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NRND
LVTTL Clock Generator
NOT RECOMMENDED FOR NEW DESIGNS
Q0
SEL
VDDO
GND
VDDA
Q7
Q6
VDDO
Q0
GND
Q1
VDDO
2
SEL1
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Core Supply Voltage 3.135 3.3 3.465 V
VDDA Analog Supply Voltage 3.135 3.3 3.465 V
VDDO Output Supply Voltage 3.135 3.3 3.465 V
IDD Power Supply Current 96 mA
IDDA Analog Supply Current 15 mA
IDDO Output Supply Current 20 mA
TABLE 4B. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
PLL_SEL, CLK_SEL,
Input SEL0, SEL1, SEL2, SEL3, 2 VDD + 0.3 V
VIH FB_IN, MR
High Voltage
CLK0 2 VDD + 0.3 V
PLL_SEL, CLK_SEL,
Input SEL0, SEL1, SEL2, SEL3, -0.3 0.8 V
VIL FB_IN, MR
Low Voltage
CLK0 -0.3 1.3 V
CLK0, CLK_SEL
Input MR, FB_IN, VDD = VIN = 3.465V 150 µA
IIH SEL0, SEL1, SEL2, SEL3
High Current
PLL_SEL VDD = VIN = 3.465V 5 µA
CLK0, CLK_SEL
Input MR, FB_IN, VDD = 3.465V, VIN = 0V -5 µA
IIL SEL0, SEL1, SEL2, SEL3
Low Current
PLL_SEL VDD = 3.465V, VIN = 0V -150 µA
VOH Output High Voltage; NOTE 1 2.6 V
VOL Output Low Voltage; NOTE 1 0.5 V
NOTE 1: Outputs terminated with 50Ω to VDDO/2. In the Parameter Measurement Information Section,
see "3.3V Output Load Test Circuit".
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Zero Delay, Differential-to-LVCMOS/ ICS8705
NRND
LVTTL Clock Generator
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
CLK1 VDD = VIN = 3.465V 150 µA
IIH Input High Current
nCLK1 VDD = VIN = 3.465V 5 µA
CLK1 VDD = 3.465V, VIN = 0V -5 µA
IIL Input Low Current
nCLK1 VDD = 3.465V, VIN = 0V -150 µA
VPP Peak-to-Peak Input Voltage 0.15 1.3 V
Common Mode Input Voltage;
VCMR GND + 0.5 VDD - 0.85 V
NOTE 1, 2
NOTE 1: Common mode voltage is defined as VIH.
NOTE 2: For single ended applications, the maximum input voltage for CLK1, nCLK1 is VDD + 0.3V.
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
TABLE 4D. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDA = VDDO = 2.5V±5%, TA = 0°C TO 70°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Core Supply Voltage 2.375 2.5 2.625 V
VDDA Analog Supply Voltage 2.375 2.5 2.625 V
VDDO Output Supply Voltage 2.375 2.5 2.625 V
IDD Power Supply Current 90 mA
IDDA Analog Supply Current 15 mA
IDDO Output Supply Current 20 mA
TABLE 4E. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = VDDA = VDDO = 2.5V±5%, TA = 0°C TO 70°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
PLL_SEL, CLK_SEL,
Input SEL0, SEL1, SEL2, SEL3, 2 VDD + 0.3 V
VIH FB_IN, MR
High Voltage
CLK0 2 VDD + 0.3 V
PLL_SEL, CLK_SEL,
Input SEL0, SEL1, SEL2, SEL3, -0.3 0.8 V
VIL FB_IN, MR
Low Voltage
CLK0 -0.3 1.3 V
CLK0, CLK_SEL
Input MR, FB_IN, VDD = VIN = 2.625V 150 µA
IIH SEL0, SEL1, SEL2, SEL3
High Current
PLL_SEL VDD = VIN = 2.625V 5 µA
CLK0, CLK_SEL
Input MR, FB_IN, VDD = 2.625V, VIN = 0V -5 µA
IIL SEL0, SEL1, SEL2, SEL3
Low Current
PLL_SEL VDD = 2.625V, VIN = 0V -150 µA
VOH Output High Voltage; NOTE 1 1.8 V
VOL Output Low Voltage; NOTE 1 0.5 V
NOTE 1: Outputs terminated with 50Ω to VDDO/2. In the Parameter Measurement Information section,
see "2.5V Output Load Test Circuit" figure.
