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SCANIN
1
Difficulties in Seq. ATPG Benchmark Circuits
Circuit
Theorem 8.1: A cycle-free circuit is always
initializable. It is also initializable in the presence of
F2
any non-flip-flop fault.
2
Theorem 8.2: Any non-flip-flop fault in a cycle-free
F3 circuit can be detected by at most dseq + 1 vectors.
F1
3 ATPG complexity: To determine that a fault is
Level = 1 F2 untestable in a cyclic circuit, an ATPG program using
2 nine-valued logic may have to analyze 9Nff time-
s - graph frames, where Nff is the number of flip-flops in the
F1 F3 dseq = 3 circuit.
Level = 1 3
L=3
1 2 4 5 6 1 2 4 5 6
L=2
L=1
2
Test Generation Partial Scan Example
Scan and non-scan flip-flops are controlled from Circuit: TLC
separate clock PIs: 355 gates
Normal mode – Both clocks active 21 flip-flops
Scan mode – Only scan clock active
Scan Max. cycle Depth* ATPG Fault sim. Fault ATPG Test seq.
Seq. ATPG model: flip-flops length (L) CPU s CPU s cov. vectors length
Scan flip-flops replaced by PI and PO
Seq. ATPG program used for test generation 0 4 14 1,247 61 89.01% 805 805
Scan register test sequence, 001100…, of length nsff + 4 4 2 10 157 11 95.90% 247 1,249
applied in the scan mode
Each ATPG vector is preceded by a scan-in sequence to set 9 1 5 32 4 99.20% 136 1,382
scan flip-flop states
10 1 3 13 4 100.00% 112 1,256
A scan-out sequence is added at the end of each vector
sequence 21 0 0 2 2 100.00% 52 1,190
Test length = (nATPG + 2) nsff + nATPG + 4 clocks * Cyclic paths ignored
3
Scan Set Applications Random-Access Scan (RAS)
PI PO
Combinational D Q
logic From comb. logic To comb.
RAM SD logic
SCANIN Scan flip-flop
(SFF)
nff
CK
bits CK
TC
SCANIN SCANOUT TC
SEL
Address decoder SCANOUT
SEL
ADDRESS Address scan
register
ACK
log2 nff bits
4
Summary
8 April 2008 25