ZXONE 8300&8500&8700 Acceptance Test Guide - R1.7

ZXONE 8300&8500&8700
Acceptance Test Guide

R1.7
ZXONE 8300&8500&8700 Acceptance Test Guide Internal Use Only▲
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Revision History
Product Document Serial

Reason for Revision
Version Version Number
R1.0 First published
R1.1 Revised
R1.2 Adds some contents.
R1.3 Adds some contents.
R1.4 Updates test specifications for the OSC board.
Adds test specifications for 8700 devices and the 100G
board.
R1.5
Adds the statements about the -60v DC power supported by
devices.
Adds
MQA1\MQM1\MQA2\MQM2\MJA\MJM\TD2C\TS2C/TS2Cp
R1.6 board test specifications;
Updates test specifications for a portion of boards
(MOM2\CH1\FCA\WSUD\WSUA)
Updates specifications according to the Acceptance Test
Record R1.7; revises test method for OTU board
R1.7
specifications; revises test method for OSC receive
sensitivity;
Author
Date Document Version Prepared by Reviewed by Approved by

2011-06-15 R1.0 Yan Xiao
2011-10-28 R1.1 Sheng Jiye
2011-12-22 R1.2 Sheng Jiye
2012-01-18 R1.3 Sheng Jiye
2012-05-08 R1.4 Sheng Jiye
2012-09-08 R1.5 He Bo
Wang Qiang/Xu
R1.6 2013-10-30
Wei
R1.7 2014-3-27 He Bo
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. II

Applicable to: Acceptance test engineers.
Proposal: Before reading this document, you had better have the following knowledge and skills.
SEQ Knowledge and skills Reference material
Unitrans ZXONE 8700(V1.10) Intelligent
Accompanying document – product
1 Optical Transport Platform Product
description
Description
Unitrans ZXONE 8700(V1.10) Intelligent
Accompanying document – hardware
2 Optical Transport Platform + Hardware
description
description
OTN 100G Service Meter Test Guide_R1.1
3 The use of meters Agilent 86120C Multi-Wavelength Meter
Usage Guideline_R1.0
ZXONE 8300&8500&8700 Product
4 Product test record
Acceptance Test Record_R1.7
Follow-up document: After reading this document, you may need the following information
SEQ Reference material Information
1
2
3
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. III
About This Document
Summary
Chapter Description
1 Board Test Describes test methods and acceptance rules for the single
system specifications
2 System Performance Test Describes test methods and acceptance rules for the system
performance specifications
3 ROADM Test Introduces test methods and acceptance rules for ROADM
4 WASON Test Introduces test methods and acceptance rules for WASON
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. IV

TABLE OF CONTENTS
1 Board Test ....................................................................................................... 1

1.1 Primary Power Supply Test .............................................................................. 1
1.1.1 Primary Power Voltage ..................................................................................... 1
1.1.2 Voltage between Working Ground and Protection Ground ................................ 1
1.1.3 Working Ground Resistance ............................................................................. 3
1.1.4 Resistance of Lightning Protection Ground ....................................................... 3
1.1.5 Ground Resistance of Joint Grounding ............................................................. 3
1.1.6 Maximum Working Current ............................................................................... 4
1.2 Fan Test ........................................................................................................... 4
1.3 Alarm Function Test.......................................................................................... 5
1.3.1 Alarm Indicator ................................................................................................. 5
1.3.2 Alarm Buzzer .................................................................................................... 6
1.3.3 Alarm Ring Interception .................................................................................... 6
1.4 SOTU2.5G/OTU2.5G—2.5G Optical Transponder ........................................... 7
1.4.1 Optical Interface at the Line Side of the SOTU2.5G Board ............................... 7
1.4.2 Optical Interface at the Client Side of the SOTU2.5G Board ........................... 13
1.5 10G Optical Transponder SOTU10G/OTU10G/EOTU10G/EOTU10GB (for
SDH/OTN/10GE Services) ............................................................................. 20
1.5.1 Line-Side Optical Interface.............................................................................. 20
1.5.2 Client-Side Optical Interface ........................................................................... 26
1.6 SRM41—Four-Channel 2.5G Aggregation Board ........................................... 34
1.7 SRM42—Four-Channel 622M/155M Aggregation Board ................................ 48
1.8 GEM2/GEMF/GEM8—Gigabit Ethernet Aggregation Board............................ 63
1.9 SDSA—Data Service Aggregation Board ....................................................... 74
1.10 DSAC—Data Service Aggregation Board (Type-C) ........................................ 84
1.11 ASMA/B—Aggregation Transponder .............................................................. 88
1.12 SAUC—SDH Service Access Board (Type-C) ................................................ 98
1.13 COM/COMB—Eight-Channel Client Service Mixed Access Board................ 105
1.13.1 Client-Side Optical Interface ......................................................................... 105
1.14 SMUB/CSC—SDH Service Aggregation Client Board .................................. 114
1.15 SMUB/LS1/LS2—SDH Service Aggregation Line Board ............................... 122
1.15.1 Line-Side Optical Interface............................................................................ 122
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1.16 CD2/M2&M3CO2/M1&M2&M3&M4CQ2/M1CX2—10G Service Access Board (at

the Client Side)............................................................................................. 129
1.16.1 CD2/CO2/CQ2 Board Client-Side Optical Interface ...................................... 129
1.17 LD2/M2LD2B/M2&M3LO2/M1&M2&M3&M4LQ2—10G Service Access Board
(at the Line Side) .......................................................................................... 137
1.18 M1&M2TST3—40G Transponder ................................................................. 144
1.19 M1&M2MQT3—Four-Channel 10G Aggregation Board ................................ 157
1.20 CS3 Board .................................................................................................... 171
1.20.1 M2&M3CS3 Board Client-Side Optical Interface ........................................... 171
1.21 M2&M3LS3 Board ........................................................................................ 179
1.21.1 LS3 Board Line-Side Optical Interface .......................................................... 179
1.22 FCA—FC Service Access Board .................................................................. 186
1.23 MOM2 Board ................................................................................................ 196
1.24 M1&M2 MQA1/M1MQM1 DWDM 2.5G Board (Multiple Services) ................ 211
1.24.1 Optical Interface at the Line Side of the MQA1/MQM1 Board ....................... 211
1.24.2 Optical Interface at the Client Side of the MQA1/MQM1 Board ..................... 218
1.25 M1&M2 MQA2/M1MQM2 DWDM 10G Board (Multiple Services) ................. 228
1.25.1 Optical Interface at the Line Side of the MQA2/MQM2 Board ....................... 228
1.25.2 Optical Interface at the Client Side of the MQA2 Board ................................ 235
1.26 M1MJA/MJM DWDM 10G Board .................................................................. 244
1.26.1 Optical Interface at the Client Side of the MJA/MJM Board ........................... 244
1.27 M1TD2C/TS2C/TS2CP Board ...................................................................... 252
1.27.1 Optical Interface at the Line Side of the TD2C/TS2C/TS2CP Board ............. 252
1.27.2 Optical Interface at the Client Side of the TD2C/TS2C/TS2CP Board (10G
SDH Services).............................................................................................. 259
1.27.3 Optical Interface at the Client Side of the TD2C/TS2C/TS2CP Board (10G
Data Services).............................................................................................. 267
1.28 M2&M3 CH1 Board (Client Side) .................................................................. 270
1.28.1 Optical Interface at the Client Side of the CH1 Board ................................... 270
1.29 100G Optical Transponder M2&M3TS4 ........................................................ 278
1.29.1 Optical Interface at the Line Side of the TS4 Board ...................................... 278
1.29.2 Optical Interface at the Client Side of the TS4 Board .................................... 284
1.30 10-Channel 10G Aggregation Board (MX2) .................................................. 291
1.30.1 Optical Interface at the Line Side of the MX2 Board...................................... 291
1.30.2 10-Channel 10G Aggregation Board (MX2) .................................................. 297
1.31 M2 LS4 of 100G Line Board ......................................................................... 305
1.31.1 Optical Interface at the Line Side of the LS4 Board....................................... 305
1.32 M2 CS4 – 100G Client Board ....................................................................... 311
1.32.1 Client-Side Optical Interface of CS4 Board ................................................... 311
1.33 OMU—Multiplexer Board .............................................................................. 318
1.33.1 Insertion Loss and the Maximum Insertion Loss Difference of Each Channel 318
1.33.2 Isolation between Adjacent Channels ........................................................... 320
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1.33.3 Isolation between Non-adjacent Channels .................................................... 321

1.34 ODU—De-Multiplexer Board......................................................................... 322
1.34.2 Isolation between Adjacent Channels ........................................................... 323
1.34.3 Isolation between Non-adjacent Channels .................................................... 325
1.35 VMUX—Pre-Equalization Multiplexer Board ................................................. 326
1.36 SOAD/OAD—Optical Add/Drop Multiplexer Board ........................................ 328
1.36.2 Channel Isolation .......................................................................................... 330
1.37 SOGMD/OGMD—Optical Combined De-Multiplexer Board .......................... 332
1.37.2 Isolation ........................................................................................................ 334
1.38 OCI—Optical Multiplexer/De-Multiplexer Board ............................................ 336
1.38.2 Isolation ........................................................................................................ 337
1.39 SDMT/SDMR—Supervision Add/Drop Multiplexer Board.............................. 339
1.39.1 Insertion Loss ............................................................................................... 339
1.39.2 Isolation ........................................................................................................ 340
1.40 PDU—Power Distribution Unit ...................................................................... 342
1.41 WBU—Wavelength Block Board ................................................................... 344
1.41.1 Insertion Loss ............................................................................................... 344
1.42 WSUA/WSUD—Wavelength Selection Board ............................................... 346
1.42.1 Insertion Loss ............................................................................................... 346
1.43 LAC—Line Attenuation Control Board .......................................................... 348
1.43.1 Insertion Loss ............................................................................................... 348
1.44 OA—Optical Amplifier ................................................................................... 350
1.44.1 Maximum Overall Optical Output Power ....................................................... 350
1.44.2 Noise Coefficient .......................................................................................... 351
1.44.3 Signal Gain ................................................................................................... 352
1.44.4 Gain Flatness ............................................................................................... 353
1.44.5 Gain Slope .................................................................................................... 353
1.45 DRA—Distributed RAMAN Amplifier ............................................................. 354
1.45.1 Signal Gain ................................................................................................... 354
1.45.2 Gain Flatness ............................................................................................... 355
1.46 SOSC/SOSCB—Optical Supervision Channel Board ................................... 356
1.46.1 Working Wavelength..................................................................................... 356
1.46.2 Optical Transmit Power ................................................................................ 356
1.46.3 Optical Receiver Sensitivity .......................................................................... 357
1.46.4 Overload Optical Power ................................................................................ 358
1.47 SOP—Optical Protection Board .................................................................... 360
1.47.1 Insertion Loss ............................................................................................... 360
1.48 SOPCS—Optical Channel Shared Protection Board..................................... 361
1.48.1 Insertion Loss ............................................................................................... 361
1.49 Testing OTN Functions ................................................................................. 363
1.49.1 Testing the OPUk Overhead ......................................................................... 363
1.49.2 Testing the ODUk PM Overhead .................................................................. 364
1.49.3 Testing the ODUk PM Overhead .................................................................. 365
1.49.4 Testing the OTUk Overhead ......................................................................... 368
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2 System Performance Test .......................................................................... 372

2.1 MPI-R and MPI-S ......................................................................................... 372
2.1.1 MPI-S(S’) Interface ....................................................................................... 372
2.1.2 MPI-R(R’) Interface ....................................................................................... 375
2.2 Protection Test ............................................................................................. 380
2.2.1 SNP 1+1 Protection ...................................................................................... 380
2.2.2 SCC 1+1 Protection ...................................................................................... 380
2.2.3 Optical Channel 1+1 Protection Switching Time and Priority ........................ 381
2.3 Testing the Bit Error and Performance .......................................................... 383
2.3.1 24-Hour BER ................................................................................................ 383
2.3.2 24-Hour Packet Loss Rate ............................................................................ 385
2.3.3 Throughout ................................................................................................... 386
2.3.4 Time Delay ................................................................................................... 386
2.4 Testing the Layer-2 Switching ....................................................................... 387
2.4.1 MAC Address Learning ................................................................................. 387
2.4.2 Testing the Tag............................................................................................. 388
2.4.3 Policy and Priority ......................................................................................... 389
2.4.4 Adding and Deleting the S-TAG .................................................................... 390
2.4.5 Verifying the Number of VLANs that can be Configured to One Port
Simultaneously ............................................................................................. 392
2.4.6 Support of Same C-VLAN and Different C-VLAN or Same S-VLAN and
Different S-VLAN.......................................................................................... 393
2.4.7 Verifying the Behavior of Sending Data Packets with the Same MAC but
Different VLANs ........................................................................................... 394
2.4.8 Verifying the Equipment Behavior when the MAC Table is Full ..................... 396
2.4.9 Traffic Policy Based on Port /VLAN/801.1p ................................................... 397
2.4.10 Link Aggregation/LACP ................................................................................ 398
2.5 Testing the IP Phone System ....................................................................... 399
2.5.1 IP Phone....................................................................................................... 399
2.5.2 Voice Quality and Volume............................................................................. 399
3 ROADM Test................................................................................................ 400

3.1 Wavelength Reconfiguration ......................................................................... 400
3.2 Port Assignment ........................................................................................... 401
3.3 Traffic Broadcast .......................................................................................... 401
3.4 Directionless Function .................................................................................. 402
3.5 Colorless Function ........................................................................................ 405
3.6 Creating End-to-End Circuits on the EMS ..................................................... 406
4 WASON Test ............................................................................................... 407

4.1 Testing the Link Auto-Discovery Function ..................................................... 407
4.2 Testing the Network Topology Refresh Function .......................................... 408
4.3 Testing the Creation of an End-to-End SPC Service ..................................... 410
4.4 Testing the Deletion of an End-to-End SPC Service ..................................... 412
4.5 Testing the SPC Route Constraint Policy Function ....................................... 414
4.6 Testing the SPC Service Restoration Function ............................................. 416
4.7 Testing the SPC Permanent 1+1 Protection Function ................................... 418
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FIGURES
Figure 1-1 SOTU2.5G Connection for testing Optical Output Power at the line side............. 7
Figure 1-2 SOTU2.5G Optical Receiver Sensitivity Connection............................................ 8
Figure 1-3 SOTU2.5G Connection for testing receive overload point at the line interface..... 9
Figure 1-4 Central Wavelength Connection ........................................................................ 11
Figure 1-5 -20dB Spectral Width Connection ..................................................................... 12
Figure 1-6 SMSR Connection ............................................................................................ 13
Figure 1-7 SOTU2.5G Connection for Testing Optical Output Power at the Client Side ..... 14
Figure 1-8 SOTU2.5G Optical Receiver Sensitivity Connection.......................................... 14
Figure 1-9 SOTU2.5G Connection for testing receive overload point at the client side ....... 16
Figure 1-10 SOTU2.5G input jitter tolerance of input interface ........................................... 17
Figure 1-11 Output Jitter Connection.................................................................................. 18
Figure 1-12 Connection for testing Optical Output Power at line side for SOTU10G .......... 21
Figure 1-13 SOTU10G Optical Receiver Sensitivity Connection......................................... 22
Figure 1-14 SOTU2.5G Connection for testing receive overload point at the line interface. 23
Figure 1-15 Central Wavelength Connection ...................................................................... 24
Figure 1-16 -20dB Spectral Width Connection ................................................................... 25
Figure 1-17 SMSR Connection........................................................................................... 26
Figure 1-18 SOTU10G connection for testing Optical Output Power at client side.............. 27
Figure 1-19 SOTU10G Optical Receiver Sensitivity Connection......................................... 28
Figure 1-20 SOTU10G Connection for testing receive overload point at the client side ...... 29
Figure 1-21 Input jitter tolerance of SOTU10G input interface ............................................ 31
Figure 1-23 SRM41 connection for testing Optical Output Power at line side ..................... 35
Figure 1-24 SRM41 Optical Receiver Sensitivity Connection ............................................. 36
Figure 1-25 SRM41 Connection for testing receive overload point at the line interface ...... 37
Figure 1-29 SRM41 connection for testing Optical Output Power at the client side ............ 41
Figure 1-31 SRM41 Connection for testing receive overload point at the client side........... 43
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Figure 1-32 Input jitter tolerance of SRM41 input interface ................................................. 45

Figure 1-34 SRM42 connection for testing Optical Output Power at line side ..................... 49
Figure 1-36 SRM42 Connection for testing receive overload point at the line interface ...... 51
Figure 1-40 SRM42 connection for testing Optical Output Power at the client side ............ 56
Figure 1-42 SRM42 Connection for testing receive overload point at the client side........... 58
Figure 1-43 Input jitter tolerance of SRM42 input interface ................................................. 60
Figure 1-45 GEM connection for testing Optical Output Power at line side ......................... 64
Figure 1-46 GEM Optical Receiver Sensitivity Connection ................................................. 65
Figure 1-47 GEM Connection for testing receive overload point at the line interface .......... 66
Figure 1-51 GEM connection for testing Optical Output Power at the client side ................ 71
Figure 1-52 GEM Optical Receiver Sensitivity Connection ................................................. 72
Figure 1-53 GEM Connection for testing receive overload point at the client side .............. 73
Figure 1-54 SDSA connection for testing Optical Output Power at line side ....................... 74
Figure 1-55 SDSA Optical Receiver Sensitivity Connection ............................................... 75
Figure 1-56 SDSA Connection for testing receive overload point at the line interface ........ 76
Figure 1-60 SDSA connection for testing Optical Output Power at the client side............... 80
Figure 1-61 SDSA Optical Receiver Sensitivity Connection ............................................... 82
Figure 1-62 SDSA Connection for testing receive overload point at the client side ............. 83
Figure 1-63 Configuration of the Average Transmit Optical Power at the Client Side of
DSAC ................................................................................................................................... 84
Figure 1-64 Configuration of the Receiver Sensitivity at the Client Side of DSAC .............. 86
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Figure 1-65 Configuration of the Minimum Overload Optical Power at the Client Side of
DSAC ................................................................................................................................... 87
Figure 1-66 Configuration of the Average Transmit Optical Power at the Line Side of ASMA
............................................................................................................................................. 88
Figure 1-67 Configuration of the Receiver Sensitivity at the Line Side of ASMA ................. 89
Figure 1-68 Configuration of the Overload Optical Power at the Line Side of ASMA .......... 90
Figure 1-69 Configuration of the Central Wavelength at the Line Side of ASMA ................ 91
Figure 1-70 Configuration of the Spectrum Features at the Line Side of ASMA ................. 92
Figure 1-71 Configuration of the Spectrum Features at the Line Side of ASMA ................. 93
Figure 1-72 Configuration of the Average Transmit Optical Power at the Line Side of ASMA
............................................................................................................................................. 94
Figure 1-73 Configuration of the Receiver Sensitivity at the Line Side of ASMA ................. 96
Figure 1-74 Configuration of the Overload Optical Power at the Line Side of ASMA .......... 97
Figure 1-75 Configuration of the Drop SAUC Average Transmit Optical Power .................. 99
Figure 1-76 Configuration of the Drop SAUC Receiver Sensitivity .................................... 100
Figure 1-77 Configuration of the Drop SAUC Receive Overload Optical Power ............... 101
Figure 1-78 Configuration of the Drop SAUC Maximum Output Jitter ............................... 102
Figure 1-79 Configuration of the Drop SAUC Input Jitter Tolerance ................................. 103
Figure 1-80 Configuration of the Drop COM Average Transmit Optical Power ................. 106
Figure 1-81 Configuration of the Drop COM Receiver Sensitivity ..................................... 108
Figure 1-82 Configuration of the Drop COM Receive Overload Optical Power ................. 109
Figure 1-83 Configuration of the Drop COM Maximum Output Jitter ................................ 111
Figure 1-84 Configuration of the Drop COM Input Jitter Tolerance ................................... 112
Figure 1-85 Configuration of the Drop COM Jitter Transfer Function ................................ 113
Figure 1-86 Configuration of the Average Transmit Optical Power at the Client Side of
SMUB/C ............................................................................................................................. 114
Figure 1-87 Configuration of the Receiver Sensitivity at the Client Side of SMUB/C......... 116
Figure 1-88 Configuration of the Receive Overload Optical Power at the Client Side of
SMUB/C ............................................................................................................................. 117
Figure 1-89 Configuration of the Output Jitter at the Client Side of SMUB/C .................... 118
Figure 1-90 Configuration of the Input Jitter Tolerance at the Client Side of SMUB/C ...... 120
Figure 1-91 Configuration of the Jitter Transfer Function at the Client Side of SMUB/C ... 122
Figure 1-92 Configuration of the Average Transmit Optical Power at the Line Side of
SMUB/L .............................................................................................................................. 123
Figure 1-93 Configuration of the Receiver Sensitivity at the Line Side of SMUB/L............ 124
Figure 1-94 Configuration of the Receive Overload Optical Power at the Line Side of
SMUB/L .............................................................................................................................. 125
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Figure 1-95 Configuration of the Central Wavelength at the Line Side of SMUB/L ........... 126
Figure 1-96 Configuration of the Spectrum Features at the Line Side of SMUB/L ............ 127
Figure 1-97 Configuration of the Spectrum Features at the Line Side of SMUB/L ............ 128
Figure 1-98 Configuration of the Optical Output Power at the Client Side of CD2/CO2/CQ2
........................................................................................................................................... 130
Figure 1-99 CD2/CO2/CQ2 Optical Receiver Sensitivity Connection................................ 131
Figure 1-100 CD2/CO2/CQ2 Connection for testing receive overload point at the client side
........................................................................................................................................... 132
Figure 1-101 Input jitter tolerance of CD2/CO2/CQ2 input interface ................................. 134
Figure 1-102 Output Jitter Configuration .......................................................................... 135
Figure 1-103 LD2/LD2B/LO2/LQ2 connection for testing Optical Output Power at line side
........................................................................................................................................... 138
Figure 1-104 LD2/LD2B/LO2/LQ2 Optical Receiver Sensitivity Connection...................... 139
Figure 1-105 Configuration of the Receive Overload Point at the Line Interface of LO2/LQ2
........................................................................................................................................... 140
Figure 1-106 Central Wavelength Connection .................................................................. 141
Figure 1-107 Spectral Width Connection .......................................................................... 142
Figure 1-108 SMSR Connection....................................................................................... 143
Figure 1-109 TST3 connection for testing Optical Output Power at line side .................... 144
Figure 1-110 TST3 Optical Receiver Sensitivity Connection ............................................ 145
Figure 1-111 Configuration of the Receive Overload Point at the Line Interface of TST3 . 146
Figure 1-113 -20dB Spectral Width Connection ............................................................... 148
Figure 1-115 Configuration of the Optical Output Power at the Client Side of TST3 ......... 150
Figure 1-116 TST3 Optical Receiver Sensitivity Connection ............................................ 151
Figure 1-117 Connection for testing receive overload point at the client side ................... 152
Figure 1-118 Input jitter tolerance of SOTU10G input interface ........................................ 154
Figure 1-119 Output Jitter Connection.............................................................................. 155
Figure 1-120 MQT3 connection for testing Optical Output Power at line side ................... 158
Figure 1-121 MQT3 Optical Receiver Sensitivity Connection ........................................... 159
Figure 1-122 Configuration of the Receive Overload Point at the Line Interface of MQT3 160
Figure 1-126 Configuration of the Optical Output Power at the Client Side of MQT3 ........ 164
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Figure 1-127 MQT3 Optical Receiver Sensitivity Connection ........................................... 165

Figure 1-128 MQT3 Connection for testing receive overload point at the client side......... 166
Figure 1-129 MQT3 input jitter tolerance of input interface ............................................... 168
Figure 1-131 Configuration of the Optical Output Power at the Client Side of CS3 ........... 172
Figure 1-132 CS3 Optical Receiver Sensitivity Connection .............................................. 173
Figure 1-133 CS3 Connection for testing receive overload point at the client side............ 174
Figure 1-134 CS3 input jitter tolerance of input interface .................................................. 176
Figure 1-136 LS3 connection for testing Optical Output Power at line side ...................... 180
Figure 1-137 LS3 Optical Receiver Sensitivity Connection ............................................... 181
Figure 1-138 Configuration of the Receive Overload Point at the Line Interface of LS3 ... 182
Figure 1-142 FCA connection for testing Optical Output Power at line side ...................... 186
Figure 1-143 Optical Receiver Sensitivity Connection ...................................................... 187
Figure 1-144 Configuration of the Receive Overload Point at the Line Interface of FCA ... 188
Figure 1-148 Configuration of the Optical Output Power at the Client Side of FAC........... 192
Figure 1-149 FCA Optical Receiver Sensitivity Connection .............................................. 193
Figure 1-150 FCA Connection for testing receive overload point at the client side ........... 195
Figure 1-151 MOM2 connection for testing Optical Output Power at line side .................. 196
Figure 1-152 MOM2 Optical Receiver Sensitivity Connection .......................................... 197
Figure 1-153 Configuration of the Receive Overload Point at the Line Interface of MOM2198
Figure 1-157 Configuration of the Optical Output Power at the Client Side of MOM2 ....... 202
Figure 1-158 MOM2 Optical Receiver Sensitivity Connection .......................................... 204
Figure 1-159 MOM2 Connection for testing receive overload point at the client side ........ 205
Figure 1-161 SOTU10G input jitter tolerance of input interface ........................................ 209
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Figure 1-162 MQA1/MQM1 Connection for Testing Optical Output Power at the Line Side 211
Figure 1-163 MQA1/MQM1 Optical Receiver Sensitivity Connection................................ 212
Figure 1-164 MQA1/MQM1 Connection for Testing Receive Overload Point at the Line Side
........................................................................................................................................... 213
Figure 1-165 Central Frequency Connection ...................................................................... 214
Figure 1-167 MQA1/MQM1 Connection for Testing Optical Output Power at the Client Side
........................................................................................................................................... 219
Figure 1-168 MQA1/MQM1 Optical Receiver Sensitivity Connection .................................. 220
Figure 1-169 MQA1/MQM1 Connection for Testing Receive Overload Point at the Client Side
........................................................................................................................................... 222
Figure 1-170 Input Jitter Connection ................................................................................... 224
Figure 1-171 Output Jitter Connection ................................................................................ 225
Figure 1-172 MQA2/MQM2 connection for Testing Optical Output Power at the Line Side . 228
Figure 1-174 MQA2/MQM2 Connection for Testing Receive Overload Point at the Line Side
........................................................................................................................................... 230
Figure 1-176 -20 dB Spectral Width Connection ................................................................. 233
Figure 1-177 SMSR Connection ......................................................................................... 234
Figure 1-178 MQA2/MQM2 Connection for Testing Optical Output Power at the Client Side
........................................................................................................................................... 235
Figure 1-180 MQA2/MQM2 Connection for Testing Receive Overload Point at the Client Side
........................................................................................................................................... 238
Figure 1-182 Input Jitter Tolerance of MQA2/MQM2 Input Interface ................................... 242
Figure 1-183 MJA/MJM connection for testing Optical Output Power at the Cine Side ....... 244
Figure 1-184 MJA/MJM Optical Receiver Sensitivity Connection ........................................ 246
Figure 1-185 MJA/MJM Connection for Testing Receive Overload Point at the Client Side 247
Figure 1-187 Input jitter tolerance of MJA /MJM Input Interface .......................................... 251
Figure 1-188 TD2C/TS2C/TS2CP connection for Testing Optical Output Power at the Line
Side .................................................................................................................................... 253
Figure 1-189 TD2C/TS2C/TS2CP Optical Receiver Sensitivity Connection ........................ 254
Figure 1-190 TD2C/TS2C/TS2CP Connection for Testing Receive Overload Point at the Line
Side .................................................................................................................................... 255
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Figure 1-192 -20 dB Spectral Width Connection ................................................................. 257
Figure 1-194 TD2C/TS2C/TS2CP Connection for Testing Optical Output Power at the Client
Side .................................................................................................................................... 260
Figure 1-195 TD2C/TS2C/TS2CP Optical Receiver Sensitivity Connection ........................ 261
Figure 1-196 TD2C/TS2C/TS2CP Connection for Testing Receive Overload Point at the Client
Side .................................................................................................................................... 262
Figure 1-198 Input Jitter Tolerance of TD2C/TS2C/TS2CP input Interface ......................... 265
Figure 1-199 TD2C/TS2C/TS2CP Connection for Testing Optical Output Power at the Client
Side .................................................................................................................................... 267
Figure 1-200 TD2C/TS2C/TS2CP Optical Receive Sensitivity Connection ......................... 268
Figure 1-201 TD2C/TS2C/TS2CP Connection for Testing Receive Overload Point at the Client
Side .................................................................................................................................... 269
Figure 1-202 CH1 Connection for Testing Optical Output Power at the Client Side ............ 270
Figure 1-203 CH1 Optical Receiver Sensitivity Connection................................................. 272
Figure 1-204 CH1 Connection for Testing Receive Overload Point at the Client Interface .. 273
Figure 1-205 Input Jitter Tolerance of CH1 Input Interface.................................................. 275
Figure 1-207 TS4 Connection for Testing Optical Output Power at the Line Side ............... 279
Figure 1-208 TS4 Optical Receiver Sensitivity Connection ................................................. 280
Figure 1-209 TS4 Connection for Testing Receive Overload Point at the Line Side ............ 281
Figure 1-211 20 dB Spectral Width Connection .................................................................. 283
Figure 1-214 TS Connection for Testing Optical Output Power at Client Side ..................... 286
Figure 1-216 TS4 Connection for Testing Receive Overload Point at the Client Side ......... 288
Figure 1-217 Configuration of the Optical Output Power at the Client Side of TS4 .............. 289
Figure 1-219 TS4 Connection for Testing Receive Overload Point at the Client Side ......... 291
Figure 1-220 MX2 Connection for Testing Optical Output Power at Line Side .................... 292
Figure 1-221 MX2 Optical Receiver Sensitivity Connection ................................................ 293
Figure 1-222 MX2 Connection for Testing Receive Overload Point at the Line Interface .... 294
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. XV

Figure 1-223 Central frequency Connection ....................................................................... 295

Figure 1-224 Configuration of the OMU Insertion Loss ..................................................... 319
Figure 1-225 Configuration of OMU Isolation between Adjacent Channels ...................... 320
Figure 1-226 Configuration of OMU Isolation between Non-adjacent Channels ............... 321
Figure 1-227 Configuration of ODU Insertion Loss ........................................................... 323
Figure 1-228 Configuration of ODU Isolation between Adjacent Channels ....................... 324
Figure 1-229 Configuration of ODU Isolation between Non-adjacent Channels................ 325
Figure 1-230 Configuration of the VMUX Insertion Loss ................................................... 327
Figure 1-231 Configuration of OAD Insertion Loss ........................................................... 328
Figure 1-232 Configuration of the OAD Channel Isolation ................................................ 331
Figure 1-233 Configuration of the OGMD Insertion Loss .................................................. 333
Figure 1-234 Configuration of the OGMD Isolation ........................................................... 335
Figure 1-235 Configuration of the OCI Insertion Loss ....................................................... 337
Figure 1-236 Configuration of the OCI Isolation ............................................................... 338
Figure 1-237 Configuration of the ADMR Insertion Loss................................................... 340
Figure 1-238 Configuration of the SDMT Insertion Loss ................................................... 340
Figure 1-239 Configuration of the SDMR Isolation ........................................................... 341
Figure 1-240 Configuration of the SDMT Isolation ............................................................ 341
Figure 1-241 Configuration of the PDU Insertion Loss ..................................................... 343
Figure 1-242 Configuration of the WBU Insertion Loss ..................................................... 345
Figure 1-243 Configuration of the WBU Insertion Loss ..................................................... 347
Figure 1-244 Configuration of the LAC Insertion Loss ...................................................... 349
Figure 1-245 OA Maximum Overall Optical Output Power................................................ 350
Figure 1-246 Configuration of the OA Noise Coefficient ................................................... 351
Figure 1-247 Configuration of the OA Signal Gain............................................................ 352
Figure 1-248 Configuration of the OA Gain Flatness ........................................................ 353
Figure 1-249 Configuration of the OA Signal Gain............................................................ 354
Figure 1-250 Configuration of the OA Gain Flatness ........................................................ 355
Figure 1-251 Configuration of the OSC Output Wavelength ............................................. 356
Figure 1-252 Configuration of the Average Transmit Optical Power ................................. 357
Figure 1-253 Configuration of the SOP Insertion Loss ..................................................... 360
Figure 1-254 Configuration of the SOPCS Insertion Loss................................................. 362
Figure 1-255 Configuration of the OPUk Overhead .......................................................... 363
Figure 1-256 Configuration of the ODUk PM Overhead.................................................... 364
Figure 1-257 Configuration of the ODUk-PM Overhead ................................................... 366
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Figure 1-258 Configuration of the OTUk Overhead .......................................................... 369

Figure 2-1 Configuration of the Maximum Channel Power Difference at MPI-S (S’) Point 373
Figure 2-2 Configuration of the Optical Signal-to-Noise Ratio of Each Channel at MPI-S (S’)
Point ................................................................................................................................... 375
Figure 2-3 Configuration of the Maximum Channel Power Difference at MPI-R (R’) Point 376
Figure 2-4 Configuration of the Optical Signal-to-Noise Ratio of Each Channel at MPI-R (R’)
Point ................................................................................................................................... 378
Figure 2-5 Configuration of the SNP 1+1 Protection ......................................................... 380
Figure 2-6 Configuration of the SCC 1+1 Protection ........................................................ 381
Figure 2-7 Configuration of the System Switching Time ................................................... 382
Figure 2-8 Configuration of the Bit Error in the 2.5G/10G Service System ....................... 384
Figure 2-9 Configuration of the 24-Hour Packet Loss Rate .............................................. 385
Figure 2-10 Configuration of the Throughout .................................................................... 386
Figure 2-11 Configuration of the Time Delay .................................................................... 387
Figure 2-12 Configuration of MAC Address Learning ....................................................... 388
Figure 2-13 Configuration of the Tag ................................................................................ 389
Figure 2-14 Test Configuration ......................................................................................... 390
Figure 3-1 Test Configuration ........................................................................................... 400
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. XVII
TABLES
Table 1-1 Input Jitter Tolerance Filter and Indices at the STM-N Interface ......................... 17
Table 1-2 Fixed Output Jitter Indices at the STM-N Interface ............................................. 19
Table 1-7 Requirements for central wavelength and offset ................................................. 53
Table 1-10 Input Jitter Tolerance Filter and Indices at the STM-N Interface ..................... 104
Table 1-11 Fixed Output Jitter Indices at the STM-N Interface ......................................... 111
Table 1-24 Requirements for Central Frequency and Central Frequency Deviation ............ 215
Table 1-25 Requirements for -20 dB Spectral Width of the OTU ......................................... 217
Table 1-26 Input Jitter Tolerance Filter and Indices at the STM-N Interface ........................ 224
Table 1-27 Fixed Output Jitter Indices at the STM-N Interface ............................................ 226
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. XVIII
Table 2-1 Requirements for the maximum channel power difference at MPI-S (S’) point . 373
Table 2-2 Requirements for the maximum channel power difference at MPI-R (R’) point . 377
Table 2-3 Requirements for the Optical Signal-to-Noise Ratio of Each Channel at MPI-R (R’)
Point ................................................................................................................................... 379
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. XIX
1 Board Test
1.1 Primary Power Supply Test
1.1.1 Primary Power Voltage

Test item Primary Power Voltage
1. The equipment installation has been checked and

accepted.
2. DC power supplies (such as the rectifier cabinet and
Prerequisites
battery) work properly.
3. The loop switch of the power supplies and the air switch on
the power alarm plug-in box are in OFF status.
1. Use a multimeter (set to measure resistance) to measure

the resistance between the –power of the air switch unit in the
power alarm plug-in box and the working ground (GND) output
terminal. No short circuit is allowed. Check whether the
terminals are properly labeled and make sure the power cables
Test Process
and ground cables are properly connected.
2. For DC, connect the loop switch of the power supplies, and
use a multimeter (set to measure DC resistance) to measure the
resistance between the -48V air switch unit of the power alarm
plug-in box and -48V GND output terminal.
Acceptance DC power of OTN devices also supports the -60v voltage. The
Criteria hardware is the same. The voltage is within -50v to -70v.
Remarks N/A
1.1.2 Voltage between Working Ground and Protection Ground

Test item Voltage between Working Ground and Protection Ground
Prerequisites Pass the primary power supply test.
Use a multimeter (set to measure DC voltage) to measure the

Test Process voltage between terminals of the power protection ground and
working ground.
ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. 1

Acceptance The voltage between the working ground and protection ground
Criteria terminals should be 0.
Remarks

1.1.3 Working Ground Resistance

Test item Working Ground Resistance
1. The bus bar of the working ground has been installed.

