Beruflich Dokumente
Kultur Dokumente
EECS
Washington State University
References
• John P. Uyemura, “Introduction to VLSI Circuits and Systems,” 2002.
– Chapter 6
• Neil H. Weste and David M. Harris, “CMOS VLSI Design: A Circuits
and Systems Perspective,” 2011.
– Chapter 2
Goal
• Understand the electrical characteristics of MOSFETs.
MOS Physics – Threshold Voltage (nFET)
• Oxide capacitance per unit area (𝐹𝐹/𝑚𝑚2 )
𝜀𝜀
– 𝑐𝑐𝑜𝑜𝑜𝑜 = 𝑡𝑡𝑜𝑜𝑜𝑜
𝑜𝑜𝑜𝑜
M O S
electric field
G 𝜙𝜙𝑆𝑆 G 𝑉𝑉𝐺𝐺
+ 𝑉𝑉
𝑡𝑡𝑜𝑜𝑜𝑜 − 𝑜𝑜𝑜𝑜 𝑉𝑉𝑜𝑜𝑜𝑜
n+ n+ n+ n+
Distance
surface charge
MOS Physics – Threshold Voltage (nFET)
• Force on a charged particle
– 𝐹𝐹 = 𝑄𝑄𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝𝑝 𝐸𝐸
• 𝐹𝐹𝑒𝑒 = −𝑞𝑞𝑞𝑞 (for electrons)
• 𝐹𝐹ℎ = +𝑞𝑞𝑞𝑞 (for holes)
• Bulk charge density (negative charge on the surface)
– 𝑄𝑄𝐵𝐵 = − 2𝑞𝑞𝜀𝜀𝑠𝑠𝑠𝑠 𝑁𝑁𝑎𝑎 𝜙𝜙𝑠𝑠
– 𝑄𝑄𝐵𝐵 = −𝑐𝑐𝑜𝑜𝑜𝑜 𝑉𝑉𝑜𝑜𝑜𝑜
1
• 𝑉𝑉𝑜𝑜𝑜𝑜 = 2𝑞𝑞𝜀𝜀𝑠𝑠𝑠𝑠 𝑁𝑁𝑎𝑎 𝜙𝜙𝑠𝑠
𝑐𝑐𝑜𝑜𝑜𝑜
𝑉𝑉𝐺𝐺 > 0
• Depletion region (depleted of free electrons and holes)
– Holes: forced away electric field
𝜙𝜙𝑆𝑆 G
– Electrons: absorbed by the dopant atoms.
+ 𝑉𝑉
− 𝑜𝑜𝑜𝑜
n+ n+
surface charge
MOS Physics – Threshold Voltage (nFET)
• 𝑉𝑉𝐺𝐺 < 𝑉𝑉𝑇𝑇𝑇𝑇
𝑉𝑉𝐺𝐺 > 𝑉𝑉𝑇𝑇𝑇𝑇
– 𝑄𝑄𝑆𝑆 = 𝑄𝑄𝐵𝐵
• 𝑉𝑉𝐺𝐺 > 𝑉𝑉𝑇𝑇𝑇𝑇 electron layer 𝑄𝑄𝑒𝑒
– 𝑄𝑄𝑆𝑆 = 𝑄𝑄𝐵𝐵 + 𝑄𝑄𝑒𝑒 < 0 G
– The additional electrons are movable.
