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JOURNAL OF RARE EARTHS

Vol. 2 5 , Suppl. , Jun. 2007, p . 64

Ce02-Ti02N O z Anti- Reflecting and UV-Shielding Double-Functional


Films Coated on Glass Substrates Using Sol-Gel Method
Zhao Qingna (&.*I&) * , Dong Yuhong ( 3 3 i $ X ) , Wang Peng (3- @), Zhao Xiujian (&@&)
( kky Laboratory o f Silicate Materials Science and Engineering o f Ministry o f Education, W h n Universityo f Technology ,
Wuhan 430070, China )

Abstract: Ce02-Ti02/Si02double-layered films were coated on glass substrates using sol-gel method. The films, formed
using spin-coating process, had two optical properties at the same time, anti-reflection in visible region and ultraviolet rays
( UV ) shielding. The films could be used as museum windows, commercial high-resolution displays and so on. These films
were composed of Ce02 and Ti02 with molar ratio of 50 to 50 in the first layer and silica matrix in the 2nd layer. Further-
more, the 2nd layer was composed of porous silica films, which showed a lower refractive index, reducing the reflectance
significantly in visible wavelength region. The reflectance of the films in visible region between 400 700 nm was lower -
than 2 % , and almost 100% UV was shielded. The surface roughness of the films was observed through an atomic force
microscope, a depth composition profile of the double layered film was measured with an X-ray photoelectmn spectrometer
(XPS).
Key words : anti-reflection and UV shielding; Ce02-Ti02/Si02 double-layered functional films ; porous silica films ;
sol-gel process; rare earths
CLC number: 0614.33 Document code: A Article ID: 1002 - 0721(2007) - 0064 - 04

The ultraviolet rays (UV) can transmit into room chemical uniformity when many kinds of ions are
through the soda-lime silicate glass (float glass)"'. mixed.
Some materials, e .g . , paper, furniture and plastics, In this study, therefore, sol-gel process was used
irradiated by UV, will be colored and deteriorated. for forming double-layered functional films, Ce02-Ti02
And UV also causes harmful damage to the human UV shielding and silica matrix anti-reflection films.
body and eyes. It is necessary to prevent the interior The structure and properties of the films were investi-
materials from damaging by UV. Along with the
gated, especially, a depth composition profile of the
change to high-resolution display terminals in recent
double layered film was measured with an X-ray pho-
years, the surface treatment of the display has changed
toelectron spectrometer (XPS) . The results were dis-
from anti-glare treatment that lowers the resolution to
cussed.
anti-reflection treatment. The anti-reflection treatment
on displays can prevent operators from getting eye- 1 Experimental
strain. Anti-reflection in visible region or shielding
from UV irradiation can be achieved through coating 1.1 Preparation of coating solutions
films on the glassL2'3 1 .
The films can be deposited using either a sputter- In the 1st layer sol-gel solution, Ti [ 0
ing ( dry type) or by a sol-gel method ( wet type). (CH2 )3CH3 1 4 and CeC13* 7H20 were dispersed in alco-
Ce02-Ti02 films on glass substrates for UV shielding hol ( C . P. ) and water (deionized water) in moderate
had been deposited by radio-frequency magnetron amounts, respectively, and then the obtained two so-
sputtering, using Ce02-TiOz targets with different mo- lutions were mixed with the molar ratio of Ce/Ti = l ,
lar ratio of Ce02 to Ti02[41. The composition of the which were used as the first layer solutions. The 2nd
Ce02-Ti02films is different from that of the target. In layer sol-gel solutions were prepared by acid hydrolysis
general, it has been recognized that the sol-gel coating of silicon alkoxides , namely tetraethoxysilane
formed multi-layered film has the advantage of higher (TEOS) , to obtain the silica oligomer, which were

