Omicron Basic Protection Course Manual

OMICRON Academy
Power System Protection Testing with the CMC Test

System
Revision Table
Date (yyyy-mm-dd) Version Changes Name

2010-11-24 1.00 First version in new format AnnBie
2011-02-15 1.01 Annual update of the document BjoCia
2013-10-02 2.00 TU3.0 update AnnBie
2014-01-21 2.00-Alec1 South African Version Cpv
Actual Version 2.00
Please use this document only in combination with the related product manual which contains several important safety
instructions. The user is responsible for every application that makes use of an OMICRON product.
OMICRON electronics GmbH including all international branch offices is henceforth referred to as OMICRON.
© OMICRON 2011. All rights reserved. This document is a publication of OMICRON.

All rights including translation reserved. Reproduction of any kind, for example, photocopying, microfilming, optical
character recognition and/or storage in electronic data processing systems, requires the explicit consent of OMICRON.
Reprinting, wholly or in part, is not permitted.
The product information, specifications, and technical data embodied in this document represent the technical status at
the time of writing and are subject to change without prior notice.
We have done our best to ensure that the information given in this document is useful, accurate and entirely reliable.
However, OMICRON does not assume responsibility for any inaccuracies which may be present.
© OMICRON Academy 2014

Content
1. Substation Safety and Protection Testing 7
1.1. Safty 7
1.2. Do’s and Don’ts When Testing Protection Schemes 8
2. Start Page 10
2.1. Test Modules 11
2.2. Control Center 12
2.3. Test Tools 13
2.3.1. EnerLyzer 14
2.3.2. AuxDC 15
2.4. Setup 16
2.4.1. Test Set Association (NET x option) 16
2.4.2. System Settings 18
2.4.3. License Manager 20
2.4.4. Language Selection 21
2.5. Support 22
2.6. Homepage with Customer Area 23
2.7. User Forum in the Customer Area 24
3. Quick CMC 25
3.1. Preface 25
3.2. Test Module 26
3.3. Test Object 27
3.3.1. RIO Function Device (Protection Device) 28
3.3.2. RIO Function Distance (Distance Protection Parameters) 30
3.4. Hardware Configuration 31
3.4.1. Output Configuration Details 32
3.4.2. VT Connections and CT Connections 33
3.4.3. Analog Outputs 34
3.4.4. Binary / Analog Inputs 35
3.4.5. Binary Outputs 36
3.4.6. DC Analog Inputs 37
3.5. Test View 38
3.6. Impedance View and Phasor View 40
3.7. Report View 41
3.8. Different Display Options 42
3.9. Example 1: Wiring Test 42
3.10. Example 2: Power Test 43
3.11. QuickCMC Exercise 44
3.11.1. Tasks 44
3.11.2. Hardware Configuration 44
3.11.3. Instantaneous Earth fault Protection Test 45
4. OMICRON Control Center 46
4.1. Preface 46
4.2. New Test Document 47
4.2.1. Views 48
4.2.2. Document Properties 49
4.2.3. Field References 50
4.2.4. Company Logo 53
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4.2.5. Page Footer 54
4.3. Test Objects in the OCC 55
4.4. Global Hardware Configuration 56
4.5. Differences between Global and Local Hardware Configurations 57
4.6. Binary / Analog Inputs 57
4.7. IRIG-B & GPS 58
4.8. Inserting a Test Module 59
4.9. Local Hardware Configuration 60
4.10. Renaming the Test Module 61
4.11. Creating a New Group in the OCC 62
4.12. Pause Module 63
4.13. OMICRON Control Center Exercise 64
5. Ramping 65
5.1. Preface 65
5.2. Adding a Ramping Test Module 66
5.3. Test Module 67
5.5. Test View 70
5.6. Calculating the Ramp Parameters 71
5.7. Entering the Ramp Parameters 72
5.8. Detail View 73
5.9. Signal View 74
5.10. Impedance View 74
5.11. Phasor View 74
5.12. Ramp Assessments and Calculated Assessments 75
5.13. Result 76
5.14. Ramping Exercise 77
6. Pulse Ramping 78
6.1. Preface 78
6.2. Adding a Pulse Ramping Test Module 79
6.3. Test Module 80
6.5. Test Parameters 82
6.6. Measurement 84
6.7. Time Signal View 85
6.8. Pulse Ramping Exercise 86
7. Overcurrent 87
7.1. Preface 87
7.2. Test Module 88
7.3. RIO Function Overcurrent, Relay Parameters 89
7.4. RIO Function Overcurrent, Elements 90
7.4.1. Define Element Characteristic 92
7.4.2. Define Element Directional Behaviour 94
7.4.3. View Resulting Characteristic 96
7.4.4. Testing with Over current Test Module, using a XRIO Convertor 97
7.6. Test View, Trigger 100
7.7. Test View, Fault 101
7.8. Test View, Characteristic Test 102
7.9. Test View, Pick-up / Drop-off Test 104
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7.10. Out of Range 105
7.11. Report View 106
7.12. Overcurrent Exercise 107
7.12.1. Exercise A: Inverse Timed Earth Fault Protection 107
7.12.2. Exercise B: Inverse Time Overcurrent Protection 107
8. XRIO 108
8.1. Preface 108
8.2. Required Parameters 109
8.3. Adding a Block 110
8.4. Adding Parameters 111
8.5. Parameter Details I> 112
8.6. Other Parameters 113
8.7. Adding a Reference 113
8.8. Parameter Overview 115
8.9. LinkToXRIO 116
8.10. Linked Ramping Test Module 117
8.11. RIO in the Advanced View 118
8.12. Formulas in RIO 119
8.13. XRIO Exercise 121
9. RIO/XRIO Function Distance 122
9.1. Preface 122
9.2. System Settings 123
9.3. Zone Settings 124
9.4. Adding a New Zone 125
9.5. Characteristic Editor 126
9.6. Building a Zone 127
9.7. First Zone Ready 128
9.8. Copying the Zone 129
9.9. Zones Ready 130
9.10. Using a XRIO Convertor 130
9.11. RIO Function Distance Exercise 133
10. Advanced Distance 134
10.1. Preface 134
10.2. Test Module 135
10.4. Trigger Tab 136
10.5. Settings Tab 137
10.6. Shot Test 139
10.7. Check Test 140
10.8. Search Test 141
10.9. Z/t Diagram 142
10.10. Advanced Distance Exercise 143
11. State Sequencer 144
11.1. Preface 144
11.2. "Manual Close" Function (Switch On To Fault, SOTF) 145
11.3. Defining States 146
11.5. Test Object and Local Hardware Configuration 148
11.6. State 1: "CB Open 1" 149
11.7. State 2: "CB Close 1" 150

11.8. State 3: "Fault 1" 151
11.9. Overview of Trigger Conditions 152
11.10. Overview of States 153
11.11. Time Signal View 154
11.12. State Assessment and Time Assessment 155
11.13. State Sequencer Exercise 156
12. Auto reclose making use of the State Sequencer 157
12.1. Preface 157
12.4. Test View 160
12.4.1. Table View 160
12.4.2. Detail View 160
12.4.3. Time Assessments View 161
12.5. Autoreclosure Exercise 161
13. Differential Test Object and Hardware Configuration 162
13.1. Preface 162
13.2. Principle of Differential Protection 163
13.3. Operating Characteristic 164
13.4. Test Object, Device 165
13.5. Test Object, Differential 166
13.5.1. Protected Object 167
13.5.2. CT 168
13.5.3. Protection Device 169
13.5.4. Zero Sequence Elimination IL - I0 172
13.5.5. YD Interposing Transformer 173
13.5.6. Characteristic Definition 174
13.5.7. Operating Characteristic for a Typical Diff Relay 175
13.5.8. Characteristic Input for a Typical Diff Relay 176
13.5.9. Harmonic (2nd Harmonic) 177
13.5.10. Harmonic (5th Harmonic) 178
13.5.11. Using the XRIO convertor 178
13.6. Global Hardware Configuration 181
13.6.1. Output Configuration 182
13.6.2. Analog Outputs 183
13.6.3. Binary / Analog Inputs 184
13.6.4. Binary Outputs 184
13.7. Differential Test Object and Hardware Configuration Exercise 185
14. Advanced Differential Configuration 186
14.1. Preface 186
14.2. Advanced Differential Configuration, Binary Out 187
14.3. Advanced Differential Configuration, General 188
14.4. Advanced Differential Configuration, Test Data 189
14.5. Advanced Differential Configuration, Test 190
14.6. Advanced Differential Configuration Exercise 191
15. Advanced Differential Operating Characteristic 192
15.1. Preface 192
15.2. Advanced Differential Operating Characteristic, General 193
15.3. Advanced Differential Operating Characteristic, Shot Test L-E 194
15.4. Advanced Differential Operating Characteristic, Shot Test L-L 195
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15.5. Advanced Differential Operating Characteristic, Search Test 196
15.6. Advanced Differential Operating Exercise 197
16. Advanced Differential Trip Time and Harmonic Restraint 198
16.1. Advanced Differential Trip Time 198
16.1.1. Advanced Differential Trip Time, Factors 198
16.1.2. Advanced Differential Trip Time, General 199
16.1.3. Advanced Differential Trip Time, Test 200
16.2. Advanced Differential Harmonic Restraint 201
16.2.1. Advanced Differential Harmonic Restraint, General 201
16.2.2. Advanced Differential Harmonic Restraint, Shot Test 202
16.2.3. Advanced Differential Harmonic Restraint, Search Test 203
16.3. Advanced Differential Trip Time and Harmonic Restraint Exercise 204
17. Transducer 205
17.1. Preface 205
17.3. Transducer RIO Function 207
17.4. Transducer Local Hardware Configuration 208
17.5. Testing the Transducer 209
17.6. The Settings Tab 210
18. Synchronizer 211
18.1. Preface 211
18.2. Synchronizer Test Module 212
18.3. Test Object 213
18.5. Testing the Relay 216
18.5.1. The Settings Tab 216
18.5.2. The Function Test 217
18.5.3. The Adjustment Test 218
18.5.4. The Auto Test 219
18.6. Synchronizer Relay Exercise 219

1 Substatio
S n Safety and Protection Te
esting
1.1
1 Safe
ety
1. Only authorised
a pe
ersonnel is allowed to enter and/or workk in a substation.
2. The persons doing so must adhere to the Op

perating Regu
ulations for
3. High Voltage
V Syste
ems (ORHVS) at all times.
4. When
n entering a su
ubstation obs ntial hazard, i .e. Live
serve all poten
5. Cham
mbers, Constru
uction Sites, etc.
e
6. Always
s wear approppriate Person PPE), i.e. harrdhat, safety b
nal Protection Equipment (P boots, overall etc.
when entering
e the HV
H yard.
7. Before
e work can co
ommence the
e equipment must
m e safe to workk on by an authorised persson.
be made
Before wo
orking on any HV equipme
ent make sure
e that the equ ipment is:
1. Isolate
ed
2. Safety
y tested
3. Earthe
ed
4. Barric
caded
5. Permiit issued
6. Workm
men's Declara
ation signed
Remember: You are re

esponsible fo
or your own liffe as well as a
all action you take!
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1.2
2 Do’s
s and Don’ts When Testing
T Pro
otection Sc
chemes
1. Make sure
s that the protection pa anel you are going
g to work on is made ssafe - as desccribed above.
2. Always s use the setttings directly from
f a settinggs sheet, i.e. d
do NOT read settings from m the relay. In
n this
way thhe testing will verify that the
e settings on the settings ssheet and rela ay correspond d.
3. A curreent transformer should nev ver be open-c circuited while
e current is pa assing throug
gh the primaryy
winding.
If the burden
b is rem
moved from the e secondary winding
w while
e current is flo
owing, most oof the primary winding
current becomes magnetizing cu urrent, but thee phase angle e changes in ssuch a way as to keep the total
current in the prima ary the same as a before. As the main circcuit is now mo ostly magnetizing current, the flux
in the core
c increasees to a high leevel and a verry high voltag e appears accross the seco ondary terminnals.
Due to o the high turn
ns ratio, the vooltage in this unsafe mode e of operation n can reach daangerously hiigh
levels, which can brreak down the e insulation, be
b a hazard to o personnel a and last but not least causee the
current transformer to destroy its self.
4. Disable the breakerr fail/bus-strip p signal from the
t panel thatt is under testt to the buszo one panel by
selecting the Test Normal
N Switchh (TNS) to “Te est” or disconnnect the sign nal wires going to the buszone
panel. Failing to do this can inad dvertently trip the whole su bstation.
5. First pull the Currennt Transforme er (CT) test block cover Fig gure 1-1
before the Voltage Transformer
T (VT)
( test blocck cover Figurre 1-2.
Impedance and dire ectional overc

current protecction relays wwill issue a trip
p if this is done
e in the wrong
g
sequen nce under live
e conditions because
b the relay
r will then
n measure currrent without any voltage w which
will appear as a close-up fault to the relay.
Figurre 1-1: Four pole

CT te
est block
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nd Protection Testing C.0047.AA
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Figurre 1-2: Four pole
VT te
est block
6. Ensuree that the CT test plug is fittted with shorrting strips be

efore inserting
g it into the test block - Figure 1-3.
This will
w prevent the e CT from beiing open-circu uited when te esting under liive conditionss.
Figu
ure 1-3: Four pole Figure 1-4: Fourr pole
CT test plug (PK-2) VT test plug (PK
K-2)
7. Ensurre that the VT

T test plug doe
es NOT have shorting strip
ps – Figure 1--4. Shorting th
he VT second
dary will
cause
e the VT fuse to blow and/o or be damage
ed.
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2 Start
S Page
e
The start page of the Test

T Universe software (TU U) is the centrral starting pooint for workin
ng with the CM MC test
system. Itt is from here that you can access all of the elementss within the so oftware.
> Test Modules:
M These are progrrams which can be used to o test individuual protection or measurem ment
functioons.
> Confiiguration Mo odules: These e are programms that can be e used to con nfigure the tesst set featuress.
> Contrrol Center: Complex
C test sequences
s coomprising a se eries of test m
modules can be created he ere.
> Test Tools:
T Less comprehensiv
c ve programs which
w make l ife easier for testers.
> Setup p: You will find an option foor connecting to a CMC tesst device with h NET-x optio on, license
manaagement, and various basic c settings herre.
> Supp port: You will find numerou us options to assist
a you in tthe event of pproblems here e.
> Custo om: Links to user-specific
u programs can n be embedd ed here.
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2.1
1 Testt Modules
Genneral test moodules:

Theese test modules are not asssigned to a sspecific protection function n.
Theey can be used to control th he analog sig gnal generatorrs from the CMC
test device directtly. As such, i n principle, th
hey provide a means of tessting
any protection function.
Deddicated test modules:

m
Theese test modules are dediccated to speciffic protection functions. Th
he
currrents and voltages output a are automaticcally calculate
ed and outputt by
the test module in question. T This makes tessting these fuunctions muchh
easier. The charaacteristics tessted are mappped on graphs and the pro ocess
of evaluating the test results iss automated.
Simmulation mod dules:

Thee NetSim and Ground Faullt test modules support the e output of
transient signals,, e.g., to test tthe anti-hunt device or a trransient groun
nd-
faultt relay with co
onsideration o of the physicaal characteristtics of the
netwwork.
Mea
asurement te est modules::
You
u can use thesse test modulles to test me
eters, transduccers, and pow
wer
quality measuring
g devices.
s test module provides a m

This means of integ
grating IEC 61
1850 signals into a
test.
Thiss CB configurration test mo dule simulate

es the auxiliarry contacts off a
circu
uit-breaker.
Thee AuxDC Conffiguration testt module conttrols the auxilliary DC voltaage
outpput of a CMC test set.
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2.2
2 Control Center
In the Con
ntrol Center, multiple
m test modules
m can be combined in a single te est sequence. This makes it
possible to create a co
ontinuous test sequence inc cluding all tesst modules th at are needed d to test a pro
otection
relay. On completion of
o the test the Control Centter generates a common lo og for all of the test module es
contained
d in the sequeence.
Use the OCC

O Batch toool to run a nuumber of Control Center do ocuments seq quentially.
Click Opeen Protectionn Testing Lib brary for direc
ct access to th
he installed PPTL packagess. These packkages
contain a predefined te
est sequence which can be e used to testt a specific typ on relay. These test
pe of protectio
sequence es can be dowwnloaded free e of charge fro
om the Custo mer Area of tthe OMICRON N homepage.. They
provide te
emplates for possible
p test sequences.
s They
T can be mmodified and e expanded by users at any time.

