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 I E C 60 3 8 4-1 5
®
Edition 2.0 201 7-05

I N TE RN ATI ON AL

S TAN D ARD

F i xed capaci tors for u s e i n el ectron i c e q u i pm e n t –

P art 1 5: S ecti on al s pe ci fi cati on : F i xed tan tal u m capaci tors wi th n on -s ol i d or

s ol i d e l ectrol yte

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ELECTROTECHNICAL
COMMISSION

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 –2– I EC 60384-1 5: 201 7 © I EC 201 7

CONTENTS
FOREWORD . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... . .. .. ... ... ... ... ... ... ... ... .. 5
1 General . ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... . .. ... ... ... ... ... ... . 7
1 .1 Scope ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... . .. ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... .. . ... ... ... ... .. 7
1 .2 Object ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... . .. ... ... ... ... ... ... .. 7
1 .3 Norm ative references . .. ... ... ... ... ... ... ... ... ... ... ... ... . .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. 7
1 .4 I nform ation to be given in a detail specification . ... ... ... ... ... .. ... ... ... ... ... ... . .. ... ... ... ... ... . 8
1 . 4. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. ... 8
1 . 4. 2 Outline drawing and dimensions ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... . .. ... ... ... ... ... .. 8
1 . 4. 3 Mounting .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... 8
1 . 4. 4 Ratings and characteristics . ... ... .. ... ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... . 8
1 . 4. 5 Marking .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. ... 9
1 .5 Terms and definitions . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... . .. .. 9
1 .6 Marking . ... ... .. ... ... ... ... ... ... ... ... ... ... ... . .. ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... .. . ... .. ... ... ... ... ... 9
1 . 6. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. ... 9
1 . 6. 2 I nform ation for m arking .. ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... . 1 0
1 . 6. 3 Marking on capacitors . ... ... ... ... ... ... .. ... ... ... ... ... ... . .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... . 1 0
1 . 6. 4 Marking on packaging . ... ... ... ... ... ... .. ... ... ... ... ... ... .. . ... ... ... ... ... ... ... ... .. ... ... ... ... ... . 1 0
2 Preferred ratings and characteristics .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... .. 1 0
2. 1 Preferred characteristics ... ... ... ... ... ... ... ... ... ... ... .. . ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . . 1 0
2. 2 Preferred values of ratings . ... ... ... ... .. ... ... ... ... ... ... ... ... ... . .. ... ... ... ... ... .. ... ... ... ... ... ... ... . 1 0
2. 2. 1 Nominal capacitance ( CN ) .. ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. 1 0
2. 2. 2 Tolerance on nominal capacitance ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... 1 1
2. 2. 3 Rated voltage ( UR ) . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... .. 1 1
2. 2. 4 Category voltage ( UC ). ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. .. . ... ... ... ... ... ... ... ... ... ... ... 1 1
2. 2. 5 Reverse voltage ... ... ... ... .. ... ... ... ... ... ... ... ... ... .. . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 1 1
2. 2. 6 Surge voltage ( URS or UCS ) .. ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... .. . ... .. ... ... ... ... ... ... 1 1
2. 2. 7 Ripple (if required) . ... ... ... ... ... ... ... ... ... .. ... ... ... .. . ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... 1 1
2. 2. 8 Rated temperature . ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... 1 2
3 Quality assessment procedures . ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... . 1 2
3. 1 Primary stage of m anufacture . ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... .. 1 2
3. 2 Structurally sim ilar com ponents ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... . .. ... ... ... ... ... .. ... ... 1 2
3. 3 Certified test records of released lots ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... .. . ... ... ... .. ... ... ... . 1 2
3. 4 Qualification approval procedures ... ... ... ... ... ... ... .. ... ... ... ... ... .. . ... ... ... ... ... ... ... ... .. ... ... 1 2
3. 4. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 1 2
3. 4. 2 Qualification approval on the basis of the fixed sample size procedure ... ... .. .. 1 2
3. 4. 3 Tests ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... . .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... . 1 3
3. 5 Quality conformance inspection ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... . .. ... ... ... ... ... .. ... ... 20
3. 5. 1 Form ation of inspection lots ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... .. . ... ... .. ... ... ... ... ... ... .. 20
3. 5. 2 Test schedule ... ... ... ... ... .. ... ... ... ... ... ... ... ... . .. ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... .. . .. 21
3. 5. 3 Delayed delivery .. ... ... ... .. ... ... ... ... ... ... ... ... ... .. . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 21
3. 5. 4 Assessment levels . ... ... ... ... ... ... ... ... ... .. ... ... ... ... .. . ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... 21
4 Test and m easurement procedures .. ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. 22
4. 1 Visual inspection and check of dimensions . ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... .. 22
4. 2 Electrical tests ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... . .. ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... .. 22
4. 2. 1 Leakage current ... ... ... ... .. ... ... ... ... ... ... ... ... ... .. . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 22
4. 2. 2 Capacitance .. ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... .. . ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... .. 22
4. 2. 3 Tangent of loss angle (tan δ) ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... .. 23
I EC 60384-1 5:201 7 © I EC 201 7 –3–

4. 2. 4 I m pedance (if required) .. ... ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. ... ... ... ... ... . 23
4. 2. 5 I nsulation resistance of the external insulation (if required) .. ... ... ... ... ... ... ... ... .. 24
4. 2. 6 Voltage proof of the external insulation (if required) ... ... ... ... ... ... ... ... .. ... ... ... ... . 24
4. 3 Robustness of terminations .. ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... .. .. 25
4. 3. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 25
4. 3. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 25
4. 3. 3 Test U a1 , U b and U c applicable... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... .. 25
4. 3. 4 Special bending test . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. ... ... ... ... ... ... ... ... ... ... ... 25
4. 4 Resistance to soldering heat ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... .. . ... ... ... ... ... ... ... ... ... ... .. .. 26
4. 4. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 26
4. 4. 2 Conditions .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... .. . ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... .. 26
4. 4. 3 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 26
4. 5 Solderability .. ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... . .. ... ... ... ... ... . 26
4. 5. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 26
4. 5. 2 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 26
4. 5. 3 Final inspections and requirements .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 26
4. 6 Rapid change of tem perature .. ... ... ... ... ... ... ... ... ... ... .. ... .. . ... ... ... ... ... ... ... ... ... ... ... ... .. .. 26
4. 6. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 26
4. 6. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 27
4. 6. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 27
4. 6. 4 Recovery .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . 27
4. 6. 5 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 27
4. 7 Vibration .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. ... ... . 27
4. 7. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 27
4. 7. 2 Test condition ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. .. 27
4. 7. 3 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 27
4. 8 Bum p . ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... . .. ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... .. . ... ... ... ... ... ... 27
4. 8. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 27
4. 8. 2 Mounting .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . 28
4. 8. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 28
4. 8. 4 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 28
4. 9 Shock ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... . .. ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... .. . ... ... ... ... 28
4. 9. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 28
4. 9. 2 Mounting .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . 28
4. 9. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 28
4. 9. 4 Final inspections and requirem ents .. ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... 29
4. 1 0 Climatic sequence... ... ... ... ... ... ... ... ... ... .. ... ... ... .. . ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... 29
4. 1 0. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 29
4. 1 0. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 29
4. 1 0. 3 Dry heat . ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... .. . . 29
4. 1 0. 4 Damp heat, cyclic, Test Db, first cycle .. ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... .. . ... ... . 29
4. 1 0. 5 Cold.. ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... . .. ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... .. . ... ... ... ... 29
4. 1 0. 6 Low air pressure (if required) . ... .. ... ... ... ... ... ... ... ... ... ... ... .. . ... ... ... .. ... ... ... ... ... ... .. 29
4. 1 0. 7 Damp heat, cyclic, Test Db, rem aining cycles . ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... 29
4. 1 0. 8 Recovery .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . 29
4. 1 0. 9 Sealing (if required) .. .. ... ... ... ... ... ... ... ... ... ... ... ... . .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... 30
4. 1 0. 1 0 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 30
4. 1 1 Damp heat, stead y state . ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... . 30
4. 1 1 . 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 30
 –4– I EC 60384-1 5:201 7 © I EC 201 7

4. 1 1 . 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 30
4. 1 1 . 3 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 30
4. 1 2 Endurance . ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . .. ... . 30
4. 1 2. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 30
4. 1 2. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 30
4. 1 2. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 30
4. 1 2. 4 Recovery .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . 31
4. 1 2. 5 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 31
4. 1 3 Surge voltage . ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... . . 31
4. 1 3. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 31
4. 1 3. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 31
4. 1 3. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 31
4. 1 3. 4 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 31
4. 1 4 Reverse voltage (if required) ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. .. 32
4. 1 4. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 32
4. 1 4. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 32
4. 1 4. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 32
4. 1 4. 4 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 32
4. 1 5 Characteristics at high and low tem perature ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... .. 32
4. 1 5. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 32
4. 1 5. 2 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 32
4. 1 6 Charge and discharge (if required) . ... ... ... ... ... ... ... ... ... ... ... ... ... . . ... ... ... ... ... ... ... ... ... ... 32
4. 1 6. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 32
4. 1 6. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 32
4. 1 6. 3 Test conditions . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. 33
4. 1 6. 4 Recovery .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . 33
4. 1 6. 5 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 33
4. 1 7 Component solvent resistance .. ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... .. . ... ... ... ... ... ... .. ... ... 33
4. 1 8 Solvent resistance of the m arking .. ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... .. . ... ... ... ... ... ... ... 33
4. 1 9 High surge current (if required) .. .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... .. 33
4. 1 9. 1 General .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... . .. . 33
4. 1 9. 2 I nitial inspection... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... . . 33
4. 1 9. 3 Final inspections and requirem ents .. ... ... ... ... .. ... ... ... ... ... ... ... . .. ... ... ... ... ... ... ... .. . 33
Bibliograph y .. .. ... ... ... ... ... ... ... ... ... ... ... . .. ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... .. . ... ... .. ... ... ... ... ... ... ... ... 34