2. The grounding body has been buried.
Prerequisites
3. The equipment has been installed, and the ground cable
connections are in good condition.
1. Connect to the equipment’s working ground with a ground

Test Process resistance tester (such as SGT-12A).
2. Start up the tester to read the data.
Acceptance The resistance of the DC working ground should be less than or

Criteria equal to 4Ω.
This test is conducted under the circumstance that the bus bars
Remarks of the working ground and protection ground are separated from
each other.
1.1.4 Resistance of Lightning Protection Ground

Test item Resistance of Lightning Protection Ground
1. The bus bar of the lightning protection ground has been

installed.
Prerequisites 2. The grounding body has been buried.
connections are in good condition.
1. Connect to the equipment’s protection ground with a

Test Process ground resistance tester (such as SGT-12A).
Acceptance The resistances of the security protection ground and lightning

Criteria protection ground should be less than or equal to 4Ω.
each other.
1.1.5 Ground Resistance of Joint Grounding

Test item Ground Resistance of Joint Grounding

1. The ground bus-bar of joint grounding has been installed.

2. The grounding body has been buried.
Prerequisites
connections are good.
1. Connect to the equipment’s working ground and protection

Test Process ground with a ground resistance tester (such as SGT-12A).
The joint-grounding resistance of the communication office

Acceptance
where the devices are located should be less than or equal to
Criteria
1Ω.
each other.
1.1.6 Maximum Working Current

Test item Maximum Working Current
1. The equipment has been installed and powered on.
Prerequisites 2. The equipment is running in normal state.
3. No service is loaded.
1. Method 1: Read the working current though the user’s

power-supply module.
Test Process
2. Method 2: Measure the -48V power cable with a clamp
meter, and read the value.
Acceptance The working current should be less than the maximum rated
Criteria current under the circumstance the equipment is at full load.
Remarks N/A
1.2 Fan Test

Test item Fan Unit Monitoring

1. Pass the primary power supply test. The loop switch of the
power supplies is connected, the air switch on the power alarm
plug-in box is in OFF status, and all the boards are in float
inserted state.
2. The EMS software has been installed, and the network
Prerequisites
data has been configured properly.
3. The database configured to the equipment has been
downloaded to the NCP.
4. The EMS terminal and the equipment are connected
properly.
1. Check the primary power supply and make sure that it is

running in normal state, and then connect the general power
switch for the cabinet. Insert three fan units into the fan plug-in
Test Process box separately in turn, and check whether the fan works
properly.
2. Monitor the rotational speed and temperature of the fan in
the EMS.
1. Fans should run stably at an even speed.

Acceptance
2. Such information as rotational speed and temperature of
Criteria
the fan can be properly reported on the EMS.
Remarks N/A
1.3 Alarm Function Test
1.3.1 Alarm Indicator

Test item Alarm Indicator
Pass the primary power supply test and the fan unit test. The
Prerequisites
equipment has been powered on and working properly.
Check whether the relationship between the cabinet-top alarm

Test Process
indicator and the working status of the equipment is correct.

1. After the equipment is powered on, the green indicator on

top of the cabinet should be always on.
2. Only the green indicator should be always on when the
equipment has no alarms.
Acceptance
3. The green and yellow indicators on top of the cabinet
Criteria
should be always on when the equipment has a minor alarm
only.
4. The green, yellow and red indicators on top of the cabinet
should be always on when the equipment has a critical alarm.
Remarks N/A
1.3.2 Alarm Buzzer

Test Item Alarm Buzzer
1. Pass the primary power supply test and the fan unit test. The
Prerequisites equipment has been powered on and working properly.
2. The ring-interception switch of the cabinet is set to Normal.
Check whether the relationship between the cabinet-top alarm buzzer

Test Process
and working status of the equipment is correct.
1. The cabinet-top buzzer should beep when the equipment has an

Acceptance alarm.
Criteria 2. The cabinet-top buzzer should beep when the equipment has no
alarms.
Remarks N/A
1.3.3 Alarm Ring Interception

Test Item Alarm Ring Interception
Prerequisites equipment has been powered on and working properly.
2. The EMS is not configured with any alarm mask.

1. Unplug the input fiber of port 1 in the OSC board. The equipment
generates an alarm.
2. The ring-interception switch of the cabinet is set to Normal.
3. The cabinet-top buzzer should beep.
Test Process
4. Set the ring-interception switch of the cabinet to off.
5. The cabinet-top buzzer should not beep.
6. Plug the input fiber of port 1 in the OSC board back after the test,
and set the alarm ring-interception switch of the cabinet to Normal.
1. There is an alarm.
2. If the alarm ring-interception switch is set to normal, the alarm
Acceptance
buzzer works properly.
Criteria
3. If the alarm ring-interception switch is set to off, the alarm buzzer
should fail.
Remarks N/A
1.4 SOTU2.5G/OTU2.5G—2.5G Optical Transponder
1.4.1 Optical Interface at the Line Side of the SOTU2.5G Board
1.4.1.1 Average Transmit Optical Power

Test Item Average Transmit Optical Power
2. The EMS software has been installed, and the network data has
Prerequisites been configured properly.
3. The database configured to the equipment has been downloaded
to the NCP.
4. The EMS terminal and the equipment are connected properly.
1. Create a test environment, as shown in the following figure. Use

the SDH signal generator to provide signals for the board.
Test Process
Figure 1-1 SOTU2.5G Connection for testing Optical Output Power
at the line side

C L
Variable S Sn
SDH/OTN R T Optical power meter
analyzer optical SOTU2.5G
attenuator
L
R
Rn
2. Set the SDH signal generator to send the test signals to the board
under test, and adjust the optical power to meet the requirements of
the receive optical power.
3. Set the receive optical wavelength of the optical power meter
equal to the transmit optical wavelength of the board under test.
Measure the Optical Output Power.
Acceptance
EA modulation: 0 dBm ~ +6dBm
Criteria
Clean the optical connector and ensure good connection before the
Remarks
test..
1.4.1.2 Optical Receiver Sensitivity

Test Item Optical Receiver Sensitivity
to the NCP.
1. Create a test environment, as shown in the following figure.

Figure 1-2 SOTU2.5G Optical Receiver Sensitivity Connection
C L
Optical S Sn Variable
SDH/OTN R T
attenuator TST3 L Optical
Analyzer C 50/50
R attenuator
T Rn coupler
Test Process
Optical
power meter
2. The SDH analyzer sends the test signal to the board under test.
3. Adjust the variable optical attenuator to gradually increase the
attenuation value with the bit error rate (BER) of 10-7 measured by the


SDH analyzer.
4. Read the optical power from the optical power meter and record
it.
5. Repeat step 3 and step 4 to measure the optical power values
with BER of 10-8, 10-9, 10-10 and 10-11 respectively.
6. According to extrapolation, draw a P-BER curve in a
dual-logarithmic coordinate paper. The optical power corresponding to
BER of 10-12 indicates the receiver sensitivity.
Acceptance PIN: ≤ -21dBm (BOL)-23(EOL)

Criteria APD: ≤ -28dBm (BOL)-30(EOL)
The receiver sensitivity refers to the minimum value of the average

Remarks receive optical power on the input port when input signals are located
in the 1550 nm window and the BER reaches 10-12.
1.4.1.3 Overload Optical Power

Test Item Overload Optical Power
to the NCP.

Figure 1-3 SOTU2.5G Connection for testing receive overload point
at the line interface
C L OA+
Optical S Sn
SDH/OTN R SOTU T variable
Analyzer attenuator C 2.5G L Optical
50/50
T R attenuator
Rn coupler
Test Process
Optical
power meter
2. Set the SDH analyzers correctly, and send test signals to the
board under test.
3. Adjust the variable optical attenuator 1 to gradually decrease the
attenuation value and make the BER to be close to but no greater than


10-12.
4. The optical power value read from the optical power meter
indicates the overload optical power of the receiver.
Acceptance PIN: ≥0 dBm;

Criteria APD: ≥-9 dBm.
The receive overload optical power refers to the maximum receivable

Remarks value of the average receive optical power at reference point Rn when
the BER reaches 10-12.
1.4.1.4 Central Wavelength and Frequency Deviation

Test Item Central Wavelength and Frequency Deviation
to the NCP.


the SDH signal generator to provide modulation signals for the board
under test.
Figure 1-4 Central Wavelength Connection
C L
Variable S Sn
attenuator
L
R
Rn
Test Process
2. Set the SDH signal generator to send test signals to the board
the receive optical power of SOTU2.5G.
3. Set the display wavelength range of the multi-wavelength
analyzer to display the waveform within the range in the center of the
screen, and then read and record the central wavelength value at the
peak. Calculate the central wavelength value with the formula ƒ=C/λ.
4. The difference between the central wavelength value and its
nominal value is the central wavelength offset value.
Acceptance
≤ ±12.5GHz
Criteria
The central wavelength refers to the actual central wavelength of the

Remarks
optical signal sent by the transmitter at reference point Sn.
1.4.1.5 -20dB Spectral Width

Test Item -20dB Spectral Width
to the NCP.


under test.
Figure 1-5 -20dB Spectral Width Connection
C L
Variable S Sn
attenuator
L
R
Rn
Test Process
2. Set the display wavelength range of the spectrometer and set the
resolution of the spectrometer to the minimum value. Adjust the
amplitude scale of the spectrometer make the waveform displayed
with proper amplitude in the center of the screen to facilitate
observation and reading.
3. Position the cursor to the peak of the primary longitudinal mode.
Find the place where the peak value has fallen by 20dB and read the
spectral width.
Acceptance
≤ 0.2nm (EA modulation); ≤ 0.5nm (direct modulation)
Criteria
The -20 dB spectral width refers to the maximum spectral width when
Remarks
the power of the maximum peak falls by 20dB.
1.4.1.6 SMSR
Test Item SMSR
to the NCP.

Test Item SMSR
Create a test environment, as shown in the following figure. Use the

SDH signal generator to provide modulation signals for the board
under test.
Figure 1-6 SMSR Connection
C L
Variable S Sn
attenuator
L
R
Rn
Test Process
Set the display wavelength range of the spectrometer and set the
amplitude scale of the spectrometer so that the primary longitudinal
mode and the side mode can be displayed with proper amplitude in the
center of the screen to facilitate observation and reading.
Adjust the cursor to read the optical powers (dBm) of the primary
longitudinal mode and side mode.
Calculate the difference between two power values to get the SMSR
(dB).
Acceptance
SMSR ≧35dB
Criteria
SMSR refers to the ratio of the average optical power of the primary
Remarks longitudinal mode to the optical power of the most significant side
mode in full modulation under the worst reflection condition.
1.4.2 Optical Interface at the Client Side of the SOTU2.5G Board

Prerequisite
been configured properly.
s
3. The database configured to the equipment has been downloaded to
the NCP.

1. Create a test environment, as shown in the following figure. Use the

SDH signal generator to provide signals for the board.
Figure 1-7 SOTU2.5G Connection for Testing Optical Output Power at
the Client Side
S CR
SDH analyzer LT Sn
Optical
SOTU2.5G
Test Optical power
R CT LR power meter
Process meter Rn
2. Set the SDH signal generator to send test signals to the board under
test, and adjust the optical power to meet the requirements of the receive
optical power.
3. Set the receive optical wavelength of the optical power meter equal
to the transmit optical wavelength of the board under test. Measure the
Optical Output Power.
I16: -10~-3dBm
S16.1: -5~0dBm
Acceptance
S16.2: -5~0dBm
Criteria
L16.1: -2~+3dBm
L16.2: -2~+3dBm
Remarks Clean the optical connector and ensure good connection before the test..

to the NCP.
1. Create a test environment, as shown in the following figure. Input

Test Process signals of the board under test are in the 1550nm window.
Figure 1-8 SOTU2.5G Optical Receiver Sensitivity Connection

SDH/OT C L Sn
Variable S R
N 50/50 T optical
optical C SOTU2.5G L
Analyzer coupler attenuator
attenuator R T R
Rn
Optical power
meter
2. The SDH analyzer sends test signals to the board under test.
SDH analyzer.
4. Read the optical power from the optical power meter and record it.
5. Repeat step 3 and step 4 to measure the optical power values with
BER of 10-8, 10-9, 10-10 and 10-11 respectively.
I16: ≤-18dBm
S16.1: ≤-18dBm
Acceptance
S16.2: ≤-18dBm
Criteria
L16.1: ≤-27dBm
L16.2: ≤-28dBm

Remarks receive optical power on the input port when input signals are located in
the 1550 nm window and the BER reaches 10-12.

to the NCP.
Test Process 1. Create a test environment, as shown in the following figure. Input


signals of the board under test are in the 1550nm window.
at the client side
SDH/OT C L Sn
Variable S R
N 50/50 T optical
optical C SOTU2.5G L
attenuator R T R
Rn
Optical power
meter
10-12
I16: ≥-3dBm
S16.1: ≥0dBm
Acceptance
S16.2: ≥0dBm
Criteria
L16.1: ≥-9dBm
L16.2: ≥-9dBm

Remarks value of the average receive optical power at reference point R when
1.4.2.4 Input Jitter Tolerance

Test Item Input Jitter Tolerance
to the NCP.
1. Self-loop the SDH analyzer with a short-circuit fiber, and then

Test Process
calibrate the SDH analyzer. Pleased be noticed that you should control


the receive optical power of the meter to avoid damage to the receive
interface from strong light.
2. Disconnect the short-circuit fiber, access the board under test,
and adjust the optical attenuator, so that the tested board can receive
a proper optical power. Make the input optical power of the SDH
analyzer equal to that of the self-looped analyzer in Step 1. Configure
the test environment.
3. Test certain items with the input jitter tolerance test template of
the SDH analyzer and observe whether the test results are above the
template.
Figure 1-10 SOTU2.5G input jitter tolerance of input interface
Optical Rd Optical
n OTU under Sd
SDH analyzer attenuat attenuator
test
or 1 2
A2
Acceptance
Criteria A1
f0 f1 f
Table 1-1 Input Jitter Tolerance Filter and Indices at the STM-N
Interface
STM Level f1(kHz) f0(kHz) A1(UIp-p) A2(UIp-p)
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6

1. Clean the optical connector and ensure good connection before

the test..
Remarks
2. Ensure that the input optical power of the board is consistent with
that of the meter.
1.4.2.5 Maximum Output Jitter

Test Item Maximum Output Jitter
to the NCP.

under test.
Figure 1-11 Output Jitter Connection
Optical Rd Optical
n OTU under Sd
test
or 1 2
Test Process 2. Set the SDH signal generator to allow the SDH output signals to
access the receive optical interface of the board under test and adjust
the optical power to meet the requirements of the receive optical
power of the board under test.
3. Set the receive rate of the jitter tester based on the rate level of
STM-N signals sent from the equipment. Adjust the optical attenuator,
so that the jitter tester can receive proper optical power.
4. Set the measurement filter of the jitter tester to the bandwidth
shown in the following table, and read the maximum output
peak-to-peak value of jitter.

Table 1-2 Fixed Output Jitter Indices at the STM-N Interface
STM Peak-to-Peak Value

Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
65kHz~1.3MHz 0.10 U
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~ 2 MHz 0.10UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI

the test..
Remarks
2. If o.171 and o.172 options are both available for the filter
template, select o.172 for the test.
1.4.2.6 Jitter Transfer Function

Test Item Jitter Transfer Function
to the NCP.


Test Process and adjust the optical attenuator, so that the tested board can receive
the test environment according to the connection for testing input jitter.
3. Test certain items and templates with the SDH analyzer and
observe whether the test results are under the templates.
1. 2.5G OTU jitter transfer function should meet the requirements of

ITU-T G.958.
Acceptance 2. 10G OTU jitter transfer function should meet the requirements of
Criteria ITU-T G.783.
3. 40G OTU jitter transfer function should meet the requirements of
ITU-T G.8251.
1. Jitter transfer function refers to the relationship between the

variation in jitter frequencies and the ratio of output-signal jitter to
Remarks input-signal jitter for the equipment.
2. If the actual input tolerance rate index of the equipment has a
margin, it is allowed to increase the jitter range of test signals properly.
1.5 10G Optical Transponder

SOTU10G/OTU10G/EOTU10G/EOTU10GB (for
SDH/OTN/10GE Services)
1.5.1 Line-Side Optical Interface


to the NCP.

Figure 1-12 Connection for testing Optical Output Power at line side
for SOTU10G
SDH/OTN Variable S CR LT Sn Optical power meter

analyzer optical SOTU10G
attenuator LR
Rn
Test Process
Acceptance ERZ:-5~-2d B m
Criteria NRZ:-5~+1d B m
Remarks
test..


to the NCP.

Figure 1-13 SOTU10G Optical Receiver Sensitivity Connection
C L Variable
Optical S Sn
SDH/OTN R SOTU T Optical
Analyzer attenuator C 10G L attenuator
50/50
T R
Rn coupler
Optical
power meter
Test Process
SDH analyzer.
Acceptance PIN: ≤--14dBm(EOL), ≤--17(BOL,OTU2), ≤--16(BOL,OTU2e)

Criteria APD: ≤-21dBm(EOL), ≤--24(BOL,OTU2), ≤--22(BOL,OTU2e)



to the NCP.

at the line interface
C L OA+varia
Optical S Sn
SDH/OTN R SOTU T ble Optical
Analyzer attenuator C 10G L attenuator
50/50
T R
Rn coupler
Optical
Test Process power meter
board under test.
10-12.




to the NCP.

under test.
C L
Variable S Sn
attenuator
L
R
Rn
Test Process
the receive optical power of SOTU2.5G.
Acceptance ≤ ±12.5GHz (100GHz wavelength interval)

Criteria ≤ ±5GHz (50GHz wavelength interval)

Remarks


to the NCP.

under test.
C L
Variable S Sn
attenuator
L
R
Rn
Test Process
spectral width.
Acceptance NRZ≤0.3nm
Criteria RZ≤0.4nm
Remarks
1.5.1.6 SMSR
Test Item SMSR

Test Item SMSR
to the NCP.

under test.
C L
Variable S Sn
attenuator
L
R
Rn
Test Process
(dB).
Acceptance
SMSR ≧35dB
Criteria
1.5.2 Client-Side Optical Interface


to the NCP.

the SDH/IP signal generator to provide signals for the board.
Figure 1-18 SOTU10G connection for testing Optical Output Power
at client side
Test Process
2. Set the SDH/IP signal generator to send test signals to the board
SDH services:
I64.1: -6~-1dBm
S64.2a: -5~-1dBm
S64.2b: -1~+2dBm
Acceptance
L64.2C: -2~+2 dBm
Criteria
10GE services:
10GBASE-LR/LW: -8.2~ +0.5 dBm
10GBASE-ER/EW: -4.5~ +4 dBm
10GBASE-SR/SW : -1~ -7.3 dBm
Remarks
test..


to the NCP.

Figure 1-19 SOTU10G Optical Receiver Sensitivity Connection
SDH/OT C L Sn
Variable S R
N 50/50 T optical
optical C SOTU10G L
attenuator R T R
Rn
Optical power
meter
Test Process 2. The SDH/IP analyzer sends test signals to the board under test.
SDH analyzer.
it.
SDH services:
I64.1: ≤-11dBm
S64.2a: ≤-18dBm
S64.2b: ≤-14dBm
Acceptance
L64.2C: ≤-26 dBm
Criteria
10GE services:
10GBASE-LR/LW: ≤-14dBm
10GBASE-ER/EW: ≤-12.6dBm
10GBASE-SR/SW : ≤-11.1dBm



to the NCP.

Figure 1-20 SOTU10G Connection for testing receive overload point
at the client side
SDH/OT C L Sn
Variable S R
N 50/50 T Optical
Optical optical C SOTU10G L
amplifier attenuat R T R
or Rn
Test Process Optical power

meter
10-12.

SDH services:
I64.1: ≥-1dBm
S64.2a: ≥ -8dBm
S64.2b: ≥-1dBm
Acceptance
L64.2C: ≤-9 dBm
Criteria
10GE services:
10GBASE-LR/LW: ≥+0 .5dBm
10GBASE-ER/EW: ≥-1 dBm
10GBASE-SR/SW: ≥-1 dBm


to the NCP.

Test Process
template.

Figure 1-21 Input jitter tolerance of SOTU10G input interface
Optical Rd Optical
n OTU under Sd
test
or 1 2
A2
Acceptance
Criteria A1
f0 f1 f
Interface
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6

the test..
Remarks
that of the meter.


to the NCP.

under test.
Optical Rd Optical
n OTU under Sd
test
or 1 2


Test Filter
INTERFACE of Jitter
500Hz ~ 1.3MHz 0.30 UI

STM-1
65kHz ~ 1.3MHz 0.10 UI
1000Hz ~ 5MHz 0.30 UI

Acceptance STM-4
250kHz ~ 5MHz 0.10 UI
Criteria
5000Hz ~ 20MHz 0.30 UI
STM-16
1MHz ~ 20MHz 0.10 UI
20kHz ~ 80MHz 0.30 UI

STM-64
4MHz ~ 80MHz 0.10 UI
20 kHz ~ 320 MHz 6.0 UI

STM-256
16 MHz ~ 320 MHz 0.15 UI

the test..
Remarks

to the NCP.



ITU-T G.958.
ITU-T G.8251.

1.6 SRM41—Four-Channel 2.5G Aggregation Board


to the NCP.

Figure 1-23 SRM41 connection for testing Optical Output Power at
line side
SDH signal A1 Ra OUT

Optical
generator power
D1 Sd San
Ra meter
A2
D2 Sd
Ra SRM
A3
Test Process Sd
D3
Ra IN
A4
Sd
D4 Rdn
Acceptance
-5~+1d B m
Criteria
Remarks
test..


to the NCP.

Figure 1-24 SRM41 Optical Receiver Sensitivity Connection
SDH A1 Ra Variable
OUT 50/50
analyzer Sd optical
D1 San coupler
Ra attenuator
A2
Sd Optical
D2
A3
Ra SRM power
Sd IN
D3 meter
Ra Rdn
A4
Sd
D4
Test Process 3. Adjust the variable optical attenuator to gradually increase the
SDH analyzer.
it.
Acceptance PIN: ≤-14dBm

Criteria APD: ≤-21dBm



to the NCP.

Figure 1-25 SRM41 Connection for testing receive overload point at
the line interface
Variabl
A1 Ra e
SDH analyzer OUT 50/50
OA optical
D1 Sd San coupler
attenua
A2 Ra
tor
Sd Optical
D2
Ra SRM power
A3
Sd IN meter
D3
Ra Rdn
A4
Sd
Test Process D4
2. Set the SDH analyzer correctly, and send test signals to the board
under test.
10-12.




to the NCP.

under test.
SDH signal A1 Ra Optical

OUT
generator Sd multi-
D1 San wavelength
Ra meter
A2
Sd
D2
A3
Ra SRM
Sd
D3
Ra
Test Process A4 IN
Sd
D4
Rdn
2. Set the SDH signal generator to send the STM-4/1 signal to the
board under test, and adjust the optical power to meet requirements of
the receive optical power of SRM41.
Acceptance ≤ ±12.5GHz (100GHz wavelength interval)

Criteria ≤ ±5GHz (50GHz wavelength interval)

Remarks


to the NCP.

under test.
SDH signal A1 Ra
OUT Spectrome
generator Sd
D1 San ter
Ra
A2
Sd
D2
A3
Ra SRM
Sd
D3
Test Process Ra
A4 IN
Sd
D4
Rdn
spectral width.
Criteria RZ≤0.4nm
Remarks
1.6.1.6 SMSR
Test Item SMSR

Test Item SMSR
to the NCP.

under test.
SDH signal A1 Ra
OUT Spectrome
generator Sd
D1 San ter
Ra
A2
Sd
D2
A3
Ra SRM
Sd
D3
Ra
A4 IN
Test Process Sd
D4 Rdn
(dB).
Acceptance
SMSR ≧35dB
Criteria


to the NCP.

the client side
SDH signal A1 Ra
OUT
generator D1 Sd
San
Ra
Optical A2
Sd Optical
power D2
Ra SRM attenuat
meter A3
Test Process or
Sd
D3
Ra
A4
IN
D4 Sd
Rdn
I16: -10~-3dBm
S16.1: -5~0dBm
Acceptance
S16.2: -5~0dBm
Criteria
L16.1: -2~+3dBm
L16.2: -2~+3dBm

Remarks
test..

to the NCP.

Variable
SDH 50/50 A1 Ra OUT
optical
analyzer coupler D1 Sd San
attenuator Optical
A2 SRM attenuat
Optical D2
or
power A3
D3
IN
meter A4 Rdn
D4
SDH analyzer.
it.
I16: ≤-18dBm
S16: ≤-18dBm
Acceptance
S16.2: ≤-18dBm
Criteria
L16.1: ≤-27dBm
L16.2: ≤-28dBm



to the NCP.

the client side
Variable A1 Ra
SDH 50/50 OUT
OA optical
attenuator
Optical
A2 SRM
Optical D2 attenuator
power A3 IN
D3
Test Process meter
A4 Rdn
D4
10-12.
I16: ≥-3dBm
S16.1: ≥0dBm
Acceptance
S16.2: ≥0dBm
Criteria
L16.1: ≥-9dBm
L16.2: ≥-9dBm



to the NCP.

Test Process
analyzer equal to that of the self-looped analyzer in step 1. Configure
template.

Figure 1-32 Input jitter tolerance of SRM41 input interface
A1 Ra OUT
SDH analyzer Sa
D1 Sd n
Ra
A2 Opti
Sd
D2 cal
Ra SRM atten
A3
Sd uato
D3 IN r
Ra
A4
Sd Rd
D4 n
A2
Acceptance
Criteria
A1
f0 f1 f
Interface
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6

the test..
Remarks
that of the meter.


to the NCP.

under test.
A1 Ra OUT
SDH analyzer Sa
D1 Sd
n
Ra
A2 Opti
Sd cal
D2
Ra SRM atten
A3 uato
Sd
D3 IN r
Ra
A4
Test Process Sd Rd
D4 n
2. Set the SDH signal generator to allow the SDH output signals to


Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
65kHz~1.3MHz 0.10 UI
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10UI
Criteria
5000Hz~20 Hz 0.30 UI
STM-16
1MHz~ 20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI

the test..
Remarks

to the NCP.



ITU-T G.958.
ITU-T G.8251.

1.7 SRM42—Four-Channel 622M/155M Aggregation

Board


to the NCP.

line side
SDH signal A1 Ra OUT

Optical
generator power
D1 Sd San
Ra meter
A2
D2 Sd
Ra SRM
A3
Test Process Sd
D3
Ra IN
A4
Sd
D4 Rdn
Acceptance
-10~ +6d B m
Criteria
Remarks
test..


to the NCP.

SDH A1 Ra Variable
OUT 50/50
analyzer Sd optical
D1 San coupler
Ra attenuator
A2
Sd
D2 Optical power
Ra SRM
A3
Sd IN
meter
D3
Ra Rdn
A4
Sd
D4
SDH analyzer.
it.
Acceptance PIN: ≤-21dBm

Criteria APD: ≤-28dBm



to the NCP.

the line interface
Variabl
A1 Ra e
SDH analyzer OUT 50/50
OA optical
D1 Sd San coupler
attenua
A2 Ra
tor
Sd Optical
D2
Ra SRM power
A3
Sd IN meter
D3
Ra Rdn
A4
Sd
Test Process D4
board under test.
10-12.




Prerequisite
s
the NCP.

SDH signal generator to provide modulation signals for the board under
test.
Optical
SDH signal A1 Ra
OUT multi-
generator Sd
D1 San wavelength
Ra meter
A2
Sd
D2
A3
Ra SRM
Sd
D3
Test Ra
A4 IN
Process Sd
D4
Rdn
2. Set the SDH signal generator to send the STM-4/1 signal to the
board under test, and adjust the optical power to meet the requirements
of the receive optical power of SRM42.
3. Set the display wavelength range of the multi-wavelength analyzer
to display the waveform within the range in the center of the screen, and
then read and record the central wavelength value at the peak. Calculate
the central wavelength value with the formula ƒ=C/λ.

1. Both the central wavelength and offset of boards below STM 64

rate should meet the requirements in the following table.
Table 1-7 Requirements for central wavelength and offset
Transmitting End Receiving End

2.5G OTU 10G OTU Receiving
OTU type
Regenerator 2.5G Regenerator 10G End OTU
OTU OTU
Central
No
wavelength Meet the requirements of ITU-TG.694.1
Acceptance requirement
(THz)
Criteria
≤12.5GHz (100
GHz wavelength
Central ≤ 20GHz(100
interval) No
wavelength GHz wavelength
≤5GHz (50 GHz requirement
offset (GHz) interval)
wavelength
interval)
2. For the boards of STM-256 rate

80-channel system: ≤±2.5GHz
40-channel system: ≤±5GHz

Remarks

to the NCP.


under test.
SDH signal A1 Ra
OUT Spectrome
generator Sd
D1 San ter
Ra
A2
Sd
D2
A3
Ra SRM
Sd
D3
Test Process Ra
A4 IN
Sd
D4
Rdn
spectral width.
Acceptance
≤0.2nm (EA modulation); ≤0.4nm (direct modulation)
Criteria
Remarks
1.7.1.6 SMSR
Test Item SMSR
to the NCP.

Test Item SMSR

under test.
SDH signal A1 Ra
OUT Spectrome
generator Sd
D1 San ter
Ra
A2
Sd
D2
A3
Ra SRM
Sd
D3
Ra
A4 IN
Test Process
Sd
D4 Rdn
(dB).
Acceptance
SMSR ≧35dB
Criteria


to the NCP.

the client side
SDH signal A1 Ra
OUT
generator D1 Sd
San
Ra
Optical A2
Sd Optical
power D2
Ra SRM attenuat
meter A3
Test Process or
Sd
D3
Ra
A4
IN
D4 Sd
Rdn
Acceptance I-1.1/I-4.1: -15~-8dBm

Criteria SI-1.1/S-4.1: -15~-8dBm
Remarks
test..


to the NCP.

Variable
SDH 50/50 A1 Ra OUT
optical
attenuator Optical
A2 SRM attenuat
Optical D2
or
power A3
D3
IN
meter A4 Rdn
D4
SDH analyzer.
it.
Acceptance I-1.1/I-4.1: ≤-23dBm

Criteria SI-1.1/S-4.1: ≤-28dBm



to the NCP.

the client side
Variable Ra
SDH 50/50 A1 OUT
OA optical
attenuator Optical
A2 SRM attenuat
D2
Optical
A3 IN
or
power
meter D3
Test Process A4
D4
Rdn
10-12.
Acceptance I-1.1/I-4.1: ≥-8dBm

Criteria SI-1.1/S-4.1: ≥-8dBm


to the NCP.


Test Process
template.

Figure 1-43 Input jitter tolerance of SRM42 input interface
A1 Ra OUT
SDH analyzer Sa
D1 Sd n
Ra
A2 Opti
Sd
D2 cal
Ra SRM atten
A3
Sd uato
D3 IN r
Ra
A4
Sd Rd
D4 n
A2
Acceptance
Criteria
A1
f0 f1 f
Interface
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6

the test..
Remarks
that of the meter.


to the NCP.

under test.
A1 Ra OUT
SDH analyzer Sa
D1 Sd
n
Ra
A2 Opti
Sd cal
D2
Ra SRM atten
A3 uato
Sd
D3 IN r
Ra
A4
Test Process Sd Rd
D4 n


Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 U
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI

the test..
Remarks

to the NCP.



