Beruflich Dokumente
Kultur Dokumente
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For referenced ASTM standards, visit the ASTM website, www.astm.org, or
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This practice is under the jurisdiction of ASTM Committee E06 on Perfor- contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
mance of Buildings and is the direct responsibility of Subcommittee E06.23 on Lead Standards volume information, refer to the standard’s Document Summary page on
Hazards Associated with Buildings. the ASTM website.
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Current edition approved March 1, 2016. Published April 2016. Originally The last approved version of this historical standard is referenced on
published as PS 95-98. Last previous edition approved in 2000 as E2119-00 which www.astm.org.
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was withdrawn January 2009 and reinstated in March 2016. DOI: 10.1520/E2119- Available from U.S. Department of Housing and Urban Development, 451 7th
16. Street, SW, Washington, DC 20410, http://www.hud.gov.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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3.2.2 calibration check, n—a procedure that generates a QC 3.2.14 power-down, n—an event where the power to the
measurement using a calibration test sample with one type of XRF instrument is turned off. The XRF instrument can not
control block (usually wood). collect and display any XRF measurements after a power-
down.
3.2.3 calibration mode, n—a selected operating mode that
permits adjustment of an instrument’s calibration. 3.2.15 power-on, n—an event where the power to the XRF
instrument from the battery is turned on. The XRF instrument
3.2.4 calibration test sample, n—a test film sample of a can collect and display any XRF measurements after a power-
known lead level in mg/cm2, which must have a reported on.
uncertainty of the lead level. Calibration test samples may be
separate from a substrate or adhered to a substrate. All 3.2.16 probe, n—a hand-held device containing a radioac-
calibration test samples shall be traceable to the National tive source, x-ray detector and associated mechanical and
Institute of Standards and Technology (NIST) standard refer- electronic components that is placed against a test location or
ence materials or other national or international standard calibration test sample to obtain an XRF measurement.
reference materials and have a known specified uncertainty in 3.2.17 radioactive source, n—a radioactive material (for
the known lead level. example, 57Co or 109Cd) that emits X rays or gamma rays that
cause ionization of atoms in the sample, and subsequently a
3.2.5 continuing calibration check, n—a calibration check
cascade of higher energy electrons into the vacated lower
performed during the testing day after the initial calibration
energy shells. As these electrons fall into the lower energy
check. A continuing calibration check also can serve as a final
orbitals, X rays characteristic of the atomic species, such as
calibration check.
lead, are emitted from the test location.
3.2.6 control block, n—a small block of material of an 3.2.18 read time—a period of X ray data collection time. It
identifiable substrate type used to simulate a building material may be controlled manually or automatically depending on the
during QC measurements. XRF instrument model. It begins with the opening of the XRF
3.2.7 display unit, n—an electronic device that presents the instrument shutter to expose the paint film surface to source
results of an XRF measurement to the user. Other parameters gamma rays and X rays and ends when the source shutter is
such as total measurement time also may be presented. closed and the XRF reading is complete.
3.2.8 final calibration check, n—the last calibration check 3.2.19 sampling site—a local geographical area that con-
performed in a testing period. tains at least one unit being tested. A sampling site generally is
limited to an area that is easily covered by walking.
3.2.9 inconclusive lead classification result, n—a lead clas-
sification result that reliably cannot be expressed, for example, 3.2.20 substrate, n—the building material that lies under the
reported, as either containing lead (positive) or not containing coating.
lead (negative) at or above an appropriate local, state, or 3.2.21 substrate bias check (SBC), n—a procedure that
federal action level for lead in coatings. Such results com- generates a QC measurement using a calibration test sample
monly are referred to and reported as “inconclusive” results, and a control block to determine the effect of that substrate on
for example, the XRF measurement that cannot determine the XRF measurement.
whether lead is or is not present at or above an appropriate 3.2.22 substrate-corrected XRF measurements—a proce-
local, state, or federal action level for lead in coatings. dure that corrects an XRF measurement for substrate effects
3.2.10 initial calibration check, n—the first calibration (see the HUD Guidelines for more information on substrate
check of the testing period performed after the XRF instrument corrections).
