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E C
n p n
A B
pnp npn
Fig 2: Sche matic representation
The three portions of transistors are named as emitter, base and collector. The junction between emitter
and base is called emitter-base junction while the junction between the collector and base is called
collector-base junction.
The base is thin and tightly doped, the emitter is heavily doped and it is wider when compared to base,
the width of the collector is more when compared to both base and emitter.
In order to distinguish the emitter and collector an arrow is included in the emitter. The direction of the
arrow depends on the conventional flow of current when emitter base junction is forward biased.
Active region
Saturation region
Cut-off region
When both EB junction and CB junction are reverse biased, the transistor is said to be operated in cut-
off region.
The current in the transistor is very small and thus when a transistor in this region it is assumed to be
in off state.
The base emitter (BE) junction is forward biased and the collector base (CB) junction is reverse
biased.
The forward bias at the BE junction reduces the barrier voltage and causes electrons to flow from
the n type emitter to the p type base.
The electrons are emitted into the base region.
Holes also flow from the p type base to the n type emitter, but because the base is much more
lightly doped than the collector, almost all of the current flowing across the BE junction consists
of electrons entering the base from the emitter. Thus electrons are the majority charge carriers in
an npn devices.
The reverse bias at the CB junction causes the CB depletion region to penetrate deeper into the
base.
The electron crossing from the emitter to the base arrives quite close to the large negative
positive electric field at the CB depletion region.
Because the electrons have a negative charge, they are drawn across the CB junction by this bias
voltage.
Some of the charge carriers entering the base from the emitter do not reach the collector, but
flow out through the base connection, because base region is lightly doped.
DEPARTMENT OF ELECTRONICS AND COMMUNICATION, DSCE Page | 45
BASIC ELECTRONICS SHOBHA A S
Relation between Alpha (α) and Beta (Β)
alpha = Ic/Ie
Where,
Ic = Collector current variations
Ie = Emitter current variations
Beta(Β):
It is the ratio of collector current variations to the base current variations on no load and constant
voltages.
Β = Ic/Ib
Where,
Ib = Base Current variations
Β = α/(1-α)
OR
α = Β /(1 + Β)
REFERENCES:
1. David A.Bell,”Electronic Devices and Circuits”, Oxford University Press ,4th Edition,Page no:
100-109
2. https://www.youtube.com/watch?v=hOT72IdQBbw
3. http://nptel.ac.in/video.php?subjectId=117103063
Fig 1: CB configuration
Base is used as common to both input and output.
Input is applied between emitter and base and output is taken from the collector and base.
In CB configuration, IE is input current and IC is output current.
Input characteristics
I/p characteristics is a curve between IE and emitter base voltage VEB keeping VCB
constant.
IE is taken along y-axis and VEB is taken along x-axis.
For a given input voltage (VEB ), more input current flows when higher levels of
collector base voltage (VCB ) are used.
This is because large collector base (reverse bias) voltage cause the depletion region
at the collector-base junction to penetrate more into the base of the transistor, thus
shortening the distance and reducing the resistance between the emitter-base and
collector base depletion region.
From the graph following points can be noted.
For small changes of VEB there will be a large change in IE. Therefore input resistance is very
small.
IE is almost independent of VCB
I/P resistance , Ri = ΔVEB / Δ IE =constant
Output characte ristics
Because the increase in collector to base bias voltage (V CB) expands the collector base
depletion region and thus shortens the distance between the two depletion regions.
With IE held constant, the increase in IC is so small that it is noticeable only for large
variation in VCB.
Saturation region: When VCB is reduced to zero, IC still flows. The charge carriers which
constitute IC are minority carriers as they cross the collector base junction (Reverse current).
To stop the flow of charge carriers, the collector base junction has to be forward biased.
Cut-off: In this region only reverse saturation current ICO flows in the circuit. When the
transistor is operated in this region, the diode act as an open switch that is in off condition.
