Process Ownership Rev40, 23Feb2016

Process Process Owners Issue Process Owners

(Event) Resolution (Standardization, Fmech
QA Contact Advocate, SME)
North America: Steve Gagne
Manufacturing Processes
Wilmington Fab: MEMS Brian Hall Joyce Collett
Wilmington Fab: Photonics Paul Stevens Joyce Collett
Wilmington Fab: All Others George Molnar Joyce Collett
Wilmington Trim and Probe John O’Connor Joyce Collett John Liddy, Probe Council owns standardization
Wilmington Test Dev Floor Ops Chris Lantagne Joyce Collett
GSBO Test Dev Floor Dave Morse Joyce Collett
NWD Warehouse Operations Kishore Balan Joyce Collett
Chelmsford IC Test Brian Jablonski Joyce Collett
Chelmsford Hybrid Assy and Test Everett Cole Joyce Collett
PL Test & Product Development
All Product Lines PL Test Engineering Mgr Joyce Collett
Failure Mechanism Advocacy
MEMS Particles: Rachel Elwell
WLCSP: Santosh Kudtarkar
Bare Die: Kathleen McLaughlin
Delamination: Dick McCann
Test Coverage:
EOS / ESD: Alan Righter
Automotive NTF: Bob Dzwil
Business Processes
WW SW ECN Process Mike Johnston, WW SW ECN Process Owner

Limerick: Ger Buckley

Manufacturing Processes
Limerick Fab & iPassives Roisin O Brien Tony Gormley
Limerick Trim and Probe John Liddy Tony Gormley John Liddy, Probe Council owns standardization
Lim Test Development Floor John Garry Tony Gormley
PL Test & Product Development
New Product Development Gordon Thomson Tony Gormley EP0035 / PLE
Test Development Process Niall McKeown / Gordon Thomson Tony Gormley ADI0941
New Product Characterization Sandra Healy Tony Gormley ADI0480
Pre Release Management Noel Quirke / Gordon Thomson Tony Gormley ADI0789
Release To Automotive Noel Quirke Tony Gormley ADI0838
Enhanced Product (EP) Kieran McGann Tony Gormley ADI0981/2
Customer Support Ger Buckley / Terry Forristal / Tony Gormley
Kieran McGann
PCN Management Terry Forristal Tony Gormley ADI0010
Medical Business Support Kieran McGann Tony Gormley
Design Guidelines (EP00080) Dennis Dempsey (Jnr) Tony Gormley EP00080
Failure Mechanism Advocacy
Test Process: John Campbell
Test Coverage: Gordon Thomson
Automotive NTF: Mike Keane
FMech Unidentified: Mike Looby
Non-Volatile Memory (NVM): Shaun Bradley
Business Processes
Inkless Assembly John Garry
Bare & Wafer Die (Sales) John Liddy/Probe Council ADI0470
Known Good Die Brian McNeilis LK08726
Issue Resolution Management Tony Gormley ADI1025