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2.3
3 Testt Tools
TransPlay: This tool iss used to play

y signal files (Wave or Com
mtrade formatt). These filess can be read out
from a relay following an
a incident, fo
or example, oro simulated a
and saved in a test module e.
EnerLyzeer: The EnerLLyzer test tooll provides a means

m ng the binary ssignals from tthe CMC test device
of usin
to measurre analog sign
nals (current, voltage).
w: You can use

TransView o display and analyze sign
u this tool to nal files (incide
ent traces in C
Comtrade forrmat, for
example) in the form of graphs.
Harmonic cs: You can use

u this progrram to genera
ate electrical ssignals with m e frequency (e.g., for
more than one
inrush).
O Monitor: A clear overvie

Binary I/O es of all binarry inputs and outputs from the connecte
ew of the state ed test
devices is
s displayed he
ere.
O/C Charracteristics Grabber:

G In th
he absence of
o a formula foor the charactteristic for deffinite time ove
ercurrent
protection
n, you can usee the Charactteristics Grabber to take th
he time and cuurrent pairs frrom a bias cu urve
which is available
a in dig
gital form.
Scheme Testing
T Toolls: Here you will
w find a num
mber of usefu
ul tools for tessting commun
nication schem
mes.
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2.3.1 EnerLyzer
This test tool
t enables the
t CMC test device to be used as a me
easuring deviice. Four diffe
erent modes a
are
available:
1. Multim
meter 1 2 3 4
2. Transient Recording g
3. Harmo onic Analysis
4. Trend Recording
Note: If a separa
ate license ha
as not been purchased
p for the EnerLyze
er test tool, only the Multim
meter
function will
w be available.
1 2

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2.3.2 AuxDC
A
This program is used to o define the voltage

v at the AUX DC outtput. This connection is the e means via w
which
the auxilia
ary voltage to supply poweer to the relay to be tested is provided, ffor example.
Notice:
ue is set, this voltage will be
If a default starting valu mediately when the CMC ttest device is
b applied imm
switched on,
o regardles ss of whethe er or not a PC ed. There is a risk of a rela
C is connecte ay inadverten
ntly
being dammaged beyond d repair by a voltage that is too high.
Caution!
C e voltage output can be life-threatenin
The ng!
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2.4
4 Setu
up
2.4.1 est Set Asso

Te ociation (NET
T-x option)
If you are using a CMC C test device with

w NET-x op ption, you neeed to assign tthe device to the corresponding
PC. To do o this, select the
t required CMC
C test dev
vice from the llist and click tthe Associate
e button. Afte
er this
you need to press the "Associate"
" button
b on the back
b of the C
CMC test device when the o on-screen proompt
appears.

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The test device
d is then displayed in the list with itts status set tto Test set is
s ready to use.
d that you are unable to ass

If you find sociate the de
evice to a PCC, you might bbe able to recttify the proble
em by
modifying the IP config guration. You can specify whether
w the C
CMC test device should obtain its IP add dress
automatic cally or you ca
an set an IP address
a manu ually. Should tthe problemss persist, please contact Su upport
(see Startt Page Suppo ort).
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2.4.2 System Settin
ngs
This is wh
here you make the settings
s that are valid
d throughout Test Universse.
On the Deefault Values s tab you define the param meters which aare set by deffault for everyy Test Objectt. Please
note that only
o the value es from the Default
D Values tab can subbsequently bee modified in tthe correspon nding
Test Objeect. If a test fiile is opened and different values have been definedd for its Test OObject, these
e are not
modified. To make testting easier, th he values you define here sshould be appplicable for th
he majority of tests.

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On the Neews Window w Settings tabb you can spe ecify whether news should be displayed d. This will the
en be
displayed in a separate
e window if th ernet connect ion. On the sttart page, in a
here is an Inte addition to the
e
version nu
umber, you will
w also see a message ind dicating if a ne
ew software vversion is ava
ailable.
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2.4.3 License Mana
ager
This is whe ere existing

license file
es are opened d
(e.g., from
m CD) in orderr
to add liceenses to the
Master Lic cense File.
All licenses for the

relevant PC are stored
in the
Master Lic cense File
(see the fo
older
specified).
These testt modules

have been n purchased
for the sele
ected CMC
test device
e.
The licensses associate

ed with
the curren
ntly selected file
f
support th
he use of thesse CMC
test devices.
In order to
o be able to use
u a CMC tes st device withh the Test Uniiverse softwaare, you need a correspond ding
license. In
nformation ab bout which CM MC test device e may be useed in conjuncttion with whicch test module es is
stored in a license file (omicron.lic). The CMC tes st devices are
e uniquely ide entified by the
eir code
(e.g., KA5503C). This iss located on thhe inside of th
he handle. Thhe license file for the corressponding devvice can
be found ono the Test Universe
U CD supplied
s with the CMC testt device. It coontains the inddividual licensses for
the test modules
m purch hased and is transferred
t auutomatically d
during installa
ation. To add a license posst-
installation, click the cense File bu
Merge into Master Lic utton.
It is possible to distribu
ute all licenses
s to all PCs within
w an orga
anization, so tthat every PC
C can work witth every
CMC test device.

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2.4.4 La
anguage Sellection
here you can change the user language

This is wh e for Test Univverse. If a serries of small ssquares is dissplayed
for a language, this me
eans that the corresponding character sset is not insta
alled on the PPC you are ussing.
Note: Manual te ext entries (e.g

g., text entere
ed in the Com
mment field) ccannot be tran
nslated when
na
different la
anguage is se elected.
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2.5
5 Support
ve questions or
If you hav o problems th
here are vario
ous ways of g
getting help:
> Tutorrials: Videos demonstrate how to get sttarted with the

e CMC test de evice and som
me of the testt
modules. (To activate this menu
u item you need to install th
he tutorials frrom the Test U
Universe DVD D.)
> Manu
uals: You will find all manu
uals (both for the
t software a ardware) in P
and for the ha PDF format he
ere.
> Help: The comprehensive help provides assistance in the e event of pro
oblems. Howe
ever, it is quicker to
p the help dire
call up ectly from the
e window abo
out which you have questioons.
> Tips & Tricks: You can access

s tips to help you
y complete testing quickker and more efficiently herre.
> Contaacts: Click he

ere to find eve
erything you need
n to know
w about getting
g in touch with OMICRON. The
teleph
hone numbers s for Technicaal Support are
e a very usefu
ul feature.
> OMICCRON Assist: Once this prrogram has been b executedd, a variety off information a
about the opeerating
system
m, the PC, annd the installe
ed software is
s collated and sent to Tech hnical Supportt via e-mail. T
This
makes it easier to provide assisstance in the event
e of softw
ware problemss.
> Diagn
nosis and Ca alibration: Click here to fin
nd tools for so
olving techniccal problems o
or calibrating the
CMC test device.
> What's New?: The

e major new features
f of the
e current softtware version are listed in a PDF file.

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2.6
6 Hom
mepage witth Customer Area
You will find the Customer Area on the OMICRON homepage e (www.omicro on.at) under S
Support. In o order to
access this area you have to registe er with the ID of your CMC C test device. Y You then receive your logiin data
via e-mail. You will find
d the latest up
pdates and va arious downlo oad options in n the Custome er Area. Thesse
include:
> New software
s verssions of the Te
est Universe software
s
> The Protection
P Tessting Library (PTL),
( a collection of predeefined test temmplates for te
esting variouss relays
> Variou us Applicationn Notes and documentatio
d on from semin nars and confe ferences
You will also

a find the User
U Forum here.
h
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2.7
7 User Forum in
n the Custo
omer Area
You can share

s experie
ences with oth
her users of OMICRON
O tesst devices on the User Forrum. Memberrs of our
Technical Support team
m also monito
or events on the
t forum andd answer questions postedd there.

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3 Quick
Q CMC
3.1
1 Prefa
ace
The QuickkCMC is the first
f test modu
ule we are go
oing to look att in more deta
ail. Some elem
ments of the T
TU
software which
w are also
o used in othe
er test modules will be desscribed in dettail.
This test module

m has been
b designed d for straightfo
orward, quickk and easy tessting. It allowws you to acceess all
the currennt and voltagee generators ofo the CMC te est device direectly and also
o enables the e state of the b
binary
input signals to be read d out. Howeve er, in its basic
c function, the
e test module e does not con ntain any info
ormation
about the protection function tested. This means that you have e to calculate
e all the signa
als to be outpuut
yourself. You
Y then have to evaluate the response e of the tested
d protection rrelay manuallyy. Therefore,
although iti is possible in
i principle to
o test virtually every protecttion function, this can be ddone more ea asily and
more quicckly by using the
t test modu ule designed specifically
s fo
or that purposse in each casse.
As such, the
t QuickCMC test module e is best suite
ed to straightfforward wiring
g and commisssioning testss. It can
also be us
sed as a diagnostic tool forr troubleshoo
oting.
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3.2
2 Testt Module
Although the QuickCM MC is the mostt basic of the test moduless, it supports n
numerous settting options. All
views and
d their functions are describ
bed below.
However, before you can

c start to ou of basic settings have to be
utput currents and voltagess, a number o e made.
In accorda MICRON's Ohm's law, we start

ance with OM s with the Test Object. Click the button to op
pen the
test objec
ct.
Quicck CMC C.0047.AA

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3.3
3 Testt Object
Standard view
Advancced view
In the Tes
st Object, you u have to define various da ata relating too the protectio
on device to b be tested. Theese
parameters are used to o set specific current, volta
age, or freque ency values aautomatically, for example, or to
add an enntry to the test report indica
ating which prrotection relayy has been te ested. The RIO (Relay Inte erface by
OMICRON N) functions are
a available to you for this s purpose. Yo ou can find these functionss under the block of
the same name. You needn to make correspondin ng settings he ere as approppriate for the pprotection fun
nction to
be tested in this instance. However,, the Device function
f is alw
ways availablee. It is describ
bed in more ddetail
below.
The Test Object can be

b displayed in two differennt modes. Yo u can choose e between the
ese in the Vie
ew
menu.
> The Standard
S Vieww is the simp
pler of the two
o. It is used be
elow.
> The Advanced
A Vieew is designe
ed for advanced users. The e XRIO techn
nology can be
e used to perfform
complex calculations automaticaally.
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3.3.1 RIO
R Function Device (Prottection Devic
ce)
Î
Î
Î The Default
D s from the Sy
Values gs are displayyed here.
ystem Setting
You can enter

e various items of inforrmation to uniquely identifyy the protectio
on relay on the left-hand siide of
the screen n. A variety of network andd device data, such as nom minal frequency, voltage, a and current, ccan be
entered on the right-ha and side.
If the relay
y has additionnal ground cuurrent or ground voltage inp puts, you havve to enter theese scaled vaalues
with the corresponding g factors.
Maximum m values for cu urrent and voltage appear under Limits s. These value es cannot be exceeded du uring
testing. Th he protection relay againstt inadvertent d
his protects th damage beyo ond repair cauused by electtrical test
values tha at are too high
h.

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Debounc
ce/Deglitch Filters
Debounc ce of input siggnals:

You can configure
c the Debounce Filter
F for inputt signals with bounce chara acteristic. If a filter is config
gured,
the first ch
hange in the input
i signal causes the sig
gnal level to bbe "held fast" ffor the duratioon of the Deb bounce
Time. The e debounce fuunction is con
nnected to the
e deglitch fun ction in seriess.
Deglitch of input sign nals:

In order to
o suppress sh hort false puls
ses a deglitch
hing algorithm
m can be confiigured. The ddeglitch process
results in an additional dead time an nd introducess a signal dela o be detected as a valid sig
ay. In order to gnal
level, the level of an input signal mu ust have a connstant value a
at least during
g the deglitch
h time. The fiigure
below illus
strates the de eglitch functio
on.
Note: The debounce and deg

glitch function
ns are only avvailable in con
njunction with the
CMC 256//CMC 256pluus/CMC 356 anda CMB IO-7 7 test devicess.
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3.3.2 RIO
R Function Distance (Diistance Prote
ection Param
meters)
This RIO function suppports numerou us setting opttions for defin

ning the chara
acteristics of a distance pro
otection
relay. How
wever, only th
he System Pa arameters arre required at this time. Enter the Line llength in ohm ms and
the Line angle.
a You ca an also speciffy whether thee PT connecttions are line or busbar con nnections. Yoou also
need to de
efine the direction of the CT
C starpoints.
This comp pletes the enttries for the Test Object. The
T File menu u contains the e Export and d Import commands.
You can useu these to save
s the Testt Object and then reopen iit later in a diffferent test module. This m
means
that it is not necessary to enter all ofo the data aga
ain. (The Imp
port Relay Se ettings comm mand has a different
function and
a is not used for this purp pose!)
You can now

n confirm all
a settings witth OK. The so
oftware takess you back to the test modu
ule.
Next we are
a going to open
o the Hard guration by cclicking the
dware Config button.

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3.4
4 Hard
dware Con
nfiguration
In the Harrdware Configuration you

u define how the connecte
ed test devices are to be ussed.
ab of the Harrdware Configuration dialog box conta

The first ta ains fields in w
which you cann specify whicch CMC
test device and, if applicable, which additional am
mplifiers are to
o be used. Yo ou can then cclick Details... to
enter morre detailed infformation.
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3.4.1 Output
O Config
guration Deta
ails
In this win
ndow you can n specify whic
ch voltage and d current geneerators are to
o be used with
h which
interconne ection option.. You can dea activate individual generatoors or even coonnect multip
ple generatorss in
parallel orr in series in order
o to generate higher ouutput currentss, voltages, or powers.
DANGER – Electrical hazard!

The connectiion of the CMC to the test object must be done byy qualified and trrained personnell.
Do not chang
ge the connection while the CMC C is injecting volta
ages and/or currrents.
Check the Ha
ardware Manual for further details.

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3.4.2 VT Connections and CT Connections
C
You can define

d the datta for transformers connected between the CMC testt device and p protection devvices
here. The
ese transformeers provide a means of generating high her output volttages or curre
ents. The maxximum
power tha
at can be achiieved by the CMC
C test dev
vice remains tthe same. For example, 4 x 900 V can b be
d with a 3V/V transformer, in order to test protection devices in wind power stations, for instance.
generated
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3.4.3 Analog
A Outpu
uts
Further se
ettings affecting the analog
g generators are
a made on the Analog O
Outputs tab:
> Test Module

M Outp put Signal: Select which fu
unction is asssigned to the analog generrator for the te
est
module. The first th
hree voltages
s are assigned
d to the phase he currents iss matched 1:1 to the
es. Each of th
phase
e currents.
> Display Name: Yo ou can enter a name of you

ur choice here
e. This name designates the correspon
nding
signal in the test module.
m
> Connnection Terminal: You can n specify here

e which conneection termina
al in the cabin
net or on the
protec
ction device the corresponding analog output
o has to be connectedd to.
Note: Changing the assignme ent of the Tes

st Module Ou utput Signalss also change
es the physiccal
properties
s of the analog
g output signa
als (e.g., clocckwise/counte
er-clockwise p
phase sequen nce,
etc.).

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3.4.4 Binary / Analo
og Inputs
On this ta
ab you define which binary input signals are connecte ed. You also h
have to speciify whether th
he
signals arre Potential-F
Free or not. In
n the latter ca
ase you have to specify botth the Nomin
nal range (e.g g.,
110 V) annd the Thresh hold (e.g., 77 V). A voltagee above this T
Threshold is evaluated as a logic 1, a vvoltage
below it as zero.
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3.4.5 Binary Outputts
If you wannt to use the Binary

B Outpuuts in this tes
st module, as is the case w
with the binaryy inputs, you h
have the
option to define
d the sig
gnals used (e..g., CB positio
on).

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3.4.6 DC Analog Inp
puts
You can configure

c the DC Analog Inputs here. They
T are used
d to test the ttransducers.
This comppletes all the settings in the

e Hardware Configuratio
C on. You can eexport these ssettings on the
e
General tab
t so that the This means that you only have to
ey can be re-imported later for other tesst modules. T
enter the relevant data once.
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3.5
5 Testt View
6 5 7 9
1 2
3
4
8
1. You ca
an enter the actual
a current and voltage values
v to be o
output by the CMC test deevice in this w
window.
Variou
us input option
ns are availab
ble under Set Mode. These e include sym
mmetrical commponents, linee-line
values
s, and specific
c types. This option
o is know
wn as the Fau or. It makes ge
ult Calculato enerating thee
necesssary signals easier.
e
Note: If the insta

allation of bus
sbar CT groun
nd connectionns was speciffied in the
RIO function Distance, this is displaayed in QuickkCMC as follo
ows:

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2. The siggnals output are
a shown in the vector dia agram in the T Test View. T They are showwn in the sam me format
as thatt in which they were entere ed. In other words,
w if symm
metrical comp ponents are ge
enerated, for
examp ple, these are displayed he ere - not the in
ndividual phasse currents o or voltages output.
3. You caan specify wh hich state the set binary outputs should adopt here. A check mark means that tthe relay
contacct is closed at the start of te
esting.
4. You caan see the current state of the binary inp puts here. Th he red dot indicates whethe er a signal is pending
at the relevant Binaary Input. If a change of sttate occurs du uring a test, the correspon
nding time is e entered
here. This
T means th
hat the pick-up and trip timmes can be me easured here, for example e. If a trigger iss set by
a checck mark, signa al output will terminate
t afte
er this.
5. Press the Start buttton (F5) to staart/stop signaal output. Thiss can be channged during o output.
6. Press the Prefault button (F8) to o output a zerro-current preefault state witth nominal vo
oltages prior to the
output of the set values. Press F8F again to terrminate the p refault; the de efined valuess are output.
7. Click th
he Hold Valu ues button (F9
9) to freeze th
he values of t he signals cuurrently being output. As lo ong as
this bu
utton is activatted you can change
c the va
alues to 1 withhout the channges being ap pplied and outtput
immed diately. Once the changes have been made m they cann be output byy pressing F9 again.
8. The seettings in this section can be
b used to ram mp the signals output (in o other words, to o change them in
steps). This means that it is poss sible, for exam
mple, to incre
ease the curre ent in small stteps until the pick-up
signal or a trip is trig
ggered. You can
c see the corresponding
c g time in 4.
9. Once the
t test has beenb completeed successfully, the resultss can be evalluated manua ally by pressinng the
Add too Report buttton (F10).
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3.6
6 Impe
edance Vie
ew and Phasor View
If an impe
edance optionn (e.g., Z-I const.) has beeen selected unnder Set Mod de, the define
ed output valuues can
be display
yed in the Imppedance View w. Conversely y, you can deffine the outpu
ut values by cclicking the
impedanc ce plane. In ad s are also dis played here if they have been specified
ddition, the diistance zones d in the
RIO function Distance e.
The signa als can be displayed in any

y format (line--neutral, line-lline, symmetrrical compone ents, fault valu
ues,
etc.) in the
e Phasor Vieew. You can select
s the required format b by right-clicking on the dia
agram.

