PCN# : P315A

Issue Date : Feb. 04, 2013

DESIGN/PROCESS CHANGE NOTIFICATION

This is to inform you that a change is being made to the products listed below.

Unless otherwise indicated in the details of this notification, the identified change will have no impact on product
quality, reliability, electrical, visual or mechanical performance and affected products will remain fully compliant to all
published specifications. Products incorporating this change may be shipped interchangeably with existing unchanged
products.

This change is planned to take effect in 90 calendar days from the date of this notification. Please work with your local
Fairchild Sales Representative to manage your inventory of unchanged product if your evaluation of this change will
require more than 90 calendar days.

Please contact your local Customer Quality Engineer within 30 days of receipt of this notification if you require any
additional data or samples. Alternatively, you may send an email request for data, samples or other information to
PCNSupport@fairchildsemi.com.

Implementation of change:

Expected First Shipment Date for Changed Product : May. 05, 2013

Expected First Date Code of Changed Product :1327

Description of Change (From) :

5/6-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea.

Description of Change (To) :

8-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea.

Reason for Change:

Fairchild Semiconductor is increasing wafer fabrication capacity by qualifying an 8-in wafer fabrication line at Fairchild
Semiconductor Bucheon Korea. Quality and reliability remain at the highest standards already demonstrated within
Fairchild's existing products. The reliability qualification results used to qualify the 8-in wafer fabrication line are
summarized below. The specific groups of products/MOSFET technologies are listed in the affected FSIDs list. Design,
die size and layout of the affected products will remain unchanged. There are no changes in the datasheet or electrical
performance.

1 of 14
Affected Product(s):

FCA20N60 FCA20N60F FCA20N60FS

FCA20N60S_F109 FCA20N60_F109 FCA35N60
FCA47N60 FCA47N60F FCA47N60F_SN00171
FCA47N60_F109 FCB11N60TM FCB20N60FTM
FCB20N60TM FCBB20CH60SF FCD4N60TM
FCD5N60TM FCD5N60TM_WS FCD7N60TM
FCD7N60TM_WS FCH35N60 FCH47N60F_F133
FCH47N60_F133 FCI7N60 FCP11N60
FCP11N60F FCP11N60_G FCP16N60
FCP16N60_G FCP190N60 FCP190N60E
FCP20N60 FCP20N60FS FCP20N60_G
FCP260N60E FCP380N60 FCP380N60E
FCP4N60 FCP7N60 FCPF11N60
FCPF11N60F FCPF11N60T FCPF11N60_G
FCPF11N65 FCPF11N65_G FCPF16N60
FCPF190N60 FCPF190N60E FCPF20N60
FCPF20N60FS FCPF20N60S FCPF20N60ST
FCPF20N60ST_G FCPF20N60T FCPF260N60E
FCPF380N60 FCPF380N60E FCPF400N60
FCPF7N60 FCPF7N60YDTU FCU5N60TU
FDA24N40F FDA24N50 FDA24N50F
FDA28N50 FDA28N50F FDA33N25
FDA38N30 FDA50N50 FDA59N25
FDA59N30 FDA69N25 FDA70N20
FDB12N50TM FDB20N50F FDB28N30TM
FDB33N25TM FDB44N25TM FDB52N20TM
FDD3N50NZTM FDD5N50NZFTM FDD5N50NZTM
FDD6N20TM FDD6N25TM FDD6N50FTM
FDD8N50NZTM FDH45N50F_F133 FDH50N50_F133
FDL100N50F FDP12N50NZ FDP15N40
FDP18N20F FDP19N40 FDP22N50N
FDP24N40 FDP26N40 FDP33N25
FDP39N20 FDP51N25 FDP52N20
FDP5N50NZ FDP61N20 FDP8N50NZ
FDPF12N50NZ FDPF13N50NZ FDPF18N20FT
FDPF33N25T FDPF33N25TRDTU FDPF39N20
FDPF39N20TLDTU FDPF3N50NZ FDPF44N25T
FDPF51N25 FDPF51N25RDTU FDPF51N25YDTU
FDPF5N50NZ FDPF5N50NZF FDPF5N50NZFT
FDPF5N50NZU FDPF8N50NZ FDPF8N50NZF

2 of 14
Affected Product(s):