Figure 1 – Apparatus of special bending test . ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. . 25

Table 1 – Rated, category and surge voltages .. ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... .. . ... ... ... ... ... .. . 1 1
Table 2 – Sampling plan for qualification approval tests . .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... 1 4
Table 3 – Test schedule for qualification approval . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... .. . ... ... .. ... .. 1 5
Table 4 – Lot-by-Lot inspection . ... ... ... ... ... ... ... ... ... ... .. ... ... . .. ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... .. . . 21
Table 5 – Periodic I nspection .. ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... . .. ... 22
Table 6 – Vibration test frequencies .. ... ... ... ... ... ... ... ... ... ... ... ... . .. ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... . 27
Table 7 – Shock peak acceleration/pulse duration . ... ... ... ... .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... .. 28
Table 8 – Test tem perature .. ... ... ... ... ... ... ... ... ... ... ... ... . .. .. ... ... ... ... ... ... ... ... ... ... ... ... ... ... .. ... ... ... ... 31
I EC 60384-1 5:201 7 © I EC 201 7 –5–

INTERNATI ONAL ELECTROTECHNI CAL COMMISSI ON

____________

F I XE D C AP AC I T O R S F O R U S E I N E L E C T RO N I C E Q U I P M E N T –

P a rt 1 5 : S e c ti o n a l s p e c i fi c a ti o n :

F i x e d ta n ta l u m c a p a c i to rs w i th n o n -s o l i d o r s o l i d e l e c tro l yte

FOREWORD
1 ) The I nternati on al Electrotechni cal Comm ission (I EC) is a worl d wid e organization for stan dardization com prisin g
all n ation al el ectrotechnical comm ittees (I EC National Comm ittees). The object of I EC is to prom ote
internati onal co-operation on all q uestions concerni ng stand ardi zati on in the el ectrical an d electronic fi elds. To
this en d and in additi on to other acti vities, I EC pu blish es I nternational Stan dards, Techn ical Specificati ons,
Technical Reports, Publicl y Avail abl e Specificati ons (PAS) an d Gu ides (h ereafter referred to as “I EC
Publication(s)”). Th ei r preparation is entrusted to tech nical comm ittees; any I EC N ational Comm ittee interested
in the subj ect dealt with m ay partici pate in this preparatory work. I nternational, governm ental an d n on -
governm ental organ izations l iaising with th e I EC also participate i n this preparation. I EC collaborates closel y
with the I ntern ational Organi zation for Stand ardization (I SO) in accordance with con ditions determ ined by
agreem ent between th e two organi zati ons.
2) The form al decisions or ag reem ents of I EC on tech nical m atters express, as n early as possible, an i nternati onal
consensus of opi nion on the rel evant subjects since each technical com m ittee has representati on from all
interested I EC N ational Com m ittees.
3) I EC Publications have the form of recom m endations for intern ational use an d are accepted by I EC National
Com m ittees in that sense. While all reasonable efforts are m ade to ensure that th e tech nical content of I EC
Publications is accu rate, I EC cann ot be h eld responsi ble for th e way in which th ey are used or for an y
m isinterpretation by an y en d u ser.
4) I n order to prom ote intern ational u niform ity, I EC National Com m ittees und ertake to apply I EC Publications
transparentl y to the m axim um extent possible i n their national an d regi on al publicati ons. Any d ivergence
between an y I EC Publication and the correspondi ng national or regi on al publicati on sh all be clearl y in dicated in
the latter.
5) I EC itself d oes n ot provi de an y attestation of conform ity. I n depend ent certificati on bodies provi de conform ity
assessm ent services and, in som e areas, access to I EC m arks of conform ity. I EC is not responsi ble for any
services carri ed out by ind ependent certification bodi es.
6) All users shou ld ensure that th ey have the l atest editi on of thi s publicati on.
7) No liability shall attach to I EC or its directors, em ployees, servants or ag ents inclu din g in divi du al experts an d
m em bers of its technical com m ittees and I EC Nati on al Com m ittees for any person al i njury, property d am age or
other dam age of any nature whatsoever, wheth er di rect or indirect, or for costs (includ i ng leg al fees) and
expenses arisi ng out of the publ ication, use of, or relian ce upon, this I EC Publicati on or any other I EC
Publications.
8) Attention is drawn to th e N orm ative references cited in th is publ ication. Use of the referenced publ ications is
indispensable for the correct applicati on of this publication.
9) Attention is drawn to the possibility that som e of the elem ents of this I EC Publication m ay be the su bject of
patent rig hts. I EC shall not be held responsibl e for identifyi ng any or all such patent ri ghts.

I nternational Standard I EC 60384-1 5 has been prepared by I EC technical com mittee 40:
Capacitors and resistors for electronic equipm ent.

This second edition cancels and replaces the first edition published in 1 982,
Amendment 1 : 1 987 and Amendment 2: 1 992, and constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Revision of the structure in accordance with I SO/I EC Directives, Part 2: 201 6 (seventh
edition) to the extent practicable, and harm onization between other similar kinds of
documents.
b) I n addition, Clause 4 and all the tables have been reviewed in order to prevent d uplications
and contradictions.
 –6– I EC 60384-1 5:201 7 © I EC 201 7

The text of this I nternational Standard is based on the following documents:

FDI S Report on votin g

40/2523/FDI S 40/2535/RVD

Full information on the voting for the approval of this I nternational Standard can be found in
the report on voting indicated in the above table.

This docum ent has been drafted in accordance with the I SO/I EC Directives, Part 2.

The list of all parts of the I EC 60384 series, under the general title Fixed capacitors for use in
electronic equipment, can be found on the I EC website.

The com mittee has decided that the contents of this document will remain unchanged until the
stability date indicated on the I EC website under "http://webstore. iec. ch" in the data related to
the specific document. At this date, the document will be
• reconfirm ed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
I EC 60384-1 5:201 7 © I EC 201 7 –7–

F I XE D C AP AC I T O RS F O R U S E I N E L E C T RO N I C E Q U I P M E N T –

P a rt 1 5 : S e c ti o n a l s p e c i fi c a ti o n :

F i xe d ta n ta l u m c a p a c i to rs w i th n o n -s o l i d o r s o l i d e l e c tro l yte

1 G e n e ra l

1 .1 S co p e

This part of I EC 60384 applies to through-hole/leaded polar and bipolar tantalum electrol yte
capacitors with solid and non-solid electrolyte for use in electronic equipment.

I t includes capacitors for long-life applications and capacitors for general-purpose

applications.

Capacitors for special purpose application m ay need additional requirements.

This docum ent covers two basic sub-fam ilies:

• Sub-family 1 : Fixed non-solid electrol yte tantalum capacitors with porous anode.
• Sub-fam il y 2: Fixed solid electrolyte tantalum capacitors with porous anode.
1 .2 O bj ect

The obj ect of this document is to prescribe preferred ratings and characteristics and to select
from I EC 60384-1 : 201 6 the appropriate quality assessm ent procedures, tests and measuring
methods and to give general perform ance requirem ents for this type of capacitor. Test
severities and requirem ents prescribed in detail specifications referring to this sectional
specification shall be of equal or higher perform ance level, because lower performance levels
are not permitted.

1 .3 N o rm a t i v e re fe re n c e s

The following documents are referred to in the text in such a way that som e or all of their
content constitutes requirem ents of this document. For dated references, onl y the edition
cited applies. For undated references, the latest edition of the referenced docum ent (incl uding
an y amendments) applies.

IEC 60063, Preferred number series for resistors and capacitors

IEC 60068-1 : 201 3, Environmental testing – Part 1: General and guidance

IEC 60068-2-6, Environmental testing – Part 2-6: Tests – Test Fc: Vibration (sinusoidal)

I EC 60068-2-1 4, Environmental testing – Part 2-14: Tests – Test N: Change of temperature

IEC 60384-1 : 201 6, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification

IEC 6041 7, Graphical symbols for use on equipment

IEC 61 1 93-2: 2007, Quality assessment system – Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
 –8– I EC 60384-1 5:201 7 © I EC 201 7

ISO 3, Pre fe rre d n um b e rs – Se rie s o f p re fe rre d n um b e rs

1 .4 I n fo rm a t i o n to b e g i v e n in a d etai l s p e c i fi c a t i o n

1 . 4. 1 G e n e ra l

Detail specifications shall be derived from the blank detail specification.