Fig 4: CE configuration
The input is connected between the base and emitter.
The output is taken between collector and emitter.
IB is input current and IC is the output current.
I/p characteristics
Input characteristics is a curve between EB voltage (VEB ) and base current (IB ) at constant VCE.
For a given level of VBE, IB is reduced when higher VCE levels are employed. Because the higher VCE
produces greater depletion region penetrates more into the base, reducing the distance between the
collector-base and emitter-base depletion regions. Resulting more of the charge carriers from the
emitter flow across the collector base junction and fewer flow out through the base terminal.
From the graph following can be noted.
For small changes of VEB there will be a large change in base current IB. i.e., input resistance
is very small.
For a fixed value of VBE, IB decreases as VCE is increased.
Input resistance , Ri = ΔVEB / Δ IB V CE = constant
Output characte ristics
VCE-VBE-VCB=0
VCB=V CE-VBE
When VCE=VBE, VCB=0. That is no reverse bias on collector base junction. With decrease in VCE,
VCB decreases and hence IC decreases. Further reduction in VC causes the collector base junction
to be forward biased. The forward bias repels the charge carriers injected from the emitter, thus
reducing IC to 0.
Cut-off Region: The base current IB=0 and collector current IC is equal to reverse leakage
current ICEO. The region below the characteristics for IB=0 is cut-off region.
Fig 1: CC configuration
The input is connected between the base and collector while the output is taken between emitter and
collector.
Here IB is the input current and IE is the output current.
Input characteristics
+
= =
Divide both numerator and denominator by
+
= = + = +
−
∴ =
−
Characteristics CB CE CC
2) Output resistance
high high low
(Ro )
β α 1
3) Current
α = --------- β = -------- γ = --------
amplification factor
l+ β l- α l- α
4) Total output current IC= αIE + ICBO IC = βIB+(l + β) I CBO IE = γIB + γICBO
5) Input current IE IB IB
6) Output current IC IC IE
10) Current gain Less than unity Greater than unity Very high
11) Voltage gain Very high Greater than unity Less than unity
LECTURE HOUR: 01
P-channel JFETs.
Generally N-channel JFETs are more preferred than P-channel. N-channel and P-channel JFETs are shown in
the figures below.
Basic Construction:
In an N-channel JFET an N-type silicon bar, referred to as the channel, has two smaller pieces of P-type
silicon material diffused on the opposite sides of its middle part, forming P-N junctions, as illustrated in
figure.
The two P-N junctions forming diodes or gates are connected internally and a common terminal, called
the gate terminal, is brought out. Ohmic contacts (direct electrical connections) are made at the two ends
of the channel—one lead is called the Source terminal S and the other Drain terminal D.
The silicon bar behaves like a resistor between its two terminals D and S. The gate terminal is analogous
to the base of an ordinary transistor (BJT). It is used to control the flow of current from source to drain.
Thus, source and drain terminals are analogous to emitter and collector terminals respectively of a BJT.
In the figure below, the gate is P-region, while the source and the drain are N-regions. Because of this, a
JFET is similar to two diodes.
The gate and the source form one of the diodes, and the drain form the other diode. These two diodes are
usually referred as the gate-source diode and the gate-drain diode. Since JFET is a silicon device, it takes
only 0.7 volts for forward bias to get significant current in either diode.
With the gate terminal not connected, and a potential applied (+ ve at the drain and – ve at the source), a
current called the drain current, ID flows through the channel located between the two P-regions. This
current consists of only majority carriers-electrons in this case.
P-channel JFET is similar in construction to N-channel JFET except that P-type semiconductor material
is sandwiched between two N-type junctions, as shown in figure. In this case majority carriers are holes.
Schematic Symbols:
The schematic symbols for N-type and P-type JFETs are shown in the figure below.
The vertical line in the symbol may be thought as channel and source S and drain D connected to the
line.