has been turned on and allowed to warm up. 3.2.23 substrate type, n—the type of building material that
3.2.11 lead classification result, n—an XRF measurement lies under the coating. Examples include wood, plaster, gyp-
expressed, for example, as either positive-for-lead, or negative- sum wallboard, metal, brick, and concrete.
for-lead, at or above and appropriate local, state, or federal 3.2.24 test location, n—an area on a building component
action level for lead in coatings. A negative-for-lead result does where a lead measurement value is obtained.
not mean there is no lead present. For some makes and models 3.2.25 testing period, n—a block of time that defines the
of XRF instruments, lead measurement values obtained near an continuous power-on operation of an XRF instrument. Any
appropriate local, state or federal action level for lead in power-down of an XRF instrument terminates the testing
coatings may generate inconclusive lead classification results. period.
3.2.12 nominal read time, n—a read time that results when 3.2.26 unit, n—all or a portion of a structure or facility that
the radioactive source normally provided by the manufacturer is the target of an investigation. Test locations are considered to
for that XRF instrument is at its original source strength. be within a unit. An example of a unit is a single family
3.2.13 operating mode, n—one or more settings that define dwelling including a detached garage that is part of the
the operating parameters of an XRF instrument. Some XRF property.
instruments have multiple settings for use under different 3.2.27 x-ray detector, n—a device that results in an elec-
testing situations, for example, substrates, time or testing tronic signal as a result of the interception of an x-ray.
objectives. Examples include gas proportional counters, for example, Xe,
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solid scintillation counters, for example, CsI, and semiconduc- rays and gamma rays. These instruments are intended for use
tor devices of elemental composition, for example, Si or Ge, or only by qualified, trained personnel.
compound composition, for example, HgI2, CdTe, or CdZnTe. 5.6 The use of field-portable XRF instruments for measure-
3.2.28 XRF instrument, n—a field-portable XRF device or ment of lead may not accurately reveal low but still potentially
analyzer with associated equipment designed and manufac- hazardous levels of lead.
tured for use in measuring lead in paint or other coating films.
XRF instruments, at minimum, include an excitation source, 6. Materials and Equipment
such as a radioactive source, x-ray detector, probe, and a 6.1 (Field-Portable) XRF Instrument—One of a variety of
display unit. the commercially available field-portable XRF instruments
3.2.29 XRF measurement, n—a procedure used to determine designed for use in measuring lead in paint and other coatings.
the lead content of a coating at a test location using an XRF 6.2 Calibration Check Samples—Calibration test samples
instrument, or a lead result, expressed as mg of lead per cm2 of that are used to verify XRF instrument calibration.
surface, that is, mg/cm2, obtained from a coating at a test
location using an XRF instrument. An XRF measurement may 6.3 Control Blocks—A set of substrate materials for use in
be one reading or the average of one or more XRF readings. making QC measurements as defined in Table 1.
3.2.30 XRF reading, n—a response, expressed as mg of 6.4 Substrate Support—A support material used to hold
lead/cm2 of surface, that is, mg/cm2, of an XRF instrument for calibration check samples and control blocks away from any
one read time. additional underlying material in a manner that will not
interfere with the lead measurements on calibration check
4. Summary of Practice samples. The support material shall not itself have potentially
interfering leaded paint or other material within or on it and
4.1 This practice covers the quality assurance (QA), quality shall be one of the following:
control (QC), and recording procedures to follow when using 6.4.1 A polystyrene foam block with minimum thickness of
field-portable energy-dispersive x-ray fluorescence spectrom- 25 cm,
etry devices (XRFs) to collect measurements of lead in paint or 6.4.2 A table constructed from an empty cardboard box with
lead in other coating films for the purposes of generating lead minimum height of 25 cm, or
classification results. This practice includes start-up 6.4.3 Any physical arrangement that holds the calibration
procedures, beginning-of-day calibration check QC check sample so that at least 25 cm of free air space or foam
procedures, during-the-test-day QC check procedures, and material exists between the XRF instrument-sample-substrate
end-of-day QC check procedures designed to complement arrangement and any nearby physical objects.
