Semiconductor/IC Test Solutions

Wafer/Chip/Package

www.chromaate.com

Turnkey Test & Automation Solution Provider

 Chroma ATE Inc, as a turnkey test & automation solution provider,
integrates customized solutions with Test & Measurement
Instruments, Automatic Test Systems and Manufacturing Execution
Systems. Over the years, Chroma has accumulated strong
experiences in semiconductor IC test areas. Chroma provides a wide
portfolio of semiconductor IC test solutions ranging from ATE, PXI
systems, IC handlers, and system level test solutions.

On the ATE & PXI side, the solutions cover applications in consumer
SoC (MCU, controller, audio, peripheral), power management IC
(Regulator, LDO, DC/DC, AC/DC, LED Driver), RF (FEM, Connectivity,
Mobile) and other specific applications (CIS, Light Sensors, RFID).

On the handler & automatic system side, the solutions include

thermal control, extreme device handling technologies, bare die
handling, pick and place handlers, CIS turnkey solutions, and system
level test solutions.

With the turnkey solutions, Chroma provides a best approach for

customers to bring down the cost of test while maintaining the test
quality and performance.

Turnkey Semiconductor/IC Test Solutions

Wafer Process Wafer Sort Assembly & Package Open Short Test

Double Sides Wafer

Inspection System VLSI Test Systems SoC/Analog Test Systems

Final Test Automatic System Level Test Shipping

RF Solution Final Test Hybrid Single Site Miniature Automatic System Level
Integrated Handler Handler Test Handler IC Handler CIS Turnkey Solution Test Handler
 Semiconductor Automatic Test Equipment (ATE)
Chroma semiconductor ATE is specifically designed for high-throughput and high parallel test capabilities to provide the most cost-
effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and
excellent reliability, it is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.

Key Features
☑ High Performance in a low-cost production system SoC
☑ High parallel test capability MCU
☑ Flexibility from engineering to production PMIC
☑ Powerful suite of software tools
Mixed-Signal
☑ Small footprint to save space in factory
Wireless
CHROMA ATE Device
☑ Adapter board to use other platform directly
Embedded
Touch
Sensor Flash
Consumer
Devices

SoC/Analog Test Systems

Model 3650-EX Model 3650 Model 3650-CX
Key Features Key Features Key Features
☑ 50/100MHz Clock Rate ☑ 50/100MHz Clock Rate ☑ 50/100MHz Clock Rate
☑ Maximum 1024 I/O Pins ☑ Maximum 640 I/O Pins ☑ Maximum 256 I/O Pins
☑ 32/64M Pattern Memory ☑ 16/32M Pattern Memory ☑ 16/32M Pattern Memory
☑ Maximum 96 CH DPS ☑ Maximum 32 CH DPS ☑ Maximum 16 CH DPS
☑ SCAN / ALPG Function ☑ SCAN / ALPG Function ☑ SCAN / ALPG Function
☑ 512 DUT Parallel Test ☑ 32 DUT Parallel Test ☑ 32 DUT Parallel Test
☑ Microsoft Windows® 7 /XP OS ☑ Microsoft Windows® 7 /XP OS ☑ Microsoft Windows® 7 /XP OS

3650 Series Options

Key Features
☑ PVI100 Analog Option
☑ VI45 Analog Option
☑ HDADDA Mixed-Signal Option
☑ Mixed-Signal and RF Box (MRX)
☑ Timing Interval Analyzer Option PVI 100 VI 45 HDADDA
VLSI Test Systems
Model 3380 Model 3380-P, 3380-D Model 3360-P, 3360-D
Key Features Key Features Key Features
☑ 50/100MHz Clock Rate ☑ 50/100MHz Clock Rate ☑ 50 MHz Clock Rate
☑ Maximum 1280 I/O Pins ☑ Maximum 576 I/O Pins (256 for 3380-D) ☑ Maximum 256 I/O Pins (64 for 3360-D)
☑ 32/64/128M Pattern Memory ☑ 32/64/128M Pattern Memory ☑ 8/16M Pattern Memory
☑ Maximum 128 CH DPS (4 wires) ☑ Maximum 64 CH DPS (4 wires) ☑ Flexible configuration
☑ SCAN / ALPG Function ☑ SCAN / ALPG Function ☑ SCAN / ALPG Function
☑ 1024 DUT Parallel Test ☑ 512 DUT Parallel Test (256 for 3380-D) ☑ 32 DUT Parallel Test
☑ Microsoft Windows® 7 OS ☑ Microsoft Windows® 7 OS ☑ Microsoft Windows® 7 /XP OS
☑ Flexible configuration ☑ Flexible configuration