Detail specifications shall not specify requirem ents inferior to those of the generic, sectional
or blank detail specification. When m ore severe requirements are included, they shall be
listed in 1 . 9 of the detail specification and indicated in the test schedules, for exam ple, by an
asterisk.

The inform ation given in 1 . 4. 2 may, for convenience, be presented in tabular form.

The following inform ation shall be given in each detail specification and the values quoted
shall preferabl y be selected from those given in the appropriate clause of this sectional
specification.

1 . 4. 2 O u t l i n e d ra w i n g an d d i m en s i on s

There shall be an illustration of the capacitors as an aid to easy recognition and for
comparison of the capacitors with others.

Dim ensions and their associated tolerances, which affect interchangeability and m ounting,
shall be given in the detail specification. All dim ensions shall preferabl y be stated in
millimetres. H owever, when the original dim ensions are given in inches, the converted metric
dimensions in millimetres shall be added.

The num erical values of the bod y shall be given as follows:

• for general: the length, width and height;
• for cylindrical bod y: the diameter and length.
The num erical values of the term inals shall be given as follows:
• for general: the spacing;
• for leaded terminals: the diam eter and spacing.
When the configuration is other than described above, the detail specification shall state such
dim ensional inform ation as will adequatel y describe the capacitor.

1 . 4. 3 M o u n ti n g

The detail specification shall specify the method of m ounting to be applied for norm al use and
for the application of the vibration and the bump or shock tests. The design of the capacitor
may be such that special mounting fixtures are required in its use. I n this case, the detail
specification shall describe the mounting fixtures and they shall be used in the application of
the vibration and bump or shock tests.

1 . 4. 4 Ra t i n g s a n d c h a ra c t e ri s t i c s

1 . 4. 4. 1 G e n e ra l

The ratings and characteristics shall be given in accordance with the relevant clauses of this
specification, together with the inform ation in 1 .4. 4. 2, 1 . 4. 4. 3 and 1 . 4. 4.4.
I EC 60384-1 5:201 7 © I EC 201 7 –9–

1 . 4. 4. 2 N om in al capaci tan ce ran g e

See 2. 2. 1 .

When products approved to the detail specification have different capacitance ranges, the
following statement should be added:

”The nom inal capacitance range available in each voltage range is given in the register of
approvals, available for exam ple on the I ECQ on-line certificate system website
www. iecq. org”.

1 . 4. 4.3 Parti cu l ar ch aracteri sti cs

Additional characteristics may be listed, when they are considered necessary to specify
adequatel y the com ponent for design and application purposes.

1 . 4. 4.4 Sold erin g

The detail specification shall specify the test methods, severities and requirements applicable
for the solderability test and the resistance to soldering heat tests.

1 . 4. 5 M arki n g

The detail specification shall specify the content of the marking on the capacitor and on the
packaging. When there are deviations from 1 . 6, these shall be given in the detail
specification.

1 .5 Term s an d d efi n i tion s

For the purposes of this docum ent, the followi ng terms and definitions apply.

I SO and I EC maintain term inological databases for use in standardization at the following
addresses:
• I EC Electropedia: available at http: //www. electropedia.org/
• I SO Online browsing platform: available at http: //www. iso.org/obp
1 . 5. 1
capaci tan ce
< electrol ytic
capacitor> equivalent circuit having capacitance and resistance in series
measured with alternating current, approximatel y sinusoidal waveform at a specified
frequency

1 . 5. 2
capaci tor
<long-life grade> capacitors intended for applications where a high degree of stability of
characteristics over a long life is essential

1 . 5. 3
capaci tor
<general-purpose grade> capacitors intended for applications where the h igh perform ance
level of long-life grade capacitors is not required

1 .6 M arki n g

1 . 6. 1 G en eral

See I EC 60384-1 : 201 6, 2. 4, with the details of 1 . 6. 2, 1 . 6. 3 and 1 . 6. 4.

 – 10 – I EC 60384-1 5:201 7 © I EC 201 7

1 . 6. 2 I n fo rm a t i o n fo r m a rki n g

The information given in the m arking is normall y selected from the following list; the relative
importance of each item is indicated by its position in the list:
a) polarity of the terminations (unless identified by the construction);
b) nominal capacitance;
c) rated voltage (d. c. voltage may be indicated by the symbol: (I EC 6041 7-5031 :2002)
or  );
d) tolerance on nominal capacitance;
e) year and m onth (or year and week) of m anufacture;
f) m anufacturer's name and/or trade mark;
g) m anufacturer's type designation;
h) reference to the detail specification.
1 . 6. 3 M a rki n g on c a p a c i t o rs

The capacitor shall be clearl y marked with a), b) and c) of 1 . 6. 2 and with as m an y as possible
of the rem aining items as is considered necessary. An y duplication of information in the
marking on the capacitor should be avoided.

1 . 6. 4 M a rki n g on p a c ka g i n g

The packaging containing the capacitors should be clearl y marked with all of the information
listed in 1 . 6. 2 as necessary.

2 P re fe rre d ra t i n g s a n d c h a ra c t e ri s t i c s

2. 1 P re fe rre d c h a ra c t e ri s t i c s

Preferred climatic categories only shall be given in the preferred characteristics.

The capacitors covered by this specification are classified into climatic categories according
to the general rules given in I EC 60068-1 :201 3, Annex A.

The lower and upper category tem perature shall be taken from the followi ng:
• lower category temperature: − 55 ° C;
• upper category tem perature: +85 ° C and +1 25 ° C.
• duration of the damp heat, stead y state test: 21 and 56 days.
The severities for the cold and dry heat tests are the lower and upper category tem peratures
respectivel y.

2. 2 P re fe rre d v a l u e s o f ra t i n g s

2. 2. 1 N om i n al cap a ci tan ce ( C
N
)

Preferred values of nom inal capacitance are shown in m icrofarad (µF).

Preferred values of nom inal capacitance shall be taken from the E1 2 series of I EC 60063 and
their decimal m ultiples. These values are:

1 , 0 – 1 , 2 – 1 , 5 – 1 ,8 – 2, 2 – 2,7 – 3, 3 – 3, 9 – 4, 7 – 5, 6 – 6, 8 – 8, 2;
I EC 60384-1 5:201 7 © I EC 201 7 – 11 –

and their decim al multiples (× 1 0 n , n : integer).

2.2.2 Tolerance on nominal capacitance

Preferred values of tolerances on rated capacitance are:

±5 % , ±1 0 % , ±20 %

2.2.3 Rated voltage ( UR)

Preferred values of rated direct voltages taken from the R1 0, R20 and R40 series of I SO 3
are:
• from R 1 0: 1 , 0 – 1 , 25 – 1 ,6 – 2, 0 – 2,5 – 3, 1 5 – 4, 0 – 5,0 – 6, 3 – 8,0;
• from R 20: 3, 5 1 ;
• from R 40: 3, 0 – 7, 5;
and their decimal multiples (× 1 0 n n : integer).
,

2.2.4 Category voltage ( UC )

The category voltages for capacitors having an upper category tem perature of 1 25 °C are
given in Table 1 .

2.2.5 Reverse voltage

I f required, the value of reverse voltage, which a polar capacitor can withstand continuousl y at
an y tem perature between the lower category temperature and the rated tem perature, shall be
included in the detail specification.

2.2.6 Surge voltage ( URS or UCS )

The surge voltage shall be a minim um of 1 ,1 5 times the rated or category voltage rounded off
to the nearest volt given in Table 1 .

Table 1 – Rated, category and surge voltages

Va lue s in vo lts

UR 2 3 4 6, 3 10 16 20 25 35 40 50 63 75 1 00 1 25
UC 1 ,3 2 2, 6 4, 2 6, 7 1 0, 7 1 3, 4 1 6, 7 23, 4 26, 8 33, 5 42, 2 50, 2 67 83, 7
URS 2, 3 3, 4 4, 6 7, 2 1 1 ,5 1 8, 4 23 28, 7 40, 2 46 57, 5 74, 4 86, 2 115 1 43, 7
UCS 1 ,4 2, 3 3 4, 8 7, 7 1 2, 3 1 5, 4 1 9, 2 26, 9 30, 8 38, 5 48, 5 57, 7 77 96, 2
Key
UR : Rated vol tage
UC : Category voltage
URS : Surg e voltag e to rated voltag e
UCS : Surg e voltag e to category voltage

2.2.7 Ripple (if required)

Ripple current and/or ripple voltage shall be specified in the detail specification.

———————
1 I SO 3 indicates th e value 3, 55 for R 20
 – 12 – I EC 60384-1 5:201 7 © I EC 201 7

2.2.8 Rated temperature

The standard value of the rated temperature is +85 ° C unless otherwise specified in the detail
specification.

3 Quality assessment procedures

3.1 Primary stage of manufacture
For capacitors with solid electrol yte, the primary stage of m anufacturing is the formation of the
oxide layer.

3.2 Structurally similar components

Capacitors considered as being structurall y similar are capacitors produced with sim ilar
processes and m aterials, though they m ay be of different case sizes and values.

3.3 Certified test records of released lots

The inform ation required in I EC 60384-1 : 201 6, Q.1 .5, shall be made available when
prescribed in the detail specification and when requested by a purchaser. After the endurance
test, the required parameters are the capacitance change, tangent of loss angle and leakage
current.

