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Webinar Agenda
• Noise on Vcc
• Major sources of IC chip interference
• Susceptible Device Types
• Example PLL circuit
– Basic PLL circuit description
– Noise effects the VCO
– Example Test System
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What is Noise on Vcc?
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Why Testing Noise on Vcc is important?
• Need to ensure immunity against noise
Designers and manufacturers of integrated circuits and small dense PCBs need to ensure their
products offer sufficient immunity against Vcc noise and other jitter.
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Impacts of Noise on IC Supply Voltage
• Digital ICs:
Broadband or discrete frequency noise on the Vcc supply can introduce jitter on
high speed data lines and degrade system performance
• Analog/RF ICs:
Noise on the supply could couple into the analog output degrading SNR or SINAD
of the signal therefore degrade system performance.
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Noise Immunity
TTL CMOS
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Noise Immunity
VNH = VOH (Min) - VIH (Min)
VNL = VIL (Max) - VOL (Max)
Noise margins for TTL and CMOS using the above:
TTL :
VIH(Min) = 2.0 V, VIL(Max) = 0.8 V,
VOH(Min) = 2.4 V, VOL(Max) = 0.4 V
VNH = VOH (Min) - VIH (Min) = 2.4 V – 2.0 V = 0.4 V
VNL = VIL (Max) - VOL (Max) = 0.8 V – 0.4 V = 0.4 V
CMOS :
VIH(Min) = 3.5 V, VIL(Max) = 1.5 V,
VOH(Min) = 4.9 V, VOL(Max) = 0.1 V
VNH = VOH (Min) - VIH (Min) = 4.9 V – 3.5 V = 1.4 V
VNL = VIL (Max) - VOL (Max) = 1.5 V – 0.1 V = 1.4 V
1.8V CMOS:
VNH = 0.1275 V Less than -8 dBm of power over 50 ohms!
VNL = 0.2325 V
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Noise Immunity
Up to 2V immunity.
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Noise Immunity
No load
15 pf load
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Digital Switching Noise
Vcc
• Dynamic switching patterns in digital
circuits
Droop L
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Ground Bounce
• Ground path detailed between the
power supply, board, device and
output trace
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Ground Bounce Scope Example
• CH3 - switching I/O pin
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Vcc Droop
• Conversely, Vcc droop occurs
when the output switches from
logic level “0” to “1”
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Switch Mode Power Supply Noise
Furthermore lower cost SMPSs may couple electrical switching noise back onto the main power
line creating additional interference
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EMI/RFI and Cross-talk Sources
Depending upon the board layout, this high frequency noise can increase
system BER, or show up as spurious signals if coupled on analog and RF lines.
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Highly Susceptible Devices
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Susceptible Devices
• Devices, ICs, Modules and PCBs:
– PLL, Phase Lock Loop
– Oscillators
– FPGA
– MMICs
– ADC and DAC
– Flash memory
– Clock Distribution circuits
– SerDes
– 10-Gigabit Ethernet transceivers
– All low-voltage devices
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Example PLL Block Diagram
• Major components are the Phase Frequency Detector (PFD), Charge pump, loop
filter, VCO, pre-scale and feedback counters
• Uses master clock crystal/oscillator reference to lock phase with other clocks in
the same system
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Effects of Noise on PLL Circuits
• PLLs are widely used for generating high-precision, low jitter
timing signals
• PLL Noise
– Power and ground plane noise that change the absolute reference values
– EMI/RFI interference that penetrates the loop filter, VCO section of the PLL
– Intrinsic jitter/noise from the reference oscillator
• Noise Effects
– Noise on the circuit traces can cause the PFD to misinterpret the correct phase
– Reference oscillator noise causes the PFD low/high outputs to constantly vary
attempting to lock the phase
– EMI/RFI on the loop filter, VCO network creates hysteresis in the PLL final output
– The loss or the inability to lock the phase of Ref in and VCO output signal
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Example PLL Test System
Injected Controlled Noise
• Typical test system includes JV9000A noise generator, PLL evaluation board, DC power
supply, and TIA (time interval analyzer) receiver
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PLL Resonant Frequency Testing
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Standard Noisecom JV9000
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JV9000 Block Diagram
• AWGN, CW and auxiliary signals
are combined with DC power via
bias-Tee
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Options
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JV9000 Noise on Vcc Applications
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Noise on Vcc Test Demonstration
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JV9000 Demonstration Results
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JV9000 Demonstration Results
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Summary
• All digital devices create noise
• RFIC mixed signal IC, high frequency PLL’s and low voltage ICs are especially
sensitive to noise
• These devices employ bypass capacitors, power & ground plane filtering,
separate digital, analog power and ground planes attempting to eliminate noise
• Mixed signal RFIC’s & HF PLL’s are used in hand held devices with radios and
microprocessors like smart phones, tablets, e-readers and notebook PC’s
• The Noisecom JV9000A series can be used to test the accuracy of these software
and hardware models and identify other immunity problems during engineering
process, not after
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Noisecom Products
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Thank You for Participating
in Today’s Webinar
Any Questions?
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WTG Regional Technical Contacts
• James Lim – Republic of Singapore - JLim@wtcom.com
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