TABLE 4F. DIFFERENTIAL DC CHARACTERISTICS, VDD = VDDA = VDDO = 2.5V±5%, TA = 0°C TO 70°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
CLK1 VDD = VIN = 2.625V 150 µA
IIH Input High Current
nCLK1 VDD = VIN = 2.625V 5 µA
CLK1 VDD = 2.625V, VIN = 0V -5 µA
IIL Input Low Current
nCLK1 VDD = 2.625V, VIN = 0V -150 µA
VPP Peak-to-Peak Input Voltage 0.15 1.3 V
Common Mode Input Voltage;
VCMR GND + 0.5 VDD - 0.85 V
NOTE 1, 2
NOTE 1: Common mode voltage is defined as VIH.
NOTE 2: For single ended applications, the maximum input voltage for CLK1, nCLK1 is VDD + 0.3V.
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
1.65V±5% 1.25V±5%
VDD,
SCOPE VDD, SCOPE
VDDA, VDDA,
VDDO VDDO
Qx Qx
LVCMOS LVCMOS
GND GND
-1.165V±5% -1.25V±5%
3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT 2.5V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT
V DD
V
DDO
Qx 2
nCLK
V Cross Points V
PP CMR
CLK V
DDO
Qy 2
tsk(o)
GND
V V V 80% 80%
DDO DDO DDO
Q0:Q7 2 2 2
➤ ➤ 20% 20%
tcycle n ➤ tcycle n+1 ➤ Clock
Outputs tR tF
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
nCLK1 VOH
VDD
CLK1 VOL CLK0 2
VOH
VDDO nCLK1
2
FB_IN VOL
➤ t(Ø)
➤ CLK1
t PERIOD
t PW
odc =
t PERIOD
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
APPLICATION INFORMATION
VDD
R1
1K
Single Ended Clock Input
CLK
V_REF
nCLK
C1
0.1u R2
1K
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
3.3V
3.3V
3.3V
1.8V
Zo = 50 Ohm
Zo = 50 Ohm CLK
CLK Zo = 50 Ohm
FIGURE 3A. CLK/NCLK INPUT DRIVEN BY FIGURE 3B. CLK/NCLK INPUT DRIVEN BY
LVHSTL DRIVER 3.3V LVPECL DRIVER
3.3V
3.3V
3.3V 3.3V Zo = 50 Ohm
3.3V
R3 R4
125 125
Zo = 50 Ohm LVDS_Driv er
CLK
CLK
R1
Zo = 50 Ohm 100
nCLK Receiv er
nCLK HiPerClockS Zo = 50 Ohm
LVPECL Input
R1 R2
84 84
FIGURE 3C. CLK/NCLK INPUT DRIVEN BY FIGURE 3D. CLK/NCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER 3.3V LVDS DRIVER
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
LAYOUT GUIDELINE
The schematic of the ICS8705 layout example is shown in depend on the selected component types, the density of the
Figure 4A. The ICS8705 recommended PCB board layout components, the density of the traces, and the stack up of the
for this example is shown in Figure 4B. This layout example is P.C. board.
