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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
Sample description
This sample shows how:
TU Data can be read easily within the .NET Framework (C#) and
Custom reports can be created (and designed) within a third party reporting component.
The exported document will contain a State Sequencer with multiple shots used to test an under voltage
relay (between two voltages U1 and U2 that are read from XRIO). The external application reads the
exported result data and shows a report with a graphical representation of the trip time depending on the
voltage.
Sample for exporting Test Data to C# / .NET-coded application software
We assume an Undervoltage relay with inverse-time tripping characteristic t,trip = f(V) with V <
Vnom (e.g. AREVA PU321 with characteristic set for inverse-time undervoltage tripping)
Set the max. test voltage Vmax and the min. test voltage Vmin as well as the max. expected trip
time tmax in User Parameters section of Test Object
Run test: 10 voltage shots evenly spaced between Vmax and Vmin will be generated in State
Sequencer
Export the Data to XML
Import in Excel or .NET application
Get graphical representation tact = f(Vtest) of the tripping curve in the external application
Note:
1. The naming of the parameters may differ, according to the registry settings (e.g. VL1-E).
2. The sample documents can be found in the Test Library.
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
6. In Standard ReportCreation Wizard dialog under the ADO.NET item you have a data source
named TestUniverseExport. Select the TestUniverseExport data source and click the ">>"
button to have it in the Selected Tables. Under the TestUniverseExport you can see the tables
contained in the XML document.
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
8. Click Next to select the fields you want to display in your report. After selecting the fields click
Finish.
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
Run the sample to see the result: Go to the Debug menu and click Start Without Debugging.
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
We need to obtain the amplitude of the voltage only for the Undervoltage state and also to remove the
duplicates generated by the adding of the Tact and MeasNumber column (for each value of the voltage
the whole range of Tact values were added)
All odd states are prefault and all even states are fault states so the values corresponding to the
Undervoltage are the ones having the ProgOrderNumber 2,4,6,…
2. Filter the amplitude of the voltage to display only the fault states. Go to the Crystal Reports
menu and open the Report and then click on the Section Expert.
3. Select the Details from Sections and click the formula button besides Suppress(No Drill-Down).
4. In the Formula Workshop dialog write the following formula:
IIF({AnalOutSignal.ProgOrderNumber} = (2*{Seq_Measurement.MeasNumber}), False, True)
and then click the Save and close button.
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
As mentioned above, these screenshots show the randomly generated OCC Demo-mode results.
Testing a real inverse-time relay Tact should result in a gradually decreasing time-over-voltage
characteristic.
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
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OMICRON Test Universe Reporting with Crystal Report in Visual Studio 2005
Support
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possible benefits. If you need any support, we are here to assist you!
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questions. Around the clock – competent and free of charge.
Make use of our 24/7 international technical support hotline: +43 59495 4444.
Additionally, you can find our Service Center or Sales Partner closest to you at
www.omicron.at or www.omicronusa.com.
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