3.4 Qualification approval procedures

3.4.1 General
The procedures for qualification approval testing are given in I EC 60384-1 : 201 6, Q. 2

The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3. 5. The procedure using a fixed sample size schedule is given in
3. 4. 2 and 3. 4. 3.

3.4.2 Qualification approval on the basis of the fixed sample size procedure
The fixed sam ple size procedure is described in I EC 60384-1 : 201 6, Q. 2. 4. The sample shall
be representative of the range of capacitors for which approval is sought. The samples m ay
be the whole or part of the range given in the detail specification.

The sample shall consist of four specim ens having the m axim um and m inim um voltages and
for these voltages the m axim um and minim um case size. When there are more than four case
sizes, an intermediate case size shall also be tested. I n each of these case size/voltage
combinations (values), the m axim um capacitance shall be chosen. Thus, for the approval of a
range, testing is required of either four or six values. When the range consists of fewer than
four values, the num ber of specim ens to be tested shall be that required for four values.

Spare specimens are permitted as follows:

Two (for 6 values) or three (for 4 values) per value may be used as replacements for
specim ens, which are non-conforming because of incidents not attributable to the
manufacturer.

The num bers given in Group 0 assum e that all groups are applicable. I f this is not so, the
numbers may be reduced accordingl y.
I EC 60384-1 5:201 7 © I EC 201 7 – 13 –

When additional groups are introduced into the qualification approval test schedule, the
number of specim ens required for Group 0 shall be increased by the sam e number as that
required for the additional groups.

Table 2 gives the number of samples to be tested in each group or subgroup together with the
perm issible num ber of non-conform ing item s for qualification approval tests.

3. 4. 3 Tests

The complete series of tests specified in Table 2 and Table 3 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.

The whole sam ple shall be subjected to the tests of Group 0 and then divided for the other
groups.

Specimens found to be non-conform ing in the tests of Group 0 shall not be used for the other
groups.

Approval is granted when the num ber of non-conform ing items is zero.

Table 2 and Table 3 together form the fixed sam ple size test schedule for the qualification
approval on the basis of the fixed sample size procedure.

Table 2 gives the number of samples and perm issible non-conforming item s for each tests or
test groups.

Table 3 gives a summary of the test conditions and perform ance requirements, and choices of
the test conditions and perform ance requirem ents in the detail specification.

The test conditions and perform ance requirem ents for the qualification approval on the basis
of the fixed sam ple size procedure should be identical to those for quality conform ance
inspection given in the detail specification.
 – 14 – I EC 60384-1 5:201 7 © I EC 201 7

T a b l e 2 – S a m p l i n g p l a n fo r q u a l i fi ca ti o n a p p ro va l te s ts

P e rm i s s i b l e
N u m ber of n u m ber of n on -
s p e ci m e n s c o n fo rm i n g
G ro u p n o . Te s t S u bcl au se
i te m s

n b
c
0 Visual exam ination 4. 1 1 04 + 8 c 0
Dim ensions 4. 1
Leakage cu rrent 4. 2. 1
Capacitance 4. 2. 2
Tang ent of l oss angl e 4. 2. 3
I m pedance a 4. 2. 4
I nsulation resistance of the extern al 4. 2. 5
insulati on a
Voltage proof of th e external 4. 2. 6
insulati on a
High su rg e current a 4. 1 9
Spare specim ens 8
1A Robustness of term inations 4. 3 12 0
Resistance to sol derin g heat 4. 4
Com ponent solvent resistance 4. 1 7
1B Solderability 4. 5 24 0
Solvent resistance of the m arki ng 4. 1 8
Rapi d change of temperature 4. 6
Vibrati on 4. 7
Bum p a 4. 8
Shock a 4. 9
1 Clim atic sequence 4. 1 0 36 0
2 Dam p heat, steady state 4. 1 1 20 0
3 Endu rance 4. 1 2 20 0
4A Surg e voltag e 4. 1 3 8 0
4B Reverse voltag e a 4. 1 4 8 0
5 Characteristics at high and l ow 4. 1 5 12 0
tem peratu re
Charg e an d discharg e a 4. 1 6
a I f requi red.
b For case size/ vol tage com binations, see 3. 4. 2.
c Spare specim ens.
I EC 60384-1 5:201 7 © I EC 201 7 – 15 –

Table 3 – Test schedule for qualification approval (1 of 6)

Number of
specimens ( n )
and number
Subclause number and D or Conditions of test a of Performance requirements a
test a , inspection i tems ND b and measu rements permissible
non-
conforming
items ( c )
Group 0 ND See Table 2
4. 1 Visual exam ination See 4. 1 Legi ble m arkin g an d as specifi ed
in the d etail specification
4. 1 Dim ensions See 4. 1 See detail specificati on
(detail)
4. 2. 1 Leakage cu rrent See 4. 2. 1 . 2 ≤ the initial lim it specified in th e
detail specification
(at 20° C, 85° C and 1 25° C)
4. 2. 2 Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 2. 3 Tang ent of l oss angl e See 4. 2. 3. 2 ≤ the initial lim it specified in th e
detail specification
4. 2. 4 I m pedance c See 4. 2. 4. 3
I nitial m easurem ent See 4. 2. 4. 2 See detail specificati on
Measurem ent at l ower See 4. 2. 4. 4 See detail specificati on
category temperature
4. 2. 5 I nsulation resistance See 4. 2. 5. 2 ≥ 1 00 M Ω
of the external
insulati on c
4. 2. 6 Voltage proof of th e See 4. 2. 6. 2 No breakdown or fl ashover
extern al insul ation c during th e test
4. 1 9 Hi gh su rg e current d See I EC 60384-
1 : 201 6, 4. 39
Group 1 A D See Table 2
4. 3 Robustness of See 4. 3. 3
term inations
4. 3. 2 I nitial inspection
Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 3. 5 Fin al inspections
Visual exam ination See 4. 1 The term inations shal l withstan d
4 successive bends.
Capacitance See 4. 2. 2. 2 See detail specificati on
4. 4 Resistance to sol derin g See I EC 60384-
heat 1 : 201 6, 4. 1 4
4. 4. 3 Fin al inspections
Visual exam ination See 4. 1 Legi ble m arkin g an d as specifi ed
in the detail specification
Capacitance See 4. 2. 2. 2 See detail specificati on
4. 1 7 Com ponent solvent See I EC 60384-
resistance 1 : 201 6, 4. 31
Group 1 B D See Table 2
4. 5 Solderability See 4. 5. 2
4. 5. 3 Fin al inspection
Visual exam ination See 4. 1 Good ti nni ng as evi denced by
free flowi ng of th e sold er with
wettin g of the term inations
 – 16 – I EC 60384-1 5:201 7 © I EC 201 7

Table 3 (2 of 6)
Number of
specimens ( n )
Subclause number and D or Conditions of test a and number
test a , inspection i tems ND b and measurements of permissibl e Performance requirements a
non-
conforming
items ( c )
Group 1 B (conti nu ed) D See Table 2
4. 1 8 Solvent resistance of See I EC 60384-1 :
the m arking 201 6, 4. 32
4. 6 Rapi d change of See 4. 6. 3
tem peratu re
4. 6. 2 I nitial inspection
Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 6. 4 Recovery See 4. 6. 4
4. 6. 5 Fin al inspection
Capacitance See 4. 2. 2. 2 See detail specificati on
4. 7 Vibrati on See 4. 7. 2
4. 7. 3 Fin al inspections
Visual exam ination See 4. 1 No visible dam age and for n on -
solid el ectrol yte capacitors no
leakag e of el ectrol yte
Leakage cu rrent See 4. 2. 1 . 2 See detail specificati on
Capacitance See 4. 2. 2. 2 See detail specificati on
Tang ent of l oss angl e See 4. 2. 3. 2 See detail specificati on
I m pedance c See 4. 2. 4. 3 See detail specificati on
4. 8 Bum p c See 4. 8. 3
4. 8. 2 Mou nting See 4. 8. 2
4. 8. 4 Fin al inspections
Visual exam ination See 4. 1 No visible dam age and for n on -
solid el ectrol yte capacitors no
leakage of el ectrol yte
Leakage cu rrent See 4. 2. 1 . 2 See detail specificati on
Capacitance See 4. 2. 2. 2 See detail specificati on
Tang ent of l oss angl e See 4. 2. 3. 2 See detail specificati on
I m pedance c See 4. 2. 4. 3 See detail specificati on
4. 9 Shock c See 4. 9. 3
4. 9. 2 Mou nting See 4. 8. 2
4. 9. 4 Fin al inspections
Visual exam ination See 4. 1 No visible dam age and for n on -
solid el ectrol yte capacitors no
leakag e of el ectrol yte
Leakage cu rrent See 4. 2. 1 . 2 See detail specificati on
Capacitance See 4. 2. 2. 2 See detail specificati on
Tang ent of l oss angl e See 4. 2. 3. 2 See detail specificati on
I m pedance c See 4. 2. 4. 3 See detail specificati on
I EC 60384-1 5:201 7 © I EC 201 7 – 17 –