used as a general guideline. The layout in the actual system will
PLL_SEL
VDD
R1 43 Zo = 50
SEL3
R7
10 - 15
VDDA
VDD
C16 C11
10u 0.01u
VDD
32
31
30
29
28
27
26
25
U1
VDDA
VDDO
PLL_SEL
SEL3
Q7
Q6
VDD
GND
SEL0 1 24
Ro ~ 7 Ohm Zo = 50 SEL1 2 SEL0 VDDO 23
3 SEL1 Q5 22
4 CLK0 GND 21
R4 43 5 nc Q4 20
6 CLK1 VDDO 19
Driv er_LVCMOS 7 nCLK1 Q3 18
8 CLK_SEL GND 17
MR Q2
VDDO
VDDO
FB_IN
SEL2
GND
VDD
R5 R4
Q0
Q1
1K 1K
VDD=3.3V or 2.5V ICS8705
10
11
12
13
14
15
16
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Input to Input to
'1' '0'
R2 43
RU1 RU2
1K Not Install
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Zero Delay, Differential-to-LVCMOS/ ICS8705
NRND
LVTTL Clock Generator
The following component footprints are used in this layout trace delay might be restricted by the available space on the board
example: and the component location. While routing the traces, the clock
signal traces should be routed first and should be locked prior to
All the resistors and capacitors are size 0603.
routing other signal traces.
POWER AND GROUNDING • The differential 50Ω output traces should have same
Place the decoupling capacitors as close as possible to the power length.
pins. If space allows, placement of the decoupling capacitor on
• Avoid sharp angles on the clock trace. Sharp angle
the component side is preferred. This can reduce unwanted in- turns cause the characteristic impedance to change on
ductance between the decoupling capacitor and the power pin the transmission lines.
caused by the via.
• Keep the clock traces on the same layer. Whenever pos-
Maximize the power and ground pad sizes and number of vias sible, avoid placing vias on the clock traces. Placement
capacitors. This can reduce the inductance between the power of vias on the traces can affect the trace characteristic
and ground planes and the component power and ground pins. impedance and hence degrade signal integrity.
The RC filter consisting of R7, C11, and C16 should be placed • To prevent cross talk, avoid routing other signal traces in
as close to the VDDA pin as possible. parallel with the clock traces. If running parallel traces is
unavoidable, allow a separation of at least three trace
CLOCK TRACES AND TERMINATION widths between the differential clock trace and the other
Poor signal integrity can degrade the system performance or signal trace.
cause system failure. In synchronous high-speed digital systems, • Make sure no other signal traces are routed between the
the clock signal is less tolerant to poor signal integrity than other clock trace pair.
signals. Any ringing on the rising or falling edge or excessive ring
• The series termination resistors should be located as
back can cause system failure. The shape of the trace and the
close to the driver pins as possible.
GND
50 Ohm
Trace
VDD
R7 C16 C11
C1 R1 VIA
VDDA
Other
signals
C7
Pin 1
C6
C5
U1
C4
C2 C3 R2
50 Ohm
Trace
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
RELIABILITY INFORMATION
0 200 500
Single-Layer PCB, JEDEC Standard Test Boards 67.8°C/W 55.9°C/W 50.1°C/W
Multi-Layer PCB, JEDEC Standard Test Boards 47.9°C/W 42.1°C/W 39.4°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
TRANSISTOR COUNT
The transistor count for ICS8705 is: 3126
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Inc. (IDT) assumes no responsibility for either its use or for infringement of
any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial
applications. Any other applications such as those requiring high reliability, or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT reserves
the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
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Zero Delay, Differential-to-LVCMOS/ ICS8705
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LVTTL Clock Generator
DISCLAIMER Integrated Device Technology, Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT’s sole discretion. All
information in this document, including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described
products are determined in the independent state and are not guaranteed to perform the same way when installed in customer products. The information contained herein is provided without representation
or warranty of any kind, whether express or implied, including, but not limited to, the suitability of IDT’s products for any particular purpose, an implied warranty of merchantability, or non-infringement
of the intellectual property rights of others. This document is presented only as a guide and does not convey any license under intellectual property rights of IDT or any third parties.
IDT’s products are not intended for use in applications involving extreme environmental conditions or in life support systems or similar devices where the failure or malfunction of an IDT product can
be reasonably expected to significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT.
Integrated Device Technology, IDT and the IDT logo are registered trademarks of IDT. Other trademarks and service marks used herein, including protected names, logos and designs, are the property
of IDT or their respective third party owners.
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