ITU-T G.958.
ITU-T G.8251.

1.8 GEM2/GEMF/GEM8—Gigabit Ethernet

Aggregation Board


to the NCP.

the IP signal generator to provide signals for the board.
Figure 1-45 GEM connection for testing Optical Output Power at line
side
A1 Ra
OUT Optical power
D1 Sd San meter
IP signal
generator GEM
Test Process A8 Ra
D8 Sd IN
Rdn
2. Set the IP signal generator to send the test signals to the board
under test, and adjust the optical power to meet the requirements for
GEM2/GEMF : -10~+6d B m
Acceptance GEM8:
Criteria ERZ:-5~-2d B m
NRZ:-5~+1d B m
Remarks
test..


Prerequisite
s
the NCP.

Figure 1-46 GEM Optical Receiver Sensitivity Connection
A1 Ra OUT Variable
optical
IP Sn attenuator
analyzer D1 Sd
GEM IN
A8 Ra
Rn
D8 Sd Optical power
meter
Test
Process
2. The IP analyzer sends test signals to the board under test.

SDH analyzer.
1) GEM2/GEMF
PIN: ≤-21dBm
Acceptance APD: ≤-28dBm
Criteria (2)GEM8
PIN: ≤-14dBm
APD: ≤-21dBm


Remarks receive optical power on the input port when input signals are located in
the 1550 nm window and the BER reaches 10-12.

Test
Overload Optical Power
Item
1. Pass the primary power supply test and the fan unit test. The equipment
has been powered on and working properly.
2. The EMS software has been installed, and the network data has been
Prerequi
configured properly.
sites
3. The database configured to the equipment has been downloaded to the
NCP.

Figure 1-47 GEM Connection for testing receive overload point at the line
interface
A1 Ra OUT Variable
optical
IP Sn attenuator
analyzer D1 Sd
GEM IN
Test A8 Ra
Rn
Process D8 Sd Optical power
meter
2. Set the IP analyzers correctly, and send test signals to the board under
test.
attenuation value and make the BER to be close to but no greater than 10-12.
4. The optical power value read from the optical power meter indicates the
overload optical power of the receiver.

Accepta
PIN: ≥0 dBm;
nce
APD: ≥-9 dBm
Criteria
The receive overload optical power refers to the maximum receivable value
Remark
of the average receive optical power at reference point Rn when the BER
s
reaches 10-12.

Test
Central Wavelength and Frequency Deviation
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. Use the IP

signal generator to provide modulation signals for the board under test.
A1 Ra
OUT Optical multi-
D1 Sd San wavelength meter
IP signal
generator GEM
A8 Ra
D8 Sd IN
Test Rdn
Process
2. Set the IP signal generator to send test signals to the board under test,
and adjust the optical power to meet the requirements for the receive optical
power of GEM.
3. Set the display wavelength range of the multi-wavelength analyzer to
display the waveform within the range in the center of the screen, and then
read and record the central wavelength value at the peak. Calculate the
central wavelength value with the formula ƒ=C/λ.
4. The difference between the central wavelength value and its nominal
value is the central wavelength offset value.

Accepta
≤12.5GHz (100GHz wavelength interval)
nce
≤5GHz (50GHz wavelength interval)
Criteria
Remark The central wavelength refers to the actual central wavelength of the optical
s signal sent by the transmitter at reference point Sn.

to the NCP.

the IP signal generator to provide modulation signals for the board
under test.
A1 Ra
OUT
D1 Sd Spectrometer
San
IP signal
generator GEM
A8 Ra
D8 Sd IN
Test Process
Rdn
amplitude scale of the spectrometer make the waveform displayed with
proper amplitude in the center of the screen to facilitate observation and
reading.
spectral width.

GEM2/GEMF:
≤ 0.2 nm (EA modulation)
Acceptance
GEM8:
Criteria
NRZ≤0.3nm
RZ≤0.4nm
Remarks
1.8.1.6 SMSR
Test Item SMSR
to the NCP.
Create a test environment, as shown in the following figure. Use the IP

A1 Ra
OUT
D1 Sd Spectrometer
San
IP signal
generator GEM
A8 Ra
D8 Sd IN
Rdn
Test Process
(dB).

Acceptance
SMSR ≧35dB
Criteria
Remarks longitudinal mode to the optical power of the most significant side mode
in full modulation under the worst reflection condition.

Test
Average Transmit Optical Power
Item
Prerequi
sites
NCP.


signal generator to provide signals for the board.
Figure 1-51 GEM connection for testing Optical Output Power at the client
side
IP signal A1 Ra
OUT
generator
San
Optical power D1 Sd
meter GEM
Test
A8 Ra
Process
D8 Sd IN
Rdn
and adjust the optical power to meet the requirements of the receive optical
power.
3. Set the receive optical wavelength of the optical power meter equal to
the transmit optical wavelength of the board under test. Measure the Optical
Output Power.
1000BASE-SX: -9.5~-3dBm
Accepta 1000BASE-LX: -11~-3dBm
nce 1000BASE-(LH,LH1,LH2): -9.5~-3dBm
Criteria 1000BASE-ZX: 0~+5dBm
1000BASE-EX: 0~+5dBm
Remark
Clean the optical connector and ensure good connection before the test..
s

Test
Optical Receiver Sensitivity
Item
Prerequi
sites
NCP.


Figure 1-52 GEM Optical Receiver Sensitivity Connection
Optical power
meter
Variable optical A1 Ra
attenuator OUT
S
D1 Sd San
IP analyzer
GEM
A8 Ra
IN
D8 Sd
Test Rdn
Process
attenuation value with the bit error rate (BER) of 10-7 measured by the SDH
analyzer.
5. Repeat step 3 and step 4 to measure the optical power values with BER
of 10-8, 10-9, 10-10 and 10-11 respectively.
6. According to extrapolation, draw a P-BER curve in a dual-logarithmic
coordinate paper. The optical power corresponding to BER of 10-12 indicates
the receiver sensitivity.
1000BASE-SX: ≤-17dBm
1000BASE-LX: ≤-19dBm
Accepta 1000BASE-LH: ≤-19dBm
nce 1000BASE-LH1: ≤-18dBm
Criteria 1000BASE-LH2: ≤-15dBm
1000BASE-ZX: ≤-18dBm
1000BASE-EX: ≤-30dBm
The receiver sensitivity refers to the minimum value of the average receive
Remark
optical power on the input port when input signals are located in the 1550 nm
s
window and the BER reaches 10-12.

Test
Item

Prerequi
sites
NCP.

Figure 1-53 GEM Connection for testing receive overload point at the client
side
Optical power
meter
Variable optical A1 Ra
attenuator OUT
S
Test D1 Sd San
IP analyzer
Process GEM
A8 Ra
IN
D8 Sd
Rdn

1000BASE-SX: ≥0dBm
Accepta 1000BASE-LX: ≥-3dBm
nce 1000BASE-(LH, LH1, LH2): ≥-3dBm
Criteria 1000BASE-ZX: ≥-3dBm
1000BASE-EX: ≥-10dBm
Remark
of the average receive optical power at reference point R when the BER
s
reaches 10-12.

1.9 SDSA—Data Service Aggregation Board

Test
Item
Prerequi
sites
NCP.

Figure 1-54 SDSA connection for testing Optical Output Power at line side
Data service A1 Ra Optical

OUT1
signal Sd power
D1 San
generator meter
IN1
SDSA Rdn
Test
Process
2. Set the IP signal generator to send the test signals to the board under
test, and adjust the optical power to meet the requirements for the receive
optical power.
Output Power.
Accepta
nce -10 ~ +6d B m
Criteria
Remark
s


Test
Item
Prerequi
sites
NCP.

Figure 1-55 SDSA Optical Receiver Sensitivity Connection
A1 Ra OUT1 Variable optical

Data San attenuator
D1 Sd
analyzer Optical
SDSA power
meter
board
IN1 50/50
Rdn coupler
Test 2. The IP analyzer sends test signals to the board under test.
Process 3. Adjust the variable optical attenuator to gradually increase the
analyzer.
Accepta
PIN: ≤-21dBm
nce
APD: ≤-28dBm
Criteria
Remark
s


Test
Item
Prerequi
sites
NCP.

Figure 1-56 SDSA Connection for testing receive overload point at the line
interface
Variable
Ra OUT Opti
A1 1 optical
Data service OA cal
D1 Sd San attenuato
analyzer filter
r
SDSA
board IN1
50/50
cooupl
Rdn
Test er Optical
power meter
Process
test.
Accepta
PIN: ≥0 dBm;
nce
APD: ≥-9 dBm.
Criteria
Remark
s
reaches 10-12.

Test
Item

Prerequi
sites
NCP.

Optical
Data service A1 Ra
OUT1 multi-
signal Sd
D1 San wavelength
generator
IN1 meter
Rdn
SDSA
Test
Process
power of SDSA.
Accepta
nce
Criteria


Prerequisite
s
the NCP.

IP signal generator to provide modulation signals for the board under
test.
Data service A1 Ra
OUT1 Spectrome
signal Sd
D1 San ter
generator
Rdn IN1
SDSA
Test Process
reading.
spectral width.
Acceptance OTU1: ≤ 0.2nm (EA modulation);

Criteria OTU2: ≤ 0.4nm (direct modulation)
Remarks
1.9.1.6 SMSR
Test Item SMSR

to the NCP.

Data service A1 Ra
OUT1 Spectrome
signal Sd
D1 San ter
generator
Rdn IN1
SDSA
Test Process
(dB).
Acceptance
SMSR ≧35dB
Criteria


Test
Item
Prerequi
sites
NCP.

Figure 1-60 SDSA connection for testing Optical Output Power at the client
side
Data service Ra
A1 OUT1
signal
generator D1 Sd
San
Optical
Optical attenuat
SDSA
Test power or
Process meter IN1
Rdn
Sn
power.
Output Power.

GE service:
1000BASE-SX: -9.5~-3dBm
1000BASE-LX: -11~-3dBm
Accepta
1000BASE-(LH,LH1,LH2): -9.5~-3dBm
nce
1000BASE-ZX: 0~+5dBm
Criteria
FC service:
100-SM-LC-L: -9~-3dBm
Remark
s

Test
Item
Prerequi
sites
NCP.


Figure 1-61 SDSA Optical Receiver Sensitivity Connection
Variable
50/50 A1 Ra OUT1
optical
coupler D1 Sd San Optical
attenuator
attenuat
Optical SDSA
IN1 or
Data power Rdn
service meter
analyzer
Test
Process 2. The IP analyzer sends test signals to the board under test.
analyzer.
GE service:
1000BASE-LH: ≤-19dBm
Accepta
1000BASE-LH1: ≤-18dBm
nce
Criteria
FC service:
100-SM-LC-L: ≤-18.2dBm
Remark
s

Test
Item

Prerequi
sites
NCP.

Figure 1-62 SDSA Connection for testing receive overload point at the
client side
Variable
50/50 A1 Ra OUT1
optical
coupler D1 Sd San Optical
attenuator
attenuat
Optical SDSA
Test IN1 or
Data power Rdn
Process service meter
analyzer

GE service:
1000BASE-LX: ≥-3dBm
Accepta
1000BASE-(LH,LH1,LH2): ≥-3dBm
nce
1000BASE-ZX: ≥-3dBm
Criteria
FC service:
100-SM-LC-L: ≥-3dBm
Remark
s
reaches 10-12.

1.10 DSAC—Data Service Aggregation Board

(Type-C)

to the NCP.
1. Test environment:
1) The needed materials for the test include a signal generator of IP
data services and an optical power meter.
2) The test configuration is shown in the following figure.
Figure 1-63 Configuration of the Average Transmit Optical Power
at the Client Side of DSAC
IP data service Ra
A1
signal Back
generator D1 Sd plane
electr
Test Process ical
Optical cross
DSAC -
power conn
meter Ra ect
A8 loopb
Sd ack
D8
2. Test method:
1) Create a test environmen according to the above figure so that
the IP signal generator can send the GbE signal.
2) Use the optical power meter to measure the optical power at 8
clients sides from DROP1 to DROP 8.

GE service:
1000BASE-SX: -9.5~-3dBm
Acceptance 1000BASE-(LH,LH1,LH2): -9.5~-3dBm
Criteria 1000BASE-ZX: 0~+5dBm
FC service:
100-SM-LC-L: -9~-3dBm
Remarks N/A

to the NCP.

1) The needed materials for the test include an IP analyzer, an
optical power meter, a variable optical attenuator, a 50/50 coupler,
optical fiber jumpers and the DSAC under test.
Figure 1-64 Configuration of the Receiver Sensitivity at the Client
Side of DSAC
Variable
50/50 A1 Ra
IP analyzer optical Backpl
coupler D1 Sd ane
attenuator electric
al
Optical DSAC cross-

connec
Test Process Ra t
power A8 loopba
Sd ck
meter D8
2. Test method:
the IP analyzer can send the GbE signal.
2) Adjust the variable optical attenuator, gradually decrease the
optical power, and make sure there is no packet lost. Test for 10
seconds.
3) Read the current optical power from the meter. The value
indicates the receiver sensitivity at the client side of the DSAC board.
GE service:
Acceptance 1000BASE-LH1: ≤-18dBm
Criteria 1000BASE-LH2: ≤-15dBm
FC service:
100-SM-LC-L: ≤-18.2dBm
Remarks N/A
1.10.1.3 Minimum Overload Optical Power

Test Item Minimum Overload Optical Power

to the NCP.
1) The needed materials for the test include an IP analyzer, an
optical fiber jumpers and the DSAC under test.
Figure 1-65 Configuration of the Minimum Overload Optical Power at
the Client Side of DSAC
Variable
50/50 A1 Ra
IP analyzer optical Backpl
coupler D1 Sd ane
attenuator electric
al
Optical DSAC cross-

connec
Ra t
Test Process power A8 loopba
Sd ck
meter D8
2. Test method:
the IP analyzer can send the GbE signal.
2) Adjust the variable optical attenuator, gradually increase the
optical power, and make sure there is no packet lost. Test for 10
seconds.
3) Read the current optical power from the meter. The value
indicates the overload optical power at the client side of the DSAC
board.
GE service:
Acceptance 1000BASE-(LH,LH1,LH2): ≥-3dBm
Criteria 1000BASE-ZX: ≥-3dBm
FC service:
Remarks N/A

1.11 ASMA/B—Aggregation Transponder

Prerequisite
s
the NCP.
1) The needed materials for the test include an IP analyzer, an optical
power meter, optical fiber jumpers and the ASMA board under test.
Figure 1-66 Configuration of the Average Transmit Optical Power at
the Line Side of ASMA
C1R Ra L1T
Optical power
C1T Sd San meter
IP
Test ASMA
analyzer L1R
Process CnT Ra
Rdn
CnT Sd
2. Test method:
1) Create a test environmen according to the above figure so that the
IP analyzer can send the GbE signal to ASMA and the board backplane
self-loops.
2) After the reading on the meter is stable, read and record the optical
power (unit: dBm).
Acceptance ERZ:-5~-2dBm
Criteria NRZ:-5~+1 dBm
Remarks N/A


to the NCP.
power meter, a variable optical attenuator, a 50/50 coupler, optical fiber
jumpers and the ASMA under test.
Figure 1-67 Configuration of the Receiver Sensitivity at the Line Side
of ASMA
C1R Ra L1T Variable

IP optical
analyzer C1T Sd San attenuator
Test Process ASMA

L1R
CnT Ra
Rdn
CnT Sd Optical power
meter
2. Test method:
IP analyzer can send the GbE signal to ASMA.
2) Adjust the variable optical attenuator to gradually decrease the
optical power with the bit error rate (BER) of 10-10 and test for 10
seconds.
3) The optical power read from the meter plus 1dB indicates the
receiver sensitivity at the line side of the ASMA board.
Optical interface at the line side:
Acceptance
PIN: ≤--14dBm(EOL), ≤--17(BOL,OTU2), ≤--16(BOL,OTU2e)
Criteria
APD: : ≤-21dBm: (EOL), ≤--24(BOL,OTU2), ≤--22(BOL,OTU2e)
Remarks N/A


to the NCP.
power meter, a variable optical attenuator, an optical amplifier, a 50/50
de-multiplexer, optical fiber jumpers and the ASMA under test.
Figure 1-68 Configuration of the Overload Optical Power at the Line
Side of ASMA
C1R Ra L1T Variable

IP optical
analyzer C1T Sd San attenuator
ASMA
L1R
CnT Ra
Rdn
CnT Sd
Test Process Optical power
meter
2. Test method:
IP analyzer can send the GbE signal. Note that if the output wavelength
on the transmit port of the IP analyzer is within band C, it can be put
into the optical amplifier directly. Otherwise, you need to use an optical
transponder unit (such as SOTU10G board) to convert the wavelength
into the one within the band C.
2) Adjust the variable optical attenuator to gradually increase the
seconds.
3) The optical power read from the meter minus 0.5dB indicates the
receive overload optical power at the line side of the ASMA board.

optical interface at the line side:

Acceptance
APD: ≥-9dBm
Criteria
PIN: ≥0dBm
Remarks N/A

Test Item Central Wavelength Deviation
to the NCP.
1) The needed materials for the test include an IP analyzer, a
multi-wavelength meter, optical fiber jumpers and the ASMA under test.
Figure 1-69 Configuration of the Central Wavelength at the Line Side
of ASMA
C1R Ra L1T Optical multi-

-
wavelength
C1T Sd San meter
IP ASMA
analyzer L1R
CnT Ra
Test Process Rdn
CnT Sd
2. Test method:
self-loops.
2) Read the actual central wavelength value (unit: THz) from the
multi-wavelength meter and record it.
3) The difference between the actual central wavelength and the
nominal central wavelength is the central wavelength deviation (unit:
GHz).

Acceptance ≤12.5GHz (100GHz wavelength interval)

Criteria ≤5GHz (50GHz wavelength interval)
Remarks N/A
1.11.1.5 Maximum 20dB Spectral Width

Test Item Maximum 20dB Spectral Width
to the NCP.
spectrometer, optical fiber jumpers and the ASMA under test.
Figure 1-70 Configuration of the Spectrum Features at the Line Side
of ASMA
C1R Ra L1T
Spectromet
-
C1T Sd San er
IP ASMA
analyzer L1R
CnT Ra
Rdn
Test Process CnT Sd
2. Test method:
self-loops.
2) Set the wavelength range and amplitude of the spectrometer, in
order to show the optical spectrum in the middle of the screen.
3) Set the resolution bandwidth of the spectrometer to the minimum
value, and the wavelength scanning range is 2 nm. Read the test result
from the meter with the automatic -20dB spectral width testing function,
and record it.

Criteria RZ≤0.4nm
Remarks N/A
1.11.1.6 Minimum SMSR

Test Item Minimum SMSR
to the NCP.
spectrometer, optical fiber jumpers and the ASMA under test.
of ASMA
C1R Ra L1T
Spectromet
-
C1T Sd San er
IP ASMA
analyzer L1R
CnT Ra
Test Process Rdn
CnT Sd
2. Test method:
1)Create a test environmen according to the above figure so that the IP
analyzer can send the GbE signal to ASMA and the board backplane
self-loops.
3) Set the resolution bandwidth of the spectrometer to 0.1nm. Read
the test result from the meter with the automatic SMSR testing function,
and record it.
Acceptance
optical interface at the line side: ≥35dB
Criteria

Remarks N/A

to the NCP.
1) The needed test materials include an IP analyzer, an optical
power meter, optical fiber jumpers and the ASMA board under test.
at the Line Side of ASMA
IP C1R Ra L1T
analyzer
C1T Sd San
Optical power
Test Process meter ASMA
L1R
CnT Ra
Rdn
CnT Sd
2. Test method:
1)Create a test environmen according to the above figure so that the
IP analyzer can send the GbE signal to ASMA and the board
backplane self-loops.
2) After the reading on the meter is stable, read and record the
optical power (unit: dBm).

1000BASE-SX: -9.5~-3dBm
Acceptance
1000BASE-(LH,LH1,LH2): -9.5~-3dBm
Criteria
Remarks N/A

to the NCP.

power meter, a variable optical attenuator, a 50/50 coupler, optical fiber
jumpers and the ASMA under test.
of ASMA
Optical power
meter
Variable optical CR1 Ra

attenuator L1T
CT
Sd San
1
Test Process
IP analyzer ASMA
Cn
Ra
R L1R
Cnt Sd
Rdn
2. Test method:
IP analyzer can send the GbE signal to ASMA.
seconds.
receiver sensitivity at the line side of the ASMA board.
Acceptance
Criteria
Remarks N/A


to the NCP.
power meter, a variable optical attenuator, an optical amplifier, a 50/50
de-multiplexer, optical fiber jumpers and the ASMA under test.
Figure 1-74 Configuration of the Overload Optical Power at the Line
Side of ASMA
Optical power
meter
Variable optical CR1 Ra

attenuator L1T
CT
Sd San
1
IP analyzer ASMA
Cn
Ra
R L1R
Test Process Cnt Sd
Rdn
2. Test method:
IP analyzer can send the GbE signal to ASMA. Note that if the output
wavelength on the transmit port of the IP analyzer is within band C, it
can be put into the optical amplifier directly. Otherwise, you need to use
an optical transponder unit (such as SOTU10G board) to convert the
wavelength into the one within the band C.
seconds.
receive overload optical power at the line side of the ASMA board.

Acceptance
Criteria
Remarks N/A
1.12 SAUC—SDH Service Access Board (Type-C)

to the NCP.

1) The needed test materials include an SDH signal generator, an
optical power meter, optical fiber jumpers and the SAUC board under
test.
Figure 1-75 Configuration of the Drop SAUC Average Transmit
Optical Power
SDH signal A1 Ra
generator D1 Sd
Optical
Test Process power
meter SAUC
A2
Ra
D2 Sd
2. Test method:
1)Create a test environmen according to the above figure so that the
SDH signal generator can send the STM-16 signal to SAUC and the
board backplane cross-connects and self-loops.
2)After the reading on the meter is stable, read and record the optical
power (unit: dBm).
I16: -10~-3dBm
S16.1: -5~0dBm
Acceptance
S16.2: -5~0dBm
Criteria
L16.1: -2~+3dBm
L16.2: -2~+3dBm
Remarks N/A


to the NCP.
1) The needed materials for the test include an SDH analyzer, an
optical fiber jumpers and the board under test. The needed materials
for the test include an SDH analyzer, an optical power meter, a variable
optical attenuator, a 50/50 coupler, optical fiber jumpers and the board
under test.
Figure 1-76 Configuration of the Drop SAUC Receiver Sensitivity
SDH Variable optical 50/50 A1 Ra
analyzer attenuator coupler D1 Sd
Test Process Optical SAUC

power A2
meter D2
2. Test method:
SDH analyzer can send the STM-16 signal to SAUC and the board
backplane cross-connects and self-loops.
seconds.
receiver sensitivity of the SAUC board.
I16: ≤-18dBm
S16.1: ≤-18dBm
Acceptance
S16.2: ≤-18dBm
Criteria
L16.1: ≤-27dBm
L16.2: ≤-28dBm
Remarks N/A

to the NCP.
1) The needed materials for the test include an SDH analyzer, an
optical power meter, an optical amplifier, a variable optical attenuator,
a 50/50 coupler, optical fiber jumpers and the board under test.
Figure 1-77 Configuration of the Drop SAUC Receive Overload
Optical Power
Variabl
e Ra
SDH 50/50 A1
OA optical
analyzer coupler D1 Sd
attenua
tor
SAUC
Optical A2
Test Process power D2
meter
2. Test method:
the SDH analyzer can send the STM-16 signal to SAUC and the board
optical power with the bit error rate (BER) of 10-10.
receive overload optical power of the SAUC board.
I16: ≥-3dBm
S16.1: ≥0dBm
Acceptance
S16.2: ≥0dBm
Criteria
L16.1: ≥-9dBm
L16.2: ≥-9dBm
Remarks N/A

to the NCP.
1) The needed materials for the test include an SDH analyzer, a
variable optical attenuator, optical fiber jumpers and the board under
test.
Figure 1-78 Configuration of the Drop SAUC Maximum Output Jitter
A1 Ra
SDH analyzer Sd
D1
SAUC
Test Process
Ra
A2
Sd
D2
2. Test method:
backplane self-loops, or cross-connects and loops back.
2) Access the output jitter test function from the SDH analyzer. Set
the filter to B1 and B2 respectively for one minute. Read and record
the maximum output jitter from the SDH analyzer.
B1 (20k~80 MHz):
Acceptance ≤0.30UIp-p
Criteria B2 (4M~80 MHz):
≤0.10UIp-p
Remarks N/A

to the NCP.
1) The needed materials for the test include an SDH analyzer, a
variable optical attenuator, a de-multiplexer, optical fiber jumpers and
the board under test.
Figure 1-79 Configuration of the Drop SAUC Input Jitter Tolerance
A1 Ra
SDH analyzer Sd
D1
SAUC
Test Process
Ra
A2
Sd
D2
2. Test method:
backplane self-loops or cross-connects or loops back.
2) Set the SDH analyzer to conduct the automatic test of input jitter
tolerance.
3) The test is completed. Please record the test result.
A2
A1
f0 f1 f
Acceptance
Criteria Table 1-10 Input Jitter Tolerance Filter and Indices at the STM-N
Interface
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remarks N/A

to the NCP.

2. Disconnect the short-circuit fiber, access the board under test, and
Test Process adjust the optical attenuator, so that the tested board can receive a
proper optical power. Make the input optical power of the SDH analyzer
equal to that of the self-looped analyzer in Step 1. Configure the test
environment according to the connection for testing input jitter.

ITU-T G.958.
ITU-T G.8251.

1.13 COM/COMB—Eight-Channel Client Service

Mixed Access Board

to the NCP.
1) The needed test materials include an SDH signal generator, an
optical power meter, optical fiber jumpers and the COM board under
test.
Figure 1-80 Configuration of the Drop COM Average Transmit
Optical Power
SDH signal A1 Ra
generator D1 Sd
Optical
Test Process power
meter COM
A2
Ra
D2 Sd
2. Test method:
the SDH signal generator can send the STM-16 signal to COM and the
board backplane cross-connects self-loops.
GE service:
1000BASE-SX: -9.5~-3dBm
1000BASE-(LH,LH1,LH2): -9.5~-3dBm
Acceptance 1000BASE-EX: 0~+5dBm
Criteria SDH service:
I16: -10~-3dBm
S16.1: -5~0dBm
S16.2: -5~0dBm
L16.1: -2~+3dBm
L16.2: -2~+3dBm
Remarks

Test
Item
Prerequi
sites
the NCP.
1) The needed test materials include an SDH analyzer, an optical power
meter, optical fiber jumpers, a variable optical attenuator, a 50/50 coupler,
and the board under test.
Figure 1-81 Configuration of the Drop COM Receiver Sensitivity
SDH Variable optical 50/50 A1 Ra

analyzer attenuator coupler D1 Sd
Optical COM
Test power A2
meter D2
Process
2. Test method:
SDH analyzer can send the STM-16 signal to COM and the board
2) Adjust the variable optical attenuator to gradually decrease the optical
power with the bit error rate (BER) of 10-10 and test for 10 seconds.
The optical power read from the meter plus 1dB indicates the receiver
sensitivity at the line side of the COM board.
GE service:
Accepta
nce
Criteria
SDH service:
I16: ≤-18dBm
S16.1: ≤-18dBm
S16.2: ≤-18dBm
L16.1: ≤-27dBm
L16.2: ≤-28dBm
Remark
s

to the NCP.
1) The needed test materials include an SDH analyzer, an optical
power meter, an optical amplifier, optical fiber jumpers, a variable
optical attenuator, a 50/50 de-multiplexer, and the COM board under
test.
Figure 1-82 Configuration of the Drop COM Receive Overload
Optical Power
Variable Ra
SDH 50/50 A1
OA optical
attenuator
Test Process Optical A2

COM
power D2
meter
2. Test method:
the SDH analyzer can send the STM-16 signal to COM and the board
backplane cross-connects self-loops.
optical power with the BER of 10-10.
receive overload optical power at the line side of the COM board.
GE service:
Acceptance 1000BASE-EX: ≥-10dBm
Criteria SDH service:
I16: ≥-3dBm
S16.1: ≥0dBm
S16.2: ≥0dBm
L16.1: ≥-9dBm
L16.2: ≥-9dBm
Remarks

to the NCP.
1) The needed test materials include an SDH analyzer, optical fiber
jumpers, a variable optical attenuator and the board under test.
Figure 1-83 Configuration of the Drop COM Maximum Output Jitter
A1 Ra
SDH analyzer Sd
D1
COM
Test Process Ra
A2
Sd
D2
2. Test method:
backplane self-loops or the backplane cross-connects and loops back.

Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
65kHz~1.3MHz 0.10 I
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
Remarks

to the NCP.
1) The needed test materials include an SDH analyzer, a variable
optical attenuator, a de-multiplexer, optical fiber jumpers, and the
board under test.
Figure 1-84 Configuration of the Drop COM Input Jitter Tolerance
A1 Ra
SDH analyzer Sd
D1
COM
Test Process
Ra
A2
Sd
D2
2. Test method:
backplane self-loops or cross-connects, loops back.
2) Set the SDH analyzer to conduct the automatic test of input jitter
tolerance.
Acceptance
Meet the requirements of ITU-T G.783
Criteria
Remarks N/A

to the NCP.
1) The needed test materials include an SDH analyzer, a variable
optical attenuator, a de-multiplexer, optical fiber jumpers, and the
board under test.
Figure 1-85 Configuration of the Drop COM Jitter Transfer Function
A1 Ra
SDH analyzer Sd
D1
COM
Ra
A2
Sd
D2
2. Test method:
Test Process
backplane self-loops or cross-connects, loops back.
2) Disconnect the board. Use the short-circuit fiber to self-loop the
SDH analyzer. Then adjust the optical attenuator, so that the tested
board can receive a proper optical power. Perform the jitter transfer
function of the analyzer to calibrate the optical power.
3) Disconnect the short-circuit fiber, access the board under test,
and adjust the optical attenuator 1, so that the tested board can
receive a proper optical power. Then adjust optical attenuator 2, so
that the tested board can still receive a proper optical power.
4) Conduct the test with the jitter transfer function of the SDH
analyzer.
Acceptance
Criteria
Remarks N/A
1.14 SMUB/CSC—SDH Service Aggregation Client

Board

to the NCP.
1) The needed materials include an optical power meter, optical fiber
jumpers and the SMUB/C board under test.
at the Client Side of SMUB/C
OUT
Optical
power
Sa meter
Test Process
SMUB/C
IN
Rd
2. Test method:
1) Create a test environmen according to the above figure.
SDH service:
I64.1: -6~-1dBm
S64.2a: -5~-1dBm
Acceptance S64.2b: -1~+2dBm
Criteria S64.2c: -2~+2dBm
10GE service:
10GBASE-ER/EW : -4.5~ +4 dBm
Remarks

to the NCP.
1) The needed materials include an SDH/IP analyzer, an optical
power meter, a variable optical attenuator, a 50/50 coupler, optical
fiber jumpers and the SMUB/C board under test.
Figure 1-87 Configuration of the Receiver Sensitivity at the Client
Side of SMUB/C
Variable
SDH 50/50 A1 Ra
optical Backpl
analyzer coupler D1 Sd ane
attenuator electric
al
SMUB/C cross-
connec
Optical power A8
Ra t
Test Process meter
loopba
Sd ck
D8
2. Test method:
1) Create a test environmen according to the above figure. The
SDH/IP analyzer sends the STM-64/10GE signal to the SMUB/C
board under test.
seconds.
receiver sensitivity at the client side of the SMUB/C board.
SDH service:
I64.1: ≤-11dBm
S64.2a: ≤-18dBm
Acceptance S64.2b: ≤-14dBm
Criteria S64.2c: ≤-26dBm
10GE service:
10GBASE-LR/LW: ≤-12.6dBm
10GBASE-ER/EW: ≤-14.1dBm
Remarks

Test
Minimum Overload Optical Power
Item
Prerequi
sites
the NCP.
1) The needed materials include an SDH analyzer, an optical power
meter, a variable optical attenuator, an optical amplifier, a 50/50 coupler,
optical fiber jumpers and the SMUB/C board under test.
Figure 1-88 Configuration of the Receive Overload Optical Power at the
Client Side of SMUB/C
Variable Ra
SDH 50/50 A
OA optical
analyzer coupler D Sd Backpl
attenuator ane
electri
cal
Test SMUB/C cross-
Optical conne
power ct
loopba
Process meter ck
2. Test method:
1) Create a test environmen according to the above figure. The SDH
analyzer sends the STM-64 signal to the SMUB/C board under test.
2) Adjust the variable optical attenuator to gradually increase the optical
power with the BER of 10-10 and test for 10 seconds.
receive overload optical power at the client side of the SMUB/C board.
SDH service:
I64.1: ≥-1dBm
Accepta S64.2a: ≥ -8dBm
nce S64.2b: ≥-1dBm
Criteria S64.2c: ≥-9dBm
10GE service
Remark
s

to the NCP.
1) The needed materials include an SDH analyzer, a variable optical
attenuator, optical fiber jumpers and the board under test.
Figure 1-89 Configuration of the Output Jitter at the Client Side of
SMUB/C
Client side S Backp

lane
access M electri
cal
Test Process SDH analyzer U cross-
conne
B/ ct
loopb
C ack
2. Test method:
the SDH analyzer can send the SDH signal to SMUB/C.

