Beruflich Dokumente
Kultur Dokumente
Digital Logic:
Boolean Algebra, Basic and Universal Logic gates, Half adder, Full adder, Simplification of logic
expressions using K-maps, Multiplexer, De-multiplexer, Encoder and Decoder.
BOOLEAN ALGEBRA
George Boole in 1854 invented a new kind of algebra known as Boolean algebra. It is sometimes
called switching algebra. Boolean algebra is the mathematical frame work on which logic design
based. It is used in synthesis & analysis of binary logical function.
Laws of Boolean Algebra:
1. 0’=1
2. 1’=0
3. If A=0, A’=1
4. IF A=1, A’=0
5. A’’=A
6. A.0=0
7. A.1=A
8. A.A=A
9. A.A’=0
10. A+0=A
11. A+1=1
12. A+A=A
13. A+A’=1
14. A+AB=A(1+B)=A
15. A+A’B=A+AB+A’B=A+B(A+A’)=A+B
LOGIC GATES
• It is an electronic circuit which makes logic decisions. A logic gate is a digital circuit with
one or more input signal and only one output signal. All input or output signals either low
voltage or high voltage. A digital circuit is referred to as logic gate for simple reason i.e.
it can be analyzed on the basis of Boolean algebra.
• To make logical decisions, three gates are used. They are OR, AND and NOT gate. These
logic gates are building blocks which are available in the form of IC.
• The input and output of the binary variables for each gate can be represented in a tabular
column or truth table.
1. OR Gate: The OR gate performs logical additions commonly known as OR function. The OR
gate has two or more inputs and only one output. The operation of OR gate is such that a
HIGH(1) on the output is produced when any of the input is HIGH. The output is LOW(0) only
when all the inputs are LOW.
• If A & B are the input variables of an OR gate and c is its output, then A+B. similarly for
more than two variables, the OR function can be expressed as Y=A+B+C.
• Logical Symbol:
A
Y
B
Truth table
Input Output
A B Y= A+B
0 0 0
0 1 1
1 0 1
1 1 1
D 1
X
F
Y
R L
D 2
2. AND Gate : The AND gate performs logical multiplication, commonly known as AND
function. The AND gate has two or more inputs and a single output. The output of an AND gate
is HIGH only when all the inputs are HIGH. Even if any one of the input is LOW, the output will
be LOW. If a & b are input variables of an AND gate and c is its output, then Y=A.B
Logic Symbol
A
Y
B
Truth table
Input Output
A B Y=A.B
0 0 0
0 1 0
1 0 0
1 1 1
Realization of AND gate using diodes
• Two input AND gate using "diode-resistor" logic is shown in figure below. Where X, Y
are inputs and F is the output.
+Vcc
+Vcc
R L
D 1
R L
X D 1 F
X F
Y
Y D 2
D 2
Fig 5.2AND gate using diodes
3. Not Gate ( Inverter): The NOT gate performs the basic logical function called inversion or
complementation. The purpose of this gate is to convert one logic level into the opposite logic
level. It has one input and one output. When a HIGH level is applied to an inverter, a LOW level
appears at the output and vice-versa.
4.NAND Gate: The output of a NAND gate is LOW only when all inputs are HIGH and
output of the NAND is HIGH if one or more inputs are LOW.
A
Y
B
5. NOR Gate: The output of the NOR gate is HIGH only when all the inputs are LOW.
A
Y
B
6.XOR Gate or Exclusive OR gate: In this gate output is HIGH only when any one of the
input is HIGH. The circuit is also called as inequality comparator, because it produces
output when two inputs are different. When both the inputs are high, then the output is
low.
A
Y
B
7. XNOR Gate or Exclusive NOR Gate: An XNOR gate is a gate with two or more inputs
and one output. XNOR operation is complimentary of XOR operation. i.e. The output of
XNOR gate is High, when all the inputs are identical; otherwise it is low.
