Beruflich Dokumente
Kultur Dokumente
A Thesis
of
Drexel University
by
Mitchell L. Thompson
Doctor of Philosophy
April 2002
ii
Acknowledgments
advisor, for his kind assistance, invaluable guidance, and friendship over many years. I
am grateful to Professors Mahmoud El-Sherif, Wei-Heng Shih, Sorin Siegler, and Dr.
Naum Khutoryansky for serving on my Ph.D. committee and for their support,
I would like to thank my children, Corinne, Marie, and Lee, for their understanding
all the times when I was busy, and I would like to thank my wife, Barbara Nicholson, for
Table of Contents
List of Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v
List of figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vi
Abstract . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xii
1. INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 Background . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.2 Constitutive Equations and Material Properties . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.3 Previous Work . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
1.4 Scope and Objectives of this Thesis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.5 Organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2. PIEZOELECTRIC MATERIALS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.1 Background . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.2 Piezoelectric Polymers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3. CONSTITUTIVE EQUATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.1 Constitutive Equations for Piezoelectric Materials . . . . . . . . . . . . . . . . . . . . . . 21
3.2 Constitutive Equations for Viscoelastic Materials . . . . . . . . . . . . . . . . . . . . . . . 24
3.3 Constitutive Equations Coupling Piezoelectricity and Viscoelasticity . . . . . . . . 33
3.4 Time - Temperature Superposition (TTS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
4. MEASUREMENTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.1 Previous Work . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.2 Equipment and Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
4.3 System Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
4.4 Calibration/Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
4.5 Sample Preparation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
4.6 Measurement Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
5. DATA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
5.1 1 Axis (Stretch Direction) Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
5.2 2 Axis (Transverse Direction) Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
5.3 Effect of Electrode Metal on Material Property Measurements . . . . . . . . . . . . . 76
5.4 Dielectric Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
VITA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175
v
List of Tables
List of Figures
2.2.1 Space filling model of the polar $ crystal form (top) and the non polar
" crystal form, bottom. Black = F, white = H, from [1] . . . . . . . . . . . . 16
3.4.3 ‘A’ curves are Arrhenius fit to measured data, expanded about 50°C . . 40
4.2.1 Piezotron test rail showing exciter, thermal chamber, force and
displacement gages. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
5.4.4 PVDF dielectric loss tangent vs temperature and frequency. Note that
the frequency axis is a linear scale . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
6.1.1 TTS expansion of data from Figure 5.1.1. 1 axis elastic storage
compliance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
6.1.2 TTS expansion of data from Figure 5.1.2. 1 axis elastic loss
compliance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
6.1.3 TTS expansion of data from Figure 5.1.3. 1 axis piezo storage
compliance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
6.1.5 TTS expansion of data from Figure 5.1.4. 1 axis piezo loss
compliance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
6.2.3 All TTS expansion curves for 1 axis elastic compliance, 50°C . . . . . . . . 91
6.2.4 All TTS expansion curves for 1 axis elastic loss, 50°C . . . . . . . . . . . . . 92
6.2.5 All TTS expansion curves for 1 axis piezo compliance, 50°C . . . . . . . . 92
6.2.6 All TTS expansion curves for 1 axis piezo loss, 50°C . . . . . . . . . . . . . . 93
6.2.7 All TTS expansion curves for 2 axis elastic compliance, 50°C . . . . . . . . 93
6.2.8 All TTS expansion curves for 2 axis elastic loss, 50°C . . . . . . . . . . . . . 94
6.2.9 All TTS expansion curves for 2 axis piezo compliance, 50°C . . . . . . . . 94
62.10 All TTS expansion curves for 2 axis piezo loss, 50°C . . . . . . . . . . . . . . 95
6.6.1 Elastic compliance 1 axis master TTS curves for all reference
temperatures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
6.6.2 Data in Fig 6.6.1 normalized at 1 Hz and a master curve fit . . . . . . . . . 102
6.6.3 Piezo compliance 1 axis master TTS curves for all reference
temperatures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
6.6.4 Data in Fig 6.6.3 normalized at 1 Hz and a master curve fit . . . . . . . . . 103
6.6.7 Elastic loss TTS master curves for all reference temperatures . . . . . . . 106
6.6.8 Data of Fig 6.6.7 normalized at 1 Hz and a master curve fit . . . . . . . . 107
6.6.9 Piezo loss TTS master curves for all reference temperatures . . . . . . . . 107
6.6.10 Data of Fig 6.6.9 normalized at 1 Hz and a master curve fit . . . . . . . . 108
7.3.1 Curve fit to permittivity data. First set of temperatures listed are data
curves, second set are curve fits using (7.4) - (7.8) . . . . . . . . . . . . . . . 116
7.3.2 Curve fit to dielectric loss data. First set of plots are data, second set
are curve fits using (7.12) - (7.14) . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
D.1 Standard linear material model showing two springs and a dashpot . . . 157
ABSTRACT
On the Material Properties and Constitutive Equations of
Piezoelectric Poly Vinylidene Fluoride (PVDF)
Mitchell L. Thompson
Horacio A. Sosa
PVDF were measured over a temperature range of 20°C to 80°C and a frequency range of
thermorheologically simple (TRS) behavior for the elastic properties and established that
the piezoelectric behavior is also TRS. The form of the piezoelectric TTS expansion was
identical to that of the elastic expansion, implying that the mechanisms responsible for
equations describing both viscoelastic and piezoelectric properties over temperature and
frequency were constructed using these expansions and compared to measured data.
The dielectric properties of PVDF were measured over the range of -60°C to 80°C
and from 20 Hz to 1MHz. Cole-Cole and Vogel-Fulcher equations were combined and
for piezoelectric materials in the frequency domain. A novel technique was employed to
test the ability of the elastic, piezoelectric, and dielectric property equations to predict
CHAPTER 1 INTRODUCTION
1.1 Background
sensors and actuators. These devices range in complexity and sophistication from the
ultrasound arrays used in biomedical imaging to the tonal buzzers used in automobile
horns, from high intensity focused ultrasound (HIFU) arrays which can thermally ablate
The vast majority of piezoelectric materials found in the marketplace today are
inorganic ceramics such as lead titanate (PbTiO3), lead zirconium titanate (PbZrTiO3),
lithium tantalate (LiTaO3), and barium titanate (BaTiO3). Most of these perovskite
materials were pioneered in the late 1940's and 1950's [3], and are characterized by high
elastic moduli, high dielectric constant, low elastic and dielectric lossiness, and high
have proven successful in many applications, they have a number of inherent limitations:
i) Low yield strains, on the order of 0.2%, eliminate ceramics from high strain
sensing applications such as flexure in helicopter rotor blades and in fishing rods.
Biomedical applications such as foot strike force or bite pressure are also impractical for
ceramic materials.
ii) Brittleness makes these materials prone to fracture and crack propagation, and
makes the use of ceramic materials in impact, shock, and ordinance applications
negative stresses must often be preloaded into compression to ensure mechanical stability.
iii) The density of ceramic materials is high, creating problems for weight sensitive
applications such as naval hull mounted and geophysical towed array sonar systems.
iv) The acoustic impedance of ceramic materials (a function of density and stiffness) is
high, providing poor acoustic coupling to lower impedance materials like water or human
tissue.
v) The raw materials and basic processing costs of piezoelectric ceramic and single
crystal materials are relatively high per unit volume, and batch to batch variations in
polymeric piezoelectric materials. Poly vinylidene fluoride, PVDF, is the foremost of this
robustness, toughness, yield and useful operating strain, density, acoustic matching to
tissue and water, chemical inertness, relative ease of manufacture, low material and
designer must have both constitutive equations and the necessary material property data.
Linear electro-elastic constitutive equations are commonly used to express the coupling of
dielectric, elastic, and piezoelectric properties in piezoelectric materials [4]. The material
properties used in these equations are treated as single valued constants in practical use,
even though they may be functions of temperature, frequency, field, and/or stress.
3
stress [6], allowing designers to graphically select material properties for conditions of
interest. Piezo ceramic manufacturers do not normally provide material property data as a
function of frequency [5-7] because most properties are relatively time invariant.
Material property data reported graphically does not allow closed form numerical
it is evident that material properties provided in this manner cover a discrete range of
temperatures or frequencies, and therefore the constitutive equations cannot be solved for
Piezoelectric PVDF is a polymer, and as such its material properties are affected
by temperature and frequency. The leading commercial supplier of this material publishes
only limited isochronal or isothermal data [62]. There are other studies of PVDF material
properties in the literature but there is no single work which provides a large range of
Since functions have not been developed to fit the material properties of inorganic
piezoelectric ceramics because of their complexity, functions for polymeric PVDF may
seem unrealistic. The problem is less difficult than may be expected, however, because
with certain polymers it is possible to extrapolate elastic properties over a very broad
range of temperature and frequency from a limited set of measurements. The Time-
4
polymers. A considerable body of work exists regarding the use of this method, as
presented in Ferry’s definitive book [12]. The WLF TTS method described in [12] is
empirical but is derived from detailed studies of the mechanisms of viscoelastic behavior in
among polymer classes. This work will use the WLF TTS approach to extrapolate the
elastic properties of PVDF, and will also attempt to use this technique to extrapolate
as discussed in chapter 2, a search for references which specifically explore the viscoelastic
properties of piezoelectric PVDF returned only four articles. All of these were authored
by research groups at Montana State University [8-11]. Schmidt [8] lays out a general
method for studying the viscoelastic properties of PVDF and suggests an extension of this
effort to include piezoelectric properties as future work. Vinogradov and Holloway [9]
show experimental results and extrapolation of elastic properties across a broad frequency
piezoelectric or dielectric data. As with PVDF material property data reported by other
voltage and phase angle relative to the applied strain under known conditions of
temperature and frequency. They suggested in their conclusions that the piezoelectric
properties of PVDF were time and temperature invariant. A review of their approach led
this author to conclude that a more detailed empirical investigation was warranted.
modulus and creep compliance of PVDF which was based upon the elastic data measured
earlier. She constructed equations for curve fitting these time domain functions and
concluded that power law relationships are appropriate in the time domain for these elastic
properties. She did not construct piezoelectric constitutive equations using these results
and did not discuss piezoelectric or dielectric material properties. Frequency domain
equations are useful to show the various coupling effects in piezoelectric materials. Also
in chapter 7. Although these fundamental equations provide some insight, they are of little
practical use to the designer when the relevant material properties are not provided as
It is the intent of this thesis to formulate more direct and effective constitutive
i) Design and build an apparatus suitable for testing the elastic and piezoelectric
ii) Measure the dielectric and the in-plane elastic and piezoelectric properties of
PVDF over a wide range of temperatures and frequencies. Present a complete set of data.
iii) Using this data and the WLF Time-Temperature Superposition principal, establish
useful functions to approximate these material properties over a much broader frequency
and temperature range. Further, a significant objective is to determine whether or not the
piezoelectric behavior can be predicted using the TTS approach in a manner identical to
that used to predict elastic properties. This has not been addressed in the literature.
iv) Measure dielectric properties over temperature and frequency, and investigate the
use of the TTS approach to create functions for this complex behavior.
vi) Validate the material property functions empirically by measuring PVDF behavior
1.5 Organization
used to make material property measurements. Elastic, piezoelectric, and dielectric data
are presented in chapter 5. The elastic and piezoelectric data is expanded using TTS, and
the resulting master curves are shown in chapter 6. Functions are also developed to match
this expanded data over a broad temperature and frequency range. The dielectric data is
analyzed in chapter 7 and the dielectric properties are given as functions of frequency and
procedure by which the material property functions are verified outside of the measured
frequency range. Summary and conclusions are presented in chapter 10. Appendix A
2.1 Background
All crystal structures can be classified into one of 32 possible forms of crystal
symmetry [13]. Eleven of these forms are centrosymmetric. Of the remaining 21 non -
crystal groups there is a permanent electric dipole, and the equilibrium of the electrostatic
electric) crystal structures typical of common ceramic ferroelectric perovskites (ABO3) are
Rochelle salt is the earliest reported piezoelectric material [14, 15]. It was first
produced in France in 1665 for medicinal use by pharmacist Elie Seignette. Brewster
discussed the pyroelectric properties of this material in 1824. Pioneering work on the
direct piezoelectric effect (stress Y charge) in this material was presented by Jacques and
Pierre Curie in 1880. In 1881, Lippmann proposed the converse piezoelectric effect based
upon thermodynamic principals and this outcome was verified by the Curie brothers,
whose early efforts included natural crystals such as tourmaline, topaz, quartz, in addition
to Rochelle salt. Their work resulted in the development of the first scientific
9
instruments using the piezoelectric effect to measure force in the direct mode and high
century, in part stimulated by military interests arising from World War I. A major
outcome of this research was the use of piezoelectric quartz in acoustic projectors and
Schrödinger in 1912, and was more firmly established by Valasek in the 1920's primarily
especially for use in radio communications and underwater acoustic applications The
discovery of BaTiO3 and other highly piezoelectric materials with a perovskite structure in
the latter half of the 1940's by researchers in the US, England, Russia, and Japan led to a
renewed interest in the study of ferroelectric materials. In the early 1950's ferroelectric
lead zirconium titanate ceramics (PZT) were introduced with even higher performance.
This precipitated further work and led to a greater understanding of the structure and
the last four decades has lead to the use of piezoelectric ceramics in a wide variety of
commercial, consumer, and military applications [2] ranging from inexpensive tonal
buzzers used in toys to sophisticated ultrasound imaging transducers used in the latest
medical procedures, from consumer fish finders to highly complex submarine sonar
systems, and from simple grill ignitors to all manner of force and acceleration sensors.