Received date: 2006 - 10 - 18; revised date: 2007 - 04 - 12


Foundation item: Project supported by the Program for Changiiang Scholars and Innovative Research Team in University (PCSIRT , IRT0.547)
Biography: Zhao Qingnan (1963 - ), Male, Doctor, Professor; Research interest: Processing glass, optical and electronic film materials
* Corresponding author (E-mail : zhaoqingnan @ tom. corn)
Zhuo Q N et a1 . Double-FunctionalFilms Coated on Glass Substrates Using Sol-Gel Method 65

dispersed in water and alcohol in approximately 1% 2.2 Properties of double-layered Ce02-


concentration. In addition, porous silica (mean diam-
TiO,/SiO, anti-reflection and W
-
eter of approximately 20 50 nm) was suspended in
shielding films
alcohol and added into the second silica matrix layer
-
solution in approximately 10% 15% . The thickness of the silica matrix 2nd layer on the
above mentioned 1st layer was approx. 95 nm. The
1.2 Coating procedures reflectance of the double-layered film is demonstrated
The UV shielding and anti-reflection double- in Fig . 3 . It is apparent that the film reflectance was
layered films were formed on the 2 mm thickness float
glass substrates in the following process : ( 1 ) The sub-
strates were cleaned out by water and alcohol. ( 2 )
The substrates were heated to approximately 50 *
5 c . The 1st layer solution was spin-coated at the ro-
tation speed of approximately 120 rev per minite and
dried for approximately 3 min. ( 3 ) In the same meth-
od as the 1st layer, the 2nd layer was spin-coated onto
the previous 1st layer and dried at approximately 120
T for 30 min. (4) Finally, the spin-coated double
layer was heat-treated at approximately 500 c for 30
min in the air to obtain a double-layered UV shielding
and anti-reflection film.
Fig. 1 Typical AFM image of a single CeOz-TiOZ layer spin-
1.3 Characterization coated on glass substrate
The reflectance and transmittance of the double-
layered coating films was measured using a spectrome-
ter (Cary 500). The surface roughness of the films
was observed through an atomic force microscope
(AFM , SPM-9500J3) . A depth composition profile of
the double layered film was measured with an X-ray
photoelectron spectrometer ( XPS, V . G . ESCALAB
MK 11). The film thickness was measured using a
spectrometer (nkd-7000WRev, Cauchy model) .
2 3 4 5 6 7 8 9 1 0 1 1
2 Results and Discussion WavelengtNl 0 nm

2.1 Properties of CeOz-TiOzsingle-layer Fig. 2 Typical UV-vis transmittance curve of glass substrate
(1 ) and single CeOZ-TiOz layer ( 2 ) spin-coated on
coating films glass substrate
In order to optimize the reflectance forming in the
double-layered films, the optical thickness of the 1st
layer was about h 14, where h is the observed wave-
length. According to the refractive index of the UV
c
shielding single-layer composed of CeO2-TiOz, the 1st
layer thicknesses was to be approximately 75 nm .
AFM image showed that the surface roughness for the
1st layer was about rt 4.15/2 nm, which means that
the film surface was extremely homogeneous and po-
rous (Fig. l ) .
Fig. 2 shows the UV-vis transmittance curve of
the single Ce02-Ti02 layer spin-coated on glass sub-
strate (2) and the glass substrate ( 1) . From Fig. 2 , it
can be seen that, compared with the substrate, the
single Ce02-Ti02layer can shield almost 100% UV .
66 JOURNAL OF RARE EARTHS, Vol. 2 5 , Suppl. , Jun 2007 .

