Beruflich Dokumente
Kultur Dokumente
Introduction
Test engineers have an understanding of high voltage isolation leakage testing, but Partial
Discharge testing is much less understood. We first summarize the more traditional Isolation
Leakage testing, and then follow with a comprehensive account of Partial Discharge testing.
Isolation Voltage
The initial design of a device with an insulation barrier includes a choice of materials and
dimensions to achieve an isolation voltage rating.
The isolation rating is the voltage level under specified conditions that the device will withstand
without breakdown.
In another type of breakdown, a path across the surface of a device can lead to carbonization and
possibly even Surface Flashover.
Another more complex cause of degradation failure inside the volume of the insulation material
is Erosion Breakdown which will be later presented.
In High Voltage Leakage testing, the tester applies line frequency AC voltage and monitors the
resulting device current to not exceed a certain limit. A good device will have both resistive and
capacitive leakage components that are proportional to the instantaneous applied voltage. The
resistive component of device impedance is typically in the order of Gigohms. A Leakage failure
occurs when this resistance is degraded. Excessive device capacitance could also cause leakage
failure, though a physical mechanism to cause this seems improbable.
Partial Discharge
Partial discharges are the source of Erosion Breakdown which affects the long term life of an
insulator.
Partial discharges are discharges that do not completely bridge the insulation between the
terminals. These discharges are termed “partial” because they occur in areas that occupy a small
portion of the electrical path length and are limited in magnitude because they are in series with
mostly good insulation (which may eventually degrade). These discharges can occur in insulators
that contain gaseous inclusions, cavities, or voids.
To understand how and why this occurs the following sections will include Electric Field
Theory.
Charge +Q
r2
D D2=Q/4πrr22
r1
The strength and direction of the Electric Field Intensity “ε” Any point in an electric field may be
measured by the force and direction upon a test charge as shown in Figure 2. Electric Field Intensity
“ε” measured in Newtons1 per Coulomb (dimensionally equivalent to Volts per meter) may be
thought of as the force effectiveness of the electric field.
+Qt
ε ƒt
ε
ε = ƒt/Qt
Figure 2. Electric Field Intensity at a Test Charge
Unlike Electric Flux Density “D”, the magnitude of the Electric Field Intensity “ε” is affected by the
medium. ε is proportional to the Electric Flux Density but inversely proportional to permittivity of
the medium as follows: ε= D/e , where is e the permittivity of the medium. The permittivity of a
vacuum is the basic electrical constant eo which equals 8.85x10-12 F/m, (Farads per meter). The
permittivity e of all other materials is expressed as a dimensionless ratio er times the permittivity eo
of a vacuum (e = er eo). Table 1 below indicates the relative permittivity values for some selected
materials.
Medium Relative
Permittivity (er)
Vacuum 1
Air 1.006
Styrofoam 1.03
Polystyrene 2.7
Plexiglass 3.4
Amber 3
Rubber 3
1
Newton is the force required to accelerate a mass of one kilogram at the rate of one meter per second squared
Quartz 5
Formica 6
Ammonia (liquid) 22
Glycerine 50
Distilled water 81
Barium Titanate 1,200
(BaTiO3)
Barium Titanate 20,000
Stannate
Q+ Q-
Figure 3. Plots of Electric Field Intensity and Flux Density vs Distance between Two
Oppositely Charged Plates in Uniform Medium (Air)
In Figure 3. the two charges are assumed to be evenly distributed on the inside surfaces, and end
effects are ignored. Because of opposite charges and symmetry, cancelation of the electric field
within the volume of each plate will occur such that the fields will be zero across the thickness
of the two plates. This causes the charges to be present only on the inside surfaces of the two
plates. With the permittivity (e) of air a constant, and since ε=D/e, the ε and D fields will
therefore have similar shapes across the gap.
This is not the case in Figure 4., since there are two different dielectrics across the gap. As
previously stated, Flux Density is not affected by the medium, and will therefore be the same in
both mediums as shown in Figure 4. Notice that the Field Intensity will be twice as great in the
air where er = 1 as in the dielectric where er = 2. It is important to note that the smaller
permittivity dielectric has the higher Electric Field Intensity.