11
Very weak piezoelectric effects have been reported in biological tissue and other
organic materials since the 1950's, but it was not until 1969 that useful levels of
investigation into the electret properties of various synthetic polymers in that year, Kawai
[18] discovered that drawn and electrically poled poly vinylidene fluoride showed
piezoelectric behavior in a number of other polymers as well [1, 51-59]: Poly vinylidene
cyanide and its copolymers; aromatic and aliphatic polyureas; poly vinyl chloride; aromatic
blends with poly methyl methacrylate (PMMA); poly vinyl fluoride; poly vinyl acetate; and
ferroelectric liquid crystal polymers. Lang [60] has published a number of bibliographies
ceramic composite materials. To the author’s knowledge, with the exception of those
specific references identified in chapter 1, none of this work has addressed the viscoelastic
behavior of PVDF or the effect of this behavior on the piezoelectric performance of PVDF
copolymers show the most significant piezoelectric behavior by far. The VDF/TrFE
12
copolymer composition and synthesis processes have a large effect on the elastic,
dielectric, and piezoelectric properties of the resulting material. Also, these copolymers
are expensive (>$250/lb resin), extremely difficult to produce, and account for a very
is inexpensive ($8/lb resin), accounts for the virtually all of the commercially significant
piezoelectric polymer applications, and has properties which are relatively unaffected by
synthesis conditions. For these reasons this work will focus on PVDF.
crystal volume fraction of about 50% after melt extrusion. The crystal structure after melt
required to induce the solid state phase transition from the " phase to a highly polar $
phase with a planar zig zag, all trans (TTTT) chain configuration. Figure 2.2.1 shows
space models of both the " and $ crystal phases. Draw ratios of 3.5 to 5 are needed with
accurate temperature and draw rate control. Subsequent poling of the resulting film rolls
is done under controlled temperatures at fields in excess of 100 V/µm [61]. The films are
then thermally annealed to allow the controlled mechanical relaxation necessary to provide
commercially stable material. The material properties of piezoelectric PVDF are made
more anisotropic because of this process history, as the large degree of microscopic order
resulting from the orientation reduces the in plane 1 axis randomness and makes the
macroscopic piezoelectric behavior more consistent with that of the microscopic 2mm
point group symmetry. The detailed morphology and fundamental basis for piezoelectric
13
components of the permittivity, piezoelectric, and stiffness tensors are non-zero and
unique. Piezoelectric coefficients are defined by the relationships between the elastic (T,
following chapter. For example, for PVDF and other materials having 2mm symmetry, we
*,11 0 0 *
,= * 0 ,22 0 * (2.1a)
* 0 0 ,33 *
*0 0 0 0 d15 0 *
d= *0 0 0 d24 0 0 * (2.1b)
*d31 d32 d33 0 0 0 *
The typical crystallographic coordinate axes used in (2.1) are shown in Figure 2.2.2.
Writing indices 11, 22, 33, 23, 31, 12 as 1, 2, 3, 4, 5, and 6 allows the third order tensor d
Due to the difficulties associated with the orientation and polarization of PVDF it
is only produced commercially in films, typically between 6 and 150 µm thick. Although
14
biaxial orientation (stretching in both in-plane axes) is possible, it produces film with lower
but laterally isotropic piezoelectric properties. The vast majority of commercially available
PVDF is uniaxially drawn as this provides a much higher level of piezoelectric response in
the axis of orientation (1 axis). Uniaxially oriented films are studied in this work.
PVDF is used in the length extensional mode (1 axis) in well over 90% of practical
applications [62] as a result of the in plane anisotropy. The motivation for stressing the 1
axis as opposed to the 2 axis can be easily understood by comparing the piezoelectric
coefficients in Table 2.1, where d32 . d31/10 (d32 is the 2 axis coefficient, d31 is the 1 axis
coefficient, as will be discussed in detail in chapter 3). The motivation for utilizing the 1
axis as opposed to the 3 axis is not so apparent, as their piezoelectric coefficients are
similar. To highlight the differences, it is helpful to compare the voltage output from
applying a force load to the flat face of a piece of film (in the 3 axis) laying on a rigid
surface to the voltage obtained from applying the same load to the edge of the film in the 1
direction (see Figure 2.2.3). In each case the simple form of the equation for open circuit
(2.2)
(2.3)
The thickness of the film is typically in the range of 6 to 150 µm, and the length of even
15
whenever possible designers will utilize the 1 axis, and the major effort in this work will
polymeric and ceramic materials. Table 2.1 contains published material property data, and
large differences are apparent in density, dielectric constant, and elastic compliance.
However large the differences in this data, measured at a single frequency and
temperature, the differences throughout the normal range of operating temperatures and
frequencies are more severe. To emphasize this, Figures 2.2.4 through 2.2.8 compare
additional published properties of PVDF [1] and PZT5A [5] in the temperature range
from 0°C to 80°C. It is important to note that these curves represent behavior measured
at the frequencies indicated. The viscoelastic nature of PVDF can be clearly seen in the
elastic storage and loss moduli, whereas the PZT5A modulus is effectively constant in this
temperature range.
16
Figure 2.2.1 Space filling model of the polar $ crystal form (top) and the
non polar " crystal form, bottom. Black = F, white = H (from [1]).
40%
30%
% Deviation from
20%
Room Temp
10%
0%
-10%
-20%
0 20 40 60 80
Temperature (C)
PZT5A PVDF
40%
30%
% Deviation from
Room Temp
20%
10%
0%
-10%
0 20 40 60 80
Temperature (C)
PZT PVDF
50%
40%
% Deviation from
30%
Room Temp
20%
10%
0%
0 20 40 60 80
Temperature (C)
PZT PVDF
40%
20%
% Deviation from Room
Temp 0%
-20%
-40%
-60%
0 20 40 60 80
Temperature (C)
PZT PVDF
80%
60%
% Deviation from
Room Temp
40%
20%
0%
0 20 40 60 80
Temperature (C)
PZT PVDF
This chapter introduces the classical constitutive equations developed for inorganic
procedure for predicting material properties outside of the range of measured data. It is a
major focus of later chapters to apply this technique to both the viscoelastic and
familiarize the reader with the fundamentals upon which the remainder of this work is
based.
Appendix B contains a summary of the field equations and electrostatics which underlie
The general constitutive equations commonly used to describe the linear behavior
of piezoelectric materials - away from coercive fields, crystal form phase transitions, or
other anomalies - are derived in a straight forward manner from basic thermodynamic
(3.1)
22
(3.2)
which leads to
(3.3)
properties are defined by the second derivatives of the Gibbs free energy with respect to
the appropriate variables (parameters subscripted to the right of the bar or superscripted
below are assumed constant during the derivation). Then from (3.3):
(3.4a)
(3.4b)
(3.4c)
(3.4d)
(3.4e)
23
Other forms of the piezoelectric coupling coefficients are commonly used, and they
(3.5a)
(3.5b)
(3.5c)
(3.5d)
Further, the piezoelectric coefficients are related by the material properties , and s. For
example:
(3.6)
The linear results of this approach provide the basic constitutive relationships of interest
[3],
(3.7)
(3.8)
24
(3.9)
dependent variables. Helmholtz free energy functions can be applied as well [64],
polarization reversal are extremely complex [65] and will not be addressed here.
It is important to note that the coefficients of the material property tensors used in
these classic equations, s, d, ", ,, and p, are defined with the constraint that some
by the linear nature of these equations. All of these parameters are also defined under
these equations to predict behavior, both the operating temperature and the material
properties at that temperature must be known for the given boundary conditions. In
practical terms, this derivation implies that temperature variations resulting from heat
generation due to electrical, piezoelectric, and mechanical losses will have an insignificant
Note that the material properties are not time dependent in the derivation shown
properties is prohibitively complex and generally does not produce useful results [12].
Polymers are composed of long chain organic molecules - in PVDF, for example, the
typical chain length may be 100,000 monomer CH2-CF2 units. The interaction of adjacent
chains is both physical (stearic) and ionic in nature, and impediments to chain motion are
is so complex, many simpler mechanisms have been proposed in order to explain specific
predictive equations. For example, Drosdov [71] suggests a mathematical model based
upon adaptive links, which are effectively elastic links between polymer chains that stretch,
break, and reform during viscoelastic strain. Dafalis [70] discusses changes in the
conformation of polymer chains without slipping, meaning for example that the chains may
wind or unwind from helical or spring like shapes. Ferry [12] based the WLF approach on
the progressive disentangling of long chain polymer molecules under stress. Matsuoka
[88] among others has proposed a model relating viscoelastic behavior to polymer
mathematical models for specific behaviors, they are often expanded to classes of
polymers which as a group may exhibit these behaviors. Polymers in the class generally
content, degree of cross linking, additives, etc. Also, different mechanisms may be used to
predict a specific behavior of the same polymer depending upon whether the material
ageing [89].
26
This subject has been extensively explored [30, 64, 66-83], and there are a number
materials which are considered classical. Spring and dashpot mechanical models are
probably most often used to construct ‘ideal’ viscoelastic material behavior, with the
Maxwell (spring and dashpot in series) and Voigt (spring and dashpot in parallel)
configurations most common. The Standard Linear Material model (SLM) is a more
acknowledged that these simplistic single and dual element models are not adequate for
most real viscoelastic materials, it is instructive to explore SLM behavior [12, 84, 85].
Harmonic excitation of the SLM leads to a first order DeBye type relaxation [86]
(3.10)
(3.11)
(3.12)
where Y ! and Y!! are the modulus storage and loss components, and Y0 and Y1 are
constants. Y* is written in complex notation and known as the complex modulus. See
Figure 3.2.2 for time and frequency domain normalized plots. Details of the derivation of
In the time domain, the one dimensional SLM model subjected to a step function in
strain exhibits an instantaneous elastic stress response combined with a first order stress
decay. It is convenient to think of this response from the perspective of a modulus that is
(3.13)
with Jr as the relaxation time constant for the decaying component. Expanding (3.13)
(3.14)
28
0
0.01 0.1 1 10 100
Frequency (Hz)
This expression is useful for step function strain only, but it can be expanded to
include a time varying strain history by breaking this history into an infinite series of small
step functions. Each of the individual step functions is then allowed to produce a resultant
decaying stress function, and all of these are summed. The resulting form
(3.15)
(3.16)
Here t is time and J is the integration variable. Although relationships between stress,
29
processes, in isothermal cases these relationships can in fact be represented over limited
Voigt elements with carefully chosen parameter values exhibit relaxations at different
frequencies which may be summed together to provide a spectra of first order relaxations
(3.17)
The use of this type of spectra to fit data is discussed by many authors [12, 84, 85,
74]. See Figure 3.2.3 for an example of this approach. Typically it is necessary to have at
least one relaxation per frequency decade [85] for well behaved data, and higher densities
may be required for ill behaved data. The assignment of relaxation frequencies is arbitrary
and done to fit the data. (3.17) can be expanded to produce an equation similar to (3.16).
In a similar manner the response of the SLM to a step function stress can be
characterized by creeping, wherein the strain exhibits an initial and immediate response,
S0, followed by an additional time dependent first order strain with an asymptote of S1.
(3.18)
(3.19)
(3.20)
Here s(t) is the creep compliance. Note that the creep time constant, Jc is not generally
equal to the relaxation time constant Jr for even the ideal SLM model. Again, this
expression for creep can be expanded using a spectrum of time constants in order to match
empirical data,.
(3.21)
31
(3.22)
(3.23)
This equation is expanded to include time dependent stiffness and arbitrary strain histories,
(3.24)
The time dependent nature of the elastic stiffness is conveyed in the c(t-J) term.
Without the assumption of spacial homogeneity this term would include a positional
(3.24) reduces to
(3.25)
when the strain function is continuously differentiable in time. Again, this equation may be
incremental strains in the time domain. The form of (3.25) may be used to predict
32
histories.
(3.26)
important to note that the time dependent elastic compliance in this equation is not
temperature dependent. (3.26) alone is therefore not adequate for predicting the behavior
The fact that polymers are viscoelastic in nature does not preclude the use of
purely elastic constitutive equations. If a solution for the behavior of a purely elastic
material under specific loads is known, often times equivalent solutions for viscoelastic
materials in the same circumstances can be formulated using what is known as the
correspondence principle [12, 63, 84, 90]. In this approach, equations such as (3.26) are
not useful, as the elastic modulus of the material must be replaced by the complex
modulus in the governing equations for the problem. The resulting complex solution is
frequency dependent and provides both magnitude and phase angle components. Success
with this approach requires knowledge of the complex material properties in the frequency
this work, wherein the compliances in the classical elastic constitutive equations are
modified to include viscoelastic behavior. In addition the TTS technique, used in later
chapters to increase the useful range of material property data, yields a frequency domain
form that is compatible with the correspondence principle. Further, this work will expand
work and material property extrapolation contained in later chapters is intended to provide
the data necessary to allow the constitutive equations to be useful over wide frequency
This author found only a small number of references discussing either general
specific to PVDF. These are presented here briefly as background. Kamlah and Jiang
[91] provided constitutive equations for history dependent piezoelectric PZT behavior, but
the focus of their work was on ferroelectric switching hysteresis and not viscoelastic
behavior. Padilla et.al. [92] have recently published interesting work dealing with the
constitutive structure for ferroelectric PVDF that accounts for large strains, but they do
piezoelectricity [75]. Their work shows a derivation of the complex elastic, dielectric, and
34
PZT/polymer composite model. Coefficients used in their analysis are complex but
compositional effects, and therefore their results are not directly useful in this work.
Lynch [32] has framed the constitutive relations of viscoelastic PVDF in integral
time domain terms similar to those of Lake [84]. Although this form is elegant, neither
author provided any useful characterization of the time dependent material properties
required by these equations, and neither addressed the issue of temperature dependence.
These researchers have proposed the inclusion of time dependent piezoelectric terms into
(3.32), yielding the following equations for strain and electric displacement:
(3.27)
(3.28)
assuming linear behavior and superposition. In order to use this approach, step function
reactions of charge displacement and strain need to be measured against applied stress
over a large range of times. These measurements need to be repeated a number of times
at each test case in order to reduce noise through averaging, and then repeated at different
through curve fitting and data analysis. Although this approach is feasible, the resulting
35
constitutive equations are limited to the range of frequencies and temperatures measured.
The alternative to the time domain integral constitutive form shown in (3.27) and
(3.28) are the elastic equations (3.14) and (3.15), applied through the correspondence
principle in the frequency domain. In this case material properties are measured as a
function of frequency over a number of temperatures. Aaveraging and curve fitting are
and temperature. The most important reason for casting constitutive relationships in the
frequency domain for PVDF is the possibility of using the Time - Temperature
temperatures and frequency beyond those actually measured - and therefore create
below, the frequency domain TTS approach has been developed over many years and is a
temperature, polymers tend to become harder and less lossy. The influence of frequency
and temperature on the elastic properties of polymers has been studied extensively [81, 82,
for example] and is the subject of a classic text by Ferry [12]. A methodology for using
predict these properties over a range much wider than measured was formalized by
Williams, Landel, and Ferry (WLF). This method uses a reduced variable approach to
36
The use of a frequency ‘shift factor’ fundamental to the WLF technique and allows
decreasing temperature with increasing frequency. This shift factor, a(2), is a function of
(3.29)
the temperature at which material properties are measured, and 1 = 2 - 20. The shift
factor is used to map measured material properties from the temperature and frequency of
or (3.30)
(3.31)
the frequency at which data was measured at temperature 2, and f0 is the frequency at
which the same material behavior can be expected at the desired reference temperature,
20. TRS materials are, by definition, materials for which this approach is valid. The
constants C1 and C2 are unchanging for a given TRS material assuming no phase change,
37
and can be used to map both the storage and the loss terms of various material properties.
different temperatures over a frequency range. To simplify the explanation, assume that
temperature j. The raw data can be plotted as Qij versus fi, with different curves resulting
for each value of temperature, j, together on the same plot. The TTS mapping is
accomplished graphically by plotting Qij against f* for all i and j, where f* = (fi)[a(1j)].
