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How to Bump Test with the

Microlog®
What is a Bump Test?
A bump test (also called a hammer test) determines the
natural frequencies of a machine or a structure. The
idea behind the test is that if an object is impacted or
“bumped,” the object’s natural or resonant frequencies are
excited. If a spectrum is taken while the object is vibrating
due to the impact, spectral peaks result pinpointing the
object’s natural frequencies. A Microlog analyzer can be
used to capture this vibration response and to display a
spectrum showing the resonant or natural frequencies.

Perform a Bump Test


To perform a bump test with your Microlog, attach
an accelerometer to the test object (machine case or
structure), set up Microlog to obtain the response data,
impact (bump or hit) the object and analyze the data
collected.

Single Channel Microlog – Input Setup


From the Analyzer menu, select Input Setup (Figure 1).

In the Input Setup screen, the important fields to set are


Type: Acceleration (if you are using an accelerometer don’t
integrate the signal) and Full Scale: 10. SKF’s Microlog Data Collector.

NOTE: If an overload occurs during data collection,


increase the full scale setting with the up
arrow key.

Two-Channel Microlog – Input


Setup
From the 4:Analyzer menu, select 2:Input Setup
(Figure 2).

In the Input Setup screen, the important fields


to set are Type: Acceleration (if you are using an
accelerometer don’t integrate the signal) and Full
Scale: 10.

NOTE: If an overload occurs during data


collection, increase the full scale setting Figure 1. The INPUT SETUP Screen.
with the up arrow key.

Application Note CM3010


Single-Channel Microlog
– Spectrum Setup
From the Analyzer menu, select Spectrum
Setup to display the screen of Figure 3.

The important fields to set in Spectrum Setup


are Average Type: Pk Hold, Average Mode:
Cont., and Window:Uniform. The peak hold
averaging technique will hold the highest
amplitude value for each frequency line.
Continuous averaging will allow updating of the
captured signal as required.

Two-Channel Microlog – Figure 2. The INPUT SETUP Screen.

Measurement Setup
From the 4:Analyzer menu, select 3:Measment
Setup to display the screen of Figure 4.

The important fields to set in Measurement


Setup are Average Type: Pk Hold, Average
Mode: Cont., and Window:Uniform. The
peak hold averaging technique will hold the
highest amplitude value for each frequency line.
Continuous averaging will allow updating of the
captured signal as required.

Single-Channel Microlog
– Display Setup
Figure 3. The SPECTRUM SETUP Screen.
From the Analyzer menu, select Display Setup
(Figure 5).

A Display Setup with dual display of magnitude


and time allows you to clearly see the results of
the test and spot a “bad” impact or bump.

Single-Channel Microlog
– Trigger Setup
From the Analyzer menu, select Trigger Setup
(Figure 6).

The Trigger Setup menu is very important. To


capture and process the spectrum of a bump,
you need to trigger your Microlog to take data
only at the bump. Set Trigger Mode: Trigger to
make the Microlog “trigger,” or take data, only Figure 4. The MEASMENT SETUP Screen.
when a positive going input signal reaches 20%
of full scale.

How to Bump Test with the Microlog®


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2
Set Trigger Delay: -50 milliseconds which sets
the pre-trigger sample data to zero prior to the
bump.

Two-Channel Microlog – Trigger


Setup
From the 4:Analyzer menu, select 5:Trigger
Setup (Figure 7).

The Trigger Setup menu is very important. To


capture and process the spectrum of a bump,
you need to trigger your Microlog to take data
only at the bump. Set Trigger Mode: Trigger to
Figure 5. The DISPLAY SETUP Screen. make the Microlog “trigger,” or take data, only
when a positive going input signal reaches 20%
of full scale.

Set Trigger Delay: -50 milliseconds which sets


the pre-trigger sample data to zero prior to the
bump.

Natural frequencies can be quite high


(thousands of cpm), consequently the time
waveform captured will look densely packed.
This is all right and the DISPLAY EXPAND key
can be used to spread out this signal if you
choose.

When you impact a machine, you cause the


transducer to produce an electrical transient
Figure 6. The TRIGGER SETUP Screen. analogous to the machine’s vibration response.
When you use the input transducer as a trigger
you will get a “No Trigger” message during
the time you are not impacting (bumping) the
machine. This is obviously most of the time
– and is OK.

When you impact the machine sufficiently, you


reach your defined trigger level and the “No
Trigger” message disappears for a few seconds
and a time waveform and spectrum is displayed
(Figure 9). Depending on your maximum
frequency, this can take a minute or two. Be
patient.

The time waveform should begin at the 50 ms


delay point and should appear exponentially
Figure 7. The TRIGGER SETUP Screen. decaying. Use the DISPLAY EXPAND key if you
need to. Next, check the resulting spectrum

How to Bump Test with the Microlog®


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3
How to Bump Test with the Microlog®

RESULTING SPECTRUM

TIME WAVEFORM

Figure 8. Time Waveform of Impact Response. Figure 9. Time Waveform and Resulting Spectrum.

of this time sample and note the possible natural


frequencies. Repeat the bump test three or four times to
make sure that these peaks are consistent and are indeed
the natural frequencies of the system.

The above data can be saved in the Microlog using the


Save key and uploaded to PRISM as a NonRoute POINT.
In PRISM the time waveform can be uploaded for later
analysis.

SKF Reliability Systems


5271 Viewridge Court • San Diego, California 92123 USA
Telephone: +1 858-496-3400 • FAX: +1 858-496-3531
Web Site: www.skf.com/reliability
The contents of this publication are the copyright of the publisher and may not be reproduced (even extracts)
unless permission is granted. Every care has been taken to ensure the accuracy of the information contained in
this publication but no liability can be accepted for any loss or damage whether direct, indirect or consequential
arising out of the use of the information contained herein. SKF reserves the right to alter any part of this
publication without prior notice.

• SKF and Microlog are registered trademarks of the SKF Group.


• All other trademarks are the property of their respective owners.

CM3010 (Revised 12-05) • Copyright © 2005 by SKF Condition Monitoring, Inc. ALL RIGHTS RESERVED.

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