FDPF8N50NZU FDPF9N50NZ FGA40N65SMD

FGD4536TM FGH20N60SFDTU FGH20N60UFDTU
FGH40N60SFDTU FGH40N60SFTU FGH40N60SMD
FGH40N60SMDF FGH40N60UFDTU FGH40N60UFDTU_SN00006
FGH40N60UFTU FGH40N60UFTU_SN00007 FGH40N65UFDTU
FGH80N60FD2TU FGH80N60FDTU FGPF4533
FGPF4533RDTU FGPF4536 FGPF4536JDTU
FGPF4536YDTU FGPF4633RDTU FGPF4633TU
FGPF4636YDTU PCFC11N60W PCFC20N60W
PCFC47N60FW PCFC47N60FW_SN00201 PCFG40N65SMW

3 of 14
Qualification Plan Device Package Process No. of Lots
Q20120257 FDA59N25 TT3P0003 UniFET1 150~250V 3

Device
FDA59N25 FDA59N25 FDA59N25
Reliability Name
Condition Standard Lot No. Q20120257AA Q20120257AB Q20120257AC
Test
Duration Result/FA Result/FA Result/FA
100 % Rated JESD22-
HTGB VGS, Tj A108 1000hrs 0/77 0/77 0/77
max=150C
80% of Rated JESD22-
HTRB BV, Tj A108 1000hrs 0/77 0/77 0/77
max=150C
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85% RH, JESD22-
HAST 96hrs 0/77 0/77 0/77
Vds=42V A110
Delta 100C, 5 MIL-STD-
6000
PRCL min on, 3.5 min 750-1036 0/77 0/77 0/77
cycles
off
JESD22-
RSDH 260C 10sec 0/30 0/30 0/30
B106
-65 C to 150 C, JESD22- 500
TMCL 0/77 0/77 0/77
30 min/ cycles A104 cycles

4 of 14
Qualification Plan Device Package Process No. of Lots
Q20120259 FDH50N50_F133 TO247003 UniFET1 300~500V (Over 24A) 3

Device
FDH50N50_F133 FDH50N50_F133 FDH50N50_F133
Reliability Name
Condition Standard Lot No. Q20120259AA Q20120259AB Q20120259AC
Test
Duration Result/FA Result/FA Result/FA
100 %
Rated
JESD22-
HTGB VGS, Tj 1000hrs 0/77 0/77 0/77
A108
max=150
C
80% of
Rated
JESD22-
HTRB BV, Tj 1000hrs 0/77 0/77 0/77
A108
max=150
C
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C,
JESD22-
HAST 85% RH, 96hrs 0/77 0/77 0/77
A110
Vds=42V
Delta
100C, 5
MIL-STD- 6000
PRCL min on, 0/77 0/77 0/77
750-1036 cycles
3.5 min
off
JESD22-
RSDH 260C 10sec 0/30 0/30 0/30
B106
-65 C to
150 C, 30 JESD22- 500
TMCL 0/77 0/77 0/77
min/ A104 cycles
cycles

5 of 14
Qualification Plan Device Package Process No. of Lots
Q20120260 FDP22N50N TO220003 UniFET2 500V 3

Device
FDP22N50N FDP22N50N FDP22N50N
Reliability Name
Condition Standard Lot No. Q20120260AA Q20120260AB Q20120260AC
Test
Duration Result/FA Result/FA Result/FA
100 % Rated VGS, JESD22-
HTGB 1000hrs 0/77 0/77 0/77
Tj max=150C A108
80% of Rated BV, JESD22-
HTRB 1000hrs 0/77 0/77 0/77
Tj max=150C A108
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85% RH, JESD22-
HAST 96hrs 0/77 0/77 0/77
Vds=42V A110
MIL-
Delta 100C, 3.5 STD- 8572
PRCL 0/77 0/77 0/77
min on, 3.5 min off 750- cycles
1036
JESD22-
RSDH 260C 10 sec 0/30 0/30 0/30
B106
-65 C to 150 C, 30 JESD22- 500
TMCL 0/77 0/77 0/77
min/ cycles A104 cycles