Test Filter
INTERFACE of Jitter
500Hz~1.3MH 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI

the test..
Remarks

to the NCP.
attenuator, a de-multiplexer, optical fiber jumpers and the board under
test.
Figure 1-90 Configuration of the Input Jitter Tolerance at the Client
Side of SMUB/C
Client side S Backplan

e
access M electrical
Test Process cross-
SDH analyzer U connect
loopback
B/
C
2. Test method:
the SDH analyzer can send the STM-64 signal to SMUB/C.
2) Conduct the test with the automatic input jitter tolerance testing
function of the SDH analyzer.
A2
A1
f0 f1 f
Acceptance
Criteria
Interface
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remarks N/A

to the NCP.
attenuator, a de-multiplexer, optical fiber jumpers and the board under
test.
Figure 1-91 Configuration of the Jitter Transfer Function at the Client
Side of SMUB/C
Client side S
access M
Backplan
e
electrical
SDH analyzer U cross-
Test Process B/
connect
loopback
2. Test method:
the SDH analyzer can send the STM-64 signal to SMUB/C. Conduct
the test with the automatic input jitter tolerance testing function of the
SDH analyzer.
2) Conduct the test with the automatic input jitter tolerance testing
function of the SDH analyzer.
Acceptance
Criteria
Remarks N/A
1.15 SMUB/LS1/LS2—SDH Service Aggregation Line

Board

to the NCP.
1) The needed materials include an optical power meter, optical fiber
jumpers and the board under test.
at the Line Side of SMUB/L
OUT
Optical
power
San meter
Test Process
SMUB/L
IN
Rdn
2. Test method:
Acceptance : ERZ:-5~-2dBm
Criteria NRZ:-3~+1 dBm
Remarks N/A

to the NCP.
meter, a variable optical attenuator, a 50/50 coupler, optical fiber
jumpers and the SMU board under test.
of SMUB/L
Variable
SDH Bo OUT 50/50
optical
analyzer ard Electr San coupler
S attenuator
at ical
M
the cross
U Optical power
conn
Test Process clie B/ meter
ection IN
nt L Rdn
sid
e
2. Test method:
analyzer sends the SDH signal to the board at the client side.
seconds.
receiver sensitivity at the line side of the SMUB/L board.
optical interface at the line side:
Acceptance
PIN: ≤--14dBm(EOL), ≤--17(BOL,OTU2), ≤--16(BOL,OTU2e)
Criteria
APD: : ≤-21dBm: (EOL), ≤--24(BOL,OTU2), ≤--22(BOL,OTU2e)
Remarks

Test
Minimum Overload Optical Power
Item
Prerequi
sites
the NCP.
meter, a variable optical attenuator, an optical amplifier, a 50/50
de-multiplexer, optical fiber jumpers and the STM board under test.
Figure 1-94 Configuration of the Receive Overload Optical Power at the
Line Side of SMUB/L
Variable
SDH Bo OUT 50/50
optical
analyzer ard Electr San coupler
S attenuator
at ical
M
Test the cross
Optical power
conn U
Process clie B/ meter
ection IN
nt L Rdn
sid
e
2. Test method:
analyzer sends the SDH signal to the board at the client side.
2) Adjust the variable optical attenuator to gradually increase the optical
power with the bit error rate (BER) of 10-10 and test for 10 seconds.
The optical power read from the meter minus 0.5dB indicates the receive
overload optical power at the line side of the SMUB/L board.
Accepta optical interface at the line side:

nce PIN: ≥0dBm
Criteria APD: ≥-9dBm
Remark
s

Test Item Central Wavelength Deviation
to the NCP.
1) The needed materials include a multi-wavelength meter, optical
fiber jumpers and the board under test.
Figure 1-95 Configuration of the Central Wavelength at the Line Side
of SMUB/L
OUT Optical multi-

wavelength
San meter
SMUB/L
Test Process
IN
Rdn
2. Test method:
2) Read the actual central wavelength value (unit: THz) from the
multi-wavelength meter and record it.
3) The difference between the actual central wavelength and the
nominal central wavelength is the central wavelength deviation (unit:
GHz).
Acceptance ≤12.5GHz (100GHz wavelength interval)

Criteria ≤5GHz (50GHz wavelength interval)
Remarks
1.15.1.5 Maximum 20dB Spectral Width

Test Item Maximum 20dB Spectral Width
to the NCP.
1) The needed materials include a spectrometer, optical fiber
of SMUB/L
OUT Spectrome
San ter
SMUB/L
Test Process
IN
Rdn
2. Test method:
3) Set the resolution bandwidth of the spectrometer to the minimum
value, and the wavelength scanning range is 2nm. Read the test result
from the meter with the automatic -20dB spectral width testing
function, and record it.
Criteria RZ≤0.4nm
Remarks
1.15.1.6 Minimum SMSR

Test Item Minimum SMSR
to the NCP.
1) The needed materials include a spectrometer, optical fiber
of SMUB/L
OUT Spectrome
San ter
SMUB/L
Test Process
IN
Rdn
2. Test method:
3) Set the resolution bandwidth of the spectrometer to 0.1nm. Read
the test result from the meter with the automatic SMSR testing
function, and record it.
Acceptance
optical interface at the line side: ≥35dB
Criteria
Remarks
1.16 CD2/M2&M3CO2/M1&M2&M3&M4CQ2/M1CX2—1
0G Service Access Board (at the Client Side)
1.16.1 CD2/CO2/CQ2 Board Client-Side Optical Interface

Test
Item
Prerequi
sites
NCP.

SDH signal generator to provide signals for the board; the backplane
cross-connects or loops back.
Figure 1-98 Configuration of the Optical Output Power at the Client Side of
CD2/CO2/CQ2
SDH signal A1 Ra
generator D1 Sd
Optical
power CO2/CQ
Test
meter Ra 2
Process A2
D2 Sd
optical power.
Output Power.
SDH service:
I64.1: -6~-1dBm
S64.2a: -5~-1dBm
Accepta
S64.2b: -1~+2dBm
nce
S64.2c: -2~+2dBm
Criteria
10GE service:
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-99 CD2/CO2/CQ2 Optical Receiver Sensitivity Connection
Variable
SDH 50/50 A1 Ra
optical
attenuator
Optical CO2/CQ2
power A2
meter D2
Test
2. The SDH analyzer sends test signals to the board under test; the
Process
backplane cross-connects or loops back.
analyzer.
SDH service:
I64.1: ≤-11dBm
S64.2a: ≤-18dBm
Accepta
S64.2b: ≤-14dBm
nce
S64.2c: ≤-26dBm
Criteria
10GE service:
10GBASE-LR/LW: ≤-12.6dBm
10GBASE-ER/EW : ≤-14.1dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-100 CD2/CO2/CQ2 Connection for testing receive overload point
at the client side
Variabl
e Ra
SDH 50/50 A1
OA optical
attenua
tor
CO2/CQ2
Optical A2
Test power D2
meter
Process
SDH service:
I64.1: ≥-1dBm
S64.2a: ≥ -8dBm
Accepta
S64.2b: ≥-1dBm
nce
S64.2c: ≥-9dBm
Criteria
10GE service:
10GBASE-ER/EW : ≥-1 dBm
Remark
s
reaches 10-12.

Test
Input Jitter Tolerance
Item
Prerequi
sites
NCP.
1. Self-loop the SDH analyzer with a short-circuit fiber, and then calibrate
the SDH analyzer. Pleased be noticed that you should control the receive
optical power of the meter to avoid damage to the receive interface from
strong light.
Test 2. Disconnect the short-circuit fiber, access the board under test, and
Process adjust the optical attenuator, so that the tested board can receive a proper
optical power. Make the input optical power of the SDH analyzer equal to
that of the self-looped analyzer in Step 1. Configure the test environment.
3. Test certain items with the input jitter tolerance test template of the SDH
analyzer and observe whether the test results are above the template.
Figure 1-101 Input jitter tolerance of CD2/CO2/CQ2 input interface
A1 Ra
SDH analyzer
D1 Sd
CO2/CQ2
Ra
A2
Sd
D2
A
Accepta
nce A2
Criteria
A1
f0 f1 f
Table 1-14 Input Jitter Tolerance Filter and Indices at the STM-N Interface
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
1. Clean the optical connector and ensure good connection before the
Remark test..
s 2. Ensure that the input optical power of the board is consistent with that of
the meter.

to the NCP.
1. Configure the test environment according to the following figure,
and use the SDH analyzer to provide modulation signals to the board
under test.
Figure 1-102 Output Jitter Configuration
A1 Ra
SDH analyzer
D1 Sd
CO2/CQ2
Ra
A2
Sd
Test Process D2
the optical power to meet the requirements of the receive optical power
of the board under test.

Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
test..
Remarks
2. If o.171 and o.172 options are both available for the filter template,
select o.172 for the test.

to the NCP.


ITU-T G.958.
ITU-T G.8251.

1.17 LD2/M2LD2B/M2&M3LO2/M1&M2&M3&M4LQ2—1
0G Service Access Board (at the Line Side)

Test
Item
Prerequi
sites
NCP.
1. Configure the test environment according to the following figure, and

use the OTN signal generator to provide signals to the board under test.
Figure 1-103 LD2/LD2B/LO2/LQ2 connection for testing Optical Output
Power at line side
Test
Process
2. Set the OTN signal generator to send signals to the board under test,
and adjust the optical power to meet the requirements of receive optical
power.
Output Power.
Accepta
nce -5~+1d B m
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-104 LD2/LD2B/LO2/LQ2 Optical Receiver Sensitivity Connection
OUT1 OTN
San analyzer
IN1 50/50 Variable
Rdn coupler optical
LO2
LQ2 Optical attenuator
OUT2 power
San meter
IN2
Rdn
Test
Process
2. The OTN analyzer sends signals to the board under test.
analyzer.
Accepta
PIN: ≤-14dBm
nce
APD: ≤-21dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-105 Configuration of the Receive Overload Point at the Line
Interface of LO2/LQ2
Test
Process
2. Set the OTN analyzer correctly so that it can send signals to the board
under test.
Accepta
PIN: ≥0 dBm
nce
APD: ≥-9 dBm
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
use the OTN signal generator to provide modulation signals to the board
under test.
OUT1
Optical multi-
wavelength
San meter
IN1
OTN signal
LO2 Rdn generator
LQ2
OUT2
Test San
IN2
Process
Rdn
and adjust the optical power to meet the requirements of LO2/LQ2 receive
optical power.
Accepta
nce
Criteria

to the NCP.

and use the OTN signal generator to provide modulation signals to the
board under test.
Figure 1-107 Spectral Width Connection
OUT1 spectromet
San er
IN1
OTN signal
LO2 Rdn generator
LQ2 OUT2
Test Process San

IN2
Rdn
reading.
spectral width.
Criteria RZ≤0.4nm
Remarks
1.17.1.6 SMSR
Test Item SMSR
to the NCP.
Configure the test environment according to the following figure, and

under test.
OUT1 spectromet
San er
IN1
OTN signal
LO2 Rdn generator
LQ2 OUT2
San
IN2
Test Process
Rdn
(dB).
Acceptance
SMSR ≧35dB
Criteria
1.18 M1&M2TST3—40G Transponder

Test
Item
Prerequi
sites
NCP.
1. Configure the test environment according to the following figure and
use the SDH/OTN signal generator to send signals to the board.
Figure 1-109 TST3 connection for testing Optical Output Power at line side
Variable C L Optical power
SDH/OTN S Sn
optical R T meter
analyzer TST3 L
attenuat C
or T R
Rn
Test
Process
2. Set the SDH/OTN signal generator to send test signal to the board
under test, and adjust the optical power to meet the requirements.
Output Power.
Accepta
P-DPSK: -5~+5dBm
nce
RZ-DQPSK: -10~+5dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-110 TST3 Optical Receiver Sensitivity Connection
C L
Optical S Sn Variable
SDH/OTN R T
attenuator TST3 L Optical
Analyzer C 50/50
R attenuator
T Rn coupler
Optical
power meter
Test 2. The SDH/OTN analyzer sends test signal to the board under test.
Process 3. Adjust the variable optical attenuator to gradually increase the
analyzer.
Accepta
P-DPSK: ≤-14 dBm
nce
RZ-DQPSK: ≤-14 dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Interface of TST3
C L Variable
Optical S Sn
SDH/OTN R T Optical
attenuator TST3 L
Analyzer C 50/50 attenuator
T R
Rn coupler
Test
Optical
Process power meter
2. Set the SDH/OTN analyzer correctly and send signals to the board
under test.
Accepta
P-DPSK: ≥0 dBm
nce
RZ-DQPSK: ≥0 dBm
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
use the SDH/OTN signal generator to send modulation signals to the board
under test.
C L Optical multi-
SDH/OTN S Sn
Optical R T wavelength meter
TST3 L
Analyzer attenuator C
T R
Rn
Test
Process 2. Set the SDH/OTN signal generator to send signals to the board under
test, and adjust the optical power to meet the requirements of TST3 receive
optical power.
Accepta
nce
Criteria

to the NCP.
1. Configure the test environment according to the following figure
and use the SDH/OTN signal generator to send modulation signals to
C L
SDH/OTN S Sn Spectrometer
Optical R T
analyzer TST3 L
attenuator C
T R
Rn
Test Process
reading.
spectral width.
Acceptance P-DPSK: 0.7nm

Criteria RZ-DQPSK: NA
Remarks
1.18.1.6 SMSR
Test Item SMSR
Prerequisites configured properly.
the NCP.
Configure the test environment according to the following figure and use the
SDH/OTN signal generator to send modulation signals to the board under
test.
C L
SDH/OTN Optical S Sn Spectrometer
R T
attenuator TST3 L
Analyzer C
T R
Rn
Test Process
Set the display wavelength range of the spectrometer and set the resolution
of the spectrometer to the minimum value. Adjust the amplitude scale of the
spectrometer so that the primary longitudinal mode and the side mode can
be displayed with proper amplitude in the center of the screen to facilitate
Calculate the difference between two power values to get the SMSR (dB).
Acceptance
SMSR ≧35dB
Criteria
Remarks longitudinal mode to the optical power of the most significant side mode in
full modulation under the worst reflection condition.

Test
Item
Prerequi
sites
NCP.

Figure 1-115 Configuration of the Optical Output Power at the Client Side
of TST3
C L Sn
S R
TST3 T
Optical power RC L
Test
meter T R
Process Rn
2. Set the SDH/OTN signal generator to send signals to the board under
test, and adjust the optical power to meet the requirements of receive optical
power.
Output Power.
SDH service (40GPOS):

Accepta
VSR2000-3R2: 0~+3dBm
nce
40GE service:
Criteria
40GBASE-LR4: -7~+2.3dBm (single channel); -1~+8.3dBm(total power)
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-116 TST3 Optical Receiver Sensitivity Connection
SDH/OT C L Sn
Variable S R
N 50/50 T optical
optical C TST3 L
attenuator R T R
Rn
Optical power
meter
Test
Process 2. The SDH/OTN analyzer sends signals to the board under test.
analyzer.
SDH service:
Accepta VSR2000-3R2: ≤-5dBm
nce 40GE service:
Criteria 40GBASE-LR4: ≤-13.7dBm(single channel), refer to the test method of CS4
board.
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-117 Connection for testing receive overload point at the client side
SDH/OT C L Sn
Variable S R
N 50/50 T optical
optical C TST3 L
attenuator R T R
Rn
Test
Process Optical power
meter
2. The SDH/OTN analyzer sends signals to the board under test.

SDH service: VSR2000-3R2: ≥+3dBm

Accepta
40GE service:
nce
40GBASE-LR4: ≥+2.3dBm(single channel). The overload optical power is
Criteria
not recommended to test;
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
strong light.
Figure 1-118 Input jitter tolerance of SOTU10G input interface
Optical Rd Optical
n Sd
SDH analyzer attenuat TST3 attenuator
or 1 2
A2
Accepta
nce
Criteria
A1
f0 f1 f
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remark test..
the meter.

to the NCP.

under test.
Optical Rd Optical
n Sd
SDH analyzer attenuat TST3 attenuator
or 1 2

Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
test..
Remarks

to the NCP.


ITU-T G.958.
ITU-T G.8251.

1.19 M1&M2MQT3—Four-Channel 10G Aggregation

Board

Test
Item
Prerequi
sites
NCP.

Figure 1-120 MQT3 connection for testing Optical Output Power at line
side
IP/SDH/ S C1R
Optical LT
OTN R C1T Optical power
attenuator Sn
Analyzer C2R MQT 3 meter
C2T
Test C3R
Process C3T LR
C4R
C4T Rn
Output Power.
Accepta
P-DPSK: -5~+5dBm
nce
RZ-DQPSK: -10~+5dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-121 MQT3 Optical Receiver Sensitivity Connection
IP/ SDH
C1
/ OTN Optical S
Analyzer R LT Variable
attenuator R C1T
C2 Sn Optical
MQT 3
R attenuator
C2T
C3 50 / 50
R coupler
C3T LR
C4
R
C4T Rn Optical power
meter
Test
2. The SDH/OTN analyzer sends test signal to the board under test.
Process
analyzer.
Accepta
P-DPSK: ≤-14 dBm
nce
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Interface of MQT3
IP/ SDH
C1
/ OTN Optical S
Analyzer R LT Variable
attenuator R C1T
C2 Sn Optical
MQT 3
R attenuator
C2T
C3 50 / 50
R coupler
Test C3T LR
C4
R
Process C4T Rn Optical power
meter
under test.
Accepta
P-DPSK: ≥0 dBm
nce
RZ-DQPSK: ≥0 dBm
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.

under test.
C L Optical multi-
SDH/OTN S Sn
Optical R MQT3 T wavelength meter
Analyzer attenuator C L
T R
Rn
Test
Process 2. Set the SDH/OTN signal generator to send signals to the board under
test, and adjust the optical power to meet the requirements of MQT3 receive
optical power.
Accepta
nce
Criteria

to the NCP.

C L
Optical R T
MQT3 L
T R
Rn
Test Process
reading.
spectral width.
Acceptance P-DPSK: 0.7nm

Criteria RZ-DQPSK: NA
Remarks
1.19.1.6 SMSR
Test Item SMSR
Prerequisites configured properly.
the NCP.
Configure the test environment according to the following figure and use
the SDH/OTN signal generator to send modulation signals to the board
under test.
C L
Optical R T
MQT3 L
T R
Rn
Test Process
resolution of the spectrometer to the minimum value. Adjust the amplitude
scale of the spectrometer so that the primary longitudinal mode and the
side mode can be displayed with proper amplitude in the center of the
screen to facilitate observation and reading.
Acceptance
SMSR ≧35dB
Criteria
Remarks longitudinal mode to the optical power of the most significant side mode in
full modulation under the worst reflection condition.

Test
Item
Prerequi
sites
NCP.

of MQT3
Optical S C1R
IP LT
attenuator R C1T
SDH/OTN C2R MQT 3 Sn
Analyzer
C2T 光 Optical
光光光
Test C3R attenuator
Optical power
C3T
Process meter LR
C4R
C4T Rn
power.
Output Power.
SDH service:
I64.1: -6~-1dBm
S64.2a: -5~-1dBm
Accepta S64.2b: -1~+2dBm
nce 10GE service:
Criteria 10GBASE-LR/LW: -8.2~ +0.5 dBm
10GFC service:
1200-SM-LL-L: -8.2~ +0.5 dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-127 MQT3 Optical Receiver Sensitivity Connection
Variable 50/ 50 S C1R

IP optical coupler LT
R C1T
/SDH/OTN attenuator
C2R MQT 3 Sn
Analyzer
C2T optical
C3R attenuator
Optical power meter
C3T
LR
C4R
C4T Rn
Test
Process
analyzer.
SDH service:
I64.1: ≤-11dBm
S64.2a: ≤-18dBm
Accepta S64.2b: ≤-14dBm
nce 10GE service:
Criteria 10GBASE-LR/LW: ≤ -14dBm
10GBASE-ER/EW : ≤-14dBm
10GFC service:
1200-SM-LL-L: ≤ -14dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-128 MQT3 Connection for testing receive overload point at the
client side
Variable 50/ 50 S C1R

R C1T
/SDH/OTN attenuator
C2R MQT 3 Sn
Analyzer
C2T optical
Test C3R attenuator
Process Optical power meter
C3T
LR
C4R
C4T Rn

SDH service:
I64.1: ≥-1dBm
S64.2a: ≥ -8dBm
Accepta S64.2b: ≥-1dBm
nce 10GE service:
Criteria 10GBASE-LR/LW: ≥+0 .5dBm
10GFC service:
1200-SM-LL-L: ≥+0 .5dBm
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
the SDH/OTN analyzer. Pleased be noticed that you should control the
receive optical power of the meter to avoid damage to the receive interface
from strong light.
Test
adjust the optical attenuator, so that the tested board can receive a proper
Process
3. Test certain items with the input jitter tolerance test template of the
SDH/OTN analyzer and observe whether the test results are above the
template.
Figure 1-129 MQT3 input jitter tolerance of input interface
Optical Ra San Optical

SDH/OTN
attenuat MQT3 attenuator
analyzer
or 1 2
A2
Accepta
nce
Criteria
A1
f0 f1 f
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remark test..
the meter.

to the NCP.

Optical Ra San Optical

SDH/OTN
attenuat MQT3 attenuator
analyzer
or 1 2
Test Process 2. Set the SDH/OTN signal generator to allow the SDH output signals
to access the receive optical interface of the board under test and adjust
STM Peak-to-Peak
Test Filter
INTERFACE Value of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
test..
Remarks

to the NCP.

calibrate the SDH/OTN analyzer. Pleased be noticed that you should
control the receive optical power of the meter to avoid damage to the
receive interface from strong light.
proper optical power. Make the input optical power of the SDH
3. Test certain items and templates with the SDH/OTN analyzer and
ITU-T G.958.
ITU-T G.8251.

1.20 CS3 Board
1.20.1 M2&M3CS3 Board Client-Side Optical Interface

Test
Item
Prerequi
sites
NCP.

SDH signal generator to provide signals for the board; the backplane
cross-connects or loops back.
of CS3
SDH signal A1 Ra
generator D1 Sd
Optical
power
Test meter CS3
Process
optical power.
Output Power.
SDH service (40GPOS):

Accepta VSR2000-3R2: 0~+3dBm
nce 40GE service:
Criteria 40GBASE-LR4: -7~+2.3dBm(single channel). Refer to the CS4 board test
method.
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-132 CS3 Optical Receiver Sensitivity Connection
Variable
SDH 50/50 A1 Ra
optical
attenuator
Optical CS3
power
meter
Test
Process
analyzer.
SDH service:
Accepta VSR2000-3R2: ≤-5dBm
nce 40GE service:
Criteria 40GBASE-LR4: ≤-13.7dBm(single channel). For the test, refer to the CS4
board test method.
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-133 CS3 Connection for testing receive overload point at the
client side
Variabl
e Ra
SDH 50/50 A1
OA optical
attenua
tor
CS3
Optical
Test power
meter
Process
SDH service: VSR2000-3R2: ≥+3dBm

Accepta
40GE service:
nce
40GBASE-LR4: ≥+2.3dBm(single channel). It is not recommended to test
Criteria
this specification. Refer to the CS4 board test method.
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
strong light.
Figure 1-134 CS3 input jitter tolerance of input interface
A2
Accepta
nce
Criteria
A1
f0 f1 f
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remark test..
the meter.

to the NCP.

and use the SDH analyzer to provide modulation signals to the board
under test.
Test Process

Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
test..
Remarks

to the NCP.


ITU-T G.958.
ITU-T G.8251.

1.21 M2&M3LS3 Board
1.21.1 LS3 Board Line-Side Optical Interface

Test
Item
Prerequi
sites
NCP.

use the OTN signal generator to provide signals to the board under test.
Figure 1-136 LS3 connection for testing Optical Output Power at line side
Test
Process
and adjust the optical power to meet the requirements of receive optical
power.
Output Power.
Accepta
RZ-DQPSK: -10~5dBm
nce
P-DPSK: -5~+1dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-137 LS3 Optical Receiver Sensitivity Connection
OUT1 OTN
San analyzer
IN1 50/50 Variable
Rdn coupler optical
LS3 Optical attenuator
power
meter
Test
Process
2. The OTN analyzer sends signals to the board under test.
analyzer.
Accepta
nce
P-DPSK: ≤-14 dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Interface of LS3
Test
Process
2. Set the OTN analyzer correctly so that it can send signals to the board
under test.
Accepta
RZ-DQPSK: ≥0 dBm
nce
P-DPSK: ≥0 dBm
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.

under test.
Test
Process
2. Set the OTN signal generator to send test signals to the board under
optical power of LS3.
Accepta
nce
Criteria

to the NCP.

and use the OTN signal generator to provide modulation signals to the
board under test.
Test Process
reading.
spectral width.
Acceptance
≤0.6nm
Criteria
Remarks
1.21.1.6 SMSR
Test Item SMSR
to the NCP.
Configure the test environment according to the following figure, and

under test.
Test Process
(dB).
Acceptance
SMSR ≧35dB
Criteria
1.22 FCA—FC Service Access Board

Test
Item
Prerequi
sites
NCP.

Figure 1-142 FCA connection for testing Optical Output Power at line side
A1 Ra Optical
OUT
Sd power
D1 San meter
IP data
service signal FCA
Test generator A8 Ra
Process D8 Sd IN
Rdn
2. Set the IP signal generator to send the test signals to the board under
test, and adjust the optical power to meet the requirements for the receive
optical power.
Output Power.
Accepta
nce -5~+1d B m
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-143 Optical Receiver Sensitivity Connection
A1 Ra Variable
OUT 50/50
Sd optical
D1 San coupler
attenuator
IP analyzer FCA
A8 Ra Optical
D8 Sd IN power meter
Rdn
Test
Process
analyzer.
Accepta
PIN: ≤-14dBm
nce
APD: ≤-21dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Interface of FCA
Variabl
A1 Ra e
OUT Optical 50/50
Sd OA optical
D1 San filter coupler
attenua
tor
IP analyzer FCA Optical
Test A8 Ra power
D8 Sd IN meter
Process
Rdn
test.
Accepta
PIN: ≥0 dBm;
nce
APD: ≥-9 dBm.
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.

Optical
A1 Ra
OUT multi-
D1 Sd wavelength
San
IP data meter
service signal FCA
generator A8 Ra
D8 Sd IN
Test
Rdn
Process
power of FAC.
Accepta
nce
Criteria

to the NCP.

the IP signal generator to provide modulation signals for the board
under test.
A1 Ra
OUT Spectrome
D1 Sd ter
San
IP data
service signal FCA
generator A8 Ra
Test Process D8 Sd IN
Rdn
reading.
spectral width.
Criteria RZ≤0.4nm
Remarks
1.22.1.6 SMSR
Test Item SMSR
the NCP.

A1 Ra
OUT Spectrome
D1 Sd ter
San
IP data
service signal FCA
generator A8 Ra
D8 Sd IN
Test Process
Rdn
resolution of the spectrometer to the minimum value. Adjust the amplitude
scale of the spectrometer so that the primary longitudinal mode and the
side mode can be displayed with proper amplitude in the center of the
screen to facilitate observation and reading.
Acceptance
SMSR ≧35dB
Criteria

Test
Item
Prerequi
sites
NCP.

of FAC
IP data Ra
A1 OUT
service signal
generator D1 Sd
San
Optical
Optical
FCA attenuat
Test power
Ra or
Process meter A8
Sd IN
D8
Rdn
power.
Output Power.
FC service:
100-SM-LC-L: -9~-3 dBm
200-SM-LC-L : -11~-3dBm
400-SM-LC-L: -8~-1dBm
Accepta
GE service:
nce
1000BASE-SX: -9.5~-3dBm
Criteria
1000BASE-(LH,LH1,LH2): -9.5~-3dBm
FC service: : 1000BASE-EX: 0~+5dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-149 FCA Optical Receiver Sensitivity Connection
Variable
50/50 A1 Ra OUT
IP analyzer optical
coupler D1 Sd San
attenuator Optical
FCA attenuat
Optical
Ra or
power A8 IN
Sd Rdn
meter D8
Test
Process 2. The IP analyzer sends test signals to the board under test.
analyzer.
FC service:
100-SM-LC-L : ≤-18dBm
200-SM-LC-L: ≤-18dBm
GE service:
Accepta
nce
Criteria
FC service: : 1000BASE-EX: ≤-30dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-150 FCA Connection for testing receive overload point at the
client side
Variable
50/50 A1 Ra OUT
IP analyzer optical
coupler D1 Sd San
attenuator optical
FCA attenuat
Test Optical
Ra or
Process power A8 IN
Sd Rdn
meter D8

FC service:
200-SM-LC-L: ≥0dBm
Accepta
GE service:
nce
Criteria
FC service: : 1000BASE-EX: ≥-10dBm
Remark
s
reaches 10-12.
1.23 MOM2 Board

Test
Item
Prerequi
sites
NCP.

Figure 1-151 MOM2 connection for testing Optical Output Power at line
side
C1
SDH/OTN S
analyzer R
C1 LT Optical power
R Sn meter
T
MOM2
Test
LR
Process Cn S Rn
Cn
R R
T
Output Power.
Accepta
nce -5 ~ +1dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-152 MOM2 Optical Receiver Sensitivity Connection
C1
SDH/OTN Variable optical S
analyzer attenuator R
C1 LT
R Sn
T optical
attenuator
MOM2
LR
Cn S Rn
Cn
R R
Optical power
Test T meter
Process
2. The SDH/OTN analyzer sends test signal to the board under test.
analyzer.
Accepta
APD: ≤ -21dBm
nce
PIN: ≤ -14dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Interface of MOM2
C1
C1 LT
R Sn
T optical
attenuator
MOM2
LR
Test
Process
Cn S Rn
Cn
R R
Optical power
T meter
under test.
Accepta
APD: ≥-9dBm
nce
PIN: ≥0dBm
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.

under test.
C1
SDH/OTN S
analyzer R
C1 LT Optical multi-wavelength
R Sn meter
T
MOM2
LR
Cn S Rn
Test
Cn
R R
Process T
2. Set the SDH/OTN signal generator to send test signals to the board
under test, and adjust the optical power to meet the requirements for the
receive optical power of MOM2.
Accepta
nce
Criteria

to the NCP.

C1
SDH/OTN S
analyzer R
C1 LT
spectrometer
R Sn
T
MOM2
LR
Cn S Rn
Test Process Cn
R R
T
reading.
spectral width.
Criteria RZ≤0.4nm
Remarks
1.23.1.6 SMSR
Test Item SMSR
to the NCP.
the SDH/OTN signal generator to send modulation signals to the board
under test.
C1
SDH/OTN S
analyzer R
C1 LT
Spectrometer
R Sn
T
MOM2
LR
Cn S Rn
Test Process Cn
R R
T
(dB).
Acceptance
SMSR ≧35dB
Criteria

Test
Item
Prerequi
sites
NCP.

of MOM2
C1
R
C1 LT
T
Sn
Optical power Optical power
meter MOM2 meter
Test
LR
Process Cn S
Rn
Cn
R R
T
power.
Output Power.
SDH service:
I16: -10~-3dBm
S16.1: -5~0dBm
L16.1: -2~+3dBm
L16.2: -2~+3dBm
FC service:
Accepta
100-SM-LC-L: -9~-3 dBm
nce
200-SM-LC-L : -11~-3dBm
Criteria
: GE service:
1000BASE-SX: -9.5~-3dBm
1000BASE-(LH,LH1,LH2): -9.5~-3dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-158 MOM2 Optical Receiver Sensitivity Connection
C1
SDH/OTN Variable optical S S
R
C1 LT
T
Sn
optical
Optical power MOM2 attenuator
meter
LR
Cn S Rn
Cn
R R
T
Test
Process
analyzer.
SDH service:
I16: ≤-18dBm
S16.1: ≤-18dBm
L16.1: ≤-27dBm
L16.2: ≤-28dBm
FC service:
100-SM-LC-L : ≤-18dBm
Accepta
nce
: GE service:
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.

Figure 1-159 MOM2 Connection for testing receive overload point at the
client side
C1
SDH/OTN Variable optical S S
R
C1 LT
T
Sn
optical
Optical power MOM2 attenuator
Test meter
LR
Process Cn S Rn
Cn
R R
T

SDH service:
I16: ≥-3dBm
S16.1: ≥0dBm
L16.1: ≥-9dBm
L16.2: ≥-9dBm
FC service:
Accepta
nce
200-SM-LC-L: ≥0dBm
Criteria
: GE service:
Remark
s
reaches 10-12.

to the NCP.

under test.
C1
R
C1 LT
T
Sn
optical
MOM2 attenuator
LR
Cn S Rn
Cn
R R
Test Process T

Test Filter
INTERFACE of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10 UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
test..
Remarks

Test
Item
Prerequi
sites
NCP.
strong light.
Figure 1-161 SOTU10G input jitter tolerance of input interface
C1
R
C1 LT
T
Sn
optical
MOM2 attenuator
LR
Cn S Rn
Cn
R R
T
A2
Accepta
nce
Criteria
A1
f0 f1 f
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remark test..
the meter.

to the NCP.


ITU-T G.958.
ITU-T G.8251.

1.24 M1&M2 MQA1/M1MQM1 DWDM 2.5G Board

(Multiple Services)
1.24.1 Optical Interface at the Line Side of the MQA1/MQM1 Board

Test
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. Use the IP/SDH
Figure 1-162 MQA1/MQM1 Connection for Testing Optical Output

Power at the Line Side
A1 S
OUT Optical power
D1 R meter
Sn
Test
IP/SDH signal MQA1/
Process generator MQM1
A2 S
D2 R IN
Rn
2. Set the IP/SDH signal generator to send the test signals to the board under test,
and adjust the optical power to meet the requirements of the receive optical power.
3. Set the receive optical wavelength of the optical power meter constant
to the transmit optical wavelength of the board under test. Measure the
optical output power.
Accepta
nce -3 to +6 d B m
Criteria
Remark
s

Test
Receiver Sensitivity
Item
Prerequi
sites
NCP.

Figure 1-163 MQA1/MQM1 Optical Receiver Sensitivity Connection
A1 S
OUT Adjustable
R 50/50 coupler
D1 Sn optical attenuator
IP analyzer MQA1/
and SDH MQM1
analyzer A2 S board Optical power
IN meter
D2 R
Rn
Test 2. The SDH analyzer and IP analyzer send test signals to the board under
Process test.
analyzer.
Accepta
PIN: ≤-18dBm
nce
APD: ≤-: GE service:: : : : : : 25dBm
Criteria
Remark
optical power on the input port when input signals are in the 1550 nm
s

Test
Item
Prerequi
sites
NCP.

