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Introduction
Material classification
Based on the ability of various materials to conduct current, the materials are
classified as conductors, insulators and the semiconductors.
a) Conductors:- These are those materials whose electrical conductivity is very high.
Conductors conduct charges very easily . For super-conductor , the value of electrical
conductivity is infinite.
(b) Semiconductors:- They are those materials whose electrical conductivity lies in
between insulators and conductors . Semiconductors can conduct charges but not so
easily as in case of conductivity.
(c) Insulators:- These are those materials whose electrical conductivity is either very
very small or nil. Insulators do not conduct charges.
The word Nanoscience refers to the study, manipulation and engineering of matter,
particles and structures on the nanometer scale . Important properties of materials, such
as the electrical, optical, thermal and mechanical properties, are determined by the way
molecules and atoms assemble on the nanoscale into larger structures. Moreover, in
nanometer size structures these properties often different then on macroscale, because
quantum mechanical effects become important.
Semiconducting Nanomaterials:
Nanomaterials (diameters in range 1-20 nm) with extremely small feature size has the
potential for wide-ranging industrial, biomedical, and electronic applications. In the
case of bulk materials, relatively small percentage of atoms will be at or near a surface
or interface a relatively small percentage of atoms will be at or near a surface or
interface whereas in nanomaterials, the small feature size ensures that many atoms,
perhaps half or more in some cases, will be near the interfaces. Surface properties like
energy levels, electronic structure and reactivity can be quite different from interior
states and give rise to unique material properties.In recent years more interest is been
observed in the preparation, characterization and application of semiconductor
nanoparticles in new technologies. When the size of semiconductor materials is reduced
to nanoscale, their physical and chemical properties changes due to their large surface
area or quantum size effect. The conductivity of the semiconductor and its optical
properties (absorption coefficient and refractive index) can be varied.They are
promising wide applications in field like solar cells, nanoscale electronic devices, light-
emitting diodes, laser technology, waveguide, chemical and biosensors, packaging
films, superabsorbents….. Semiconductor devices include the various types of
transistors, solar cells, many kinds of diodes including the light-emitting diode, the
silicon controlled rectifier, and digital and analog integrated circuits. Some of the
semiconductor nanomaterials such as Si-Ge, GaAs, AlGaAs, InP, InGaAs, GaN,
AlGaN, SiC, ZnS, ZnSe, AlInGaP, CdSe, CdS,ZnMn2O4,ZnO etc., exhibit excellent
application in computers, palm pilots, laptops, cell phones, pagers, CD players, TV
remotes, mobile terminals, satellite dishes, fiber networks, traffic signals, car taillights,
and air bags. Semiconductor nanocrystals are made from a different compounds. They
are referred to as II-VI, III-V or IV-VI semiconductor nanocrystals, based on the
periodic table groups into which these elements are formed.
In nanocrystalline materials, the electrons are confined to regions having one, two or
three dimensions ,when the relative dimension is comparable with the de Broglie
wavelength. For a semiconductor like CdSe, the de Broglie wavelength of free electron
is around 10 nm. The nanostructures of semiconductor crystals having the zdirection
below this critical value (thin film, layer structure, quantum well) are defined as two
dimensional(2D) nanostructures. When the dimension both in the x and z direction is
below this critical value (linear chain structure, quantum wire) the nanostructures are
defined as one dimensional(1D) and when the y direction is also below this threshold
(cluster, colloid, nanocrystal, quantum dot) it is referred to as zero dimensional(0D).(by
Sagadevan Suresh, Semiconductor Nanomaterials, Methods and Applications: A
Review, Nanoscience and Nanotechnology, Vol. 3 No. 3, 2013, pp. 62-74)
Compound Semiconductors
Compound semiconductors are semiconductors that are made from two or more
elements.Most of them are combinations of elements from GroupIII and GroupV of the
Periodic Table of the Elements (GaAs, GaP, InP and others). Other compound
semiconductors are made from Groups II and VI (CdTe, ZnSe and others). It is also
possible to use different elements from within the same group (IV), to make compound
semiconductors .Potential characteristics of compound semiconductors are high speed
operation(high electron mobility, ability to generate high frequency (microwave)
signal,low voltage operation (for lighter & longer lasting, low voltage batteries used for
portable devices),light emission (both visible and infrared light, for lasers and
LEDs),sensitivity to light (for photodetectors),sensitivity to magnetism (useful in sensor
applications),resistance to heat and radiation (useful in space applications, such as solar
cells for satellites).
ZnMn2O4 Nanomaterials
Literature Reviewss
XRD
XRD analysis provided in different journals give us information that the particle size of
ZnMn2O4 is observed within the range 24 nm – 90 nm, all the diffraction peaks appears
at 2o equal to 32.9420,54.4300,56.7380,60.8280 which is exclusively indexed to that of
tetragonal phase and the lattice constants a=b comes in the range 5.71749 A0 – 5.762 A0
and c in the range 9.23527 A0 – 9.470 A0.