Qualification Plan Device Package Process No. of Lots

Q20120263 FCP20N60 TO220003 Super-FET 600V TO220 3

Device
FCP20N60 FCP20N60 FCP20N60
Reliability Name
Condition Standard Lot No. Q20120263AA Q20120263AB Q20120263AC
Test
Duration Result/FA Result/FA Result/FA
100 % Rated VGS, JESD22-
HTGB 1000hrs 0/77 0/77 0/77
Tj max=150C A108
80% of Rated BV, JESD22-
HTRB 1000hrs 0/77 0/77 0/77
Tj max=150C A108
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85% RH, JESD22-
HAST 96hrs 0/77 0/77 0/77
Vds=42V A110
MIL-
Delta 100C, 3.5 STD- 8572
PRCL 0/77 0/77 0/77
min on, 3.5 min off 750- cycles
1036
JESD22-
RSDH 260C 10 sec 0/30 0/30 0/30
B106
-65 C to 150 C, 30 JESD22- 500
TMCL 0/77 0/77 0/77
min/ cycles A104 cycles

6 of 14
Qualification Plan Device Package Process No. of Lots
Q20120265 FCB20N60TM TT263002 Super-FET 600V D2pak 1

Device Name FCB20N60TM

Reliability Test Condition Standard Lot No. Q20120265AA
Duration Result/FA
PRECON L1 245C JESD22-A113 5 Cycles 24 hrs 0/154
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
80% of Rated BV, Tj
HTRB JESD22-A108 1000hrs 0/77
max=150C
HTSL 150 C JESD22-A103 1000hrs 0/77
130 C, 85% RH,
HAST JESD22-A110 96hrs 0/77
Vds=42V
Delta 100C, 3.5 min on, MIL-STD-750-
PRCL 8572 cycles 0/77
3.5 min off 1036
RSDH 260C JESD22-B106 10 sec 0/30
-65 C to 150 C, 30 min/
TMCL JESD22-A104 500 cycles 0/77
cycles

Qualification Plan Device Package Process No. of Lots

UNIFET 200V(include 250V
Q20120266 FDB52N20TM TT263002 1
/Dpak and D2 pak)

Device Name FDB52N20TM

Reliability Test Condition Standard Lot No. Q20120266AA
Duration Result/FA
PRECON L1 245C JESD22-A113 5 Cycles 24 hrs 0/154
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
80% of Rated BV, Tj
HTRB JESD22-A108 1000hrs 0/77
max=150C
HTSL 150 C JESD22-A103 1000hrs 0/77
130 C, 85% RH,
HAST JESD22-A110 96hrs 0/77
Vds=42V
Delta 100C, 3.5 min on, MIL-STD-750-
PRCL 8572 cycles 0/77
3.5 min off 1036
RSDH 260C JESD22-B106 15 sec 0/30
-65 C to 150 C, 30 min/
TMCL JESD22-A104 500 cycles 0/77
cycles

7 of 14
Qualification Plan Device Package Process No. of Lots
Q20120267 FDB12N50TM TT263002 UNIFET1 300-500V_D2pak 1

Device Name FDB12N50TM

Reliability Test Condition Standard Lot No. Q20120267AA
Duration Result/FA
PRECON L1 245C JESD22-A113 5 Cycles 24 hrs 0/154
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
80% of Rated BV, Tj
HTRB JESD22-A108 1000hrs 0/77
max=150C
HTSL 150 C JESD22-A103 1000hrs 0/77
130 C, 85% RH,
HAST JESD22-A110 96hrs 0/77
Vds=42V
Delta 100C, 2 min on, MIL-STD-750-
PRCL 8572 cycles 0/77
3.5 min off 1036
RSDH 260C JESD22-B106 10 sec 0/30
-65 C to 150 C, 30 min/
TMCL JESD22-A104 500 cycles 0/77
cycles

Qualification Plan Device Package Process No. of Lots

Q20120268 FCA47N60 TT3P0003 SuperFET 600V TO3P/TO247 1

Device Name FCA47N60

Reliability Test Condition Standard Lot No. Q20120268AA
Duration Result/FA
HTGB 100 % Rated VGS, Tj max=150C JESD22-A108 1000hrs 0/77
HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
PRCL Delta 100C, 5 min on, 3.5 min off MIL-STD-750-1036 6000 cycles 0/77
RSDH 260C JESD22-B106 10 sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