Note that the direction of the arrow at the gate indicates the direction in which the gate current flows
when the gate junction is forward biased. Thus for the N-channel JFET, the arrow at the gate junction
points into the device and in P-channel JFET, it is away from the device.
Source – The terminal through which the majority carriers enter the channel, is called the source terminal S and
the conventional current entering the channel at S is designated as Ig.
Drain – The terminal, througih which the majority carriers leave the channel, is called the drain terminal D and
the conventional current leaving the channel at D is designated as I D. The drain- to-source voltage is called VDS,
and is positive if D is more positive than source S
Gate – There are two internally connected heavily doped impurity regions formed by alloying, by diffus ion, or
by any other method available to create two P-N junctions. These impurity regions are called the gate G. A
voltage V GS is applied between the gate and source in the direction to reverse-bias the P-N junction.
Conventional current entering the channel at G is designated as I G.
Channel – The region between the source and drain, sandwiched between the two gates is called the channel
and the majority carriers move from source to drain through this channel.
Ope ration:
When neither any bias is applied to the gate (i.e. when V GS = 0) nor any voltage to the drain w.r.t. source
(i.e. when VDS = 0), the depletion regions around the P-N junctions , are of equal thickness and
symmetrical.
When positive voltage is applied to the drain terminal D w.r.t. source terminal S without connecting
gate terminal G to supply, as illustrated in fig. 9.4, the electrons (which are the majority carriers) flow
from terminal S to terminal D whereas conventional drain current I D flows through the channel from D
to S.
Due to flow of this current, there is uniform voltage drop across the channel resistance as we move from
terminal D to terminal S. This voltage drop reverse biases the diode.
The gate is more “negative” with respect to those points in the channel which are nearer to D than to S.
Hence, depletion layers penetrate more deeply into the channel at points lying closer to D than to S. Thus
wedge-shaped depletion regions are formed, as shown in figure. when Vd s is applied.
The size of the depletion layer formed determines – the width of the channel and hence the magnitude of
current ID flowing through the channel.
Characteristics of JFET:
The circuit of Fig. 4.23 is used to experimentally obtain the various values for plotting the transfer characteristic
of a given JFET. The drain source voltage is held constant, VGS is adjusted in steps using the variable resistor
R, and the corresponding levels of VGS and ID are recorded.
Curved Region
At point A, the channel resistance begins to be affected by the depletion regions. Further increases in VDS now
produce smaller ID increases, as shown by the curved part of the characteristic. The increased ID levels, in
turn, result in more depletion region penetration and greater channel resistance. Eventually, a saturation level
of ID is reached, where further VDS increase has no effect on ID’ At the point B on the characteristic where ID
levels off, the drain current is known as the drain- source saturation current (IDSS). The shape of the
characteristic in the depletion regions in the channel at the I DSS level is such that they look as if they are
ready to pinch off the channel. Hence the drain-source voltage at this point is known as the pinch-off voltage
(V) (5.2 V in Fig. 4.24). Part AB is the curved region of the p characteristic.
Pinch-off Region Be
It is also known as saturation region or amplifier region. Here, the JFET operates as a constant current
device because ID is relatively independent of VDS’ This is due to the fact that as VDS increases,
channel resistance also increases proportionately, thereby keeping ID practically constant at I DSS’ This
is the normal operating region of the JFET when used as an amplifier.
Breakdown Region
If VDS is continuously increased (in the pinch-off region) a voltage is reached at which the reverse-
biased gate channel junctions experience avalanche breakdown (at point C on the characteristic in Fig.
4.24), where ID increases to an excessively high value and the device may be destroyed.
to 356.
2. https://www.youtube.com/watch?v=SjeK1nkiFvI
3. http://www.learnabout-electronics.org/fet_01.php
COURSE NAME WITH CODE: BASIC ELECTRONICS - COURSE OUTCOMES:
18EC1ICBEE
CO1 :
FACULTY NAME:SHOBHA A S Understand the characteristics, operations of different
electronic components.