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3.7
7 Report View
Once the test is compleeted the repo

ort can be disp
played in the Report View w. Click on Re
eport Settings in the
Home tab b to define wh
hich settings should
s be inclluded in the reeport. A predefined short form and lonng form
are availa
able, which ca
an be adapted d accordingly in line with in
ndividual requ
uirements.
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3.8
8 Diffe
erent Displlay Options
To
oggles the tim
me unit betwee
en seconds (ss) and cycless (cy)
To
oggles the dis
splay between
n secondary a
and primary vvalues
To
oggles the dis
splay between nd relative values
n absolute an
3.9
9 Exam
mple 1: Wiiring Test
A wiring te
est is a simplee example of an applicatio on involving thhe QuickCMC C test module. You should carry
out a test of this type at
a the start of every
e test in order
o to ensu ure that all ana
alog connectiions have bee en made
correctly. During the teest, currents and
a voltages are a output witth various am mplitudes. The e measured
secondary y values or prrimary values can then be read off on th he relay's dispplay. If they m
match, the wirring is
correct. Using
U the different display options
o is veryy useful for th
his test.

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3.1
10 Exam
mple 2: Po
ower Test
This test checks

c for dis
screpancies affecting
a the directions
d of e
energy flow an
nd amplitudess displayed. Itt can be
used to te
est the transmmission of thes
se signals via
a the control a
and instrumen ology, for example.
ntation techno
This test is easy to run with the Set Mode Powerrs.
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3.1
11 Quic
ckCMC Exe
ercise
Essentia
al informatio
on about ex
xercises:
1. You must
m comply with
w OMICRON N's Ohm's laww!
2. Alwayss apply what you
y have learrned in the prrevious chaptter. Please usse this chapte
er and the
corresponding notes.
3. You must
m always sa
ave all test mo
odules to a fo
older created on your PC.
3.11.1 Ta
asks
> Do the
e example in the offline mo ode.
> An ea
arth fault relay
y’s pick-up, drrop-out, and trip
t times nee ed to be testedd. As the testt is to be cond
ducted
manually, no autom matic test is necessary.
n
> Work with the varioous input mod des (direct, fa
ault values, syymmetrical coomponents, ettc.) and the V Vector
View.
> Checkk the pick-up,, drop-out andd trip time of the
t IDMT eartth fault protecction.
3.11.2 Hardware Con

nfiguration
In the harrdware config
guration, deffine all the sig
gnals you nee ning. Use the screenshots below
ed during train
as a guidee:

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nstantaneous
3.11.3 In s Earth fault Protection Test
T
For the kn
nowledge hun
ngry students: Check the trrip value of th
he instantaneo
ous earth fault protection w
with the
QuickCMC C test module
e.
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4 OMICRON
O N Control Center
4.1
1 Prefface
The OMIC CRON Contro ol Center (OCC) is used to combine mulltiple test mod dules in a single file. As a result, a
single OCCC file can be used to test a relay completely, rather than relying o on multiple individual test
modules. A template iss created and worked throu ugh step by s tep. A commo on report is g
generated. Yo ou can
modify thee appearancee and content of this reportt in line with yyour requirem
ments. You can even add im mages
or tables.
Additional pause modu

ules provide th
he tester with
h important infformation abo
out carrying o
out the test.
This chap
pter describes
s how to creatte and adapt a test templatte like the one above. It also
e referred to a o
explains how
h to add ex
xisting and ne
ew test modules.
Start by clicking New Test

T ent under Con
Docume ntrol Center o
on the start pa ens a blank OCC file.
age. This ope
OMICRON Control Center

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4.2
2 New
w Test Docu
ument
The OCC is divided intto two section

ns:
> A list of the elemennts contained in the open OCC
O file appe
ears on the le
eft-hand side. These are th he test
objecct, the hardwa are configurration, and the test module es. You can eeven combine e multiple instances of
these objects into groups
g here. When opened the file conttains one tes st object and one hardwarre
configguration.
> The re eport pane, which
w displays
s the common n report gene rated from alll test moduless, is located o
on the
right-h
hand side. Ad
dditional texts
s, images, or tables
t can bee added or forrmatted here in the same w way as
in MSS Word.
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OMICRON Acade emy 2014 Page 4 47 of 219
4.2.1 Views
The View tab contains the Report View,

V the Listt View and th
he Script View
w.
Use the Report

R View to
t customize your overall report.
r Test m be embedded
modules may b d in the reportt and
run from it. The headerr and footer can
c also be ed
dited here.
In the List View, the objects embed dded in the OC CC are show n in a tree strructure. For e each object, th
he List
View show ws specific prroperties, suc
ch as test stattus, whether o
or not it is rea
ady for testing
g, or the assig
gned test
report form
m (short or long form).
The Scrippt View allows you to write

e and run your own scripts using the Co ontrol Center sscript languag
ge.
We will no
ow explain hoow to add a tittle, user-spec
cific informatio
on, and a logo page. "Fields" are
o on the first p
used to en
nsure that the
e text is updatted automaticcally downstre eam.

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4.2.2 Document Pro
operties
You need to start by sp

pecifying a nu
umber of docu
ument properrties, so that yyou can imple
ement referen
nces to
fields later.
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4.2.3 Field Referenc
ces
Next you need to add some

s delimiteers. To do this
s, click the Te
est Object in the report to select it. Use
e the
ss Enter. This adds a new lline above the
y to move the cursor to the left and pres
arrow key e test object.
You can now

n add the first
f field right at the top. Prroceed as sho
own in the sccreenshot. In tthe Insert Fieeld
dialog box
x you can sele
ect which item ms from the list you wish too appear in th
he report (e.g., the title).

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Use the Text
T tab to ma
ake the title sttand out.
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Two more
e fields are no
ow added to specify
s the Te
est Person an
nd the Date T
Tested.
A field wo
orks as a placeholder for ce ertain informa ormation will be acquired b
ation. This info by the Controol Center
and insertted into the do
ocument auto omatically (e.g d, path of the
g., date tested e test report, eetc.). As we h
have
seen, somme of the field
ds in the list ca
an be definedd and named on the Document Properrties dialog (e e.g., title,
subject, company, etc.). Therefore, if there is no information a about a particuular field (e.g., you have not run
any test yet
y so there is s no test date)) or no entry on
o the Docum ment Propertties dialog, "n n/a" (not availlable) is
shown.
The area highlighted on the screens

shot shows which
w fields ha ave been seleected (e.g., {T
Title}, {Test Pe
erson},
etc.). Activ
vate the Field
d Names che
eckbox in the View
V tab to ssee this view.

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4.2.4 Company Log
go
The comp pany logo is th

he next thing to be added. The easiest w
way to do thiss is to open th
he image file in an
image proocessing prog gram and copy the image to the clipboa rd from there. The image ccan then be in nserted
ort using the shortcut key <Ctrl>
in the repo < + <V>.
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4.2.5 Page Footer
The Filen
name, the Pag
ge Number, and
a the Page
e Count now jjust need to b
be added to th
he page foote
er.
The blank k test templatee is now read

dy and can be e saved. If you
u use this tem
mplate for eve
ery test from n
now on,
all test rep
ports will look
k the same. Thhis is of cours
se only a sug gestion of ho
ow a template might look.

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4.3
3 Testt Objects in
n the OCC
As explainned above, thhe template already contain ns one Test O Object. This is valid for all test moduless
inserted fo
or the Test Object.
O It means that you only
o have to e nter the settin
ngs for the Te
est Object onnce for
all test mo
odules. Double-click the ico
on or the textt in the report to open the ttest object. Im
mport and expport
functions like those in QuickCMC
Q arre also available here.
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4.4
4 Glob
bal Hardwa
are Configuration
The Hardware Configuration is very similar to the Test Obje ect. It also ap pplies for all su
ubsequent tesst
modules. However, a distinction
d hass to be made between the global Hardw ware Configu uration in the
e OCC
and the loocal one in thee test module
e. There is a difference
d betw
tween the two o, which is explained in mo ore detail
below. Ho owever, first, we
w are going to import the Hardware C Configuration n saved previo ously. This wway you
will not ne
eed to configuure any furthe
er settings, altthough we willl revisit the configuration o of the Analogg
Outputs.

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4.5
5 Diffe
erences be
etween Glo
obal and Lo
ocal Hardw
ware Configurations
At first gla
ance, there se eem to be no differences between
b the twwo, but if you look more closely you can n see
that the Test Module Output
O Signaal column is missing.
m This is because th he global Harrdware
Configura ation is not linked to a spe
ecific test mod
dule for which h the precise application off the signals ccould be
defined. The
T column is s also missingg from all othe
er tabs. It onlyy reappears inn the Local H
Hardware
Configura ation of a tes
st module. Ho owever, none of the setting gs made in the e Global Harrdware
Configura ation can be changed there.
Note: Once a test module ha

as been added ence again in more detail.
d we will lookk at this differe
4.6
6 Bina
ary / Analo
og Inputs
All binary input signals which are required in the subsequent ttest sequence
e have to be d
declared in th
he global
Hardware e Configuration.
All Binary y Outputs, as

s well as DC Analog
A Inputts, can be de
eactivated, sin
nce they are n
not used for te
ests in
this trainin
ng.
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4.7
7 IRIG
G-B & GPS
You can configure

c settings relating to
t the connec cted time syncchronization d devices in the
e Time Source tab.
The availa
able time sources are GPS S, PTP and IRRIG-B. These additional se e multiple CMC test
ettings enable
devices to
o be synchron nized. This is helpful above d to end test", but it is not
e all in the casse of the "end
discussedd any further below.
b

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4.8
8 Inse
erting a Tes
st Module
You can now

n insert the
e QuickCMC test
t module you
y saved pre eviously for th
he wiring test. The module
automaticcally adopts thhe test objec
ct and the glob
bal hardware e configuration already avvailable in the
e OCC
file. Howe
ever, you MUS ST make suree that you insert the test m
module under the global ha ardware
configuraation and nott inadvertently
y between the e test module e and global hardware co onfiguration.
Note: You only need

n to take a look at the test
t object o dule inserted to check whe
of the test mod ether
this does actually conta
ain the right data.
d
All that remains is to make

m some ch
hanges to the local hardwa
are configura
ation.
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4.9
9 Loca
al Hardwarre Configu
uration
In contras
st to the globa
al hardware configuration
c n, the local ha
ardware configuration fo or the test mod
dule
does conttain the Test Module Outp put Signal orr Input Signaal column. As this column is specific to e
each test
module, you
y might nee ed to make so
ome local adju
ustments here e. None of the
e other setting
gs can be mo odified.
Once you have inserte

ed a test modu
ule you need to check all ta ardware conffiguration one more
abs of the ha
time.

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4.1
10 Renaming the Test Modu
ule
Close the test module to save all ch

hanges and go o back to the OCC. You ca
an rename the test module
e here
by double
e-clicking with the left mous
se button or pressing
p <F2>>.
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4.1
11 Crea
ating a New
w Group in
n the OCC
As all testts associated with definite time emergen

ncy overcurre
ent protection have to be lo
ocated in the same
subfolder,, you need to create another group and rename it to "Emergency Overcurrent"".

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4.1
12 Paus
se Module
e
A Pause Module now needs to be added a to the group created d in the previo
ous step. Thiss test module
e can be
used to warn
w the user of
o the test tem
mplate with ann instruction tto activate de
efinite time em
mergency ove ercurrent
protection
n by tripping th
he voltage tra
ansformer circ
cuit-breakers..
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4.1
13 OMICRON Con
ntrol Cente
er Exercise
e
> Creatte a blank tes
st template complete
c with title and co
ompany logo o.
> Set up the test obbject as earlie
er as well as
s the hardwa re configura ation.
> Insertt a new Quic
ckCMC. Rena ame the mod dule “Wire Te est”.
> Check the local teest object annd the local hardware
h connfiguration.
> Creatte a group fo
or instantaneeous overcurrrent protectiion tests and d a pause mo
odule which will
prompt the user that
t Instantaneous tests will now be c carried out.
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5 Ramping
R
5.1
1 Prefface
You can use
u the Ramp ping test module to alter the currents or voltages to bbe output by the CMC test device
in stages (ramping). Th
his is the sam
me as the Step p / Ramp fun ction in the Q
QuickCMC tesst module, alth hough
the signals are not cha
anged manually in this case e. Instead, yo
ou can define the shape off the ramp in d detail in
advance. The analog signal
s outputs
s are then ram
mped during te esting in acco
ordance with the settings
configured
d in advance.. In contrast to
o QuickCMC,, where you h had to evaluatte test resultss manually, th
his
process is
s automated in the case off the Ramping g test module . You just neeed to define the correspon nding
measurem ments and toleerances.
Typical ap
pplications forr the Ramping g test module
e are testing t he pick-up vaalues of variouus protection
ample below illustrates tessting the pick--up value of the overcurren
functions (e.g., I>, V<, etc.). The exa nt
protection e emergency overcurrent protection).
n (definite time p The current is increased in steps until the pick-
T
up signal is triggered. It
I is then redu
uced so that th
he drop-off vaalue can be mmeasured. The reset ratio ccan
subseque ently be calculated from the ese two parammeters.
Pickup Drop-off
I/A
t/s
s
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5.2
2 Add
ding a Ram
mping Test Module
Start by adding a Ramp

ping test mod
dule to the "Emergency Ovvercurrent" grroup.
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5.3
3 Testt Module
The scree
enshot showss the standard
d view in the Ramping
R test module, with
h various diffe
erent window vviews.
However, before you start
s to make settings
s in the
e test module
e, you need to
o double-checck the Test Object
and the Hardware
H Connfiguration.
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5.4
4 Loca
uration
You have to configure the Test Mod dule Output Signals

S in the
e local Hardwware Configu uration. As th
he
definite tim
me emergenc cy overcurrent protection fuunction is to b be tested here e outputs are not
e, the voltage
needed. YouY can, there efore, set them to Not use ed on the Ana alog Outputs s tab. Howeveer, as they are
e
needed fo or other tests (e.g., testing distance prottection), they must be keptt in the globall
Hardware e Configuration.
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As only th
he pick-up signal is needed d to test the pick-up
p value o
of the definite
e time emerge
ency overcurrrent
protection
n, you can deaactivate all other signals (in other wordss, configure th
hem as Not uused).
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5.5
5 Testt View
3 4 5 6
1. Here you
y can define e the type of signal
s to be ra
amped. The a available optioons are the ssame as thosee in the
QuickC CMC test mod dule. This meeans that in adddition to currrents and volttages, symme etrical compo
onents,
fault va
alues, impeda ances, etc., can also be ramped directlyy.
2. What exactly
e the ramp is to channge is set undder Signal an d Quantity. T Two different signals can bbe
ramped at the same e time. The poossible settings are determmined by the s set mode. Exxamples inclu ude:
ode
Set mo Sig
gnal 1 Quantity 1 Signa
al 2 Q
Quantity 2
Direct I L1, I L2, I L3 Magnitude none n
none
Symme
etrical components V1 Magnitude none n
none
Z-I con
nst. ault
ZFa Magnitude ZFaullt P
Phase
3. The start and end values

v of the signal
s to be ra
amped are en ntered here.
4. This iss the step size
e, i.e., the magnitude, by which
w the sign
nal is to chang
ge with each sstep.
5. You ca an set the outtput duration of o a step heree. It always haas to be longeer than the op
perating time of the
protecttion relay. This ensures that the protecttion relay will respond befo ore the end off the step which
triggerred it.
6. The se ettings result in
i a change rate, step count, and time d duration for th
he entire rampp.
7. Every ramp can be assigned a stop s conditioon. As soon ass this event o occurs, the neext ramp startts or the
test fin
nishes. This means
m that the
e set end valuue is not actu ally reached. This stop co ondition is co
onfigured
in the Detail
D View.
Use the Ramps

R tab to insert ramp states.
s This ta
ab also includ p Navigation toolbar to go through
des the Ramp
the seque
ence of ramp states by a siimple mouse--click.
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5.6
6 Calc
culating the Ramp Pa
arameters
The first step

s (I>) of the
e definite time
e emergency overcurrent p protection hass been set to 1.8 A for thiss
example. The tolerance e of the relay is 3%. In rela
ation to I> thiss correspondss to 54 mA. T
The tolerancess of a
relay can be found in th he technical data
d of the relevant relay mmanual.
When setting the ramp p parameters you will encounter the pro blem of how tto size the inddividual stepss. One
possible solution
s is to have
h approxim
mately 4 step
ps between th e limit of the ttolerance ran
nge and the se etpoint.
This produces a step size
s ximately 14 mA.
of approx
As a guide
e for the startt and end valu
ues, use 0.8 and
a 1.2 timess the nominal value. This ccorresponds to
o
absolute values
v of 1.44
4 A and 2.16 A.
The durattion of every one

o of the rammp steps mus
st be longer th ating time of the relay. For our
han the opera
example, therefore, 100 ms is suffic
cient.
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5.7
7 Ente
ering the Ramp
R Param
meters
You can now

n enter the
e required ram
mp parameters
s accordinglyy. Select a thrree-pole fault (I L1; L2; L3) as the
signal for our example..
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5.8
8 Deta
ail View
The Detail View has th hree tabs:

