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Designing Electronic
Systems For ESD Immunity
Here’s A Comprehensive Checklist To Ensure That Your
System Is Properly Protected

his article describes over 140 ● Metal enclosures and shielding.

T different ways to make your


electronic equipment and
electronic products immune to
● Grounding and bonding.
● Power distribution, bypassing and
decoupling.
John R. Barnes
dBi Corporation
electrostatic discharge (ESD). Many of 4. Choose switches and controls with
these techniques can also improve your ● PCB design and mounting.
plastic shafts, or put plastic knobs
system’s electromagnetic compatibility ● Cable design and routing. (without metal setscrews) on metal
(EMC), electromagnetic interference ● Filters and transient suppressors. shafts.
(EMI), and overall robustness. ● Robust components. 5. Cover LEDs and indicators with
● Robust circuit design. insulating overlays, tape, caps or
An ESD arc is an intense noise source
● Watchdog timers. lightpipes.
with significant energy from 1MHz to
500MHz. This energy penetrates your ● Software. 6. Keep traces on membrane keyboards
system by every means possible, ● ESD testing to find and fix weak >=12mm inside the border, seal the
coupling into cables and printed circuit spots. circuitry layers, or add a plastic
boards (PCBs), and may cause system bezel.
upsets, lock-ups or unwanted resets, as Plastic Enclosures, Air Space And 7. Keep traces on tactile rubber
well as lost data and risk of permanent Insulation keypads in tight, and extend the
damage. Plastic enclosures, air space, and rubber top layer.
insulation prevent ESD arcs to a system 8. Round corners and edges on
The key to effective immunity against (direct ESD): heatsinks and metal parts that are
ESD is to begin early in development, close to ventilating/mounting holes
following conservative design practices 1. For >=20kV breakdown voltage, and seams.
and providing “wiggle room” in areas keep >=20mm air-path length
where you may need to tweak your between electronics and: Metal Enclosures And Shielding
design. ESD testing throughout
- Any points that users can touch- Metal enclosures and shielding
development can also help you to find
including ventilating/mounting intercept ESD arcs and their electric,
and fix weak spots as you go.
holes and seams. magnetic and electromagnetic fields,
Specifically, we defend against ESD by - Any ungrounded metal parts that also protecting your system from
reducing the coupling into your system, users can touch- including external arcs (indirect ESD):
and by making the system immune to controls, indicators, and fasteners.
transients through use of any or all of 2. Recess PCBs and cables in the 9. Provide for >=20kV breakdown
the following methods: enclosure, or use tongue-in-groove voltage between ungrounded
or shiplap seams. enclosures and electronics, and
● Plastic enclosures, air space and >=1.5kV breakdown voltage
3. Cover unused connectors.
insulation. (>=2.2mm air-path length) between

18 CONFORMITY ®: FEBRUARY 2003


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grounded enclosures/shields and - EMFs within 0.75V (0.25V for 18. For grounded equipment, connect
electronics. salt-spray environments) for shields to chassis ground at the
10. Design plastic enclosures to surfaces that will be in contact connector entry point.
accommodate shields made of: - Surface area of anodic part(s) 19. For ungrounded equipment, connect
- Sheet metal larger than cathodic part(s) shields to circuit common near
- Mylar/copper or Mylar/aluminum 13. Overlap seams in shields by >=5 switches and controls.
laminate times the gap. 20. Put a secondary shield parallel and
- Thermoformed metal mesh, 14. Bond seams in shields at least every close to susceptible electronics,
metallized fiber mat, or metallized 20mm (0.8”) with welds, dimples, connected to chassis
fabric fasteners, fingerstock, or conductive ground/circuit common at the cable
gaskets. connection point.
- Silver, copper or nickel paint
- Electroless plating 15. Don’t nick, crack, or thin shields- 21. Put cable entry points near the
make gentle bends and rounded center of conductive panels.
- Zinc arc spray
corners. 22. Use alodine, iridite or chromate
- Vacuum metallization
16. Make holes <=20mm (0.8”) coatings on aluminum, and
- Highly-conductive fillers in the conductive chromate coatings on
plastic (require special inserts to diameter and slots <=20mm (0.8”)
long; space openings apart by steel.
make contact)
their largest dimension; use many 23. Mask or scrape off anodizing and
11. Aim for <=1 ohm/square resistance, small openings instead of one/a few paint from seams, joints and
using low resistivity metals (see big ones. connectors.
Table 1).
17. If a control/indicator requires a 24. Don’t depend on hinges or screws
12. Choose compatible materials for larger opening, put a secondary for bonding. Force clean metal
shields, fasteners, and gaskets to shield between it and the surfaces into direct contact.
minimize corrosion (see Table 1): electronics.
25. Put a ground plane next to a double-