Recall that there is an assumed reference temperature, 20, in the a(1) term, so that the
entire mapped curve shows data reduced to this temperature. This means that at the
reference temperature, the value of Q may be selected from the curve as a function of the
dimensional contraction and the resulting curve yields parameter values plotted against
Figure 3.4.1 shows an example plot for PVDF elastic compliance. Graphically
stated, a reference temperature is chosen and the material property data at that
temperature is not altered on the frequency axis. A shift factor is calculated for each
remaining set of isothermal data, and data taken at temperatures above the reference
temperature is shifted to the left towards lower frequencies while data taken at lower
temperatures is shifted to the right towards higher frequencies. Ideally, the data curves
can be shifted such that they join and a single “master curve” emerges, representing the
material property of interest at the reference temperature but extrapolated over a much
selection of the constants in the WLF equation, which determine the magnitude of the shift
factor. These constants are chosen to provide the best possible master curve across a
0.9
0.8 Increasing Temperature
Compliance, 1/GPa
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
-2 -1 0 1 2
Log Frequency (Hz)
25 35 50 65 80
A limitation in the use of the WLF approach is that, although the expanded
frequency range (f0 in (3.30)) may be many orders of magnitude larger than the measured
data, the desired or reference temperature to which the measured data is reduced, 20,
must generally be within the temperature range of the measured data. Choosing 20
outside of the measured temperature range results in a shifted frequency range that does
not include some or all of the measured frequency range - an unacceptable trade off
39
typically. It may seem that a form of WLF expansion using a temperature shift factor
range, but this approach is extremely complex and does not generally yield useful
correlation to experimental data [12]. Clearly the utility of the WLF equation would be
frequency extrapolation.
1.0
Compliance (Gpa^-1)
0.8
0.6
0.4
0.2
0.0
-10 -5 0 5 10
Log Frequency (Hz)
For PVDF, it appears initially that the empirical elastic and piezoelectric
(3.32)
40
at least over the temperature range measured in this study. Here U is the activation
energy and k is the Boltzmann constant (1.38 @10-23 J/°K). The accuracy of the initial
Arrhenius expansion about 50°C can be seen in Figure 3.4.3 where U = 1.054@10-20 J, or
about 6.32 kJ/mole. The net effect of this expansion is to map material property data
estimation over the same range of frequency. Note that although the form of (3.32) is
0.8
Compliance, Gpa^-1
Increasing Temperature
0.7
0.6
0.5
0.4
0.3
-2 -1 0 1 2
Log Frequency (Hz)
25 35 50 65 80
25A 35A 65A 80A
Figure 3.4.3 ‘A’ curves are Arrhenius fit to measured data, expanded about
50°C.
This is quite a significant finding in that it opens up the possibility that the
measured data can be extended over a wider temperature range prior to the construction
41
of the WLF master curve. This in turn produces master curves with a much wider
isothermal material property data curves plotted against frequency (larger vertical
separation), when curves above and below the reference curve are shifted to lower and
higher frequencies respectively, the magnitude of the shift is more significant. A review of
elastic compliance versus temperature data for PVDF from other sources [1, 20] which
show isochronal data over a broader temperature range than measured in this work
indicates that the Arrhenius expansion of material properties may be valid from about -20
°C to about 85 °C. If this enhanced temperature range is used the resulting master curves
will contain several orders of magnitude more than the present curves, which are based on
the 20° to 85°C data. This proposed expansion will be discussed in depth in Chapter 6.
Ferry [12] raised the possibility that the WLF technique may be useful for
modeling the dielectric properties of polymers as well as their viscoelastic properties. This
CHAPTER 4 MEASUREMENTS
As discussed in the introduction, the only references identified by this author which
published by the ferroelectrics group at Montana State University [8-11]. They produced
and from 25°C to 81°C. They used both creep techniques (time domain) and frequency
techniques to measure elastic property data. Their dynamic elastic data collection
technique was not specifically detailed but they reported measuring stiffness magnitude
and phase angle. Their piezoelectric data collection was done by measuring oscilloscope
voltage traces in the frequency domain. This data required compensation due to the
interface between the frequency dependent source impedance of the PVDF sample and the
instrument impedance. They did not report specific piezo coefficient values, only peak to
Extrapolation of d31 and d32 information from their data is difficult because they did not
In this work, elastic and piezoelectric measurements were taken at 20 (25 in some
cases), 35, 50, 65, and 80°C. Measurements at each temperature were made at 80
different frequencies in logarithmic progression with 20 points per decade over 4 decades
from 0.01 to 100 Hz. Data collection was fully automated. See Appendix C for detailed
43
instrumentation specifications.
work. Pictures of the test base and associated test instrumentation are shown in Figures
tension preload and a smaller sinusoidal load were applied to one end of a sample under
test. The displacement of the sample was measured at the point where the load was
applied and the load was measured at the opposite end of the sample, which was clamped
to the load cell. A single displacement transducer provided sufficient accuracy in this
measurement system because the load cell, the load cell mounting structure, the drive rods
applying load to the sample, and the support structure for the exciter had an effective
spring constant much higher than the equivalent spring constant of the sample under test.
Displacement of any part of the mechanical structure other than the sample under test was
considered noise, and significant effort was applied to reduce this by making the system as
stiff as possible. A spring - mass - dashpot schematic of the system is shown in Figure
4.2.6. Actual measurements of system displacement magnitude and phase are shown in
Figure 4.2.7. These were made with a metal sample having a spring constant roughly
three orders of magnitude higher than the PVDF samples tested. This data was measured
frequency domain elastic measurements. A subtle resonance can be seen at about 600 Hz,
most likely due to the compliance of the load cell, and this limits the safe upper test
frequency to 100 Hz. Calculations from the data in Figure 4.2.7 indicate a peak system
displacement on the order of 0.05 µm at 100 Hz, showing that the apparatus was
sufficiently stiff below this frequency - typical sample displacements were on the order of
44
35 µm. The -20° phase shift shown in Figure 4.2.7 at 100 Hz is not meaningful given the
It must be noted that although the stiffness of the measurement system is quite
high and the resulting high frequency resonance with a stiff sample is not significant, there
are other inertial issues which become important as the displacement increases when
measuring polymer samples. There is a mass associated with the exciter, as shown in
Figure 4.2.6, and this mass forms another resonance with the compliance of the PVDF
samples. In order to make sure that this resonance event is not close to the frequency
range being measured, the length of the samples is limited to about 20 mm. The focus on
keeping any resonance behavior away from the frequency range tested is required in order
to use static equations to deduce material properties - far simpler than using dynamic
equations of motion.
The system had a rigid cast steel base and the framework of a small thermal
chamber from an older Toyo Rheovibron originally used to test material elastic properties.
A T bar slot in the center of the base allowed placement and alignment of the major
The pyroelectric response from PVDF is significant (on the order of 8 V/°C open
circuit), and very small changes in temperature can produce charge equivalent to or larger
than the charge produced when stressing the film to measure piezoelectricity . It was
therefore very important that the chamber used for testing the piezoelectric properties of
PVDF not allow the film temperature to change during isothermal frequency sweeps.
45
Figure 4.2.1 Piezotron test rail showing exciter, thermal chamber, force
and displacement gages.
These temperature changes were most critical at lower frequencies, as the thermal
mass of the film sample minimized high frequency pyroelectric noise. Also, thermally
induced pyroelectric charge outside the measurement bandwidth had a reduced effect on
the piezoelectric measurements because the DSA uses very strong digital filtering
functions to exclude all frequencies but the frequency being measured. It is interesting to
note that the minor temperature changes which may seriously affect the piezoelectric
and new insulation, signal wiring, and gasket assemblies. Special isolated interconnection
springs were fabricated and installed on the inside of the chamber and were wired to BNC
connectors on the outside of the chamber housing with fully shielded high temperature
coax cable. Thermal insulation was packed around the cable path to eliminate heat loss.
The thermal mass of the chamber was made quite high by using a large aluminum heat
exchanger block in order to increase the time constant of temperature fluctuations in the
chamber. The temperature controller had both heating and cooling functions. The heating
function applied 120VAC to a 100W resistive heater coil embedded in the large aluminum
mass. The cooling function switched on a solenoid valve allowing cold water to flow
through a copper cooling coil embedded in the same mass in the chamber. The PID
(proportional, integral, and derivative) controller parameters were set to initial conditions
and then allowed to auto-tune for the highest temperature stability prior to testing
samples. The RTD temperature sensing probe used by the controller was attached to the
large thermal mass using a thermally conductive silver filled epoxy in order to eliminate
carefully set to further reduce coherent low frequency thermal noise. For example, when
the system was first assembled the controller applied heat and then switched to a cooling
cycle in order to maintain an exact set point. The cooling cycle was initiated every 45
seconds or so, and even though it only lasted for several seconds this caused a severe
thermal noise problem at a frequency having a period of 45 seconds - about 0.02 Hz. A
small aluminum baffle was also constructed and placed around the sample inside the
thermal chamber to eliminate any thermally induced air currents. The outer shell of the
thermal chamber was heavily insulated with high temperature fiberglass material to prevent
changes in room temperature or the operation of the laboratory HVAC system from
affecting measurements.
The mechanical clamps used at each end of the sample under test were developed
for this work and were specifically designed for compliant thin film materials. The clamps
and their operation are shown in Figure 4.2.8. Special tooling was built to allow accurate
orientation of the sample films in the clamping blocks. Spring loaded clamps were not
used due to the increased mass required for the spring and its housing. Likewise screw
together clamps were avoided in an attempt to reduce mass. The final T slot solution used
the minimum amount clamping material and yet provided maximum stiffness. The major
drawback to this approach is the amount of time required to carefully mount and glue each
sample.
The size of the existing thermal chamber and the requirement to use relatively
short sample lengths required the use of long connecting rods on both ends of the sample.
Dampening of lateral vibrations in these clamp support rods was accomplished using
49
donut shaped silicone rubber diaphragms. The diaphragms fit snugly around the
connecting rods and the outer diameter was attached rigidly to the test chamber wall (see
Figure 4.2.9). These diaphragms offered high compliance in the direction of sample
motion (rod axis) but were relatively stiff in lateral directions (rod radius). Dampening of
lateral rod vibrations was essential to eliminate phase and magnitude artifacts induced by
lateral rod vibration resonances at higher frequencies. In fact, the upper frequency limit of
The force generator was a 3.8 ohm voice coil exciter manufactured by Toyo
Corporation. The exciter was driven by a 180 watt Bruel and Kjaer model 2712 power
amplifier capable of operating from DC to 100 kHz. The power amplifier input signal was
The HP3562A is a dual channel, self calibrating multifunction DSA rated from
64µHz to 100kHz. Over the measurement bandwidth of .01 Hz to 100 Hz, the DSA has
an input noise equivalent to 36 µNrms force, 6.1 Drms displacement, and 2 10-15 Coulombs
compensation. Although this phase accuracy is sufficient for most measurements taken
with a DSA, it was borderline for the kind of resolution required to provide accurate
The force on the sample under test was measured by a semiconductor load cell
rigidly attached to a machined steel mount. The mount was fixed rigidly to an adjustable
carriage assembly which allowed manual pre-tensioning of the sample. The load cell was
calibrated at the factory and the calibration was verified after mounting through the use of
small weights.
51
The displacement of the driven end of the sample (left side in Figure 4.2.1) was
measured by a commercially available non-contact eddy current sensor. The sensor output
over the displacement range of interest using a precision dial indicator attached to the
adjustable carriage assembly and a rigid 10 mil BeCu test sample. During actual testing
the displacements undergone by the film samples were so small that the eddy current
transfer function was considered linear about the initial measurement point.
Charge was measured using a Kiethley 610C Electrometer, typically set to the 10-9
Coulombs scale. Output from the electrometer was set at 1 Volt per nanoCoulomb. The
interconnection wiring was a guarded four wire arrangement up to the BNC connectors on
the thermal chamber in order to provide maximum accuracy and noise suppression. The
Kiethley electrometer was calibrated over the frequency range of interest using a precision
capacitor and the DSA voltage drive source, and the data recorded for compensation.
controller to collect data from the DSA after every scan. All other system data was
The dielectric data was measured using an HPIB (Hewlett Packard Interface Buss)
sample holder was built to minimize inductive compensation and standard 4 wire dielectric
measurements were taken inside a separate thermal chamber. The chamber was capable of
maintaining temperature from -60°C to 200°C under remote computer control on an HPIB
bus. Custom software was written for the control computer to automatically step the
chamber through a desired temperature range at 10° per step. At least 30 minutes were
53
allowed at each temperature for settling, and the control software ensured that the
temperature was stable before taking data. The refrigeration units and heater fans in the
chamber were automatically turned off by the computer during the relatively quick
dielectric measurements in order to minimize noise. The LCR bridge was calibrated using
precision air capacitors, and the sample holder was auto-compensated before each
measurement run. Data was read directly from the LCR bridge over the HPIB connection
and automatically stored on a hard drive. Dielectric measurements were taken separately
from the elastic and piezoelectric measurements using samples from the same film sheet
The typical procedure for elastic and piezoelectric measurements was to mount a
film sample into the clamps, set a pre-tension on the film, and connect the electrode wires
to the internal spring connectors. The chamber was checked to make sure all gaskets and
insulation were in place, the thermal baffle was inserted, and the chamber was closed.
A set of operating parameters was then programmed into the DSA for each test
sequence, either manually or via the control computer. An example of the programmed
Once initialized, the DSA supplied the source drive signal to the power amplifier.