Figure 1-164 MQA1/MQM1 Connection for Testing Receive Overload Point
at the Line Side
A1 S
OUT Adjustable
R 50/50 coupler
D1 Sn optical attenuator
IP analyzer MQA1/
and SDH MQM1
analyzer A2 S board Optical power
Test IN meter
D2 R
Rn
Process
2. The SDH analyzer and IP analyzer send test signals to the board under
test.
Accepta
PIN≥0 dBm
nce
APD≥-9 dBm
Criteria
Remark
s
reaches 10-12.
1.24.1.4 Central Frequency and Frequency Offset

Test
Central Frequency and Frequency Offset
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. Use the SDH signal
generator to provide modulation signals for the board under test.
Figure 1-165 Central Frequency Connection
A1 S
OUT Optical multi-wavelength
D1 R meter
Sn
IP/SDH signal MQA1/
generator MQM1
A2 S
Test D2 R IN
Rn
Process
2. Set the IP signal generator to send GbE LAN (or WAN) signals to the OTU
under test, and adjust the optical power to meet the requirements of the receive
optical power of the MQA1 board.
3. Set the display wavelength range of the multi-wavelength analyzer, display the
waveform within the range in the center of the screen, and then read and record the
central frequency value at the peak. Calculate the central frequency value with the
formula ƒ=C/λ.
4. The difference between the central frequency value and its nominal
value is the central frequency deviation value.
1. The central frequency and central frequency deviation of the boards with the
rate at STM-64 or below should meet the following requirements.
Table 1-24 Requirements for Central Frequency and Central

Frequency Deviation
2.5G OTU at the 10G OTU at the

OTU at the
transmitting end receiving end
OTU Type receiving
Regenerator 2.5G Regenerator 10G
end
OUT OTU
Accepta Central No
nce frequency Meet the requirements of ITU-T G.694.1. requiremen
Criteria (THz) ts
≤12.5 (100 GHz

Central wavelength
No
frequency ≤20 (100 GHz interval)
requiremen
deviation wavelength interval) ≤5 (50 GHz
ts
( GHz) wavelength
interval)
2. For the boards with the rate at STM-256,
In the 80-wavelength system: ≤±2.5 GHz
In the 40-wavelength system: ≤±5 GHz
Remark The central frequency refers to the actual central frequency of the optical
s signal sent by the sender at reference point Sn.

to the NCP.

and use IP and SDH signal generators to provide modulation signals to
A1 S
OUT
R Spectrometer
D1 Sn
IP MQA1/
analyzer
MQM1
and SDH
analyzer A2 S board
D2 R IN
Rn
Test Process
1. The -20 dB spectral width of the OTU with the rate at 10G or below should
meet the requirements in the following table.
Table 1-25 Requirements for -20 dB Spectral Width of the OTU
2.5G OTU at
10G OTU at
the
the receiving
transmitting OTU at the
OTU Type end
end receiving end
Regenerator
Regenerator
Acceptance 10G OTU
2.5G OUT
Criteria
≤0.2 (with EA
-20 dB modulate)
No
Spectral Width ≤0.4 (with ≤0.3
requirements
(nm) direct
modulate)
2. For the boards with the rate at 40G,
O DB/PSBT: 0.6 nm
P-DPSK: 0.7 nm
DP-QPSK: 0.17 nm
Remarks
the power of the maximum peak falls by 20dB..
1.24.1.6 SMSR
Test Item SMSR
to the NCP.
the IP and SDH signal generator to send modulation signals to the
board under test.
A1 Ra
OUT
D1 Sd
Spectrometer
San
IP signal
generator GEM
A8 Ra
D8 Sd IN
Test Process Rdn
(dB).
Acceptance
SMSR ≧35dB.
Criteria
1.24.2 Optical Interface at the Client Side of the MQA1/MQM1 Board

1. Pass the primary power supply test and the fan unit test. The equipment has
been powered on and operates properly.
Prerequis 2. EMS software has been installed, and network data has been configured
ites properly.
3. The database configured for the equipment has been downloaded to the NCP.
generator to provide signals for the board.

Power at the Client Side
IP/SDH signal A1 S
OUT
generator
Sn
Optical D1 R
Test MQA1/
power meter
MQM1
Process
IN
Rn
2. Set the SDH/IP signal generator to send SDH/GE/FC signals to the board under
test, and adjust the optical power to meet the requirements of the receive optical
power.
3. Set the receive optical wavelength of the optical power meter constant to the
transmit optical wavelength of the board under test. Measure the optical output
power.
For SDH services:
I16: -10 to -3 dBm

S16.1: -5 to 0 dBm
L16.1: -2 to +3 dBm
L16.2: -2 to +3 dBm
I-1.1/I-4.1: -15 to -8 dBm
SI-1.1/S-4.1: -15 to -8 dBm
Acceptan
For FC services:
ce
100-SM-LC-L: -9 to -3 dBm
Criteria
200-SM-LC-L: -11 to -3 dBm
For GE services:
1000BASE-SX: -9.5 to -3 dBm
1000BASE-LX: -11 to -3 dBm
1000BASE-(LH,LH1,LH2): -9.5 to -3 dBm
1000BASE-ZX: 0 to +5 dBm
1000BASE-EX: 0 to +5 dBm
Clean the optical connector and ensure good connection before the test.
Remarks
The MQM1 board does not support FC services.

ites properly.
1. Create a test environment, as shown in the following figure. The input signals of
the board under test are in the 1550 nm window.
Variable optical S OUT

A1
50/50 coupler
attenuator Sn
IP/SDH signal MQA1/

generator Optical power MQM1
D1 meter
R IN
Test Rn
Process 2. Set the IP/SDH signal generator to send SDH/GE/FC signals to the board under
test.
3. Adjust the variable optical attenuator to gradually increase the attenuation value
with the Bit Error Rate (BER) of10-7.
5. Repeat Step 3 and Step 4 to measure the optical power values with BER of
10-8, 10-9, 10-10, and 10-11 respectively.
6. Based on extrapolation, draw a P-BER curve in a dual-logarithmic coordinate
paper. The optical power corresponding to BER of 10 -12 indicates the receiver
sensitivity.
For SDH services:
I16: ≤-18 dBm

S16.1: ≤-18 dBm
L16.1: ≤-27 dBm
L16.2: ≤-28 dBm
I-1.1/I-4.1: ≤-23 dBm
SI-1.1/S-4.1: ≤-28 dBm
For FC services:
Acceptan
100-SM-LC-L: ≤-18 dBm
ce
200-SM-LC-L: ≤-18 dBm
Criteria
For GE services:
1000BASE-SX: ≤-17 dBm
1000BASE-LX: ≤-19 dBm
1000BASE-LH: ≤-19 dBm
1000BASE-LH1: ≤-18 dBm
1000BASE-ZX: ≤-18 dBm
 The receiver sensitivity refers to the minimum value of the average receive
optical power on the input port when input signals are in the 1550 nm window
Remarks
and the BER reaches 10-12.
 The MQM1 board does not support FC services.

ites properly.
Figure 1-169 MQA1/MQM1 Connection for Testing Receive

Overload Point at the Client Side
A1 Variable optical S OUT

50/50 coupler
attenuator Sn
Test IP/SDH signal MQA1/

generator Optical power MQM1
Process meter
D1
R IN
Rn
2. Set the IP/SDH signal generator to send SDH/GE/FC signals to the board under
test.
3. Adjust the variable optical attenuator 1 to gradually decrease the attenuation
value and make the BER to be close to but no greater than 10-12.
4. Read the optical power value from the optical power meter. This optical power
For SDH services:
I16: ≥-3 dBm

S16.1: ≥0 dBm
L16.1: ≥-9 dBm
L16.2: ≥-9 dBm
I-1.1/I-4.1: ≥-8 dBm
SI-1.1/S-4.1: ≥-8 dBm
Acceptan
For FC services:
ce
100-SM-LC-L: ≥-3 dBm
Criteria
200-SM-LC-L: ≥0 dBm
For GE services:
1000BASE-SX: ≥0 dBm
1000BASE-LX: ≥-3 dBm
1000BASE-(LH,LH1,LH2): ≥-3 dBm
1000BASE-ZX: ≥-3 dBm
 The receive overload optical power refers to the maximum receivable value of
the average receive optical power at reference point R when the BER reaches
Remarks
10-12.

ites properly.
1. Self-loop the SDH analyzer with a short-circuit fiber, and then calibrate the SDH
analyzer.
Note: You should control the receive optical power of the meter to protect the receive
interface from being damaged by strong light.
Test 2. Disconnect the short-circuit fiber, access the board under test, and adjust the
Process optical attenuator, so that the tested board can receive proper optical power. Make
the input optical power of the SDH analyzer constant to that of the self-looped
analyzer in Step 1. Configure the test environment.
Figure 1-170 Input Jitter Connection
Line-side loopback
P1
SDH signal
generator CR MQA1/MQM1 CT Jitter Analyzer
A2
Acceptan A1
ce f0 f1 f
Criteria
Interface
f1
STM Level f0 (kHz) A1 (UIp-p) A2 (UIp-p)
(kHz)
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
1. Clean the optical connector and ensure good connection before the test.
Remarks 2. Ensure that the input optical power of the board is consistent with that of the
meter.

2. EMS software has been installed, and network data has been configured
Prerequisite
properly.
s
3. The database configured for the equipment has been downloaded to the
NCP.
1. Create a test environment, as shown in the following figure. Use the SDH
Line-side loopback
P1
SDH signal
generator CR MQA1/MQM1 CT Jitter Analyzer
Test Process
2. Set the SDH signal generator to allow the SDH output signals to access the
receive optical interface of the board under test and adjust the optical power to
meet the requirements of the receive optical power of the board under test.
3. Set the receive rate of the jitter analyzer based on the rate level of STM-N
signals sent from the equipment. Adjust the optical attenuator, so that the jitter
analyzer can receive proper optical power.
4. Set the measurement filter of the jitter analyzer to the bandwidth listed in the
following table, and read the maximum output peak-to-peak value of jitter.
Peak-to-Peak Value
STM Interface Test Filter
of Jitter
500Hz to 1.3MHz 0.30 UI

STM-1
65kHz to 1.3MHz 0.10 UI
Acceptance 1000Hz to 5MHz 0.30 U

STM-4
Criteria 250kHz to 5MHz 0.10 UI
5000Hz to 20MHz 0.30 UI

STM-16
1MHz to 20MHz 0.10 UI
20kHz to 80MHz 0.30 UI

STM-64
4MHz to 80MHz 0.10 UI
20 kHz to 320 MHz 6.0 UI

STM-256
16 MHz to 320 MHz 0.15 UI
Remarks 2. If o.171 and o.172 options are both available for the filter template, select
o.172 for the test.

Prerequisites properly.
NCP.
1. Self-loop the SDH analyzer with a short-circuit fiber, and then calibrate the
SDH analyzer.
Note: You should control the receive optical power of the meter to protect the
receive interface from being damaged by strong light.
2. Disconnect the short-circuit fiber, access the board under test, and adjust
Test Process
the optical attenuator, so that the tested board can receive proper optical power.
Make the input optical power of the SDH analyzer constant to that of the
self-looped analyzer in Step 1. Configure the test environment.
3. Perform the test with the corresponding test items and templates of the SDH
analyzer and observe whether the test results are under the templates.
1. 2.5G OTU jitter transfer function should meet the requirements of ITU-T
G.958.
Acceptance 2. 10G OTU jitter transfer function should meet the requirements of ITU-T
Criteria G0.783.
3. 40G OTU jitter transfer function should meet the requirements of ITU-T
G0.8251.
1. Jitter transfer function refers to the relationship between the variation in jitter
frequencies and the ratio of output-signal jitter to input-signal jitter for the
Remarks equipment.
2. If the actual input tolerance rate of the equipment has a margin, it is allowed
to properly increase the jitter range of test signals.
1.25 M1&M2 MQA2/M1MQM2 DWDM 10G Board

(Multiple Services)
1.25.1 Optical Interface at the Line Side of the MQA2/MQM2 Board

ites properly.
Figure 1-172 MQA2/MQM2 connection for Testing Optical Output

A1 S
OUT Optical power
D1 R meter
Sn
Test
IP/SDH signal MQA2/
Process generator MQM2
A2 S
D2 R IN
Rn
2. Set the IP/SDH signal generator to send test signals to the board under test,
and adjust optical power to meet the requirements of the receive optical power.
power.
Acceptan
ce -3 to +6 d B m
Criteria
Remarks Clean the optical connector and ensure good connection before the test.

ites properly.
A1 S
OUT Variable optical
R 50/50 coupler
D1 Sn attenuator
IP/SDH signal MQA2/
generator MQM2
A2 S Optical power
R IN meter
D2
Rn
Test
2. SDH/IP signal generator send test signals to the board under test.
Process
sensitivity.
Acceptan
PIN ≤-14 dBm
ce
APD ≤-21 dBm
Criteria
The receiver sensitivity refers to the minimum value of the average receive optical
Remarks power on the input port when input signals are in the 1550 nm window and the BER
reaches 10-12.

ites properly.

Overload Point at the Line Side
A1 S
OUT Variable optical
R 50/50 coupler
D1 Sn attenuator
IP/SDH MQA2/
Test generator MQM2
A2 S Optical power
Process R IN meter
D2
Rn
2. Set the SDH/IP signal generator correctly, and send test signals to the
board under test.
Acceptan
PIN≥0 dBm
ce
APD≥-9 dBm
Criteria
The receive overload optical power refers to the maximum receivable value of the
Remarks
average receive optical power at reference point Rn when the BER reaches 10 -12.

Test Item Central Frequency and Frequency Deviation
ites properly.
A1 S
OUT Optical multi-
R wavelength meter
D1 Sn
IP/SDH
MQA2/
signal
MQM2
generator A2 S
Test D2 R IN
Rn
Process
2. Set the IP signal generator to send GbE LAN (or WAN) signals to the OTU
optical power of the MQA2 board.
formula ƒ=C/λ.
4. The difference between the central frequency value and its nominal value is the
central frequency deviation value.
rate at STM-64 or below should meet the following requirements.

Frequency Deviation
2.5G OTU at
10G OTU at the 2.5G OTU at the
the transmitting OTU at the
receiving end transmitting end
end receiving
Regenerator 10G Regenerator 2.5G
Regenerator end
OTU OUT
2.5G OUT
Acceptan
ce Central No
Meet the requirements of
Criteria frequency requiremen
ITU-T G.694.1.
(THz) ts
≤12.5 (100 GHz

Central wavelength
≤20 (100 GHz No
frequency interval)
wavelength requiremen
deviation ≤5 (50 GHz
interval) ts
( GHz) wavelength
interval)
2. For the boards with the rate at STM256,
The central frequency refers to the actual central frequency of the optical signal sent
Remarks
by the transmitter at reference point Sn.

Test Item -20 dB Spectral Width
NCP.
Figure 1-176 -20 dB Spectral Width Connection
A1 S
OUT
R Spectrometer
D1 Sn
IP/SDH MQA2/
generator MQM2
Test Process A2 S
D2 R IN
Rn
2. Set the display wavelength range of the spectrometer and set the resolution
of the spectrometer to the minimum value. Adjust the amplitude scale of the
spectrometer so that the waveform can be displayed with proper amplitude in the
3. Position the cursor to the peak of the primary longitudinal mode, find the
place where the peak value has fallen by 20 dB, and read the spectral width.
1. The -20 dB spectral width of the OTU with the rate at 10G or below should
meet the requirements in the following table.
2.5G OTU at
10G OTU at
the
the receiving The OTU at
transmitting
OTU Type end the receiving
end
Acceptance Regenerator end
Regenerator
Criteria 10G OTU
2.5G OUT
-20 dB
No
spectral ≤0.2 ≤0.3
requirements
width (nm)
O DB/PSBT: 0.6 nm
P-DPSK: 0.7 nm
DP-QPSK: 0.17 nm
The -20 dB spectral width refers to the maximum spectral width when the power
Remarks
of the maximum peak falls by 20 dB.
1.25.1.6 SMSR
Test Item SMSR
NCP.
Create a test environment, as shown in the following figure. Use the IP/SDH
A1 S
OUT
R Spectrometer
D1 Sn
IP/SDH
MQA2/
signal
MQM2
generator A2 S
Test Process D2 R IN
Rn
Set the display wavelength range of the spectrometer and set the resolution of
the spectrometer to the minimum value. Adjust the amplitude scale of the
spectrometer so that the primary longitudinal mode and the side mode can be
displayed with proper amplitude in the center of the screen to facilitate
Adjust the cursor to read the optical powers (dBm) of the primary longitudinal
mode and side mode respectively.
Calculate the difference between two power values to get the SMSR ( dB).
Acceptance
SMSR35 dB
Criteria
SMSR refers to the ratio of the average optical power of the primary longitudinal
Remarks mode to the optical power of the most significant side mode in full modulation
under the worst reflection condition.
1.25.2 Optical Interface at the Client Side of the MQA2 Board

Prerequis 2. The EMS software has been installed, and the network data has been
ites configured properly.

IP and SDH A1 S
OUT
generators
Sn
Optical D1 R
Test MQA2/MQ
power meter
M2 board
Process
IN
Rn
power.
power.
For SDH services:
I16: -10 to -3 dBm

S16.1: -5 to 0 dBm
S16.2: -5 to 0 dBm
L16.1: -2 to +3 dBm
L16.2: -2 to +3 dBm
For FC services:
Acceptan
ce
200-SM-LC-L: -11 to -3 dBm
Criteria
For GE services:
Clean the optical connector and ensure good connection before the test.The MQM2
Remarks
board does not support FC services.

Variable optical 50/50 S OUT

A1
attenuator coupler Sn
MQA2/M
IP and SDH QM2
generators Optical board
D1 power meter R IN
Rn
Test
Process 2. Set the IP/SDH signal generator to send SDH/GE/FC signals to the board under
test.
sensitivity.
For SDH services:
I16: ≤-18 dBm

S16.1: ≤-18 dBm
S16.2: ≤-18 dBm
L16.1: ≤-27 dBm
L16.2: ≤-28 dBm
For FC services:
100-SM-LC-L: ≤-18 dBm

Acceptan
200-SM-LC-L: ≤-18 dBm
ce
400-SM-LC-L: ≤-15 dBm
Criteria
For GE services:
Remarks


Variable optical S OUT

A1
50/50 coupler
attenuator Sn
Test IP and SDH MQA2/

generators MQM2
Optical power
Process
D1 meter R IN
Rn
2. Set the IP/SDH signal generator to send SDH/GE/FC signals to the board under
test.
For SDH services:
I16: ≥-3 dBm

S16.1: ≥0 dBm
S16.2: ≥0 dBm
L16.1: ≥-9 dBm
L16.2: ≥-9 dBm
For FC services:
Acceptan
ce
Criteria
For GE services:
Remarks
10-12.

Prerequisite
properly.
s
NCP.
Line-side loopback
P1
SDH signal
CR MQA2/MQM2 CT Jitter analyzer
generator
Test Process
Peak-to-Peak Value
of Jitter
500 Hz to 1.3 MHz 0.30 UI

STM-1
65 kHz to 1.3 MHz 0.10 UI
Acceptance 1000 Hz to 5 MHz 0.30 UI

STM-4
Criteria 250 kHz to 5 MHz 0.10 UI
5000 Hz to 20 MHz 0.30 UI

STM-16

STM-64

STM-256
o.172 for the test.

Test Item Maximum Input Jitter Tolerance
analyzer.
Note: You should control the receiving optical power of the meter to protect the
the input optical power of the SDH analyzer equal to that of the self-looped analyzer
in Step 1. Configure the test environment.
Figure 1-182 Input Jitter Tolerance of MQA2/MQM2 Input Interface
Line-side loopback
P1
SDH signal
generator CR MQA2/MQM2 CT Jitter analyzer
A2
Acceptan A1
ce f0 f1 f
Criteria
Interface
f1
(kHz)
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
meter.

NCP.
SDH analyzer.
Test Process
G.958.
Criteria G0.783.
G0.8251.
Remarks equipment.
1.26 M1MJA/MJM DWDM 10G Board
1.26.1 Optical Interface at the Client Side of the MJA/MJM Board

Figure 1-183 MJA/MJM connection for testing Optical Output Power at the
Cine Side
IP and SDH A1 S
generators
Optical power D1 R
meter MJA/MJM Loop back
Test
Process
power.
power.
For SDH services:
I16: -10 to -3 dBm

S16.1: -5 to 0 dBm
L16.1: -2 to +3 dBm
L16.2: -2 to +3 dBm
I-1.1/I-4.1: -15 to -8 dBm
SI-1.1/S-4.1: -15 to -8 dBm
Acceptan
For FC services:
ce
Criteria
200-SM-LC-L: -11 to -3 dBm
For GE services:
 Clean the optical connector and ensure good connection before the test.
Remarks
 The MJM board does not support FC services.

Figure 1-184 MJA/MJM Optical Receiver Sensitivity Connection
A1 Variable optical S
50/50 coupler
attenuator
IP and SDH MJA/MJ Loop

generators M board back
Optical power
D1 meter
R
Test
2. Set the IP/SDH signal generator to send SDH/GE/FC signals to the
Process
board under test.
sensitivity.
For SDH services:

I16: ≤-18 dBm
S16.1: ≤-18 dBm
L16.1: ≤-27 dBm
L16.2: ≤-28 dBm
I-1.1/I-4.1: ≤-23 dBm
SI-1.1/S-4.1: ≤-28 dBm
For FC services:
Acceptan
100-SM-LC-L: ≤-18 dBm
ce
200-SM-LC-L: ≤-18 dBm
Criteria
For GE services:

Remarks

Figure 1-185 MJA/MJM Connection for Testing Receive Overload

Point at the Client Side
Variable optical S
A1
50/50 coupler
attenuator
Loop
Test IP/SDH signal MJA/MJM
generator back
Optical power
Process meter
D1
R
2. Set the IP/SDH signal generator to send SDH/GE/FC signals to the

board under test.
For SDH services:
I16: ≥-3 dBm

S16.1: ≥0 dBm
L16.1: ≥-9 dBm
L16.2: ≥-9 dBm
I-1.1/I-4.1: ≥-8 dBm
SI-1.1/S-4.1: ≥-8 dBm
Acceptan
For FC services:
ce
Criteria
For GE services:
Remarks
10-12.

Prerequisite
properly.
s
NCP.
Line-side loopback P
SDH signal 1
CR MJA/MJM CT Jitter analyzer
generator
Test Process
Peak-to-Peak Value
of Jitter
500 Hz to 1.3 MHz 0.30 UI

STM-1
1000 Hz to 5 MHz 0.30 U

Acceptance STM-4
Criteria
5000 Hz to 20 MHz 0.30 UI
STM-16

STM-64

STM-256
o.172 for the test.

analyzer.
Figure 1-187 Input jitter tolerance of MJA /MJM Input Interface
Line-side loopback
P1
SDH signal
CR MJA /MJM CT Jitter analyzer
generator
A2
Acceptan
ce
A1
Criteria
f0 f1 f
f1 f0
STM Level A1 (UIp-p) A2 (UIp-p)
(kHz) (kHz)
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
meter.

NCP.
SDH analyzer.
Test Process
G.958.
Criteria G0.783.
G0.8251.
Remarks equipment.
1.27 M1TD2C/TS2C/TS2CP Board
1.27.1 Optical Interface at the Line Side of the TD2C/TS2C/TS2CP Board

Figure 1-188 TD2C/TS2C/TS2CP connection for Testing Optical Output

S
TD2C/
IP/SDH signal OUT Optical power
TS2C/
Test generator Sn meter
TS2CP
Process
2. Set the IP/SDH signal generator to send test signals to the board under test,
power.
Acceptan
ce -3 to +6 d B m
Criteria

Figure 1-189 TD2C/TS2C/TS2CP Optical Receiver Sensitivity

Connection
Fixed 50/50 TD2C/ Variable

IP signal Ra San
optical demultipl TS2C/ optical
generator
attenuator exer TS2CP attenuator
Optical power
meter
Test
Process
2. The IP signal generator sends 10GbE LAN (or WAN) test signals to the
TD2C/TS2C/TS2CP board.
sensitivity.
Acceptan
PIN: ≤-14 dBm
ce
APD: ≤-21 dBm
Criteria
reaches 10-12.

Figure 1-190 TD2C/TS2C/TS2CP Connection for Testing Receive

Overload Point at the Line Side
Fixed 50/50 TD2C/ Variable

IP signal Ra San
optical demultipl TS2C/ optical
generator
attenuator exer TS2CP attenuator
Test
Optical power
Process meter
2. The IP signal generator sends 10GbE LAN (or WAN) test signals to the
Acceptan
PIN≥0 dBm
ce
APD≥-9 dBm
Criteria
Remarks

ites properly.
1. Create a test environment, as shown in the following figure. Use the IP signal
IP signal TD2C/TS2C Multi-

IN OUT wavelength
generator /TS2CP
analyzer
Variable optical
attenuator
Test
2. Set the IP signal generator to send 10GbE LAN (or WAN) signals to the board
Process
optical power of the TD2C/TS2C board.
formula ƒ=C/λ.
rate at 10G or below should meet the following requirements.

Frequency Deviation
2.5G OTU at the 10G OTU at the

OTU at the
transmitting end receiving end
OTU Type receiving
Regenerator 2.5G Regenerator 10G
end
OUT OTU
Acceptan
Central No
ce
Frequency Meet the requirements of ITU-T G.694.1. requiremen
Criteria
(THz) ts
≤12.5 (100 GHz

Central wavelength
≤20 (100 GHz No
Frequency interval)
wavelength requiremen
Deviation ≤5 (50 GHz
interval) ts
( GHz) wavelength
interval)
Remarks

ites properly.
Figure 1-192 -20 dB Spectral Width Connection
IP signal TD2C/TS2C
IN OUT Spectrometer
generator /TS2CP
Test Variable Optical
Process Attenuator
2. Set the display wavelength range of the spectrometer and set the resolution of
3. Position the cursor to the peak of the primary longitudinal mode, find the place
where the peak value has fallen by 20 dB, and read the spectral width.
1. The -20 dB spectral width of the OTU with the rate at 10G or below should meet
the requirements in the following table.
2.5G OTU at
10G OTU at
the
the receiving The OTU at
transmitting
OTU Type end the receiving
Acceptan end
Regenerator end
ce Regenerator
10G OTU
Criteria 2.5G OUT
No
-20 dB Spectral
≤0.2 ≤0.3 requirement
width (nm)
s
O DB/PSBT: 0.6 nm
P-DPSK: 0.7 nm
DP-QPSK: 0.17 nm
The -20 dB spectral width refers to the maximum spectral width when the power of
Remarks
the maximum peak falls by 20 dB.
1.27.1.6 SMSR
Test Item SMSR
ites properly.
Create a test environment, as shown in the following figure. Use the IP signal
IP signal TD2C/TS2C
IN OUT Spectrometer
generator /TS2CP
Variable Optical
Test Attenuator
Process
Set the display wavelength range of the spectrometer and set the resolution of the
spectrometer to the minimum value. Adjust the amplitude scale of the spectrometer
so that the primary longitudinal mode and the side mode can be displayed with
proper amplitude in the center of the screen to facilitate observation and reading.
Adjust the cursor to read the optical powers (dBm) of the primary longitudinal mode
and side mode.
Acceptan
ce SMSR35 dB
Criteria
Remarks mode to the optical power of the most significant side mode in full modulation under
the worst reflection condition.
1.27.2 Optical Interface at the Client Side of the TD2C/TS2C/TS2CP Board

(10G SDH Services)

Figure 1-194 TD2C/TS2C/TS2CP Connection for Testing Optical Output

A1 S
SDH generator
Optical D1 R TD2C/
power meter TS2C/ Loop
Test TS2CP back
Process
receive optical interface of the board under test and adjust the optical power to meet
the requirements of the receive optical power of the board under test.
power.
Acceptan
S64.2b: -1 to +2 dBm
ce
I64.1: -6 to -1 dBm
Criteria
Remarks 2. On-site equipment can replace the SDH signal generator to act as the
modulation source.

Figure 1-195 TD2C/TS2C/TS2CP Optical Receiver Sensitivity

Connection
SDH Variable 50/50 Rdn Sd Fixed optical

signal optical demultiple TD2C
attenuator
generator attenuator xer
Optical power
meter
Test
Process
2. The SDH signal generator sends STM-64 NRZ PRBS231-1 test signals to the
paper. The optical power corresponding to BER of 10-12 indicates the receiver
sensitivity.
Acceptan
S64.2b:<-16 dBm
ce
I64.1: <-14 dBm
Criteria
reaches 10-12.


SDH Variable 50/50 Rdn Sd Fixed optical

signal optical demultiple TD2C
attenuator
generator attenuator xer
Test
meter
2. Set the SDH rate and signal structure correctly, and send test signals to the
board under test.
Acceptan
S64.2b:>-1 dBm
ce
I64.1: >0 dBm
Criteria
Remarks
average receive optical power at reference point R when the BER reaches 10 -12.

Prerequisite
properly.
s
NCP.
Line-side loopback
P1
SDH signal TD2C/TS2C
CR /TS2CP CT Jitter analyzer
generator
Test Process
Peak-to-Peak Value
of Jitter
500 Hz to 1.3 MHz 0.30 UI

STM-1
Acceptance 1000 Hz to 5 MHz 0.30 UI

STM-4
Criteria 250 kHz to 5 MHz 0.10 UI
5000 Hz to 20 MHz 0.30 UI

STM-16

STM-64

STM-256
o.172 for the test.

analyzer.
Figure 1-198 Input Jitter Tolerance of TD2C/TS2C/TS2CP input

Interface
Line-side loopback
P1
SDH signal TD2C/TS2C
CR Jitter analyzer
generator /TS2CP CT
A2
Acceptan
ce
Criteria A1
f0 f1 f
f1 A1
STM Level f0 (kHz) A2 (UIp-p)
(kHz) (Up-p)
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
meter.

NCP.
SDH analyzer.
Test Process
G.958.
Criteria G0.783.
G0.8251.
Remarks equipment.
1.27.3 Optical Interface at the Client Side of the TD2C/TS2C/TS2CP Board

(10G Data Services)

Figure 1-199 TD2C/TS2C/TS2CP Connection for Testing Optical

Output Power at the Client Side
IP signal A1 S
generator
Optical D1 R TD2C/
Test power meter TS2C/ Loop back
Process TS2CP
2. Set the IP signal generator to send 10GbE LAN (or WAN) signals to the OTU
optical power of the board.
power.
Acceptan
10GBASE-LR/LW: -6 to -1 dBm
ce
10GBASE-ER/EW: -1 to +2 dBm
Criteria

Figure 1-200 TD2C/TS2C/TS2CP Optical Receive Sensitivity

Connection
Variable 50/50 Rdn Sd

IP signal Fixed optical
optical demultiplex TD2C
generator attenuator
attenuator er
Optical power
meter
Test
Process
2. The IP signal generator sends 10GbE LAN (or WAN) test signals to the OTU
under test.
sensitivity.
Acceptan
10GBASE-LR/LW: >-14 dBm
ce
10GBASE-ER/EW: >-16 dBm
Criteria
reaches 10-12.


Variable 50/50 Rdn Sd

IP signal Fixed optical
optical demultiple TD2C
attenuator xer
Test
meter
2. The IP signal generator sends 10GbE LAN (or WAN) test signals to the OTU
under test.
Acceptan
10GBASE-LR/LW: >0 dBm
ce
10GBASE-ER/EW: >-1 dBm
Criteria
Remarks
1.28 M2&M3 CH1 Board (Client Side)
1.28.1 Optical Interface at the Client Side of the CH1 Board

generator to provide signals for the board. The board backplane loops back.
Figure 1-202 CH1 Connection for Testing Optical Output Power at

the Client Side
A1 Ra
SDH generator
D1 Sd
Ra
A2
Optical Sd
Test power meter
D2
CH1 board
Process
2. Set the SDH signal generator to send signals to the board under test, and
adjust the optical power to meet the requirements of the receive optical power of the
board.
power.
For SDH services:
I16: -10 to -3 dBm

S16.1: -5 to 0 dBm
S16.2: -5 to 0 dBm
L16.1: -2 to +3 dBm
L16.2: -2 to +3 dBm
Acceptan For FC services:
ce 100-SM-LC-L: -9 to -3 dBm
Criteria 200-SM-LC-L: -11 to -3 dBm
For GE services:


Figure 1-203 CH1 Optical Receiver Sensitivity Connection
SDH signal Variable optical 50/50 A1 Ra

generator attenuator coupler D1 Sd
A2 CH1
D2
Optical power
meter
Test
Process 2. The SDH signal generator sends test signal to the board under test. The board
backplane loops back.
paper. The optical power corresponding to BER of 10-12 indicates the receiver
sensitivity.
For SDH services:
I16: ≤-18 dBm

S16.1: ≤-18 dBm
S16.2: ≤-18 dBm
L16.1: ≤-27 dBm
L16.2: ≤-28 dBm
For FC services:
Acceptan 100-SM-LC-L: ≤-18 dBm
ce 200-SM-LC-L: ≤-18 dBm
Criteria For GE services:
1000BASE-EX: ≤-30 dBm
reaches 10-12.

Figure 1-204 CH1 Connection for Testing Receive Overload Point at

the Client Interface
Variable A1 Ra
SDH signal Optical 50/50
optical
generator amplifier coupler D1 Sd
attenuator
Test A2 CH1
D2
Process Optical
power meter
A8
D8
2. The SDH signal generator sends test signal to the board under test. The board
backplane loops back.
For SDH services:
I16: ≥-3 dBm

S16.1: ≥0 dBm
S16.2: ≥0 dBm
L16.1: ≥-9 dBm
L16.2: ≥-9 dBm
Acceptan For FC services:
ce 100-SM-LC-L: ≥-3 dBm
Criteria 200-SM-LC-L: ≥0 dBm
For GE services:
1000BASE-EX: ≥-10 dBm
Remarks

analyzer.
Figure 1-205 Input Jitter Tolerance of CH1 Input Interface
SDH signal A1 Ra
generator D1 Sd
Ra
A2
Sd
D2 Backplane
CH1 loops back
A2
Acceptan
ce
Criteria
A1
f0 f1 f
f1
(kHz)
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
meter.
1.28.1.5 Maximum Output Jitter Tolerance

NCP.
SDH signal A1 Ra
generator D1 Sd
Ra
A2
Sd
D2 Backplane
CH1 loops back
Test Process
Peak-to-Peak Value
of Jitter
500 Hz to 1.3 MHz 0.30 UI

STM-1
1000 Hz to 5 MHz 0.30 UI

Acceptance STM-4
Criteria
5000 Hz to 20 MHz 0.30 UI
STM-16

STM-64

STM-256
o.172 for the test.