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20 CONFORMITY : FEBRUARY 2003
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sided card, connected to ground on - Direct metal-to-metal contact and preferably >= 1/3 the length.
the card at close intervals. between clean surfaces, held 36. Make gaskets >=5mm wide.
26. Bond displays with a shielding tightly together.
37. Bring chassis ground to within
coating to the enclosure, around the - Direct contact between metal
40mm (1.6”) of each cable entry
entire periphery. surfaces with thin conductive
point.
coatings, held tightly together.
Grounding And Bonding - Dimples or outside-star washers 38. Connect chassis ground to metal
(to pierce paint/grease/insulating pieces of the enclosure, connector
Current from an ESD arc follows every housings, switch housings, and
available conductive path from the films) compressed between the
metal surfaces. control shafts (via grounding fingers
point of contact. Bonding minimizes or conductive bushings).
the voltage drops along these current 30. Protect bonds from moisture.
paths, while grounding drains off the 39. Connect the grounds on all the
31. Put multiple bonding straps or boards inside an enclosure with
charge: jumpers across hinges. multiple conductors.
27. Keep the ESD current density and 32. Position bonding straps or jumpers 40. Connect chassis ground to circuit
the current-path impedances as low away from PCBs and cables. common with a ferrite bead.
as possible by using multipoint 33. Use solid bonding straps >=5mm 41. Encircle a membrane
grounds where you want the current wide where possible, braided keyboard/rubber keypad with a wide
to flow, and single-point grounds bonding straps and stranded chassis-ground guard ring,
where you don’t. bonding jumpers where you must. connected to the metal enclosure all
28. Weld, braze, sweat or swage metal 34. Choose compatible materials for around the periphery, or at least at
parts that don’t need to come apart. bonding straps/jumpers and all four corners- don’t connect this
29. Bond metal pieces that must come fasteners (see Rule 12). guard ring directly to circuit
apart by: 35. Make bonding straps short and common.
wide, with width >= 1/5 the length

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Power Distribution, Bypassing And Decoupling 47. Put a ceramic 1kV capacitor, metal-oxide varistor (MOV),
Power distribution networks are prime targets for inductive or transient suppressor between each power pin in a
coupling from ESD: connector and chassis ground.

