
August 2008
8
N/C 1 8 VCC + 1 8 VCC
1
VF1
+ 2 7 VE _ 2 7 V01
VF
8
_ _ 8
3 6 VO 3 6 V02
1
1
V
F2
*6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value
is 5.0mA or less.
Switching Characteristics (TA = -40°C to +85°C, VCC = 5V, IF = 7.5mA unless otherwise specified)
Symbol AC Characteristics Test Conditions Min. Typ.* Max. Unit
TPLH Propagation Delay RL = 350Ω, TA = 25°C 20 45 75 ns
Time to Output HIGH CL = 15pF(4) (Fig. 12) 100
Level
TPHL Propagation Delay TA = 25°C(5) 25 45 75 ns
Time to Output LOW RL = 350Ω, CL = 15pF (Fig. 12) 100
Level
|TPHL–TPLH| Pulse Width Distortion (RL = 350Ω, CL = 15pF (Fig. 12) 3 35 ns
tr Output Rise Time RL = 350Ω, CL = 15pF (6)
(Fig. 12) 50 ns
(10–90%)
tf Output Rise Time RL = 350Ω, CL = 15pF(7) (Fig. 12) 12 ns
(90–10%)
tELH Enable Propagation IF = 7.5mA, VEH = 3.5V, RL = 350Ω, CL = 15pF(8) 20 ns
Delay Time to Output (Fig. 13)
HIGH Level
tEHL Enable Propagation IF = 7.5mA, VEH = 3.5V, RL = 350Ω, CL = 15pF(9) 20 ns
Delay Time to Output (Fig. 13)
LOW Level
|CMH| Common Mode TA = 25°C, |VCM| = 50V 6N137, HCPL2630 10,000 V/µs
Transient Immunity (Peak), IF = 0mA, HCPL2601, HCPL2631 5000 10,000
(at Output HIGH Level) VOH (Min.) = 2.0V,
RL = 350Ω(10) (Fig. 14)
|VCM| = 400V HCPL2611 10,000 15,000 V/µs
|CML| Common Mode RL = 350Ω, IF = 7.5mA, 6N137, HCPL2630 10,000
Transient Immunity VOL (Max.) = 0.8V, HCPL2601, HCPL2631 5000 10,000
(at Output LOW Level) TA = 25°C(11) (Fig. 14)
|VCM| = 400V HCPL2611 10,000 15,000
Notes:
1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package VCC and GND pins of each device.
2. Each channel.
3. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
4. tPLH – Propagation delay is measured from the 3.75mA level on the HIGH to LOW transition of the input current
pulse to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.
5. tPHL – Propagation delay is measured from the 3.75mA level on the LOW to HIGH transition of the input current
pulse to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.
6. tr – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. tf – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. tELH – Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input
voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
9. tEHL – Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input
voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
10. CMH – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the
HIGH state (i.e., VOUT > 2.0V). Measured in volts per microsecond (V/µs).
11. CML – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the
LOW output state (i.e., VOUT < 0.8V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted
together.
Conditions:
IF = 5 mA 30
0.7 VE = 2 V 16
0.5 1
IOL = 16mA
0.4
0.1
0.3
IOL = 6.4mA
0.2 0.01
IOL = 9.6mA
0.1
0.001
0.0
-40 -20 0 20 40 60 80 0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6
TA – AMBIENT TEMPERATURE (°C) VF – FORWARD VOLTAGE (V)
Fig.3 Switching Time vs. Forward Current Fig. 4 Low Level Output Current
vs. Ambient Temperature
120 50
IF = 15mA
100 45
IF = 10mA
RL = 4 kΩ (TPLH)
80 40
IF = 5mA
60 35
RL = 1 kΩ (TPLH)
40 30
Conditions:
VCC = 5 V
VE = 2 V
20 25 VOL = 0.6 V
RL = 1 kΩ
RL = 4 kΩ (TPHL)
RL = 350 Ω (TPLH) RL = 350 kΩ
0 20
5 7 9 11 13 15 -40 -20 0 20 40 60 80
IF – FORWARD CURRENT (mA) TA – AMBIENT TEMPERATURE (°C)
Fig. 5 Input Threshold Current Fig. 6 Output Voltage vs. Input Forward Current
vs. Ambient Temperature
6
IFT – INPUT THRESHOLD CURRENT (mA)
4
Conditions:
VCC = 5.0 V
VO = 0.6 V 5
VO – OUTPUT VOLTAGE (V)
RL = 350Ω
3 4
RL = 350Ω RL = 4kΩ RL = 1kΩ
3
RL = 1kΩ
2 2
RL = 4kΩ
1 0
-40 -20 0 20 40 60 80 0 1 2 3 4 5 6
TA – AMBIENT TEMPERATURE (°C) IF - FORWARD CURRENT (mA)
RL = 4 kΩ RL = 4 kΩ (tr)
500
40
300
200
20
RL = 1 kΩ RL = 1 kΩ (tr)
100
RL = 350Ω (tr)
0 RL = 350Ω
0 RL = 1 kΩ
RL = 4 kΩ (tf)
RL = 350Ω
-60 -40 -20 0 20 40 60 80 100 -60 -40 -20 0 20 40 60 80 100
TA – TEMPERATURE (°C) TA – TEMPERATURE (°C)