The power amplifier converted this signal into a large current drive to power the inductive
coil in the exciter. The exciter applied a force to one end of the film sample. For elastic
property measurements the displacement of this end of the sample was measured and the
output of the displacement sensor was fed back to channel 2 of the DSA. For
piezoelectric measurements, the output from the electrometer charge amplifier was fed
back to channel 2 of the DSA instead of the displacement signal. The other side of the
film was held stationary, and the reaction force exerted by the test fixture on the film
sample was measured by the load cell. In all measurements the output of the load cell was
The DSA measured two channels of data real time. Twenty data points per decade
were measured over four decades, with 20 to 30 averages per measurement point. A large
number of averages was used to ensure repeatable accuracy, especially at low frequencies.
The frequency response data was collected in a phase angle and dB signal versus
log(frequency) format for scale compression, allowing detection of small anomalies in the
55
Figure 4.3.2 shows a typical DSA frequency response plot. In addition, the power
spectra of both measured channels were collected versus frequency in order to provide
absolute magnitude data. The power spectra were recorded such that they provided the
peak values of the voltages from both input channels as a function of frequency.
The temperature controller was programmed manually for each temperature set
point then allowed to auto-tune for temperature stability prior to testing samples.
56
12 0.0
11 -0.5
10 -1.0
9 -1.5
Phase
dB
8 -2.0
7 -2.5
6 -3.0
5 -3.5
4 -4.0
0.01 0.1 1 10 100
Log Frequency
4.4 Calibration/compensation
Compensation spectra were run for the sensors over the bandwidth of interest in
order to determine sensor noise floors. This testing was done with all conditions as much
as possible identical to those in a normal test run. The HP3562A DSA was used to
capture the data, allowing the electrical noise contribution from the DSA to be included in
the compensation. The DSA was configured as in a normal test run, collecting power
The Kiethley electrometer was evaluated with a 330 picofarad capacitor in place of
a piezoelectric film sample in order to remove any vibrational input noise. The Entran
load cell was tested with no film sample in the clamps and with the output power from the
exciter power amplifier turned off to avoid extraneous vibrational noise. The ECS
displacement transducer was measured at the same time and under identical conditions.
57
The results of these electrical noise floor measurements are shown in Figure 4.4.1. Note
that in all cases the sensor noise floors are significantly less than 1% of the signals of
precision voltage sources in order to produce the charge nominally equivalent to that seen
in a normal run. Both magnitude and phase errors were recorded as shown in Figure
4.4.2. These errors were then used to compensate the raw charge versus frequency data
No compensation was applied to the load cell or the displacement sensor spectra
because their measured noise floors were extremely small in both phase and magnitude.
Noise Floor
18 90
16 80
Load Noise (mN)
14 70
12 60
10 50
8 40
6 30
4 20
2 10
0 0
-2 -1 0 1 2
Log Frequency (Hz)
Ele c t r o m e t e r C o m p e n sa t i o n t h r o u g h C a p a c i t o r
27.5 4
3
27.0 2
26.5 0
-1
26.0 -2
-3
25.5 -4
-2 -1 0 1 2
Log Frequency Hz
The film samples were prepared from a single film sheet of commercial grade,
polarized PVDF, roughly 12" by 12" with a nominal thickness of 30.5 µm. Samples were
plasma etched under vacuum (argon, 400W, 15 minutes) to enhance surface adhesion and
sputtered with 150 D Ni followed by 300 D of Al on both sides using an MRC 973
sputtering system. Film strips were razor cut and pieces of film were bonded onto the
special clamping blocks while held in the bonding fixture. A rubber toughened cyano-
acrylate adhesive (Loctite 401) was chosen for bonding the film samples into the metal end
blocks because of its superior strength, ability to form thin layers, high stiffness, and
handling ease. After bonding the sample to the clamp blocks, the surfaces of the exposed
sample films were patterned with a resinoid etch mask to provide clearly delineated active
regions. The positive film poling polarity was patterned with a nominal 5 mm by 15 mm
59
rectangle, and the negative side a 6mm by 18 mm rectangle. The exposed metal surfaces
were etched in a dilute solution of FeCl, and the masking resin was removed with
isopropyl alcohol. This left an electrode on the positive side that was somewhat smaller
then that on the negative side, ensuring that there would be little variation in the total
Small 36 gauge solid copper wires were attached to the positive and negative
patterned metal electrodes using silver filled epoxy (TRA-CON 2902 BiPax). Only the
tips of the wires were bonded, using the smallest epoxy pad size possible – typically ½ mm
in diameter. Although the silver epoxy is stiffer than the PVDF film sample, much less
than 1% of the surface area was covered so the effects on the elastic behavior of the test
The dimensions of the film sample captured between the clamping blocks were
measured optically to high precision, as were the active electrode areas. The film
dimensions were required to calculate stress, the electrode area was required to calculate
the piezoelectric coefficients. The thickness of the sample strips was measured using a 0.1
µm low force drop gauge (Mitutoyo LVDT style). Dimensional data for all samples is
Because the DSA is a 2 channel device, two runs were required to measure both
displacement and charge with respect to the applied load on a single sample: one run
measuring load and displacement simultaneously, a second run measuring load and charge
output simultaneously. Test conditions were kept identical for each of the two runs for a
given sample at a given temperature. After each temperature change, more than 4 hours
elapsing before the next measurements were taken. All of the samples were
61
Several samples were run without resetting the stress preload between
temperatures, and the remainder were reset to a determined value prior to starting the run
at each new temperature. A period of 2 to 4 hours was allowed for the sample to settle
after preload adjustments were made. The results do not indicate any significant
Typical test time for each sample, after the chamber was set and sealed, was about
8 hours for each of the elastic and piezoelectric measurements at each of the five
temperatures, or about 80 hours total per sample. This allowed about 4 hours for the
sample test chamber to achieve thermal stability, the film sample to completely relax, and
the pretension on the film to be stable before taking data. Actual measurement time was
The most common commercial piezoelectric PVDF films are annealed to 85°C in
order to provide thermal stability and repeatability to 80°C. When films are exposed to
85°C annealed samples were run to higher temperatures (>100°C), and then retested at
room temperature after a relaxation period. Data from these runs is given in Figure 4.6.1.
Note the distinct change in properties after returning to room temperature. In this work,
12.0 35
11.0 46
10.0 57
9.0 68
8.0 79
7.0
Change after 99C 91
6.0
99
-2 -1 0 1 2
24
Log Frequency Hz
CHAPTER 5 DATA
elastic, piezoelectric, and dielectric properties for piezoelectric PVDF. Fourteen samples
were tested using the apparatus and procedure outlined in chapter 4, although data sets
from four were rejected as they contained artifacts attributed to poor sample mounting.
Only typical data is presented in this chapter, as a complete set of data for all samples is
difficult to convey in raw form because of the number of plots (4 per sample) and because
of the density of information on each plot (5 curves per plot). A summary of the full data
set is shown in chapter 6 after the raw data was subjected to TTS extrapolation. This
process produces master curves which are less dense and simpler to interpret than the raw
data. All samples tested had properties very similar to the typical data presented in this
chapter.
All samples tested in this work had sputtered electrode metal on both surfaces.
The data presented in sections 5.1, 5.2, and 5.4 is for samples with metal. The effects of
Figure 5.1.1 shows magnitude data for the elastic compliance in units of GPa-1. All
of the data in this section is recorded in terms of the peak sensor voltages measured. The
true magnitude of the elastic storage compliance should be calculated by multiplying the
measured magnitude by the cosine of the phase angle between the applied load and the
resulting strain. The magnitudes shown in Figure 5.1.1 are actually the measured
64
magnitudes, but because the angles are very small the error will be within 0.2% of the true
value. The storage compliance in the 1 axis is monotonic, well behaved, and without
reasonable, as is the increase with decreasing frequency. These are two features
0.9
0.8 Increasing Temperature
Compliance, 1/GPa
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
0.01 0.1 1 10 100
Frequency (Hz)
25 35 50 65 80
Figure 5.1.2 shows the elastic loss tangent associated with the data in Figure 5.1.1.
The angle shown represents the phase lag between the applied load and the resulting
displacement in degrees (360 degrees per period). The increasingly negative phase angle
with increasing temperature at all frequencies seems quite natural as it indicates increasing
loss. The actual elastic loss compliance, s", is calculated by taking the product of the
compliance magnitude and the sine of the phase angle, but again the angles are so small
65
that the ratio of loss to storage elasticity is equivalent to the actual measured phase angle
in radians to within less than 0.5% error. In the range of this data the loss ratio is about
Figure 5.1.2 shows relatively flat curves above approximately 1 Hz, with
increasingly negative phase angle with decreasing frequency. The region above 1 Hz
appears to follow the basic Arrhenius relationship with temperature (see (3.32)). Behavior
at frequencies below this region is not easily explained because the losses continue to
increase with decreasing frequency. The phase measurements are inherently far more
sensitive than the magnitude measurements, as the scale used - 1 degree equals 1.75% loss
- is sensitive to changes in loss compliance on the order of 0.1%. It is not apparent from
the loss phase response that there is a relaxation at lower frequencies; if there were the
phase response would show an inflection and the storage compliance would show a
relatively abrupt shift. A reasonable extrapolation from this data appears to be a straight
line on the phase angle versus log frequency plot below 1 Hz. A concern with this type of
estimate might be that the TTS expansion will produce estimates over frequencies which
are many orders of magnitude below the lowest frequency measured, so small errors can
about 5 degrees at 80°C, indicating that the loss compliance was 8.75% of the storage
compliance. This seems reasonable for a crystalline polymer [1,12], and appears to be
supported by more limited isochronal PVDF data in the temperature range of interest [20].
collected from the same sample. Note that these curves are very similar in shape to the
66
0.0
-0.5
-1.0
Phase Angle
-1.5
-2.0
-2.5
-3.0
Increasing Temperature
-3.5
-4.0
0.01 0.1 1 10 100
Frequency (Hz)
25 35 50 65 80
30
25
Increasing Temperature
20
d31, pC/N
15
10
0
0.01 0.1 1 10 100
Freq
25 35 50 65 80
elastic compliance data shown in Figure 5.1.1. In fact, the normalized curves overlay
remarkably well at each temperature, indicating that the e31 coefficient is overwhelmingly
real (recall that e = d/s). This will be shown more clearly in the next chapter.
Figure 5.1.4 shows the associated piezoelectric loss compliance term. The general
shape of the loss curves is similar to the elastic loss in Figure 5.1.2. In this plot the
separation between the temperature curves becomes slightly more pronounced at lower
frequencies than is evident in the elastic loss. This separation will become even more
obvious in the loss curves for the 2 axis data shown in the following section.
There are two regions containing noise shown in Figure 5.1.4: at about 60 Hz
there is some minor feedthrough due to electrical mains power; below 1 Hz there is some
pyroelectric contribution from the PVDF due to the period of the temperature controller.
The 60 Hz noise has been significantly reduced by shielding. The pyro noise was more
adding baffles in the thermal chamber to reduce small temperature fluctuations caused by
air currents and by adjusting the cooling water flow rates. The pyroelectric response of
the film is about 30µCoul/(m 2 °K), or roughly 2.3 nCoul/°C for this size sample, and with
the charge values measured during the experiment on the order of several hundred pCoul,
temperature changes on the order of a 0.01 °C are detectable as noise even through a
Complex elastic and piezoelectric data from a sample cut in the transverse 2 axis is
presented in this section. Figure 5.2.1 shows the elastic storage compliance, Figure 5.2.2
the elastic loss compliance. Figures 5.2.3 and 5.2.4 show transverse piezoelectric data.
The 2 axis elastic data is identical in form to the 1 axis data. The storage
compliance appears to be a little higher, indicating that the 2 axis modulus is lower. The 2
axis phase angle is somewhat lower, suggesting that although the material is softer it is
less lossy. The numeric differences between the elastic data for the two axes are small.
Since the 1 axis clearly shows that the piezo compliance and the elastic compliance
have nearly identical behavior over temperature, it is reasonable to expect that the 2 axis
will behave similarly. However, it is quite obvious that the transverse piezoelectric
response is not similar in form to the 1 axis response. Figure 5.2.3 shows unusual
piezoelectric compliance behavior at lower frequencies. The source of this behavior is not
easily understood. The transition in the 2 axis storage compliance and the peak in the
associated loss angle suggest that there is a relaxation occurring, but Figure 5.2.4 shows
1.0
Increasing Temperature
Compliance, 1/GPa
0.8
0.6
0.4
0.2
0.0
0.01 0.1 1 10 100
Frequency (Hz)
25 35 50 65 80
0.0
-0.5
-1.0
Phase Angle
-1.5
-2.0
-2.5
Increasing Temperature
-3.0
-3.5
-4.0
0.01 0.1 1 10 100
Fre q u e n c y ( Hz )
20 35 50 65 80
shown clearly in the 2 axis elastic material properties in Figures 5.2.1 and 5.2.2. A more
convincing argument against viscoelastic relaxation is that the polarity of the phase peak in
Figure 5.2.4 is not consistent with viscoelastic loss. The strain in a viscoelastic material
lags behind the stress (a fundamental principal of causality), and the charge produced by
this strain should also lag behind the stress in time. Since the sample measurements are
made relative to the stress, the strain and charge should be expected to have a negative
In fact, the positive phase angle suggests an electrically resistive material - PVDF
with abnormally high conduction. The charge conducted through a resistive material is the
integration of current flow through the material over time. If we assume that the
piezoelectric charge production is in phase with and proportional to the applied strain on
(5.1)
material,
(5.2)
with DR the displacement from resistive conduction and D the bulk resistivity. This yields
71
(5.3)
2.5
Increasing Temperature
2
d32, pC/N
1.5
0.5
0
0.01 0.1 1 10 100
Frequency (Hz)
25 35 50 65 80
Clearly the resistive component produces a positive phase shift in this type of
term in Figure 5.4.3, where the lossiness increases with decreasing frequency and
supported by results from the 1 axis piezoelectric data. If all samples become appreciably
conductive at higher temperatures then similar loss curves would be present in the 1 axis
data. Pure resistance is a linear parameter and is independent of the magnitude of the
signal produced by the PVDF sample, so the fact that the 1 axis samples produced much
Another interesting point is that the electrometer used to measure the charge
produced by the film actually measures the voltage across a large parallel capacitor. The
actual voltage on the PVDF film sample was not exactly zero, but something less than one
volt. The impedance of the voltage measurement is greater than 1013 ohms and there is no
The attenuation of measured charge output and the positive phase shift at lower
frequencies cannot be attributed to purely resistive losses, and yet they appear to be
resistive in nature. The actual cause is not known, although this behavior may be the
result of a kind of non linear conduction where the amount of charge conducted is fairly
constant, independent of applied field. In the 1 axis case, this charge quantity is relatively
small compared to the charge measured from the film and is therefore not noticeable in the
6.0
Increasing Temperature
4.0
2.0
0.0
-2.0
-4.0
0.01 0.1 1 10 100
Frequency (Hz)
25 35 50 65 80
range of data observed. In the case of the 2 axis measurements, with much reduced
In order to test this hypothesis, the same sample was driven electrically using the
circuit in Figure 5.2.5. A low loss polyethylene capacitor having a capacitance nearly
equal to the PVDF sample was also tested using the same circuit. The results in Figures
5.2.6 and 5.2.7 clearly show that the phenomenon in Figure 5.2.4 is real and dielectric in
nature, suggesting that the cause is likely not related to unusual elastic behavior or even
possibly to the d32 mechanism itself. Attempts were made to model the PVDF sample as a
series of parallel resistors and capacitors, and capacitors with series resistance added, as
shown in Figure 5.2.8. None of the electrical models were capable of producing the
complex shape of Figure 5.2.4. If a non linear conduction mechanism is assumed and the
possible that the 1 axis parameters are also affected by this phenomenon, but the value of
This approach can be tested somewhat by close scrutiny of the 1 axis elastic data
from sample 1205-3, taken over a wide range of applied stress. The data may show slight
evidence of this behavior, but at the low stress levels necessary to get small displaced
charge in the 1 axis, it does not appear to be nearly as evident as in the 2 axis. Thermal
noise makes it difficult to interpret this piezo phase data precisely. Sample 1205-3 is
discussed in more detail in section 6.4. The 2 axis data is presented as measured, and a
more detailed investigation of this interesting behavior will be the subject of future work.
