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Proceedings of ESSCIRC, Grenoble, France, 2005

A Fast-Lock Mixed-Mode DLL with Wide-Range


Operation and Multiphase Outputs
Kuo-Hsing Cheng and Yu-Lung Lo

Department of Electrical Engineering


National Central University, Jung-Li, Taoyuan, Taiwan R.O.C.
E-mail: cheng@ee.ncu.edu.tw

clock/data recovery (CDR), DDR [7] and multiphase clock


Abstract: generation, the multiphase VCDL output is usually used to
implement the circuit function.
This paper describes a fast-lock mixed-mode delay-locked Conventional DLL’s may suffer from harmonic locking
loop (MMDLL) for wide-range operation and multiphase over wide operating range. Therefore, various wide-range
outputs. The architecture of the proposed DLL uses the DLL’s architectures [1]Ё[7] are proposed to overcome the
mixed-mode time-to-digital converter (TDC) scheme for problem of false locking. However, such DLL’s resulted in
frequency range selector, a start-up circuit and coarse tune complex architectures that faced such problems as
circuit to offer the faster lock time. And the multi- increased area, added power consumption and degradation
controlled delay cell for voltage-controlled delay line of jitter performance. According to the previous works, a
(VCDL) was used to provide the wide locked range and mixed-mode architecture, which increases the lock range
low-jitter performance. The charge pump circuit is having no degradation of jitter performance with a
implemented by digital controlled scheme to reach relatively small overhead in area and power, is proposed in
bandwidth tracking. The chip has been fabricated using the this paper.
TSMC 0.25-ȝm single-poly five-metal CMOS process
with a 2.5 V power supply voltage. From the measurement 2. Architecture
results, this DLL can operate correctly when the input
clock frequency is changed from 32 to 320 MHz and
generate ten-phase clocks within just one clock cycle. 2.1 Architecture and Operating Principle of
Moreover, the proposed DLL can solve the problem of the Proposed DLL
false locking associated with conventional DLL’s and
wide-range operation. At 320 MHz, the measured peak-to-
peak jitter and root-mean-squared jitter are 37.2 ps and
2.492 ps, respectively. Furthermore, the locking time is
less than 22 clock cycles based on the HSPICE simulation
results. The DLL occupies smaller area (0.32×0.22 mm2)
and dissipates less power (15 mW) than other wide-range
DLL’s [1]Ё[7].

1. Introduction

For high-speed and high-integration density VLSI systems,


the phase-locked loops (PLL’s) and delay-locked loops
(DLL’s) have been widely adopted to solve clock signal
skew and jitter in microprocessors, memory interfaces and
communication IC’s. Generally, if there is no need for
frequency multiplication, DLL’s would be more attractive
Figure 1: Block diagram of the proposed DLL.
than PLL’s because they are more stable and easier to
implement together with digital circuits and exhibit better The architecture of the proposed DLL is shown Fig. 1. It
jitter accumulation characteristics than PLL’s. Therefore, has two major blocks, the frequency range selector and
the DLL’s offer better jitter performance than PLL’s [1] DLL core. The frequency range selector can detect the
[2]. In many DLL applications, such as high speed input frequency range and generate digital control signals

0-7803-9205-1/05/$20.00 ©2005 IEEE 189 Paper 3.G.2


Proceedings of ESSCIRC, Grenoble, France, 2005

(S1, S0) to switch the delay time range of the multi- (TVCDL.max, TVCDL.min and Td) of the multi-controlled delay
controlled VCDL and charge pump for tuning the loop cell is determined by three control signals Vctrl, S0 and S1.
bandwidth. The digital-mode control scheme for range Of these signals, S0 and S1 are outputs of the frequency
selector and the flat gain of the VCDL not only offer the range selector, and the Vctrl is output of the VCDL of the
faster lock time and wide locked range but also provide a core DLL.
low-jitter performance for various frequency application.
The other block is DLL core that consists of PD, CP, LF,
start-up circuit, coarse tune circuit and the multi-controlled
delay line for VCDL. The start-up circuit sets the initial
control voltage of the loop filter to VDD. On the same
time, the coarse tune circuit is activated to generate a large
discharge current until the output clock (out_clk) of the
delay line is close to the input reference clock (ref_clk).
Therefore, the coarse-tuning scheme can offer the faster
lock time in this DLL.
(a)