LXPG2x1 (No Outlet) PMUVIx1 Flexible Configuration

☑ Support flexible slots
☑ Flexible slot can insert I/O, UVI, ADDA, PXIe, and etc. versatile functions
☑ 3360-D : 2 slots ; 3360P : 8 slots ; 3380-P : 9 slots ; 3380 : 20 slots
☑ Time/Freq Measurement unit

STBUSx1 Flexible Slots

UR+I/F

PXI IC Test Systems

Programmable Pin Electronics DUT Power Supply Mini ATE
Module Model 36010 Model 36020 Model A360101
Key Features Key Features Key Features
☑ PXI / PXIe-Hybrid Compatible ☑ PXI / PXIe-Hybrid Compatible ☑ Maximum 64 I/O Pins
☑ 50/100MHz Clock Rate ☑ +10V/-2V Voltage Range ☑ 8 Channels DPS
☑ 32M Pattern Memory ☑ 6 Selectable Current range ☑ Universal Loadboard
☑ Per-Channel PMU ☑ 16-Bit V Force Resolution ☑ Support Labview / LabWindows
☑ SCAN Function 4Chain/256M ☑ 18-Bit I Measurement Resolution ☑ Windows® 7 /XP OS
☑ Support Labview / LabWindows ☑ Support Labview / LabWindows
☑ Microsoft Windows® 7/XP OS ☑ Microsoft Windows® 7/XP OS
 Pick & Place Handler - Final Test (FT) and System Level Test (SLT)
Final Test
FT is taken to test before delivery of the product to customers. This test through test patterns to verify the functionality of the device and
measure the electrical characteristics to meet the desired specifications. The purposes of testing are listed as below.

☑ To verify product design

☑ To achieve high quality production
☑ To control production quality
☑ To acquire continue improvement in product yield

Advanced TEC Controller

Model 54100 Series
Key Features
☑ Bidirectional driving with 150W (24V 8A), 300W (27V/12A), Temp.
or 800W (40V/20A) output Stability
800W
☑ Filtered PWM output with >90% driving power efficiency ±0.01℃
while maintaining linear driving with current ripples<20 mA 25
☑ Temperature reading and setting range -50 to 150℃ Time
with 0.01℃ resolution and 0.3℃ absolute accuracy
☑ Short term stability (1 hour) ±0.01℃ and long term
stability ±0.05℃ with optimal PID control
TEC Modules
☑ Feature true TEC large signal PID auto tune for Chroma 54100 Series
best control performance
☑ 2 T-type thermal couple inputs, one for control feedback and
the other for monitor and offset, providing versatile control modes

Full Range Tri-temp Final Test Handler TT Chart - Hot to Cold

85℃ ~ -40℃ : 400 sec. (Tc of Kit)
Model 3110 Model 3110-FT Temp.
-40℃~125℃ -40℃~125℃
90
70
50
30
10
-10
-30

125 125 0 75 150 225 300 350 400 Sec.

* Only for 3110 thermal head
50 50

0 0

-40 -40 TT Chart - Cold to Hot

-40℃ ~ 85℃ : 120 sec. (Tc of Kit)
℃ ℃
Temp.

90
Model 3160-A Model 3180 70
40℃~125℃ Ambient~125℃ 50
30
10
-10
-30

125 0 75 150 225 300 350 400 Sec.

125
* Only for 3110 thermal head
Ambient

40

℃ ℃
 System Level Test
In conventional IC backend process, to ensure shipment quality, most companies test packaged devices at speed with full function. However
this induces several issues :
【1】 Device shipment quality is not ensured due to the difference between ATE and real working environment
【2】 Time to market is delayed due to months-long test program development on ATE's
【3】 Test cost continually raises in contrast with reducing silicon cost.