• 𝑄𝑄𝑒𝑒 = −𝑐𝑐𝑜𝑜𝑜𝑜 (𝑉𝑉𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 ) n+ n+
• Active
– 𝑉𝑉𝐺𝐺𝐺𝐺 > 𝑉𝑉𝑇𝑇𝑇𝑇
– If 𝑉𝑉𝐷𝐷𝐷𝐷 = 𝑉𝑉𝐷𝐷𝐷𝐷
1 𝑊𝑊 1 𝑊𝑊 1
• 𝐼𝐼𝐷𝐷 = 𝜇𝜇𝑛𝑛 𝑐𝑐𝑜𝑜𝑜𝑜 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 2
= 𝑘𝑘𝑛𝑛 ′ 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 2
= 𝛽𝛽𝑛𝑛 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 2
2 𝐿𝐿 2 𝐿𝐿 2
𝐼𝐼𝐷𝐷
cutoff active
𝑉𝑉𝐺𝐺𝐺𝐺
0
𝑉𝑉𝑇𝑇𝑇𝑇
MOS Physics – I-V Characteristics (nFET)
• Active
– 𝑉𝑉𝐺𝐺𝐺𝐺 > 𝑉𝑉𝑇𝑇𝑇𝑇
– If 𝑉𝑉𝐷𝐷𝐷𝐷 varies
𝑊𝑊 1 1
• 𝐼𝐼𝐷𝐷 = 𝜇𝜇𝑛𝑛 𝑐𝑐𝑜𝑜𝑜𝑜 { 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 𝑉𝑉𝐷𝐷𝐷𝐷 − 𝑉𝑉𝐷𝐷𝑆𝑆 2 } = 𝛽𝛽𝑛𝑛 { 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 𝑉𝑉𝐷𝐷𝐷𝐷 − 𝑉𝑉𝐷𝐷𝐷𝐷 2 }
𝐿𝐿 2 2
𝜕𝜕𝐼𝐼𝐷𝐷
• The saturation occurs when = 0.
𝜕𝜕𝑉𝑉𝐷𝐷𝑆𝑆
– 𝑉𝑉𝐷𝐷𝑆𝑆,𝑠𝑠𝑠𝑠𝑠𝑠 = 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 (saturation voltage)
– If 𝑉𝑉𝐷𝐷𝐷𝐷 ≥ 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇
• Saturation
1 2
• 𝐼𝐼𝐷𝐷 = 𝛽𝛽𝑛𝑛 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇
2
1 𝐼𝐼𝐷𝐷
• 𝐼𝐼𝐷𝐷 = 𝛽𝛽 𝑉𝑉𝐺𝐺𝐺𝐺 − 𝑉𝑉𝑇𝑇𝑇𝑇 2 [1 + λ(𝑉𝑉𝐷𝐷𝐷𝐷 − 𝑉𝑉𝑠𝑠𝑠𝑠𝑠𝑠 )]
2 𝑛𝑛
– λ: Channel-length modulation parameter non-saturation saturation
𝑉𝑉𝐷𝐷𝐷𝐷
0
𝑉𝑉𝑠𝑠𝑠𝑠𝑠𝑠