(b)
Figure 3: The multi-controlled delay cell (a) circuit
diagram of HDEC and (b) configuration of ten-stage delay
cell.
Figure 2: Block diagram of the frequency range selector.

2.2 Circuits Description

2.2.1 Frequency Range Selector


The frequency range selector consists of the mixed-mode
time-to-digital converter (TDC), which composed of a ten-
stage delay line, encoder circuit and control unit as shown
in Fig. 2. The schematic of the encoder and control unit are
composed of only latches and simple logic gates.
While the DLL is activated, the input reference clock
(ref_clk) will be propagated in the ten-stage delay line.
The outputs (Q1 Ё Q10) of the encoder are the digital
value to describe the time interval in which the ref_clk is
high. Therefore, the ref_clk determines the outputs of the
encoder. The encoder circuit and the control unit detect the
Figure 4: The principle of operating range of the proposed
outputs (o1Ёo10) of the ten-stage delay line, and generate DLL.
2-bit control signals (S1, S0). The 2-bit control signals (S1,
S0) are generated from frequency range selector to select In the DC, there are four operating ranges. Figure 4 shows
the number of MOS transistors for tuning the delay range the principle of operating range of the proposed DLL. To
of the VCDL and control the current of charge pump. avoid the false locking with process, voltage supply,
temperature, and loading (PVTL) variations, the delay
2.2.2 Multi-Controlled Delay Cell range will overlap for each other. From the simulation
In the proposed DLL, the multi-controlled delay cell is results of VCDL transfer function, we get the KVCDL1 >
employed as the basic half delay cell element (HDCE), in a KVCDL2> KVCDL3 > KVCDL4. Where the gain (KVCDL) of
manner similar to that associated with the current-starved VCDL in the range1 is KVCDL1, the KVCDL in the range2 is
inverter. Two HDCE’s compose a delay cell (DC). Figure KVCDL2 and so on.
3 shows the proposed circuit diagram of HDCE and the 2.2.3 Coarse Tune Circuit
configuration of the ten-stage delay cell. The delay time
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Proceedings of ESSCIRC, Grenoble, France, 2005

In this DLL, the coarse tune circuit is proposed to offer Zn I CH ˜ KVCDL (1)
faster locking time and provide better jitter performance as Z REF 2S ˜ C
shown in Fig. 5. When the input reference clock is In order to keep the ratio of loop bandwidth for constant
activated, the output pulse of start-up circuit is used to set value, we apply digital controlled charge pump and the
the initial control voltage of the loop filter to VDD. The multi-controlled delay cell. The charge pump has different
out_clk of the delay line leads before the ref_clk. The dn current combination to correspond to different KVCDL is
and dn1 signals are activated and the Vctrl greatly shown in Table 1.
decreases. When the out_clk is close to the ref_clk, the
dn1 signals will disappear. The PD up and dn signals are
then used to fine-tune this DLL.
The coarse tune circuit consists of a D-type flip-flop
(D_FF) and an adjustable pulse width circuit. The
adjustable pulse width circuit output (out_apw) is
generated to reset the out_clk, when the out_clk leads
before the ref_clk. A schematic of the adjustable pulse
width circuit is shown in Fig. 5(b). The adjustable pulse
width is controlled by the ref_clk and control voltage
(Vctrl) of filter. The adjustable pulse width circuit consists
of three stages VCDL and a AND gate. The delay between
ref_clk and int_clk of the three stages VCDL is controlled
by Vctrl. When the Vctrl increases that cause the delay Figure 6: The schematic of the digital controlled charge
between ref_clk and int_clk of the three stages VCDL pump and loop filter.
decreasing. After the AND gate, the narrow pulse width is
generated. Control Gain
Region Condition Current (Ich)
Signals (KVCDL)
S0=0,
Range 1 TVCDL.max < 2×Td1 Ich1=Id1 KVCDL1
S0=0
S0=0,
Range 2 Td2 < 2×Td3 Ich2=Id1+Id2 KVCDL2
S0=1
S0=1,
Range 3 Td4 < 2×Td5 Ich3=Id1+Id3 KVCDL3
S0=0
S0=1,
Range 4 Td6 < 2×TVCDL.min Ich4=Id1+Id2+Id3 KVCDL4
(a) S0=1