Table 3 (3 of 6)
Number of
specimens ( n )
Subclause number and D or Conditions of test a and number
test a , inspection i tems ND b and measurements of permissibl e Performance requirements a
non-
conforming
items ( c )
Group 1 D See Table 2
4. 1 0 Clim atic sequence See 4. 1 0. 3
4. 1 0. 2 I niti al inspection
Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 1 0. 3 Dry heat See 4. 1 0. 3
4. 1 0. 4 Dam p heat, cyclic, See I EC 60384-
Test Db, first cycle 1 : 201 6, 4. 21 . 4
4. 1 0. 5 Col d See I EC 60384-
1 : 201 6, 4. 21 . 5
4. 1 0. 6 Low air pressure c See 4. 1 0. 6. 2
4. 1 0. 7 Dam p heat, cyclic, See I EC 60384-
Test Db, rem aini ng 1 : 201 6, 4. 21 . 7.
cycles
4. 1 0. 8 Recovery See 4. 1 0. 8
4. 1 0. 9 Sealin g c See I EC 60384-
1 : 201 6, 4. 20
4. 1 0. 1 0 Fin al inspections
Visual exam ination See 4. 1 No visible dam age and for n on -
solid el ectrol yte capacitors no
leakag e of el ectrol yte
Legi ble m arkin g
Leakage cu rrent See 4. 2. 1 . 2 ≤ initial lim it
Capacitance See 4. 2. 2. 2 For g en eral-pu rpose grade:
| ∆ C/ C | ≤ 1 2 % of the value
m easured i n 4. 1 0. 2
For long -l ife grade:
| ∆ C/ C | ≤ 5 % of the val ue
m easured i n 4. 1 0. 2
| ∆ C/ C | ≤ 8 % of the val ue
m easured i n 4. 3. 2 or 4. 6. 2 c

Tang ent of l oss angl e See 4. 2. 3. 2 ≤ initial lim it

Group 2 D See Table 2
4. 1 1 Dam p heat, steady See I EC 60384-
state 1 : 201 6, 4. 22
4. 1 1 . 2 I niti al inspection
Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 1 1 . 3 Recovery See 4. 1 1 . 3
4. 1 1 . 4 Fi nal i nspections
Visual exam inations See 4. 1 No visible dam age and for
nonsol id el ectrol ytic capacitors
no leakag e of el ectrol yte
Legi ble m arkin g
Leakage cu rrent See 4. 2. 1 . 2 ≤ the initial lim it
 – 18 – I EC 60384-1 5:201 7 © I EC 201 7

Subclause number and test a , D or
inspection items
Group 2 (contin ued )
4. 1 1 . 4 Final i nspections
(contin ued)
Capacitance
I nsulation resistance of the
extern al insul ation c
Vol tage proof of th e external
insulati on c
Table 3 (4 of 6)
Number of
specimens ( n )
Conditions of test a and number of
ND b and measurements permissible Performance requirements a
non-
conforming
items ( c )
D See Table 2
See 4. 2. 2. 2 Sub-fam ily 1 :
For gen eral-pu rpose grade:
| ∆ C/ C | ≤ 1 2 % of the val ue
m easured i n 4. 1 1 . 2
For long -life grade:
| ∆ C/ C | ≤ 8 % of the val ue
m easured i n 4. 1 1 . 2
Sub-fam ily 2:
| ∆ C/ C | ≤ the i nitial lim it
See 4. 2. 5. 2 No breakdown or flashover
See 4. 2. 6. 2 ≥ 1 00 M Ω

Group 3 D See Table 2

4. 1 2 Endurance See 4. 1 2. 3
4. 1 2. 2 I nitial inspection
Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 1 2. 4 Recovery See 4. 1 2. 4
4. 1 2. 5 Final i nspections
Visual examinations See 4. 1 No visible dam age
Legi ble m arkin g
Leakage current See 4. 2. 1 . 2 ≤ 1 , 25 tim es the initial l im it
Capacitance See 4. 2. 2. 2 | ∆ C/ C | com pared to val ues
m easured i n 4. 1 2. 2:
Sub- UR e 85°C 1 25° C c
fam ily
1 ≤ 1 60 ≤ 20 % ≤ 25 %
> 1 60 ≤1 5 % ≤ 20 %
2 ≤ 1 60 ≤1 5 % ≤ 25 %
> 1 60 ≤1 0 % ≤ 20 %
Tang ent of l oss angl e See 4. 2. 3. 2 Sub-fam ily 1 :
≤ 1 , 3 tim es the initial lim it
Sub-fam ily 2:
≤ initial lim it
I EC 60384-1 5:201 7 © I EC 201 7 – 19 –

Table 3 (5 of 6)
Number of
specimens ( n )
Subclause number and D or Conditions of test a and number of
test a , inspection i tems ND b and measu rements permissible Performance requirements a
non-
conforming
items ( c )
Group 4A D See Table 2
4. 1 3 Surg e voltag e See 4. 1 3. 3
4. 1 3. 2 I nitial inspection
Capacitance See 4. 2. 2. 2 Within specified tol erance
4. 1 3. 4 Final i nspections
Visual exam inations See 4. 1 No visible dam age
Leakage cu rrent See 4. 2. 1 . 2 ≤ initial lim it
Capacitance See 4. 2. 2. 2 ≤ initial lim it
Tang ent of l oss angl e See 4. 2. 3. 2 ≤ initial lim it
Group 4B D See Table 2
4. 1 4 Reverse voltag e c See 4. 1 4. 3
4. 1 4. 4 Final i nspections
Visual exam inations See 4. 1 No visible dam age
Leakage cu rrent See 4. 2. 1 . 2 ≤ initial lim it
Capacitance See 4. 2. 2. 2 ≤ initial lim it
Tang ent of l oss angl e See 4. 2. 3. 2 ≤ initial lim it
Group 5 D See Table 2
4. 1 5 Characteristics at high See I EC 60384-1 :
and l ow tem perature 201 6, 4. 29
Step 1 : 20 ° C
Leakage cu rrent f See 4. 2. 1 . 2
Capacitance f See 4. 2. 2. 2
Tang ent of l oss angl e f See 4. 2. 3. 2
I m pedance (at the sam e See 4. 2. 4. 3
freq uency as Step 2) c f
Step 2: lower category
tem perature
Capacitance See 4. 2. 2. 2 See detail specificati on
Tang ent of l oss angl e See 4. 2. 3. 2 See detail specificati on
I m pedance c See 4. 2. 4. 3 See detail specificati on
Step 3: 20 ° C
Leakage cu rrent See 4. 2. 1 . 2
Capacitance See 4. 2. 2. 2
Tangent of l oss angl e See 4. 2. 3. 2
I m pedance c See 4. 2. 4. 3
Step 4: rated tem peratu re
Leakage cu rrent See 4. 2. 1 . 2 See detail specificati on
Capacitance See 4. 2. 2. 2 See detail specificati on
Tangent of l oss angl e c See 4. 2. 3. 2 See detail specificati on
I m pedance c See 4. 2. 4. 3 See detail specificati on
 – 20 – I EC 60384-1 5:201 7 © I EC 201 7

Table 3 (6 of 6)
Number of
specimens ( n )
Subclause number and D or Conditions of test a and number of
test a , inspection i tems ND b and measurements permissible Performance requirements a
non-
conforming
items ( c )
Group 5 (contin ued ) D See Table 2
4. 1 5
Step 5: upper categ ory
tem peratu re
Leakage cu rrent See 4. 2. 1 . 2 See detail specificati on
Capacitance See 4. 2. 2. 2 See detail specificati on
Tang ent of l oss angl e c See 4. 2. 3. 2 See detail specificati on
I m pedance c See 4. 2. 4. 3 See detail specificati on
Step 6: 20 ° C
Leakage cu rrent See 4. 2. 1 . 2
Capacitance See 4. 2. 2. 2
Tangent of l oss angl e c See 4. 2. 3. 2
I m pedance c See 4. 2. 4. 3
4. 1 6 Charg e an d discharg e c See I EC 60384-1 :
201 6, 4. 27
4. 1 6. 5 Fi nal i nspections
Visual exam inations See 4. 1 No visible dam age and for n on -
solid el ectrol yte capacitors no
leakag e of el ectrol yte
Leakage cu rrent See 4. 2. 1 . 2 ≤ the initi al lim it
Capacitance See 4. 2. 2. 2 Sub-fam ily 1 :
| ∆ C/ C | ≤ 1 0% of th e valu e
m easured i n 4. 2. 2
Sub-fam ily 2:
| ∆ C/ C | ≤ 5% of the val ue
m easured i n 4. 2. 2
Tang ent of l oss angl e See 4. 2. 3. 2 ≤ the initi al lim it
a The val ue of th ese m easurem ents after m ountin g serve as initi al m easurem ents for th e tests after
m easurem ent of each su bgrou ps.
b I n this table, D = destructive, N D = non-destructive.
c I f requi red.
d I f requi red for solid electrolyte capacitors onl y.
e UR = rated voltag e in volts.
f For use as reference valu e.

3.5 Quality conformance inspection

3.5.1 Formation of inspection lots
3.5.1 .1 Groups A and B inspection
These tests shall be carried out on a lot-by-lot basis.