The author is aware of a single reference in the literature showing this unusual
behavior. Furakawa and Fukada [20] measured properties of piezoelectric PVDF in 1981.
74
In their data they show d32! and d32" measurements taken at 10 Hz across a wide
temperature range. It is interesting to note that this data clearly shows the d32" term to be
negative at temperatures greater than -40 °C. This has the effect of producing a positive
phase angle when translated to the kind of measurement used in this work. Although the
data is shown in their work, the authors did not discuss this peculiarity. Parts of this data
were included in other reference works [21, 37] but the anomalous d32" behavior was
again not discussed. Personal communication with these researchers has not provided a
satisfactory explanation.
-15
Film
-20
cap
-25
-30
-35
-2 -1 0 1 2
70
60
50
Film
40
cap
30
20
10
0
-2 -1 0 1 2
Figure 5.2.8 Electrical models used in trying to fit anomalous d32 data.
All PVDF samples studied in this work were sputtered with a tie coat of 150 D of
electrodes on the material property measurements, the elastic properties of one sample
were tested with and without electrode metal. The exact same sample was used in both
tests, without removing the PVDF from the clamps. The metal was removed by careful
FeCl etching and a deionized water rinse. As can be seen in Figures 5.3.1 and 5.3.2, the
effects of the metal electrodes are not insignificant. The difficulties associated with
measuring displaced electric charge from a PVDF sample without electrodes are
formidable and beyond the scope if this work. All of the samples in this work were
prepared using the metalization process described above, and the piezoelectric, elastic, and
dielectric data presented herein include the effects of these electrodes. This approach
77
seems reasonable as the electrodes do not to change the general shape of the curves.
Piezoelectric PVDF is rarely used without electrodes. The data in Figure 5.3.1
suggests that it is important that researchers and manufacturers clearly identify the
1 0.14
0.9 0.12
Compliance, 1/GPa
Delta compliance,
0.8 0.10
1/GPa
0.7 0.08
0.6 0.06
0.5 0.04
0.4 0.02
0.01 0.1 1 10 100
Frequency (Hz)
Dielectric data was collected from -60°C to 125°C using an HP 4284A precision
LCR bridge and a thermal chamber, as described in chapter 4. Data taken for clamped and
unclamped samples was nearly identical at temperatures below 85°C. Above 85°C the
unclamped samples exhibited an inflection and decreasing permittivity, while the clamped
0.00
-1.00
-1.50
-2.00
0.01 0.1 1 10 100
Frequency (Hz)
relaxes above its anneal temperature, this inflection and downward trend disappear. Data
reported in this chapter is for unclamped samples and exceeds the 85°C annealing
temperature by 5°C.
PVDF sample versus temperature and frequency. The relaxations are more clearly visible
in the projections of this data shown in Figures 5.4.2 and 5.4.3 for clarity. As frequency
increases, the relaxation event moves to higher temperatures. This is expected and normal
for polymer materials, and it leads into the question of whether or not the permittivity can
chapter 6.
Figure 5.4.4 shows a surface plot of the dissipation factor (or loss tangent) for
PVDF versus temperature and frequency. The shifting and broadening of the loss peaks
79
can be clearly seen in this figure. Recall that PVDF is a semi crystalline polymer, roughly
the bulk dielectric behavior of PVDF film. The mechanism responsible for the low
temperature dielectric loss maximum in this frequency range is associated with the glass
transition of PVDF. As the polymer is cooled through the glass transition temperature the
around main chain bonds, causing a lossiness in dipole mobility and a subsequent
reduction in permittivity and increase in loss [12, 27, 94]. Conduction (ionic transport) in
frequencies this has the effect of increasing the dielectric lossiness. The high temperature
low frequency corner of Figure 5.4.4 shows a trend towards such conduction. The
dielectric bridge equipment used in this testing is not capable of measuring down to the
very low frequencies to which the elastic and piezoelectric properties were tested.
In chapter 7 the dielectric data will be curve fit and an appropriate equation
Sample 8504
1.40E-10
1.20E-10
1.00E-10
8.00E-11
Permittivity
6.00E-11
4.00E-11
20 2.00E-11
251
0.00E+00
3981
60
Frequency Hz
20
63096
-20
-60
1000000
T e m p e r a ture
C
1.6E-10
1.4E-10
1.2E-10
Permittivity, F/m
100
1.0E-10 1000
8.0E-11 10000
6.0E-11 100000
4.0E-11 1000000
2.0E-11
0.0E+00
-60 -40 -20 0 20 40 60 80
Temperature C
Permittivity S8504
1.6E-10
1.4E-10
1.2E-10
-60
Permittivity, F/m
1.0E-10 -30
0
8.0E-11
30
6.0E-11 60
90
4.0E-11
2.0E-11
0.0E+00
10 100 1000 10000 100000 1000000
Frequency
S8504
0.30
0.25
0.20
0.10 1000000
25119
0.05
631 Freq Hz
0.00
90
60
20
30
0
-30
-60
Te m p C
3 is applied to the elastic and piezoelectric data from the samples discussed in chapter 5,
and master curves are constructed for all storage and loss compliances. Summary plots
are made for each parameter and a curve fit is made to each combined data set. Selection
of the appropriate WLF constant values is done empirically by minimizing the r2 value of a
regression fit to the expanded data set of each sample. The constants were shared across
the data files of all samples in order to get an adequate fit. Note that all TTS master curve
unless otherwise specified in order to reduce the density of the information on each plot.
This topic is discussed in length in the final section of this chapter, where equations are
proposed to estimate elastic and piezoelectric material properties over a wide frequency
6.1 TTS Master Curves for all Elastic and Piezo Coefficient Data Sets
In the first part of this section, data shown in the previous chapter is expanded
through the use of the TTS method as described above. TTS curves from the remaining
The WLF constants C1 and C2 (see (3.29)) were chosen empirically after creating
the master curves of all four parameters for all samples tested. The fit to most of the
curves using these values was excellent with the exception of piezoelectric loss
compliance, as will be shown in a later section of this chapter. The values used in this
83
work were
(6.1)
Figure 6.1.1 shows the PVDF elastic compliance data of Figure 5.1.1 mapped onto
a single reference temperature. Note that the frequency range of the extrapolated master
curve spans about 12 orders of magnitude as opposed to the four orders of magnitude for
After careful inspection the fit to this data was done using an inverse linear curve.
The r2 value of the data relative to the curve fit approaches .998 for the selected WLF
coefficients, indicating a very reasonable fit. The data fitting equation for storage
(6.2)
This equation will accurately predict the storage compliance at the reference temperature,
2o. Recall that 2o is the temperature used to generate the shift factor in (3.29).
Figure 6.1.2 shows the elastic loss compliance for the same sample expanded with
the same shift factor, along with a curve fit. Changing the WLF coefficients for the loss
term would provide a slightly better fit to the data, but a number of researchers have
pointed out the need to keep the constants identical for storage and loss terms [12, 85].
The reduced curve fit accuracy seen in Figure 6.1.2 when compared to Figure 6.1.1 has a
number of sources, but in this author’s opinion the primary cause is the difficulty the DSA
84
has in resolving phase at extremely low frequencies - made more difficult in this case by
1.0
0.8
s' (Gpa^-1)
0.6
0.4
0.2
0.0
-10 -5 0 5 10
L o g F r e q u e n c y (Hz)
Figure 6.1.1 TTS expansion of data from Figure 5.1.1. 1 axis elastic
storage compliance.
Figure 6.1.3 shows the TTS expansion of the storage piezo compliance data of
Figure 5.1.3. The high r2 value in the inverse linear curve fit to this data shows excellent
correlation to the elastic data of Figure 5.1.3. This can be seen by normalizing both
curves to their 1 Hz value and putting them on the same plot, as shown in Figure 6.1.4.
The strength of this correlation between the elastic and piezoelectric compliances is
surprising, clearly indicating that the mechanisms responsible for viscoelastic behavior are
The data spread in the TTS expansion shown in Figure 6.1.5 makes a good curve
fit difficult. The tails from each subset of data tend to increase as frequency decreases.
85
% Loss Compliance
6%
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
Figure 6.1.2 TTS expansion of data from Figure 5.1.2 1 axis elastic loss
compliance.
This is caused by the increasingly negative phase angle with decreasing frequency
prominent in the raw data. Conduction at elevated temperature and low frequency most
likely account for this behavior, as discussed in later sections. Clearly the piezo loss
Figures 6.2.1 (a-d) show typical expanded TTS curves for 1 axis samples tested in
this work. Figures 6.2.2 (a-d) show typical expanded data for 2 axis samples. Figures
6.2.3 to 6.2.10 show all curves for each parameter combined and a best fit of the
expansion data curves. See Appendix E for additional data plots in both the 1 and 2 axes.
86
30
25
20
d31 pC/N
15
10
0
-10 -5 0 5 10
Figure 6.1.3 TTS expansion of data from Figure 5.1.3. 1 axis piezo
storage compliance.
1.4
Normalized
1.2 Elastic
1 Piezo
0.8
0.6
0.4
0.2
0
-10 -5 0 5 10
Log Frequency (Hz)
7%
% Loss Compliance 6%
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
Figure 6.1.5 TTS expansion of data from Figure 5.1.4. 1 axis piezo loss
compliance.
0.6
0.5
0.4
0.3
0.2
0.1
0
-10 -5 0 5 10
Log Frequency (Hz)
6%
% Elastic Loss
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
25
d31 pC/N
20
15
10
5
0
-10 -5 0 5 10
7%
% Piezo Loss 6%
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
0.8
s' (Gpa^-1)
0.6
0.4
0.2
0.0
-10 -5 0 5 10
7%
6%
% Elastic Loss
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-10 -5 0 5 10
0%
-5%
% Piezo Loss
-10%
-15%
-20%
-25%
-30%
-10 -5 0 5 10
1.0
0.8
s' (GPa^-1)
0.6
0.4
0.2
0.0
-10 -5 0 5 10
Log Frequency (Hz)
Figure 6.2.3 All TTS expansion curves for 1 axis elastic compliance, 50° C.
92
Figure 6.2.4 All TTS expansion curves for 1 axis elastic loss, 50° C.
25
20
d31 pC/N
15
10
0
-10 -5 0 5 10
Log Frequency (Hz)
Figure 6.2.5 All TTS expansion curves for 1 axis piezo compliance, 50° C.
93
7%
6%
% Piezo Loss
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
Log Frequency (Hz)
Figure 6.2.6 All TTS expansion curves for 1 axis piezo loss, 50° C.
1.2
1.0
s' (GPa^-1)
0.8
0.6
0.4
0.2
0.0
-10 -5 0 5 10
Figure 6.2.7 All TTS expansion curves for 2 axis elastic compliance, 50° C.
94
7%
6%
% Elastic Loss 5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
Figure 6.2.8 All TTS expansion curves for 2 axis elastic loss, 50° C.
2.5
2
d32 pC/N
1.5
0.5
0
-10 -5 0 5 10
Figure 6.2.9 All TTS expansion curves for 2 axis piezo compliance, 50° C.
95
5%
0%
% Piezo Loss
-5%
-10%
-15%
-20%
-25%
-30%
-10 -5 0 5 10
Figure 6.2.10 All TTS expansion curves for 2 axis piezo loss, 50° C.
All of the individual curves in the 1 axis elastic and piezo compliances, Figures
6.2.3 and 6.2.5, have a consistent shape. The curves on each plot appear to have minor
offsets in the compliance axis which cause a lower than expected r2 value to the curve fit
for the entire data set. Since all of the samples were taken from the same film section, it is
unlikely that the variations of this magnitude are caused by actual differences in material
properties. The sources of error can most likely be attributed to the sample mounting
process, which can induce small irregularities in the film boundary conditions through lack
of parallelism between end clamp plated, uneven tension in the prestress on the sample
prior to bonding, etc. It is not unreasonable that these kinds of mounting variations could
produce small vertical curve shifts as seen in the plots, and therefore improving the
The 1 axis elastic and piezoelectric losses are shown in Figures 6.2.4 and 6.2.6.
The sensitivity of this phase measurement coupled with the relatively low loss magnitude
makes this data inherently noisy. However, the elastic loss curve fit is reasonable given
the small magnitude of the loss term overall. The piezoelectric loss data has a wider
spread, limiting the value of this information in the constitutive equations and in predicting
performance. Again, however, the magnitude of the piezo losses is so small that the fitted
curve slope seems reasonable. It may also be simpler to use a constant value for the piezo
The curves in the 2 axis elastic compliance plot shown in Figure 6.2.7 have a
shape very near those found in the 1 axis, with the slope slightly sharper and the overall
magnitude of the transverse compliance slightly higher. The 2 axis elastic loss data is
noisy but it is similar in shape and magnitude to the 1 axis loss data.