8 of 14
Qualification Plan Device Package Process No. of Lots
Q20120269 FGD4536TM TT252003 PDP 4GEN Trench IGBT_360V Dpak 1

Device Name FGD4536TM

Reliability
Condition Standard Lot No. Q20120269AA
Test
Duration Result/FA
5 Cycles 24
PRECON L1 260C JESD22-A113 0/154
hrs
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
Delta 100C, 2 min on, 3.5 min MIL-STD-750-
PRCL 10000 cycles 0/77
off 1036
RSDH 260C JESD22-B106 10 sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

Qualification Plan Device Package Process No. of Lots

Q20120270 FCD7N60TM TT252002 SuperFET_600V Dpak 1

Device Name FCD7N60TM

Reliability
Condition Standard Lot No. Q20120270AA
Test
Duration Result/FA
5 Cycles 24
PRECON L1 260C JESD22-A113 0/154
hrs
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
Delta 100C, 2 min on, 3.5 min MIL-STD-750-
PRCL 10000 cycles 0/77
off 1036
RSDH 260C JESD22-B106 10 sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

9 of 14
Qualification Plan Device Package Process No. of Lots
Q20120271 FDD7N60NZTM TT252003 UniFET2 600V Dpak 1

Device Name FDD7N60NZTM

Reliability
Condition Standard Lot No. Q20120271AA
Test
Duration Result/FA
5 Cycles 24
PRECON L1 260’C JESD22-A113 0/154
hrs
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
80% of Rated BV, Tj
HTRB JESD22-A108 1000hrs 0/77
max=150C
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
Delta 100C, 2 min on, 3.5 min MIL-STD-750-
PRCL 10000 cycles 0/77
off 1036
RSDH 260C JESD22-B106 10sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

Qualification Plan Device Package Process No. of Lots

Q20120272 FCP190N60 TT220003 Super-FET2 600V 3

Device
FCP190N60 FCP190N60 FCP190N60
Reliability Name
Condition Standard Lot No. Q20120272AA Q20120272AB Q20120272AC
Test
Duration Result/FA Result/FA Result/FA
100 % Rated
JESD22-
HTGB VGS, Tj 1000hrs 0/77 0/77 0/77
A108
max=150C
80% of Rated
JESD22-
HTRB BV, Tj 1000hrs 0/77 0/77 0/77
A108
max=150C
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85% JESD22-
HAST 96hrs 0/77 0/77 0/77
RH, Vds=42V A110
Delta 100C, 2
MIL-STD- 8572
PRCL min on, 3.5 min 0/77 0/77 0/77
750-1036 cycles
off
JESD22-
RSDH 260C 10 sec 0/30 0/30 0/30
B106
-65 C to 150 C, JESD22- 500
TMCL 0/77 0/77 0/77
30 min/ cycles A104 cycles

10 of 14
Qualification Plan Device Package Process No. of Lots
Q20120273 FCPF190N60 TF22S003 SuperFET2 600V TO220F 1

Device Name FCPF190N60

Reliability Test Condition Standard Lot No. Q20120273AA
Duration Result/FA
HTGB 100 % Rated VGS, Tj max=150C JESD22-A108 1000hrs 0/77
HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
PRCL Delta 100C, 2 min on, 3.5 min off MIL-STD-750-1036 8572 cycles 0/77
RSDH 260C JESD22-B106 10 sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

Qualification Plan Device Package Process No. of Lots

Q20120277 FDD6N50TM TT252002 UniFET1 300-500V/Dpak Ipak 1

Device Name FDD6N50TM

Reliability
Condition Standard Lot No. Q20120277AA
Test
Duration Result/FA
5 Cycles 24
PRECON L1 260’C JESD22-A113 0/154
hrs
100 % Rated VGS, Tj
HTGB JESD22-A108 1000hrs 0/77
max=150C
HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
Delta 100C, 2 min on, 3.5 min MIL-STD-750-
PRCL 10000 cycles 0/77
off 1036
RSDH 260C JESD22-B106 10 sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

11 of 14
Qualification Plan Device Package Process No. of Lots
FCB20N60FTM TT263002 2
Q20130022A SuperFET FR FET
FCH47N60F_F133 TO247003 1