> Analo og Out: You can c define all parameters of o the signalss output which h are not auto
omatically rammped. If
you wish
w to ramp the magnitude e, for examplee, you can ma ake the phase e and frequen ncy settings h
here. As
the magnitude has s already been n set when the ramp was d defined, this ffield cannot be changed in the
Detail View.
> Binarry Out: If nee eded you can define binary y signals whicch are put out during the te est.
> Trigger: You can define
d a Stopp Condition fo or a ramp herre. If you choose not to set a stop condition, the
ramp will continue until it reache es its end valu
ue. In the exaample for the definite time emergency
overcurrent protecttion test, the Binary trigge er option is se
elected. In thee lower part o
of the view yoou can
now select
s the trigg
ger signal. In this case the
e triggers are tthe pick-up signal for the uup ramp and tthe
droppping off of the pick-up signa wn ramp. You can also use logic AND an
al for the dow nd OR operattions to
link multiple
m signalss.
Note: The settin e to be made individually ffor each ramp

ngs in the Dettail View have p. The Ramp
navigation
n toolbar indic
cates which ra ntly being proccessed. The ramps can also be
amp is curren
selected from
f the toolb
bar.
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5.9
9 Sign
nal View
The chara
acteristic for the ramped va
ariables and the
t binary trig
ggers is displa
ayed in the Siignal View.
5.1
10 Impe
edance Vie
ew
When an impedance is s ramped, it is
s displayed in the Impedan efined distancce
nce View along with the de
n zones. Howe
protection ever, this view
w is not releva
ant for the exxample we are
e considering
g here.
5.1
11 Phas
sor View
The signa
als are display
yed in a vecto
or diagram in this window. This view is a
also not relevvant for the exxample
we are co
onsidering herre.
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5.1
12 Ram
mp Assessm
ments and
d Calculate
ed Assessm
ments
Here you can configure e settings for ramp measurements as w well as for calcculations with
h the subsequuent
measuremment results. Automatic
A assessment of the
t measurem ment results a also takes pla
ace here. We will now
describe in detail how this
t works, baased on the example
e of de
efinite time em
mergency ove ercurrent prote
ection.
Two meas surements are to be taken. The first me easurement iss to determine e the pick-up value while th he
second is the drop-off value.
v In "Ram mp 1" the pick-up value is determined b by the amplituude of the currrent
output at the
t time at wh hich the pick--up signal is trriggered. You
u can make th he correspond ding settings in the
Ramp, Co ondition, and
d Signal colum mns. Enter thhe set value 1 .8 A in the Noom. field. Youu also need too define
a permisssible Deviatio
on within whicch the measurred signal hass to be locate ed. During thee course of the test
the Actuaal Value is en
ntered automa atically, the deeviation is dettermined, and
d the test is a
assessed.
The same e principle is applied

a to me
easure the dro
op-off value, a
although in the case of "Ra amp 2" a
measurem ment is taken when the pic ck-up drops offf. The setpoi nt is 95% of tthe set value. Please referr to the
relevant re
elay manual for
f this reset ratio
r also.
As well as
s taking thesee measurements, the actua al reset ratio a o be calculated. You can se
also needs to elect
various algorithms in order
o to do thiss. In this exam
mple you nee ed X/Y. The re
esults of the m
measurementts taken
previously
y ("Drop-off" and
a "Pick-up") are to be us sed as X and Y. A Setpoin nt of 0.95 is e
entered and th
he
permissib
ble deviation is
s set to 0.05.
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5.1
13 Result
Start
S
Cle
ear results
Click the Start/Continu

S e button to sttart the test. The
T ramps theen run until th
he set Stop C Conditions an nd the
measurem ments and calculations are e taken and made
m automattically. The tesst is then asssessed. A green
check ma ark indicates "test successfful", a red cross means "te st failed".
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5.1
14 Ram
mping Exerrcise
> Add a Ramping teest module to o the OCC file.
> Check the pick-upp value for th
he IDMT overrcurrent prottection functtion for line-line faults as
s
discu
ussed in the last chapter..
Note: When carrrying out the test, make sure that th e IDMT overrcurrent prote
ection is acttivated.
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6 Pulse
P Ram
mping
6.1
1 Prefface
In the previous chapterr we showed you how you can use the R Ramping testt module to te est the pick-upp value
I> of the definite
d time emergency
e ovvercurrent prootection. The current is increased in stages until the pick-up
signal is triggered. How wever, this pro ocedure only works for the e smallest picck-up step (I>, V<, etc.): Thhe
Ramping test module cannot
c be use ed to test a higher step (e.gg., I>>, I>>>, etc.). This ca
an be illustrate
ed using
the examp me overcurrent protection. The I>> step
ple of multi-sttep definite tim p cannot be te ested with a ramp, as
the I> stepp causes pick k-up and can even result in n tripping befo
ore the pick-uup value I>> iss reached.
The Pulse e Ramping tes st module offe ers an alterna ative solution.. Instead of th
he pick-up sig gnal, the trip ssignal is
used to as ssess the test. The trip tim
mes of the high her steps are always shortter than that o of the first step. It is
possible, therefore, to test
t the fasterr trip via one of the higher steps (e.g., I> >>) by injectinng the curren nt just for
a short tim
me. If the CMC C test device does not register a trip sig gnal during th his time, the ccurrent is reduuced
until the pick-up
p is able
e to drop off. This
T avoids trripping in the first step. The
e sequence iss repeated aftter a
short paus se, but the cuurrent output this
t time is grreater by ΔI. T
This continues until the I>> > step picks u up.
It is thus possible
p to tes
st all higher steps.
s In fact, the applicatio
on range exte
ends beyond o
overcurrent
protectionn.
The same e set modes can be used in the Pulse Ramping

R test module as in n the Rampingg and QuickCCMC test
modules. This results in numerous possible
p applications for te
esting the high all manner of different
her steps of a
protection
n functions.
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6.2
2 Add
ding a Pulse Ramping
g Test Mod
dule
Start by adding a Pulse

e Ramping test module to the existing O CC file.
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6.3
3 Testt Module
The test module

m is disp
played in the Test View. However,
H befoore you do anything else, yyou need to m
modify a
he Test Object. As the sec
value in th cond step of the
t definite tim
me emergenccy overcurren nt protection iss set to
6 A, you have
h to increaase the maximmum value of the current inn the RIO function Device to 8 A.
You also need to config

gure some se
ettings in the local Hardwa
are Configura
ation.

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6.4
4 Loca
uration
As we are
e once again testing
t definitte time emerg
gency overcurrrent protectio
on, you can d
deactivate the
e voltage
generatorrs (Not used)).
Only the trip

t signal is used
u on the Binary / Analog
g Inputs tab. None of the o
other signals a
are needed.
We will no e possible settings for the module base

ow explain the ed on an exam
mple. The seccond step of a definite
time emerrgency overcuurrent protecttion function with
w the follow
wing paramete
ers is to be te
ested:
Settings Value
I> 1.8 A
t I> 0.5 s
I>> 6A
t I>> 0.1 s
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6.5
5 Testt Paramete
ers
3
2
4
6
1. The Seet Mode func ctions in the same way as the

t Ramping test module. The available e setting optio
ons are
also th
he same. This s means that you
y can chan nge currents aand voltages d directly or sym
mmetrical
compo onents, fault values,
v impeddances, etc., automatically,
a , in steps.
2. Here you
y can define e which valuees are to be varied. The poossible setting
gs are determ mined by the SSet
Mode. Examples in nclude:
Set mode
m Outpu
uts Size
S
Directt I L1, I L2, I L3 Magnitude
M
Symm
metrical
V1 Magnitude
M
components
Z-I const. ZFaultt Phase
P
In the example we are

a considerin
ng here, the magnitude
m of a three-phasse fault curren
nt is to be ram
mped.

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3. Two sttates are defin ned:
The firrst is the Reseet state, durin
ng which the pick-up of the e first step is tto drop off.
The se econd is the Fault
F state, which
w is variedd in steps andd should ultimmately lead to tripping.
Duringg the Reset sttate 500 mA is output in th his case. You must make ssure that the vvalue is less tthan the
drop-ooff value of the
e first overcurrrent step.
In the case of the Fault state the e values preset when the rramp was deffined cannot b be changed. Y You can
alter all other electrical parameteers in the usual way.
4. A Preffault time durring which the e Reset state e is output cann be defined.
5. This is
s where you define the valu ues at which thet pulse ram mp should starrt and end. Yo ou can also sset the
step siize here. The values to be entered can be calculated d using the sa ame principle as for the Ra amping
test mo odule. The start value is to
o be 80% and d the end valuue 120% of the set value. T The step size is
selecteed so that theere are approx ximately eightt steps within the tolerance e range. The current tolera ance of
the prootection relay is 3%. This results
r in a ste
ep size of 45 mA.
6. Here you
y can set th he length of eaach step and each Reset s state. Select a value for th he fault time w
which is
greater than the tripp time of the step
s to be testted (t I>>) butt less than t I>. In our exammple, therefore, the
value has
h to be betw ween 500 ms s and 100 ms. The value exxactly in the m middle of the two (300 ms)) is
selecteed.
You do noot need to maake any settings on the oth her two tabs, B
Binary Outpuuts and Gene eral. This testt module
also featu
ures an option
n to synchroniize the start of
o the test with
h a GPS or IR
RIG-B pulse.
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6.6
6 Mea
asurement
As in the other
o modules, you can take a measure ement here a nd run autommatic assessm ment. In our exxample
the amplittudes of the generated
g signal are measured at the pooint in time att which the de
efined trigger
condition is met. The setpoint is the set value of the
t I>> step ((6 A). The abssolute tolerannces can be
calculated
d using the vaalues specified in the relay manual (3% of 6 A = 180 mA).
Check the
e box highligh
hted to enter the
t relative to
olerances dire
ectly.

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6.7
7 Time
e Signal Viiew
The define
ed pulse ramp is shown in the Time Sig
gnal View on
nce the test iss completed.
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6.8
8 Puls
se Ramping Exercise
e
> Add a Pulse Ramping test mo odule to the OCC
O file.
> Check the pick-upp value for thhe second sttep of the deefinite time em
mergency ov
vercurrent
prote
ection functio
on for line-lin
ne faults as described
d in the last cha
apter.

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7 Overcurre
O ent
7.1
1 Prefface
You can use
u the Overc current test module
m to test the trip timess and the pickk-up of an ove
ercurrent protection
function. In
I this test moodule the tripp
ping characteeristic and thee trip times meeasured are sshown in the fform of a
graph. This makes testting very straiightforward and convenien nt. However, it is importantt to remember that
the charac t be defined in advance. This
cteristic has to T is explain
ned below.
This moduule can be us sed to test mu

uch more than n just non-direectional inverrse time/definite time overccurrent
protection s testing of prrotection relayys with directional overcurrent protectio
n functions. It also supports on,
unbalanceed load protec ction, thermal overload prootection, and zero sequencce current pro otection functtions.
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7.2
2 Testt Module
Once the test module has

h been add ded to the OCCC file, it is op
pened automa
atically. The fiirst thing you see
here is the
e predefined overcurrent definite
d time characteristic.
c
However, this definite time

t characte
eristic does no on examples of this training
ot conform to the applicatio
course. This has to be set in the Tes
st Object firs
st. A new RIO
O function calle
ed Overcurre
ent is availab ble for
this purpo
ose.
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7.3
3 RIO Function Overcurren
O nt, Relay Parameters
P s
1. Here you can set whether

w a Non-directional or a Directio onal overcurrrent protection is to be testted. If
you se er option, you have to defin
elect the latte ne the position
n of the CT starpoint con nnection
(To protected object or From protected ob bject). Examp ples are show
wn below.
To prote
ected object From pro
otected object
Protected Protected
Object Object
Busb
bar Relay e.g. Line Bus
sbar Relay e.g. Line
Protected Protected
Object Object
Busb
bar Relay e.g. Line Bus
sbar Relay e.g. Line
As VTT connection ns also have to

t be included d for Directioonal protection n, the correspponding selecction box
is che
ecked. You ne eed to define whether the PT
P connectio ns are busba ar or line conn nections here.. In the
formeer case a volta
age is output in the postfau he second, a vvoltage
ult state after the relay hass tripped; in th
is not output.
2. As the test module is to carry out an automatiic assessmen nt, you need tto specify the tolerances foor the
currents and the trip
p times here. These can be e found in the ata section of the relevant relay
e technical da
manua al.
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7.4
4 RIO Function Overcurren
O nt, Elemen
nts
1
2
Use this ta
ab to define the overcurren
nt elements (s
stages) of the
e relay:
1. The firrst step is to select

s the type
e of element. This refers to o the type of o
overcurrent protection, the
e tested
relay uses.
u You can n choose betw ween Phase, Residual, Po ositive seque ence, Negatiive sequence e and
Zero sequence.
s
2. This lis
st show all de efined elemen nts of the sele
ected type. Th here are comm mand buttonss available to Add,
Copy To...,
T Remov ve, Move Up or Move dow wn the elemen nts. Each element has diffferent properties that
are shown in the list:
- Active:
A Use this checkbox to t activate or deactivate el ements.
- Element Name e: A meaning gful name help ps to distingu ish between tthe stages.
- Tripping Charracteristic: Here H you will find the name of the used ccharacteristicc type.
- I Pick-up:
P This up current as multiples of th
s is the pick-u he nominal cu urrent.
- Absolute:
A Herre you find the
e pick-up valu ue in amperess.
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- Time: If the ele
ement is a de efinite time sta age, this valuee represents the trip time in seconds, if it is an
nverse charac
in cteristic it is th
he time index of the stage.
- Reset
R Ratio: This
T is the ration between the t drop-off a and the pick-uup value of the
e stage.
- Direction:
D Seleect whether the element is s Forward dirrected, Reverrse directed o or Non Directtional.
Not all values can be changed within w the list; some have tto be accesse ed from the taabs below.
3. With th
hese three tab bs you can de efine more de etails propertiees of the elem
ments. As thee settings in th
hese
tabs arre very complex, the will be described in n the followin g sections
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7.4.1 Define Elemen
nt Characterristic
3 5
1. With thhe Characterristic definitio

on you set thee characteristic type, the I p
pick-up value
e and the Trip p time.
Right to
t the charactteristics name e there is a brrowse button ... that openss the Managee Characteris stics
dialog..
2. Within this dialog yo ou can select either a Stanndard characcteristic or a P
Predefined onne from the lisst on the
left. All characteristiic parameters
s are then shoown in this dia
alog. To enter a custom chharacteristic sselect
one off the predefine ed ones and click
c OK. The en you can chhange the parrameters in thhe Define Eleements
Characteristic tab (1).
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3. Also yo ou have the possibility
p to restrict
r the ran
nge of the cha aracteristic. T
Therefore youu can enter minimum
and maximum value es for currentt and time. Th his is used forr characteristics with a min
nimum trippingg time.
4. If a relay with Reset characteris ested, this opttion has to be
stic is to be te e activated. Y
You can eitherr select
Definitte time or Invverse time an nd enter the corresponding
c g data.
5. The re esulting characteristic is shown at the rig ght.
Note: This diagram m shows only the t characteristic for the se elected eleme ent.
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7.4.2 Define Elemen
nt Directiona
al Behaviour
The directtional behavio

our for each element
e can be
b set in this ttab.
1. This is
s only possible ction of the ellement is set to Forward o
e, if the Direc or Reverse. T This setting iss only an
ation for the user. The trip sector will be shifted by 18
orienta ed from Forw ard to
80° if this settting is change
Revers se or from Reeverse to Forrward.
2. The trip sector can be defined either by using a Start and a an End angle e or by using the
Maximmum torque angle
a and the
e Sector opening.
3. Also a Blinder can be defined. Itt can be set by b using a commplex currentt (active and reactive comp ponents)
and ann angle. The blinder
b charac
cteristic line will
w go through h the complexx current and will have the e defined
angle.
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Different relays
r use diffferent polariz
zation methodds, which meaans that they use different reference volltages to
determinee the fault dire
ection. This is
s why the directional behavviour of the te
est object has to be adapte
ed to
them. Som me of these methods
m are explained
e beloow.
Quadra ature Voltage