NCP.
SDH analyzer.
Test Process
G.958.
Criteria G0.783.
G0.8251.
Remarks equipment.
1.29 100G Optical Transponder M2&M3TS4
1.29.1 Optical Interface at the Line Side of the TS4 Board


100GE/OTN signal generator to provide signals for the board.
Figure 1-207 TS4 Connection for Testing Optical Output Power at

the Line Side
100GE/OTN Variable CR LT Sn Optical power

S
signal optical TS4 meter
Test generator attenuator CT LR
Rn
Process
2. Set the 100GE/OTN signal generator to send test signals to the board under
test, and adjust optical power to meet the requirements of the receive optical power.
power.
Acceptan
ce PM-QPSK: -5 to 3 dBm
Criteria

Figure 1-208 TS4 Optical Receiver Sensitivity Connection
100GE/OTN CR LT Sn Variable
optical S
signal TS4 optical
attenuator
generator CT LR 50/50 attenuator
Rn coupler
Optical power
meter
Test
Process 2. Set the 100GE/OTN signal generator to send test signals to the board under
test.
sensitivity.
Acceptan
ce PM-QPSK: ≤-15 dBm
Criteria
reaches 10-12.

Figure 1-209 TS4 Connection for Testing Receive Overload Point at

the Line Side
100GE/OTN CR LT Sn OA+
Optical S variable
signal TS4
attenuator optical
generator CT LR 50/50 attenuator
Rn coupler
Test
Process
Optical power
meter
2. Set the 100GE/OTN signal generator correctly, and send test signals to the
board under test.
Acceptan
ce PM-QPSK: ≥1 dBm
Criteria
Remarks
1.29.1.4 Central Frequency and Frequency Deviation

ites properly.

100GE/OTN signal generator to provide modulation signals for the board under test.
CR LT Sn Optical multi-
100GE/OTN Optical S
TS4 wavelength meter
CT LR
Rn
Test
2. Set the 100GE/OTN signal generator to send signals to the board under test,
Process
and adjust the optical power to meet the requirements of the receive optical power of
the TS4 board.
formula ƒ=C/λ.
Acceptan The frequency deviation of the board with the rate at OTU4:
ce In the 40-wavelength system: ≤±5 GHz
Criteria In the 80-wavelength system: ≤±2.5 GHz
Remarks

Prerequisites
properly.

100GE/OTN signal generator to provide modulation signals for the board under test.
Figure 1-211 20 dB Spectral Width Connection
100GE/OTN CR LT Sn
Optical S Spectrometer
signal TS4
attenuator
generator CT LR
Test Process
Rn
2. Set the display wavelength range of the spectrometer and set the resolution of
3. Position the cursor to the peak of the primary longitudinal mode, find the place
where the peak value has fallen by 20 dB, and read the spectral width.
Acceptance For the boards with the rate at 100G,

Criteria PM-QPSK: ≤0.6 nm
The -20 dB spectral width refers to the maximum spectral width when the power of
Remarks
the maximum peak falls by 20 dB.
1.29.1.6 SMSR
Test Item SMSR
Prerequisite
properly.
s
NCP.
Create a test environment, as shown in the following figure. Use the 100GE/OTN
100GE/OTN CR LT Sn
Optical S Spectrometer
signal TS4
attenuator
generator CT LR
Rn
Test
Process
Set the display wavelength range of the spectrometer and set the resolution of the
spectrometer to the minimum value. Adjust the amplitude scale of the
spectrometer so that the primary longitudinal mode and the side mode can be
displayed with proper amplitude in the center of the screen to facilitate
Adjust the cursor to read the optical powers (dBm) of the primary longitudinal
mode and side mode.
Acceptance
SMSR35 dB
Criteria
Remarks mode to the optical power of the most significant side mode in full modulation
under the worst reflection condition.
1.29.2 Optical Interface at the Client Side of the TS4 Board
1.29.2.1 Central frequency/Frequency Deviation at the Transmitting End

Test Item Central frequency/Frequency Deviation at the Transmitting End
1. Create a test environment, as shown in the following figure. Perform the test
configuration and wait until the OTU operates stably.
CR Sn
Test S LT
TS4
Process Optical multi- R CT LR
wavelength meter
Rn
Set the display frequency (wavelength) range of the multi-wavelength meter, and
then read and record the central frequency (wavelength) value at the peak.
The difference between the central frequency (wavelength) value and its nominal
value is the central frequency (wavelength) deviation value.
For the 1000GBASE LR4/ER4 module: 4*25G/28G
Acceptan Lane0: 1295.56 nm, Range: 1294.53 to 1296.59 nm

ce Lane1: 1300.05 nm, Range: 1299.02 to 1301.09 nm
Criteria Lane2: 1304.58 nm, Range: 1303.54 to 1305.63 nm
Lane3: 1309.14 nm, Range: 1308.09 to 1310.19 nm
1.29.2.2 Average Transmit Optical Power at the Transmitting End

Test Item Average Transmit Optical Power at the Transmitting End
Figure 1-214 TS Connection for Testing Optical Output Power at

Client Side
Test
Process CR Sn
S LT
TS4
Optical R CT LR
power meter
Rn
2. Set the optical power meter in a suitable wavelength window (1310nm). After
the reading is stable, read and record the optical power.
100GBASE-LR4 (4I1-9D1F): +1.7 dBm to +10.5 dBm

Acceptan
100GBASE-ER4 (4L1-9C1F): +3.1 dBm to +8.9 dBm
ce
LR4 indicates the 10km module.
Criteria
ER4 indicates the 40km module.

Test Item Optical Receiver Sensitivity (Four Client Channels)
100GE/OTN Variable CR Sn
S LT
signal optical 50/50 Optical
TS4
generator attenuator coupler attenuator
R CT LR
Rn
Optical power
meter
Test
Process 2. Set the 100GE/OTN signal generator to send test signals to the board under
test.
sensitivity.
Acceptan
100GBASE-LR4 (4I1-9D1F): ≤-2.6 dBm
ce
100GBASE-ER4 (4L1-9C1F): ≤-15.6 dBm
Criteria
reaches 10-12.
1.29.2.4 Receive Overload Optical Power

Test Item Receive Overload Optical Power (Four Client Channels)
Figure 1-216 TS4 Connection for Testing Receive Overload Point at the
Client Side
100GE/OTN Variable CR Sn
S LT
signal optical 50/50 Optical
TS4
generator attenuator coupler attenuator
R CT LR
Rn
Test
Process
Optical power
meter
2. The 100GE/OTN signal generator sends test signals to the board under test.
Acceptan
ce ≥+10.5 dBm
Criteria
Remarks
1.29.2.5 Single-Channel Average Transmit Optical Power

Test Item Single-Channel Average Transmit Optical Power
Figure 1-217 Configuration of the Optical Output Power at the Client

Side of TS4
Test Lane0
Process S Lane1
Optical power
Demult meter
TS4 Lane2
iplexer
Lane3
2. Set the optical power meter in a suitable wavelength window (1310nm). After
the reading is stable, read and record the optical power.
Acceptan
100GBASE-LR4 (4I1-9D1F): -4.3 dBm to +4.5 dBm
ce
100GBASE-ER4 (4L1-9C1F): -2.9 dBm to +2.9 dBm
Criteria
This test item requires a demultiplexer with special wavelength. It is not applicable on
Remarks
site. You can read the value from the EMS.
1.29.2.6 Single-Channel Optical Receiver Sensitivity

Test Item Single-Channel Optical Receiver Sensitivity
Optical power
meter
Lane0 Variable
attenuator/
Lane1 amplifier
Demu
S Multip
ltiplex Lane2
lexer
R er
100GE/OTN Reference TS4 Lane3
signal generator S
TS4 under test
R
R
Test
Process 2. Set the 100GE/OTN signal generator to send test signals to the reference TS4
board.
sensitivity.
Acceptan
100GBASE-LR4 (4I1-9D1F): ≤-8.6 dBm
ce
100GBASE-ER4 (4L1-9C1F): ≤-21.4 dBm
Criteria
This test item requires a demultiplexer/multiplexer with special wavelength. It is not

Remarks
applicable on site.
1.29.2.7 Single-Channel Receive Overload Optical Power

Test Item Single-Channel Receive Overload Optical Power
Figure 1-219 TS4 Connection for Testing Receive Overload Point at the
Client Side
Optical power
meter
Lane0 Variable
attenuator/
Lane1 amplifier
Test S
Demu Multi
ltiplex Lane2 plexe
R er r
Process 100GE/OTN Reference TS4 Lane3
signal generator S
TS4 under test
R
R
2. The 100GE/OTN signal generator sends test signals to the board under test.
Acceptan
ce ≥+4.5 dBm
Criteria
This test item requires a demultiplexer/multiplexer with special wavelength. It is not

Remarks
applicable on site.
1.30 10-Channel 10G Aggregation Board (MX2)
1.30.1 Optical Interface at the Line Side of the MX2 Board

1. Create a test environment, as shown in the following figure. Use the SDH/OTN
Figure 1-220 MX2 Connection for Testing Optical Output Power at

Line Side
IP/SDH/
S C1R
OTN Optical LT Optical power
R C1T
signal attenuator meter
C2R Sn
generator
Test C2T MX 2
Process
LR
C10R
C10 T Rn
2. Set the SDH/OTN signal generator to send test signals to the board under test,
power.
Acceptan
ce PM-QPSK: -5 to 3 dBm
Criteria

Figure 1-221 MX2 Optical Receiver Sensitivity Connection
IP/SDH/
OTN Optical S C1R
signal attenuator LT Variable
R C1T
generator C2R MX2 Sn optical
C2T attenuator
C3R 50/50
C3T coupler
LR
CiR
Ci T Rn Optical power
Test meter
Process 2. Set the SDH/OTN signal generator to send test signals to the board under test.
sensitivity.
Acceptan
ce PM-QPSK: ≤-15 dBm
Criteria
reaches 10-12.

Figure 1-222 MX2 Connection for Testing Receive Overload Point at

the Line Interface
IP/SDH/OTN Optical S C1R

generator attenuator LT OA+
R C1T
C2R MX2 Sn variable
C2T attenuator
Test C3R 50/50
C3T coupler
LR
Process CiR
Ci T Rn Optical power
meter
2. Set the SDH/OTN signal generator correctly, and send test signals to the board
under test.
Acceptan
ce PM-QPSK: ≥1 dBm
Criteria
Remarks
average receive optical power at reference point Rn when the BER reaches 10-12.
1.30.1.4 Central Frequency and Frequency Deviation

ites properly.
1. Create a test environment, as shown in the following figure. Use the signal
Figure 1-223 Central frequency Connection
SDH/OTN CiR LT Sn Multi-wavelength

Optical S
signal MX2 meter
attenuator
generator CiT LR
Rn
Test
Process
2. Set the SDH/OTN signal generator to send signals to the board under test, and
adjust the optical power to meet the requirements of the receive optical power of the
board.
formula ƒ=C/λ.
Acceptan
ce The frequency deviation of the OTU4 board: ≤±2.5 GHz
Criteria
Remarks

to the NCP.

the SDH/OTN signal generator to provide modulation signals for the
board under test.
C L
Optical R T
analyzer TST3 L
attenuator C
T R
Rn
Test Process
proper amplitude in the center of the screen for the convenience of
spectral width.
Acceptance 100G-rate board meets:

Criteria PM-QPSK: ≤0.6nm
Remarks
1.30.1.6 SMSR
Test Item SMSR
to the NCP.

use the SDH/OTN signal generator to send modulation signals to the
board under test.
Ci L
SDH/OTN S R Sn Spectrometer
Optical T
MX2 L
analyzer attenuator
CiT R
Rn
Test Process 2. Set the display wavelength range of the spectrometer and set the
3. Adjust the cursor to read the optical powers (dBm) of the primary
4. Calculate the difference between two power values to get the SMSR
(dB).
Acceptance
SMSR ≧35dB
Criteria
1.30.2 10-Channel 10G Aggregation Board (MX2)
MX2 board adopts SFP+ 10G pluggable module at the customer site.

Test
Item
Prerequi
sites
NCP.

Figure 1-4 Configuration of the Output Optical Power at the Client Side of
MX2
IP/ SDH/ S C1R

Optical LT
OTN R C1T Optical power
attenuator Sn
analyzer C2R meter
C2T MX2
Test
Process LR
C10R
C10T Rn
Output Power.
SDH service:
I64.1: -6~-1dBm
S64.2a: -5~-1dBm
Accepta S64.2b: -1~+2dBm
nce 10GE service:
Criteria 10GBASE-LR/LW: -8.2~ +0.5 dBm
10GFC service:
1200-SM-LL-L: -8.2~ +0.5 dBm
Remark
s

Test
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. The input

signals of the board under test are located in the 1550 nm window;
Figure 1-5 MX2 Optical Receiver Sensitivity Connection
Adjustable 50/ 50 S C1R

R C1T
/SDH/OTN attenuator
C2R MX2 Sn
Analyzer
C2T Optical
C3R attenuator
Optical power meter
C3T
LR
CiR
Test CiT Rn
Process
2. The SDH/OTN analyzer sends test signal to the board under test;
3. Adjust the variable optical attenuator 1 to gradually increase the
attenuation value with the bit error rate (BER) of 10-7.
of 10-8, 10-9, 10-10 and 10-11 respectively
SDH service:
I64.1: ≤-11dBm
S64.2a: ≤-18dBm
Accepta S64.2b: ≤-14dBm
nce 10GE service:
Criteria 10GBASE-LR/LW: ≤ -12dBm
10GBASE-ER/EW : ≤-14dBm
10GFC service:
1200-SM-LL-L: ≤ -14dBm
Remark
s

Test
Item
Prerequi
sites
NCP.

signals of the board under test are located in the 1550 nm window;
Figure 1-6 Configuration of the Receive Overload Point at the Line Side of
MX2
Adjustable 50/ 50 S C1R

R C1T
/SDH/OTN attenuator
C2R MX2 Sn
Analyzer
C2T Optical
Test C3R attenuator
Process Optical power meter
C3T
LR
CiR
CiT Rn
2. SDH/OTN analyzer sends testing signals;

3. Adjust the variable optical attenuator to gradually decrease the
attenuation value and make the BER to be close to but no greater than 10-12
SDH service:
I64.1: ≥-1dBm
S64.2a: ≥ -8dBm
Accepta S64.2b: ≥-1dBm
nce 10GE service:
Criteria 10GBASE-LR/LW: ≥+0 .5dBm
10GFC service:
1200-SM-LL-L: ≥+0 .5dBm
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
1. Self-loop the SDH/OTN analyzer with a short-circuit fiber, and then

calibrate the SDH analyzer. Pleased be noticed that you should control the
receive optical power of the meter to avoid damage to the receive interface
from strong light.
Test
adjust the optical attenuator, so that the tested board can receive a proper
Process
optical power. Make the input optical power of the SDH/OTN analyzer equal
to that of the self-looped analyzer in step 1. Configure the test environment.
3. Test certain items with the input jitter tolerance test template of the
SDH/OTN analyzer and observe whether the test results are above the
template.
Figure 1-7 Input Jitter Tolerance of MX2 Input Interface
LT LR
SDH/ OTN Optical Ra Sa Optical

MX2 attenuator
analyzer attenua
tor 1 2
A2
Accepta
nce
Criteria A1
f0 f1 f
STM-1 (A) 65 6.5 0.15 1.5
STM-4 (A) 250 25 0.15 1.5
STM-16 (A) 1000 100 0.15 1.5
STM-64 (A) 4000 400 0.15 1.5
STM-256 (A) 16000 400 0.15 6
Remark test.;
the meter.

to the NCP.

and use the SDH/OTN analyzer to provide modulation signals to the
board under test.
LT LR
SDH/ OTN Optical Ra Sa Optical

MX2 attenuator
analyzer attenua
tor 1 2
Test Process
2. Set the SDH/OTN signal generator to allow the SDH output signals
to access the receive optical interface of the board under test and adjust
Peak-to-Peak
Value of Jitter
500Hz~1.3MHz 0.30 UI
STM-1
1000Hz~5MHz 0.30 UI
Acceptance STM-4
250kHz~5MHz 0.10 UI
Criteria
5000Hz~20MHz 0.30 UI
STM-16
1MHz~20MHz 0.10UI
20kHz~80MHz 0.30 UI
STM-64
4MHz~80MHz 0.10 UI
20 kHz~320 MHz 6.0 UI

STM-256
16 MHz ~320 MHz 0.15 UI
test..
Remarks

to the NCP.
1. Self-loop the SDH/OTN analyzer with a short-circuit fiber, and then

calibrate the SDH/OTN analyzer. Pleased be noticed that you should
control the receive optical power of the meter to avoid damage to the
receive interface from strong light.
proper optical power. Make the input optical power of the SDH/OTN
analyzer equal to that of the self-looped analyzer in step 1. Configure
3. Test certain items and templates with the SDH/OTN analyzer and
Acceptance 10G OTU jitter transfer function should meet the requirements of ITU-T
Criteria G.783.

1.31 M2 LS4 of 100G Line Board
1.31.1 Optical Interface at the Line Side of the LS4 Board
1.31.1.1 Overall Average Transmit Optical Power at the Transmit End

Test
Item
Prerequi
sites
NCP.
1. Configure the test environment according to the following figure and set
the service mapping and time cross connection properly.
Figure 1-9 LS4 Connection for Testing Optical Output Power at Line Side
Test
Process
2. Set the 100GE/OTN signal generator to send test signal to the board
Output Power.
Accepta
nce PM-QPSK: -5~3dBm
Criteria
Remark
s

Test
Item
Prerequi
sites
NCP.
Figure 1-10 LS4 Optical Receiver Sensitivity Connection
Test
Process
2. The 100GE/OTN analyzer sends test signal to the CS4 board.
attenuation value with the bit error rate (BER) of 10-7.
4. Read the optical power from the optical power meter and record it;
the receiver sensitivity
Accepta
nce PM-QPSK: ≤-15dBm
Criteria
Remark
s
window and the BER reaches 10-12

Test
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure and set the
service mapping and time cross connection properly.
Figure 1-11 Configuration of the Receive Overload Point at the Line Side of
LS4
Test
Process
2. Set the 100GE/OTN analyzer correctly and send signals to CS4 board.
attenuation value and make the BER to be close to but no greater than 10-12
Accepta
nce PM-QPSK: ≥1dBm
Criteria
Remark
s
reaches 10-12.
Test
Item
Prerequi
sites
NCP.
service mapping and time cross connection properly.
Figure 1-12 Configuration of the Receive Overload Point at the Line Side
of LS4
Test
Process
2. Set the 100GE/OTN analyzer correctly and send signals to CS4 board.
Accepta
nce PM-QPSK: ≥1dBm
Criteria
Remark
s
reaches 10-12.

Test
Item
Prerequi
sites
NCP.
Test
2. Set the 100GE/OTN signal generator to send test signals to the CS4
Process
board, and adjust the optical power to meet the requirements for the receive
optical power of CS4.
value is the central wavelength offset value. Use the optical wavelength
meter to test LS4 board directly (CS4 and cross-connection are not needed).
Accepta
For the OTU4 board, the deviation should be:
nce
≤±2.5GHz
Criteria

to the NCP.

and set the timeslot cross connection properly.
Test Process
reading.
spectral width.
Acceptance 100G-rate board should meet the following requirements:

Criteria PM-QPSK: ≤0.6nm
Remarks
the power of the maximum peak falls by 20dB..
1.31.1.6 SMSR
Test Item SMSR
to the NCP.

set the timeslot cross connection properly.
Test Process
resolution of the spectrometer to the minimum value.
3. Adjust the amplitude scale of the spectrometer so that the primary
longitudinal mode and the side mode can be displayed with proper
amplitude in the center of the screen to facilitate observation and
reading.
4. Adjust the cursor to read the optical powers (dBm) of the primary
5. Calculate the difference between two power values to get the SMSR
(dB).
Acceptance
SMSR ≧35dB
Criteria
1.32 M2 CS4 – 100G Client Board
1.32.1 Client-Side Optical Interface of CS4 Board
1.32.1.1 Central Wavelength and Frequency Deviation at the Transmit End

Test
Central Wavelength and Frequency Deviation at the Transmit End
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. Wait until

the CS4 board works in normal state.
C
S R
Optical CS4
Test
wavelength RC
Process
meter T
2. Set the display wavelength range of the multi-wavelength analyzer to,

and then read and record the central wavelength value at the peak.
3. The difference between the tested central wavelength value and its
Index of the 1000GBASE LR4/ER4 module: 4*25G/28G

Accepta Lane0: 1295.56 nm range: 1294.53 to 1296.59 nm
nce Lane1: 1300.05 nm range: 1299.02 to 1301.09 nm
Criteria Lane2: 1304.58 nm range: 1303.54 to 1305.63 nm
Lane3: 1309.14 nm range: 1308.09 to 1310.19 nm
Remark
s
1.32.1.2 Overall Average Transmit Optical Power at the Transmit End

Test
Overall Average Transmit Optical Power at the Transmit End
Item
Prerequi
sites
NCP.

the OTU board works in normal state.
CS4
Test C
S R
Process Optical CS4
wavelength RC
meter T
2. Set the optical power meter in the suitable wavelength window

(1310nm). After the reading is stable, read and record the optical power.
100GBASE-LR4 (4I1-9D1F): +1.7dBm~+10.5dBm

Accepta
100GBASE-ER4 (4L1-9C1F): +3.1dBm~+8.9dBm
nce
LR4 indicates the 10km module
Criteria
ER4 indicates the 40km module
Remark
s

Test
Optical Receiver Sensitivity (four client channels)
Item
Prerequi
sites
NCP.

signal of the board under test is in the 1310nm window.
100GE/OT C L Sn
Adjustable S R
N 50/50 T Optical
optical C CS4 LS4 L
analyzer coupler attenuator
attenuator R T R
Rn
Optical power
meter
Test
2. The 100GE/OTN analyzer sends test signals to the board under test;
Process
analyzer.
Accepta
100GBASE-LR4 (4I1-9D1F): ≤-2.6dBm
nce
100GBASE-ER4 (4L1-9C1F): ≤-15.6dBm
Criteria
Remark
s
1.32.1.4 Receive Overload Optical Power

Test
Overload Optical Power (four client channels)
Item
Prerequi
sites
NCP.

signal of the board under test is in the 1310nm window. CS4 is cross
connected to LS4 (CS4 is configured with backplane-side loopback).
Figure 1-18 CS4 Connection for testing receive overload point at the client
side
100GE/OT C L Sn
Variable S R
N 50/50 T Optical
optical C CS4 LS4 L
analyzer coupler attenuator
attenuator R T R
Test Rn
Process
Optical power
meter
2. The 100GE/OTN analyzer sends test signals to the board under test.
Accepta
nce ≥+10.5dBm
Criteria
Remark
s
reaches 10-12.
1.32.1.5 Single-Channel Average Transmit Optical Power

Test
Single-Channel Average Transmit Optical Power
Item
Prerequi
sites
NCP.

the OTU board works in normal state.
CS4
Lane0
Test
S Lane1 Optical
Process Demul power
CS4 tiplexe Lane2 meter
r
Lane3
2. Set the optical power meter in the suitable wavelength window

(1310nm). After the reading is stable, read and read the optical power.
Accepta 100GBASE-LR4 (4I1-9D1F): -4.3dBm~+4.5dBm

nce 100GBASE-ER4 (4L1-9C1F): -2.9dBm~+2.9dBm
Criteria
Remark This test item requires a demultiplexer with special wavelength. It is not
s applicable on site. You can read the value from the network management.
1.32.1.6 Single-Channel Optical Receiver Sensitivity

Test
Single-Channel Optical Receiver Sensitivity
Item
Prerequi
sites
NCP.
cross connection between CS4 boards.
Optical
power meter
Lane0 Variable
optical
attenuator/amp
ODU4 Lane1 lifier
cross Multi
S Demulti plex
connection Lane2
plexer er
R
100GE/OTN Lane3
analyzer S CS4 CS4
Test
2. The100GE/OTN analyzer sends test signals to CS4 board.;
Process
analyzer.
Accepta
100GBASE-LR4 (4I1-9D1F): ≤-8.6dBm
nce
100GBASE-ER4 (4L1-9C1F): ≤-21.4dBm
Criteria
Remark This test item requires a multiplexer/demultiplexer with special wavelength.

s It is not applicable on site.
1.32.1.7 Single-Channel Overload Optical Power

Test
Single-Channel Overload Optical Power
Item
Prerequi
sites
NCP.

signal of the board under test is in the 1310nm window.
Figure 1-21 CS4 Connection for testing receive overload point at the client
side
Optical
power meter
Lane0 Variable
optical
attenuator/amp
ODU4 Lane1 lifier
cross Multi
S Demulti plex
Test connection Lane2
plexer er
R
100GE/OTN Lane3
analyzer S CS4 CS4
Process
R
2. The 100GE/OTN analyzer sends test signals to the board under test.
10-12.
4. Overload Optical Power. The optical power value read from the optical
power meter indicates the overload optical power of the receiver.
Accepta
nce ≥+4.5dBm
Criteria
Remark This test item requires a multiplexer/demultiplexer with special wavelength.

s It is not applicable on site.
1.33 OMU—Multiplexer Board
1.33.1 Insertion Loss and the Maximum Insertion Loss Difference of Each
Channel
Test Insertion Loss and the Maximum Insertion Loss Difference of Each
Item Channel
Prerequi
sites
the NCP.
1) The needed materials include a variable laser source, an optical
power meter, optical fiber jumpers and the OMU board under test.
Figure 1-224 Configuration of the OMU Insertion Loss
OU Optical
Variable IN1
T power
optical source IN2
meter
OMU under
test
INn
Test 2. Test method:

Process
2) Connect the devices according to the dotted lines in the above figure.
Adjust the output wavelength of the variable laser optical source and set it
to the wavelength of the working port n of the board under test. Test the
optical power and record the value as Pi(λ).
3) Connect the devices according to the solid lines in the above figure.
Test the optical power passed by the port n of the board under test, and
record the value as Pno(λ) in unit of dBm. The insertion loss is calculated
by the following formula: Lossn(λ)=Pi(λ)-Pno(λ) (unit: dB).
4) Repeat step 2 and step 3 multiple times to test the insertion loss of
each port.
5) Calculate the difference between the maximum and minimum values
of the insertion losses of each port. This difference is the maximum
difference between the insertion losses of each channel.
1. Insertion loss:
1) Wavelength insensitive:
Coupler:≤17 dB(for 32 channels)
Accepta Coupler:≤19 dB(for 40 channels)
nce
Coupler:≤22 dB(for 80 channels)
Criteria
2) Wavelength sensitive:
AWG/TFF: ≤10 dB
2. Maximum insertion loss difference of each channel ≤3dB
Remark
s
1.33.2 Isolation between Adjacent Channels

Test
Isolation between Adjacent Channels
Item
Prerequi
sites
the NCP.
Figure 1-225 Configuration of OMU Isolation between Adjacent Channels
OU Optical
Variable IN1
T power
optical source IN2
meter
OMU under
test
INn
Test
Process
2. Test method:
1) Configure the test environment according to the solid line shown in the
above figure.
2) Adjust the output wavelength of the variable laser source as the
wavelength λn of channel n (n=1, 2 …) of the board under test.
3) Test the port optical power of channel n to get the value Pno, and test
optical power of the channel m (m=1,2… and m≠n) to get the value Pmo
(unit: dBm).
4) The isolation between channel m and channel n is Pno-Pmo (unit: dB).
5) Repeat these procedures multiple times to get the isolation of each
channel.
Accepta
nce ≥25dB
Criteria
Remark
s
1.33.3 Isolation between Non-adjacent Channels

Test
Isolation between Non-adjacent Channels
Item
Prerequi
sites
NCP.
1) The needed materials include a variable laser source, an optical power
meter, optical fiber jumpers and the OMU board under test.
Figure 1-226 Configuration of OMU Isolation between Non-adjacent
Channels
OU Optical
Variable IN1
T power
optical source IN2
meter
OMU under
test
Test INn
Process
2. Test method:
1) Configure the test environment according to the solid line shown in the
above figure.
3) Test the port optical power of channel n to get the value Pno, and test
optical power of the channel m (m=1,2… and m≠n) to get the value Pmo
(unit: dBm).
4) The isolation between channel m and channel n is Pno-Pmo (unit: dB).
channel.
Accepta
nce ≥25dB
Criteria
Remark
s
1.34 ODU—De-Multiplexer Board
Channel
Item Channel
Prerequi
sites
the NCP.
Figure 1-227 Configuration of ODU Insertion Loss
OU Optical
Variable IN1
T power
optical source IN2
meter
OMU under
test
INn
2. Test method:
Test
Process
each port.
Accepta
Insertion loss ≤ 10dB
nce
Maximum insertion loss difference of each channel ≤ 3dB
Criteria
Remark
s
1.34.2 Isolation between Adjacent Channels

Test Item Isolation between Adjacent Channels
Prerequisit
es
to the NCP.
Figure 1-228 Configuration of ODU Isolation between Adjacent
Channels
OU Optical
Variable IN1
T power
optical source IN2
meter
OMU under
test
INn
Test
Process
2. Test method:
1) Configure the test environment according to the solid line shown in
the above figure.
3) Test the port optical power of channel n to get the value Pno, and
test optical power of the channel m (m=1,2… and m≠n) to get the value
Pmo (unit: dBm).
4) The isolation between channel m and channel n is Pno-Pmo (unit:
dB).
channel.
Acceptanc
Isolation between adjacent channels ≥25dB
e Criteria
Remarks
1.34.3 Isolation between Non-adjacent Channels

Test Item Isolation between Non-adjacent Channels
Prerequisit
es
to the NCP.
Figure 1-229 Configuration of ODU Isolation between Non-adjacent
Channels
OU Optical
Variable IN1
T power
optical source IN2
meter
OMU under
test
INn
Test
Process
2. Test method:
1) Configure the test environment according to the solid line shown in
the above figure.
3) Test the port optical power of channel n to get the value Pno, and
test optical power of the channel m (m=1,2… and m≠n) to get the value
Pmo (unit: dBm).
4) The isolation between channel m and channel n is Pno-Pmo (unit:
dB).
channel.
Acceptanc
Isolation between Non-adjacent Channels ≥25dB
e Criteria
Remarks
1.35 VMUX—Pre-Equalization Multiplexer Board
Channel
Item Channel
Prerequi
sites
the NCP.
Figure 1-230 Configuration of the VMUX Insertion Loss
IN1
Optical
Variable OUT
VMUX power
optical source
meter
IN40
2. Test method:
Test 1) Create a test environmen according to the above figure.
Process
each port.
Accepta
Insertion loss ≤ 10dB
nce
Maximum Insertion Loss Difference of Each Channel ≤ 3dB
Criteria
Remark
s
1.36 SOAD/OAD—Optical Add/Drop Multiplexer Board
Channel
Test Item Insertion Loss and the Maximum Insertion Loss Difference of Each
Channel
Prerequisites 1. Pass the primary power supply test and the fan unit test. The
the NCP.
Test Process
power meter and optical fiber jumpers.
Figure 1-231 Configuration of OAD Insertion Loss
Variable
A1
optical Optical
A2 OUT
source power
A3 meter
A4/8
Optical
MID2
power
MID1 OAD meter
Optical D1
power Variable
D2 IN
meter optical
D3
source
D4/8
Variable
optical
source
2. Test method:
1) Connect the test devices according to the purple lines in the above
figure. Test the insertion loss of IN-DROP.2) Connect the devices
according to the purple dotted lines in the above figure. Adjust the output
wavelength of the variable laser optical source and set it to the
wavelength of the working port Dn of the board under test. Test the
Test the optical power passed by the port Dn of the board under test, and
4) Repeat step 2 and step 3 multiple times to test the insertion loss
between IN and each DROP port.
of the insertion losses between IN port and each DROP port. This
difference is the maximum difference between the insertion losses
between IN and each DROP port.
6) Connect the test devices according to the red lines in the above
figure. Test the insertion loss of IN-DROP.
7) Connect the devices according to the red dotted lines in the above
figure. Adjust the output wavelength of the variable laser optical source
and set it to the wavelength of the working port An of the board under
test. Test the optical power and record the value as Pi(λ).
8) Connect the devices according to the red solid lines in the above
figure. Test the optical power passed by the port An of the board under
test, and record the value as Pno(λ) in unit of dBm. The insertion loss is
calculated by the following formula: Lossn(λ)=Pi(λ)-Pno(λ) (unit: dB).
9) Repeat step 7 and step 8 multiple times to test the insertion loss
between OUT and each ADD port.
10)Calculate the difference between the maximum and minimum values of the
insertion losses between OUT port and each ADD port. This difference is the
maximum difference between the insertion losses between the OUT port and
each ADD port.
11)Connect the test devices according to the blue lines in the above
figure. Test the insertion loss of IN-OUT.
12)Connect the devices according to the blue dotted lines in the above
figure. Adjust the output wavelength of the variable laser optical source
and set it to the wavelength of the working port MID of the board under
test. Test the optical power and record the value as Pi(λ).
13)Connect the devices according to the blue solid lines in the above
figure. Test the optical power passed by the MID port of the board under
test, and record the value as Pno(λ) in unit of dBm. The insertion loss of
channel n is calculated by the following formula: Lossn(λ)=Pi(λ)-Pno(λ)
(unit: dB).
14)Repeat step 12 and step 13 multiple times to test the insertion loss
between OUT and IN ports at each working wavelength.
15)Calculate the difference between the maximum and minimum values of the
insertion losses between OUT and IN ports at each working wavelength. This
difference is the maximum difference between the insertion losses between OUT
and IN ports.
Acceptance 1. Insertion loss of the ADD-OUT port:

