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TLP2200
Isolated Bus Driver
High Speed Line Receiver Unit: mm
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
Forward current IF 10 mA
Reverse voltage VR 5 V
Input Power Dissipation PD 45 mW
Input power dissipation derating (Ta ≥ 70°C) ΔPD/ΔTa -0.86 mW/°C
Output current IO 25 mA
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 3) Device considered a two terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5,6,7 and 8 shorted
together
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Electrical Characteristics (unless otherwise specified, Ta = 0 to 85°C, VCC = 4.5 to 20V,
IF(ON) = 1.6 to 5mA, IF(OFF) = 0 to 0.1mA, VEL = 0 to 0.8V,VEH = 2.0
to 20V)
Logic low output voltage VOL IOL = 6.4mA (4 TTL load) ― 0.32 0.5 V
VE = 2.7V ― ― 20
(**) All typ. values are at Ta = 25°C, VCC = 5V, IF(ON) = 3mA unless otherwise specified.
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Switching Characteristics
(unless otherwise specified, Ta = 0 to 85°C,VCC = 4.5 to 20V,IF(ON) = 1.6 to 5mA,IF(OFF) = 0 to
0.1mA)
Test
Characteristic Symbol Test Condition Min Typ. Max Unit
Circuit
Propagation delay time to Without peaking capacitor
― 235 ―
logic high output level tpLH C1 ns
(Note 5) With peaking capacitor C1 ― ― 400
Propagation delay time to Without peaking capacitor
1 ― 250 ―
logic low output level tpHL C1 ns
(Note 5) With peaking capacitor C1 ― ― 400
Output rise time (10−90%) tr ― 35 ― ns
―
Output fall time (90−10%) tf ― 20 ― ns
Common mode transient
IF = 1.6mA, VCM = 50V,
immunity at logic high CMH −1000 ― ― V / μs
Ta = 25°C
output (Note 6)
3
Common mode transient
IF = 0mA, VCM = 50V,
immunity at logic low CML 1000 ― ― V / μs
Ta = 25°C
output (Note 6)
(*) All typ. values are at Ta = 25°C, VCC = 5V, IF(ON) = 3mA unless otherwise specified.
(Note 4) Duration of output short circuit time should not exceed 10ms.
(Note 5) The tpLH propagation delay is measured from the 50% point on the leading edge of the input pulse to the
1.3V point on the leading edge of the output pulse.
The tpHL propagation delay is measured from the 50% point on the trailing edge of the input pulse to the
1.3V point on the trailing edge of the output pulse.
(Note 6) CML is the maximum rate of rise of the common mode voltage that can be sustained with the output
voltage in the logic low state (VO < 0.8V).
CMH is the maximum rate of fall of the common mode voltage that can be sustained with the output
voltage in the logic high state (VO > 2.0V).
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Test Circuit 1 tpHL, tpLH, tr and tf
Output VO
Pulse
Monitoring
Generator
Node
tr = tf = 5ns
VO = 5V VCC 5V
619Ω
IF(ON) D1 to D4
1 VCC 8
50% : 1S1588
0mA Input 7
Input IF tpLH 2
tpHL Monitoring D1 D2
VOH Node 3 6 CL
90% D3
GND
5kΩ
Output VO 1.3V D4
10% 4 5
VOL R1
tr tf C1=120pF
Pulse
5V
Generator
ZO = 50Ω
tr = tf = 5ns VCC
S1
VO
619Ω
3.0V 1 VCC 8
D1 to D4
Input VE 1.3V
IF 2 7 : 1S1588
Output VO 0V
tPZL tPLZ S1 and S2 CL D1 D2
IF=IF (OFF)
Closed 3 6
0.5V D3
5kΩ
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Test Circuit 3 Common Mode Transient Immunity
VCC
50V Output
90% 1 VCC 8
VCM IF VO
10%
0V 2 7 Monitoring
tr tf A Node
B 3 6
VFF GND 0.1μF
4 5 Bypass
VOH
VO(min) (*) VCM
Switch AT A: IF = 1.6mA −
Output VO +
VO(max) (*) Pulse gen.
VOL ZO = 50Ω
Switch AT B: IF = 0mA
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