Fault Voltag
ge Polarized
Polarize
ed
VL3 V L3
Directional Line Directional Line
Vref = VL1 V L1
Relay Cha
aracteristic Angle
= Maximum
m Torque Angle
Maximumm Torque Angle
VL2 V L2
MTA - F
Forward
MT
TA - Forward Vref = VL2- L3
Re
elay Characteristicc Angle
Zero Seque
ence Voltage Pola
arized
VL3 Directional Line
Vref = 3V 0 Vref = VL1
Maximum To
orque Angle
VL2
MTA - Forwa
ard
Rellay Characteristic Angle
Fault Voltage Polarize ed: Here the voltage of the

e faulty phase e is used as rreference volttage. In this case the
relay charracteristic ang
gle (RCA), wh
hich is a relay entically with the test objecct setting
y setting, is ide
Maximum m torque ang gle (MTA).
Quadratuure Voltage polarized:

p Duuring a fault cllose to the re lay the voltag
ge in the faultyy phase can d drop to
almost ze
ero. In such ca
ases the angle of this phasse voltage can nnot be meassured. That iss why many re elay
manufactuurers use the phase to pha
ase voltage of the non faullty phases as the polarizing g voltage. In such
cases the
e Maximum to orque angle can be calculated with the e following equation: MTA = RCA - 90°
Zero Sequence Voltag ge Polarized d is typical fo r earth fault o

d: This method overcurrent prrotection. It usses the
zero sequ
uence voltage
e as reference
e. The Maximmum torque a angle can be calculated wiith the following
equation: MTA = RCA – 180°
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7.4.3 View Resultin
ng Characteriistic
After defin
ning the chara
acteristic, you
u can use the tab View Re sulting Charracteristic to have a look a
at the
results. Th
he characteris
stic of the cho
osen elementt type will be d
displayed.
If you hav he relay, you can close the

ve defined all the characterristics, which are used in th e test object b
by
clicking OK.
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7.4.4 Te
esting with the
t Over currrent test mod
dule, using a XRIO conve
ertor.
All of the above

a can alsso be achieve ed by making use of a XRI O convertor. A XRIO convvertor is a file that is
stored on your hard driive that you looad into your test object thhat will automaate setup proocess of the
characteristics. This ca
an be achieve ed by opening g the File – Im
mport menu iteems and then n with the opeen dialog
box, naviggate to an apppropriate XRIO file for use. The one tha at we will use for this expla
anation is a geeneric
over curreent and earth fault XRIO co onvertor. For this reason itt is important to explain tha
at this genericc XRIO
do not nec cessarily have all of the ca
apability that you
y will find inn a relay-speccific XRIO convertor.
On the Ge
eneral page, you
y just fill in the fields acccording to Sta
ation name, fd
dr name etc m
mostly everyth
hing you
would hav
ve typed in on
n the Device page
p in the RIO
R function.
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The rest of
o the exercise
e is to just typ
pe in the settings for the diifferent functio
ons.
This Gene
eric XRIO con
nvertor can allso be used foor testing a diirectional rela
ay. If you chan
nge the Direcctional
parameter from “NONDDIRECTIONA AL” to “FORW WARD” or to “R REVERSE”, then you will ssee a few extra
parameters appearing that apply to the directiona
al behaviour oof the relay.
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7.5
5 Hard
dware Con
nfiguration
If you testt a non directiional overcurrrent function you

y can deacctivate the volltage outputs in the local
Hardware e Configuration. Configurre the binary inputs as show wn.
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7.6
6 Testt View, Trig
gger
You also have to config
gure a numbe
er of settings in the test mo
odule itself:
You can define

d whethe er the Binary Outputs sho ould be closed
d or open for testing. As no
o binary outpu
uts have
been defin
ned for our ex
xample, this tab is empty.
The refe
erence for tim
me measurem ment has to be e defined
here. Th
he measured time will be tthe difference e
betweenn the Fault in
nception and d the trigger or
betweenn the Startingg signal and tthe trigger.
In the lo
ower part of th
he screen you
u have to spe
ecify
which ssignals are to be used to m
measure the trrip time.
Note: T
This trigger on
nly defines the e trip. For thee
Pick-Up
p / Drop-off Te est the triggerr will be set
automaatically by defiining the Starrt contact in thhe
Hardwa are Configurration.
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7.7
7 Testt View, Fau
ult
1 4
2 5
3 6
1. The Looad current, which will be injected during the prefau ult, can be deffined here.
2. Here you
y can set th he Prefault tim me and the Postfault
P timee.
Also yoou can speciffy how long th he test module waits for a ttrip in two diffferent ways. T
The first of the
ese is
Absolute max. tim me and the sec cond is Relattive max. tim e. The relativve time is calcculated for the e
relevannt test point frrom the trip time setpoint. If, for examplle, you want tto test the trip
p time of a hig
gh-
current stage with a setpoint of 100 ms, a Rellative max. tiime of 100% means that th he testing of tthe test
point will
w be aborted d at the latestt after 200 ms
s. To avoid da amaging the rrelay, whichevver time is fasster is
active.
3. The vooltages during g the fault can n be defined as
a well. Even if non directio onal relays arre tested, a vo
oltage
output can be enabled.
4. For rea
alistic fault sim
mulation a De ecaying DC can
c be set.
5. The CB B characteris stic is linked to the RIO function CB Co onfiguration in the Test O Object.
6. sting thermal overload func
For tes ctions the res
set of the The ermal image ccan be define ed as well. Thhis can
be donne either man nual or autom matic.
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7.8
8 Testt View, Cha
aracteristic
c Test
Now all thhe essential settings have been made, you y need to d define the testt points for the characteristtic test.
A a new test point, or yo
You can Add ou can edit an n existing onee. The highligh hted test poinnt can be edited
either in th
he table on th
he left (A) or directly
d in the table of the ttest points (B)). The resultin
ng test pointss will be
shown in the expected trip time and directional characteristicss (C).
Note: If two or more

m overcurrrent protection
n functions arre activated, tthey may inte erfere (e.g. a p
phase
overcurrent and a resid dual overcurre
ent protection
n). But if all off these functio
ons are entere ed in the
Test Obje ect, they will be
b taken into account auto omatically. The resulting ch haracteristic wwill
individuallly be calculate
ed and shown n for each tesst point depen ault type and fault
nding on its fa
angle, enssuring a prope er assessmen nt according tto the expecte ay behavior.
ed overall rela
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Each test point needs several
s settin
ngs which hav
ve to be define
ed:
1 2 3 4 5 6 7 8
1. For thee fault Type you

y can choos se between th hree, two or oone phase fau ults as well ass phase to gro
ound
faults and
a zero and negative seq quence faults..
2. It is po
ossible to ente
er your test cu
urrents relativve to the pick--up currents w which you havve defined in the test
object.. The elementt, on which th he test point will
w be referen nced, can be sset here.
3. Here you
y can enter the relative test current.
Note: If a test pointt is entered re
elatively, the absolute
a test ccurrent will be
e changed au utomatically,
whene ever its pick-up value is cha
anged.
4. The Magnitude can n be entered as an absolutte value as w well.
5. For dirrectional overrcurrent protection, the testt Angle has tto be set additionally.
The data for the test as

ssessment is shown as we
ell:
6. Here you
y can see th he nominal triipping time off the test poin
nt.
7. Also th
he tolerances are shown foor each test point.
8. The measured tripp b displayed here after the
ping time will be e test.
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7.9
9 Testt View, Pick-up / Drop
p-off Test
1 2
3 4 5
Also there
e is the possib
bility to perforrm a Pick-up / Drop-off te est. This is do
one automaticcally by rampiing the
current. The
T start pointt, the end poin nt and the ste
ep size of the ramp are calculated by the test module e.
1. For a pick-up
p test normally a Rellay with startt contact is nneeded. But itt is also possible to test an
n
electroo mechanica al (EM) relay without starrt contact. Di gital relays w
without start coontact can on nly be
tested, if they emula ate the behavvior of a disc-ttype EM relayy.
2. If you do
d not want th he pick-up tes
st to be asses ssed automattically you havve to clear this check box.
Note: The drop-off value as well as the reset ratio will not b be assessed automaticallyy
3. The fault Type can be defined siimilar to the characteristic
c test.
4. If you test
t a directio
onal overcurreent relay, the test Angle caan be set as w
well.
5. The Re esolution defines the step p length of the be set longer than the pickk-up time
e ramp. This vvalue has to b
of the relay.
After the test

t the pick-u
up value will be
b displayed and
a assessed
d. The drop-o
off value and tthe drop-off ra
atio will
be displayyed as well.
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7.1
10 Out of Range
If the test point is indica

ated blue, the
e Absolute max.
m time is sshorter than th
he upper tolerrance tmax. IIn this
case the test
t cannot be e assessed properly. There
efore you havve to increasee the Absolutte max. time.
If the test point is indica

ated pink, the
e test current is too high. T
This means that the test cu
urrent of this te
est point
is higher than
t the maxiimum test currrent I max which is define ed in the test o
object.
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7.1
11 Report View
The Repoort View is als

so available in the Overcurrrent test mod
dule. It can be
e opened via clicking Repo
ort on
the View tab.
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7.1
12 Overcurrent Exercise
> Add an
a Overcurre ent test module to the OCCC file.
> Use the Generic XRIO
X convertor to set up
p the parametters for testing an Over c
current and E
Earth
fault function.
f
> Check the trip tim
mes of the ov
vercurrent prrotection spe
ecified by the
e trainer.
7.12.1 Ex
xercise A: In
nverse Timed
d Earth Faultt Protection
Settings
S Value
Charac
cteristic type I> Normal Inverse
I> 0.2 A
t I> 0.8 s
I>> 2.4 A
t I>> s
Instantaneous
Directiional behaviou
ur Non directiona
al
xercise B: In
7.12.2 Ex nverse Timed
d Overcurren
nt Protection
n
Settings
S Value
Charac
cteristic type I> Normal Inverse
I> 1.0 A
Tim
me multiplier 0.5
I>> 10 A
t I>> s
Instantaneous
Directiional behaviou
ur Non directiona
al
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8 XRIO
X
8.1
1 Prefface
XRIO is our
o name for a powerful option for autom
mating and sim
mplifying test sequences. P
Picture the fo
ollowing
scenario:
Numerous s relays of thee same type with

w similar se ettings (functiional scope, ppick-up chara
acteristics, etcc.) are in
use in a single
s transforrmer substatio on. To test onne of these re
elays you have e created a te
est template
containing
g the pick-up value and trip p time tests fo
or various fau
ult loops. Folloowing successful testing yo ou now
want to usse the same template
t to te
est the next re ecalculate and enter
elay. Howeve r, to do this, yyou have to re
a numberr of set values s for the test modules
m due to the discrep pancies betwe een paramete er settings. Thhis can
involve up
p to 12 differeent settings foor one ramp module
m alone. If this routine
e task could b
be carried outt
automaticcally, you wou uld be able to save a huge amount of tim me when adapting the testt template.
In this cha
apter we will show
s you how
w to implemen
nt this type off automated ttesting.
XRIO = eX
Xtended Rela
ay Interface by OMICRON
N
Up to now
w you have be
een using RIO
O functions.
RIO = Relay Interface

e by OMICRO
ON
RIO made o map the behaviour of a protection

e it possible to p devvice regardlesss of manufaccturer. Howevver, it
did have certain
c limits, which were imposed by th RIO functions used. XRIO does
he content of the specific R
h these limits. Users can no
away with will in an XML file and use fformulas to in
ow create parrameters at w nterlink
them.
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8.2
2 Required Para
ameters
The definite time emerrgency overcu
urrent protectiion function to
o be tested ha
as the following set valuess for the
purpose of
o our example:
Settings Value
I> 1.8 A
t I> 0.5 s
I>> 6A
t I>> 0.1 s
You have to create the

ese values as XRIO parameters in the T Test Object. YYou also need two additio
onal
parameters to configurre the ramp fo
or the pick-up test; these ca
an be calcula
ated from the parameters sspecified
above.
Tol/A = 3% · I> = 54 mA
Delta I = Tol/A / 4 = 14 mA
These two
o parameters have to be created by ass orresponding formulas to th
signing the co hem.
I/A
1.2 I>
I> + Tol
I>
I> - Tol
0.8 I>
Tol t/s
t
Delta I =
4
This is all done in an advanced view w (View menu u) of the Testt Object. How
wever, you ha
ave to create a new
sub-blockk first and add
d all the param
meters to it.
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8.3
3 Add
ding a Bloc
ck
A block off this type has

s various attributes. The most
m importantt of these are
e:
> ID: Th he ID identifiees the block. This
T ID must contain
c only uuppercase lettters; not all o
of these letters can be
speciaal characters..
> Name e: The name can c be selectted at will.
> Description: You can enter add ditional notes here to speccify the purposses for which the block is tto be
used.
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8.4
4 Add
ding Param
meters
You now need to creatte the first parrameter in this

s block. To do
o this, you ha
ave to select tthe data type first. In
our example, only the Real
R data typpe is used.
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8.5
5 Para
ameter Dettails I>
The first parameter

p is the
t pick-up va alue I>. Make the settings as shown:
> Foreign ID: If the parameter
p is a set value off a relay, you can enter thee ID used to rrefer to it in th
he relay
here.
> Value e: Enter the vaalue of the pa
arameter here e.
> Formula: If a formula is to be used to calcula ate the value,, it can be enttered here.
> The Min.M Value an nd the Max. Value
V restricts
s the range off values. An eerror message e will appear if
illogiccal values are entered.
> You can c specify a Multiplier an nd a Unit (e.g., MW or mA)).
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8.6
6 Othe
er Parametters
Proceed in the same way

w to define the
t remaining
g relay set va lues.
Completee the process by adding the

e two parame
eters Tol[A] an
nd Delta I. Yo
ou will need to
o use addition
nal
formulas for
f this purpose.
8.7
7 Add
ding a Refe
erence
Add a refe
erence in the Formula field
d. This enablees you to linkk the value of a different pa
arameter. Oncce you
have addeed a referenc
ce you will nee
ed to specify the correspon nding parame eters.
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The ID of the paramete er added via the
t reference is displayed in red. This p
parameter now
w has to be m
multiplied
by the rela
ative toleranc y (3%). Three percent has to be entered
ce of the relay al number using
d as a decima
American notation (i.e., with a decimmal point).
Once the unit of measu

urement mA has
h been spe
ecified under D perties, a valu
Display Prop ue is displaye
ed
(54 mA).
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In our exa
ample Delta I is the last parameter to be
e defined. As the step size of the ramp h
has to be equ
uivalent
to approximately one-q
quarter of the tolerance, this algorithm n
needs to be entered under Formula.
8.8
8 Para
ameter Ove
erview
ed. However, so far these parameters

All parameters are liste p have no effectt at all on the test moduless.
h
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8.9
9 Link
kToXRIO
The screeenshot shows s the pick-up test

t in the Rammping test mo odule. The inclusion of a liink via
LinkToXR RIO is also vissible. In the window
w which is displayed you can now select the I> parameter. A As the
ramp is to
o start at 80% of the nomin nal value, the Factor needss to be set to 0.8. When yo ou click OK th
he field
turns purp
ple to indicate
e that it has beeen linked. Alll settings are
e then linked in the same wway, including
g the
parameters from the Assessment
A tables.
t
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8.1
10 Link
ked Rampin
ng Test Mo
odule
Nothing about
a the func
ctionality of the test module e has change d. However, iif we now cha
ange the pick-up
value of th
he I> step in the
t Test Obje ect, the test module
m is ada
apted automatically.
You have to proceed differently

d in order
o for the trrip time test to
o adapt autom
matically.
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8.1
11 RIO in the Adv
vanced Vie
ew
vanced view, the RIO functtions are disp

In the adv played as indivvidual blocks with sub bloccks and param
meters.
The differrent overcurre
ent stages are
e displayed as
s Timed Ove rcurrent Elem ments. The P Pick-up Currrent and
the Time Multiplier/Trrip Time are part
p of these elements.
e
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8.1
12 Form
mulas in RIO
R
As was th he case with parameters

p crreated by the user, a refere ence can also
o be added he ere in the Forrmula
field. In ou
ur example thhe pick-up currrent is linked to I> (I_G). T
This means th
hat this value is applied
automatic cally. The sam
me applies forr the trip time..
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The seconnd overcurren nt stage is als
so linked. Of course
c these settings can be applied to phase overccurrent
stages as
s well as to res
sidual overcuurrent stages.
vercurrent test module uses these value

As the Ov es and the tesst points have
e to be positio
oned relative tto the
overcurrent stages, no further modiffications need
d to be made there.
The LinkT
ToXRIO functtion is supporrted in almostt all test modu ules. It can be ate complete test
e used to crea
templates
s where only the
t set valuess have to be entered.
e All te
est modules thhen adapt to these values
automatic
cally.
This princciple also prov

vides the basis for the PTL
L (Protection Testing Librrary). You ca
an find out mo
ore about
this in the
e Customer Arrea of the OMMICRON homepage (www..omicron.at).
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8.1
13 XRIO
O Exercise
> Autommate the testt template fo
or testing the
e definite tim
me emergency y overcurren
nt protection
n with
XRIO.
> Link the
t set value es in the Rammping test module.
> Save the test template with a new name.
> Change the set vaalues in the test
t object and check tha at the test modules adappt to the chan
nges
autom
matically.
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9 RIO/XRIO
R Function
n Distanc
ce
9.1
1 Prefface
In order to
o test distance
e protection you
y first have to create thee associated ccharacteristic in the Test O
Object in
the RIO fuunction Distance. You sho ould map the individual zonnes on the graaph in accorddance with theeir
parameter settings in the protection device. This chapter expla ains how to cconfigure the n
necessary se ettings.
RIO
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9.2
2 Systtem Settings
1
1. The line imppedance is enntered here, w
with magnitud de
and angle aas secondary values. If onlly the primaryy
values are sspecified, you
u can use
Impedance es in primary y values to m
modify the entrry.
If the PT co
onnection is a busbar conn
nection, voltag
ges
are applied in the postfault state.
2 The directio efined as either

on of the CT sstarpoint is de
Dir. line or D
Dir. busbar.
2. The Tolera ances of the rrelay (relative and absolute e)

are entered d here. In the case of abso olute time
tolerance thhe operating ttime of the protection relayy to
be tested a lso has to be taken into acccount. The
relative imppedance tolera ance is conve erted into an
absolute va alue at the point where the zone intersects
3 with the line
e angle.
3. The Groun ding Factor indicates the ratio of the

ground imppedance to the e line impeda ance. Various
input modess are available for it. Sepaarate arc
resistance is required iff the relay deaals with the arrc
resistance sseparately fro
om the line im
mpedance
component .
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9.3
3 Zone
e Settings
A list of th
he protection's
s various distance zones appears
a on th is tab. As no zones have b
been defined as yet,
the list is empty
e at this point. Click New
N to add th
he first zone.
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9.4
4 Add
ding a New Zone
3
1 2 3 4
1. Zone numbers
n are assigned
a auto
omatically.
2. You caan enter a name of your ch hoice for the zone
z here.
3. Four different
d typess of zone are available:
a
> Triipping
> Sta arting: This is
s a zone which causes starrting only. It iss also possiblle to define a range on the e
impedance plan ne in which sttarting will be followed by ttripping with m maximum ope erating time.
> Ex xtended: This is a tripping zone
z which iss only activateed occasionallly, e.g., by mmeans of "man nual
clo
ose" detection n, autoreclosuure, etc.
> No on tripping: Thhere can be no
n tripping in this
t zone, eve
en if it is overrlapped by a ttripping zone. This
zone is used to model load blinding,
b for ex
xample.
4. Select the appropria ate Fault loop for each zo one. In our exa ample All hass been selectted.
Click the Edit...