Criteria 1) 4-channel Add/Drop: ≤4dB
2) 8-channel Add/Drop: ≤4dB
2. The maximum insertion losse difference of the ADD-OUT port ≤2dB
3. Insertion loss of the IN-Drop port:
4. The maximum insertion losse difference of the IN-DROP port ≤2dB
5. Insertion loss of the IN-OUT port:
6. The maximum insertion losse difference of the IN-OUT port ≤2dB
Remarks
1.36.2 Channel Isolation

Test Item Channel Isolation
Prerequisi
tes
the NCP.
Figure 1-232 Configuration of the OAD Channel Isolation
Variable
A1
optical Optical
A2 OUT
source power
A3 meter
A4/8
Optical
MID2
power
MID1 OAD meter
Optical D1
power Variable
D2 IN
meter optical
D3
source
D4/8
Variable
optical
source
2. Test method:
Test
1) Connect the test devices according to the purple solid lines in the
Process
above figure. Test the isolation of the drop port.
2) Adjust the output wavelength of the variable optical source and set it
to the wavelength λn of the drop port of channel n (n=1~8) of the OAD
board under test.
3) Test the optical power of the drop port of channel n, and record the
value as Pno. Test the optical power of drop port of channel m
(m=1,2,…,m≠n), and record the value as Pmo (the unit of optical power is
dBm).
4) The isolation of n drop channel at channel m is Pno-Pmo (unit: dB).
5) Repeat step 2.
6) Test the optical power of the drop port of channel n, and record the
value as Pno. Test the optical power of the output port according to the
blue solid line in the above figure, and record the value as Pmo (the unit
of optical power is dBm).
7) The isolation of the n drop channel at the direct-through port is
Pno-Pmo (unit: dB).
8) Repeat step 2 to step 7 multiple times to test each isolation.
1. Adjacent isolation of the drop port ≥25 dB.
Acceptan
2. Non-adjacent isolation of the drop port ≥30 dB.
ce
3. Isolation between In-Mid1 and Drop ≥14 dB.
Criteria
4. Isolation between In-Out and Drop ≥28 dB.
Remarks
1.37 SOGMD/OGMD—Optical Combined

De-Multiplexer Board
Channel
Item Channel
Prerequi
sites
the NCP.
Figure 1-233 Configuration of the OGMD Insertion Loss
Variable Optical
RI OUT
optical power
BI
source meter
Optical
RO OGMD Variable
BO IN
power optical
meter source
2. Test method:
1) Connect the test devices according to the purple lines in the above
figure. Test the insertion loss at the de-multiplex direction.
Test 2) Connect the devices according to the purple dotted lines in the above
Process figure. Adjust the output wavelength of the variable laser optical source and
set it within the wavelength range of the working port RO/BO of the board
under test. Test the optical power and record the value as Pi(λ).
3) Connect the devices according to the purple solid lines in the above
figure. Test the optical power passed by the RO and BO ports of the board
under test, and record the value as Pno(λ) with the dBm unit. The RO/BO
insertion loss is calculated by the following formula: Lossn(λ)=Pi(λ)-Pno(λ)
(unit: dB).
4) Connect the test devices according to the red lines in the above figure.
Test the insertion loss at multiplex direction.
5) Connect the devices according to the red dotted lines in the above
figure. Adjust the output wavelength of the variable laser optical source and
set it within the wavelength range of the working port RI/BI of the board
under test. Test the optical power and record the value as Pi(λ).
6) Connect the devices according to the red solid lines in the above
figure. Test the optical power passed by the RI/BI port of the board under
test, and record the value as Pno(λ) with the dBm unit. The RI/BI insertion
loss is calculated by the following formula: Lossn(λ)=Pi(λ)-Pno(λ) (unit: dB).
Accepta
Insertion loss ≤2dB
nce
Maximum insertion loss difference of each channel ≤1dB
Criteria
Remark
s
1.37.2 Isolation
Test
Isolation
Item
Prerequi
sites
the NCP.
Figure 1-234 Configuration of the OGMD Isolation
Variable Optical
RI OUT
optical power
BI
source meter
Optical
RO OGMD Variable
BO IN
power optical
meter source
2. Test method:
1) Connect the test devices according to the purple solid lines in the
above figure. Test the isolation at the de-multiplex direction. 2) Adjust
the output wavelength of the variable optical source and set it within the
wavelength range of RO port for the OGMD board under test.
3) Test the optical power of the RO port, and record the value as Pno.
Test the optical power of BO port, and record the value as Pmo (the unit of
optical power is dBm).
Test 4) The isolation of the RO port at BO port is Pno-Pmo (unit: dB).
Process 5) Adjust the output wavelength of the variable optical source and set it
within the wavelength range of BO port for the OGMD board under test.
6) Test the optical power of the BO port, and record the value as Pno.
Test the optical power of RO port, and record the value as Pmo (the unit of
7) The isolation of the BO port at RO port is Pno-Pmo (unit: dB).
8) Connect the test devices according to the red solid lines in the above
figure. Test the isolation at the multiplex direction. 9) Adjust the output
wavelength of the variable optical source and set it within the wavelength
range of RI port for the OGMD board under test.
10) Test the optical power of the RI port, and record the value as Pno.
Test the optical power of BI port, and record the value as Pmo (the unit of
11) The isolation of the RI port at BI port is Pno-Pmo (unit: dB).
12) Adjust the output wavelength of the variable optical source and set it
within the wavelength range of BI port for the OGMD board under test.
13) Test the optical power of the BI port, and record the value as Pno. Test
the optical power of RI port, and record the value as Pmo (the unit of optical
power is dBm).
14) The isolation of the BO port at RO port is Pno-Pmo (unit: dB).
Accepta
Isolation between adjacent channels ≥20 dB
nce
Isolation between non-adjacent channels ≥25 dB
Criteria
Remark
s
1.38 OCI—Optical Multiplexer/De-Multiplexer Board
Channel
Item Channel
Prerequi
sites
the NCP.
Figure 1-235 Configuration of the OCI Insertion Loss
OUT1
Variable IN OUT2 Optical power

optical source meter
OCI
Test
Optical power OUT IN1 Variable
Process meter optical source
IN2
2. Test method:
2) Adjust the output wavelength of the variable laser optical source and
set it to the wavelength of the working port IN of the board under test. Test
the optical power and record the value as Pi(λ).
3) Test the optical power passed by the port OUT1/OUT2 of the board
under test, and record the value as Pno(λ) in unit of dBm. The insertion loss
is calculated by the following formula: Lossn(λ)=Pi(λ)-Pno(λ) (unit: dB).
4) Test the insertion loss from IN1/IN2 to the port OUT.
Accepta
Insertion loss≤3dB
nce
Maximum insertion loss difference of each channel ≤1dB
Criteria
Remark
s
1.38.2 Isolation
Test
Isolation
Item
Prerequi
sites
the NCP.
Figure 1-236 Configuration of the OCI Isolation
OUT1
Variable IN OUT2 Optical power

optical source meter
Test OCI
Process Optical power OUT IN1 Variable
meter optical source
IN2
2. Test method:
1) Create a test environmen according to the above figure. Select the
working wavelength whose optical source wavelength is OUT2, and then
test the optical input power Pi of the IN port.
2) Test the optical power Po of the OUT2 port passed by the board under
test.
3) Calculate the isolation according to the following formula: IL = Pi-Po.
4) Repeat steps 1 t o3 to test the isolation of other ports.
Accepta
nce Isolation ≥25 dB
Criteria
Remark
s
1.39 SDMT/SDMR—Supervision Add/Drop Multiplexer

Board
1.39.1 Insertion Loss

Test
Insertion Loss
Item
Prerequi
sites
the NCP.
2) The test configuration is shown in the following two figures.
Figure 1-237 Configuration of the ADMR Insertion Loss
Optical
Variable Out power
optical In SDMR under meter
source test Sout Optical
power
meter
Figure 1-238 Configuration of the SDMT Insertion Loss
Variable In Optical
Test optical Out power
SDMT under
Process source meter
Sin test
2. Test method:
1) Create a test environmen according to the above figures.
set it to the wavelength range (192.1THz ~ 196.0THz) of the working port
IN of the board under test. Test the optical power and record the value as
Pi(λ).
3) Test the optical power passed by the out port of the board, and record
it as P0(λ) in unit of dBm.
4) Calculate the insertion loss of the SDMR/SDMT board according to
the following formula: Lossn(λ)=Pi(λ)-Po(λ) (unit: dB).
Accepta
nce Insertion loss≤2 dB
Criteria
Remark
s
1.39.2 Isolation
Test
Isolation
Item
Prerequi
sites
the NCP.
Figure 1-239 Configuration of the SDMR Isolation
Optical
Variable Out power
optical In SDMR under meter
source test Sout
Figure 1-240 Configuration of the SDMT Isolation
In Optical
Out power
Test SDMT under
Variable Sin meter
test
Process optical
source
2. Test method:
1) Create a test environmen according to the above figures.
set it to the wavelength of the optical monitoring channel (1510±10nm).
Test the optical power of the source, and record it as Pi(λ).
4) Calculate the isolation of the SDMR/SDMT board for the supervision
signal wavelength according to the following formula: Lossn(λ)=Pi(λ)-Po(λ)
(unit: dB).
1) SDMT:
IN→OUT (@λSIN): ≥12dB
Accepta
SIN→OUT (@λIN):≥20dB
nce
2)SDMR:
Criteria
IN→OUT (@λSOUT):≥12 dB
IN→SOUT (@λOUT):≥40 dB
Remark
s
1.40 PDU—Power Distribution Unit
Channel
Item Channel
Prerequi
sites
the NCP.
Figure 1-241 Configuration of the PDU Insertion Loss
OU
IN1 D1
Variable T
O1-1
optical
O1-1
source Po
Pi PDU
O1-m
Test INn
Process
2. Test method:
each port.
PDU4-4: INn-On-m ≤8dB

Accepta PDU5-4: INn-Dn≤4dB, INn-On-m≤12dB
nce PDU8-2: INn-On-m ≤11dB
Criteria PDU9-2: INn-Dn≤4dB, INn-On-m≤15dB
PDU16-1: INn-On-m≤14dB
Remark
s
1.41 WBU—Wavelength Block Board

Test
Insertion Loss
Item
Prerequi
sites
the NCP.
1) The needed materials include a broadband source, a spectrometer,
optical fiber jumpers, the board under test and the EMS.
Figure 1-242 Configuration of the WBU Insertion Loss
Variable Optical
IN OUT
optical WBU under test power
source 1 meter 2
DROP1 ADD1
Optical Variable
power optical
meter 1 source 2
2. Test method:
2) Use the computer to control the wavelength channel direct-through of
the board under test with the attenuation of 0. Adjust the wavelength of the
variable optical source 1 to set the output wavelength to a value within the
working wavelength range. Measure the optical output power P1 of the
variable optical source 1 according to the dotted lines in the above figure.
3) Configure the test environment according to the solid lines in the
Test
above figure and measure the optical output power P1’ of the board at the
Process
optical power meter 2.
4) Calculate the insertion loss of the direct-through channel as P1-P1’.
5) Repeat steps 2 to 5. Change the wavelength of the direct-through
channel, and test the insertion loss of direct-through channels of other
wavelengths within the working wavelength range.
6) Adjust the wavelength of the variable optical source 1 to set the output
wavelength to a value within the working wavelength range. Measure the
optical output power P2 of the optical source at the optical power meter 1
according to the dotted lines in the above figure.
8) Calculate the DROP insertion loss as P2-P2’.
9) Adjust the wavelength of the variable optical source 2 to set the output
wavelength to a value within the working wavelength range. Measure the
optical output power P3 of the optical source at the optical power meter 2
according to the dotted lines in the above figure.
11) Calculate the ADD insertion loss as P3-P3’.
1. WBU/AD1
1) Insertion loss of the IN-Drop port: ≤3.5dB
2) For the insertion loss of the ADD-OUT port ≤1.5dB
3) Insertion loss of the IN-OUT port ≤17dB
Accepta
2. WBU/AD2
nce
1) Insertion loss of the IN-DROP1 port ≤11dB
Criteria
2) Insertion loss of the IN-DROP2 port ≤1.5dB
3) Insertion loss of the ADD1-OUT port ≤11dB
4) Insertion loss of the ADD2-OUT port ≤1.5dB
5) Insertion loss of the IN-OUT port ≤28dB
Remark
s
1.42 WSUA/WSUD—Wavelength Selection Board

Test Item Insertion Loss
the NCP.
1) The needed materials include a broadband source, a
spectrometer, optical fiber jumpers, the board under test and the EMS.
Figure 1-243 Configuration of the WBU Insertion Loss
Variable Optical
optical WSU under test power
source 1 meter 2
DROP1 DROP8 ADD1 ADD2
Optical Variable
power optical
meter 1 source 2
2. Test method:
2) Use the computer to control the wavelength channel
direct-through of the board under test with the attenuation of 0. Adjust
the wavelength of the variable optical source 1 to set the output
wavelength to the value. Measure the optical output power P1 of the
variable optical source 1 according to the dotted lines in the above
figure.
above figure and measure the optical output power P1’ of the board at
Test Process
the optical power meter 2.
4) Calculate the insertion loss of the direct-through channel as
P1-P1’.
5) Repeat steps 2 to 5. Change the wavelength of the direct-through
channel, and test the insertion loss of direct-through channels of other
wavelengths within the working wavelength range.
6) Use the computer to control the wavelength channel DROP from
one port of the board under test with the attenuation of 0. Adjust the
wavelength of the variable optical source 1 to set the output
wavelength to the value. Measure the optical output power P2 of the
variable optical source 1 according to the dotted lines in the above
figure.
8) Calculate the DROP insertion loss as P2-P2’.
9) Adjust the wavelength of the variable optical source 2 to set the
output wavelength to a value within the working wavelength range.
Measure the optical output power P3 of the optical source at the
optical power meter 2 according to the dotted lines in the above figure.
1. WSUA/MD1
1) Insert loss of IN-D1 port ≤2dB
2) Insert loss of IN-Exout port ≤9dB
3) Insert loss from A1 to A8-OUT ports ≤8dB
4) Insert loss of ExinIN-OUT port ≤8dB
2. WSUA/MD2
1) Insert loss of IN-D1 port ≤2dB
2) Insert loss of IN-D2 port≤10dB
3) Insert loss of IN-Exout port≤16dB
4) Insert loss from A1 to A8-OUT ports≤8dB
5) Insert loss of ExinIN-OUT port≤8dB
3. WSUA/E
Acceptance 1) Insert loss from A1 to A9-OUT ports≤8dB
Criteria 4. WSUD/MA1
1) Insert loss of A1-OUT port ≤2dB
2) Insert loss of IN-Exout port ≤8dB
3) Insert loss from IN-D1 to D8 port≤8dB
5. WSUD/MA1
1) Insert loss of A1-OUT port≤10dB
2) Insert loss of A2-OUT port≤2dB
3) Insert loss of IN-Exout port≤8dB
4) Insert loss from IN-D1 to D8 ports ≤8dB
6. WSUD/E
1) Insert loss from IN-D1 to D9 ports 8dB
Remarks N/A
1.43 LAC—Line Attenuation Control Board

Test
Insertion Loss
Item
Prerequi
sites
the NCP.
Figure 1-244 Configuration of the LAC Insertion Loss
IN
U n d er test OUT O p tical p o w er
O p tical so u rce
LAC m eter
Test
Process
2. Test method:
2) Set the attenuation of the LAC board to the minimum value.
set it to the wavelength range (192.1THz ~ 196.0THz) of the working port
IN of the board under test. Test the optical power and record the value as
Pi(λ).
5) Calculate the insertion loss of the board according to the following
formula: Lossn(λ)=Pi(λ)-Po(λ) (unit: dB).
Accepta
LAC: ≤2dB
nce
LAC-GFF: ≤5dB
Criteria
Remark
s
1.44 OA—Optical Amplifier
1.44.1 Maximum Overall Optical Output Power

Test Item Maximum Overall Optical Output Power
to the NCP.
Figure 1-245 OA Maximum Overall Optical Output Power
Variable
Variable Optical
optical
Test Process optical OA under test power
attenuat
source meter
or
2. Test method:
optical input power of the board under test. Check and record the
maximum optical output power.
SEOPA1717: ≤17dBm
SEOPA2217: ≤17dBm
SEOPA2717: ≤17dBm
SEOBA1717: ≤17dBm
Acceptance SEOBA2220: ≤20dBm
Criteria EOBAH2424: ≤24dBm
EOBAH2626: ≤26dBm
EONA2520: ≤20dBm
EONA3320: ≤20dBm
SEOLA2220: ≤20dBm
Remarks
1.44.2 Noise Coefficient

Test Item Noise Coefficient
to the NCP.
1) The needed materials include a multi-wavelength optical source,
a spectrometer, optical fiber jumpers, and the board under test.
Figure 1-246 Configuration of the OA Noise Coefficient
Variable
multi-
optical OA under test spectro
wavelength
attenuat meter
optical source
or
2. Test method:
Test Process 1) Create a test environmen according to the above figure. The
spectrometer performs the EDFA automatic analysis function.
2) Adjust the variable optical attenuator to set the optical input power
of the OA within the normal working range.
3) Configure the test environment according to the dotted lines
shown in the above figure and use the spectrometer to test the OA
input.
4) Configure the test environment according to solid lines shown in
the above figure and use the spectrometer to test the OA input.
5) Perform the EDFA automatic analysis function of the
spectrometer to test the noise coefficient and gain of each channel.
EOBAH: ≤6 dB
SEOBA: ≤6 dB
Acceptance
SEOLA: ≤6 dB
Criteria
SEOPA: ≤5.5 dB
EONA: ≤6 dB
Remarks
1.44.3 Signal Gain

Test Item Signal Gain
to the NCP.
Figure 1-247 Configuration of the OA Signal Gain
Variable
Optical
Variable optical OA under test power
optical source attenuat
meter
or
.
Test Process
2. Test method:
of the board under test within the normal working range.
3) Measure the optical input and output powers of the OA.
4) The difference between the optical output power (dBm) and the
optical input power (dBm).
SEOPA1717: 17dB
SEOPA2217: 22dB
SEOPA2717: 27dB
SEOBA1717: 17dB
Acceptance SEOBA2220: 22dB
Criteria EOBAH2424: 24dB
EOBAH2626: 26dB
EONA2520: 25dB
EONA3320: 33dB
SEOLA2220: 22dB
Remarks
1.44.4 Gain Flatness

Test Item Gain Flatness
to the NCP.
Figure 1-248 Configuration of the OA Gain Flatness
Variable
multi-
optical OA under test spectro
Test Process wavelength
attenuat meter
optical source
or
2. Test method:
1) Measure the gain of the OA under each channel with reference to
the method described in chapter 1.42.4.
2) The difference between the maximum and minimum values of the
gain indicates the gain flatness.
Acceptance
Gain Flatness ≤2dB
Criteria
Remarks
1.44.5 Gain Slope

Test Item Gain Slope
to the NCP.
Refer to chapter 1.42.2.
Test Process
2. Test method:
Refer to chapter 1.42.2.
Acceptance
Gain Slope ≤2dB/dB
Criteria
Remarks
1.45 DRA—Distributed RAMAN Amplifier
1.45.1 Signal Gain

Test Item Signal Gain
to the NCP.
Figure 1-249 Configuration of the OA Signal Gain
Variable
Variable Optical
optical
optical DRA power
attenuat
source meter
or
Test Process
2. Test method:
of the board under test within the normal working range.
3) Measure the optical input and output powers of the OA.
4) The difference between the optical output power (dBm) and the
optical input power (dBm).
Gain of the C/CE band (G.652): 10dB

Acceptance
Gain of the C/CE band (LEAF): 12dB
Criteria
Gain of the C/CE band (TW RS): 13dB
Remarks
1.45.2 Gain Flatness

Test Item Gain Flatness
to the NCP.
Figure 1-250 Configuration of the OA Gain Flatness
Variable
multi-
optical DRA spectro
Test Process wavelength
attenuat meter
optical source
or
2. Test method:
1) Measure the gain of the OA under each channel with reference to
the method described in chapter 1.42.4.
2) The difference between the maximum and minimum values of the
gain indicates the gain flatness.
Acceptance
Gain Flatness ≤2dB
Criteria
Remarks
1.46 SOSC/SOSCB—Optical Supervision Channel

Board
1.46.1 Working Wavelength

Test
Working Wavelength
Item
Prerequi
sites
NCP.
The needed materials include a multi-wavelength optical source, optical fiber

jumpers, and the board under test.
Test Configuration:
Test Figure 1-251 Configuration of the OSC Output Wavelength

Process
Optical multi-
OSC under
wavelength
test meter
Test method:
Create a test environmen according to the above figure. After the reading on
the multi-wavelength meter is stable, read the output wavelength.
Accepta
nce Central wavelength: 1510±10 nm
Criteria
Remark
s
1.46.2 Optical Transmit Power

Test Item Optical Transmit Power
to the NCP.
optical fiber jumpers, and the board under test.
Test Process
OSC under Optical power
test meter
2. Test method:
2) Read the optical power from the optical power meter.
80km SFP: -3~+2dBm
Acceptance
120km SFP: +2~+7dBm
Criteria
140Km SFP: +3~+10dBm
Remarks
test..
1.46.3 Optical Receiver Sensitivity

Test
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. Self-loop

test can only query no light power through the EMS. The PC sends pings to
NE B to see whether its IP address has packet loss.
Figure 1-22 OSC Optical Receiver Sensitivity Connection
OSC board
Adjustable
50/50
optical
coupler
attenuator
Optical power
Test meter
Process
NE A NE B
OSC board Adjustable OSC board
50/50
optical
coupler
attenuator
Optical power
meter

attenuation value until peer NE’s IP address has packet loss when being
pinged.
3. Read the optical power meter and record the power value.
Accepta 80km SFP: -37dBm

nce 120km SFP: -37dBm
Criteria 140Km SFP: -43dBm
Remark
s
1.46.4 Overload Optical Power

Test
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure. In self-loop

test, no light power can only be queried by the EMS. The PC sends pings to
the IP address of NE B to see whether packets are lost.
Figure 1-23 OSC Receive Overload Point Test Connection
OSC board
Adjustable
50/50
optical
coupler
attenuator
Optical power
meter
Test
Process
NE A NE B
OSC board Adjustable OSC board
50/50
optical
coupler
attenuator
Optical power
meter
2. Adjust the optical attenuator to decrease the attenuation value, until

there are packets lost when sending pings to peer NE’s IP address.
The optical power value shown on the optical power meter is theOverload
Optical Power of the receiver.
Accepta 80km SFP: -10dBm

nce 120km SFP: -8dBm
Criteria 140Km SFP: -8dBm
Remark
s
1.47 SOP—Optical Protection Board

to the NCP.
1) The needed materials include an optical power meter and optical
fiber jumpers.
Figure 1-253 Configuration of the SOP Insertion Loss
T1- Po
T1_I O1
T1- Optical power meter
Optical source
O2
Pi R1_ R1-I1
O R1-I2
Optical power meter
SOP T2-
T2_I O1
T2-
Test Process O1
R2_ R2-I1
O R2-I2
2. Test method:
2) Test the optical output power of the optical source and record it as
Pi(λ) in unit of dBm.
3) Test the optical output power passed by the board and record it as
Po(λ) in unit of dBm.
4) Calculate the insertion loss according o the following formula:
Lossn(λ)=Pi(λ)-Po(λ) (unit: dB).
5) Repeat steps 2 t0 4 to test other ports.
T1_I-T1_O1<4.5dB
T1_I-T1_O2<4.5 dB
T2_I-T2_O1<4.5 dB
Acceptance T2_I-T2_O2<4.5 dB
Criteria R1_O-R1_I1<2.2 dB
R1_O-R1_I1<2.2 dB
R2_O-R2_I1<2.2 dB
R2_O-R2_I2<2.2 dB
Remarks
1.48 SOPCS—Optical Channel Shared Protection

Board

to the NCP.
1) The needed materials include an optical power meter and optical
fiber jumpers.
Figure 1-254 Configuration of the SOPCS Insertion Loss
AWO Po
AIN Optical power meter
Optical source BPO
Pi AOU AWI
T BWI
Optical power meter
SOPCS BWO
BIN
APO
Test Process
BOU API
T BWI
2. Test method:
2) Test the optical output power of the optical source and record it as
Pi(λ) in unit of dBm.
3) Test the optical output power passed by the board and record it
as Po(λ) in unit of dBm.
4) Calculate the insertion loss according o the following formula:
Lossn(λ)=Pi(λ)-Po(λ) (unit: dB).
5) Repeat steps 2 t0 4 to test other ports.
AIN-AWO<4dB
AIN-BPO<4dB
BIN-BWO<4dB
Acceptance BIN-APO<4dB
Criteria AWI-AOUT<4dB
BWI-AOUT<4dB
API-BOUT<4dB
BPI-BOUT<4dB
Remarks
1.49 Testing OTN Functions
1.49.1 Testing the OPUk Overhead

Test
Testing OPUk Overhead
Item
Prerequi
sites
NCP.
1. Create a test environment, as shown in the following figure in case that
the client side can be connected to the OTN tester or SDH analyzer
according to the supported service access types.
Figure 1-255 Configuration of the OPUk Overhead
SDH analyzer
Client Board Line
or OTN tester
Test side under test side
OTN tester
Process
2. Use the OTN tester to monitor the PT byte content sent by the board
under test and set the PT byte content sent by the tester.
3. Set the corresponding PT expected value on the EMS, and query the
PT value and related alarm reported currently.
4. Modify the PT byte content sent by the tester and query the PT content
and related alarm of the board on the EMS.
1. The board under test supports the OPUk overhead.
2. The PT byte content monitored by the tester should be consistent with
Accepta that sent by the board.
nce 3. Monitoring over PT byte is supported and the PT byte content can be
Criteria queried on the EMS.
4. When the expected value is not consistent with the actual value, the
EMS reports the “OPU Payload Type Mismatch” alarm.
The test is conducted to prove that the board can support the following
functions:
Remark 1. The board supports the OPUk overhead.
s 2. It supports the functions of monitoring and setting PT byte.
3. When the PT byte content is modified to be inconsistent with the
expected value, the EMS reports the “OPU Payload Type Mismatch” alarm.
1.49.2 Testing the ODUk PM Overhead

Test Item Testing ODUk Overhead
to the NCP.
1. Configure the test environment according to the following figure in
case that the client side can be connected to the OTN tester or SDH
analyzer according to the supported service access types.
Figure 1-256 Configuration of the ODUk PM Overhead
SDH analyzer
Client Board Line
or OTN tester
side under test side
OTN tester
2. Use the OTN tester to monitor the ODUk overhead content sent by
the board under test and set the ODUk overhead content sent by the
Test Process tester.
3. Modify the TTI byte content sent by the tester and query the TTI
byte content and current alarm on the EMS.
4. Perform the error insertion function at the ODU layer of the tester to
insert N*BIP-8 errors, query the current performance and current alarm
on the EMS, and monitor the tester in the meantime.
5. Use the tester to send BDI and BEI and query the current
performance and current alarm on the EMS.
6. The OTN tester sets numerical values of the STAT, including AIS,
OCI, LCK and the normal value, and then sends them to the board
under test. Query the current alarm of the board on the EMS.
1. The board under test supports the ODUk PM overhead.

2. The ODUk PM overhead content monitored by the tester should be
consistent with that sent by the board under test.
3. Monitoring over TTI byte is supported and the TTI byte content can
be queried on the EMS. If it is not consistent with the expected value,
the board will report a TIM alarm and back insert a BDI alarm into the
Acceptance signal.
Criteria 4. Monitoring over BIP-8 byte is supported and the BIP-8 byte content
can be queried on the EMS. BEI is back inserted.
5. Monitoring over BDI and BEI is supported and they can be queried
on the EMS.
6. Monitoring over each status of the STAT, such as AIS (111), OCI
(110), LCK (101), and the normal value (001) is supported.
This test is conducted to prove that the board under test can support the
following functions at both line side and client side.
At line-side:
1. It supports monitoring over TTI. The EMS can monitor
corresponding TTI byte of the equipment under test. If the detected byte
is inconsistent with the actual byte, the board reports a TIM alarm and
back insert a BDI alarm into the signal.
2. The tester sends N error signals to the equipment under test. The
equipment receives corresponding BIP8 error and the tester receives
N*BEI.
3. The tester sends N*BEI to the equipment under test, and the
Remarks
equipment receives N*BEI.
4. It supports monitoring over each status of PM-BDI and STAT.
At client-side:
1. The service is OTU2. The tester only detects the TTI value but
does not report alarms.
2. The tester sends N error signals to the device under test. The
device receives corresponding BIP8 error and the tester receives
N*BEI.
3. The tester sends N*BEI to the device under test, and the device
receives N*BEI.
4. It supports monitoring over each status of the PM-BDI and STAT.
1.49.3 Testing the ODUk PM Overhead

Test Item Testing ODUk PM Overhead
to the NCP.

Figure 1-257 Configuration of the ODUk-PM Overhead
SDH analyzer
Client Board Line
or OTN tester
OTN tester
2. Use the OTN tester to monitor the ODUk overhead content sent by
the board under test and set the ODUk overhead content sent by the
4. Perform the error insertion function at ODU layer of the tester to
1. The board under test supports the ODUk TCM1~6 overhead.

2. The ODUk TCMi overhead content monitored by the tester should
be consistent with that sent by the board under test.
Acceptance
signal.
Criteria
4. Monitoring over BIP-8 byte is supported and the BIP-8 byte content
can be queried on the EMS. Returning of BEI is supported.
on the EMS.
6. Monitoring over each status of STAT, such as AIS (111), OCI (110)
and LCK (101) and the normal value (001) is supported.
At line side:
1. It supports the functions of setting and querying TCM1~TCM6,
including their running, transparent transmission and monitoring status.
2. It supports the monitoring over TTI. The EMS can monitor
is inconsistent with the actual byte, the equipment will report a TIM
alarm and back insert a BDI alarm into the signal.
N*BEI.
5. It supports the monitoring over each status of the PM-BDI and
Remarks
STAT.
At client side:
1. It supports the functions of setting and querying TCM1~TCM6,
including their running, and monitoring status.
2. It supports the monitoring over TTI. The EMS can monitor
is inconsistent with the actual byte, the equipment will report a TIM
alarm and back insert a BDI alarm into the signal.
N*BEI.
5. It supports the monitoring over each status of the PM-BDI and
STAT.
1.49.4 Testing the OTUk Overhead

Test Item Testing OTUk Overhead
to the NCP.

Figure 1-258 Configuration of the OTUk Overhead
SDH analyzer
Client Board Line
or OTN tester
OTN tester
2. Use the OTN tester to monitor the OTUk overhead content sent by
the board under test and set the OTUk overhead content sent by the
4. Perform the error insertion function at OTUk layer of the tester to
1. The board under test supports OTUk overhead.

2. The OTUk overhead content monitored by the tester should be
consistent with that sent by the board under test.
Acceptance
signal.
Criteria
4. Monitoring over BIP-8 byte is supported and the BIP-8 byte content
can be queried on the EMS. Returning of BEI is supported.
on the EMS.
6. Monitoring over each status of STAT, such as AIS (111), OCI (110)
and LCK (101) and the normal value (001) is supported.
At line side:
1. It supports the OTUk overhead.
2. It supports monitoring over TTI and modifies the TTI byte sent by
the tester. The EMS can monitor corresponding TTI byte of the
equipment under test, report the “SM TTI Mismatch” alarm, and back
insert a BDI alarm into the signal.
N*BEI.
5. It supports BDI and SM-IAE/BIAE.
Remarks
6. The board does not monitor GCC0.
At client side:
1. It supports the OTUk overhead.
2. It supports monitoring over TTI and modifies the TTI byte sent by
the tester. The EMS can monitor corresponding TTI byte of the
equipment under test, report the “SM TTI Mismatch” alarm, and back
insert a BDI alarm into the signal.
N*BEI.
5. It supports BDI and SM-IAE/BIAE.
6. It supports the monitoring over each status of STAT.
2 System Performance Test
2.1 MPI-R and MPI-S
2.1.1 MPI-S(S’) Interface
2.1.1.1 Maximum Channel Power Difference at MPI-S (S’) Point

Test Item Maximum Channel Power Difference at MPI-S (S’) Point
to the NCP.
1. Configure the test environment according to the actual network

configurations, as shown in the following figure.
Figure 2-1 Configuration of the Maximum Channel Power Difference
at MPI-S (S’) Point
Spectrometer
MPI-S MPI-R Optical

signal
MPI-R OADM MPI-S
Optical
signal
Test Process G.692 interface

OTU
Interface at the Spectrometer
client side
Client side
2. Set the resolution bandwidth of the spectrum analyzer to 0.1nm,

and adjust the display wavelength range and amplitude to display the
channel spectrum to be measured in the center of the screen.
3. Measure and record the Optical Output Power of each channel.
4. Calculate the difference between the maximum value and minimum
value of all the channel Optical Output Powers. The difference indicates
the maximum channel power difference.
The following table lists the requirements for the maximum channel
power difference at MPI-S (S’) point.
Table 2-1 Requirements for the maximum channel power difference at
MPI-S (S’) point
Acceptance System Type N×22dB M×33dB
Criteria
10G ≤4 ≤3
40G (DPSK&
≤6 ≤6
RZ-DQPSK)
100G (PM-QPSK) ≤6 ≤6
1. The maximum channel power difference at MPI-S (S’) point refers

to the difference between the maximum input optical power and
minimum input optical power of each channel at MPI-S (S’) point.
Remarks
test..
3. The input optical interface of the OTU board should access the
OTU modulation optical-source. Generally, the on-site SDH equipment
is selected to act as the modulation optical-source.
2.1.1.2 Optical Signal-to-Noise Ratio of Each Channel at MPI-S (S’) Point

Test Item Optical Signal-to-Noise Ratio of Each Channel at MPI-S (S’) Point
to the NCP.

