Afm service

Creative Biostructure provides images with near-atomic resolution for

measuring surface topography using the Atomic Force Microscopy (AFM)
technology. The Atomic Force Microscope is applied to solve processing and
materials problems in a wide range of technologies affecting the electronics,
telecommunications, biomedical, chemical, automotive, aerospace, and
energy industries.

Technical Abilities

Measurement:
i. Topography (surface roughness, grain size, step height, etc.) at the angstrom
scale
ii. Mechanical properties (stiffness, etc.)
iii. Electrical properties (capacitance, conductivity, etc.)
iv. Thermal properties
v. Magnetic properties
These properties can be measured either in air or with the specimen immersed
in a liquid, depending on your requests.

Imaging:
AFM images show critical information about surface features with
unprecedented clarity, including 3D images and quantitative data analysis
(such as feature sizes, surface roughness and area, and cross-section plots),
integrated and interpreted in the context of your problem.

Manipulation:
In manipulation, the forces between tip and sample can also be used to
change the properties of the sample in a controlled way, for example, atomic
manipulation, scanning probe lithography and local stimulation of cells.

Block diagram of atomic force microscope using beam deflection detection. As

the cantilever is displaced via its interaction with the surface, the reflection of
the laser beam will be displaced on the surface of the photodiode.Figure 1.
Block diagram of atomic force microscope using beam deflection detection. As
the cantilever is displaced via its interaction with the surface, the reflection of
the laser beam will be displaced on the surface of the photodiode.

What can Creative Biostructure do for you?

Quality service from the world’s leader in atomic force microscopy to measure
the surface structure and characteristics by atomic forces between the probe
tip and sample.
A wide range of applications by AFM:
i. Material surface roughness measurement and structure observation;
ii. Material surface 2D/3D pattern image;
iii. Nanoscale depth analysis and dimensioning;
iv. World class support and equipment.

Our scientists can offer you highly accurate measurements such as surface
topography, dopant distribution, magnetic domain features, and a wide variety
of other sample properties to give you the information you need to do great
work. Please contact us for more information.

Ordering Process

Ordering Process

References

Lang, K.M., et al. (2004). Conducting atomic force microscopy for nanoscale
tunnel barrier characterization. Review of Scientific Instruments. 75 (8):
2726–2731.
Binnig, G., (1986). Atomic Force Microscope. Physical Review Letters. 56 (9):
930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007. PMID
10033323.
Geisse, Nicholas A. (July–August 2009). AFM and Combined Optical
Techniques. Materials Today. 12 (7–8): 40–45.
doi:10.1016/S1369-7021(09)70201-9. Retrieved 4 November 2011.