A manufacturer m ay aggregate the current production into inspection lots subject to the
following safeguards.
I EC 60384-1 5:201 7 © I EC 201 7 – 21 –

a) The inspection lot shall consist of structurall y sim ilar capacitors (see 3. 2).
b) The sample tested shall be representative of the values and dim ensions contained in the
inspection lot:
– in relation to their num ber;
– with a m inim um of five of an y one value.
c) I f there are fewer than five of an y one value in the sample, the basis for the drawing of
samples shall be agreed between the m anufacturer and the certification bod y (CB).
3. 5. 1 . 2 G ro u p C i n s p e c t i o n

These tests shall be carried out on a periodic basis.

Samples shall be representative of the current production of the specified periods and shall
be divided into high-, medium- and low-voltage ratings or case sizes. I n order to cover the
range of approvals in any period , one case size shall be tested from each voltage group. I n
subsequent periods, other case sizes and/or voltages in production shall be tested with the
aim of covering the whole range.

3. 5. 2 T es t s ch e d u l e

The schedule for the lot-by-lot and periodic tests for quality conformance inspection is given
in the blank detail specification.

3. 5. 3 D e l a ye d d e l i v e ry

When according to the procedures of I EC 60384-1 :201 6, Q. 1 . 7, re-inspection should be made,

solderability and for sub-fam ilies 1 : leakage current and for sub-famil y 2: capacitance, shall
be checked as specified in Groups A and B inspection.

3. 5. 4 As s e s s m e n t l e v e l s

The assessm ent level(s) given in the blank detail specification shall preferably be selected
from Table 4 and Table 5.

T a b l e 4 – L o t-b y-L o t i n s p e c ti o n

EZ
I n s p e c ti o n
a
s u b g ro u p
IL
b
n b
c b

A0 1 00 % c
d
A1 S-3 0
d
B1 S-3 0
a The content of the i nspection subg roup is descri bed in th e blank detail specification.
b I L = inspection level
n = sam ple size
c = perm issible num ber of non-conform ing item s
c After rem oval of n onconform ing item s by 1 00 % testing during th e m anufacturin g process, sam pling
inspection shall be perform ed in order to m onitor outg oin g q uality l evel by n onconform ing i tem s per m illion
(×1 0 − 6 ). The sam pling l evel shall be establish ed by the m anufacturer, preferably accordin g to
I EC 61 1 93-2: 2007, Annex A. I n case on e or m ore n onconform ing item s occur in a sam pl e, this lot shall be
rej ected, but the whole sam pl e shall be i nspected an d all nonconform ing item s shall be counted for the
cal culation of qual ity l evel val ues. Outg oin g q uality level by nonconform ing item s per m illion (× 1 0 − 6 ) val ues
shall be calculated by accum ulating i nspection data accordin g to the m ethod gi ven in I EC 61 1 93-2: 2007, 6. 2.
d Num ber to be tested: sam ple si ze shall be determ ined accordi ng to I EC 61 1 93-2: 2007, 4. 3. 2.
 – 22 – I EC 60384-1 5:201 7 © I EC 201 7

T a b l e 5 – P e ri o d i c I n s p e c t i o n

I n s p e c ti o n EZ
a
s u b g ro u p

p b
n b
c b

C1 3 12 0
C2 3 12 0
C3 3 78 0
C4 6 12 0
C5 3 24 0
a The content of the i nspection subg roup is descri bed in Clause 2 of the bl ank d etail specificati on.
b p = peri odicity in m onths
n = sam ple size
c = perm issible n um ber of n on -conform ing item s

4 T e s t a n d m e a s u re m e n t p ro c e d u re s

NOTE This clause su ppl em ents the inform ation gi ven i n I EC 60384-1 : 201 6, Clause 4.

4. 1 Vi s u a l i n s p e cti on an d ch e ck of d i m e n s i o n s

See I EC 60384-1 : 201 6, 4.4.

4. 2 E l e c t ri c a l te s ts

4. 2 . 1 L e a k a g e c u rre n t

4. 2 . 1 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.9, with the details of 4. 2. 1 . 2 and 4. 2. 1 . 3.

4. 2 . 1 . 2 M e a s u ri n g con d i ti on s

The voltage appropriate to the test temperature shall be applied across the capacitor and its
protective resistor. The protective resistor shall be between 1 000 Ω and 1 0 000 Ω .

In the case of bipolar capacitors, the duration of the electrification periods before the
measurem ent m ade in each direction is 5 m in.

4. 2 . 1 . 3 Re q u i re m e n t

See Table 3.

4. 2 . 2 C ap a ci tan ce

4. 2 . 2 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.7, with the details of 4. 2. 2. 2 and 4. 2. 2. 3.

4. 2 . 2 . 2 M e a s u ri n g co n d i ti on s

The capacitance shall be m easured at a frequency of 1 00 H z or 1 20 H z. The peak alternating

voltage actually applied across the capacitor shall be between 0, 1 V and 1 , 0 V.
I EC 60384-1 5:201 7 © I EC 201 7 – 23 –

A d.c. bias voltage of 2, 1 V to 2, 5 V m ay be applied during the measurement (unless

otherwise prescribed in the detail specification), except for bi-polar capacitors which shall be
measured without an applied d.c. voltage.

Suitable measurem ent techniques shall be used to m inimize errors due to connections
between the measuring apparatus and the capacitors.

4. 2 . 2 . 3 R e q u i re m e n t

See Table 3.

4. 2 . 3 Tan g en t of l o s s an g l e (tan δ
)

4. 2 . 3 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4. 8, with the details of 4. 2. 3. 2 and 4. 2. 3. 3.

4. 2 . 3 . 2 M e a s u ri n g con d i ti on s

The measurem ent shall be m ade under the conditions of 4.2. 2. 2.

4. 2 . 3 . 3 R e q u i re m e n t

See Table 3.

4. 2 . 4 I m p e d a n c e ( i f re q u i re d )

4. 2 . 4 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.1 0, with the details of 4. 2. 4. 2, 4. 2. 4.3, 4. 2.4. 4 and 4. 2. 4.5.

4. 2 . 4 . 2 I n i ti al i n s p ecti o n

The frequency of the m easuring voltage shall be chosen from one of the following
frequencies: 1 00 H z, 1 20 H z, 1 kH z, 1 0 kH z, 1 00 kH z, and 1 MH z, and shall be that at which
the lowest value of im pedance is likely to occur.

The tolerance on all frequencies for m easuring purposes shall not exceed ±20 %.

The value of the m easuring frequency shall be prescribed in the detail specification.

4. 2 . 4 . 3 M e a s u ri n g con d i ti o n s

When required in the detail specification, the im pedance shall be determined at the requ ired
temperature and frequency. I f the peak a. c. voltage exceeds 0, 5 V on polar types, a direct
polarizing voltage of 2, 1 V to 2, 5 V m ay be applied.

The application of voltage shall be such as to cause no readable change in im pedance due to
the change in the temperature of the capacitor.

The error of m easurem ent shall not exceed ±5 % of the requirement, or 0, 1 Ω , whichever is
the greater.

Great care shall be exercised in m aking these measurem ents when the impedance values are
low.
 – 24 – I EC 60384-1 5:201 7 © I EC 201 7

4. 2 . 4. 4 M e a s u re m e n t a t l o w e r c a t e g o ry t e m p e ra t u re

The frequency shall be 1 00 H z or 1 20 H z unless otherwise specified in the detail

specification.

4. 2 . 4 . 5 Re q u i re m e n t

See Table 3.

4. 2 . 5 I n s u l ati o n re s i s t a n c e o f t h e e xt e rn a l i n s u l a ti o n ( i f re q u i re d )

4. 2 . 5 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.5, with the following details.

4. 2 . 5 . 2 M e a s u ri n g con d i ti o n s

A m etal foil shall be wrapped closel y around the full length of the body of the capacitor,
protruding by at least 5 mm from each end, provided a m inim um space of 1 m m can be
maintained between the metal foil and the term inations. The ends of the foil shall not be
folded over the ends of the capacitor. I f the 1 mm space cannot be maintained the protrusion
of the foil shall be reduced as m ay be necessary to establish the 1 m m space.

When applicable, the V-block m ethod is permitted as an alternative.

A direct voltage of 1 00 V ± 1 5 V shall be applied between the metal foil or the V-block and the
term ination connected to the capacitor bod y for a minimum of 1 m in or for the tim e required to
obtain a stable reading. At the end of this period the insulation resistance shall be measured.

4. 2 . 5 . 3 R e q u i re m e n t

See Table 3.

4. 2 . 6 Vo l t a g e p ro o f o f t h e e xt e rn a l i n su l ati on ( i f re q u i re d )

4. 2 . 6 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.6, with the details of 4. 2. 6. 2 and 4. 2. 6. 3.

4. 2 . 6 . 2 M e a s u ri n g con d i ti o n s

A m etal foil shall be wrapped closel y around the bod y of the capacitor, protruding by at least
5 mm from each end, provided a m inim um space of 1 mm can be maintained between the
metal foil and the term inations. The ends of the foil shall not be folded over the ends of the
capacitor. I f the 1 mm space cannot be maintained, the protrusion of the foil shall be reduced
as may be necessary to establish the 1 mm space.

When applicable, the V-block method is permitted as an alternative.

A direct voltage gradually increasing at a rate of 1 00 V/s to a maximum of 1 000 V shall be

applied between the m etal foil or the V-block and the termination connected to the capacitor
bod y.