A
Y
B
Theorem 2: It states that compliment of sum of two variables is equal to product of compliment
of two individual variables.
X Y X Y
1. RealizeEXOR Gate using only minimum NAND Gates
A Sum
H a lf A d d e r
C arry
B
Logic Expression :
A Sum
B F u ll A d d e r
C arry
C in
Truth Table for Full Adder
Example
Using Boolean algebra techniques, simplify thisexpression:
1) a 0 yyy
14) xyx y
2) a0
15)
3) aa 16 xyx
)
9) (ab)(a b)
For (11),(12),(13),
f(a,b,c)abc 24) w(wxyz)
11) f(a, b, ab) 25) xzxyzy
12) f(a,b,ab) 26) (x z)(x y)(z y)
13)f[a,b,(ab)] 27) x y xyz
1) a0 a
2) a0 0
3) aa 1
1) a a a
5) aaba(1 b) a
6)aab(aa)(ab)ab
7) a(a b) aaabab
8) ababb(a a) b
9) (ab)(ab)aaabbabbaababa(1bb)a
10) a(a b c ...) aaabac ... a abac ... a
11) f(a, b, ab) a b aba b
12) f(a,b,ab)abababa1
13) f[a,b,(ab)]ab(ab)abab 1
14) y yy y
15) xyx y x( y y) x
16) xyxx(1 y) x
17) (wx y z) y
y18) (x y)(x y)
x19)w[w(wx)]w
20) x[x (xy)] x
21) (x x) x
22) (x x) 0
23) w(wxyz)w(1xyz)w
24) w(wxyz)w(wxyz)w
25) xzxyzyxzxy
26)(xz)(xy)(zy)(xz)(xy)xyxz
27) xy xyz x y z
Draw a logic circuit for (A + B)C.
Soln:
Soln:
Soln:
Soln:
MULTIPLEXER (MUX)
MUXTypes
2-to-1(1selectline)
4-to-1(2selectlines)
8-to-1(3selectlines)
16-to-1(4selectlines)
The basic multiplexer has several data input lines and a single output line and hence the
name ‘Many to One’.
2:1 Mux
2:1 Mux contains 2 input lines, 1 select line and one output line
Logic Symbol
Truth Table
S0 S1 Y
0 0 D0
0 1 D1
1 0 D2
1 1 D3
S0 S1
Logic Expression:
No of AND Gates : 04
No of NOT Gates : 02
No of OR Gates : 01
Total Gates : 07
DEMULTIPEXER (De-MUX)
• DEMUXTypes
1-to-2(1selectline)
1-to-4(2selectlines)
1-to-8(3selectlines)
1-to-16(4selectlines)
1:4 DEMUX:
Input = 01
Select lines ‘n’= 2
Outputs = 2n = 4
Logic symbol:
Truth Table:
S0 S1 D0 D1 D2 D3
0 0 X 0 0 0
0 1 0 X 0 0
1 0 0 0 X 0
1 1 0 0 0 X
Logic Expression:
D0=S0’ S1’ X
D1= S0’ S1 X
D2= S0 S1’ X
D3= S0 S1 X
1: 4 DEMUX Circuit:
S0 S1
AND Gates= 04
NOT Gates = 02
ENCODERS:
DECODER
Device which transforms the coded bits to generate the original data again
Multiple inputs multiple output logic circuit
It converts coded inputs into coded outputs, where the inputs and outputs are different
Less inputs with more outputs
It takes in ‘n’ input and gives out 2n outputs
A2 A1 A0 D0 D1 D2 D3 D4 D5 D6 D7
0 0 0 1 0 0 0 0 0 0 0
0 0 1 0 1 0 0 0 0 0 0
0 1 0 0 0 1 0 0 0 0 0
0 1 1 0 0 0 1 0 0 0 0
1 0 0 0 0 0 0 1 0 0 0
1 0 1 0 0 0 0 0 1 0 0
1 1 0 0 0 0 0 0 0 1 0
1 1 1 0 0 0 0 0 0 0 1
In below figure1.1 p-type and n-type semiconductor materials are shown side by side
representing a PN- junction
Fig1.1: At an pn-junction, electrons cross from the n-side to fill the holes in a layer of the p-
side close to the junction.