lower than that of the non-coated substrate (approx. that of the ordinary pore-free silica film"'.
7.8%) in the visible wavelength region. The rnini- Fig. 6 is the reflectance and transmittance curve
mum values of the reflectance curve for the double- of the double-layered film, in which the 2nd layers
layered films were approximately 1 .0% . with 10% porous silica contents were formed on the
Fig.4 shows the XPS depth analysis of the dou- 1st layer of Ce02-Ti02films by the spin-coat method.
ble-layered film. From Fig. 4 it can be shown that the From Fig. 6( a ) it can be seen that the minimum value
distribution profiles of Ce and Si were overlapped in of the reflectance is lower than 1% , and the shape of
the 1st layer. It was assumed that the Ce ions in the the reflection valley is similar to that of the silica ma-
1st layer were diffused into the 2nd silica layer to form trix with no incorporation of the porous silica content
an inclining refractive index structure by generating (Fig. 3 ) . From Fig. 6 ( b ) it can be seen that the trans-
the mixture layer for optical effect. The reflectance of mittance of the double-layered film in the visible re-
the double-layered film shows an extremely wide re- -
gion of 480 650 nrn is higher than 98%, and almost
flection curve (Fig. 3 ) , which proves the inclining re- 100% UV is shielded. So, the prepared double-
fractive index structure. layered film shows two optical properties at the same
2.3 Effects of porous silica incorporated time, i .e . , anti-reflection in visible region and ultra-
violet rays (UV) shielding.
in 2nd layer film on double-layered
anti-reflection and UV shielding 3 Conclusions
In order to investigate the refractive index of po- 1 . A double-layered anti-reflection in the visible
rous silica particles qualitatively, the refractive indices wavelength region and almost 100% UV shielding
of single layer silica films with different porous silica films was successfully obtained, by sol-gel method to
contents were measured using an ellipsometer as shown spin-coat 1st layer Ce02-Ti02films on glass substrates
in Fig. 5 . It was obvious that the refractive indices de- using Ti[O( CH2)3CH3]4and CeC13* 7 H 2 0with molar
creased with an increase of the porous silica content ratio of Ce/Ti = 1 , and the 2nd layer silica matrix film
incorporated into the silica matrix films. This is be- coated on the 1st layer.
cause the refractive index of porous silica is lower than
Silica 2nd layer CeO,-TiO, layer Substrate

0 20 25 30 35 40 45 50 55 60
Sputtering timehin Concentration of porous silica/(%, mass fraction)
Fig. 4 Typical depth composition profiles of double-layered film Fig. 5 Refractive index of silica matrix vs concentration of porous
composed of CeO,-Ti@ 1st layer and silica matrix 2nd layer silica incorporated into the silica matrix films

"1 i
01 J ' 1 I I
400 500 600 700 800 300 400 500 600 700 800
Wavelengthhm Transmittance/%
Fig.6 Reflectance ( a ) and transmittance (b) of double-layered films, the silica matrix 2nd layer containing 10% porous silica
Zhuo Q N et a1 . Double-Functional Films Coated on GIass Substrates Using Sol-Gel Method 67

2. There was inter-diffusion between the two als, 1983. 654.


films, forming a microstructure of a mixture layer, [2] Tang Jinfa, Zheng Quan. Application of Optical thin
Films [ M ] . Shanghai China, Shanghai Publishing House
which might result in refractive indices distributing in
of Science and Technology, 1984. 115.
an inclining structure. 31 Takeshi Morimoto, Hiroyuki Tomonaga, Akemi Mitani .
3. An extremely low reflection curve (reflectance Ultraviolet ray absorbing coatings on glass for automobiles
< 2%) of the double-layered films were obtained by [ J ] . Thin. Solid. Films., 1999, 351: 61.
incorporating porous silica to the 2nd silica matrix 41 Zhao Qingnan, Ni Jiamiao, Zhang Naizhi, Zhao Xiujian,
layer, because porous silica had a lower refractive in- et a1 . Structure and properties of Ti02-Ce02films depos-
dex . ited on soda-lime glass substrates by R .F Magnetron sput-
tering [J]. 1. Rare Earths, 2004, 22: 151.
References : [ 51 Stober W , Fink A , Bohn E . Controlled growth of mono-
.
disperse silica spheres in the micro size range [J] 1Col-
[ 1] Jiang Guodong et a l . Handbook of Glass [ M 1 . Beijing: loid Interface Sci . , 1968, 26: 62.
P .R .China, China Publishing House of Building Materi-

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