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Features: Description:
• Max. Clock 10 MHz The Microchip Technology Inc. 25AA160A/B,
• Low-Power CMOS Technology 25LC160A/B (25XX160A/B*) are 16 Kbit Serial
• 2048 x 8-bit Organization Electrically Erasable PROMs. The memory is accessed
via a simple Serial Peripheral Interface (SPI)
• 16-Byte Page (‘A’ version devices)
compatible serial bus. The bus signals required are a
• 32-Byte Page (‘B’ version devices) clock input (SCK) plus separate data in (SI) and data
• Write Cycle Time: 5 ms max. out (SO) lines. Access to the device is controlled
• Self-Timed Erase and Write Cycles through a Chip Select (CS) input.
• Block Write Protection: Communication to the device can be paused via the
- Protect none, 1/4, 1/2 or all of array hold pin (HOLD). While the device is paused, transi-
• Built-In Write Protection: tions on its inputs will be ignored, with the exception of
Chip Select, allowing the host to service higher priority
- Power-on/off data protection circuitry
interrupts.
- Write enable latch
The 25XX160A/B is available in standard Pb-free pack-
- Write-protect pin
ages including 8-lead PDIP and SOIC, and advanced
• Sequential Read packaging including 8-lead MSOP, and 8-lead TSSOP.
• High Reliability:
- Endurance: 1,000,000 erase/write cycles Package Types (not to scale)
- Data retention: > 200 years
- ESD protection: > 4000V TSSOP/MSOP PDIP/SOIC
(ST, MS) (P, SN)
• Temperature Ranges Supported:
- Industrial (I): -40°C to +85°C CS 1 8 VCC CS 1 8 VCC
SO 2 7 HOLD
- Automotive (E): -40°C to +125°C WP 3 6 SCK SO 2 7 HOLD
VSS 4 5 SI 3 6
• Pb-Free and RoHS Compliant WP SCK
VSS 4 5 SI
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
Param.
Sym. Characteristic Min. Max. Units Test Conditions
No.
D001 VIH1 High-level input 2.0 VCC +1 V VCC ≥ 2.7V (Note)
D002 VIH2 voltage 0.7 VCC VCC +1 V VCC < 2.7V (Note)
D003 VIL1 Low-level input -0.3 0.8 V VCC ≥ 2.7V (Note)
D004 VIL2 voltage -0.3 0.2 VCC V VCC < 2.7V (Note)
D005 VOL Low-level output — 0.4 V IOL = 2.1 mA
D006 VOL voltage — 0.2 V IOL = 1.0 mA, VCC < 2.5V
D007 VOH High-level output VCC -0.5 — V IOH = -400 μA
voltage
D008 ILI Input leakage current — ±1 μA CS = VCC, VIN = VSS TO VCC
D009 ILO Output leakage — ±1 μA CS = VCC, VOUT = VSS TO VCC
current
D010 CINT Internal Capacitance — 7 pF TAMB = 25°C, CLK = 1.0 MHz,
(all inputs and VCC = 5.0V (Note)
outputs)
D011 ICC Read — 6 mA VCC = 5.5V; FCLK = 10.0 MHz;
SO = Open
Operating Current — 2.5 mA VCC = 2.5V; FCLK = 5.0 MHz;
SO = Open
D012 ICC Write — 3 mA VCC = 5.5V
D013 ICCS — 5 μA CS = VCC = 5.5V, Inputs tied to VCC or
Standby Current VSS, TAMB = -40°C TO +125°C
— 1 μA CS = VCC = 2.5V, Inputs tied to VCC or
VSS, TAMB = -40°C TO +85°C
Note: This parameter is periodically sampled and not 100% tested.
Param.
Sym. Characteristic Min. Max. Units Test Conditions
No.
Param.
Sym. Characteristic Min. Max. Units Test Conditions
No.
SCK
18 19
High-Impedance
SO n+2 n+1 n n n-1
Don’t Care 5
SI n+2 n+1 n n n-1
HOLD
CS 12
2 11
7
Mode 1,1 8 3
SI MSB in LSB in
High-Impedance
SO
CS
9 10 3
Mode 1,1
SCK Mode 0,0
13
14 15
Don’t Care
SI
Memory EEPROM
I/O Control X
Control Array
Logic
Logic Dec
Page Latches
SI
SO Y Decoder
CS
SCK
HOLD Sense Amp.
R/W Control
WP
VCC
VSS
0 1 2 3 4 5 6 7 8 9 10 11 21 22 23 24 25 26 27 28 29 30 31
SCK
Data Out
High-Impedance
SO 7 6 5 4 3 2 1 0
CS
Twc
0 1 2 3 4 5 6 7 8 9 10 11 21 22 23 24 25 26 27 28 29 30 31
SCK
Instruction 16-bit Address Data Byte
SI 0 0 0 0 0 0 1 0 15 14 13 12 2 1 0 7 6 5 4 3 2 1 0
High-Impedance
SO
CS
0 1 2 3 4 5 6 7 8 9 10 11 21 22 23 24 25 26 27 28 29 30 31
SCK
Instruction 16-bit Address Data Byte 1
SI 0 0 0 0 0 0 1 0 15 14 13 12 2 1 0 7 6 5 4 3 2 1 0
CS
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
SCK
Data Byte 2 Data Byte 3 Data Byte n (16/32 max)
SI 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
CS
0 1 2 3 4 5 6 7
SCK
SI 0 0 0 0 0 1 1 0
High-Impedance
SO
CS
0 1 2 3 4 5 6 7
SCK
SI 0 0 0 0 0 1 10 0
High-Impedance
SO
CS
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCK
Instruction
SI 0 0 0 0 0 1 0 1
CS
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCK
SI 0 0 0 0 0 0 0 1 7 6 5 4 3 2 1 0
High-Impedance
SO
WEL WPEN WP
Protected Blocks Unprotected Blocks STATUS Register
(SR bit 1) (SR bit 7) (pin 3)
0 x x Protected Protected Protected
1 0 x Protected Writable Writable
1 1 0 (low) Protected Writable Protected
1 1 1 (high) Protected Writable Writable
x = don’t care
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Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
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Revision D (10/07)
Added Pb-free to Features section; Section 1.0,
revised Ambient Temp.; Replaced Package Drawings;
Revised Product ID section.
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• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
• Microchip is willing to work with the customer who is concerned about the integrity of their code.
• Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
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09/10/07