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Features • Reliability
– MTTF: 1.5 million device hours3
• Micron® 3D TLC NAND Flash – Static and dynamic wear leveling
• RoHS-compliant package – Uncorrectable bit error rate (UBER): <1 sector
• SATA 6 Gb/s interface per 1015 bits read
• TCG/Opal 2.0-compliant self-encrypting drive • Low power consumption
(SED) – Device Sleep numbers: <4mW
• Compatible with Microsoft eDrive® – DIPM numbers: 110mW TYP 4
• Hardware-based AES-256 encryption engine • Endurance: Total bytes written (TBW)
• ATA modes supported – 120TB
– PIO mode 3, 4 • Capacity (unformatted): 128GB
– Multiword DMA mode 0, 1, 2 • 2.5-inch × 7mm form factor
– Ultra DMA mode 0, 1, 2, 3, 4, 5, 6 • Secure firmware update with digitally signed firm-
• Industry-standard, 512-byte sector size support ware image
• Hot-plug/hot-remove capable (2.5") • Operating temperature
• Device sleep (DEVSLP), extreme low-power mode – Commercial (0°C to +70°C)5
• Native command queuing support with 32-com-
mand slot support Notes: 1. Typical I/O performance numbers as meas-
• ATA-8 ACS3 command set compliant ured fresh-out-of-the-box (FOB) using Iome-
• ATA security feature command set and password ter with a queue depth of 32 and write
login support cache enabled.
• Secure erase (data page) command set: fast and se- 2. 4 KB transfers used for READ/WRITE latency
cure erase values.
• Sanitize device feature set support 3. The product achieves a mean time to failure
• Self-monitoring, analysis, and reporting technology (MTTF) based on population statistics not
(SMART) command set relevant to individual units.
• Dynamic write acceleration 4. Active average power measured during exe-
• Adaptive thermal monitoring cution of MobileMark® with DIPM (device-
initiated power management) enabled.
• Power loss protection for data-at-rest
5. Temperature measured by SMART attribute
• Performance1, 2
194.
– PCMark® Vantage (HDD test suite score): Up to
84,000 Warranty: Contact your Micron sales representative
– Sequential 128KB READ: Up to 530 MB/s for further information regarding the product,
– Sequential 128KB WRITE: Up to 500 MB/s including product warranties.
– Random 4KB READ: Up to 55,000 IOPS
– Random 4KB WRITE: Up to 83,000 IOPS
– READ/WRITE latency: 85µs/40µs (TYP)
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© 2015 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
1100 2.5-Inch and M.2 NAND Flash SSD
Features
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
General Description
General Description
Micron’s solid state drive (SSD) uses a single-chip controller with a SATA interface on
the system side and up to four channels of Micron NAND Flash internally. Available in
both M.2 and 2.5-inch form factors, the SSD integrates easily in existing storage infra-
structures.
The SSD is designed to use the SATA interface efficiently during both READs and
WRITEs while delivering bandwidth-focused performance. SSD technology enables en-
hanced boot times, faster application load times, reduced power consumption and ex-
tended reliability.
The self-encrypting drive (SED) features a FIPS-compliant, AES-256 encryption engine,
providing hardware-based, secure data encryption, with no loss of SSD performance.
This SED follows the TCG/Opal specification for trusted peripherals.
When TCG/Opal features are not enabled, the device can perform alternate data en-
cryption by invoking the ATA security command set encryption features, to provide full-
disk encryption (FDE) managed in the host system BIOS. TCG/Opal and ATA security
feature sets cannot be enabled simultaneously.
The data encryption is always running; however, encryption keys are not managed and
the data is not secure until either TCG/Opal or ATA security feature sets are enabled.
NAND
SSD
SATA
controller NAND
NAND
NAND
DRAM
buffer
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1100 2.5-Inch and M.2 NAND Flash SSD
Performance
Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the capacity of the drive and the interface of the host. Addition-
ally, overall system performance can affect the measured drive performance. When
comparing drives, it is recommended that all system variables are the same, and only
the drive being tested varies.
Performance numbers will vary depending on the host system configuration.
For SSDs designed for the client computing market, Micron specifies performance in
fresh-out-of-box (FOB) state. Data throughput measured in steady state may be lower
than FOB state, depending on the nature of the data workload.
For a description of these performance states and of Micron's best practices for per-
formance measurement, refer to Micron's technical marketing brief, Best Practices for
SSD Performance Measurement.
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Logical Block Address Configuration
User Available
Total LBA Max LBA Bytes
Capacity Decimal Hexadecimal Decimal Hexadecimal (Unformatted)
256GB 500,118,192 1DCF32B0 500,118,191 1DCF32AF 256,060,514,304
512GB 1,000,215,216 3B9E12B0 1,000,215,215 3B9E12AF 512,110,190,592
1024GB 2,000,409,264 773BD2B0 2,000,409,263 773BD2AF 1,024,209,543,168
2048GB 4,000,797,360 EE7752B0 4,000,797,359 EE7752AF 2,048,408,248,320
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Reliability
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 4: MTTF
Note: 1. The product achieves a mean time to failure (MTTF) of 1.5 million hours, based on popu-
lation statistics not relevant to individual units.
