VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

ATPG LAB Guidelines

Step1: - tcsh (press Enter)

Step2: -Please check with Sujith regarding the Input netlists

Step3: -mkdir STUCK_AT TRANSISTION

Step4: - cd STUCK_AT

Step5: -mkdir EDT EDT_BYPASS

Step6: - cd EDT

Step7: - cp -rf copy all test cases from the <ATPG_traning>dir .

Step8: - cp < EDT inserted netlist, edt dofile, test proc from the your EDT output dir> Step9: -
source /home/tools/mentor/cshrc_mentor Step10: - cd case1

Step9: - source run_sa

Note1:- ATPG Training has 12 Labs, Please go through README and follow instruction and go
through LAB_QUESTION Note2:- Add command set_context dft -scan in the beginning of the
dofile Note3:- Add read_veriog < Netlist path> in the run file or dofile after above command
Note4:- Dump all reports like scan cells.rpt, scan_chains.rpt, DRC.rpt, nonscan.rpt, clock.rpt
Note5:- Please go through complete log file each line, analyze Warnings, Errors Note6:-
Understand Corresponding DRC rules like S1 is scan rule violations Note7:- Analyze Clocks and
Resets are controllable means Clock path should be clean, it should not come from combo or
sequential Note8:- Please use tool manual for different commands. Note9:- While running,
some commands are not executing, please modify dofile and re-run

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

DIRECTORY_STRUCTURE
ATPG_Training

|---- STUCK_AT

|---EDT

|----dofile

|----netlist

|----vecs

|----faults

|----logs

|---EDT_BYPASS

|----dofile

|----netlist

|----vecs

|----faults

|----logs

|---- TRANSITION

|---EDT

|----dofile

|----netlist

|----vecs

|----faults

|----logs

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

STUCK_AT

• Generate Patterns for EDT mode and EDT_BYPASS Mode for all Test cases.
• Analyse number of scan chains and Scan chain length for both modes.
• Analyse all reports, coverage report.
• Write detected and Undetected Faults.
• Write patterns in different formats like verilog, stil, wgl, ascii for serial and parallel mode.

TRANSITION

• Generate Patterns for EDT mode for all Test cases.

• Analyse number of scan chains and Scan chain length for both modes.
• Analyse all reports, coverage report.
• Write detected and Undetected Faults.
• Write patterns in different formats like verilog, stil, wgl, ascii for serial and parallel mode

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

INPUTS

1. EDT inserted Netlist

Copy netlist from the EDT output directory. This netlist has both EDT and EDT_BYPASS features

2. EDT dofile

Copy netlist from the EDT output directory. This dofile has has EDT Settings

3. EDT Test proc file

Copy netlist from the EDT output directory. This testproc has EDT constraints

4. Main dofile

This dofile has reading netlist, libraries model(.mdt) and setup of ATPG commands like ATPG
constraints, add nofaults

EDT dofile and and EDT testproc need to define in the Main dofile

5. Library

Read Mentor Tessent supported library model(.mdt file)

OUTPUTS

1. ATPG Vectors or ATPG Patterns (Verilog Patterns)

Serial Patterns

a. Chain Patterns

b. Capture Patterns

Parallel Patterns

a. Chain Patterns

b. Capture Patterns

Patterns are in verilog, ascill, wgl, stil, binary formats

2. Report_statistics

Check coverage report and its hierarchical report

a. Check test coverage a. Calculate manually test coverage

b. Check Fault coverage a. Calculate manually fault coverage

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3. Reports

Report_clocks

Report_scan_cells

Report_scan_chains

Report_drc

4. Logs

Analyze all warnings

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

ATPG LAB OBSERVATIONS

Test Case 1: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage
What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 2: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?

How resolved?

Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 3: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 4: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 5: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 6: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 7: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 8: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 9: -
Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 10: -

Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?

How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 11: -

Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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VLSIGURU DFT TRAINING ATPG LAB OBSERVATIONS

Test Case 12: -

Problem Definition: -
Inputs: -

 Scan Inserted with EDT Netlist

 Library Model
 EDT dofile
 EDT Test proc
 ATPG Dofile commands
Outputs: -

 ATPG Patterns
 ATPG Coverage
 ATPG Reports
a. Scan cells report
b. Scan chain report
c. Drc summary report
d. Report patterns
e. Report clocks
f. Report coverage

What is issue?
How resolved?
Observations: -
1) How many clock domains?
2) How many resets?
3) Number of scan chains?
4) Chain test pattern format?
5) Number of scan flops and non-scan flops in the design?
6) Chain length?
7) Number of DRC violations?
8) Report patterns command
9) How many basic patterns, sequential patterns and Reset patterns?
10) Write all flavours of patterns styles
11) Write Serial and parallel patterns?
12) Write Detect faults and Undetected faults?
13) Manually calculate test coverage and fault coverage with formula?
14) Log file: - please note your observations from the log file

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