The 2 axis piezo data represents a challenge as it does not easily suggest
thermorheologically simple behavior. The curves in Figure 6.2.9 clearly show evidence of
the odd conduction mechanism discussed in detail in Chapter 5. Likewise the piezo loss
data in the 2 axis shown in Figure 6.2.10 is unreasonable for the same reasons.
Fortunately the d32 coefficient is of little use to practical sensor designers. For this reason,
in the remainder of this work the components of the d32 coefficient will be given a constant
value of 1.5 pC/n and 2.5% loss, regardless of the frequency or temperature.
Sample 1205-3 was tested using the normal test procedure with increasing applied
load levels. The sample data sets were labeled 1205-3, 1205-3a, 1205-3b, and 1205-3c
97
with letters for subsequent load levels. Table 6.1 shows the data extracted at 10 Hz for
Figures 6.4.1 and 6.4.2 show the elastic and piezoelectric storage compliances from this
test after the usual TTS expansion. It is clear from this data that a factor of 50 change in
the level of applied load does not significantly affect the compliance values.
0.8
3a
s' (GPa^-1)
0.6
3b
3c
0.4
3
0.2
0.0
-10 -5 0 5 10
Log Frequency (Hz)
25
20
3a
d31 pC/N
15
3b
10 3c
3
5
0
-10 -5 0 5 10
Log Frequency (Hz)
It is clear from Figures 6.2.6, 8 that the elastic and piezo compliance summary data
shows a series of similar curves offset on the compliance axis. Although this offset does
imply that there is variability in the measured data, it detracts from any relationship that
may be observed. Therefore a normalized data set is proposed in order to clarify the
in the center of the measured data, and all other data was normalized to the 1Hz value for
each sample. The results are shown in Figures 6.5.1, 2. Use of the normalized form
allows each sample to scale from compliance measured at 1 Hz. Note also that the
similarity between the elastic compliance and piezoelectric compliance is so strong that the
same curve fit parameters yield very good results on both data sets. This clearly
99
demo nstrat
Elastic Compliance 1 Axis Average
Normalized @ 1Hz, 50C
es that the
1.6
piezoe 1.4 lectric
1.2
effect can be
s' re 1Hz
1.0
expan 0.8 ded
0.6
using 0.4 elastic
0.2
TTS techni
0.0
ques. -10 -5 0 5 10
Figure 6.5.1 All 1 axis elastic compliance curves normalized at 1Hz, 50° C.
1.0
0.8
0.6
0.4
0.2
0.0
-10 -5 0 5 10
Log Frequency (Hz)
Figure 6.5.2 All 1 axis piezo compliance curves normalized at 1 Hz, 50° C.
100
The best curve fit to the elastic and piezoelectric storage compliance TTS master
curves, averaged over the samples, yields the following inverse linear equations at a
Gpa -1 (6.3)
pC/N (6.4)
where the s!11(1 Hz, 323K) and d!31(1 Hz, 323K) refer to actual material property values
these curves exceed 0.99. The curve equations are extremely close and will be combined
hereafter using constant values of 0.055 and 1.0 which were found to yield best results.
The WLF TTS method used above provides a reasonable basis for expanding the
frequency over which material parameter predictions can be made. The typical output from
a normal TTS expansion are master curves showing the parameter values expanded over
frequency for a reference temperature. One of the drawbacks of the equations above is that
although the curve fit equations are a function of frequency, they must be recalculated for
the specific estimation temperature. The WLF equation for the temperature dependent
(3.29)
101
Log Frequency Hz
Figure 6.6.1 Elastic compliance 1 axis master TTS curves for all reference
temperatures.
which easily allows the data sets to be recast for each reference temperature, 20. The
frequency term is not explicit by the very nature of the frequency shift factor a(2), meaning
that a material parameter prediction cannot be calculated for a specific temperature and
frequency. Typically a graph is created with the TTS method showing the material
parameter against the expanded frequency, and the desired result must be chosen from the
operating frequency.
and frequency, the following technique is proposed. The reference temperature in the WLF
equation was altered in turn to match each temperature at which material property data was
collected. The data was then expanded in the normal manner, and at each temperature a
new inverse linear equation was calculated for the resulting master curve. This series of
Figure 6.6.2 Data in Fig 6.6.1 normalized at 1 Hz and a master curve fit.
were all normalized to their 1Hz value as shown in Figures 6.6.2 & 4. Figures 6.6.2 & 4
also contain the identical curve fit. This curve fit on the normalized data has the form
. (6.5)
reasonably well represented by the Arrhenius equation [12, 63, 94]. This appears to be the
case for the elastic and piezoelectric compliance of PVDF at constant frequency, as is
shown in Figures 6.5.3 and 6.5.4 below. The general Arrhenius equation has the form
(6.6)
103
25
Increasing Temperature 293
20
d31 pC/N
308
15 323
10 338
353
5
0
-10 -5 0 5 10 15
Figure 6.6.3 Piezo compliance 1 axis master TTS curves for all reference
temperatures.
1.6 293
1.4 308
1.2 323
1.0 338
0.8
353
0.6
Fit
0.4
0.2
0.0
-10 -5 0 5 10 15
Figure 6.6.4 Data in Fig 6.6.3 normalized at 1 Hz and a master curve fit.
104
the initial temperature 20. k is the Boltzmann constant and U is the effective activation
energy for PVDF. There is a minor modification to this form proposed by other
researchers [12] which allow an additional 1 term, as shown in (6.7) by the constant $.
Further, the constant " has been added by this author to account for a small shift with
frequency, yielding
(6.7)
The Arrhenius expansion using this equation correlates well to measured data in
Figures 6.6.5 and 6. This equation is useful in both the elastic and piezoelectric compliance
of PVDF. (6.7) indicates that the expansion of a storage compliance, Q, with temperature
change occurs at constant frequency and that data measured at any frequency at an initial
Because the form of the normalized master curves is nearly identical regardless of
the reference temperature, as seen in Figures 6.6.1 and 3 by the very close match to the
single fit equation, it is possible to suggest the following condensed equation for elastic and
piezoelectric compliance:
(6.8)
(6.9)
The frequency and temperature at which the initial material property value is
measured are f0 and 20, and f represents the frequency at which the material property value
is extrapolated. Figures 6.6.7-8 and 6.6.9-10 show the normalized loss master curves with
the curve fit approximation given in the equation above. Note that the Arrhenius
expansions are about 50° C (353° K), and best results are obtained when 20 is near this
temperature.
0.8
Increasing Temperature
s' ( Gpa^-1)
0.7
0.6
0.5
0.4
0.3
-2 -1 0 1 2
Log Frequency (Hz)
25 35 50 65 80
25A 35A 65A 80A
24
22 Increasing Temperature
20
d31 pC/N
18
16
14
12
-2 -1 0 1 2
Log Frequency (Hz)
25 35 50 65 80
25A 35A 65a 80A
Figure 6.6.7 Elastic loss TTS master curves for all reference temperatures.
107
Figure 6.6.8 Data of Fig 6.6.7 normalized at 1 Hz and a master curve fit.
293
5%
308
4%
323
3%
338
2%
353
1%
0%
-10 -5 0 5 10 15
Figure 6.6.10 Data of Fig 6.6.9 normalized at 1 Hz and a master curve fit.
109
hundreds of articles and many texts written on the subject. The mechanisms commonly
associated with dielectric relaxations in polymers are described in detail by Böttcher [86]
and McCrum [84] among others. As an example, the classical and simplistic DeBye
theory of dielectric relaxation is based upon a model of a rigid spherical molecule with
polarity rotating with viscous friction under the influence of an electric field. Other
modifications to this approach by researchers such as Eyring have attempted to include the
modifications have been suggested to include the relaxation broadening effects of the
distribution of molecular weight (polydispersity), and the effects of the fractional free
volume. Empirical modifications to these kinds of theories have produced well known
models useful for particular materials, such as the Cole-Cole, Fuoss-Kirkwood, and
understanding of polymer dielectric behavior, but only in a very general manner - they are
more appropriate to this work [1, 20, 22, 51, 95-98]. The physical mechanisms for the
particular dielectric behavior of PVDF are discussed by [22, 94, 96-99] among others and
are thought to result primarily from the large dipole moment inherent in the PVDF " and
$ crystal structures, the semi-crystalline nature of PVDF, and the morphology of the
engineering polymer. This is a result of rotation and displacement of the dipoles under the
stress of an electric field, which is accomplished through backbone chain motion, sub
amorphous boundary), and molecular diffusion. Other theories, such as those forming the
basis of the WLF equation, are based on free volume calculations [100, 101]. These
theories generally include ‘hindrance’ mechanisms, such as viscous and Coulomb friction
Despite the amount of empirical data reported on PVDF, there are few research
The success of the TTS expansion applied to the elastic and piezoelectric data in
chapter 6, and the strong indication that the relaxation mechanisms in both of these
parameters are identical, leads one to consider the possibility of using the same technique
to expand the dielectric properties. Malecki [96] and others have proposed using the TTS
expansion technique for the dielectric behavior of PVDF with the caveat that the WLF
TTS approach is not reasonable in the temperature and frequency ranges of the dielectric
relaxation. Figure 7.1.1 shows an attempt to use the TTS approach to expand the
permittivity data from chapter 5. This expansion was done with the same WLF constants
used to determine the shift factor for the elastic and piezoelectric properties in chapter 6.
The temperature range of the dielectric data used in the expansion was -20°C to +90°C
instead of the original -60°C to +125°C temperature range over which the data was
111
measured in order to more closely match the elastic and piezoelectric data temperature
range. Even over these reduced temperatures, however, the resulting WLF TTS
significant dielectric relaxation. The frequency shift factor constants were altered in an
attempt to provide a closer fit to the data without significant success. This implies that the
elastic/piezoelectric and dielectric relaxation mechanisms are not the same, and therefore
1.6E-10
1.4E-10
Permittivity F/m
1.2E-10
1E-10
8E-11
6E-11
4E-11
2E-11
0
0 2 4 6 8 10 12 14
Log Frequency (Hz)
The classical dielectric relaxation equation offered by DeBye [84] is often used to
(7.1a)
(7.1b)
(7.1c)
In these equations, ,r and ,u represent the permittivity at very low frequency and at very
high frequency, respectively. JE is the time constant for the relaxation, being equal to the
reciprocal of the radian frequency at which the relaxation occurs. This approach is also
used in modified form to describe relaxation distributions, with each unique relaxation in
The major drawback with this equation is that it generally does not fit well to
empirical data [86, 94, 96]. The relaxation described by (7.1) occurs in about a single
order of magnitude in the frequency domain, while dielectric relaxations in polymers are
typically much broader. In order to accommodate this broadening, Cole and Cole [93]
modified the DeBye expressions with an exponent, ( (0 < ( # 1), such that
(7.2a)
113
(7.2b)
(7.2c)
Lowering the value of ( flattens the permittivity versus log(T) relaxation curve,
and setting ( = 0 has the effect of making the permittivity independent of frequency.
The Cole-Cole equations are able to reproduce the dielectric relaxations found in
temperature, and therefore this equation is of very limited value when attempting to
Capellades [95] suggested the well known Vogel-Fulcher equation as one method
coefficients given by [95] produced a reasonable fit to the PVDF data he presented. This
(7.3)
114
Capellades et.al. determined the coefficient values to be: 2M = 187 °K, (U/k) = 446, 2 =
the temperature of interest in °K, and J0 = 10 -10.98 seconds. Recasting this equation in
(7.4)
A study of the dielectric data presented in chapter 5 led this author to consider
integrating the Vogel-Fulcher equation into the Cole-Cole equation in order to provide a
In addition, the data clearly suggests that there is a power law relationship between
permittivity and frequency in regions well away from the relaxation event, as seen by the
distinct linear slope in the permittivity versus log(T) curves in Figure 5.4.3 away from the
relaxations. Further, a number of authors have suggested that power relations are
reasonable in these frequency regions [95- 97]. Therefore, various slopes were empirically
curve fit to both the high frequency and low frequency regions of the measured
permittivity data. It was determined in this work that a slope on the high frequency part of
the spectrum was not necessary. Also, the Vogel-Fulcher coefficients provided in [95]
were adjusted slightly to give the best performance for the data in chapter 5. One reason
for the difference may be that Cappellades et. al. used piezoelectric PVDF films produced
by Solvay, based on the Solef series of PVDF resins. The PVDF films in this work were
produced by MSI using ATOFINA’s Kynar PVDF resins, which are produced using a
(7.5)
where J(2) is the relaxation time constant as a function of temperature. With the
(7.6)
(7.7)
(7.8)
(7.9)
(7.10)
matches the dielectric data reported in chapter 5 quite well, as seen in Figure 7.3.1.
116
Permittivity S8504
1.6E-10
-60
1.4E-10
Permittivity, F/m -30
1.2E-10 0
1.0E-10 30
8.0E-11 60
6.0E-11 90
4.0E-11 -60
-30
2.0E-11
0
0.0E+00
10 100 1000 10000 100000 1000000 30
60
Frequency (Hz)
90
Figure 7.3.1 Curve fit to permitivity data. First set of temperatures listed
are data curve, second set are curve fits using (7.4) - (7.8).
Turning now to the dielectric loss term, note that (7.2c) approaches zero as the
frequency approaches zero. This expression is accurate for the displacement loss, typically
assumed to be the result of molecular friction, but it clearly does not accurately model the
empirical data. An additional term is required to account for the losses due to conduction
through the dielectric material [44, 102]. This conduction is in phase with the voltage on
the dielectric, and cannot be distinguished from the displacement losses by the measuring
equipment. Also, it cannot contribute to the storage permittivity, ,!, and cannot be
detected by observing that parameter. McCrum [84] discussed this problem and
suggested that the complete dielectric loss term be composed of two parts:
(7.11)
117
(7.12)
Equation (7.12) did not produce a satisfactory fit to the measured data, which
showed too rapid a rise in conductivity with decreasing frequency and increasing loss with
increasing frequency due to electrode resistance. Improved results are found by modifying
(7.11) as follows:
(7.13)
(7.14)
Here A is the electrode area of the test sample, a is the sample thickness, and RS is the
electrode equivalent series resistance. 7 is an arbitrary curve fit constant of unit value
with dimensions of [sec3/4]. The third part of (7.13) is derived from simply adding a
resistance in series with the parallel resistor and capacitor film model. This resistance
could not be compensated in the equipment and was calculated to be about 6 ohms, which
seems quite reasonable for a metalization layer with a sheet resistivity of about 2 S/9.