Figure 2-2 Configuration of the Optical Signal-to-Noise Ratio of Each
Channel at MPI-S (S’) Point
Spectrometer
MPI-S MPI-R Optical

signal
MPI-R OADM MPI-S
Optical
signal
Test Process
G.692 interface
OTU
Interface at the Spectrometer
client side
Client side

signal wavelength of the channel under test in the center of the screen.
3. Measure and record the output signal-to-noise ratio of each
channel.
Acceptance
Just record it
Criteria
1. The signal-to-noise ratio of each channel at MPI-S (S’) point refers

to the ratio of the signal power to the noise power of each channel at
MPI-S (S’) point.
Remarks
test..
2.1.2 MPI-R(R’) Interface
2.1.2.1 Maximum Channel Power Difference at MPI-R (R’) Point

Test Item Maximum Channel Power Difference at MPI-R (R’) Point
to the NCP.

Figure 2-3 Configuration of the Maximum Channel Power Difference
at MPI-R (R’) Point
Spectrometer
MPI-S MPI-R Optical

signal
MPI-R OADM MPI-S
Optical
signal
G.692 interface
Test Process
Spectrometer OTU
Interface at the
client side
Client side

channel spectrum to be measured in the center of the screen.
3. Measure and record the Optical Output Power of each channel.
4. Calculate the difference between the maximum value and minimum
value in all the channel Optical Output Powers. The difference indicates
the maximum channel power difference.
The following table lists the requirements for the maximum channel
power difference at MPI-R (R’) point.
Table 2-2 Requirements for the maximum channel power difference at
MPI-R (R’) point
Acceptance System Type N×22dB M×33dB
Criteria
10G ≤6 ≤4
40G (DPSK&
≤8 ≤8
RZ-DQPSK)
100G (PM-QPSK) ≤6 ≤6
1. The maximum channel power difference at MPI-R (R’) point refers

to the difference between the maximum input optical power and
minimum input optical power of each channel at MPI-R (R’) point.
Remarks
test..
2.1.2.2 Optical Signal-to-Noise Ratio of Each Channel at MPI-R (R’) Point

Test Item Optical Signal-to-Noise Ratio of Each Channel at MPI-R (R’) Point
Prerequisi
tes
the NCP.

Figure 2-4 Configuration of the Optical Signal-to-Noise Ratio of Each
Channel at MPI-R (R’) Point
Spectrometer
MPI-S MPI-R Optical

signal
MPI-R OADM MPI-S
Test Optical
Process signal
G.692 interface
Spectrometer OTU
Interface at the
client side
Client side
2. Set the resolution bandwidth of the spectrum analyzer to 0.1nm, and

adjust the display wavelength range and amplitude to display the signal
wavelength of the channel under test in the center of the screen.
3. Measure and record the output signal-to-noise ratio of each channel.
The following table lists the requirements for the optical signal-to-noise
ratio of each channel at MPI-R (R’) point.
Table 2-3 Requirements for the Optical Signal-to-Noise Ratio of Each
Channel at MPI-R (R’) Point
System 2.5G 100G

10G 40G
Type
Optical Without Without PM-QPSK+F

P-DPSK+AFE
signal-to-no FEC FEC EC (SD)
C
ise ratio OSNR OSNR OSNR≥
≥22dB OSNR≥18.5dB
(dB) ≥25dB 18dB
With FEC With FEC RZ-DQPSK+A

Acceptanc
OSNR≥18 OSNR≥20 FEC
e Criteria
dB dB OSNR≥17.5dB
P-DPSK line
AFEC service OTU3e
OSNR≥18 +AFEC
dB OSNR≥
19.5dB
RZ-DQPSK
ERZ+AFE
line service
C
OTU3e+AFEC
OSNR≥16
OSNR≥
dB
18.5dB
1. The signal-to-noise ratio of each channel at MPI-R (R’) point refers to

the ratio of the signal power to the noise power of each channel at MPI-R
(R’) point.
Remarks
test..
3. The input optical interface of the OTU board should access the OTU
modulation optical-source. Generally, the on-site SDH equipment is
selected to act as the modulation optical-source.
2.2 Protection Test
2.2.1 SNP 1+1 Protection

Test Item SNP 1+1 Protection
to the NCP.
Figure 2-5 Configuration of the SNP 1+1 Protection
FC Analyzer
M820 M820
#1 #2
STM-16 10GE Analyzer

Analyzer
M820 M820
Test Process GE Analyzer
#3 #4
STM-64
Analyzer
1) Create a test environmen according to the above figure. Perform

the master/slave switching through the EMS or unplugging the master
SNP board.
2) Check the EMS status and the result of the analyzer.
1) After the master/slave switching, the EMS can manage NEs
Acceptance
properly.
Criteria
(2) Services are running in normal state and there is no bit error.
Remarks
2.2.2 SCC 1+1 Protection

Test Item SCC 1+1 Protection
to the NCP.
Figure 2-6 Configuration of the SCC 1+1 Protection
FC Analyzer
M820 M820
#1 #2
STM-16 10GE Analyzer

Analyzer
M820 M820
Test Process GE Analyzer
#3 #4
STM-64
Analyzer
1) Create a test environmen according to the above figure. Perform the

master/slave switching through the EMS or unplugging the master SCC
board.
2) Check the EMS status and the result of the analyzer.
Acceptance 1) After the master/slave switching, the EMS can manage NEs properly.
Criteria 2) Services are running in normal state and there is no bit error.
Remarks
2.2.3 Optical Channel 1+1 Protection Switching Time and Priority

Test Item Optical Channel 1+1 Protection Switching Time and Priority
to the NCP.

Figure 2-7 Configuration of the System Switching Time
Ra Sd
Termin
OADM ation
site
OADM Protection ring OADM
Start
OADM site
Ra Sd
OTUm OTUn
Test Process Variable optical

attenuator
IN
OUTSDH analyzer
APS test
2. Connect the SDH analyzer to the channel under test at the

originated site. Set the SDH analyzer to send STM-16/STM-64 signals
at the rate of the channel and loop back the channel at the end site.
3. If there is no bit error on the SDH analyzer through observation, set
the SDH analyzer to be in APS test state.
4. Disconnect the direction-A or direction-B line-side fiber of the
originated site, and read the protection switching time from the APS
function test result of the SDH analyzer.
5. Connect the line-side fiber of the start site, and read the protection
switching recovery time from the APS function test result of the SDH
analyzer.
6. Test the switching priority through external commands, manual
switching, forced switching and automatic switching.
Acceptance The system protection switching and recovery time should be ≤50ms.
Criteria Switching priority: Clear≥FS-W≥FS-P≥SF-W≥MS-W≥MS-P≥NR
Remarks N/A
2.3 Testing the Bit Error and Performance
2.3.1 24-Hour BER

Test Item 24-Hour Bit Error
to the NCP.
Testing the bit error of 2.5G/10G service system

Figure 2-8 Configuration of the Bit Error in the 2.5G/10G Service
System
SD H
analyzer
OADM
A
OADM OADM
D B
Test Process
OADM
C
L o o p b a ck
2. Set the SDH analyzer to send STM-16/STM-64 signals at the rate

of the channel under test.
3. Adjust the variable attenuator 1 to make the OTU input optical
power of the channel under test within the normal working range. Adjust
the variable attenuator 2 to make the input optical power of the SDH
analyzer to be within the normal working range.
4. Perform the bit error analysis function of the SDH analyzer to
conduct a long-term (24 hours) bit error test, and read the test result
from the analyzer.
5. Repeat step 2 to step 4 to test the bit error of other channels.
Acceptance
Zero bit error
Criteria
1. The bit error here refers to the long-term (24-hour) bit error feature
of the system.
2. For the 2.5G/10G services, you can test the cascade bit error. That
Remarks
is, send the DROP signal to an ADD OTU. In doing do, the optical power
may be overloaded. To solve this problem, add a fixed attenuator before
the ADD OTU.
2.3.2 24-Hour Packet Loss Rate

Test Item 24-Hour Packet Loss Rate
to the NCP.

Figure 2-9 Configuration of the 24-Hour Packet Loss Rate
IP analyzer
OADM
A
Test Process
OADM OADM
D B
OADM
C
Loopback
2. Use the ScriptMate software of the IP data service tester to test the
packet loss rate and read the result from the tester.
Long-term packet loss rate: The tested packet length should be 64

Acceptance
bytes, the bandwidth should be 90%, the test time should be 24 hours,
Criteria
and the packet loss rate of GbE service should be < 0.01%.
Remarks N/A
2.3.3 Throughout
Test Item Throughout
to the NCP.

Figure 2-10 Configuration of the Throughout
IP analyzer
OADM
A
Test Process
OADM OADM
D B
OADM
C
Loopback
2. Use the IP data service tester to test the throughout and read the
result from the tester.
Acceptance
100%
Criteria
Remarks N/A
2.3.4 Time Delay

Test Item Time Delay
to the NCP.

Figure 2-11 Configuration of the Time Delay
IP analyzer
OADM
A
Test Process
OADM OADM
D B
OADM
C
Loopback
2. Use the IP data service tester to test the time delay and read the
result from the tester.
Acceptance
Just record it.
Criteria
Remarks N/A
2.4 Testing the Layer-2 Switching
2.4.1 MAC Address Learning

Test Item MAC Address Learning
to the NCP.
Configure the test environment according to the actual network

Figure 2-12 Configuration of MAC Address Learning
C1
1
IXIA ASMA
2
Test Process C2
Enable the MAC address learning function, and then check the MAC
address of the port. In case of dynamic MAC, please quit.
Use the IP analyzer to send data packets, and increase the MAC
address gradually.
1) Disable the MAC address learning function, and then check the
MAC address table. No more new MAC addresses are learnt.
2) Enable the MAC address learning function, and then check the MAC
address table. New MAC addresses are learnt.
3) Send a MAC address of all 0, and check whether it is learnt.
4) Send a MAC address of all 1, and check whether it is learnt.
Acceptance 1) The MAC address learning function can be enabled and disabled.
Criteria 2) The MAC address of all 0 or all 1 cannot be learnt.
Remarks N/A
2.4.2 Testing the Tag

Test Item Testing the Tag
to the NCP.

Figure 2-13 Configuration of the Tag
C1
1
IXIA ASMA
2
Test Process C2
1 Create VLAN 100.

1) Add port 1 into VLAN 100. Set the PVID 100, untagged.
2) Set port 2 PVID to 100, tag.
3) Send untagged packets to port 1 through the IP analyzer; check the
result at port 2.
2 Add port 1 and port 2 into VLAN 100.
1) Set port 1 PVID and port 2 PVID to 100, untagged.
2) Send untagged packets to port 1 through the IP analyzer; observe
the result at port 2.
Acceptance 1 The tag of received packets is 100.

Criteria 2 The received packets are untagged.
Remarks N/A
2.4.3 Policy and Priority

Test Item Policy and Priority
to the NCP.

Figure 2-14 Test Configuration
C1
1
IXIA ASMA
2
C2
Test Process
1 Define an ACL rule for data flow;
1) Enable the ACL in port 1 and define the traffic policy in the meantime.
2) For example: traffic limit, 10Mbps.
3) Send data to port 1 through the IP analyzer and check the received
data packets.
2 COS based on port and VLAN
1) Configure the IP analyzer port 1 to send two data flows with full
bandwidth. One belongs to COS7, and the other belongs to COS3.
2) Configure the ASMA packet dispatching method as SP(Strict Priority).
3) Capture data packets from ASMA port C2 and analyze.
1 The receive packet rate of the IP analyzer is 10Mbps.

Acceptance
2 The receive packet should be all from COS7 with the full (100%)
Criteria
bandwidth.
Remarks N/A
2.4.4 Adding and Deleting the S-TAG

Test Item Adding and Deleting the S-TAG
to the NCP.

A A
S Line1 S Client4
Client4 M Line1 M
A A
1 2
Test Process IXIA
1) Configure the ASMA1 and enable the “QinQ” function of client port4 .
2) Add Client port 4 and Line port 1 to Vlan 1000.
3) IP analyzer sends data packets (belongs to Vlan 100) to Client port 4
4) Capture data packets at Line port 1 and analyze.
5) Configure the ASMA2 and enable the “QinQ” function of client port.
6) Add Client port 4 and Line port 1 to Vlan 1000.
7) IP analyzer receives data packets from Client port 4.
8) Capture data packets at Client 4 and analyze.
1) The captured package from ASMA1 should be double tagged, the

inner tag belongs to Vlan 100 and the external tag belongs to Vlan
Acceptance
1000.
Criteria
2) The captured package from ASMA 2 should be single tagged, it
belongs to Vlan 100.
Remarks N/A
2.4.5 Verifying the Number of VLANs that can be Configured to One Port
Simultaneously
Verifying the Number of VLANs that can be Configured to One Port
Test Item
Simultaneously
to the NCP.

C1
1
IXIA ASMA
Test Process 2
C2
1 Create VLANs ranging from 1 to 4094 and add each port to all VLAN.
2
1) Set ports 1 and 2 to access mode for VLAN 1 to 4094.
2) Send broadcast data to C1 port with the maximum amount of
4094 though the IP analyzer.
3) Capture data packets at port 2 and analyze.
1. A maximum of 4094 VLANs are created successfully and each port

Acceptance can be added to all the VLANs;
Criteria 2. Data packet form any VLAN can be successfully transmitted at full
(100%) bandwidth.
Remarks N/A
2.4.6 Support of Same C-VLAN and Different C-VLAN or Same S-VLAN and
Different S-VLAN
Support of Same C-VLAN and Different C-VLAN or Same S-VLAN
Test Item
and Different S-VLAN
to the NCP.

A A
S Line1 S Client4
Client4 M Line1 M
A A
1 2
IXIA
Test Process
1 Enable and configure the “QinQ” function at the client port and uplink
port.
Set the client port 4 PVID to 5. And set the uplink port to belong to
VLAN 5.
2 Send data packets
1) Send packets of VLAN 5 to client port 4. Capture the packets from
uplink port and analyze. The expected result is number 1.
2) Send packets of VLAN 10 to client port 4. Capture the packets from
uplink port and analyze. The expected result is number 2.
3).Change the client port PVID to 10, repeat step 1) and 2). The
expected result is number 3 and number 4.
1 Double tagged packets can be received , inner tag is VLAN 5, external

port is VLAN 5;
2 Double tagged packets can be received , inner tag is VLAN 10,
Acceptance external port is VLAN 5;
Criteria 3 Double tagged packets can be received , inner tag is VLAN 5, external
port is VLAN 10;
4 Double tagged packets can be received, inner tag is VLAN 10, and
external port is VLAN 10.
Remarks N/A
2.4.7 Verifying the Behavior of Sending Data Packets with the Same MAC
but Different VLANs
Verifying the Behavior of Sending Data Packets with the Same
Test Item
MAC but Different VLANs
to the NCP.

Client5 Client5
A A
S Line1 Line 1 S Client 4
Client4
M M
A A
1 2
IXIA
1 Enable and configure the “QinQ” function at the client port and uplink
port.
Set the client port PVID to 5.
Set the uplink port belongs to VLAN 5
Send 10 different data packets to client port 4 though the IP analyzer.
Capture the packets of uplink port and analyze. The expected result
Test Process should be number 1.
2 Enable and configure the flexible” QinQ” function of client port.
Set up the mapping relationship as follows:
c-VLAN 5 is mapped to s-VLAN 10.
c-VLAN 10 is mapped to s-VLAN 20.
Set the uplink port to belong to VLAN 10 and VLAN 20.
Send data packets of VLAN 5 and VLAN 10 to client port 4 though the
IP analyzer.
Capture the packets of uplink port and analyze. The expected result
should be number 2.
3 Enable and configure the flexible “QinQ” function at two different client
ports.
Set up the mapping relationship as follows:
Port 4: c-VLAN 5 is mapped to s-VLAN 10.
Port 5: c-VLAN 5 is mapped to s-VLAN 20.
Set the uplink port to belong to VLAN 10 and VLAN 20.
Send data packets of VLAN 5 to both client ports 4 and 5 though the IP
analyzer. Capture packets of uplink port and analyze. The expected
result should be number 3.
1 No matter what the c-VLAN is, the learnt source MAC belongs to
s-VLAN 5.
2 The data packet belongs to c-VLAN 5, the learnt source MAC belongs
Acceptance to s-VLAN 10.
Criteria The data packet belongs to c-VLAN 10, the learnt source MAC
belongs to s-VLAN 20.
3 The data packet belongs to c-VLAN 5, the learnt source MAC belongs
to both s-VLAN 10 and s-VLAN 20.
Remarks N/A
2.4.8 Verifying the Equipment Behavior when the MAC Table is Full
Test Item Verifying the Equipment Behavior when the MAC Table is Full
to the NCP.

A A
S Line1 S Client4
Client4 M Line1 M
A A
Test Process
1 2
IXIA
Enable the MAC address learning function, use the IP analyzer to send
data packets, and increase the MAC address gradually.
Acceptance No specific behaviors occur. Just wait for the MAC address aging and
Criteria relearn.
Remarks N/A
2.4.9 Traffic Policy Based on Port /VLAN/801.1p

Test Item Traffic Policy Based on Port /VLAN/801.1p
to the NCP.

C1
1
IXIA ASMA
2
C2
1 Define an ACL rule for data flow.

1) Enable the ACL rule at client port C1 and C2.
Define the traffic control policy, for example:
Traffic limit, 10Mbps.
Test Process
2)Send packets to C1 port through the IP analyzer and check the
received packets.
2 Define an ACL rule for VLAN 10.
2) Send VLAN 10 packets to C1 port through the IP analyzer and
check the received packets.
3 Define an ACL rule for COS7.
2) Send COS 7 packets to C1 port through the IP analyzer and check
the received packets.
1 Rate of the received packets should be 10 Mbps.

Acceptance
2 Rate of the received VLAN 10 packets should be 20 Mbps.
Criteria
3 Rate of the received COS 7 packets should be 30 Mbps.
Remarks N/A
2.4.10 Link Aggregation/LACP

Test Item Link Aggregation/LACP
to the NCP.

00.d0.c0.a8.01.18 00.d0.c0.a8.01.38
Client4 Client13
Client7 Client8
ASMA1 ASMA2
Client19 Client21
Test Process
Port3 Port4
IXIA
1 Configure an aggregation group between ASMA1 and ASMA2.

2 Add the corresponding ports to the aggregation group.
3 Send data packets from port 3 of the IP analyzer with full bandwidth;
4 Capture packets of the port4 of the IP analyzer.
5 Unplug a fiber between the two ASMAs randomly and check the
traffics.
Acceptance
The traffic is normal.
Criteria
Remarks Only applicable to manual aggregation.
2.5 Testing the IP Phone System
2.5.1 IP Phone
Test Item IP Phone
2. Monitor the system with the EMS. The equipment works well.
There are no alarms, and no non-zero performance value.
Test Process 1. Properly set the IP address and gateway for IP phone. The
gateway is assigned with the IP address of SOSC interface 3 and the IP
address of the phone is located in the network section of SOSC
electrical interface 3.
2. Insert the phone to the SEI panel.
Acceptance Local equipment sends a ring-back tone. The called NE should ring and
Criteria a conversation is established after the callee answers the call.
Remarks N/A
2.5.2 Voice Quality and Volume

Test Item Voice Quality and Volume
2. Monitor the system with the EMS. The equipment works well.
There are no alarms, and no non-zero performance value.
3. Addressing call is completed and the opposite party hooks off to
talk.
Test Process Judge the voice quality and volume with ears through the test.
Acceptance Both parties can hear each other clearly, without howling, echo or
Criteria noises.
3 ROADM Test
3.1 Wavelength Reconfiguration

Test Item Wavelength Reconfiguration
to the NCP.
Test Process Configure the test environment according to the actual network
ROADM ROADM
＃1
＃2
λ1 —
> λ2
Ring1 HUB Ring2

＃0
ROADM
＃3
The test environment includes HUB ROADM at six directions. The test
procedures are as follows:
1) Use the wavelength λ1 running in normal state and configure the
traffic from node 1 to node 2.
2) Change the wavelength to λ2 via the EMS.
Acceptance One wavelength can be changed to any value.

Criteria
Remarks N/A
3.2 Port Assignment

Test Item Port Assignment
to the NCP.
OSA
Output1
OTU 1 Input Output2

OM ROADM Output3
…
… Outputn
OTU n
1) Different wavelengths are to be dropped, and they can be assigned to

any drop ports.
2) The port assignment function is controlled by the EMS
Acceptance 1) You can assign any wavelength to any port.

Criteria 2) You can assign any wavelength group to any port.
Remarks N/A
3.3 Traffic Broadcast

Test Item Traffic Broadcast
Test Item Traffic Broadcast
to the NCP.
λ1
ROADM ROADM
＃1
＃2
Ring1 HUB Ring2

＃0
ROADM
＃3
λ1
λ1
1) Broadcast the wavelength configured with traffic to nodes at other

directions.
2) Set the wavelength to be dropped to nodes at other directions
through the EMS and test the traffic.
Acceptance
One traffic can be received from more than one node.
Criteria
Remarks N/A
3.4 Directionless Function

Test Item Directionless Function
to the NCP.
λ1
ROADM ROADM
＃1
＃2
Ring1 HUB Ring2

＃0
ROADM
＃3
λ1
λ1
(a) Sending
λ1
ROADM ROADM
＃1
＃2
Ring1 HUB Ring2

＃0
ROADM
＃3
λ1
λ1
(b) Receiving
1) Configure the test environment according to figure (a).

2) Set the system on the EMS according to figure (a). The wavelength
configured with traffic can be sent to any direction.
3) Test the traffic at the receiving end OTU with the analyzer. There
should be no bit error generated.
4) Set the system on the EMS according to figure (b). At the receiving
end, any of the same wavelengths configured with different traffics from
different directions can be dropped.
5) Test the traffic at the receiving end OTU with the analyzer. There
should be no bit error generated.
Acceptance Any traffic with special wavelength can be transmitted to any direction
Criteria and drop at any node.
Remarks N/A
3.5 Colorless Function

Test Item Colorless Function
to the NCP.
ROADM ROADM
＃1
＃2
λ1
Ring1 HUB Ring2

＃0
λ1
ROADM
＃3
λ1 λ1
1) Set the system to receive several traffics configured with the same λ
from different direction at the same time.
2) Test the traffics with the analyzer. The traffics should be running in
normal state.
Acceptance Can receive several traffics configured with the same λ at the same
Criteria time, and the traffics are running in normal state.
Remarks N/A
3.6 Creating End-to-End Circuits on the EMS

Test Item Creating End-to-End Circuits on the EMS
to the NCP.
ROADM ROADM
＃1
＃2
λ1
Ring1 HUB Ring2

＃0
λ1
ROADM
＃3
λ1 λ1
1)Configure the ROADM system on the EMS according to the above

figure. Then create an end-to-end circuit on the EMS according to the
following procedures.
- Select the Transponder from the target NE A to NE Z.
- Display the usable circuit path.
- Select the exact circuit path.
2) Test whether the created circuit is running in normal state.
Acceptance
The circuit created by the EMS is running in normal state.
Criteria
Remarks N/A
4 WASON Test
4.1 Testing the Link Auto-Discovery Function

Test Item Testing the Link Auto-Discovery Function
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. Connect the test network according to the above figure.
2. Query the link adjacency relation between node A and node B on

Test Process
the EMS.
3. Configure the transmit interfaces of node A and node B, without the
configuration of remote node and remote transmit interface;
4. Enable the automatic discovery function of node A and node B.
5. Query the link adjacency relation between node A and node B on
the EMS.
6. Create a service between node A and node B.
1. The neighbor configuration between control interface and control
plane is correct.
2. The link neighbor relationship between node A and node B is not
set up.
Acceptance
3. The configuration of transmit interface query in the EMS is correct.
Criteria
4. The result of automatic discovery query is correct.
5. The link neighbor relationship between node A and node B is set
up.
6. Service is created successfully.
Remarks
4.2 Testing the Network Topology Refresh Function

Test Item Testing the Network Topology Refresh Function
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. The network has been initialized.

Test Process
2. Disconnect the optical fiber between node B and node C. Query the
topology on the EMS.
3. Recover the fiber connection between node B and node C. Query the
topology on the EMS.
4. Delete node C and query the topology on the EMS.
5. Add node C and query the topology on the EMS.
1. Query that the network topology is in stable state.
2. Query the control plane topology on the EMS. There is no link
neighbor relationship between Node B and Node C.
3. Query the control plane topology on the EMS. The link neighbor
relationship between Node B and Node C is set up.

Acceptance
4. Query the control plane topology on the EMS. There is no link
Criteria
neighbor relationship between Node B and Node C or between
Node E and Node C.
5. Query the control plane topology on the EMS. The link neighbor
relationships between Node B and Node C and the one between
Node E and Node C are set up.
Remarks
4.3 Testing the Creation of an End-to-End SPC

Service
Test Item Testing the Creation of End-to-End SPC Services
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. The test configuration is shown in the above figure. The signaling
network works in fiber-in out-of-band mode.
2. On the call management interface of the EMS, create a SPC call
from Node A to Node C.
3. The service granularity is wavelength. The configuration items of a call
include:
--Source node and destination node, ADD/DROP board and port.
--Service granularity: wavelength
Test Process —Service level: diamond service, gold service, silver service, copper
service and iron service.
--Service protection and restoration property
--Restoration and restoration property
--Route policy property
4. Verify whether the physical connection is created successfully between
associated ports with the SDH analyzer/data analyzer/OTN analyzer, and
whether the data sent from the tester can be received at the destination
port.
5. Check whether the connection information is added on the EMS, whether
the information can be queried properly, such as the route and connection
property.
6. Check whether the system has completed the wavelength resource
assignment and ROADM cross connection setting on the EMS.
1. The service creation request can be issued properly.
2. Under the circumstance of sufficient available wavelength cross-connect
configuration resources according to the result of route calculation, the SPC
service can be created successfully. The service tester shows that the
Acceptance service is configured accurately and works properly, and there is no bit
Criteria error.
3. The service can be queried on the EMS, and the fields associated with the
service are displayed correctly.
4. Query on the EMS that the cross-connect configurations of
associated nodes are correct.
Remarks
4.4 Testing the Deletion of an End-to-End SPC

Service
Test Item Testing the Deletion of an End-to-End SPC Service
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. The test configuration is shown in the above figure. T he signaling
2. On the call management interface of the EMS, create a SPC call from Node
A to Node C.
Test Process
3. Verify whether the service is created successfully through the SDH
analyzer/data analyzer/OTN analyzer, and whether the physical connection
between associated ports is set up correctly.
4. Issue commands on the EMS to delete the SPC serve.
5. Verify whether the physical connection is deleted through the SDH
analyzer/data analyzer/OTN analyzer.
6. Check whether the SPC service information is deleted through the EMS.
7. Check whether the wavelength resource and ROADM cross connection
configured to the node under test are released.
1. The service creation request can be issued properly.
service is configured accurately and works properly, and there is no bit
Acceptance error.
Criteria 3. The service deletion command can be issued successfully.
4. The service is deleted successfully. Verify through the service tester that
the physical connection is deleted.
5. Query on the EMS that the SPC service is deleted, and the wavelength
resource and ROADM cross connection configured to the node under test
are released.
Remarks
4.5 Testing the SPC Route Constraint Policy

Function
Test Item Testing the SPC Route Constraint Policy Function
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. The test configuration is shown in the above figure. T he signaling
A to Node D.
3. Verify whether the route test configuration meets the following route
constraint policies during the connection creation.
Test Process --minimum link cost constraint
--minimum amount of nodes constraint
--nodes/links to be involved
--nodes/links to avoided
--isolated with other nodes/links constraint
---combination of the above constraint policies
4. Check whether the SPC service is created successfully through the SDH
analyzer/data analyzer/OTN analyzer.
5. On the EMS, check the route information of the SPC service, check
whether the nodes and links involved meet the above constraint policies,
and check whether the wavelength resource and ROADM cross connection
configured to the node under test are accurate.
1. The service creation request can be issued successfully, and the listed
constraint policies can be set properly.
Acceptance
service is configured accurately and works properly, and there is no bit
Criteria
error.
3. The service can be queried on the EMS, and the fields associated with the
service are displayed correctly. The route information meets the required
route constraint policy, and the configuration of cross connection on the
node under test is accurate.
Remarks
4.6 Testing the SPC Service Restoration Function

Test Item Testing the SPC Service Restoration Function
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. The test configuration is shown in the above figure. The signaling network
works in fiber-in out-of-band mode.
A to Node D. Set the Protection Type parameter of the service to No, set
the restore type to Global Dynamic Re-routing, and set the reversion type
Test Process
to Non-reversion, Manual Reversion or Automatic Reversion.
analyzer/data analyzer/OTN analyzer, and record the associated routes.
4. On condition that the SPC service is created successfully, select an optical
fiber in one working path (such as the path between node A and node B),
and then unplug it. Then check whether service re-routing is triggered, and
record the service restoration time.
5. Rectify the fault, and then check whether the service is restored to the
working path and record the restoration time according to the restore type
set during the service configuration.
parameters associated with service creation can be set properly.
configuration resources, the SPC service can be created successfully. The
Acceptance service tester shows that the service is configured accurately and works
Criteria properly, and there is no bit error.
3. When the fiber break occurs in the working path again, the service can be
triggered to perform dynamic re-routing.
4. When the fault is solved, service restoration can be performed according to
the restore type set with the service.
Remarks
4.7 Testing the SPC Permanent 1+1 Protection

Function
Test Item Testing the SPC Permanent 1+1 Protection Function
to the NCP.
A C
M820 M820
ROADM ROADM
B
M820
ROADM
D E
M720 M720
OLA OADM
1. The test configuration is shown in the above figure. The signaling network
works in fiber-in out-of-band mode.
A to Node D. Set the Protection Type parameter of the service to
Permanent 1+1 Protection.
analyzer/data analyzer/OTN analyzer, and record the route information of
the specific working path and protection path on the EMS.
4. Disconnect the working path of the SPC service according to the following
procedures, and then check the service interruption time through the SDH
analyzer/data analyzer/OTN analyzer. Then query the route information of
the new working path and protection path on the control plane through the
EMS, and check whether the protection switching and restoration

Test Process
processes are consistent with the following procedures:
A) Break one optical fiber in the working path of the SPC service, which
then triggers protection switching. Then the service is switched to the
protection path. At the same time, the restoration operation is
triggered so as to generate a new protection path for the current
working path after switching, thus forming the new 1+1 protection
service.
B) Based on the step A, break one optical fiber in the current working
path of the service, and then the service is switched to the new
protection path. The restoration operation is triggered again, thus
forming the new 1+1 protection service.
ZTE Confidential Proprietary 5. © connect

Dis 2018 ZTEthe
CORPORATION.
protection pathAllofrights
the reserved. 419 to the
SPC service according
following procedures, and then check whether service interruption or
transient interruption occurs through the SDH analyzer/data analyzer/OTN

A) Break one optical fiber in the protection path of the SPC service, and
the protection switching is not performed. Check through the service
tester that the service interruption or transient interruption does not
occur. But the restoration operation is triggered for the original
protection path, so as to generate a new protection path to replace the
invalid one. The original working path does not change and is running
in normal state.
B) Based on step A, break one optical fiber of the current

protection path of the service again. After this, the service
interruption or transient interruption does not occur, and the
restoration operation is triggered for the protection path, so as
to generate a new 1+1 protection service. The original working
path does not change and is running in normal state.
parameters associated with service creation can be set properly.
configuration resources, the permanent 1+1 SPC service can be created
successfully. The service tester shows that the service is configured
accurately and works properly, and there is no bit error.
3. The route information of the specific working path and protection path can
Acceptance
be queried in the EMS.
Criteria
4. Disconnect the working path of the SPC service, thus triggering protection
switching. The protection switching and restoration processes are
consistent with that described in step 4.
5. Disconnect the protection path of the SPC service, thus triggering
protection service restoration, but not the protection switching. The
protection switching and restoration processes are consistent with that
described in step 5.
Remarks

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and are registered trademarks of ZTE CORPORATION. ZTE’s company name,

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. I

Product Document Serial

Date Document Version Prepared by Reviewed by Approved by

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. II

Applicable to: Acceptance test engineers.

About This Document

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1 Board Test ....................................................................................................... 1

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. V

1.16 CD2/M2&M3CO2/M1&M2&M3&M4CQ2/M1CX2—10G Service Access Board (at

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. VI

1.33.3 Isolation between Non-adjacent Channels .................................................... 321

2 System Performance Test .......................................................................... 372

3 ROADM Test................................................................................................ 400

4 WASON Test ............................................................................................... 407

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. IX

Figure 1-32 Input jitter tolerance of SRM41 input interface ................................................. 45

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. X

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. XI

Figure 1-127 MQT3 Optical Receiver Sensitivity Connection ........................................... 165

Figure 1-191 Central Frequency Connection ...................................................................... 256

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. XV

Figure 1-223 Central frequency Connection ....................................................................... 295

Figure 1-258 Configuration of the OTUk Overhead .......................................................... 369

1.1 Primary Power Supply Test

1.1.1 Primary Power Voltage

1. The equipment installation has been checked and

1. Use a multimeter (set to measure resistance) to measure

1.1.2 Voltage between Working Ground and Protection Ground

Prerequisites Pass the primary power supply test.

Use a multimeter (set to measure DC voltage) to measure the

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. 1

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. 2

1.1.3 Working Ground Resistance

1. The bus bar of the working ground has been installed.

1. Connect to the equipment’s working ground with a ground

Acceptance The resistance of the DC working ground should be less than or

1.1.4 Resistance of Lightning Protection Ground

1. The bus bar of the lightning protection ground has been

1. Connect to the equipment’s protection ground with a

Acceptance The resistances of the security protection ground and lightning

1.1.5 Ground Resistance of Joint Grounding

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1. The ground bus-bar of joint grounding has been installed.

1. Connect to the equipment’s working ground and protection

The joint-grounding resistance of the communication office

1.1.6 Maximum Working Current

1. Method 1: Read the working current though the user’s

1.2 Fan Test

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1. Check the primary power supply and make sure that it is

1. Fans should run stably at an even speed.

1.3 Alarm Function Test

1.3.1 Alarm Indicator

Check whether the relationship between the cabinet-top alarm

ZTE Confidential Proprietary © 2018 ZTE CORPORATION. All rights reserved. 5

1. After the equipment is powered on, the green indicator on

1.3.2 Alarm Buzzer

Check whether the relationship between the cabinet-top alarm buzzer

1. The cabinet-top buzzer should beep when the equipment has an