42. Use multilayer PCBs with paired power/ground planes. PCB Design And Mounting
43. Use tightly-interwoven power/ground grids on double- Intelligent PCB layout is our best weapon against ESD, and
sided PCBs: can incorporate most of the techniques described in this
article:
- Route power traces next to ground traces.
- Connect vertical and horizontal traces/infill with vias 48. Design any protection circuits that you might need into
wherever possible. your original layout (“wiggle room”). You can leave these
-Keep power/ground grids <=60mm (2.4”) on a side, and components unpopulated or replaced by 0-ohm resistors if
preferably <=13mm (0.5”) on a side. they aren’t needed:
44. Provide plenty of ceramic bypassing/decoupling - Put the protection circuit at the connector (preferred), or
capacitors on PCBs, close to their circuits/connectors. <=25mm (1”) from the receiver/driver.
45. Tightly twist power wires and their returns together. - Position the components to minimize parasitic
capacitance, mutual inductance, and the wiring common
46. Put a ferrite bead in each power line where it enters a
to the input and output of the protection circuit.
PCB.
- Use short and wide traces (see Rule 35) to chassis
ground/circuit common.
Metal Electromotive Resistivity, - Route signal and ground to the protection circuit, then to
Force (EMF), volts nano ohm-meters the receiver/driver.
49. Make provisions for changing the grounding scheme,
(anodic, corrodes) especially circuit common to chassis ground connections:
Magnesium +2.37V 42 - Run chassis ground along PCB edges that have
Magnesium alloys ——— 50 - 175 connectors to the outside world; use wide traces in all
Aluminum +1.66V 27 layers, tied together by vias about every 13mm (0.5”).
Zinc +0.76V 60 - Connect chassis ground to the connector housings and to
any mounting holes on these edges. Use topside and
Galvanized steel ——— 100 - 197
bottomside pads without soldermask, put vias around the
Aluminum alloys ——— 27 - 86 mounting holes, and don’t get solder on these pads
Chromium +0.74V 132 during assembly. Screws with built-in Belleville washers
Cadmium +0.40V 73 connect the pads to tabs/metal standoffs on the
chassis/shield.
Mild steel +0.44V 100 - 197
- Make provisions for isolating/connecting other mounting
Iron +0.44V 101
holes to chassis ground- isolated pads with 0-ohm
Tin-lead solder ——— 145 - 195 resistors to circuit common, choice of plastic or metal
Stainless steel ——— 560 - 780 standoffs, etc.
Lead +0.13V 206 - Separate circuit common/power from chassis ground by
Tin +0.14V 126 an identical 0.64mm (0.025”) wide moat in all layers.
Nickel +0.25V 69 - Connect circuit common to chassis ground by ground
ties (1.27mm (0.050”) wide traces on the top and bottom
Brass ——— 61 - 110 layers) paralleled by pads for ferrite beads/capacitors at
Beryllium copper ——— 29 - 115 mounting holes and every 100mm (4”) along the moat.
Copper -0.34V 17 50. Put a circuit-common guard ring around the rest of the
Bronze ——— 91 - 212 PCB:
Monel ——— 510 - 614 - >=2.5mm (0.1”) wide in every layer you can, stitched
Silver solder ——— 22 - 172 together by vias about every 13mm (0.5”).
Titanium alloys ——— 482 - 1700 - Keep signal traces >=0.5mm (0.020”) inside this guard
ring.
Silver -0.80V 16
51. Use multilayer PCBs with paired power/ground planes-
Titanium +1.63V 540
they have 1-10% of the common-impedance and inductive
Gold -1.50V 22 coupling of equivalent double-sided PCBs:
(cathodic, passive) - Put each signal layer next to a ground/power layer.
Table 1: Galvanic Series (in order of decreasing EMF) - Use a “submerged trace” scheme; top and bottom layers

