Sepam 2000 dependability

Sepam 2000 operating diagram

Bus interne
C urrents
acquisition
D isplay unit /
Pow er supply
Keyboard
Voltages
acquisition
Processing U nit C om m unication
O nly S epam 2000
C ircuit breaker "Bay C ontroller"
control I/O
C artridge
(EPR O M )
C ontrol logic
logic I/O
Local control
m im ic diagram
Analog inputs

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 Sepam 2000 self-tests

„ Self-monitoring functions (self-tests) are set in order to

detect internal Sepam internal, leading to unwanted
tripping orders, or to the failure to trip when a network
fault occurs.
„ Self-tests are executed:
† during switching on: complete self-tests of Sepam
† continuously in operation: contextual self-tests of
Sepam
„ If a major failure is detected, the product goes into the fail-
safe position:
† all Sepam applications inhibited
† watchdog relay is locked in fault position (deactivated)
† all the relay outputs are locked in deactivated position
† the «wrench» light is On
† an error message is displayed
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 List of Sepam 2000 self-tests
FAIL-SAFE
FUNCTIONS TYPE OF SELF-TEST WHEN RUN
POSITION

Power supply ß Detection of processor power supply outside tolerance YES

range Continuously
ß Detection of power supply drop YES

Currents acquisition ß Detection of analog channels saturation YES (1)

Continuously
ß Current channels coherency check (2) YES (2)

Voltages acquisition ß Detection of analog channels saturation Periodically YES (1)

Circuit breaker Control ß Output relay power supply check YES

Switching on
Inputs / Outputs ß Inputs / Outputs (I/O) control test YES
and continuously
ß Outputs status test (3) YES

Program Logic ß Output relay power supply check YES

Switching on
logic Inputs / Outputs ß Inputs / Outputs (I/O) control test (3) YES
and continuously
ß Outputs status test (3) YES

Processing Unit Switching on and :

ß Central processor test continuously YES
ß Working memory test periodically YES
ß Signal selector and digitization test continuously YES
ß Measurement acquisition system test continuously YES
ß Test of hardware - cartridge software coherency periodically YES
ß Software Watchdog (limited time allocation to each continuously YES
function)

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 List of Sepam 2000 self-tests
FAIL-SAFE
FUNCTIONS TYPE OF SELF-TEST WHEN RUN
POSITION

Cartridge Switching on and :

ß Cartridge presence test continuously YES
ß Memories test periodically YES
ß Test of number of entries in parameter storage memory continuously NO

Display unit ß Memories test Switching on NO

ß Display unit central processor test and continuously NO

Communication Switching on and :

ß Memories test periodically NO
ß Communication unit central processor test periodically NO
ß Monitoring of dialogue with processing unit continuously NO

Analog Inputs (3) ß Reference channels test (3) NO

Continuously
ß Inputs validity test (3) NO

Local control mimic ß Detection of no selection of a local control mode (3) Switching on YES
diagram (3) ß Validity test of data exchanged with processing unit (3) Continuously NO

(1) Don't move Sepam 2000 "Bay Controller" into fail-safe position
(2) Self-test not carried out in Sepam 2000 "Bay Controller"
(3) Only for Sepam 2000 "Bay Controller"

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 Reliability of Sepam 2000 calculated
according data from the field
„ Assumptions:
†the failure rate stays constant during the life of the Sepam
†MTTF = nb of Sepam in service during the period of observation
nb of failures recorded during the period of observation
†the year of observation is 2001
„ Results
† MTTF from the field : 210 years
† MTTF confidence interval 90%: 189 to 234 years
†failure rate:
† λ = 0,54 x 10–6 failures per hour
† λ = 4,76 x 10–3 failures per year
† λ = 4760 ppm (per year)
„ Please note: factors that aggravate failures are temperature,
humidity, pollution by conductive dust, chemical pollution

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