MOS Physics – I-V Characteristics (nFET)
• Body-bias effects
– occurs when 𝑉𝑉𝑆𝑆𝑆𝑆 > 0.
• 𝑉𝑉𝐵𝐵 : bulk potential
𝑉𝑉𝐷𝐷
– 𝑉𝑉𝑇𝑇𝑇𝑇 = 𝑉𝑉𝑇𝑇𝑇𝑇𝑇 + 𝛾𝛾( 2 𝜙𝜙𝐹𝐹 + 𝑉𝑉𝑆𝑆𝑆𝑆 − 2 𝜙𝜙𝐹𝐹 )
• 𝛾𝛾: Body-bias coefficient 𝑉𝑉𝐺𝐺
2𝑞𝑞𝜀𝜀𝑠𝑠𝑠𝑠 𝑁𝑁𝑎𝑎
– 𝛾𝛾 = 𝑉𝑉𝑆𝑆 +
𝑐𝑐𝑜𝑜𝑜𝑜 𝑉𝑉𝑆𝑆𝑆𝑆 − 𝑉𝑉𝐵𝐵
• 2 𝜙𝜙𝐹𝐹 : Bulk Fermi potential
• Example (NAND3)
S D
𝐶𝐶𝑆𝑆𝑆𝑆 𝐶𝐶𝐷𝐷𝐷𝐷
𝑉𝑉𝑆𝑆
𝑉𝑉𝐺𝐺 current
𝑉𝑉𝐷𝐷
MOS Physics – pFET
• Cutoff
– 𝑉𝑉𝑆𝑆𝑆𝑆 < |𝑉𝑉𝑇𝑇𝑇𝑇 | 𝑉𝑉𝑆𝑆
+
𝑉𝑉𝑆𝑆𝑆𝑆
– 𝐼𝐼𝐷𝐷 = 0 +
𝑉𝑉𝐺𝐺 −
– Open switch 𝑉𝑉𝑆𝑆𝑆𝑆 𝐼𝐼𝐷𝐷
−
𝑉𝑉𝐷𝐷
• Active
– 𝑉𝑉𝑆𝑆𝐺𝐺 > |𝑉𝑉𝑇𝑇𝑝𝑝 |
– If 𝑉𝑉𝑆𝑆𝑆𝑆 = 𝑉𝑉𝐷𝐷𝐷𝐷
1 𝑊𝑊 2 1 𝑊𝑊 2 1 2
• 𝐼𝐼𝐷𝐷 = 𝜇𝜇𝑝𝑝 𝑐𝑐𝑜𝑜𝑜𝑜 𝑉𝑉𝑆𝑆𝑆𝑆 − |𝑉𝑉𝑇𝑇𝑇𝑇 | = 𝑘𝑘𝑝𝑝 ′ 𝑉𝑉𝑆𝑆𝑆𝑆 − |𝑉𝑉𝑇𝑇𝑇𝑇 | = 𝛽𝛽𝑝𝑝 𝑉𝑉𝑆𝑆𝑆𝑆 − |𝑉𝑉𝑇𝑇𝑇𝑇 |
2 𝐿𝐿 2 𝐿𝐿 2
𝐼𝐼𝐷𝐷
cutoff active
𝑉𝑉𝑆𝑆𝑆𝑆
0
|𝑉𝑉𝑇𝑇𝑇𝑇 |
MOS Physics – pFET
• Active
– 𝑉𝑉𝑆𝑆𝐺𝐺 > |𝑉𝑉𝑇𝑇𝑝𝑝 |
– If 𝑉𝑉𝑆𝑆𝑆𝑆 varies
𝑊𝑊 1 1
• 𝐼𝐼𝐷𝐷 = 𝜇𝜇𝑝𝑝 𝑐𝑐𝑜𝑜𝑜𝑜 { 𝑉𝑉𝑆𝑆𝑆𝑆 − |𝑉𝑉𝑇𝑇𝑇𝑇 | 𝑉𝑉𝑆𝑆𝑆𝑆 − 𝑉𝑉𝑆𝑆𝑆𝑆 2 } = 𝛽𝛽𝑝𝑝 { 𝑉𝑉𝑆𝑆𝐺𝐺 − |𝑉𝑉𝑇𝑇𝑝𝑝 | 𝑉𝑉𝑆𝑆𝐷𝐷 − 𝑉𝑉𝑆𝑆𝐷𝐷 2 }
𝐿𝐿 2 2
𝜕𝜕𝐼𝐼𝐷𝐷
• The saturation occurs when = 0.
𝜕𝜕𝑉𝑉𝑆𝑆𝑆𝑆
– 𝑉𝑉𝑆𝑆𝑆𝑆,𝑠𝑠𝑠𝑠𝑠𝑠 = 𝑉𝑉𝑆𝑆𝐺𝐺 − |𝑉𝑉𝑇𝑇𝑇𝑇 | (saturation voltage)
– If 𝑉𝑉𝑆𝑆𝑆𝑆 ≥ 𝑉𝑉𝑆𝑆𝑆𝑆 − |𝑉𝑉𝑇𝑇𝑇𝑇 |
• Saturation
1 2
• 𝐼𝐼𝐷𝐷 = 𝛽𝛽𝑝𝑝 𝑉𝑉𝑆𝑆𝐺𝐺 − |𝑉𝑉𝑇𝑇𝑝𝑝 |
2
𝐼𝐼𝐷𝐷
non-saturation saturation
• pFET resistance
1
– 𝑅𝑅𝑝𝑝 =
𝛽𝛽𝑝𝑝 (𝑉𝑉𝐷𝐷𝐷𝐷 −|𝑉𝑉𝑇𝑇𝑇𝑇 |)
𝑉𝑉𝑆𝑆𝑆𝑆
0
𝑉𝑉𝑠𝑠𝑠𝑠𝑠𝑠