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• Quality
By quality, we mean an attribute of the product that determines its fitness of use.
Quality means a level or standard which is turn, depends on our M’s besides
many other factors:
• Materials
• Manpower
• Machineries
• Management
Statistical quality control (SQC) means planned collection and affective use of
data for studying causes of variation in quality cither or between processes, procedures,
materials, machines etc or over periods of time.
[This cause effect analysis is then fed back into the system with a view to
continuous action on the process of handling, manufacturing packaging, transporting
and delivery at end use.]
• Management
• Methods &
• Mathematics
The main purpose of S.Q.C is to device statistical techniques, which would help
us in separate the assignable causes from the chance cause, thus enabling us to take
immediate remedial action whenever assignable causes are present.
The variation due to these causes is beyond the control of human hand and
cannot be avoided/prevented under any circumstances. The range of such variation is
known as natural tolerance of the process or allowable variation.
The variation due to these causes is non-random or, the so-called assignable
causes and is termed as preventable variation of any production process.
• Process Control:
The main objective in any production process is to control, maintain the quality of the
manufactured product, so that it conforms to quality standards. In other words, we want
to ensure that the proper defective items in the manufactured product is not too large.
This is called process control & is achieved through the technique of control chars
pioneered by Stewarts.
• Product Control:
• Control Chart:
The Shewhart control chart gives two answers of a problem faced in the industry:
i) A central line (CL) to indicate the desired standard or the level of the
process.
ii) Upper control limit (UCL) and
iii) Lower control limit (LCL)
Example: For following data, the constructed control chart has drawn as
following: 12, 14, 15, 16, 23, 18, 19, 16, 17, and 14
Above figure shows the essential features of a control chart as applied to sample
averages. The sample averages are plotted, and if they fall within the control limits, the
process is said to be in a state of statistical control. A state of statistical control merely
means that only random causes are present. It does not necessarily mean that the
product meets specifications.
• Types of control charts:
The analysis of variance is a technique for breaking the total variation observed
in the experimental data into different components, associated with the nature of
classification of the data. Each component subjected to a defined source of variation.
An article that does not conform to one or more of the specifications is termed as
defective while any instance of articles lack of conformity to specifications is a defect.
Thus, every defective contains one or more of the defects.
The limits of variation on a control chart based on µt + 3σt & µt − 3σt which are termed
respectively the UCL & LCL are known as 3 σ control limits. The + 3 σ control limits
are used to distinguish between random and specific causes of variation.
•
• C-Chart:
The C-chart is used for the control of number of defects per unit. C-chart is
particularly effective when the number of defects possible on a unit is large but the
percentage for any simple defect is small.
The sample size for the C-chart is usually any one of the fixed time, length, area,
a single unit or group of units. In the case of yarn, the fixed length constitutes the unit of
sample.
It may be noted that when the lower control limit is negative it is taken as zero.
• P-Chart:
The P-chart is used whenever the quality characteristic observed in the
classification of items as defective. It is the result of inspection and is also most
useful when tests are of a group or no group nature.
A np– Chart shows the actual number of defectives found each sample. Control chart for
the number of defectives is equivalent to the control chart for P i.e fraction defective. It is
a particular alternative when all the samples have the size n. it makes direct use of
number of defectives.
For no of defectives.
Total no of defectives
Average no of fraction defective, P = Total no of items inspected
Total no . of defectives of all samples
Central Line, CL = n P = No of samples inspected
Upper control limit, UCL = n P +3 n P (1 −P )
Lower control limit, LCL = n P −3 n P (1 −P )
ΣXi
X =
n
MATH
Problem:- 1
From a transistor production line 20 samples (each of 100 transistor) in chosen. The no.
of defects in each sample is given below:
Sample No. of defect (di)
1 → 44
2 → 48
3 → 32
4 → 56
5 → 29
6 → 31
7 → 46
8 → 52
9 → 44
10 → 48
11 → 36
12 → 52
13 → 35
14 → 41
15 → 42
16 → 30
17 → 46
18 → 38
19 → 26
20 → 30
Solution:-
The appropriate control chart will be c- chart. The computation required for
preparing this chart are-
(ii) U. C. L = c + 3 c =40 +3 40
= 58.97
(iii) L. C. L = c – 3 c =40 −3 40
= 21.025
65
60
55 UCL =58.97
50
45
40
CL = 40
35
30
25
20 LCL = 21.025
15
10
05
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
Comment:
Since all the points are lying within central limits. So the control chart is regarded to be
statistical control.