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Reliability
Endurance
Endurance for the SSD can be predicted based on the usage conditions applied to the
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficiency of the drive. The table below shows the drive lifetime for each
SSD capacity by client computing and sequential input and based on predefined usage
conditions.
Notes: 1. Total bytes written validated with the drive 90% full.
2. SSD volatile write cache is enabled.
3. Access patterns used during reliability testing are 25% sequential and 75% random and
consist of the following: 1% are 512B; 44% are 4 KiB; 35% are 64 KiB; and 20% are 128
KiB.
4. Host workload parameters, including write cache settings, I/O alignment, transfer sizes,
randomness, and percent full, that are substantially different than the described notes
may result in varied endurance results.
5. GB/day can be calculated by dividing the total bytes written value by the number of
days in the interval of interest (365 days × number of years). For example: 100 TB/3
years/365 days = 91 GB/day for 3 years.
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1100 2.5-Inch and M.2 NAND Flash SSD
Electrical Characteristics
Electrical Characteristics
Environmental conditions beyond those listed may cause permanent damage to the de-
vice. This is a stress rating only, and functional operation of the device at these or any
other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect reliability.
Note: 1. Operating temperature is best measured by reading the SSD's on-board temperature
sensor, which is recorded in SMART attribute 194 (0xC2).
Parameter/Condition Specification
Non-operating shock 1500G/0.5ms
Non-operating vibration 5–800Hz @ 3.10G
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1100 2.5-Inch and M.2 NAND Flash SSD
Dynamic Write Acceleration
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1100 2.5-Inch and M.2 NAND Flash SSD
Adaptive Thermal Monitoring
dTd
u(t) = Kp × Tp(t) + Kd ×
dt
The delay-control equation is tuned for a steady-state temperature target, which has
been designed as an optimum balance of hardware temperature tolerances and drive
performance. Steady-state temperature targets are hardware-configuration dependent
and may range around 80°C. Temperatures below the intended steady-state target will
not produce a proportional component delay, but may produce a differential compo-
nent based on the current rate of temperature change according to the control equa-
tion. When the feature is active, DRAM refresh rates are also adjusted to improve data
integrity and stability while operating outside of temperature specifications.
When the device temperature falls below 73°C, normal operation will continue without
induced delays. If the temperature continues to rise above the temperature target and
exceeds a hardware-dependent critical threshold, the device will abort host commands
to prevent component damage. The critical threshold values have a 5°C margin on top
of the target threshold of 85°C.
Device temperature values used by the adaptive thermal monitoring feature are based
on an internal temperature sensor located on the device PCB and may differ from case
or package temperatures as measured by a thermocouple. Device temperature is acces-
sible through SMART attribute 194, though usage of the SMART feature is not necessary
for adaptive thermal monitoring functionality.
Adaptive thermal monitoring does not change the current negotiated speed of the SATA
bus, nor require or cause any new commands to be issued on the SATA bus. Rated
throughput performance is not guaranteed at any point above the maximum specified
operating temperature.
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
TCG/Opal Support
TCG/Opal Support
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1100 2.5-Inch and M.2 NAND Flash SSD
TCG/Opal Support
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
TCG/Opal Support
IEEE1667
Probe Silo Supported –
TCG Storage Silo Supported –
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1100 2.5-Inch and M.2 NAND Flash SSD
TCG/Opal Support
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
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© 2015 Micron Technology, Inc. All rights reserved.
1100 2.5-Inch and M.2 NAND Flash SSD
Device ID
Note: 1. F = The content of the word is fixed and does not change.
V = The content of the word is variable and may change depending on the state of the
device or the commands executed by the device.
X = The content of the word may be fixed or variable.
R = The content of the word is reserved and will be zero.
M = Support of the word is mandatory.
O = Support of the word is optional.
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1100 2.5-Inch and M.2 NAND Flash SSD
Commands
Commands
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1100 2.5-Inch and M.2 NAND Flash SSD
Commands
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1100 2.5-Inch and M.2 NAND Flash SSD
Commands
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1100 2.5-Inch and M.2 NAND Flash SSD
Interface Connectors
Interface Connectors
2.5" 7 mm
Figure 3: 2.5" 7 mm SSD Interface Connections
P1 S1
Power Signal
segment segment
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1100 2.5-Inch and M.2 NAND Flash SSD
Interface Connectors
M.2 2280
Figure 4: M.2 2280 SSD Interface Connections
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1100 2.5-Inch and M.2 NAND Flash SSD
Interface Connectors
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1100 2.5-Inch and M.2 NAND Flash SSD
Physical Configuration
Physical Configuration
2.5" 7 mm
Product mass: 56 grams MAX
Physical dimensions conform to the applicable form factor specifications as listed in
the figure below.
(14.00)
W ±0.25 (90.60)
L MAX
(61.71)
(14.00)
(90.60)
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1100 2.5-Inch and M.2 NAND Flash SSD
Physical Configuration
M.2 2280
Product mass: 10 grams MAX
Physical dimensions conform to the applicable form factor specifications as listed in
the figure below.