This term is only really important at frequencies above 100 kHz for the samples tested.
Although the dielectric loss tangent is by far the most difficult material parameter to
118
cureve fit, (7.14) produces an acceptable match to the data as seen in Figure 7.3.2. The
value of D (resistivity) shown in (7.14) was also determined by curve fitting. The need for
an exponent on the radian frequency in the second term of (7.13) and the fact that the bulk
resistivity numbers produced by curve fitting are smaller than typical values given in the
literature [103] are not ideal. There is an indication that there is some other mechanism at
work in the dielectric loss tangent, one not familiar to this author or others that have
reported in this field. Nonetheless, the primary intent of this work is to provide useful
30
0.20
60
0.15 90
0.10 -30
0
0.05
30
0.00
60
10 100 1000 10000 100000 1000000
90
Frequency (Hz)
Figure 7.3.2 Curve fit to dielectric loss data. First set of plots are data,
second set are curve fits using (7.12) - (7.14).
119
order to describe and predict the elastic, piezoelectric, and dielectric material properties of
PVDF over frequency and temperature. The purpose of this chapter is to summarize these
(6.8)
(6.9)
(8.1)
(8.2)
120
It appears convenient to rewrite (6.8) and (6.9) into a shorter form. To this end let
(8.3)
(8.4)
(8.5)
(8.6)
(7.6)
121
(8.7)
(3.7)
(3.8)
Substituting (8.1) - (8.7) and (7.6) into these equations for the isothermal, uniaxial strain
cases and isothermal displacement case yields the following equations in complex notation:
(8.8)
(8.9)
122
(8.10)
constructed in complex form to allow designers to predict complex (lossy) behavior in the
frequency domain. Curve fits between these material property equations and measured
The expanded form of the piezoelectric and elastic terms, discussed in chapter 6
frequency. However, PVDF is a polymer and as such has some fundamental limits. Recall
poling process in order to provide thermal stability. Heating the material to temperatures
(shrinkage) in PVDF that is not clamped. This relaxation causes irreversible losses in
piezoactivity, primarily due to dipole relaxation. It is therefore not advisable to use the
annealing temperature of the film being used. Currently the majority of commercial PVDF
is annealed to 85°C, but films stable to 125°C are now being introduced. These new films
are expected to grow to as much as 50% of the market, driven by the widely accepted
developed in this work are broad and are based on a technique of relative scaling: material
property values measured at one frequency and temperature are expanded to predict
material properties over a much wider range of temperatures and frequencies. It is the
author’s expectation, therefore, that the general material property framework constructed
in this work will be applicable to PVDF films annealed to 125°C. Verification of this will
amorphous material. When the temperature to a critical point the amorphous material
‘freezes’ and transitions to a glassy phase, suffering a radical change in material properties.
The temperature at which this occurs is the glass transition temperature, or Ig. It is no
surprise that the glass transition temperature is a function of frequency [1, 20, 22],
increasing as frequency increases. This phenomenon may be observed clearly in the ridge
which occurs in the dielectric loss term in Figure 5.4.4, as the temperature of the peak of
this ridge is the glass transition temperature. Based on this data, and on curves of d31
frequency applications may extend to 0.005 Hz, including force detection, biomedical
pulse pressure sensors, and geophones. The natural limit to the use of any ferroelectric
material at low frequencies in the voltage mode is the equivalent internal resistance of the
material itself. A convenient figure of merit for this conduction term is the product of the
bulk resistivity and the dielectric permittivity, in units of seconds, representing the time
124
constant associated with a first order voltage decay through the material (the time it takes
for a voltage on the film to decay to 1/e of its original value). For PVDF this term is
about 2,500 seconds, or about 60 µHz. This is the intrinsic low frequency limit for the
used in RFID (radio frequency identification) tags, which operate at about 900 MHz.
Practical use of PVDF in its length extensional mode is limited to low megahertz
frequencies due to its acoustic velocity. Thin film PVDF half wave or quarter wave
resonators for ultrasonic IDT (interdigitated electrode transducer) filters have a minimum
In summary, the material property equations developed in this work are expected
to be useful in a bandwidth from 0.005 Hz to 15 MHz., and from about -15°C up to the
describing PVDF material properties over a wide range of temperatures and frequencies.
piezoelectric, elastic, and dielectric performance over the frequency and temperature range
of the material property equations. This chapter discusses testing done to verify the
properties were measured at high frequency and the results compared with calculations.
The technique used for verification testing is entirely electrical and does not
involve the apparatus previously used in chapter 4. The technique, suggested by Linville
in [105], was adapted by the author for this work and is described briefly below. Figure
9.1.1 contains a schematic outline of a sample in this test configuration. In this approach,
a sample of PVDF film prepared with two electrode patterns on the top side and a
continuous ground electrode on the other is clamped at the ends under tension. A drive
voltage is applied to one electrode of the sample, piezoelectrically inducing stress into the
material bounded by this electrode. This stress induces a piezoelectric response in the
remaining material and a sense voltage is measured from a second electrode covering this
region. Using the nomenclature in Figure 9.1.1, the relationship between the piezoelectric
and elastic material properties can be predicted by the ratio of the measured (sensed)
126
The equivalent spring constants for the driven (subscript a) and the sensed
(9.1)
Notice that the compliances of the two segments are written separately, denoted
by the “a” and “b” subscripts. Using the simple force/spring constant/displacement
relationship F = k ), and knowing that the force, F, is induced by the piezoelectric effect
(9.2)
127
(9.3)
It is important to note that the open circuit voltage developed by the sensing side
of the test sample has a polarity that causes the compliance of the material under the
sensing electrode to decrease. This has the net effect of working against the stress
induced by the driving voltage and decreasing the displacement, ), and therefore this
s11D, recalling the superscript convention from chapter 3. Because the electronic driving
circuit applying a voltage to side “a” of the sample has a very low source impedance, the
compliance of this driven side of the film is written as s11E . The electro-mechanical
electrical energy that results from applied mechanical energy (or vice versa),
(9.4)
and the relationship between the open circuit (s11D) and short circuit (s11E) compliance of a
(9.5)
(9.6)
Knowing that the open circuit voltage of a piezo material can be simply written as
(9.7)
and substituting S1 = )/b with (9.6) into (9.7) produces, after simplification,
(9.8)
calculated value of k312 = 0.0045. Since this term is quite small (n1), we can ignore it.
Setting the two electrode regions equal, a = b, gives the following simplified equation
which will be used in this chapter to relate piezoelectric, elastic, and dielectric material
(9.9)
It can be seen from (6.8) that the frequency and temperature dependence of d31 and s11 are
identical. This implies that the voltage ratio in (9.9) will behave in a manner similar to
(6.8) over temperature/frequency when (9.9) is used with the initial d31 and s11 values.
129
9.2 Apparatus
cutting pieces to a length of 3 cm. Electrode regions were reticulated using an extremely
sharp razor tip (Exacto type) to skive the electrode metal from the PVDF, using a straight
silver epoxy was used to bond a 30 AWG wire to the surface of the sensing electrode.
The test sample was then carefully installed in the fixture and the clamp on one side was
tightened. Tension was applied to the other side of the sample as the second clamp was
tightened, leaving the film taut between the clamps. The sample was mounted such that
the driven electrode occupied exactly one half of the gap between the clamps. Dimensions
were measured using an optical inspection station accurate to within 0.05 mm, and actual
The drive electrode (side “a”) was connected to the source output of an HP3562A
Dynamic Signal Analyzer (see Appendix C for specifications). This output was also
connected to the DSA channel 1 input. The sense electrode on the other side of the film
sample (side “b”) was connected to the input of a pre-amplifier. This amplifier had a 50
Gohm input impedance and was built using a Burr Brown OP124A instrumentation opamp
designed to measure very low level voltages with high transducer source impedance. The
amplifier system had a gain of 1.0 and a gain-bandwidth product of over 1 MHz. It was
noise. The output of this pre-amplifier was connected to channel 2 of the DSA. The DSA
source was programmed to supply 5 Vp to the driven electrode and also to channel 1,
130
over a frequency range of 10 Hz to 100 kHz. The temperature of the test apparatus and
film sample was not controlled directly, although the apparatus was insulated and the
measurement bandwidth. A high input impedance was necessary in order to lower the first
order high pass filter pole created by the film capacitance combined with the amplifier
input impedance. A 50 Gohm input impedance and 50 pF of film capacitance gave a low
end roll off frequency of about 0.1 Hz. This frequency was low enough that the phase
deviation caused by the filter above 10 - 20 Hz was below 0.5 degrees and the phase
information was therefore useful above that point. In contrast, the DSA input impedance
is 1 Mohm, and without a preamplifier the lowest useful frequency would have been about
90 kHz. Likewise, the low output impedance of the amplifier was necessary to overcome
the shunt capacitance of the coax cable between the amplifier and the DSA (about 70 pF)
and the losses due to the complex DSA input impedance (1 Mohm in parallel with 100 pF)
at high frequencies.
A number of unusual problems were encountered during this test. One issue
requiring serious consideration was the length of the sample between the clamps. The
acoustic velocity in this axis of PVDF is about 1,500 m/s, and in order to push the first
mode acoustic resonance above 100 kHz the sample had to be below 5 mm or so in
length. The first mode, or half wave resonance of the sample can be approximated by
(9.10)
131
where 8 is the separation between the clamps. In order to make sure that the resonance
was well above 100kHz the clamp separation was set to 3.0 mm, giving a resonance at
roughly 250 kHz. Even with the resonance that high, piezoelectric loss data could not be
measured accurately at frequencies above about 5kHz due to the resonance phase shift.
Recall that the loss terms of interest are quite small, on the order of a few degrees, and
that there is a 180 degree phase shift through the acoustic resonance.
It was also discovered that the mass of the tiny epoxy bead and the small attached
wire were sufficient to cause out of plane resonances with film displacements normal to
the flat surface. Although the magnitude of these resonances were quite small, they
caused a subtle phase shift around 10 - 15 kHz which made it even more difficult to
accurately measure the piezoelectric loss term. In order to reduce this effect, a special
cutout feature was added to one of the clamps allowing the region of the sample with the
epoxy bead to be supported underneath by one clamp, thereby blocking out of plane
motion. The active electrode region on the measurement side of the sample was created
such that the region around the epoxy bead had no ground electrode. Even with the
The need to keep the sample small to avoid acoustic resonances had the
unfortunate effect of reducing the sense electrode area to a typical source capacitance
value of 50 pF. This low capacitance value, coupled with the very small Vb/Va ratio of
about 1/500, created another condition requiring careful experimental attention. Figure
9.2.1 shows an electrical schematic of the test apparatus. Note that in addition to the
capacitance of the drive film, Ca, and the sense film, Cb, there is a coupling capacitance
132
depicted, Cc. Weak capacitive coupling is a natural occurrence in any physical apparatus,
but in this case even very weak coupling is significant. Because Vb . Va/500, the effect of
charge injected by the coupling capacitor on the measured output voltage can be
(9.11)
where Vb! is the measured voltage and Vb is the actual open circuit voltage generated by
the PVDF in section b. The exact source of the coupling is not known - it may have been
due to fringing effects between the adjacent drive and sense electrodes. Extremely careful
measurement of all three capacitance values was necessary to properly compensate the
Substituting actual values leads to the conclusion that the charge injected by the
measured coupling capacitor value of about 0.080 pF is roughly equal to the generated
signal from section b. The data presented in the next section has been compensated by
precision LCR bridge with a resolution of 0.1 fF (0.0001 pF). Using 1,024 averages
produced steady and consistent capacitance baselines. The coupling capacitance was
deduced by comparing the expected series capacitance equivalent of the sense and drive
capacitances, Cb and Ca, to the actual series capacitance value, Cab, measured from the top
(9.12)
The measurements discussed in the last section were used to remove the artifact of
injected charge due to coupling capacitance from the raw data. This compensation
baseline was adjusted slightly from about 80 fF to about 67 fF to allow the 10 Hz Vb/Va
ratios to match those calculated from actual d31 data, implying that the Cc measurement is
capacitance of the sample (about 1/1000 Cb), this seems a reasonable correction. The
calculated values shown in Figure 9.3.1 were obtained using (6.8) for elastic and
The fit of the measured data to the calculated values is remarkably good.. Even
though the fundamental resonance occurs at 250 kHz with a fairly low Q, there is a slight
The phase response of the film was quite reasonable at frequencies below 1 kHz.
The phase measurement is so sensitive to the onset of acoustic resonance that above this
frequency the phase data is not representative of material loss properties, and therefore no
2.0
1.9
Va/Vb/1000
1.8
Meas
1.7 Calc
1.6
1.5
10 100 1000 10000 100000
Frequency (Hz)
CHAPTER 10 CONCLUSIONS
In this work the elastic and piezoelectric material properties of PVDF were
measured over a temperature range of 20°C to 80°C and a frequency range of 0.01 Hz to
100 Hz. Special equipment and techniques were developed specifically for these
data confirmed thermorheologically simple behavior for these parameters. A novel TTS
expansion technique was employed to allow an even broader expansion of the original
data. Equations describing the viscoelastic and piezoelectric properties over a wide range
of temperature and frequency were constructed using these expansions. The dielectric
properties of PVDF were measured over the range of -60°C to 80°C and from 20 Hz to
1MHz. Modifications were proposed to classical dielectric equations and confirmed for
were put into the framework of piezoelectric constitutive equations. Finally, a special
technique was employed to test the ability of the elastic, piezoelectric, and dielectric
range.
The primarily focus of this work was to provide useful constitutive relationships
piezoelectric PVDF film over temperature and frequency. It is expected that these
equations will be used by transducer engineers and others designing and evaluating PVDF
sensors for new applications. This work will also enable a broader understanding of the
C An apparatus was designed and built to measure complex piezoelectric and elastic
dielectric behavior was reported from 20 Hz to 1 MHz and from -60 to +80°C.