DATE:
LECTURE HOUR: 02
As well as the Junction Field Effect Transistor (JFET), there is another type of Field Effect Transistor
available whose Gate input is electrically insulated from the main current carrying channel and is therefore
called an Insulated Gate Field Effect Transistor or IGFET. The most common type of insulated gate FET
which is used in many different types of electronic circuits is called the Metal Oxide Semiconductor Field
Effect Transistor or MOSFET for short.
MOSFET is a voltage controlled field effect transistor that differs from a JFET in that it has a “Metal
Oxide” Gate electrode which is electrically insulated from the main semiconductor n-channel or p-channel
by a very thin layer of insulating material usually silicon dioxide, commonly known as glass.
This ultra thin insulated metal gate electrode can be thought of as one plate of a capacitor. The isolation of
the controlling Gate makes the input resistance of the MOSFET extremely high way up in the Mega-ohms (
MΩ ) region thereby making it almost infinite.
As the Gate terminal is isolated from the main current carrying channel “NO current flows into the gate”
and just like the JFET, the MOSFET also acts like a voltage controlled resistor were the current flowing
through the main channel between the Drain and Source is proportional to the input voltage. Also like the
JFET, the MOSFETs very high input resistance can easily accumulate large amounts of static charge
resulting in the MOSFET becoming easily damaged unless carefully handled or protected.
Symbolic representation of N-channel and P-channel MOSFET is shown in figure below.
Fig.2.6.Construction of DEMOSFET
Depletion Mode:
DE-MOSFET can be operated with either a positive or a negative gate. When gate is positive with
respect to the source it operates in the enhancement—or E- mode and when the gate is negative with
respect to the source, as illustrated in figure, it operates in depletion- mode.
When the drain is made positive with respect to source, a drain current will flow, even with zero gate
potential and the MOSFET is said to be operating in E-mode.
In this mode of operation gate attracts the negative charge carriers from the P-substrate to the N-
channel and thus reduces the channel resistance and increases the drain-current. The more positive
the gate is made, the more drain current flows.
For the n-channel enhancement MOS transistor a drain current will only flow when a gate voltage (
VGS ) is applied to the gate terminal greater than the threshold voltage ( VT H ) level in which
conductance takes place making it a transconductance device.
The application of a positive (+ve) gate voltage to a n-type eMOSFET attracts more electrons
towards the oxide layer around the gate thereby increasing or enhancing (hence its name) the
thickness of the channel allowing more current to flow.
This is why this kind of transistor is called an enhancement mode device as the application of a gate
voltage enhances the channel.
We have seen above that we can construct a graph of the MOSFETs forward DC characteristics by keeping
the supply voltage, VDD constant and increasing the gate voltage, V G. But in order to get a complete picture
of the operation of the n-type enhancement MOS transistor to use within a MOSFET amplifier circuit, we
need to display the output characteristics for different values of both VDD and VGS
As with the NPN Bipolar Junction Transistor, we can construct a set of output characteristics curves
showing the drain current, ID for increasing positive values of VG for an n-channel enhancement- mode MOS
transistor as shown.
Note that a p-channel eMOSFET device would have a very similar set of drain current characteristics curves
but the polarity of the gate voltage would be reversed.
IMPORTANT POINTS TO REMEMBER:
MOSFET’s are unipolar conduction devices
Depletion MOSFET and Enhancement MOSFET
Different regions of Characteristics of MOSFET
REFERENCES:
1. David A Bell ,“Electronic Devices and Circuits”, Oxford University Press, 5th Edition, 2008. Page
No.367 to 371.
2. http://www.nptel.ac.in/courses/Webcourse-contents/IIT%20Kharagpur/Power%20Electronics/PDF/L-
6%28DK%29%28PE%29%20%28%28EE%29NPTEL%29.pdf
3. http://npteldownloads.iitm.ac.in/softlinks_3gp/117103063/mod03lec01.3gp