Q+ Q-
air
er=1 er=2
Figure 4. Electric Flux Density and Field Intensity ε between Two Oppositely Charged
Parallel Plates Separated by Two Types of Dielectrics
Figure 5. below illustrates a model for a capacitor (or the passive elements of an optocoupler). A
quartz insulator 1.0 mm thick is shown between two conducting plates. The insulator has defects
in the form of air voids. If 1.0 kV is applied across the insulator, there would be an Electric Field
Intensity of 1.0kV per mm (ε=volts/distance) across the dielectric. However, the air voids have a
relative permittivity (∈r = 1) equal to 1/5 that of the quartz, which would cause a localized
Electric Field Intensity of 5 kV/ mm in the air voids. This causes unequal charge distributions in
the insulator. Table 2. shows that the dielectric strength of quartz is 30 kV/mm. The air voids,
however, have a dielectric strength of only 3 kV/mm. This produces sufficient ionization in the
voids to cause an arc that shorts out the charges that accumulate on opposite sides of the void.
This discharge path is in series with good insulation which limits the bandwidth of the
picocoulomb discharge. The effect is similar to discharging a capacitor through a high resistance.
ε
Quartz
er = 5
Void,
Air er = 1
When the void discharges, the arcing stops and a slow recharging of the void through good
insulation begins again until the critical breakdown voltage of the air in the void is
again reached, repeating the process of slow charging followed by fast discharging. Thus the
void essentially becomes a relaxation oscillator. This effect is known as Partial Discharge.
Table 2. below illustrates the relative dielectric strength of some sample materials.
When high voltage is applied to a device that produces Partial Discharge it may be observed that
the effect starts at a certain voltage level, and once started, the voltage must be reduced to a
lower voltage before it ceases. These two voltages are called the Inception and Extinction
voltages. This effect is illustrated in Figure 6. In typical AC voltage testing Partial Discharge
cycles may occur many times during the positive and negative peaks. In applications, if this
happens with sufficient magnitude over time, arcing in the voids will degrade the insulation,
even producing tree-like patterns in the dielectric that lead to failure. This effect is called Erosion
Breakdown.
Figure 6. below illustrates the repetitive nature of Partial Discharge. Once Inception Voltage is
reached the frequency of partial the discharge will increase as the AC voltage is approaches its
peak value (frequency change not illustrated).
Inception
Voltage
Extinction
Voltage
There are a number of Regulatory Agencies governing standards throughout the world:
USA UL 1577
Germany VDE 0884
Canada CSA comp. acceptance notice 5
UK BSI
The standard test adopted by the European Community (CE) for semiconductor manufacturers is
VDE 0884. This has also become recognized as an international standard. There are three classes
of tests that exist for VDE optocoupler test specifications: Type, Random, and Routine.
1. Type Testing is performed on a specified number of devices that are sent to the testing
agency. It includes both destructive and non-destructive tests as well as
environmental test and is the most all-encompassing, determining whether products
meet design requirements.
2. Random Testing, which is performed on random samples from normal production
batches, also does both destructive and non-destructive testing.
3. Routine Testing is non-destructive testing that is performed on all production units.
Routing Testing (as well as Type and Random) includes partial discharge testing to
verify isolation barrier integrity.
Partial discharge measurement per VDE 0884 (June 1992) is used to evaluate the insulation
integrity of optocouplers. Partial discharge testing replaces the common dielectric withstand
voltage test, because dielectric test voltages may pre-damage the insulation of an optocoupler.
Partial discharge testing qualifies an optocoupler for operation at voltage levels that are below
the inception level so that no harmful breakdown of the insulation occurs during its normal
lifetime. The illustrations below describe the partial discharge test for Type and Sampling
(Procedure A—Figure 7.) and for 100% production (Procedure B—Figure 8.) testing in
accordance with VDE 0884.