Fig. 9 Enable Propagation Delay vs. Temperature Fig. 10 Switching Time vs. Temperature
120 120
TE – ENABLE PROPAGATION DELAY (ns)
RL = 4 kΩ TPLH
TP – PROPAGATION DELAY (ns)
100
100
RL = 4 kΩ (TELH)
80
80
60
60
40
RL = 1 kΩ (TELH) RL = 1 kΩ TPLH
Conditions:
VCC = 5.5 V
VO = 5.5 V
15 VE = 2.0 V
IF = 250 µA
10
0
-60 -40 -20 0 20 40 60 80 100
TA – TEMPERATURE (°C)
Pulse
Generator
tr = 5ns
Z O = 50Ω +5V
IF = 7.5 mA
.1 µf Output
2 7 RL
(VO )
bypass
1.5 V
Input Output
Monitor
3 6 (VO ) 90%
Output
(I F) CL
(VO )
10%
47 4 GND 5
tf tr
Pulse
Generator Input
tr = 5ns Monitor
Z O = 50Ω (V E)
+5V
3.0 V
VCC Input
(VE ) 1.5 V
1 8
t EHL t ELH
7.5 mA
Output
2 7 .1 µf
RL
(VO )
bypass 1.5 V
Output
3 6 (VO )
CL
4 5
GND
VCC
1 8 +5V
IF
A 2 7 .1 µf 350Ω
bypass
B
Output
VFF 3 6 (VO)
4 5
GND
VCM
Pulse Gen
Peak
VCM
0V
5V CM H
Switching Pos. (A), IF = 0
VO
VO (Min)
VO (Max)
0.390 (9.91)
5 6 7 8
0.370 (9.40)
SEATING PLANE
0.070 (1.78)
0.390 (9.91)
0.045 (1.14)
0.370 (9.40)
SEATING PLANE
0.200 (5.08) 0.020 (0.51) MIN
0.140 (3.55) 0.070 (1.78)
0.045 (1.14)
0.154 (3.90) 0.200 (5.08) 0.004 (0.10) MIN
0.120 (3.05) 0.140 (3.55)
0.022 (0.56) 15° MAX
0.016 (0.40)
0.016 (0.41) 0.154 (3.90)
0.008 (0.20)
0.300 (7.62) 0.120 (3.05)
0.100 (2.54) TYP
TYP
0.022 (0.56) 0° to 15°
0.016 (0.41) 0.016 (0.40)
0.008 (0.20)
0.400 (10.16)
0.100 (2.54) TYP
TYP
0.270 (6.86)
0.060 (1.52)
0.250 (6.35)
5 6 7 8 0.100 (2.54)
0.295 (7.49)
0.030 (0.76)
0.415 (10.54)
0.070 (1.78) 0.300 (7.62)
0.045 (1.14) TYP
0.045 (1.14)
0.022 (0.56)
0.016 (0.41)
0.315 (8.00)
0.100 (2.54) MIN
TYP
0.405 (10.30)
Lead Coplanarity : 0.004 (0.10) MAX MAX.
Note:
All dimensions are in inches (millimeters)
Marking Information
2601 2
6
V XX YY T1
3 4 5
Definitions
1 Fairchild logo
2 Device number
3 VDE mark (Note: Only appears on parts ordered with VDE option –
See order entry table)
4 Two digit year code, e.g., ‘03’
5 Two digit work week ranging from ‘01’ to ‘53’
6 Assembly package code
7.5 ± 0.1
13.2 ± 0.2 16.0 ± 0.3
10.30 ± 0.20
Reflow Profile
300
215 C, 10–30 s
250
Temperature (°C)
225 C peak
200
150
50 Ramp up = 3C/sec
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5
Time (Minute)
* EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR
CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE
SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN,
WHICH COVERS THESE PRODUCTS.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are 2. A critical component in any component of a life support, device, or
intended for surgical implant into the body or (b) support or sustain life, system whose failure to perform can be reasonably expected to
and (c) whose failure to perform when properly used in accordance cause the failure of the life support device or system, or to affect its
with instructions for use provided in the labeling, can be reasonably safety or effectiveness.
expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation's Anti-Counterfeiting Policy. Fairchild's Anti-Counterfeiting Policy is also stated on our external website, www.fairchildsemi.com,
under Sales Support.
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufacturers of semiconductor products are experiencing counterfeiting of their parts.
Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed applications,
and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of
counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are
listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have
full traceability, meet Fairchild's quality standards for handling and storage and provide access to Fairchild's full range of up-to-date technical and product information.
Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address any warranty issues that may arise. Fairchild will not provide
any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global problem and encourage our
customers to do their part in stopping this practice by buying direct or from authorized distributors.