Drivers to System Level Test Wafer IC Module Board

Time To Market Cycle Probe Test Final Test System Level Test
☑ Shipment made before ATE program ready
☑ Maximize device
☑ Availability
ICs ICs
Wafer

Cost
☑ Lower investing cost (COO) than ATE
☑ Higher efficiency (lower unit cost)
than manual test Probe Card ATE Module Boards

Disruptive Process Implement in Semiconductor Test

Fault Coverage
☑ Control DPPM Manual ASFT
☑ Quality asurance
☑ Reduce personnel effort Assembly & Auto. System
Wafer Process
☑ evaluating the system's compliance Package Function Test
☑ Test accessibility
☑ Detect inconsistencies between Wafer Sort Package Test Shipping
SW and the hardware assemblages

Mini Tabletop Single Site Test Handler System Level Test Handler
Model 3111 Model 3260
Key Features Key Features
☑ IC packages: 5x5 mm to 45x45 mm ☑ Reduce overkill rate by RC (re-check or retest)
☑ Software configurable binning ☑ Time and resources saving
☑ Air damper contact ☑ Yield increasing
☑ Optimizes IC force balance ☑ Tie-in BICT for various testers for RC
☑ Maximize test socket lifetime ☑ Optional PoP (Package on Package) solutions
☑ Double stack protection ☑ Made-to-order test procedure design
☑ Continuous automated re-test ☑ Unique FACT (Fault Auto Correlation Test) to reduce
☑ Remote control operation personnel handling time
☑ Real time system camera monitoring
☑ Alerts to mobile device
CIS Turnkey Test Solutions
The CIS (CMOS Image Sensor) test solution is one of Chroma's
unique turnkey solutions. It provides the best UPH with best
optimized resource, which delivers the performance and quality
for functional and image tests. Chroma integrated CIS solution
provide the best COO (Cost Of Ownership) to customers.

Key Features
☑ Handler Model 3270 -16 sites Parallel
☑ 16/16 light source(FT)/IPC
☑ ATE 3380P 100MHz clock Rate
☑ 128 M Pattern Memory
☑ 192pins I/O pins
☑ 16 CH UVI (4 wires)
☑ RMB2 switching board
☑ Capture card (MIPI 1G)

Circuit Probing
Chroma ATE, Capture Card, and MIB
☑ 3380 Series 100 MHz ATE solutions
☑ Flexible optimized configuration by MIB
(Matrix Interface Board)
MIB Board LED Light Source
☑ Cost reduction 2-3 times vs traditional
full config ATE solutions
☑ Up-to-date capture card solutions : Chroma Tester Capture Cards
supporting MIPI CSI1/2, Multiple-lanes

Light Source
☑ > 10 times longer life time than Halogen light source
☑ No overheat issues
☑ < 1% difference in spectrum response vs D65 spectrum
☑ LED light source size expandable for 16-site above parallelism requirement
☑ 8 to 10 times cost reduction than Halogen light source Light Source Light Source

Pick and Place IC Handler

☑ Reliable high speed pick & place handler,
supporting up to 16 sites
☑ Handling various package types, with
outer dimensions 2x2mm to 14x14mm
☑ Integrated FT light source for each site
☑ Support low temp (-40℃) in quad sites
by Model 3110-FT

Miniature IC Handler
Model 3270
Tri-temp Test Handler
Model 3110-FT
 HEADQUARTERS
CHROMA ATE INC.
66 Huaya 1st Road, Guishan, Taoyuan 33383, Taiwan
T +886-3-327-9999
F +886-3-327-8898
info@chromaate.com
www.chromaate.com

CHINA
CHROMA ELECTRONICS (SHENZHEN) CO., LTD.
8F, No.4, Nanyou Tian An Industrial Estate,
Shenzhen, China PC: 518052
T +86-755-2664-4598
F +86-755-2641-9620
www.chroma.com.cn

JAPAN
CHROMA JAPAN CORP.
472 Nippa-cho, Kouhoku-ku, Yokohama-shi,
Kanagawa, 223-0057 Japan
T +81-45-542-1118
F +81-45-542-1080
info@chroma.co.jp
www.chroma.co.jp

U.S.A.
CHROMA ATE INC. (U.S.A.)
7 Chrysler Irvine, CA 92618
T +1-949-421-0355
F +1-949-421-0353
Toll Free +1-800-478-2026
info@chromaus.com
www.chromaus.com

SANTA CLARA
3350 Scott Blvd., #601 Santa Clara, CA 95054
T +1-408-969-9998
F +1-408-969-0375

EUROPE
CHROMA ATE EUROPE B.V.
Morsestraat 32, 6716 AH Ede, The Netherlands
T +31-318-648282
F +31-318-648288
sales@chromaeu.com
www.chromaeu.com

© 2015 Chroma ATE Inc. All Rights Reserved.

201501-1000