22 CONFORMITY ®: FEBRUARY 2003


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have components and short traces, 65. If you can’t reach chassis ground, 76. Cascade low-pass filters
completely surrounded by ground; connect a cable shield to circuit (frequencies of f, 30*f, 1000*f, etc.)
otherwise the signal/power wiring common with a 1-10nF 1kV if needed. Filters are usually
is on the inner layers, essentially capacitor or an anti-parallel pair of effective only up to 100-1000 times
encased in a Faraday cage. diodes. their design frequency.
52. Put all connectors on one edge if 66. Choose compatible materials for 77. Follow power-line filters with high-
you can. mating connectors, connector frequency ESD filters.
53. Put input/output circuits close to backshells, and cable shields (see 78. Configure protection circuits as:
their connectors. Rule 12).
- A blocking device.
54. Put ESD-susceptible circuits at the 67. Minimize loop area inside cables by - Shunt device(s) to chassis
center of the PCB. providing one ground wire per 1-5 ground/circuit common.
signal wires; use S-G-S-S-G-S-S-G-
55. Keep circuits compact. S for flat cables. - An L-network, with a blocking
56. Put vias solid into power/ground device and shunt device(s) to
68. If a cable has spare wires: chassis ground/circuit common.
planes.
- Connect them to circuit common - A pi-network, with shunt device(s)
57. Make all signal traces as short as at both ends. to chassis ground, a blocking
possible. - Connect them to device, and shunt device(s) to
58. Parallel signal traces that can get ground/power/signal wires at both circuit common.
direct ESD hits, and signal traces ends. 79. Connect blocking devices to ESD
>=300mm (12”) long, by ground - Clip them short, so they are sources and low-impedance
traces. completely enclosed by the shield. drivers/receivers:
59. Keep resets, interrupts, and edge- 69. Prefer coaxial cable, or twisted pair - <=100k resistors for CMOS
triggered signals away from: with at least 4 twists in the shortest inputs.
- The edges of the PCB. wavelength of concern, to round - <=50-ohm resistors for bipolar
- Unprotected input/output signals. cable or flat cable. inputs.
60. Where permitted, fill in unused 70. Choose cable shields: - Ferrite beads if low resistance is
areas with ground, with layers tied - >=0.025mm (0.001”) thick. important. They provide 50-500
together by vias at least every ohms impedance from 10-
- Prefer foil or foil-and-braid shields
60mm (2.4”)- patches exceeding 1000MHz.
to braid shields, with metal-to-
25mm x 6mm (1” x 0.25”) should metal contact at the overlap. 80. Connect shunt devices to high-
have at least two connections to impedance drivers/receivers:
- >=85% optical coverage for braid
ground at opposite ends. - 100-1000pF capacitors to chassis
shields.
61. If accidental slots in power/ground ground.
71. Choose connectors with dimpled
planes are longer than 8mm (0.3”), - 10-100pF capacitors to circuit
contacts between the mating
stitch the sides together with traces. common.
connector shells, and between the
connector shells and backshells. - Clamps to chassis ground/circuit
Cable Design And Routing common.
72. Fit ferrite sleeves on cables so that
ESD can arc to the connectors on - Crowbars to chassis ground/circuit
they encircle everything except the
cables, while indirect ESD can couple common.
shield or shield drain wire(s).
into cables through induction or - Keep leads very short- 1nH/mm
radiation: lead inductance slows down turn-
Filters And Transient Suppressors
on.
62. Keep cables short. Filters and transient suppressors block
ESD-induced voltages, and shunt ESD- - Connectors are available with
63. Keep internal cables >=50mm built-in capacitor arrays, ferrite
induced currents elsewhere:
(2.0”) from slots, seams, and sleeves, and MOV arrays.
bonding straps/jumpers, routed over
Determine the maximum capacitance 81. Limit transients to a safe voltage
continuous metal.
you can put on the signal lines. with clamps that turn on in <=1ns:
64. Terminate cable shields to the - Reverse-biased diodes to power
outside of the metal 74. Put filters on resets, interrupts, and and ground, with a 100-200nF
enclosure/shield, preferably with edge-triggered signals. bypass capacitor nearby.
360-degree bonds- short and wide
75. Put filters/transient suppressors on - MOVs, multilayer varistors
connections (see Rule 35) may
off-board receivers, and on off- (MLVs), and multifunction
suffice, but keep unshielded sections
board drivers for cables that can get capacitors (MFCs)- 0.5 ns turn on.
of the cable <= 40mm (1.6”) long.
direct ESD hits- including signals
that go through opto-isolators.