E button to open an editor
e in which
h you can ente
er the geome
etry of the zon
ne (e.g., polyg
gon).
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9.5
5 Characteristic Editor
A zone co omprises a nuumber of elem ments, which define

d its limitt. These elem
ments can be lines and circcles:
> Line cartesian:
c A point on the line
l with real and imaginarry componentts as well as a an angle speccifying
the direction are re
equired here.
> Line polar:
p The po oint is entered
d here with po olar coordinattes. An angle defining the direction is allso
requirred here.
> Arc cartesian:
c In order
o to define the arc, its center point h has to be enteered in cartessian coordinates,
along with its radiu
us, a start anggle and an end d angle, and a direction.
> Arc polar:
p The cen nter point is specified
s here e in polar coorrdinates. As wwas the case with the carte esian
arc, th
he radius, sta
art angle, end angle, and direction also h have to be sppecified.
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9.6
6 Building a Zon
ne
The funda amental geom metry of the zo

ones is actually dependentt upon the typpe of relay. Directional line
es, load
blinding, etc.,
e b taken into account in this context. In order to map
have to be p the zones co orrectly, there
efore,
you need a precise kno owledge of booth the relay settings
s and tthe parameter settings.
To avoid input
i errors, you
y should de
efine the elem
ments of a zon ne in a continuous sequence. We advise you,
therefore, to number elements conssecutively befo o build zones .
ore starting to
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9.7
7 Firstt Zone Rea
ady
This scree
enshot shows
s the first zone
e with the corrresponding to
olerances.
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9.8
8 Cop
pying the Zone
As all zoness (with the exxception
of starting) are structuredd in a
similar way, you can Copy the
first zone fo
or subsequent zone
definitions.
You can theen add this zoone by

clicking App
pend Copied d Zones.
Please notee that selectin
ng the
Paste optio
on would repla ace the
selected zo
one!
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9.9
9 Zone
es Ready
The scree
enshot shows s the tripping zones
z (1) andd the extende d zone (2). The starting zo
ones (directio
onal and
non-directtional) are als
so visible. The
e VI starting used
u in this exxample canno
ot, however, b
be mapped o on the
impedancce plane.
9.1
10 Usin
ng a XRIO convertor
Obviously y all of the aboove can also be achieved by making usse of a XRIO convertor. Ass previously
discussed d in this manu hat you load into your
ual, the XRIO convertor is a file that is s tored on yourr hard drive th
test objecct that will auto
omate the settup process of
o the charactteristics.
In the follo
owing explana ation, we will make use of the XRIO con nvertor for the
e SEL321 Disstance relay.
By making g use of the File
F – Import menu
m items in
n the test obje ect and then wwith the openn dialog box, n
navigate
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to the app
propriate XRIO
O file for use.
Now once
e again, you ju
ust type in the
e settings from
m the setting sheet into the
e appropriate
e fields.
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Doing all of
o this, you will
w notice that all of the cha
aracteristics and other relevvant parametters will be up
pdated
automaticcally.
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9.1
11 RIO Function Distance
D Exercise
E
> Open
n the test object for the OCC
O file you created
c prevviously.
> Use the relay set values and the
t last chappter to build tthe distance
e protection zzones.
> Save the test template.
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10 Advanced
A d Distance
10
0.1 Prefface
You can use
u the Advan e test module
nced Distance e to test the b ias curve (zon
ne reach and
d trip times) fo
or
distance protection.
p
w group called "Distance prrotection" in th

You need to start by crreating a new he OCC file a
and adding an
n
d Distance tes
Advanced st module to it.
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10.2 Test Module
The above
e screenshot shows the th
hree most imp
portant views of the test mo odule: the Test View, the
Impedancce View and the Phasor View.
V The zon
nes previousl y defined in tthe Test Objeect are displayed in
the Imped
dance View.
However, before startin ng the actual test, the Testt Object and the Hardwarre Configuration have to be set
correctly. As the definittion of the Test Object waas described i n the chapterr before, you only have to
configure a number of settings in the e local Hardw
ware Configu uration.
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10
0.3 Loca
uration
The scree
enshot shows
s the configura
ation of the Binary Inputs .
10
0.4 Trigger Tab
After chec
cking the Test object and the Hardwarre Configurattion, the test module can b
be set up.
ab to explain will be the Trrigger tab.

The first ta
ab you can configure the triigger signal fo

On this ta or the subseq
quent tests.

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10
0.5 Setttings Tab
You can choose

c which simulation model
m is to be used for the Test Model. The following
g Test Modells are
available for selection:
> Cons
stant test currrent: To test distance prottection relays with I> pick-u
up
> Cons
stant test volttage: To test the underexccitation protecction function
> Cons
stant source imp.: To test distance prottection relayss with more re ealistic fault co
onditions
In our exa
ample we are using the Test Model, Co current with a test currentt of 2 A (2·In)..
onstant test c
Under Fault inception n you can spe ecify the phase angle at wh
hich the fault iis to be trigge
ered. If DC-offfset has
been activ sient event is simulated witth a decaying
vated, a trans g DC element.
The Ignorre nominal characteristic

c cs, Search in Search Resolution setting
nterval, and S gs are relevan
nt for the
est. These pa
search te arameters will be described
d in more deta
ail later in thiss chapter.
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You can define
d the durration of a pre
efault or postffault state und der Times. In addition, Ma ax fault speciffies the
maximum m time during which
w fault quuantities are output.
o If the C
CMC test devvice does not register a valid
trigger sig
gnal, the test module
m will au
utomatically switch
s to the nnext test poin
nt once this tim
me has elapsed.
You can select

s the time
e to be assesssed after the test under Tiime referencce. This is eith
her the time b
between
eption and tripping, or the time between starting an
Fault ince nd tripping.
Set Exten
nded zones active
a to defin
ne whether thhese zones arre activated o
or deactivated
d during the te
est.
Deactivate
ed extended zones will the
en not be disp
played on the impedance p plane.
The Switc o-crossing fu

ch off at zero unction shouldd always be a activated. As a result, the C
CMC test devvice will
only disco
onnect the tes
st currents following trippin
ng in the corre
esponding natural zero-cro ossing.

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0.6 Shot Test
You can define

d a Test Point either in polar coord dinates (|Z|, P
Phi) or in carttesian coordin
nates (R, X).
Alternative
ely, you can useu the curso or to place a Test
T Point an nywhere on th he impedance e plane. Click Add to
add the shhot to the list.. This procedu
ure applies fo
or each of the selected Fau ult Types.
In our exaample the rea

aches and tripp times of the zones are to be tested. Th
his is done byy setting the p
points
relative to
o the zones on
n the line ang
gle. The shotss are at 94% a
and 106% of the relevant zzone (outside e the
tolerance range).
ect the Follow

If you sele w line angle change
c optio
on, the test po
oints will be adapted autom
matically if the
e line
angle chaanges in the Test
T Object.
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10
0.7 Check Test
The Chec ck Test is a more

m convenie ent option for testing zone reaches. You u can define a Check Line e along
the requirred test sectio
on. The test points are autoomatically plaaced at the inttersections beetween this lin
ne and
the zone limits
l (1% outtside the tolerrance range). The Check L Line is speciffied by meanss of an Origin n, an
Angle, annd a Length. Alternatively, you can draw w this line by pressing and d holding dow wn the left mouuse
button on the impedance plane. You u then have too click Add too add the line
e to the list.
Click Sequence... for a quick way to

o generate a large numberr of Check Lines with the same origin a
and
different angles.
a

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0.8 Searrch Test
As in the Check
C Test, you can defin ne a Search Line
L in a Seaarch Test. Ho owever, in conntrast to Checck
Lines, noo fixed test points are defined at the intersections betw tween the Sea arch Line and the zone
boundariees. The bound dary between the zones is determined a automatically here, with a ssearch algoritthm
being useed for this purpose. The accuracy requirred for this ca an be specified on the Setttings tab under
Search Resolution
R . If Ignore nominal characte eristics is sellected here, the search alggorithm is modified to
the effect that the search for the zon ne boundaries
s starts at the
e origin of the lines. The se
earch is carrie
ed out
with the predefined
p sea arch interval. However, the
e results of th e search are not assessed d.
ck... to define
Click Quic e three search
h lines at once
e (0°, 90°, an
nd line angle)..
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10
0.9 Z/t Diagram
D
The tests carried out on the impeda

ance plane can also be rep
presented in a Z/t diagram.
However, please note that only one line at a time

e can be displlayed after a Check or a S
Search Test.

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0.10 Advanced Disttance Exerrcise
> Creatte a new grou
up in the OC
CC documentt called "Disttance protec ction".
> Add an
a Advanced d Distance te
est module and check the e trip times ffor L1-E faultts.
> Copy
y the module and change e the fault typ
pe to L1-L2-L
L3.
> Repeat the last tw
wo steps to te
est the reachhes of the zo
ones.
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11 State
S Sequencer
11.1 Prefface
You can use
u the State Sequencer te est module too define all ma
anner of differrent tests (sta
ates). In this ccontext
each state
e corresponds
s to specific currents,
c volta
ages, and bin ary signals, w
which can be freely defined d by the
user.
To switch from one sta ate to the nextt, you can deffine various trransition cond
ditions. Thesee can be binaary
gnals, for exam
trigger sig mple, manual interventions s by the user (the pressing g of a button iin response to
oa
prompt), or
o simply the expiry of a seet time.
es it possible to set up com

This make mplex test seq
quences.
ple configurattion options supported

The multip s by the
t State Seq quencer test m module will be
e described in
n this
chapter ba
ased on an example test of o the "manuaal close" functtion of a dista
ance protectio
on relay.
Statte Sequencer C.0047.AA

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11.2 "Manual Close
e" Function
n (Switch On
O To Fault, SOTF)
Although this function isi known by many

m different names ("ma
anual close" d
detection, "sw
witch on to fau
ult", etc.),
cal function is
its technic s always the same.
s
A grading factor of 85% % ... 90% is usually used fo or the first zon
ne in the case
e of distance protection. This
means tha at the busbarr in station B is already in zone
z Z2. Therrefore, in the event of a fau
ult at the end of the
line, no triipping would be possible inn quick time t1.
Should it happen that the

t line betwe een A and B was
w out of serrvice and grounded, the fo ollowing problem may
occur wheen the power supply is con nnected: High fault currentss occur exacttly at the mom
ment of startin
ng which
are not de
etected in stattion B. This is
s often attributable to a forg
gotten ground
d electrode in
n station B. Ho
owever,
because the
t fault is outside Z1 it can only be disc connected at t2 subject to a time delay..
The "man nual close" fun

nction can sollve this proble
em: The "CB close" comm mand activatess extended zo one Z1E
or Overreach (represen nted by the daashed line) fo
or a time whicch can be set as a parameter in the prottection
s provides a means
relay. This m of disc
connecting a fault of this tyype in quick time. In our exxample, the re
each of
the extendded zone has s been set to 125% of the line length an nd the time duuring which thhe zone is active is
1 s. Oncee this time has
s elapsed the zone is deac ctivated again n and distance e protection iss resumed witth its
graded zoones.
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11.3 Defining State
es
A test is now
n to be set up to test thee logic describ
bed above. Th he energizingg of the line iss simulated for this
purpose. After
A 800 ms,, a fault is sim
mulated at 1000% of the line
e length. This fault has to b be cleared by Z1E in
quick timee. The energiz zing of the line is then simulated for a s econd time. TThis time, how wever, the fauult only
occurs aftter 1.2 s. In th
his case the extended
e zonee must alreaddy have been deactivated; in other word ds, the
fault is no
ot disconnecte ed until zone time
t t2.
n states required for the te

The seven est are shown in the diagra
am below. The
e transition co
onditions app
pear in
green.
1 CB Open
O 1 V = 0; I = 0
Manual Close
C =1
2 CB Close
C 1 V = Vn; I = 0
t = 0.8
8s
3 Fa
ault 1 ZF = 100% · ZAB
Trip = 1
4 CB Open
O 2 = 1
Manual Close
C =1
5 CB Close
C 2 = 2
t = 1.2
2s
6 Fa
ault 2 = 3
Trip = 1
7 CB Open
O 3 = 1
t=1s

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11.4 Testt Module
Once we insert the Sta ate Sequence er test module

e in the OCC ffile, we have to look at OM
MICRON's Oh
hm's law
first. Then
n, we will desc
cribe the test module in de
etail.
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11.5 Testt Object an
nd Local Hardware Configuratio
on
Thhe Test Objec ct already conntains

all relevant information abou ut the
disstance protection relay to bbe
tessted. The Line length and d the
Linne angle in pparticular are
neeeded subsequently.
he binary inpu
Th uts have to be e
de
efined in the lo
ocal Hardwarre
Coonfiguration. The starting
command for th he circuit-brea
aker
(Close Cmd or C CB close) alsso
as to be config
ha gured for this test.

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11.6 Statte 1: "CB Open
O 1"
All defined
d states are liisted in the Ta
able View. User-defined n names can alsso be assigne ed here. The current
and voltagge outputs to be applied du uring the test are also visib
ble. You can use the buttons highlighted d on the
screensho ot to switch beetween the in ndividual state
es. You can a also add new states or deleete existing sttates at
any time.
The Detail View is whe

ere you config
gure the signa
als (analog a nd binary) of the state sele
ected in each case.
The availa
able set mode
es are the sam
me as those in
i the QuickCCMC test mod dule.
In the firstt state, the op

pen line is sim
mulated. The current
c and vo
oltage outputts are, therefo ore, zero. The
e
"Manual close"
c comma and provides the
t trigger. An
n overview off all trigger co
onditions is sh
hown below.
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11.7 Statte 2: "CB Close
C 1"
cond state, the

In the sec e line is close
ed for 800 ms at no-load. In
n other wordss, a nominal vvoltage is outp
put but
the curren
nts remain at zero.

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11.8 Statte 3: "Faultt 1"
ate, a fault is simulated

In this sta s at 100%
1 of the line length. To
o do this, chan
nge the Set MMode to Z%-I const.
and config gure a three-p pole fault at 100% line leng
gth and line a
angle. The trig
gger condition
n is in this casse the
open com mmand.
You can define

d the four remaining states
s by copy
ying the existiing ones and modifying the em accordinggly.
However, you do need to increase the
t time delay y for fault ince
eption (state ""CB Close 1")) from 800 mss to
1.2 s.
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11.9 Overview of Trrigger Con
nditions
er conditions for
The trigge f each of the states are shown here.

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11.10 Overview of Sttates
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11.11 Time
e Signal Viiew
e test sequence is shown in the Time Signal View. O nce the testt is complete, the binary sig
The entire gnals
recorded are also displayed here.

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11.12 Statte Assessm
ment and Time
T Asses
ssment
You can use

u two differe ent types of te
est assessme ents
> Time Assessment: You can de efine the start and stop eve
ents here, alo
ong with a nomminal time. Th
he time
Tact is
i calculated from
f the prev
viously definedd time measuurement. Nom m/act assessmment then takes place
autom
matically.
> State Assessmen nt: Here you can
c define the e binary signa
als which havee to be present or must noot be
prese
ent during the states. The toolerances deffine the time range during which the sig
gnals are permmitted to
deviatte from the de
efined conditions. State As ssessment iss not required
d in the example used here e.
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11.13 Statte Sequenc
cer Exercis
se
> Add a State Sequ
uencer test module
m to the
e "Distance p
protection" g
group in the OCC file.
> Test the
t protectio
on's "manuall close" dete
ection.