Since holes and electrons are close together at the junction, some free electrons from the
n-side are attracted across the junction from a region of higher carrier concentration.
The free electrons crossing the junction create negative ions on the p-side by giving some
atoms one more electron than their total number of protons.
The electrons also leave positive ions(atoms with one fever electron than the number of
protons)behind them on n-side.
Barrier Voltage:
Before the diffusion process the n-type and p-type materials will be electrically neutral.
When the negative ions are created on the p-side, the portion of the p-side close to the
junction acquires a negative voltage. Similarly the positive ions created on the n-side give
the n-side a positive voltage close to the junction.
The negative voltage on the p-side tends to repel additional electrons crossing from the n-
side and the positive voltage on the n-side tends to repel additional holes from the p-side.
The initial diffusion of charge carriers creates a barrier voltage at the junction which is
positive on n-side and negative on p-side.
The magnitude of the barrier voltage for germanium is 0.3V and for silicon is 0.7V.
Depletion Region:
Depletion region is also called space charge region.
The movement of charge carriers across the junction leaves a layer on each side that is
depleted of charge carriers.
On the n-side, the depletion region consists of donor impurity atoms that having lost the
free electron associated with them have become positively charged.
On the p-side, the depletion region consists of acceptor impurity atoms that have become
negatively charged by losing the hole associated with them.
If the two blocks of semiconductor material have equal doping densities ,the depletion
layer on each side have equal widths.
If the p-side is more heavily doped than n-side the depletion region penetrates more
deeply into the n-side in order to include an equal number of impurity atoms on each side
of the junction.
When the n-side is more heavily doped, the depletion region penetrates more deeply into
the p-side.
In equilibrium condition, the depletion region gets widened upto a point where further
electrons or holes can cross the junction.
The term Bias refers to the application of external voltage across the two terminals of the
device to extract the response.
1. Forward Bias
2. Reverse Bias
If a voltage applied across the diode has the same polarity across the diode it is
considered as Forward Biasing.
If a voltage applied across the diode has the reverse polarity across the diode it is
considered as Reverse Biasing.
The minority flow of carrier flow of electrons from the p-type material to the n-type
material and of holes from n-type material to p-type material has not changed in
magnitude but the reduction in the width of the depletion region has resulted in a heavy
majority flow across the junction
An electron of the n-type material now experiences reduced barriers at the junction due to
the reduced depletion region and a strong attraction for the positive potential applied to
the p-type material.
As the applied bias increase in magnitude the depletion region will continue to decrease
in width until a flood of electrons can pass through the junction resulting in a exponential
rise in current.
Typically the voltage across the forward biased diode will be less than 1V.
Increasing the battery voltage will increase the number of majority carriers arriving the
junction and therefore increases the current flow.
If the battery voltage is increased to the point where the barrier is greatly reduced a heavy
current will flow and the junction may be damaged from the resulting heat.
.
Fig1.5:Reverse biased PN junction: Internal distribution of charge
carriers under reverse-bias condition
The number of uncovered positive ions in the depletion region of the n-type material will
increase due to the large number of free electrons drawn to the positive potential of the
applied voltage
Similarly the number of uncovered negative ions will increase in the p-type material. The
net effect therefore is a widening of depletion region.
This widening of the depletion region will establish a great barrier for the majority
carriers to overcome effectively reducing the majority carrier flow to zero.
The number of minority carriers, however entering the depletion region will not change,
resulting in minority carrier flow.
The current that exists under reverse bias conditions is called the reverse saturation
current represented by Is or Io.
when the reverse bias on the PN junction is increased, there is only a negligible increase
in the reverse saturation current.