The voltage of 1 000 V shall be applied for 1 min ± 5 s.

4. 2 . 6 . 3 Re q u i re m e n t

See Table 3.
I EC 60384-1 5:201 7 © I EC 201 7 – 25 –

4. 3 R o b u s t n e s s o f t e rm i n a t i o n s

4. 3 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.1 3, with the details of 4. 3. 2, 4. 3. 3 and 4. 3. 4.

4. 3 . 2 I n i ti a l i n s p ecti o n

See Table 3.

4. 3 . 3 Test U a1 , U b an d U c appl i cabl e

See I EC 60384-1 : 201 6, 4. 1 3. 2 (Test U a1 ), 4.1 3. 3 (Test U b) and 4. 1 3. 4 (Test Uc).

Which test condition(s) is (are) applied shall be described in detail specification.

However, capacitors with external welds on wire leads shall be subj ected onl y to the
procedure of Test U a 1 and to the bending test described in the detail specification.

4. 3 . 4 S p e ci al ben d i n g te s t

4. 3 . 4. 1 G e n e ra l

This examination shall determine the ability of the termination to withstand the bonding likel y
to be applied during normal assembly operation.

4. 3 . 4. 2 T es t con d i ti on

See Figure 1 with the following detail.

4. 3 . 4. 3 Ap p a ra t u s

Dim e n sio n s in millim e tre s

Capacitor und er test

Weld

Cou ntersunk 1 , 6 ± 0, 4 a
Brass or steel
1 2, 7

6, 35 Approxim atel y 1 27

IEC

a The di am eter of the hol e shou l d be 0, 025 m m less than the di am eter of the term ination.
F i g u re 1 – Ap p a ra t u s o f s p e c i a l ben d i n g test
 – 26 – I EC 60384-1 5:201 7 © I EC 201 7

4.3.4.4 Test procedure

The term ination shall be inserted into the hole in the fixture (Figure 1 ) so that the lower side
of the weld on the soldered joint is approximately flush with the surface of the fixture. The
case shall be forced over in such a manner that the tantalum stub is m aintained in its axial
position as closel y as possible while bending the termination until the end of the case j ust
touches the top surface of the fixture.

When the case is returned to its norm al position, one bend will have been com pleted.

Subsequent bends shall be m ade in alternate directions.

4.3.4.5 Requirements
See Table 3.

4.4 Resistance to soldering heat

4.4.1 General
See I EC 60384-1 : 201 6, 4.1 4, with the details of 4. 4. 2 and 4. 4. 3.

4.4.2 Conditions
No pre-drying.

4.4.3 Final inspections and requirements

See Table 3.

4.5 Solderability
4.5.1 General
See 60384-1 : 201 6, 4. 1 5, with the details of 4. 5. 2 and 4. 5. 3.

4.5.2 Test conditions

No ageing.

The test m ethod (the globule test m ethod , the bath m ethod or soldering iron test method)
shall be prescribed in the detail specification.

The requirem ents of the globule test method shall be prescribed in the detail specification.

Where neither the solder bath nor th e solder globule method is appropriate, the soldering iron
test shall be used with soldering iron size A.

4.5.3 Final inspections and requirements

See Table 3.

4.6 Rapid change of temperature

4.6.1 General
See I EC 60384-1 : 201 6, 4. 1 6, with the following details.
I EC 60384-1 5:201 7 © I EC 201 7 – 27 –

4. 6. 2 I n i ti al i n s p e c ti o n

See Table 3.

4. 6. 3 T es t con d i ti o n s

The capacitors shall be subj ected to test N a (see I EC 60068-2-1 4) for 5 cycles. The duration
of the exposure at each temperature lim it shall be 30 min.

4. 6 . 4 R e c o v e ry

The recovery period shall be max. 1 6 h.

4. 6 . 5 Fi n al i n s p e cti o n s an d re q u i re m e n t s

See Table 3.

4. 7 Vi b ra t i o n

4. 7 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.1 7, with the details of 4. 7. 2 and 4. 7. 3.

4. 7 . 2 Test con d i ti on

Test Fc (see I EC 60068-2-6) shall be applied with one of the following severities in Table 6 as
prescribed by the detail specification.

T a b l e 6 – V i b ra t i o n t e s t fre q u e n c i e s

F re q u e n c y Am p l i t u d e o r a c c e l e r a t i o n ( w h i c h e v e r i s th e l o we r a c c e l e ra ti o n ) D u ra t i o n

Hz h
1 0 to 55 0, 35 m m or 49 m /s 2 (5 g) 3 × 0, 5
1 0 to 55 0, 75 m m or 98 m /s 2 (1 0 g ) 3×2
1 0 to 500 0, 75 m m or 98 m /s 2 (1 0 g ) 3×2
1 0 to 2 000 0, 75 m m or 98 m /s 2 (1 0 g ) 3×2

The detail specification shall specify the severity (frequency/am plitude or acceleration/
duration) and shall also prescribe the mounting m ethod to be used. For capacitors with axial
leads and intended to be mounted by the leads onl y, the distance between the bod y and the
mounting point shall be 6 mm ± 1 m m.

4. 7 . 3 Fi n al i n s p e cti o n s an d re q u i re m e n t s

The capacitors shall be visuall y examined and m easured and shall m eet the requirem ents
given in Table 3.

4. 8 Bu mp

4. 8 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.1 8, with the details of 4. 8. 2, 4. 8. 3 and 4. 8. 4.

Whether the bum p or the shock test applies shall be described in the detail specification.
 – 28 – I EC 60384-1 5:201 7 © I EC 201 7

4.8.2 Mounting
See detail specification.

For capacitors with axial leads, the following applies:

• mounting: m ounted by the leads onl y;
• the distance between the bod y and the mounting point: be 6 mm ± 1 m m.
4.8.3 Test conditions
Test conditions are as follows:
• peak acceleration: 390 m/s 2 ;
• potal num ber of bumps: 1 000 tim es for general-purpose grade capacitors;
4 000 tim es for long-life grade capacitors;
• duration of pulse: see detail specification.
4.8.4 Final inspections and requirements
See Table 3.

4.9 Shock
4.9.1 General
See I EC 60384-1 : 201 6, 4. 1 9, with the details of 4. 9.2, 4. 9. 3 and 4.9. 4.

Whether the bump or the shock test applies shall be described in the detail specification.

4.9.2 Mounting
See the detail specification.

For capacitors with axial leads the following applies:

• mounting: m ounted by the leads onl y;
• the distance between the bod y and the mounting point is 6 mm ± 1 m m.
4.9.3 Test conditions
See the detail specification with the following item s:
• Pulse shape: half-sine
• Peak acceleration: see Table 7
• Duration of pulse: see Table 7
Table 7 – Shock peak acceleration/pulse duration
Peak acceleration Corresponding duration of the pulse
m /s 2 (g) ms
294 (30) 18
490 (50) 11
981 (1 00) 6
I EC 60384-1 5:201 7 © I EC 201 7 – 29 –

The detail specification shall also prescribe the mounting m ethod to be used. For capacitors
with axial leads and intended to be mounted by the leads only, the distance between the bod y
and the m ounting point shall be 6 mm ± 1 mm .

4. 9 . 4 Fi n al i n s p e cti o n s an d re q u i re m e n t s

See Table 3.

4. 1 0 C l i m a ti c s e q u e n ce

4. 1 0 . 1 G e n e ra l

See 60384-1 : 201 6, 4. 21 , with the details of 4. 1 0.2 to 4. 1 0. 1 0.

4. 1 0 . 2 I n i ti al i n s p e c ti o n

See Table 3.

4. 1 0 . 3 D ry h e a t

See I EC 60384-1 : 201 6, 4.21 . 3, with the following details.

• Temperature: upper category tem perature;
• Duration: 1 6 h.
4. 1 0 . 4 D a m p h e at, c yc l i c, T e s t D b , fi rs t c y c l e

See I EC 60384-1 : 201 6, 4.21 . 4.

4. 1 0 . 5 Col d

See I EC 60384-1 : 201 6, 4.21 . 5, with the following details.

• Temperature: lower category temperature;
• Duration: 2 h.
4. 1 0 . 6 L o w a i r p re s s u re ( i f re q u i re d )

4. 1 0 . 6. 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.21 . 6, with the details of 4. 1 0. 6. 2.

4. 1 0 . 6 . 2 Tes t con d i ti on s

Test conditions are as follows:

• temperature: +5 °C to +35 °C;
• air pressure: 8, 5 kPa;
• duration of test: 5 min;
• applied voltage: rated voltage is applied during the last minute of test.
4. 1 0 . 7 D am p h e at, cycl i c, Test Db, re m a i n i n g c yc l e s

See I EC 60384-1 : 201 6, 4.21 . 7.

4. 1 0 . 8 R e c o v e ry

I f the capacitors have been immersed in a liquid, they shall be shaken to rem ove excess
liquid.
 – 30 – I EC 60384-1 5:201 7 © I EC 201 7

The recovery period shall be 1 h to 2 h under the standard atmospheric conditions.

4. 1 0 . 9 S e a l i n g ( i f re q u i re d )

See I EC 60384-1 : 201 6, 4. 20, with the following details.

The test shall be applied at the end of the climatic sequence.