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12 Auto
A reclo
ose making use off the Statte Sequencer
12
2.1 Prefface
Most of th
he faults in ov verhead syste ems are arc fa aults caused b
by temporary conditions. Iff these faults are
promptly interrupted
i orr cleared thenn, they disapp pear automaticcally when the line is disco
onnected. The erefore,
the use off automatic re eclosing is usually advisable. Auto-reclo osing can minnimize the discconnect time
resulting from
f electricaal faults. When n a fault is de
etected on an open line, the
e line is disco
onnected. The e line is
automaticcally reconnec cted once a dead or delay time, which ccan be defined in the prote ection system, has
elapsed. If
I the fault perrsists, the line
e is disconnec cted again. D ependent upo on the settingg of the protecction
system, thhe line will remmain disconnected for goo od or a reneweed attempt will be made to o reclose the line.
To test thee Auto reclos se function, we e can use thee State Seque encer test moodule. The ide ea is to simula
ate the
test as cloose to reality asa possible. In order to do this, we have e to thoroughhly mimic the ssequence of e events
of an autoo reclose proc cess.
> Firstly y there should d be a normall condition and this we sim mulate with no ominal voltage es and load cu urrent at
a normmal load angle.
> Secon ndly we have to simulate th he fault condiition on the lin
ne. This you ccan simulate by either makking the
currennt high and th he voltage low w, or you can (in the detail view) select tto test impeda ance with connstant
currennt instead of thet direct metthod.
> Now the t Impedanc ce relay will open the breakker and also sstart the ARC C function, so now we have e to
simulaate a dead tim me, this you dod by injectingg nothing into o the relay for a little more tthat the dead time
setting
g.
> After thet dead time e has elapsed d, the ARC relay or functio n should issu ue a close pulse to the brea aker.
This close
c pulse sh hould be mon nitored; we will use this to ddo the timing test of the deead time.
> Herea after it is yourr choice if you
u want to simuulate another full cycle or e even two or thhree. These
additio
onal cycles work
w on exactlly the same principle
p as deescribed in the previous linnes, but the dead time
might differ.
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2.2 Testt Module
Once the test module has

h been add
ded to the app
propriate grou
up, it is opene
ed automatica
ally.
Auto
o reclose making
g use of the State
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12
2.3 Loca
uration
You have to start by de

efining the bin he protection relay's
nary inputs in the local Harrdware Confiiguration. Th
mand and CB CLOSE com
Trip comm mmand in particular are req quired for this test.
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2.4 Testt View
12.4.1 Ta
able View
The table above is an example

e where the ARC re elay/function will reclose th
he breaker tw
wice. After thiss the
uld trip and lo
relay shou ock out. It is up to the user to find out hoow many timees the ARC reelay/function w will try
and close
e the breaker. Then you have to adapt your y test setup
p to accommo odate the amount of reclosses
according
gly.
12.4.2 Detail View
The detail view represe ents an exam mple of how to

o use the Impeedance set mmode with connstant test currrent
instead off the direct mo
ode. It is set to
t 80% of a zo
one 1 three p
phase fault on
n the line anglle of 85 degre
ees,
using a te
est current of 2Amp.
2 The Im
mpedance Vie ew gives you a visual repre
esentation of where the fault will
be placedd from the relaay’s point of view.
v
Auto
o reclose making
g use of the State
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12.4.3 Time Assessm
ments view
The Time Assessments view above is an example of how to m make the time e measureme ents. In the firsst
column yo ou can give th
he test a name of your cho oice, the second column – Ignore before e – is there to
o for in
case you have one con ntact that ope
ens and closes more than o once, to discrriminate whichh of the opens or
closes to use for this measurement.
m . It is good pra
actice to makke this value tthe same as tthe Start colum mn
ou do not kno
value if yo ow how to use e the function.. The Start annd Stop colum mn gives you control over w when to
start a tim
mer and when to stop that timer. The Tno om column iss where you tyype the value e to measure against
and then obviously
o youu have the poositive and neg gative deviatiions to allow rroom for som
me error.
12
2.5 Auto
o reclose Exercise
E
> Add a State Sequ uencer test module
m to the
e OCC file.
> Set up a test to te
est one full AR
A cycle, whe ere the break
ker will be cllosed succes
ssfully after the first
dead time, measu uring this deaad time.
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13 Differentia
D al Test Object and
d Hardwa
are Config
guration
13
3.1 Prefface
The group
p of Advanced
d Differential test modules for testing th
he differential function conssists of the tesst
modules shown
s below..
ou can benefit from the adv

So that yo vantages of a common Te est Object and a common Hardware
Configuraation, we rec
commend thatt you use thes se test modu les in a single
e OCC file.
pter describes
This chap s how to define the Test Ob
bject and the
e Hardware C n for a differe
Configuration ential
test.
Diffe
erential Test Object and Hardwarre Configuration C.0047.AA
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3.2 Prin
nciple of Diifferential Protection
P
Pre
ecisely defined
pro
otection zo
one with
abs
solute sele
ectivity
Thrree-phase differentia
al
pro
otection
The principle of differential protectio

on is based on
n current com
mparison. It ca
an be used to
o protect
transformers, generato ors, motors, lin
nes, or busbaars.
The differrential protection zone is lo

ocated precise
ely between t he current tra
ansformers. T
This ensures a absolute
selectivity
y. Tripping only occurs in re
esponse to internal faults. Protection re
emains stable in the face off
external faaults.
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13
3.3 Ope
erating Cha
aracteristic
c
Idiff = Ip - Is
ID>> Characteriistic
Sum
Trripping
Blocking
Saturation
er /
Tap change
Leakage
ID>
Magnetizattion
Ibias = Ip + Is
The opera ating characte

eristic represe
ents the ratio between stab
bilizing curren
nt (Ibias) and differential currrent
(Idiff), whic
ch causes trip
pping.
acteristic has to be configu

The chara ured so that it is always gre
eater than the
e total faults o
occurring (e.g.,
magnetiza
ation, scatter,, etc.).
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3.4 Testt Object, Device
D
OMICRON N's Ohm's law w stipulates th

hat all data haas to be enterred in the Tes
st Object as a first step. T
The fields
for the RIO
O function De evice are com mpleted in thee usual way. HHowever, the fields for the voltage and ccurrent
transformers are only needed
n to tes
st additional protection
p funcctions (such a
as definite tim
me emergencyy
overcurrent protection, for example)) The Advanc al test module
ced Differentia es use the RIO O function
Differentiial in addition
n to the RIO fu
unction Devic ce.
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13
3.5 Testt Object, Differential
D
nction menu you can add the RIO function Differenttial by selectiing Add.... Tw
In the Fun wo options arre
available but we are no ot going to co
onsider the sin ngle-phase te est module in our example,, therefore, yo
ou
ck the Edit... button to calll up the test object
should clic o definitio
on.
Note: The Edit (single

( phase)... button is s used for sing
gle phase ele
ectro mechaniical differentia
al relays
only. It is used
u for the Differential
D tes
st module. Hoowever the fo
ollowing chaptters refer to th
hree
phase diffferential relay
ys.
Diffe
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13.5.1 Protected Objject
On this taab you need to o make a num mber of data entries

e assoc iated with the
e Protected O Object. In ourr
example, this is a YYnD5 transformer. The corresponding datta can be see en on the scre eenshot. The
following entry
e fields arre listed:
> Prote ected Object:: The protecte ed object can be a transforrmer, a generrator, a motorr, or a busbarr. This
selecttion determine es the functio
onality of the subsequent
s e
entry fields.
> Numb ber of Windin ngs: If a transsformer has been
b selected
d as the proteected object, yyou can specify here
whethher it has two or three wind dings.
> Winding/Leg Nam me: You can enter
e a name of your choicce for each wiinding here.
> Voltage: The trans sformer nomin nal voltage off the correspo
onding windin ng.
> Powe er: The transfo ormer nomina al power of th
he correspond ding winding. Make sure th hat the units a
are
correcct for the ratin
ng of the transsformer. If meega voltamps than use a capital M.
> Vecto or Group: Enter the vectorr group for the e individual w
windings here using the lettters Y (star), D
(delta
a), and Z (zigz zag). You also o need to speecify the phasse offset identtifier for the se
econdary winding
and, if there is onee, the tertiary winding.
w
> Starp point Ground ding: Specify which starpoints are groun nded here. Thhis is of coursse only possib ble if the
corressponding wind ding is star-co
onnected.
> Curre ent: The curre ent of the rele
evant protecteed object is enntered here. TThis value is calculated
autommatically.
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Note: If you wish
h to test a YY
Y transformer,, it is always a
assumed thatt the transform
mer has a
compensa ation winding..
13.5.2 CT
The data for the curren

nt transformerr is entered on this tab.
> CT No ominal Values s:

- Primary Curre ent: Primary-s side nominal current of the
e current transsformer at the
e relevant win nding of
th
he protected object.
o
- Secondary Cu urrent: Secon ndary-side no
ominal currentt of the currennt transformer at the releva ant
winding
w of the protected objject.
- Starpoint Gro ounding: The position of th he CT ground ding is specifie
ed here.
> Use Ground
G Curre ent Measure ement inputs (CT): If the p protection relaay's ground current inputs are
being used, you ne eed to select this
t here. How
wever, you wwill only be ablle to make thiis selection if a
oint is grounded.
starpo
> Ground CT Nomin nal Values: The
T correspon nding nomina al values of the ground CTss used have tto be
speciffied here. Howwever, setting gs can only bee made on thhe windings off the protecte
ed object on w which the
starpo
oint grounding g is in place.
Diffe
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13.5.3 Protection De
evice
Please refer to the rele

evant relay ma
anual for inforrmation abou
ut which Ibias
s Calculation the protectio
on relay
escription of each
uses. A de e type app
pears in the Help,
H as show
wn below.
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The No co ombined cha aracteristic function
f is req
quired for prottection relayss with single-p
phase trip commmands
where the e healthy phas
ses do not trip
p. If the relay combines the e trip commands of all thre ee phases in one
signal, the
en single phase faults mayy lead to two phase
p faults i n the non fauulty phases. TThis is due to the
calculatedd zero sequennce eliminatio
on. As most digital relays u use the combiination of all p phase trip commmands
as well ass the zero seq
quence eliminnation, this check box has tto remain clea ared in most cases.
Fault currrents cease to

o be output fo
or the relevantt test point at the latest wh
hen the Test M
Max time elap
pses.
The Delay y Time is the time between two test poiints.
es of Idiff> an
The value nd Idiff>> resp
pectively are defined for th
he Diff Current Settings.
The Reference Windin

ng is used to convert all measured
m qua ntities to a sin
ngle winding.
The Reference Curren nt is the curre

ent referenced d by the Diffe
erential Curreent Settings and, subsequently,
by the cha
aracteristic also. This is eitther the CT no
ominal currennt or the prote
ected object'ss nominal currrent.
D Time Setttings from the

You have to take the Diff e current prottection relay p
parameter se
ettings and en
nter them
here.
If Zero Se
equence Elimmination has been activateed in the prote
ection relay to
o be tested, yyou have to configure
the corres
sponding settings in the Te
est Object.
ample, the terrtiary winding is not connec

In our exa cted, so the e
equivalent circcuit diagram looks like this:
42
4 MVA
10.5 kV
160 MVA 2400/1
2
400/1 231 kV
nnected
not con
600/1
118 MVA
115.5 kV
Diffe
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Note: When there are different nominal po
owers for eac h winding, the
e nominal currrents are nott same.
That means when one winding leads the nomina l current, the other windingg cannot lead d
nominal current.
nal current on
For nomin n the primary side
s the curre
ents will be:
42 MVAA
10.5 kV
V
160 MVA
VA 2400/1
400/1 231 kV
V
400 A not connected
d
800
0A
600/1
118 MVA
115.5 kV
1.00 A 1.33
3A
Δ
nal current on
For nomin n the seconda
ary side the cu
urrents will be
e:
42 MVAA
10.5 kV
V
160 MVA
VA 2400/1
400/1 231 kV
V
295 A not connected
d
590
0A
600/1
118 MVA
115.5 kV
0.74 A 0.98
8A
Δ
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13.5.4 Ze
ero Sequenc
ce Eliminatio
on IL - I0
IP IS
⎡ +2⎤ ⎡ +3⎤
⎢ ⎥ 1 ⎢ ⎥
IP = ⎢ −1⎥ I0 = ( IL1 + IL2 + IL3 ) IS = ⎢ 0 ⎥
3
⎢⎣ −1⎥⎦ ⎢⎣ 0 ⎥⎦
⎡ +2⎤ ⎡0 ⎤ ⎡ +2⎤ ⎡+3⎤ ⎡ +1⎤ ⎡+2⎤

⎢ ⎥ ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ ⎢ ⎥
IP′ = IP − IP0
P = ⎢ −1⎥ − ⎢0 ⎥ = ⎢ −1⎥ IS′ = IS − IS0 = ⎢ 0 ⎥ − ⎢ +1⎥ = ⎢ −1⎥
⎢⎣ −1⎥⎦ ⎢⎣0 ⎥⎦ ⎢⎣ −1⎥⎦ ⎢⎣ 0 ⎦⎥ ⎢⎣ +1⎥⎦ ⎢⎣ −1⎥⎦
⎡ 2⎤ ⎡ 2 ⎤ ⎡ 4 ⎤ ⎡ +2 ⎤ ⎡ +2⎤ ⎡0 ⎤
⎢ ⎥ ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ ⎢ ⎥
IBias = IP′ + IS′ = ⎢ 1⎥ + ⎢ 1⎥ = ⎢ 2⎥ IDiff = IP′ − IS′ = ⎢ −1⎥ − ⎢ −1⎥ = ⎢0 ⎥
⎢⎣ 1⎥⎦ ⎣⎢ 1⎥⎦ ⎢⎣ 2⎥⎦ ⎢⎣ −1⎥⎦ ⎢⎣ −1⎥⎦ ⎢⎣0 ⎥⎦
alse tripping of
To stop fa o the differential relay in re
esponse to a ssingle-pole exxternal fault, yyou need to u
use what
is known as
a computatio onal zero seqquence elimination.
Diffe
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13.5.5 YD Interposin
ng Transform
mer
This diagrram shows ho ow a YD interrposing transfformer works.. Interposing ttransformers compensate the
effects of the zero sequuence as well as the effectts of vector g roups. This m
makes the usee of single phase
differentia
al relays possible.
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13.5.6 Characteristic
c Definition
On this ta
ab you define the operating
g characteristiic for the prottection device
e. The characcteristic can co
omprise
one or a number
n of line
ear elements..
The value
es for Idiff> an
nd Idiff>> are
e taken from the
t previous ttab automaticcally.
Every line
e is defined byy a Start poinnt and an Endd point. Thesse two elements have to be entered as a pair of
values comprising Ibiaas and Idiff. Iff the Auto-init Start point function is ussed, when a n
new line is cre
eated,
the end point
p of the prrevious line is
s automatically used as the
e Start point. The slope off each line is
calculated
d and displaye ed.
The start and end points have to be calculated ba

ased on the rrelay parametters.
Diffe
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13.5.7 Operating
O Cha
aracteristic for
f a typical diff relay.
Line e equations:
I : IDiff = 0.25 ⋅ IBias
II : IDiff = 0.5 ⋅ ( IBias − 2.5 )
P2:
I = II
0.25 ⋅ IBias = 0.5 ⋅ ( IBBias − 2.5 )
0.25 ⋅ IBias = 0.5 ⋅ IBiaas − 1.25
1.25 = 0.25 ⋅ IBBias
1
IBias = 5
Use Ibbias = 5 in I:
IDiff = 0.25 ⋅ IBias
= 0.25 ⋅ 5 = 1.25
5
P3:
Use IDDiff = 6 in II
6 = 0.5 ⋅ IBias − 1.25
7.25 = 0.5 ⋅ IBias
IBias = 14.5
The graph
h shows the operating
o characteristic of a typical diff rrelay. The cha
aracteristic is defined by tw
wo line
segmentss and the preddefined set va alues "Idiff>" and
a "Idiff>>". The line segm ments are deffined by parameters
which can
n be set in the
e protection re elay. In our exxample, these e are:
> Segm ment I:
- Root:
R Ibias = 0 · In | Idiff = 0 · In
- Swell: m = 0.25 5
> Segm ment II:
- Root:
R Ibias = 0 · In | Idiff = 2.5
2 · In
- Swell: m = 0.5
You have to use the lin

ne equations to he remaining points definin
t calculate th ng the characcteristic. The ffigure
shows the
e calculations
s you need to do this.
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13.5.8 Characteristic
c Input for a typical
t diff re
elay
The resultting operating

g characteristic is shown here.
Note: When deffining the operating charac cteristic you do

o not have to
o define any line segments for the
set values
s "Idiff>" and "Idiff>>".
" Thesse parameterrs are taken innto account aautomatically when
the operatting characteristic is tested
d.
Diffe
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13.5.9 Harmonic (2nd Harmonic))
On this ta
ab you define the characterristic for harm monic restraintt. You have to
o start by spe
ecifying which
h
harmonic component this setting is to apply for. The T characterristic is defineed in the same way as the
operating characteristic
c for the differrential functio
on.
The 2nd harmonic

h is ch
haracteristic of
o the switch-on operation of a transform
mer (inrush).
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13.5.10 Harmo
onic (5th Harrmonic)
Stabilizing
g of the 5th ha
armonic preve
ents false trip
pping of the trransformer diffferential prottection in the event of
over-excittation.
13.5.11 Using the XRIO co

onvertor
As stated earlier, the XRIO
X convertoor do all of this automatica lly. The only tthing you havve to do is to ttype in
the setting
gs from the se etting sheet in
nto the releva ant parameterr fields in the appropriate X XRIO convertor.
In this exa
ample, we will use the XRIO convertor for f the SEL38 87 diff relay.
Step 1 willl be to use th
he File – Impoort menu items in the test o object and the en with the oppen dialog boxx,
navigate to
t an approprriate XRIO file e for use. In thhis case, it wi ll be XRIO coonvertor for th
he SEL387 difff relay.
Diffe
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Fill in the General, Transformer Data and Relay Data
D pages, yyou take the vvalues directly from the se
etting
sheet.
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This is ab
bsolutely all yo
ou do, the corrrect characte
eristics and evverything else
e you need, w
will be set up b
by the
software automatically
a .
Diffe
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13
3.6 Glob
bal Hardwa
are Configuration
Once you have defined

d the Test Ob
bject, you hav
ve to configurre the settingss for the Hard
dware Config
guration
in accorda
ance with OM
MICRON's Ohm's law.
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13.6.1 Output
O Config
guration
Six curren
nts but no volttages are req
quired for the example sele
ected here, w ith one three--phase system
m for the
primary siide and anoth
her for the seccondary side.
Diffe
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13.6.2 Analog
A Outpu
uts
Current sy
ystem A is co
onfigured for the primary side and curren
nt system B ffor the second
dary side.
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13.6.3 Binary / Analo
og Inputs
In practice
e the OPEN command
c has
s to be entere
ed and tested for all windin
ngs here. How
wever, for reasons of
nd is used in our example..
transparency, only the Trip comman
13.6.4 Binary Outputts
Binary outputs are not required for the