C Vinogradov et. al. [9] showed that the viscoelastic behavior of both in plane axes
of PVDF were thermorheologically simple (TRS), meaning that it can be predicted over
temperature and frequency using the WLF equation. Their measurements covered a
limited range of frequencies from 1 to 50 Hz. Their findings were confirmed in this work
C Vinogradov et. al. [10-11] suggested that the piezoelectric properties of PVDF
Clear evidence was presented in this work showing that the piezoelectric properties are a
function of temperature and frequency. Further, these functions were shown to be TRS.
C The TTS expansions of both the elastic and piezoelectric data in this work were
accomplished using the identical WLF constants, and it was clearly shown that the form of
the piezoelectric expansion was exactly that of the elastic case. This holds for both the
storage and loss terms associated with the complex variables d31*, s11*, and s22*. The
similarity between the behavior of these piezoelectric and elastic compliances over
temperature and frequency was unanticipated. It appears that the same mechanisms are
C The storage and loss terms of the d32 coefficient were found to vary little over the
measured range, and given the relative unimportance of this term constant values were
assigned.
137
C The unusual sign of the d32" term suggested by Furukawa [20] was confirmed in
this work. The value of this compliance loss parameter was expected to be negative on
theoretical grounds but was clearly found to be positive. No reasonable explanation for
such behavior has been determined yet. This is a topic for further work.
the raw elastic and piezoelectric data along the temperature axis prior to the typical TTS
frequency axis expansion. This technique allowed prediction of material properties over a
much broader range of temperature and frequency compared to the normal TTS approach.
C The similarity in elastic and piezoelectric behavior over temperature and frequency,
combined with the Arrhenius expansion in the temperature axis, led to the construction of
extrapolation over a wide range of temperatures and frequencies from a single value of
piezoelectric and elastic properties measured at 1 Hz and 50°C can be used to predict the
piezoelectric and elastic material properties over the useful operating range of PVDF:
#0.001 Hz to low Mhz and from -15°C to 85°C. Further, it is expected that these
equations will also be applicable to new PVDF films with a maximum operating
temperature of 125°C.
C The classical Cole-Cole equation for complex permittivity was proposed and
dielectric behavior. The loss equation was further modified to account for the conductive
losses through PVDF at low frequencies and increased temperature. The resulting
138
equations for ,! and ," were compared to measured data with good results.
properties over temperature and frequency were incorporated into a set of constitutive
relations for electric displacement and elastic strain. These equations were written in
C The effect of the thin, sputtered metal electrodes on elastic material property
measurements was investigated. Data indicated that even thin metal electrodes have an
impact on the results and must be considered. A similar impact on the piezoelectric
C A broad range of frequency and temperature data were presented in a single work
C The d31 piezoelectric behavior was shown to be TRS for the first time.
C The TRS behavior of the elastic and piezoelectric material properties were shown
to be identical, implying that the physical mechanism responsible for visco elastic behavior
constitutive equations.
139
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APPENDIX A
v Velocity
V Voltage (volts)
W Width, m
x Position
Yi Young’s modulus of elasticity (1/sij , i = j)
APPENDIX B
B.1 Ferroelectricity
ferroelectric [16]: a permanent dipole, the ability to switch the dipole orientation with
the application of a sufficiently high electric field, and the existence of what is known as
under low electric fields and often have extremely high permittivities. The permittivity
of all ferroelectric materials is dependent upon frequency, field, elastic stress, and
ferroelectrics.
Linear reversible dipole rotation under electric field occurs in all dielectric
to high fields the energy in the material is sufficient to overcome internal energy barriers
and cause permanent dipole rotation. This process is known as poling and the resulting
Poling tends to align the randomly oriented dipoles in an unpoled ferroelectric and thus
produces a net non zero polarization in the bulk material. Poling is the mechanism
charge displacement which remains after the applied field returns to zero. Application of
a high field of the opposite polarity will result in dipole reversal and a large charge
materials exhibit a classical D/E hysteresis, as shown in Figure B.1.2. The hysteretic D/E
relationship is the most fundamental description of ferroelectric behavior, with two key
parameters: coercive field, Ec, and remnant polarization, Pr. Ec is defined as the field at
which the total displacement is zero and is approximately equal to the field at which half
of the dipole reversal has occurred. Pr is defined as the displaced charge remaining at
zero field.
It is important to note that linear piezoelectricity occurs only in the linear regions
shown in Figures B.1.1, 2. An unpoled ferroelectric material has a linear dielectric slope
in the low field region of the D/E curve, but since Pr = 0 for this condition, all of the
piezoelectric coefficients are 0, as they are intrinsically a function of Pr. In this work it
is assumed that all fields on piezoelectric materials remain below the point at which
linear phenomena.
151
B.2 Electrostatics
appropriate.
charge such that one coulomb of charge produces one coulomb of electric flux [3].
Gauss’s law states that the total electric flux out of closed surface is equal to the total
D # dA Q . (B.1)
3
D is clearly a vector quantity. Comparing (B.1) to Gauss’ law for electricity (B2) [17]
yields (B.3).
ε E # dA Q , (B.2)
3
D εE. (B.3)
Also, using (B.1) with charge density q = /·D, Gauss’ divergence theorem yields
( /# D ) d v Q . (B.4)
2
φ, the electric potential between two points A and B, is a scalar quantity defined as the
154
work required to move a positive charge from point A to point B. E, the electric field
E /φ . (B.5)
tensor from (B.3). This property can be simply described as the propensity of a material
charge displacement is a linear function of the applied field, and all discussions in this
All real (non ideal) dielectric materials have energy loss mechanisms associated
with dipole rotation and charge displacement in a time varying electric field. It is
therefore convenient to represent the permittivity tensor in complex notation, εij’ - jεij”,
where εij” represents the loss term and εij’ the reversible storage term, in a manner
analogous to elastic compliance. Likewise, real dielectric materials are not perfect
insulators and therefore suffer DC conduction losses. These dielectric loss components
can be ignored in many applications when using low loss ceramic materials, but become
significant in some lossy ceramics and in polymers. This is especially true at elevated
temperatures.
The following field equations apply to all materials regardless of their internal
structure [63]. The equations are based upon the laws of conservation of mass, the
155
0ρ Continuity (B.6)
div( ρ v ) 0
0t
1
S ( / u / u T)
2
Strain-displacement (B.9)
156
Although these equations represent fundamental laws holding for all points in any
media, there are more unknown field functions than there are equations. Constitutive
equations are therefore necessary in order to fully determine the state of the system.
157
APPENDIX C
Measurement Equipment
2. Load Cell
Manufacturer: Entran, Inc. (Fairfield, NJ)
Model: ELF-T3-20L
Load range 20.0 pounds force (~90N)
Temperature Drift: ± 2.5 mV/100(F
Sensitivity: 12.5 mV pound
Amplifier: Entran PS-30A
Gain: 20.0 (250 mV/pound, 56.2 mV/N)
3. Displacement Sensor
Manufacturer: Magnetic Moments, LLC (Goleta, CA)
Model: ECS998s
Sensitivity (in range of interest): 3.288 V/mm
4. Power Amplifier
Manufacturer: Bruel & Kjaer
Model: 2712
Frequency response: DC to 100 kHz.
Output: 180VA max
Distortion: -80 dB
APPENDIX D
This appendix shows the derivation of the complex modulus of the Standard
k2
k1 F(t)
u(t)
Figure D.1 Standard Linear Material model showing two springs
and a dashpot.
The approach used is based on the kind of first order impedance calculations
where F(t) is an applied force, u(t) is displacement, and ZM(t) is the mechanical
impedance. Looking at the Maxwell component of the SLM model, the displacement can
be written as the sum of the displacements from the spring and the dashpot. Here the
dampening coefficient is shown as ζ, the equivalent spring constant of the material as k1,
F (t) 1
u (t) u spring (t) udash (t) F (t) dt . (D.2)
k1 ζ2
F0 e jωt F0 k1 jωζ
u (t) e jωt jω dt F0 e jωt [ ]. (D.3)
k1 jωζ 2 jωζk1
2
jωζk1 (jωζk1)(k1 jωζ) k1 ω2 ζ2 jωk1 ζ (D.4)
ZMAX
k1 jωζ 2
k1 ω2ζ2
2
k1 ω2ζ2
ζ
τ (D.5)
k1
k1 ω2 τ2 k1 ω τ
Z MAX j .
1 ω2τ2 1 ω2τ2 (D.6)
160
The SLM has another spring element mechanically in parallel with the Maxwell
element. Letting k2 be the spring constant of this second spring, the SLM impedance can
be written as
k1 ω2 τ2 k1 ω τ
ZS L M ( k2 ) j . (D.7)
1 ω2τ2 1 ω2τ2
The final conversion to the form shown in equations (3.10) and (3.11) can be
made by realizing that the spring constant of a sample is a function of material properties
and geometry,
Y AC kL
k , Y , (D.8)
L AC
where AC is the cross sectional area and L is the sample length. Y’ is the real part
The loss tangent it defined as Y”/Y’. The location of the peak of this loss term is
not generally coincident with the peak of the Y” curve, which occurs at ω = τ. The peak
loss frequency can be determined by setting the derivative of the loss tangent equal to 0
1 k2
ωloss peak ( )1/2 . (D.9)
τ k2 k1
161
APPENDIX E
Figures E.1 (a-d) through E.5 (a-d) show expanded TTS curves for 1 axis
samples tested in this work. Figures E.6 (a-d) and E.7 (a-d) show expanded data for 2
axis samples. This data is presented in addition to the data shown in chapter 6, and
Each plot contains a curve fit obtained through the use of the WLF TTS equations
discussed in chapter 6. All fit curves are produced using the identical WLF constants.
162
M a s t e r C u r v e C o m p lia n c e v s Fr e q 0 6 2 2 - 2
1 .0
Co mp lian ce (G p a^-1) 0 .8
0 .6
0 .4
0 .2
0 .0
-1 0 -5 0 5 10
Lo g F r e q u e n c y ( H z )
6%
% L os s Com plian ce
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
M a s te r C u r ve d 3 1 vs Fr e q 0 6 2 2 -2
30
25
20
d 31 p C/N
15
10
0
-10 -5 0 5 10
L o g Fr e q u e n c y ( Hz )
7%
6%
% L os s Co m plian ce
5%
4%
3%
2%
1%
0%
- 10 -5 0 5 10
L o g Fr e q u e n cy ( Hz )
1.0
Com plia nce (Gpa ^ -1) 0.8
0.6
0.4
0.2
0.0
-10 -5 0 5 10
Log Frequency (Hz)
7%
6%
% Ela stic Loss
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
L o g F re q u e n cy (Hz )
25
20
d31 pC/N
15
10
0
-10 -5 0 5 10
5%
4%
3%
2%
1%
0%
-10 -5 0 5 10
0.6
0.4
0.2
0
-10 -5 0 5 10
Lo g F re q u e n cy (Hz)
7%
6%
5%
% Elas tic Lo s s
4%
3%
2%
1%
0%
-10 -5 0 5 10
L o g F re q u e n cy (H z )
M a s te r C u r ve d 3 1 vs Fr e q 1 2 0 5 -3 B
25
20
15
d 31 p C/N
10
0
-10 -5 0 5 10
L o g F r e q u e n c y (H z )
7%
6%
5%
% Pie z o L os s
4%
3%
2%
1%
0%
- 10 -5 0 5 10
L o g F re q u e n cy (H z )
1.0
0.6
0.4
0.2
0.0
-10 -5 0 5 10
L og F re q ue ncy (Hz )
7%
6%
5%
% Elas tic Los s
4%
3%
2%
1%
0%
- 10 -5 0 5 10
L o g F re q u e n cy (H z )
M a s te r C u r ve d 3 1 vs Fr e q 1 2 0 5 -4
25
20
15
d 31 p C/N
10
0
-10 -5 0 5 10
L o g F re q u e n c y (H z )
7%
6%
5%
% p ie z o Los s
4%
3%
2%
1%
0%
-10 -5 0 5 10
L o g F re q u e n cy (H z )
1.0
0.6
0.4
0.2
0.0
-10 -5 0 5 10
L og F re q ue ncy (Hz )
6%
5%
% Elas tic L os s
4%
3%
2%
1%
0%
-6 -4 -2 0 2 4 6
L o g F re q u e n cy (Hz )
M a s te r C u r ve d 3 1 vs Fr e q 1 2 0 5 -5
25
20
15
d31 pC/N
10
0
-10 -5 0 5 10
L o g F re q u e n c y (H z )
6%
5%
% Pie z o Los s
4%
3%
2%
1%
0%
-6 -4 -2 0 2 4 6
L o g F re q u e n cy (H z )
0.6
0.4
0.2
0.0
-10 -5 0 5 10
L og F re q ue ncy (Hz )
7%
6%
5%
% Elas tic L os s
4%
3%
2%
1%
0%
- 10 -5 0 5 10
L o g Fr e q u e n cy (Hz )
M a s te r C u r ve d 3 2 vs Fr e q 1 2 0 6 -4
2 .4
2 .2
2 .0
1 .8
1 .6
d32 pC/N
1 .4
1 .2
1 .0
0 .8
0 .6
0 .4
0 .2
0 .0
-10 -5 0 5 10
L o g Fr e q u e n c y ( Hz )
5%
0%
% Pie z o Lo s s
- 5%
-10%
-15%
-20%
- 10 -5 0 5 10
L o g Fr e q u e n cy ( Hz )
1.0
Com p lian ce (Gp a^-1)
0.8
0.6
0.4
0.2
0.0
-10 -5 0 5 10
L og F re q ue ncy (Hz )
6%
5%
% Elas tic Los s
4%
3%
2%
1%
0%
- 10 -5 0 5 10
L o g F re q u e n cy (H z )
M a s te r C u r ve d 3 2 vs Fr e q 1 2 0 6 -6
2 .4
2 .2
2
1 .8
1 .6
d31 pC/N
1 .4
1 .2
1
0 .8
0 .6
0 .4
0 .2
0
-10 -5 0 5 10
L o g F r e q u e n c y (H z )
5%
0%
- 5%
% Pie z o L os s
-10%
-15%
-20%
-25%
-30%
- 10 -5 0 5 10
L o g F re q u e n cy (Hz )
Vita
Mitchell L. Thompson
Born: 11/13/54, Pensacola, Florida
Citizenship: United States of America
EDUCATION
Ph.D. 2002 Drexel University, Philadelphia, Pennsylvania
Mechanical Engineering
PROFESSIONAL EXPERIENCE
1998 - 2002 Measurement Specialties, Inc., Norristown, PA
Director, Development Engineering