Foundry: Matt Crome

Manufacturing Processes
Foundry Wafer Fab Matt Crome Ed Waters
Foundry Trim and Probe Matt Crome Ed Waters John Liddy, Probe Council owns standardization
Process Ownership Rev40, 23Feb2016
Process Process Owners Issue Process Owners
(Event) Resolution (Standardization, Fmech
QA Contact Advocate, SME)
Supplier Assembly & Test: SK Tan (Jhun Gocoyo for updates, ADI0559 for PROMIS site codes)
Manufacturing Processes
Subcontract Assembly Sonny Ong / Glenn Capuz SK Tan
Amkor China (AC3) Owen Liu / Eli Flores Roy Gu
Amkor Korea (AK1, 2, 3, 4) Aiden Choi Jhun Gocoyo
Amkor Phil (AP1) Roel Birung / George Faelden Aimee Magno
ATP MPD MLF (AP3) Ariel Aprecio / George Faelden Cacai Lopez
ATP MPD Hermetics (AP1) Roel Birung / George Faelden Aimee Magno
Amkor Taiwan (AT5) Jason Yang Calvin Loo
ASE Shanghai (AEP) Mentor Li / Eli Flores Roy Gu
ASE Korea (AEK) Aiden Choi Jhun Gocoyo
ASE Kaoshiung (AEG) Jason Yang Calvin Loo
ASE Taiwan Chong Li (AET) KK Lin Calvin Loo
Carsem (CRS, CRM) Edmond Chua / Warren Amparo Dennis Arciga
Cirtek (CP1) Ariel Aprecio / George Faelden Edith Arive
Colorado Microcircuits (CMI) Greg Regan Ed Carciero
Compass (CTC) Owen Liu / Eli Flores Roy Gu
STATS Singapore (STA) Janee Nigos / Warren Amparo Dawn Yong
STATS Korea (SCK) Aiden Choi Jhun Gocoyo
STATS China (SCC) Owen Liu / Eli Flores Jean Lu
JCET (JC2) Mentor Li / Eli Flores Jean Lu
JCAP (JC1) Mentor Li / Eli Flores Jean Lu
Unisem (UG1) Eddie Chow/Warren Amparo Dennis Arciga
Sigurd (SM1) KK Lin Calvin Loo
Subcontract Test Process FK Heng
Amkor, XL Hermetic Test Marte Hartinez Cacai Lopez
(AP4)
Carsem (CRS) KW Chaw / Annie Goh Dennis Arciga
Giga (GS1) Jen-Chi Lin / FK Heng Calvin Loo
ASE Kaoshiung (AEG) Jen-Chi Lin / FK Heng Calvin Loo
ASE Korea (AEK) Adam Ma/ Mart Martinez Jhun Gocoyo
ASE Taiwan Chong Li (AET) Jen-Chi Lin /FK Heng Calvin Loo
JCAP (JC2) Victor Hu / Andy Ye Jean Lu
JCET (JC1) Victor Hu / Andy Ye Jean Lu
STATS China (SCC) Andy Ye / Adam Ma Jean Lu
STATS Singapore (STA) Steven Tan / Annie Goh Dawn Yong
STATS Singapore Probe Steven Tan / Annie Goh Dawn Yong
UTAC Probe (UT1) Yang Tong Jiang/Annie Goh Dawn Yong
Unisem (UG1) WK Lam Dennis Arciga
Sigurd (SM1) Jen-chi Lin Calvin Loo
Subcon B/E (T&R, Pack & Ship) Glenn Capuz / FK Heng
Carsem S (CRS) KW Chaw / Annie Goh Dennis Arciga
SCS (STA) Steven Tan / Annie Goh Dawn Yong
ATP Test Captive Line Marte Martinez Cacai Lopez
ATP Test Non-Captive Line Marte Martinez Cacai Lopez
JCET (JC2) Victor Hu / Andy Ye Jean Lu
Giga Solutions (GS1) Jen-Chi Lin / FK Heng Calvin Loo
Amkor Taiwan WLCSP (AT5) Jason Yang Calvin Loo
ASE Korea (AEK) Adam Ma/ Mart Martinez Jhun Gocoyo
ASE Taiwan Chong Li (AET) Jen-Chi Lin /FK Heng Calvin Loo
JCAP WLCSP (JC1) Mentor Li / Eli Flores Jean Lu
SCS WLCSP (STA) Janee Nigos / Warren Amparo Dawn Yong
ASE Kaoshiung WLCSP (AEG) Jason Yang Calvin Loo
Subcontract Product Test (App) Test RE/PL Test Mgr
Singapore Warehouse Alpha Wang Dawn Yong
Failure Mechanism Advocacy
Die Attach: Glenn Capuz
Wire bond: Jef Interia
Package Body: Ray Eviota
Laminate Issues: James Yang
Solderability: Mon Navarro
Fmech Undetermined: Augie Andal
Process Ownership Rev40, 23Feb2016
Process Process Owners Issue Process Owners
(Event) Resolution (Standardization, Fmech
QA Contact Advocate, SME)
ADGT/PI: Raul Viacrucis
Manufacturing Processes
ADPI Assembly & Final Test Joey Go John Nas
ADGT/PI Equipment Ponch Santos John Nas
ADGT/PI Mfg Product Test (App) Manny Malaki John Nas
ADGT/PI Post Test Process Rey Luares John Nas
ADGT/PI Warehouse Racquel Luces John Nas
ADGT/PI Pkg Test Process Andrew Espiritu John Nas Packaged Test Manufacturing Process
ADGT MPD Process Ryan Bautista John Nas
ADGT Wafer Level Process Marco Kissey John Nas
ADGT Chip on Flex (COF) Process Marco Kissey John Nas
Failure Mechanism Advocacy
Mixing: John Nas
EOS/ESD: Raymond Sietereales
Package Crack: Jojo Pinlac
Test Misprocessing: Marlon Flores
Post Test Processing (Int/Ext): Joy Morano
Warehouse Misprocessing: Joy Morano
Automotive (excluding MEMS): Barry Yap
ADGT MEMS Test: Raymond Sietereales
Mil-Aero Test Misprocessing: Carrie Vallespin
Business Processes
Pack and Ship Alan DeOcampo, Pack and Ship Team Leader

Manufacturing Location Reliability Engineer

Risk Assessment Owner for Time Dependent Failure Mechanisms: James Molyneaux
Wilmington Denis Belisle
Limerick Mark Forde
Foundry Kevin Manning
Subcon (Assy/Test) Paul Gustilo
ADGT Test Paul Gustilo

TRB Name TRB Chairperson

Technical Review Board Contacts: Ed Carciero for updates
Fab/Probe
Wilmington Fab Denis Murphy
Wilmington Capping John O'Connor
Wilmington Trim Bob Doherty
ADLK Wafer Fab Change Review Board Ann O Sullivan
ADLK Probe Change Review Board Mike Kennedy
Foundry Oliver Donnelly
Assembly
Subcontractor Assembly Change TRB Ted Weygan
MEMS Assembly Change TRB Joel Benedictos
Test
ADGT Jhie Camacho
ADPI Oliver Caraballido
Backend MEMS TRB (Automotive Test) Jigar Raja
Subcontractor Test John Campbell
Test & Probe Hardware David Williams
Misc
Norwood Paul Kramarz
Greensboro David Hensley
Safe Launch Jim Hunt / John Garry