standard operating procedures written by manufacturers for
specific models of field-portable XRF instruments. 7. Procedure
7.1 Conduct XRF measurements on test locations in accor-
5. Significance and Use dance with manufacturer protocols (see Note 1). In addition,
5.1 This practice provides procedures to generate and docu- XRF measurements shall adhere to the items presented in
ment QC data for ensuring that an XRF is operating within 7.2-7.4.3.
acceptable tolerances throughout the testing period when being
NOTE 1—Exercise care to avoid performing XRF measurements on
used to collect lead results during a lead-based pain (LBP) surfaces, which may generate inaccurate results even under conditions
inspection for the purposes of generating lead classification where all measurements are performed within the QC and QA specifica-
results. tions described in this practice. Surfaces that may generate inaccurate
results include:
5.2 This practice is intended to supplement XRF instrument
manufacturer protocols and Performance Characteristic Sheets
TABLE 1 Specifications for Control BlocksA
(PCSs)4 through the use of QA and QC procedures to provide
Control Block Substrate Substrate Materials Minimum Thickness of
uniform lead testing practices among the wide variety of Material Represented by Control Control BlockB
available field-portable XRF instruments. Block
Wood, clear pine All wood and wallboard 17 mm
5.3 While the QC results collected using this practice can materials
provide assurances that an XRF instrument is operating within
acceptable tolerances, this practice does not determine an Steel (316 stainless)C All metal materials 6 mm
actual level of confidence for a classification result obtained Brick All plaster, poured concrete, 50 mm
from an XRF measurement. pressed concrete, and brick
materials
5.4 This practice does not address selection of test locations A
Other materials can be used to supplement this list. However, it is the
or representative sampling for leaded paint. Additional infor- responsibility of the user to properly characterize other control block materials.
mation on conducting measurements of lead in leaded paint or B
All control blocks are to have minimum length and width dimensions of 60 mm by
60 mm.
other coatings may be found in the HUD Guidelines, Chapter C
This grade of steel has been selected because it is readily available and
7. impervious to rusting. Although this steel is not representative of the types of
painted or coated metals commonly found in buildings and related structures, it will
5.5 This practice involves the use of field-portable XRF serve to provide a satisfactory surrogate for quality control measurements.
instruments that may contain radioactive materials that emit X
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(1) Extremely rough, curved or highly ornate surfaces. In 7.4 Quality Control (QC) Checks—Perform QC checks as
general, field-portable XRF instruments are designed to per- specified below:
form XRF measurements on flat surfaces. Any surface condi- 7.4.1 QC Calibration Checks—Perform calibration checks
tion that does not permit the XRF probe to come into complete as specified in Table 2 for each operating mode used during the
contact with the surface may generate inaccurate results. testing period (see Note 2). If more than one operating mode is
(2) Substrates that have leaded coatings on the side oppo- used during a testing period, then replicate QC calibration
site from the surface being measured. The extent of the effect checks, as specified in Table 2, for each of the different
on an XRF measurement depends on the instrument model, the calibration modes using a control block substrate type that is
substrate type and thickness, and the lead content of the film on appropriate for the operating mode are required.
the opposite side. An example would be a recessed portion of
a thin panel door where one side contains a leaded coating NOTE 2—Depending on the make and model of the XRF instrument,
different operating modes may be specified by the manufacturer for
while the other side does not. In this example, measurements different substrate types. For example, different modes may exist for
on the side without the leaded coating side may be biased high wood, metal, and other nonwood or non-metal substrate types.
because of read-through from the lead in the coating on the
opposite side. 7.4.1.1 If the error tolerance specifications in Table 2 are not
(3) Surfaces that are likely to have objects that may met for any of the QC calibration checks, the XRF instrument
interfere with the XRF measurement, such as pipes or electrical is out-of-specification and shall not be used for further testing
wires, lying immediately under the test location. until it is serviced and able to meet the specifications in Table
2 (see Note 3). If the error tolerance specifications in Table 2
7.2 Warm-Up of XRF Instruments—All XRF instruments are met for all of the QC calibration checks, the XRF
shall be allowed to warm up prior to making any XRF instrument is within specification. All XRF measurements at
measurements. In absence of specific instructions from the test locations shall be made between an initial and a final
manufacturer, expend a minimum of 5 min between the time an continuing calibration check with an XRF instrument that is
XRF instrument is turned on to the time that XRF instrument within specifications. XRF measurements taken with an XRF
is used to perform XRF measurements. instrument, that is out-of-specification are considered invalid.