AC Voltage
Voltage
initial (Maximum
V initial (MaximumTransient)
Transient)
V pr (1. 5 Viorm)
VIORM
(Maximun
Rated
Contiunous)
t
0
tini tm ( 60sec)
(10sec)
td
V
Vpr =1. 875 (Viorm)
Viorm
(Maximum
Rated
Continuous)
t
tm
td
Term Definition
Vinitial Maximum test voltage for the Partial discharge test. It is also the maximum
transient over voltage occurring in a rated mains service class. At this initial
voltage, partial discharge (but no breakdown) may occur. Vinitial also equals
Viotm (transient over voltage) which is listed in the applicable VDE
insulated related characteristics section. Preferred values for Vinitial are
shown in Table 3 below. This is taken from table 2 of the VDE 0884, June
1992 revision.
Vpr Partial Discharge test voltage applied to an optocoupler and maintained for
a specific time period, tst. During this time, Partial Discharge is measured at
a specific time interval, tm. Vpr=1.5 X Viorm for procedure A and
Vpr=1.875 X Viorm for Procedure B.
Viorm Working voltage (maximum service insulation voltage); this is the
maximum continuous permitted voltage that may be applied to an
optocoupler. This value is specified by VDE to each insulator.
tm Test time for Partial Discharge equal to 60 seconds for Procedure 1 and
1 second for procedure B.
tini Time beginning at Vinitial test voltage, which equals 10 seconds.
td Test voltage initialization time.
Pass/Fail No leakage failures and no optocoupler to have more than 5 pC Partial
Criteria Discharge during Partial discharge test time, tm.
Rated Mains 1 2 3 4
voltage up to Peak Peak Peak Peak
and including V
rms. & V dc
50 330 500 800 1500
100 500 800 1500 2500
150 800 1500 2500 4000
300 1500 2500 4000 6000
600 2500 4000 6000 8000
1200 4000 6000 8000 12000
Material Group
Because the behavior of insulating materials is very complex under various contaminants and
voltages, direct correlation between deterioration of the insulating material and formation of
conductive paths on the insulation surface is not practical. Correlation between the Comparative
Tracking Index (CTI) and ranking performance of insulating materials has been found by
empirical observation. Consequently, CTI values can be used to categorize insulation materials:
Material Group 1 600 < CTI
Material Group 2 400 < CTI < 600
Material Group 3a 175 < CTI < 400
Material Group 3b 100 < CTI < 175
In some equipment specifications, material Group is used in conjunction with Pollution Degree,
Creepage distance and the Working Voltage Table.
2
Source: VDE 0884, June 1992 revision, Table 2
Front Panel Variacs Volt Meter Circuitry Leakage Current Partial Discharge
V1 and V2 Peak Detector Measurement Signal Processing
0 to 120 VAC 0 to 7.50 KVAC uApeak
(0 to 10.6 KVpeak)
Main Controller
Figure 9. HT 9464 High Voltage Diagram Showing Signals to Main Controller and Partial
Discharge Calibrator
Another consideration when using multiple devices is the effect of the resultant higher device
leakage current upon the tester. With higher device leakage currents, the tester Source Voltage
will have to be raised more than normal to obtain the desired Device Voltage. These two
voltages typically have a small difference due to a drop across the tester source impedance.
Typically the Device Voltage is more than 95% of the tester Source Voltage. With multiple
devices and larger leakage currents the actual Device Voltage will be a smaller percentage of the
Source Voltage and more dependent upon the device leakage currents. If device leakage current
is not fairly constant then the Device Voltage will be difficult to keep at the desired setting.
The Test Equipment required for Partial Discharge Testing is considerably different from the
standard Automatic Test Equipment (ATE) utilized to test analog, digital and mixed signal
circuits. The design must be able to generate high voltages (up to 10 kV peak) and unlike Hi-Pot
Testers, detect leakage in the sub-µA range. Additionally for Partial Discharge measurement the
equipment must have the ability to detect and measure minute charges at the picocoulomb level.
For accurate and repeatable Partial Discharge measurements, the equipment must be calibrated
against a traceable standard. Additionally for use in production interfacing to a handler is
mandatory. Most importantly, the equipment needs VDE certification to allow the user to test to
the International VDE Standard.
HT, Inc. is a privately owned company specializing in Semiconductor Equipment. The HT 9460
and 9464 product lines previously owned by Hewlett Packard, were acquired by HT in 1998. HT
is located in the heart of Silicon Valley. For further information:
Email: info@ht-world.com
Phone: 408-980-9738
Fax: 408-727-0344.
www.ht-world.com