Device
FCB20N60FTM FCB20N60FTM FCH47N60F_F133
Reliability Name
Condition Standard Lot No. Q20130022AA Q20130022AB Q20130022BA
Test
Duration Result/FA Result/FA Result/FA
JESD22- 5 Cycles
PRECON L1 245’C 0/154 0/154 -
A113 24 hrs
100 %
Rated VGS, JESD22-
HTGB 1000hrs 0/77 0/77 0/77
Tj A108
max=150C
80% of
Rated BV, JESD22-
HTRB 1000hrs 0/77 0/77 0/77
Tj A108
max=150C
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85%
JESD22-
HAST RH, 96hrs 0/77 0/77 0/77
A110
Vds=42V
8572
Delta 100C,
MIL-STD- cycles
PRCL 2 min on, 0/77 0/77 0/77
750-1036 5000
3.5 min off
cycles
JESD22-
RSDH 260C 10 sec 0/30 0/30 0/30
B106
-65 C to
JESD22- 500
TMCL 150 C, 30 0/77 0/77 0/77
A104 cycles
min/ cycles

12 of 14
Qualification No. of
Device Package Process
Plan Lots
PDP 4GEN Trench IGBT 330V_360V
Q20130023 FGPF4633TU TF22S003 3
TO220F

Device
FGPF4633TU FGPF4633TU FGPF4633TU
Reliability Name
Condition Standard Lot No. Q20130023AA Q20130023AB Q20130023AC
Test
Duration Result/FA Result/FA Result/FA
100 % Rated
JESD22-
HTGB VGS, Tj 1000hrs 0/77 0/77 0/77
A108
max=150C
80% of Rated
JESD22-
HTRB BV, Tj 1000hrs 0/77 0/77 0/77
A108
max=150C
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85% JESD22-
HAST 96hrs 0/77 0/77 0/77
RH, Vds=42V A110
Delta 100C, 2
MIL-STD- 8572
PRCL min on, 3.5 min 0/77 0/77 0/77
750-1036 cycles
off
JESD22-
RSDH 260C 10 sec 0/30 0/30 0/30
B106
-65 C to 150 C, JESD22- 500
TMCL 0/77 0/77 0/77
30 min/ cycles A104 cycles

Qualification Plan Device Package Process No. of Lots

Q20130024 FCP20N60 TO220003 Super-FET 600V TO220 1

Device Name FCP20N60

Reliability Test Condition Standard Lot No. Q20130024AA
Duration Result/FA
HTGB 100 % Rated VGS, Tj max=150C JESD22-A108 1000hrs 0/77
HTRB 80% of Rated BV, Tj max=150C JESD22-A108 1000hrs 0/77
HTSL 150 C JESD22-A103 1000hrs 0/77
HAST 130 C, 85% RH, Vds=42V JESD22-A110 96hrs 0/77
PRCL Delta 100C, 2 min on, 3.5 min off MIL-STD-750-1036 8572 cycles 0/77
RSDH 260C JESD22-B106 10 sec 0/30
TMCL -65 C to 150 C, 30 min/ cycles JESD22-A104 500 cycles 0/77

13 of 14
Qualification Plan Device Package Process No. of Lots
Q20130020 FGH40N60SMD TO247003 FS IGBT 600V 3

Device
FGH40N60SMD FGH40N60SMD FGH40N60SMD
Reliability Name
Condition Standard Lot No. Q20130020AA Q20130020AB Q20130020AC
Test
Duration Result/FA Result/FA Result/FA
100 % Rated
JESD22-
HTGB VGS, Tj 1000hrs 0/77 0/77 0/77
A108
max=175C
80% of
JESD22-
HTRB Rated BV, Tj 1000hrs 0/77 0/77 0/77
A108
max=175C
JESD22-
HTSL 150 C 1000hrs 0/77 0/77 0/77
A103
130 C, 85%
JESD22-
HAST RH, 96hrs 0/77 0/77 0/77
A110
Vds=42V
Delta 100C,
MIL-STD- 6000
PRCL 5 min on, 5 0/77 0/77 0/77
750-1036 cycles
min off
-65 C to 150
JESD22- 500
TMCL C, 30 min/ 0/77 0/77 0/77
A104 cycles
cycles

14 of 14