t subseque
ent tests.
Diffe
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13
3.7 Diffe
erential Test Object and
a Hardw
ware Config
guration Ex
xercise
> Openn a new test template.
t
> Import the XRIO convertor
c forr the SEL3877 relay.
> Enterr all required values in th
his function. Use the relay
y's setting s heet for this purpose.
> Makee the settingss for the hard
dware configguration.
> Save the test template.
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14 Advanced
A d Differen
ntial Conffiguration
n
14
4.1 Prefface
The configguration test is used to che
eck the stability of the conn
nected differe
ential system.. A fault outsidde the
protection
n zone is alwaays simulated and the diff and
a bias curre ents are checcked. The diffferential functtion must
not causee tripping durin
ng the test.
You need to add a Difff Configuration

n test module
e to the OCC file to test the
e differential ffunction.
Advvanced Differentia
al Configuration C.0047.AA
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14
4.2 Advanced Diffferential Co
onfiguratio
on, Binary Out
This screeenshot shows s the Test Vie

ew. The prote
ected object's single-phasee equivalent ccircuit diagram
m is on
the right-h
hand side. In our example, an external fault
f has been
n set on the p
primary side, wwhich draws power
from the secondary
s sid
de.
The Binary Out tab ca an be seen on

n the left-handd side. Howevver, as no bin were defined in the
nary outputs w
global Hardware Conffiguration, this list is blank
k. If binary ou tputs had bee
en defined, th
hey could be a
activated
and deacttivated here.
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14
onfiguratio
on, Genera
al
1. The Test
T Time has s to be set to leave the tesster with enouugh time to chheck all releva ant measuredd values
in the protection reelay to be testted. In our exaample, set the me, the CMC will stop
e time to 60 ss. After this tim
injectiing the curren
nt into the rela
ay, but the tes
st will keep onn running, until you make a an assessme ent.
2. In the
e event of an OPEN
O comma and while the
e test is runnin
ng, the test w
will automatica ally be assesssed as
Failedd.
3. You can
c set the fau ult location an
nd the infeed location here e.
Note: In our exa

ample, the fau
ult has to be set
s on the seccondary side.
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14
onfiguratio
on, Test Da
ata
In our exa
ample, three times
t the refe
erence current is defined ass the fault currrent in phase
e L1.
The corre
esponding currrents on both
h sides of the transformer a d automatically by the test module
are calculated
and show o the screen.
w on the right of
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14
onfiguratio
on, Test
Once the test has startted, you have

e to read out the latest currrent values on
n the protectio
on relay and e
enter
them on the Test tab. If
I these value
es are correct, you must asssess the testt manually witth Passed.
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14
onfiguratio
on Exercis e
> Add a Diff Config
guration test module to th he test templlate for differrential testin
ng.
> Simulate a line-ne
eutral fault to
o test the sta
ability of the differential ffunction.
> Copy
y the test mod dule and reppeat the test for 3-phase ffaults.
> Save your test doocument.
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15 Advanced
A d Differen
ntial Operrating Characteris
stic
15
5.1 Prefface
You can use
u this test module
m to testt the operating characteris tic of a differe
ential relay. Id
diff/Ibias pairrs of
e used to testt whether the protection relay is tripping
values are g in accordancce with the ch haracteristic. TThe
tolerances
s entered are
e used for auto omatic assessment. Two ttest modes arre available: S Shot and Sea arch.
A Diff Ope acteristic test module is add

erating Chara ded to the tem
mplate.
al Operating Cha
aracteristic C.0047.AA
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15
5.2 Advanced Diffferential Op
perating Characteris
C stic, Generral
If you nee
ed to, you can
n define a Preefault on this tab. It is also where you sp pecify the neccessary Trigg
ger
Conditionns. Under Test Method yo ou can select whether the nominal charracteristic sho ould be ignore
ed during
a Search Test. This fuunction is simiilar to the corrresponding o ption in the A
Advanced Distance test mo odule.
The opera
ating characte
eristic is show
wn on the righ
ht-hand side.
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15
C stic, Shot T
Test L-E
With the Shot

S Test you u can define the
t individual test points e ither directly b
by clicking wiith the mouse
e in the
c diagram or by entering th
operating characteristic es in the Idiff and Ibias fiellds.
he coordinate
A characteristic can be
e tested by plaacing one tes
st shot above and one belo ow the start an
nd the end off each
segment of t tolerance overlapping o
o the charactteristic. Also the of the differen
nt segments o of the charactteristic
has to be considered.
You also have to speciify the fault lo

oop to be teste
ed under Fau
ult Type.
al Operating Cha
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15
C stic, Shot T
Test L-L
When the
e fault loop is changed
c from
m L-E to L-L or
o L1-L2-L3, th
he shape of th
he operating characteristicc
changes dependent
d up
pon the type of
o protection relay.
r
Because of
o this, the tes
st points have
e to be redefined.
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15
C stic, Search
h Test
With the Search

S Test you
y can add search
s lines which
w are deffined by their bias current. During the te
est a
search alg
gorithm will be e used on eveery search lin
ne to determin
ne the exact p position of the
e characteristtic. The
Resolutioon of this testt can be defined in this tab as well.
al Operating Cha
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15
perating Exercise
> Add a Diff Operatting Characte
eristic test module
m to the
e test templa
ate for differe
ential testing
g.
> Perfo
orm shot andd search tests
s for single- and three-ph
hase faults.
> Save your test do
ocument.
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16 Advanced
A d Differen
ntial Trip Time
T and
d Harmon
nic Restra
aint
16
6.1 Advanced Diffferential Trrip Time
16.1.1 Advanced
A Diffferential Trip
p Time, Facto
ors
On the Fa
actors tab you can define current
c and time tolerance
es that differ frrom those in the test obje
ect. In
our example, however,, the settings in the Test Object
O are suffficient.
al Trip Time and Harmonic Restrraint C.0047.AA
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16.1.2 Advanced
p Time, Gene
eral
You can define

d a Prefa
ault on this ta
ab. It is also where
w you can
n specify the ttrigger cond
ditions.
A t/Idiff dia
agram will latter appear on the Test tab. This diagramm is defined b
by the test line
e on the Ibiass/Idiff
plane. We e advise you not
n to change e the default setting
s for the
e Slope of the
e test lines.
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16.1.3 Advanced
p Time, Test
To test the
e trip times, place
p one testt point above the Idiff> pickk-up and one
e above the Id
diff>> pick-up..
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16
6.2 Advanced Diffferential Ha
armonic Restraint
You can use
u this test module
m to testt the harmonic restraint of a differential relay.
16.2.1 Advanced
A Diffferential Harrmonic Restrraint, Genera
al
The Gene eral tab features an option to activate a Postfault wi thout harmon
nics. It is also where you sp
pecify
the Trigge
er Condition ns.
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16.2.2 Advanced
A Diffferential Harrmonic Restrraint, Shot Te
est
With the Shot

S Test you u can set you
ur test points either
e by clickking the test p
plane at the right hand or b
by
entering the differential and the harm
monic currentt manually.
In our exa
ample, you ne
eed to select fault
f type L1L
L2L3.
You also have to speciify the ordinall number of th

he harmonic tto be tested. IIn our example, the 2nd ha
armonic
is to be te
ested.
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16.2.3 Advanced
A Diffferential Harrmonic Restrraint, Search
h Test
With the Search

S Test you
y can set search
s lines which
w are defi ned by their d
differential current. During the test
a search algorithm
a will be used on every
e search line to determ
mine the exacct position of tthe characteriistic.
The searcch resolution can
c be define ed in this tab as
a well.
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16
6.3 Advanced Diffferential Trrip Time an
nd Harmon
nic Restraint Exercise
> Add a Diff Trip Tim
me test module to the tes st template ffor differential testing.
> Test the
t trip time for three-phase faults.
> Add a Diff Harmonic Restraint test module e to the tempplate.
> Test the
t relay's haarmonic resttraint for the
e 2nd harmon nic with a sinngle-phase a and a three-p
phase
test.
> Repeat these step ps for the 5th
h harmonic.
> Save your test doocument.
AX | v2.00
17 Transduce
T er
17
7.1 Prefface
Due to thee high accuraacy of the voltage and curre
ent outputs, t he CMC test equipment le ends itself to tthe
testing of electrical measurement tra ansducers. The low level o
output signal of the transdu
ucer is measu ured by
the dedicaated DC analo ogue input. Transducers
T c be tested by making usse of the transsducer test m
can module.
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17.2 Test Module
The above e screenshot shows the most

m importantt views of the test module: the Test Vieew and the Errror
Curves View
V . To make e the screens
shot more commplete, the Te est object hass been set up
p, however, be efore
starting th
he actual test,, the Test Ob
bject and the Hardware Co onfiguration have to be se et correctly, a
also to
comply with the Omicro on ohm’s law.
Tran
nsducer C.0047.AA
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17
7.3 Tran
nsducer RIIO Function
When opeening the Tes st Object and there is no Trransducer RIO
O function, th
hen one can b
be inserted ass
described
d in section 13
3.5 (P165).
As the scrreenshot above demonstra ate, you have e to make certtain choices.
1 – Here you hav ve to select th
he functions the
t transduce er is capable o of testing.
2 – Type the min nimum input in nto the transdducer and wh hat value the ttransducer wiill then give out.
3 – Type the maximum input into the transducer and wh hat value the transducer w will then give o
out.
4 – select this boox if the function in the tran
nsducer has a symmetrica al characteristtic.
5 – See to it thatt you select all the tabs and d populate alll of them with
h the appropriiate values.
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17
7.4 Tran
nsducer Lo
ocal Hardw
ware Config
guration
The Local hardware co onfiguration is
s the same in the General ttab and in the
e Analog Outp puts tab. You
u will
notice tha
at the Hardware Configurattion screen do oes not even present you w with the Binary/Analog Ouutputs
tab. Makee sure in the DC
D Analog Inp puts tab that the
t current orr voltage inpuut Signal you w
want to use iss
available. In our exampple we will maake use of the
e Current Inpu
ut signal.
Tran
nsducer C.0047.AA
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17
7.5 Testting the Transducer
The easie
est way to gett a few test po
oints in the Te
est view, is to use the “Add
d Multiple…” bbutton, this w
will
present yo
ou with a scre
een where yo ou type in the amount of tesst points and then click on the Add to ta
able
button.
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17
7.6 The Settings Tab
T
On the se
ettings tab, yo
ou can select different
d functions of the ones that was set up in the Test Object tto be
tested.
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nsducer C.0047.AA
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18 Synchron
S izer
18
8.1 Prefface
When con nnecting a generator to the e network, thee synchronizin ng relay has tto control starrting up the generator
and switching it onto thhe network at the right poinnt in time. Thee relay commmonly used forr this duty gives a
three-fold check, i.e. ph
hase angle, voltage
v differe
ence and freq uency differeence.
The relay sends a clos se signal to the breaker when all of the vvalues fall witthin the set lim
mits and main ntain
these valuues for a userr-defined period of time. If any of the coonditions are nnot met, some e synchronizing
relays usee adjustment commands which w are sentt to the valve actuators of tthe generatorrs in an attem mpt to
achieve thhe proper con her cases where the condiitions are not met, the rela
nditions. In oth ay provides a fault
signal.
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18.2 Synchronizer Test
T Module
e
When ope ening the Synnchronizer Test Module, yo ou will notice tthat in the Te
est View, there
e are four tab
bs, three
of them are the three different
d tests that can be performed
p by this test mod dule.
Other imp
portant views in this Test Module
M is the Sync
S View annd the Synchrronoscope View.
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18.3 Test Object
O
Before thee test can be performed, it is important to adhere to tthe Omicron o
ohm’s law. So
o the Test Ob
bject has
to be set up
u first of all.
By editingg the Synchroonizer RIO funnction, it will be

b noticed tha at the function
n consist of m
mainly two inpu
ut
pages.
The first page
p is wheree the setup of the two syste ems that have e to be synch ronized is done. Here the user will
have to seet up System one and two, so that when e done, they must be able
n the tests are e to mimic the real
system. Take
T special note
n of the phase rotation and
a the conne ected phasess.
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The secon nd page is wh
here the settin
ngs of the rela
ay have to be
e put in. This iis where you set up the window
for the syn
nchronizing device.
d
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18.4 Hardw
ware Configuration
The Geneeral tab in the hardware co onfiguration is not different to other harddware configu urations. In the
e Analog
Outputs ta
ab however, it can be notic ced that the software
s sugggest a certain name alreadyy and it is verry
important that you takee note of this and
a make the e right decisioon regarding tthe selection here, becausse it is
important to note that system
s 1 will be fed from thhe first voltag
ge output, butt it might repre
esent a phase e to
phase value. The same e goes for sys stem 2.
Also take very well note of the Binarry / Analog Inputs Tab, beccause here as well, the sooftware suggeest
certain na
ames and it is important to know that the e Test Modulee Input Signa
al name is linkked to a speciific
functionality.
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The Binarry Outputs Ta
ab as well. The test module
e has the abil ity to – at som
me point durin
ng testing – simulate
a start clo
ose commandd.
18.5 Testing the Relay

It has to be
b noted that the user cann not put tests in the Functio
on and the Adjjustment and d the Auto Tesst
functions. These functions can only be used one at a time. In other words, if you have te ests in the Fu
unction
test tab, th ware will not allow you to also put tests i n one of the o
hen the softw other tabs.
18.5.1 The Settings Tab

T
On the se
ettings Tab, th
he most imporrtant setting is
s the Max-syn
nc setting.
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18.5.2 The Function Test
The Function test can almost

a be commpared with a shot test in the Advanced Distance te est. In this test, the
user set up
u static pointts for system 1 and 2 that will
w be injecteed into the rela
ay as is, the rrelay should tthen
either rele
ease a close command
c or block the clos
se, dependingg on where thhe test point w
was placed.
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18.5.3 The Adjustme
ent Test
The Adjus stment Test is s a more dyna amic test, with h interaction ffrom the relayy. The relay h has 4 outputs that
need to be e monitored for
f this test the first contact is what the rrelay activate e if it wants to raise the volttage, the
second on ne is what thee relay activatte if it wants to lower the vo oltage, the otther two conta acts are the ssame,
but for the
e frequency.
The CMC C will inject sys
stem 1 into th
he relay as it is on the syste em 1 section on the screen. System 2 w will then
react to th
he inputs fromm the relay. Syystem 2 will start
s it’s inject ion on the pooint as specifieed in the test line,
then these e values chan nges accordin ng to the inputs and chang ge the injection values acco ordingly.
The CMC C also monitorrs the close pu ulse and whe en the relay re eleases the cllose pulse, th hen the softwa are
evaluates s the test.
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18.5.4 The Auto Testt
The Auto test is exactly

y what the na ame suggests s. Once again , system 1 wiill be injected as a static va alue.
System 2 has a start point and an ende point. Sys stem 2 will sta
art with the injjection of the start point va
alues
into the re
elay and then it will automa e specified ratte of change, move toward
atically, at the ds the System m2
endpoint. The only inpuut that gets monitored
m heree is the close command input. The test gets evaluate ed as
soon as thhe close command is activ vated and then the locus ha ave to be insiide the windo ow.
18
8.6 Synchronizer Relay Exerrcise
> Openn the Synchroonizer test Module.
M
> Set up the Test Object
O and thee Hardware configuratio
c n.
> Test the
t relay with the Functio on test wherre you have ttest points in
nside as welll as outside of the
windoow.
> Test the
t relay with the Adjustment test with 2 tests wh here your staart point is w
well outside tthe
windoow.
> Test the
t relay with the Auto Test
T where th
he start pointt and the endd point form a vertical lin
ne.
> Save the test.
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OMICRON Academy

Power System Protection Testing with the CMC Test

Date (yyyy-mm-dd) Version Changes Name

Actual Version 2.00

© OMICRON 2011. All rights reserved. This document is a publication of OMICRON.

© OMICRON Academy 2014

Content C.0047.AAX | v2.00

C.0047.AAX | v2.00 Content

Content C.0047.AAX | v2.00

C.0047.AAX | v2.00 Content

Content C.0047.AAX | v2.00

2. The persons doing so must adhere to the Op

Remember: You are re

Impedance and dire ectional overc

Figurre 1-1: Four pole

6. Ensuree that the CT test plug is fittted with shorrting strips be

7. Ensurre that the VT

The start page of the Test

Starrt Page C.0047.AA

Genneral test moodules:

Deddicated test modules:

Simmulation mod dules:

s test module provides a m

Thiss CB configurration test mo dule simulate

Use the OCC

Starrt Page C.0047.AA

TransPlay: This tool iss used to play

EnerLyzeer: The EnerLLyzer test tooll provides a means

w: You can use

Harmonic cs: You can use

O Monitor: A clear overvie

O/C Charracteristics Grabber:

Starrt Page C.0047.AA

This program is used to o define the voltage

2.4.1 est Set Asso

If you are using a CMC C test device with

Starrt Page C.0047.AA

d that you are unable to ass

Starrt Page C.0047.AA

This is whe ere existing

All licenses for the

These testt modules

The licensses associate

Starrt Page C.0047.AA

here you can change the user language

Note: Manual te ext entries (e.g

> Tutorrials: Videos demonstrate how to get sttarted with the

> Tips & Tricks: You can access

> Contaacts: Click he

> What's New?: The

Starrt Page C.0047.AA

You will also

You can share

Starrt Page C.0047.AA

This test module

However, before you can

In accorda MICRON's Ohm's law, we start

Quicck CMC C.0047.AA

The Test Object can be

You can enter

Quicck CMC C.0047.AA

Debounc ce of input siggnals:

Deglitch of input sign nals:

Note: The debounce and deg