Beruflich Dokumente
Kultur Dokumente
1972
CONFIRMED
OCTOBER 1982
Methods
Assessing the
performance
characteristics of
ultrasonic flaw
detection equipment
Part 2: Electrical performance
BS 4331-2:1972
Co-operating organizations
Contents
Page
Co-operating organizations Inside front cover
Foreword ii
1 Scope 1
2 Definitions 1
3 General 1
4 Transmitter pulses 1
5 Amplifier 2
6 Time base 3
7 Gates 3
8 Variations in power supply 4
Appendix A Test equipment 6
Appendix B Description of bi-polar gate 6
Appendix C Measurement of amplifier frequency response 7
Figure 1 Test arrangement for flaw detector amplifier tests 5
Figure 2 Circuit diagram for bi-polar gate 6
Figure 3 CRT diagrams Amplifier frequency response 8
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BS 4331-2:1972
Foreword
Summary of pages
This document comprises a front cover, an inside front cover, pages i and ii,
pages 1 to 8 and a back cover.
This standard has been updated (see copyright date) and may have had
amendments incorporated. This will be indicated in the amendment table on
the inside front cover.
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BS 4331-2:1972
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5.3.4 Equivalent input noise. For this check, the NOTE During the checks described in 5.3.2 and 5.3.3 an
signal generator frequency is reset to the peak of the approximate assessment of flaw detector attenuator accuracy
may be obtained by comparing its readings with the actual
amplifier response curve, and with the ultrasonic changes in attenuation.
instrument at maximum usable sensitivity
(see 5.3.1), the input amplitude is reduced until the 6 Time base
resulting deflection on the cathode ray tube is barely
discernible above the noise. The peak-to-peak 6.1 Linearity
amplitude at the amplifier input which produces 6.1.1 For checking the linearity of the time base, the
this result shall be recorded. This may be obtained testing arrangement described in 5.1 may be used
either by direct measurement or approximately by provided that the pulse generator has a double
correcting the signal generator amplitude for the delayed pulse output, this facility being used to
loss in the connecting chain to the amplifier input, check linearity by sweeping the double pulse
neglecting the amplifier input impedance. through the time base range. As an alternative, the
5.3.5 Threshold level. For this check, the deflection procedure described in Section 4 of BS 4331-1, may
versus input voltage curves obtained in 5.3.2 are be used.
extrapolated to zero deflection and the values of the 6.1.2 When the first method is used, the frequency
input voltage at these points are recorded. The of the signal generator is set to mid-band, the width
ratios of these input voltages to the input voltage of the individual pulse being not more than 1/20 of
levels required to produce 50 % maximum deflection full range and the space in between pulses being not
under the same amplifier conditions are then more than 1/20 full range. The distance between
regarded as threshold level at full gain, mid-gain leading edges of the two pulses shall be measured at
and minimum gain. It should be noted that at the beginning, middle and end of the range, this
maximum usable sensitivity, the value may be check being carried out on each time base range.
affected by input noise. 6.1.3 Regardless of the procedure selected, the
5.3.6 Dead period after transmitter pulse. The same following additional checks shall also be made.
test equipment as illustrated in Figure 1 is used for 6.2 Fluctuation with supply voltage. The
this check except that the synchronizing pulse to the linearity shall be checked at the extremes of supply
pulse generator is disconnected and the instrument voltage ranges specified by the equipment
under test is switched to single probe working. The manufacturer. If the instrument is also
pulse generator repetition rate is adjusted to battery-operated, this check should be repeated at
approximately ten times that of the flaw detector the specified upper and lower limits of battery
and the signal generator frequency is set to voltage.
mid-band. The signal amplitude on the flaw detector
6.3 Drift (ambient). The linearity shall be checked
is then adjusted to give 50 % full scale height at an under continuous operating conditions over an
intermediate depth range. The dead period after the eight-hour period, due account being taken of
transmitter pulse can be expressed as a depth (at a reduction in battery voltage over that period
quoted material velocity) through which the
(see 6.2), when the instrument is battery-operated.
amplitude rises to 70 % of the final amplitude, or
The ambient conditions, e.g. temperature and
rises to 35 % full scale height. The check shall be
humidity, should be recorded.
carried out at approximately 20 %, 50 % and 80 % of
the maximum usable instrument sensitivity. 7 Gates
5.3.7 Swept gain. This may be regarded as an
optional check to be carried out where swept gain is 7.1 General. The range of the gate width and delay
provided. The same test rig and the same conditions controls can be measured by using the test
as described in 5.3.6 may be used. The signal equipment illustrated in Figure 1.
amplitude of the flaw detector is adjusted to 50 % 7.2 Gate delay range. The signal generator is set
full scale height with the swept gain switched off to the middle of the receiver frequency range
and with the instrument sensitivity set to 50 % of (as measured) in use and the attenuators adjusted
the maximum usable. The swept gain is then to give a signal on the display of 50 % full scale
switched on and its control set to maximum. height. The gate delay shall be set to minimum and
If the commencement of the swept gain is variable, the pulse generator adjusted to align the displayed
it should be adjusted to start at the beginning of the pulse with the leading edge of the gate. The delay
test range. The signal amplitude is measured at the time for these conditions is noted. The
start of the test range and at 20 %, 50 % and 100 % measurements are then repeated with the gate
of the range, the values obtained being expressed in delay set to maximum. The time range for the gate
dB. The test range and velocity used shall be delay is obtained from the two delay times from the
recorded. pulse generator.
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7.3 Gate width. To determine the gate width 8 Variations in power supply
range, the signal generator shall be set as in 7.2.
8.1 Mains and battery. As variations in power
The gate width is then adjusted to minimum and the
supply voltage may have a deleterious effect on the
pulse generator delay adjusted to align the
performance of the flaw detection instrument, the
displayed pulse firstly with the leading edge and
secondly with the trailing edge of the gate pulse. effects of such variations shall be determined by
The difference between these two times gives the repeating the checks described in 4.8, 5.3.1
and 6.1.1 at the specified upper and lower limits of
gate pulse time. The procedure is repeated with the
mains supply and/or battery voltage.
gate width set to maximum. The range of gate width
times may then be calculated. 8.2 Voltage (current) cut-out. It shall be verified
that the cut-out operates within the specified value
7.4 Presentation of gating time. If the gate
position is indicated by a pedestal, the height of this by reducing the supply voltage to the instrument.
pedestal shall be measured as a percentage of full
scale height. The rise and fall times of the pedestal
shall also be measured on the shortest depth range
using the fastest material velocity available, this
measurement being expressed in micro-seconds.
7.5 Trigger sensitivity. For this check, the gate
width is set to mid-position and the displayed signal
adjusted to the centre of the gate. The amplitude of
this signal shall then be reduced until the flaw
alarm just operates, and this amplitude recorded. It
shall be verified that this signal just operates the
flaw alarm at both the beginning and at the end of
the gating time. To check the minimum width of
pulse necessary to operate the alarm, the displayed
pulse is returned to the centre of the gate time and
the width of pulse reduced until the alarm just
ceases to operate. As this test may be related to
pulse repetition frequency, the frequency used shall
be recorded.
NOTE When the signal in the gate is used to operate external
equipment, e.g. recording or monitoring devices, it is desirable
that the characteristics of the gate outputs should be quoted.
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Figure 1 Test arrangement for flaw detector amplifier tests
5
BS 4331-2:1972
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Figure 3a
Figure 3b
Figure 3c
Figure 3d
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BS 4331-2:
1972
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