24 CONFORMITY ®: FEBRUARY 2003


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- Zener diodes and avalanche 87. Test proposed substitute/second- Watchdog Timers
diodes- 0.05 ns turn on; can put a source active components. They Watchdog timers are circuits that
standard diode in series to reduce may have poorer immunity to ESD monitor a “heartbeat” generated by the
the capacitance. upset. software- this heartbeat stops if the
- Limited by their maximum power 88. Prefer processors with fixed system hangs or the software “gets lost”
dissipation. interrupt vectors over ones that read because of ESD, whereupon the
82. Short out transients with crowbars the interrupt address from memory. watchdog timer resets and restarts the
that turn on in <=1ns- trigger level 89. Avoid programmable input/output system:
must exceed the maximum signal chips. A configuration change can
level, and hold current must exceed completely change their function. 102. Connect the watchdog timer to
the maximum loop current. master reset to force a cold start (all
90. Beware of chips with “one-way”
83. Choose components to withstand instructions- ones that can be data lost on restart), or to a non-
ESD voltages and currents: reversed only by hardware reset. maskable interrupt (NMI) to force a
- Thick-film and carbon warm start (some data retained on
composition resistors. Robust Circuit Design restart).
- Shunt capacitors that may take Design circuits such that noise ESD- 103. Use an edge-triggered input, so
direct ESD hits should be rated induced transients cannot cause long- that the software must toggle the
>=1kV, or be large enough to term effects, including upsets, input to reset the watchdog timer.
absorb 2.3uC without exceeding unwanted resets, lock-ups, or lost data: 104. Make sure that software cannot
their voltage rating if they aren’t stop the watchdog timer once it has
protected by transient suppressors. 91. Tie unused inputs/bi-directional been started.
84. Provide for the same protective pins high or low through resistors. 105. Design the software to periodically
circuitry on all the signals going 92. Avoid edge-triggered logic; latch reset the watchdog timer. This code
through a connector, to keep data with strobes instead of clock should be in as few places as
common-mode noise from edges. possible, and preferably just one
becoming differential-mode noise- 93. Do not connect resets, interrupts, or spot in the main loop.
running all the wires through a other edge-triggered signals to long
common-mode choke works well. cables.
Robust Components 94. Do not use circuits that can enter an Technology ESD Damage
endless wait/disabled state: Threshold (Volts)
Choose robust active components to
keep ESD transients from affecting the - Halted.
circuitry: - Waiting. MOSFET’s 10 - 200V
- Deadlocked. Recording Heads 10 - 800V
85. Choose active components that: - Low-power mode. VMOS 30 - 1800V
- Are just fast and sensitive enough - I/O idle mode.
to do the job. NMOS 60 - 500V
- I/O invalid mode.
- Have enough noise margin that GaAsFET’s 60 - 2000V
95. Give software control of peripheral EPROMs 100 - 500V
small series resistors on their
chip resets.
inputs and outputs will not Laser Diodes 100 - 1700V
affect them. 96. Design peripheral circuits using
“hold” or “ready” such that a reset JFETs 140 - 7000V
- Have high noise/noise-energy SAW devices 150 - 500V
immunity. will restore normal operation.
97. Give software a way to hardware CMOS 150 - 3000V
- Have good ESD immunity (see
Table 2)- upset usually takes about reset the entire system, as a last- Op Amps 190 - 2500V
10% of the damage-threshold ditch recovery technique. PIN Diodes 200 - 1000V
voltage. 98. Make sure that ESD transients DRAMs 200 - 3000V
- Have differential inputs and won’t trigger power monitors. Schottky Diodes 300 - 2500V
outputs. 99. Check parity/framing on data Film Resistors 300 - 3000V
- Can read back all internal whenever you can.
registers. Bipolar Transistors 300 - 7000V
100. Use differential signals wherever
- Are immune to latch-up. SCRs 500 - 1000V
you can.
ECL 500 - 2000V
86. Don’t push components close to 101. Isolate signals coming from the
their design limits. outside world with opto-isolators or Schottky TTL 500 - 2500V
transformers. Table 2: Immunity to ESD Damage

CONFORMITY ®: FEBRUARY 2003 25


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106. Design the software to run 116. Don’t let out-of-domain inputs - Checkpoint flags that are set at
software and hardware sanity affect program flow. critical points in the routine.
checks, including confirming that 117. Check pointers, indexes, and index - A flow-check counter that is
the watchdog timer is running, registers against the bounds of data incremented in the routine.
before resetting it. structures, arrays, stacks and heaps - The stack pointer is in a valid
107. Choose a period long enough to before using them. range.
prevent timeouts when the system is 118. Check the count before entering a - The return address is to a code
operating correctly, even during rare delay loop. segment, and a CALL instruction
events, but short enough to prevent precedes the return address.
danger if the system hangs and must 119. Immediately exit with an error if
be restarted. you find that the count is outside its 129. Make sure that the error
legal range while executing a loop. detection/warm-boot process is fast
108. Use a tight timeout during enough to find and correct errors
software testing to ensure that the 120. Point all unused interrupt vectors
to an error handler. before the system becomes
watchdog timer won’t time out dangerous.
during normal operation. 121. Log abnormal events for later
analysis. 130. Put a multibyte flag filled with
109. Provide a hardware method to mixed 1s and 0s in each volatile
disable the watchdog timer 122. Store critical data in multiple RAM as a power-loss indicator.
(disconnect it from reset/NMI) for locations. Periodically crosscheck
product development, ESD testing, these locations and fix mismatched 131. Try to restore the last correct state
and servicing. data. after an error. If this is unknown, go
to a safe state, then notify the user
123. Break large tables into fixed-length and any attached units.
Software records, each with a checksum.
It takes a lot of work, but software can 124. Protect blocks of data with parity ESD Testing
be designed to find and correct errors bits/checksums/CRCs/ECCs.
before they become dangerous, ESD testing points out weak spots that
including errors caused by random 125. Put redundant data (pointers, we have overlooked:
transients like ESD: counts, type/status identifiers) into
data structures for easy checking 132. To work on the hardware’s ESD
110. Validate inputs from humans, other and repair. immunity, run a specially-compiled
software modules, and hardware as 126. Keep a copy of all output states in version of the software:
soon as you receive them (and memory, and periodically: - With the software ESD-immunity
recheck them just before use), by - Reread control and selection features disabled.
checking: inputs. - That continuously exercises all
- Type - Refresh configuration registers and functions of the system without
- Range output ports. operator intervention.
- Framing - Check memory, and correct errors. - That uses a LED/beeper/status
display to warn that an error
- Parity/checksum/cyclic- - Re-enable interrupts.
occurred.
redundancy check (CRC)/Error- 127. To regain control if the program
correcting code (ECC) 133. Have product designers attend or
counter “gets lost”, put recovery
help with the ESD testing.
111. Acknowledge correct data and code between routines, at the end of
return an error code for incorrect data tables, and in unused memory, 134. Begin with indirect ESD tests,
data. with: harden the system to that desired
- A group of NOPs (as long as the ESD-immunity level, and only then
112. Retransmit data if you don’t start running direct ESD tests.
receive an acknowledgement. longest instruction that the
processor can execute) followed 135. Start testing at 2kV, and work up
113. Read critical hardware inputs three in 2kV steps until you see failures
by a software interrupt, call, or
times, several microseconds apart, or have exceeded your desired ESD-
jump to an error handler.
and verify that they match before immunity voltage by 1-2kV:
using them. - Two absolute jumps/calls to an
error handler, located such that the - Find target points with the ESD
114. Use serial protocols that ignore a data bytes match the opcode. gun in continuous/fast-repetition
single high in a long string of lows, mode using the air-discharge tip.
and vice versa. 128. Do sanity checks before exiting a
routine. Verify: Mark these points with chalk or
115. If a peripheral uses an index water-soluble marker.
- A token that was written before
register to access internal registers, - Test target points at both polarities
calling the routine.
set the index register just before before increasing the voltage.
doing critical reads/writes.