Williamson-Hall analysis:
Assuming both size and strain broadening are lorentzian, the integral breadths of both
components are additive
Theoretical density
From XRD data, we can obtain the unit cell parameters. Using the unit cell parameters,
a,b,c, you can get the unit cell volume. Based on the crystal structure of the material,
we can find how many molecular units are present in every unit cell. Chemical
structure give us information about molecular weight. Using all these data and using
the formula given below we will be able to calculate the theoretical density.
n=atoms/unit cell
A= molar mass
FTIR
According to the stretching and bending vibrations of surface hydroxyl and adsorbed
atmospheric moisture on the surface of the nanomaterial, the samples are having IR
Bands in the high frequency region of 3400 cm-1 and 1370 cm-1. The sample shows the
prominent IR band at 507cm-1 and 630 cm-1 which can be attributed to the stretching
vibration of Mn3+ species in Octahedral and Tetrahedral sites. A shoulder at 710cm-1
shows the asymmetric vibration of Mn-O band in an Octahedral environment. The
shoulder disappeared and an additional peak emerged at 423cm-1 which can be ascribed
to the stretching vibration of Zn-O.
UV
The Optical property of the ZnMn2O4 nanorods can be observed by the UV-visible
diffuse reflectance spectroscopy. In previous studies the spectra of ZnMn2O4 nanorods
at different temperatures. All the samples have strong absorption between 300nm and
500nm. The absorption edges of these samples are around 700nm from the UV-spectra
.It is clear that the absorbance decreases with increase in wavelength.This decrease in
absorption indicates the presence of optical band gap in the material.The optical band
gap could be determined from the tauc plot between (𝛼ℎʋ)2 versus hʋ curve of
ZnMn2O4 nanorods calcined at different temperatures.From the previous studies the
optical band gaps were calculated as 1.2,1.34 and 1.45eV for the samples calcined at
500,650 and 800℃ respectively.
Dielectric property
Dielecric constant analysis in various journals gives the idea that real and imaginary
dielectric constant decrease gradually with increase in frequency at low frequency
region and in high frequency region it is almost indepent of frequency .From dielectric
loss analysis it is noted that at low frequency region the value of dielectric loss is high
and as frequency increases dielectric loss tends to become zero,independent of
frequency.From real part impedence (Z) analysis we came to know that Z remains
constant at low frequency region and it emerges with increase of frequency;Z decreades
with increase in temperature.From the information provided in journals about imaginary
part impedence (Z’) we observed that Z’ peak decreases and shift towards higher
frequency with increase in temperature.
The dielectric parameters such as real part of dielectric constant (ε`), the imaginary part
of dielectric constant (ε``) and ac-conductivity were calculated using the equation given
below:
𝐶𝑑
ε`=
𝐴𝜀₀`
CAPACITANCE
Combustion Synthesis
Procedure
X-ray diffractometers consist of three basic elements: an X-ray tube, a sample holder,
and an X-ray detector.
X-rays are generated in a cathode ray tube by heating a filament to produce electrons,
accelerating the electrons toward a target by applying a voltage, and bombarding the
target material with electrons. When electrons have sufficient energy to dislodge inner
shell electrons of the target material, characteristic X-ray spectra are produced. These
spectra consist of several components, the most common being Kα and Kβ. Kα consists,
in part, of Kα1 and Kα2. Kα1 has a slightly shorter wavelength and twice the intensity as
Kα2. The specific wavelengths are characteristic of the target material (Cu, Fe, Mo, Cr).
Filtering, by foils or crystal monochrometers, is required to produce monochromatic
X-rays needed for diffraction. Kα1and Kα2 are sufficiently close in wavelength such
that a weighted average of the two is used. Copper is the most common target material
for single-crystal diffraction, with CuKα radiation = 1.5418Å. These X-rays are
collimated and directed onto the sample. As the sample and detector are rotated, the
intensity of the reflected X-rays is recorded. When the geometry of the incident X-rays
impinging the sample satisfies the Bragg Equation, constructive interference occurs
and a peak in intensity occurs. A detector records and processes this X-ray signal and
converts the signal to a count rate which is then output to a device such as a printer or
computer monitor.The geometry of an X-ray diffractometer is such that the sample
rotates in the path of the collimated X-ray beam at an angle θ while the X-ray detector
is mounted on an arm to collect the diffracted X-rays and rotates at an angle of 2θ. The
instrument used to maintain the angle and rotate the sample is termed a goniometer.
For typical powder patterns, data is collected at 2θ from ~5° to 70°, angles that are
preset in the X-ray scan.
FTIR SPECTROSCOPY