Table 1: The charge pump currents versus the KVCDL.

(b)
Figure 5: The schematic of (a) coarse tune circuit and (b)
adjustable pulse width circuit.

2.2.4 Digital Controlled Charge Pump


To design a suitable DLL, there are many considerations,
such as bandwidth requirement, jitter performance, and
lock time. From the analysis of the small signal AC model
of the DLL, the fast acquisition time in the initial state and
the jitter performance in locked state are two major (a) (b)
concerns. In this wide-range operation DLL, the charge
pump circuit is implemented by digital controlled scheme Figure 7: The clock waveforms at 32 MHz. (a) Output
to reach bandwidth tracking as shown in Fig. 6. The wide- clock and phase 2. (b) Output clock and phase 5.
range operation DLL, which has difference KVCDL of linear
voltage-controlled delay line so that the loop bandwidth
will change with difference KVCDL. Moreover, the charge 3. Experiment and Comparison Results
pump current (Ich) also affects the loop bandwidth.
Therefore, the loop bandwidth of DLL should be chosen The proposed DLL was fabricated using the TSMC 0.25-
carefully. The Eq. 1 shows the ratio of loop bandwidth to ȝm single-poly five-metal CMOS process with a 2.5 V
operating frequency is power supply voltage. The chip area is 0.823×0.823 mm2

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Proceedings of ESSCIRC, Grenoble, France, 2005

including the input and output digital buffers and pads. this DLL. Besides, the charge pump circuit is implemented
The active area of DLL is 0.32×0.22 mm2 and the loop by digital controlled scheme to reach bandwidth tracking.
filter consumes ~50% of total area. The proposed DLL As a result, this DLL can solve the problem of the false
operates from 32 to 320 MHz with 2.5 V power supply. locking associated with conventional DLL’s and wide-
Figure 7 (a) shows the waveforms of output clock and range operation. This DLL can operate correctly when the
phase 2 at 32MHz, respectively, and have a 72o phase input clock frequency is changed from 32 to 320 MHz and
difference. Figure 7 (b) shows the waveforms of output generate ten-phase clocks that can be used in applications
clock and phase 5, which are an inversion of each other such as serial-link and high-speed interfaces.
with a 180o phase difference. Figure 8 (a) shows the
Performance
measured jitter histogram for the DLL output clock at 32 Parameter
ADL DLL [1] AAAM DLL [3] AWR DLL [5] ALJ DLL [7] This work