4. 1 0 . 1 0 Fi n al i n s p e cti o n s an d re q u i re m e n t s

See Table 3.

4. 1 1 D a m p h eat, s te ad y s t ate

4. 1 1 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.22, with the details of 4. 1 1 . 2 and 4.1 1 .3.

4. 1 1 . 2 I n i ti al i n s p e c ti o n

See Table 3.

4. 1 1 . 3 Fi n al i n s p e cti o n s an d re q u i re m e n t s

See Table 3.

4. 1 2 E n d u ra n c e

4. 1 2 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.23, with the details of 4. 1 2. 2, 4. 1 2. 3, 4. 1 2. 4 and 4. 1 2. 5.

4. 1 2 . 2 I n i ti a l i n s p e c ti o n

See Table 3.

4. 1 2 . 3 Tes t co n d i ti on s

Test conditions are as follows:

• Duration: 2 000 h for long-life grade capacitors;
1 000 h for general-purpose grade capacitors.
• Ambient tem perature: upper category temperature.
• Applied voltage: category voltage, unless otherwise specified in the detail specification.
NOTE When the category vol tage and/or tem peratu res are different from the rated voltag e an d/or tem peratures,
the sam pl e tested is di vid ed i nto two parts an d subm itted to the rated and categ ory voltages and tem peratures
respecti vel y.

During the test of bipolar capacitors, the applied voltage shall be reversed in polarity at
intervals of 1 68 h ± 24 h.

When specified in the detail specification , a sinusoidal alternating voltage with frequency of
50 H z, 60 H z, 1 00 H z or 1 20 H z, as specified, may be superimposed on the d.c. voltage
provided that the peak voltage does not exceed the value of the rated direct voltage and that
the rated ripple current is not exceeded.
a) For solid electrolyte capacitors onl y, the test voltage shall be applied graduall y (not less
than 2 m in but not more than 5 m in) either by a slow build-up of voltage or through a
I EC 60384-1 5:201 7 © I EC 201 7 – 31 –

resistor which shall be shorted out within 5 min. The impedance seen from the terminals
of each capacitor shall not exceed 3 Ω .
b) For non-solid electrol yte capacitors, the test voltage shall be supplied by a regulated
power suppl y free from surges, having a low internal resistance, and shall be applied to
each capacitor or capacitor section through a separate resistor. The value of this resistor
shall be so chosen that a short-circuit of one of the capacitors or capacitor sections will
have no influence on the rest of the sample, but the resistance value shall not exceed
1 000 Ω .
4. 1 2 . 4 Re c o v e ry

The recovery period shall be less than 1 6 h.

4. 1 2 . 5 Fi n al i n s p e cti o n s a n d re q u i re m e n t s

See Table 3.

4. 1 3 S u rg e v o l t a g e

4. 1 3. 1 G e n e ra l

See I EC 60384-1 : 201 6, 4.26, with the details of 4. 1 3. 2, 4. 1 3. 3 and 4. 1 3. 4.

4. 1 3. 2 I n i ti a l i n s p e c ti o n

See Table 3.

4. 1 3. 3 T es t con d i ti on s

The capacitors shall be subj ected to 1 000 cycles, each consisting of a charge as described
below, followed by a no-load period of 5 m in and 30 s.

A voltage, equal to the surge voltage, shall be applied during 30 s through a resistor with a
value so that the total resistance in series with the capacitor and voltage source is
1 000 Ω ± 1 00 Ω .

The test shall be carried out at the test temperatures given in Table 8.

T a b l e 8 – T e s t t e m p e ra t u re

U p p e r ca te g o ry T e s t t e m p e ra t u re

t e m p e ra t u re

≤ 85 °C Al l specim ens are at u pper category tem peratu re

>85 °C 50 % of the specim ens at 85 ° C an d the rem ainin g 50 % at th e upper category tem perature

Each surge voltage cycle shall be performed in such a manner that the capacitor is
discharged through the resistor of approximatel y 1 000 Ω at the end of the 30 s application.

The test shall be term inated on the discharge portion of the cycle. For bipolar capacitors, the
polarity shall be reversed after 500 cycles.

4. 1 3 . 4 F i n al i n s p e cti o n s an d re q u i re m e n t s

See Table 3.
 – 32 – I EC 60384-1 5:201 7 © I EC 201 7

4. 1 4 R e v e rs e v o l t a g e ( i f re q u i re d )

4. 1 4. 1 G e n e ra l

See the details in 4. 1 4. 2, 4. 1 4.3 and 4. 1 4. 4.

4. 1 4. 2 I n i ti al i n s p e c ti o n

Not required.

4. 1 4. 3 Test con d i ti on s

Test conditions are as follows:

a) Sub-famil y 1 :
– Temperature: rated temperature;
– Applied voltage: a voltage of 3 V d. c., unless otherwise specified in the detail
specification, shall be supplied in reverse voltage polarity direction to each capacitor
through a resistor of 1 000 Ω ± 1 00 Ω ;
– Duration: 1 25 h in the reverse polarity direction with the test reverse voltage, followed
by 1 25 h in the forward polarity direction with the rated voltage.
b) Sub-fam il y 2:
– Temperature: rated tem perature;
– Applied voltage: 0, 1 × rated voltage, but with max. 3 V d.c., unless otherwise specified
in the detail specification , shall be supplied in reverse voltage polarity direction;
The voltage applied to each capacitor shall be from a voltage source with a minimum
im pedance of 0, 1 Ω /V with a maximum of 3 Ω .
(The voltage shall be applied graduall y as described in 4. 1 2. 3 a).
– Duration: 1 25 h in the reverse polarity direction with test reverse voltage followed by
1 25 h in the forward polarity direction with the rated voltage.
4. 1 4. 4 Fi n al i n s p e cti o n s an d re q u i re m e n t s

See Table 3.

4. 1 5 C h a ra c t e ri s t i c s a t h i g h an d l o w t e m p e ra t u re

4. 1 5. 1 G e n e ra l

See I EC 60384-1 : 201 6, 4. 29, with the details in 4. 1 5. 2.

4. 1 5. 2 F i n al i n s p e cti o n s an d re q u i re m e n t s

The capacitors shall be m easured at each tem perature step and shall m eet the requirem ents
given in Table 3.

4. 1 6 C h a rg e a n d d i s c h a rg e ( i f re q u i re d )

4. 1 6 . 1 G e n e ra l

See I EC 60384-1 : 201 6, 4. 27, with the details in 4. 1 6. 2, 4. 1 6. 3, 4. 1 6. 4 and 4. 1 6. 5.

4. 1 6 . 2 I n i ti a l i n s p e c ti o n

Not required.
I EC 60384-1 5:201 7 © I EC 201 7 – 33 –

4. 1 6. 3 T es t con d i ti on s

At an am bient tem perature of 20 °C, unless otherwise specified in the detail specification, the
capacitors shall be subj ected to the specified num ber of cycles, each cycle consisting of a
charge according to a), followed by a discharge according to b).

The detail specification shall state the cases where an increase of the cycling period is
required, leaving the charging time unchanged so as not to exceed the m axim um perm issible
heat generated in the capacitor.
a) Charge
– Applied voltage: rated direct voltage;
– I nternal resistance of the voltage source plus external series;
– Resistor: see detail specification;
– Duration: 0,5 s.
b) Discharge
– No voltage applied;
– Discharge resistor: see detail specification;
– Duration: 0, 5 s.
c) Num ber of cycles: 1 0 6 cycles.
4. 1 6. 4 R e c o v e ry

The recovery period shall be 24 h.

4. 1 6. 5 F i n a l i n s p e cti o n s an d re q u i re m e n t s

See Table 3.

4. 1 7 C o m p o n e n t s o l v e n t re s i s t a n c e

See I EC 60384-1 : 201 6, 4.31 .

4. 1 8 S o l v e n t re s i s t a n c e o f t h e m a rk i n g

See I EC 60384-1 : 201 6, 4.32.

4. 1 9 High s u rg e c u rre n t ( i f re q u i re d )

4. 1 9 . 1 G e n e ra l

I f required for solid electrol yte capacitors onl y, see I EC 60384-1 :201 6, 4. 39, with the details in
4. 1 9. 2 and 4. 1 9.3.

4. 1 9 . 2 I n i ti a l i n s p e c ti o n

Not required.

4. 1 9 . 3 Fi n al i n s p e cti o n s a n d re q u i re m e n t s

Final inspections and requirem ents are those for the subsequent tests in Group 0 or in the
blank detail specification or Group A, as appropriate.
 – 34 – I EC 60384-1 5:201 7 © I EC 201 7

Bibliography
I EC 60068-2-54: 2006, En viro n m e n ta l te stin g – Pa rt 2-54: Te s ts – Te s t Ta : So lde ra b ility

te s tin g o f e le ctro n ic co m p o n e n ts b y th e we ttin g b a la n ce m e th o d

___________
I N TE RN ATI O N AL

E LE CTRO TE CH N I CAL

CO M M I S S I O N

3, ru e d e Va re m bé

P O B ox 1 3 1

CH -1 2 1 1 G e n e va 2 0

S wi tze rl a n d

Te l : + 41 22 91 9 02 1 1

F a x: + 4 1 22 91 9 03 00

i n fo @i e c. ch

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