Further increase in the reverse bias voltage reduces a special phenomenon called
“Junction Breakdown”.
Diode Current Equation:
When a diode is subjected to bias there will be a current flow through the diode
depending on bias conditions.
Diode conducts when it is forward biased and there will be a large majority charge
carriers crossing the junction resulting in large current.
Diode stops conduction when it is reverse biased and there will be only minority charge
carriers crossing the junction resulting in a reverse saturation current.
The equation relating pn junction current and voltage levels is called Shockley equation
and is represented as
where
K-Boltzman’s constant=1.38*10-23 J/K
T- Absolute Temperature=(273+Tºc)K
q-change of electron=1.6*10-19 C
By substituting the above values VT can be obtained as
V
T =T/11600
Where as in the reverse biased condition, the diode current ID is almost constant
irrespective of the applied voltage and is almost equal to Io.
The relation between the current through the diode and the voltage across the diode is
given by diode equation.
The diode behavior based on the diode current equation is illustrated in below fig 1.6.
Fig1.6: V-I Characteristics of PN junction diode
The figure1.6 indicates the VI characteristics for a germanium diode and a silicon diode.
From the curve it is clear that cut-in voltage Vγ for a germanium diode is 0.3V and for a
silicon diode is 0.7V.
It is evident from the diode current equation that diode current is sensitive to the device
temperature.
In the forward bias region for a given voltage ,diode current reduces with increase in
temperature and the current shifts to the left.
In reverse bias condition, the diode current increases i.e. I0 doubles for every 10º c rise in
temperature.
Diode Parameters:
The diode parameters of greatest interest are listed below:
1. VF ----- Forward voltage drop/ Cut-in voltage
4. rd-----Dynamic or AC resistance
RD= VD/ ID
Fig 1.7:Determining the DC resistance of a diode at a particular operating
point
The resistance levels in the reverse bias region will naturally be quite high.
In general, the higher the current through the diode the lower is the dc resistance levels.
rd =ΔVD/Δ ID
where Δ signifies the finite change in the quantity.
Pd= Vf *If W
To avoid overeating and damage of the device, the maximum safe value of power
dissipation is specified which is denoted as Pd(max).
At higher temperatures, as the device junction temperature is higher it can dissipate
less power. Thus maximum power dissipation of the device must be derated at higher
temperature.
Ideally, a diode is (a) a perfect conductor when it isforward biased, (b) a perfect insulator.
when reverse biased, and (c) the transition from conductor to insulator is instantaneous
upon a forward bias/reverse bias switch.
Practical diodes don’t display these ideal characteristics, and this question is related to the
transition (switching) time from conduction to open circuit when the bias is reversed. The
figure below shows what happens when the diode bias is switched from forward to
reverse. At the switch time, the current reverses and stays at a constant level for a period
of time called the storage time, ts.
During this time the diode acts essentially as a short circuit. Then the current decreases to
the reverse leakage current value. This latter time is called the transition time
The sum of the storage and trasition times is the reverse recovery time. It depends on the
forward current, and data sheets give the reverse recovery time along with the test
conditions.
When pn junction is forward biased, a large number of electrons are injected into the p-
material, and a large number of holes are injected into the n-material of the pn junction.
When the diode is then reverse biased, these stored minority carriers must return to the
opposite material. The time it takes for the electrons to move from the p-material back to
the n-material and the holes to move from the n-material to the p-material is the storage
time, and is determined by the geometry of the pn junction.
The reverse recovery times for pn junction diodes are a few microseconds for general-
purpose rectifier diodes such as the 1N4001.