Problem: 02
Construct control chart for mean and range for the following data on the basis of samples,
samples of 5 being are taken every hour (each set of 5 has been arranged in ascending
order of magnitude). Comment on the process.
No. of
Sample observation Sample mean xi Range Ri
sample
1. 42, 65, 75, 78, 87 69.4 45
2. 42, 45, 68, 72, 90 63.4 48
3. 19, 24, 80, 81, 81 57 62
4. 36, 54, 69, 77, 84 64 48
5. 42, 51, 57, 59, 78 57.4 36
6. 51, 74, 75, 78, 132 82 81
7. 60, 60, 72, 95, 138 85 78
8. 18, 20, 27, 42, 60 33.4 42
9. 15, 30, 39, 62, 84 46 69
10. 69, 109, 113, 118, 153 112.4 84
11. 64, 90, 93, 109, 112 93.6 48
12. 61, 78, 94, 109, 136 95.6 75
Σxi = 859.2 ΣRi = 716
Σxi 859 .2
C.Lx = x = = = 71 .6
n 12
∴ U .C .L x =x +A2 R
120
110 UCL =106.21
100
90
80
CL = 71.6
70
60
50
40 LCL = 36.99
30
20
10
0 1 2 3 4 5 6 7 8 9 10 11 12
Comment:
From x chart we see that the process in out of control. Since the points corresponding to
8th and 10th sample be outside the control limits.
ΣRi 716
∴ [R = = = 59 .67 ]
n 12
R– Chart
UCL = 125.9
Sample range
120
110
100
90
80
70
60 CL = 59.67
50
40 LCL = 36.99
30
20
10
LCL = 0
0 1 2 3 4 5 6 7 8 9 10 11 12
No. of sample
Comment:
From range chart, we see the process is within control. Since all the points lies within the
control limits.
Although 'R' chart depicts control the process cannot be regarded to be statistical control
since x chart shows lack of control.
Problem: 03
Samples of 100 tubes are drawn randomly from the output of process that produced
several thousand items daily. Sample items are inspected for quality and defective tubes
are rejected. The result of 15 sample are given below:
On the basis of stated information prepare a control chart for fraction defectives.
The suitable control chart here will be P–chart. The computation required for preparing
this chart are-
∴ C.L = 0.113
P (1 − P )
2. U.C.L = P + 3
n
0.113 × (1 − 0.113 )
= 0.113 + 3 [n = 100 ]
100
= 0.1147.
P (1 −P )
3. L.C.L = P −3
n
0.113 × (1 − 0.113 )
= 0.113 – 3 [n = 100 ]
100
= 0.0813
No. of defectives
p– Chart
0.18
0.17
0.16
0.15
UCL = 0.1447
0.14
0.13
0.12
CL = 0.113
0.11
0.10
0.09 LCL = 0.081
0.08
0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
No. of sample
Comment:
The process is out of control, since the points corresponding to its, 5th, 8th, 11th and 12th
sample lie outside the control limits.
Problem: 04
The data given in the table refer to visual defects found during impaction of cloth of the
first to samples of size 100 each. Use them to obtain U.C.L and L.C.L for np– chart.
U.C.L = n p +3 n p (1 −p )
= 8.9 + 3 8.9(1 −0.089 )
= 17.63
L.C.L = n p −3 n p (1 −p )
= 8.9 – 3 8.9(1 −0.089 )
= 0.17
d– Chart
No. of defection
30
25
20 UCL =17.63
15
10 CL = 8.9
5
LCL = 0.17
0 1 2 3 4 5 6 7 8 9 10
No. of sample