7.3 Identification of Test Locations—Each XRF measure- For XRF instruments found to be out-of-specification, the
ment shall be uniquely identified and recorded. Identification following actions shall be performed:
shall be such that a given XRF measurement can be uniquely (a) The out-of-specification XRF instrument shall not be
associated with only one test location or control block mea- used until the problem is identified and solved and the
surement. If a measurement is the average of more than one instrument meets specifications in Table 2.
XRF reading, each XRF reading included in the average shall (b) Invalid XRF measurements shall be considered
be uniquely identified and recorded. See Section 8 on record unreliable, and shall not be reported. Make entries in the field
keeping. records indicating which XRF measurements are invalid.
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(c) The XRF instrument found to be out-of-specification tion checks and SBCs should not be used for these substrate
shall be serviced according to the manufacturer’s directions corrections. Substrate corrections for substrate corrected XRF
and must successfully meet the manufacturer’s QC specifica- measurements require the use of substrates that are more
tions and the QC specifications herein before the instrument representative of the substrates being tested in the unit than
can be returned to service. those used for making calibration checks and SBCs (refer to
NOTE 3—Allowable tolerance specifications should be available from the HUD Guidelines for more information on substrate correc-
the manufacturer upon request. tions).
7.4.2 QC Substrate Bias Check (SBC)—Perform calibration
checks as specified in Table 3. SBC measurements are required 8. Record Keeping
on all of the control blocks shown in Table 1 even if the 8.1 General Record Keeping—All field data related to
substrate material represented by that control block is not collection of XRF measurements during the testing period must
tested during the testing period. be documented. This documentation can take the form of either
7.4.2.1 If the error tolerance specifications in Table 3 are not manual data recording, electronic data recording, or a combi-
met for any of the substrate types, then the XRF instrument is nation of manual and electronic data recording. These general
out-of-specification and shall not be used for further testing record keeping procedures are important to document properly
until it is serviced and able to meet the specifications in Table and trace field data.
3 (see Note 3). If the error tolerance specifications in Table 3
are met for all the substrate types, then the XRF instrument is 8.1.1 Requirements for Manual Record Keeping—Manual
within specification. All XRF measurements at test locations record keeping shall be performed within a bound record
shall be made between an initial and a final SBC with an XRF keeping book, such as a bound set of data forms or bound field
instrument that is within specification. XRF measurements notebook and each bound record keeping book shall be used as
taken with an XRF instrument that is out-of-specification are follows:
considered invalid. For XRF instruments found to be out-of- 8.1.1.1 Each bound record keeping book shall be uniquely
specification, the following actions shall be performed: identified.
(a) The out-of-specification XRF instrument shall not be 8.1.1.2 Each page within the bound record keeping book
used until the problem is identified and solved and the shall be uniquely identified using page numbers.
instrument meets specifications in Table 3. 8.1.1.3 All manual record keeping entries shall be made
(b) Invalid XRF measurements shall be considered using indelible ink.
unreliable, and not be reported. Make entries in the field
8.1.1.4 Each page shall have a signature and date of entry.
records indicating which XRF measurements are invalid.
(c) The XRF instrument found to be out-of-specification 8.1.1.5 Any entry errors must be corrected by using only a
shall be serviced according to the manufacturer’s directions single line through the incorrect entry (no scratch outs)
and must successfully meet the manufacturer’s QC specifica- accompanied by the initials of the person making the correction
tions and the QC specifications herein before the instrument and the date of correction.
can be returned to service. 8.1.2 Requirements for Electronic Record Keeping—
7.4.3 For XRF instruments that require substrate corrected Electronic record keeping, if used for data recording, shall
XRF measurements, the control blocks used to make calibra- meet the following minimum requirements:
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8.1.2.1 All of the records electronically recorded during the within the unit and where within that component the measure-
testing period shall be printed in hard copy form and included ment is taken. This description shall be sufficient to distinguish
as recording keeping documentation. between like building components that may have different
8.1.2.2 Each electronically recorded XRF measurement painting histories present within the same room. An example is
shall include, within the electronically captured record, a an interior window sill on wall B (west wall) in the dining
unique identification number, a component identifier, and a room.
location identifier that meets all the requirements listed under 8.3.3 Substrate types, if known.