E VD
+E-VD-VR=0
E=VD+ ID VR--------------------(1)
The intersection of load line on the characteristics can easily be determined if one simply
employs the fact that anywhere on the horizontal axis ID=0 and anywhere on the vertical
axis VD=0 and
E=VD+ ID VR
E=0+ ID VR
ID=E/R| VD=0
If we set ID=0 in eqn (1) and solve for VD we get
E=VD+ ID VR
E=VD
VD =E| ID=0
Plotting these points on the diode characteristics and joining the points will give the load
line.
The below figure 16 shows the load line and the point of operation.
E/R
E
Fig 1.17: Drawing the load line and finding the point of operation.
The diode characteristics are placed on the same set of axes as a straight line defined by
the parameters of the network.
The straight line is called load line because the intersection on the vertical axis is defined
by the applied load R. the analysis to follow is therefore called load line analysis.
The intersection of two curves will define the solution for the network and define the
current and voltage levels for the network.
Changing the level of R (the load) will change the intersection on the vertical axis; the
result will be a change in slope of the load line. So we get a different point of intersection
between the load line and the device characteristics.
The point of intersection of the load line and the device characteristics will give the point
of operation for the circuit.
The point of operation is usually called the quiescent point or Q point which is nothing
but still unmoving.
Temperature Effects:
1. Effect of Temperature on the forward voltage drop across a Diode:
Most of the times, the drop across the diode is assumed to be constant. But in few
situations it is necessary to consider the effect of temperature on forward voltage
drop.
The diode voltage drop decreases with increase in temperature.
A diode forward voltage drop at any temperature can be calculated from a
knowledge of VF at the starting temperature(VF1 @ T1) the temperature change (ΔT)
and the voltage per temperature co-efficient(Δ VF/ºc)
VF2= VF1 @ T1 + [ΔT Δ VF/ºc]
Fig 1.18: Effect of temperature on VF
2. Effect of temperature on dynamic resistance :
WKT, the dynamic resistance is expressed as
r`= KT`/ IF
Where T` is the new temperature
New dynamic resistance can be expressed as
r`=26mV/IF[Tº in K/300 K]
As temperature increases VT increases hence dynamic resistance increases.
3. Effect of temperature on reverse saturation current:
IS Varies with temperature, IS doubles for every 10º rise in temperature. When the
temperature of a semiconductor material is raise, increasing the number of electrons
break away from their atoms. This Generates additional minority carriers causing I S to
increase as temperature rises.
The new IS at temperature T2 is given as
AC Equivalent circuits:
Junction capacitances:
The depletion region of a PN junction is a layer depleted of charge carriers situated
between two blocks of low resistance material which is similar to a capacitor. The
junction depletion region clearly has a capacitance.
Depending on the biasing conditions, 2 types of capacitance effects exists in the diode.
They are
i. Transition capacitance (CT) in reverse biased condition.
ii. Diffusion capacitance (CD) in forward biased condition.
2. Diffusion capacitance(CD)
During forward biased condition another capacitance comes into existence called
Diffusion capacitance or storage capacitance.
In forward biased condition, the width of the depletion region decreases. Holes from
P side get diffused into N side while electrons from N side moves into the P side.
As the applied voltage increases, concentration of injected charged particles
increases.
This rate of change of the injected charge with the applied voltage is defined as
diffusion capacitance.
CD=dQ/dV or CD=ΓI/ηVT
Usually CD will be in the order of nF to µF and CT will be pF.
Therefore CD >> CT
CD is very significant when we are considering the fast signals.
Variation of CD with respect to applied forward bias is shown in below figure 21
.
Fig 1.22: Variation of CD with respect to applied forward bias
3. AC Equivalent Circuits:
Reverse biased condition:
a. The equivalent circuit of a reverse biased diode is shown below:
b. It consists of large reverse resistance RR in parallel with depletion layer
capacitance CD .
Fig 1.23: Reverse biased condition
Forward biased condition:
a. The forward biased diode is represented by two parallel circuits as shown
below.
b. The first circuit comprises of forward voltage drop VF in series with dynamic
resistance RD.While the second circuit contains diffusion capacitance CD.