(3.50 DIA)
(5.50 DIA)
Pin 1
B
W ±0.15
Pin 75
L ±0.15
A MAX
B ±0.08
Note: 1. M.2 2280 dimension values in millimeter per PCI Express M.2 Specification Rev. 1.0.
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1100 2.5-Inch and M.2 NAND Flash SSD
Compliance
Compliance
Micron SSDs comply with the following:
• Micron Green Standard
• Built with sulfur resistant resistors
• CE (Europe): EN 55032 Class B, RoHS
• FCC: CFR Title 47, Part 15 Class B
• UL/cUL: approval to UL-60950-1, 2nd Edition, IEC 60950-1:2005 (2nd Edition); EN
60950-1 (2006) + A11:2009+ A1:2010 + A12:2011 + A2:2013
• BSMI (Taiwan): approval to CNS 13438 Class B and CNS 15663
• RCM (Australia, New Zealand): AS/NZS CISPR32 Class B
• KC RRL (Korea): approval to KN32 Class B, KN 35 Class B
FCC Rules
This equipment has been tested and found to comply with the limits for a Class B digital
device, pursuant to part 15 of the FCC Rules. These limits are designed to provide rea-
sonable protection against harmful interference in a residential installation. This equip-
ment generates, uses, and can radiate radio frequency energy and, if not installed and
used in accordance with the instructions, may cause harmful interference to radio com-
munications. However, there is no guarantee that interference will not occur in a partic-
ular installation. If this equipment does cause harmful interference to radio or televi-
sion reception, which can be determined by turning the equipment off and on, the user
is encouraged to try to correct the interference by one or more of the following meas-
ures:
• Reorient or relocate the receiving antenna.
• Increase the separation between the equipment and the receiver.
• Connect the equipment into an outlet on a circuit different from that to which the re-
ceiver is connected.
• Consult the dealer or an experienced radio/TV technician for help.
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1100 2.5-Inch and M.2 NAND Flash SSD
References
References
• Serial ATA: High-speed serialized AT attachment, Serial ATA working group, available
at www.sata-io.org
• SATA 3.2 GOLD
• ATA-8 ACS3 (T13/2161-D, Revision 5)
• TCG Storage Security Subsystem Class Opal; Specification 2.00 Revision 1.00, Feb 24,
2012
• TCG Core Specification; Specification 2.00 Revision 2.00, Nov 4, 2011
• TCG Storage Interface Interactions: Specification Version 1.02 Revision 1.00 30 De-
cember, 2011
• IEEE-1667: "Standard Protocol for Authentication in Host Attachments of Transient
Storage Devices"
• SFF 8201 Rev 2.7: For form factor
• PCI Express M.2 Specification rev 1.0: For form factor
• Trade Agreements Act of 1979 (19 U.S.C. 2501)
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1100 2.5-Inch and M.2 NAND Flash SSD
Revision History
Revision History
Rev. D – 10/17
• Updated the certifications list
• Updated Table 10, Word 83 to reflect both APM ON & OFF available options
Rev. C – 12/16
• Added TAA Compliant option
• Updated pin names for M.2 in Table 14
Rev. B – 5/16
• Updated random 4KB read IOPS
• Updated Adaptive Thermal Monitoring, TCG/Opal Support and Device ID sections
• Updated doc ID number
• Misc. documentation edits
Rev. A – 12/15
• Initial release
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Mouser Electronics
Authorized Distributor
Micron Technology:
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MTFDDAV256TBN-1AR15FCHA MTFDDAV256TBN-1AR1ZABCA MTFDDAK512TBN-1AR15FCDA
MTFDDAK512TBN-1AR12ABDA MTFDDAK256TBN-1AR15FCDA MTFDDAV1T0TBN-1AR1ZABHA
MTFDDAV1T0TBN-AAR12ABYYES MTFDDAV256TBN-1AR12ABDA MTFDDAV256TBN-1AR15FCDA
MTFDDAV512TBN-1AR12ABDA MTFDDAV512TBN-1AR1ZAFHB MTFDDAK256TBN-1AR1ZABFA
MTFDDAK512TBN-1AR15ABFA MTFDDAK512TBN-1AR1ZABFA MTFDDAK1T0TBN-1AR12ABDB
MTFDDAK2T0TBN-1AR12ABDB MTFDDAK512TBN-1AR12ABDB MTFDDAK256TBN-1AR12ABDA
MTFDDAK256TBN-1AR15ABDA MTFDDAK1T0TBN-1AR15ABFA MTFDDAK1T0TBN-1AR1ZABDA
MTFDDAK1T0TBN-1AR1ZABFA MTFDDAK256TBN-1AR15ABFA MTFDDAV256TBN-1AR1ZABCB
MTFDDAV256TBN-1AR1ZABFA MTFDDAV256TBN-1AR1ZABLA MTFDDAV512TBN-1AR15ABFA
MTFDDAV512TBN-1AR1ZABDA MTFDDAV512TBN-1AR1ZABFA