26 CONFORMITY ®: FEBRUARY 2003


FEATURE

- Zap each target point >=50 times 143. If a certain failure seems to come
at a given voltage. and go, check the seams and bonds
- Zap at <= one pulse per second. near the target point.
Slow down if the system uses error 144. If you install an ESD fix, but it
detection/recovery and needs to doesn’t seem to affect the ESD
fully recover after an error, or if immunity, leave it in place until you
the system consistently passes the have attained the system’s desired
first few times you hit a target ESD immunity. Then you can
point, then consistently fails (you remove the ESD fixes one-by-one to
may be charging up something determine which one(s) are
with a high-resistance discharge effective.
path).
145. Test software defenses with an
- Keep run/fail maps which show emulator. Make random changes
the voltage/polarity at which each (one at a time) to registers, stack-
target point fails. pointers, the program counter, and
136. Check supposedly identical ports data in memory, then watch what
early in testing to see if one of them the system does.
is more sensitive than the rest. Then, 146. Save your test system for
concentrate your testing on this comparison, in case field problems
port. arise or production units show a
137. Test the system in both operating sudden drop in ESD immunity.
and installation configurations, and
at all customer-accessible points, Electronic engineers, PCB layout folks,
including any service areas that the mechanical engineers, and
user may access. programmers must all cooperate to
138. If you have multiple sources for develop equipment and products with
critical chips (microprocessors, and good ESD immunity. This is much
chips driving/receiving off-board easier when ESD immunity is
signals) hand-pick the chips for considered throughout the design
your ESD-test system from the process, instead of treated as an
leading chip vendors. afterthought. 
139. If only a few spots seem to be About The Author
vulnerable, turn out the lights and
zap the system to try to see the John R. Barnes is a NARTE Certified
discharge path. EMC and ESD Engineer and president
of dBi Corporation, an EMC/EMI/ESD
140. Identify vulnerable cables by testing laboratory. He can be reached at
disconnecting the cable, or jrbarnes@iglou.com. The full
clamping a snap-on ferrite onto the bibliography of over 1500 sources for
cable next to the connector, and this article can be downloaded from the
rerunning that section of the test. company’s web site at
141. If just one area is failing, try www.dbicorporation.com/esd-anno.htm.
testing another unit:
- Similar symptoms at similar
voltages/polarities indicate a
design problem.
- Different symptoms indicate a
contact/bonding problem, cable
position, or a marginal component
(maybe damaged by the ESD
testing).
142. Mock up shields/gaskets/bonding
straps from aluminum foil and
copper tape.

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