MHz. The peak-to-peak jitter is 49.2 ps and the rms jitter 0.25-ȝm 5M 0.35-ȝm 3M 0.35-ȝm 1P3M 0.16-ȝm DRAM 0.25-ȝm 1P5M
Process
is 6.153 ps. Figure 8 (b) shows the measured peak-to-peak CMOS CMOS CMOS CMOS
Supply
and rms jitters for the 320 MHz output clock, at 37.2 ps 2.5 V 3.3 V 3.3 V 2.3 V 2.5 V
Voltage
and 2.492 ps, respectively. From the simulation results, the Operating
150 ~ 600MHz 62.5 ~ 250MHz 6 ~ 130MHz 42 ~ 400MHz 32 ~ 320MHz
maximum locking time is 22 clock cycles at 160 MHz. Range
~1130 clock 22 clock cycles
Lock Time NA NA NA
cycles (Max.)
24.77ps @ 6.153ps @
6.683ps with 4ps with quiet 6MHz 4.77ps with 32MHz
RMS Jitter
quiet supply supply 3.297ps @ quiet supply 2.492ps @
130MHz 320MHz
49.2ps @
54ps with 210ps @ 6MHz 43ps with
Peak-to-Peak 29ps with quiet 32MHz
quiet 24.3ps @ quiet
Jitter supply 37.2ps @
supply 130MHz supply
320MHz
Power 60mW @ 12.6 mA @ 132 mW @ 52mW @ 15 mW @
Dissipation 400MHz 250MHz 130MHz 400MHz 320MHz
Active Area 0.13 mm2 0.08 mm2 0.45 mm2 0.27 mm2 0.07 mm2

Table 2: Performance comparison.

(a) (b) References:


Figure 8: The jitter histogram. (a) When operation [1] Y. J. Jung et al., “A Dual-Loop Delay-Locked Loop
frequency at 32 MHz and (b) at 320 MHz. Using Multiple Voltage-Controlled Delay Lines,” IEEE J.
The comparison results are according to various wide- Solid-State Circuits, vol.36, no.5, pp. 784-791, May. 2001
range DLL architectures, as shown in Table 2. The [2] D. J. Foley et al., “CMOS DLL-Based 2-V 3.2-ps Jitter
parameters are captured from the references [1], [3], [5] 1-GHz Clock Synthesizer and Temperature-Compensated
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the reference [3] is AAAM DLL, the AWR DLL is no.3, pp. 417-423, Mar. 2001.
reference [5], the ALJ DLL is reference [7]. From the [3] Y. Moon et al., “An All-Analog Multiphase Delay-
comparison results, the proposed DLL can achieve wide Locked Loop Using a Replica Delay Line for Wide-Range
operating frequency than the the ADL DLL [1], AAAM Operation and Low-Jitter Performance,” IEEE J. Solid-
DLL [3] and the ALJ DLL [7], and has faster lock time State Circuits, vol.35, no.3, pp. 377-384, Mar. 2000.
than the AWR DLL [5]. Furthermore, the area cost and [4] B.W. Garlepp et al., ”A Portable Digital DLL for
power consumption of the prototype chip are much smaller High-Speed CMOS Interface Circuits,” IEEE J. Solid-
than those of other wide-range DLL’s [1]Ё[7]. State Circuits, vol.34, no.5, pp. 632-644, May. 1999.
[5] H. H. Chang et al., ” A Wide-Range Delay-Locked
Loop With a Fixed Latency of One Clock Cycle,” IEEE J.
4. Conclusions
Solid-State Circuits, vol.37, no.8, pp. 1021-1027, Aug.
2002.
In this paper, a fast-lock mixed-mode delay-locked loop
[6] S. Sidiropoulos et al., “A Semidigital Dual Delay-
for wide-range operation and multiphase outputs. First, the
Locked Loop,” IEEE J. Solid-State Circuits, vol.32, no.11,
mixed-mode TDC architecture for frequency range
pp. 1683-1692, Nov. 1997.
selector can automatically select one of the delay lines
[7] S. J. Kim et al., “A Low-Jitter Wide-Range Skew-
from different frequency. Then the multi-controlled delay
Calibrated Dual-Loop DLL Using Antifuse Circuitry for
cell element for VCDL was switched by frequency range
High-Speed DRAM,” IEEE J. Solid-State Circuits, vol.37,
selector, which can provide wide locked range and low-
no.6, pp. 726-734, June. 2002.
jitter performance. Both the start-up circuit and the coarse
tune circuit are proposed to offer the faster lock time in

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