IV(M) GAMMA RAY MICROSCOPE

GOPAL HAZARIKA

11/05/2020

Q1. Describe with necessary diagram Heisenberg’s gamma ray microscope experiment to show that
validity of uncertainty principle.

Ans. Let us try to measure both position and momentum of an

electron. In order to do so, we set up a high-powered microscope
with gamma ray.

As the photon from the sources collide with the electrons some of
these bounce into the microscope and enable the observer to see
the flash of light and thus to find out both the position and
momentum of the electron at some instant of time.

(i)Accuracy in determining the position of electron by a

microscope is done by the resolving power of

microscope as follows----
𝜆′
Δ𝑥 = → (1)
2 sin 𝜃
Where,

Δ𝑥 = Minimum distance between two points in the field of view

which can be distinguished as separate.

𝜆′ → Wavelength of the scattered photon and

𝜃 →Semi vertical angle of the cone light coming from the illuminated electron.

To make Δ𝑥 very small, radiation of very small wavelength such as gamma rays should be used.

(ii) In the process of determining the momentum of the electron with gamma ray photon will result in
the change of momentum of the electron because of its recoil.

Suppose at any instant the electron is observed near the point O. It means that at least one photon
coming from light source gets deflected by the electron into the microscope. The scattered photon
enters the objective lens along the path OA or OB. Now the change in momentum of the electron can
be calculated by using Compton effect.
 ℎ𝜈
In fig.2 when a photon of momentum 𝑐
strikes an
electron initially at rest. If the electron is at rest, its
momentum will be zero. The striking photon will
transfer a momentum mv to the electron and gets
scattered in a direction, making an angle 𝜙 with x-
axis. Now if the conservation of momentum is
applied along the x-axis i.e. the momentum, before
strike is same as after strike, then we get
ℎ𝜈 ℎ𝜈 ′
= cos 𝜙 + 𝑚𝑣 cos 𝜓 → (2)
𝑐 𝑐
Fig:2

Now component of momentum along x-axis transferred by the photon to an electron is given as
follows:

px=mvcos 𝜓
ℎ𝜈 ℎ𝜈 ′
=𝑐 − 𝑐
cos 𝜙 𝑓𝑟𝑜𝑚 → (2)
ℎ ′
= 𝑐 (𝜈 − 𝜈 cos 𝜙

As the angle 𝜙 inside the microscope may vary from (90−𝜃) to (90+𝜃)

∴ the uncertainty in momentum is given as

ℎ ℎ
∆𝑝x= 𝑐 [𝜈 − 𝜈 ′ cos(90 + 𝜃)] − 𝑐 [𝜈 − 𝜈 ′ cos(90 − 𝜃)]

ℎ ℎ
= [𝜈 + 𝜈 ′ sin 𝜃] − [𝜈 − 𝜈 ′ sin 𝜃]
𝑐 𝑐
ℎ𝜈 ℎ𝜈 ′ sin 𝜃 ℎ𝜈 ℎ𝜈 ′ sin 𝜃
= + − +
𝑐 𝑐 𝑐 𝑐
2ℎ𝜈 ′ sin 𝜃
=
𝑐
2ℎ
≈ sin 𝜃 → (3)
𝜆′
Equations (1) & (3) are contrary to each other. If we try to improve the measurement of the
electron’s position by decreasing λ and increasing θ, then accuracy in the measurement of
momentum is increased and vice versa. Multiplying equations (1) & (3) we get

∆𝑥∆𝑝 ≈ ℎ → (4)
ħ ħ
But the Planck’s constant h is greater than 2. Therefore, eq. (4) becomes Δ𝑥Δ𝑝𝑥 ≥ 2 .