8.3. 8.3.4 All XRF measurement values with units of measure,
8.2 Specific Record Keeping for Each Unit—At a minimum, for example, mg/cm2. If an XRF measurement is the average of
the following information must be documented for each unit more than one XRF reading, each XRF reading value included
tested: in the average shall also be recorded.
8.2.1 Project or client name, or both, address and city/state 8.3.5 For each XRF measurement value, determine and
location, record a lead classification result with respect to appropriate
8.2.2 General sampling site description and unit designa- local, state or federal action levels for lead in leaded paint or
tion. other coatings (see Note 5). Lead classification results shall be
8.2.3 XRF instrument manufacturer, model number, probe determined as per guidance provided in the performance
serial number, radiation source type, radiation source age, or characteristic sheets (PCSs) referenced from Chapter 7 of the
date of manufacture, and if appropriate, display unit serial HUD Guidelines or other appropriate guidance from the
number and software version number. manufacturer of the XRF instrument used to collect the XRF
8.2.4 Name of person operating the XRF instrument, a measurements.
contact address for this person, and a telephone number where NOTE 5—If an inconclusive lead classification result is generated from
this person can be reached. an XRF measurement, one of two options is suggested as a means to
8.2.5 A statement describing the testing protocols used to generate more definitive lead classification result; collect a paint sample at
collect the data. the test location where the XRF measurement was taken using Practice
E1729 and submit for laboratory confirmation analysis by Test Method
8.2.6 The local, state, or federal action level for lead in E1613, using Practice E1645 and Practice E1583, or equivalent standards;
coatings that is used to convert XRF measurements into lead or, assume the result is classified as positive-for-lead.
classification results. 8.3.6 Date and approximate clock time of the XRF mea-
8.2.7 The listing of all laboratory confirmatory samples surements.
collected in the unit. 8.3.7 Any relevant notes regarding the testing at a testing
8.2.8 A listing of error tolerances used to assess the XRF location such as nominal read time or the operating mode (see
measurement values obtained from calibration checks, SBC, Note 4), or both.
and checks recommended by the manufacturer of the XRF
instrument. 8.4 Specific Record Keeping for Quality Control
8.2.9 A list of defined technical terms (glossary) used to Checks—At a minimum, the following information must be
report the results. At a minimum, the glossary shall contain documented for each calibration check, SBC, and checks
definitions for building component names and codes, such as recommended by the manufacturer of the XRF instrument:
wall orientation codes, used in reporting lead measurement 8.4.1 A unique identifier for each XRF measurement;
results. 8.4.2 A description of each control block and substrate
8.2.10 Any relevant notes regarding the testing in a unit support.
including, but not limited to, the nominal read time or the 8.4.3 A description of each calibration check test sample.
operating mode utilized during testing (see Note 4), miscella- 8.4.4 All XRF measurements with units of measure, for
neous diagrams, photos or videos. example, mg/cm2. If an XRF measurement is the average of
more than one XRF reading, each XRF reading value included
NOTE 4—Read time and operating mode may be general for a unit or
vary among test locations. Describe fully operational or testing problems in the average shall be recorded.
or unusual occurrences. 8.4.5 Date and approximate clock time of the XRF readings
8.3 Specific Record Keeping for XRF Measurements at Each and measurements.
Test Location—At a minimum, the following information must 8.4.6 Any relevant notes regarding the testing including, but
be documented for XRF measurements collected at each test not limited to, the nominal read time or the operating mode
location within a unit. utilized during testing.
8.3.1 A unique sample identifier.
8.3.2 Descriptive information on the location of the XRF 9. Keywords
measurement. At a minimum, the location description shall be 9.1 analysis; building; coatings; field testing; lead; paint;
sufficient to determine which building component was tested testing; XRF
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