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Electrical double layer forces. A Monte Carlo study
Lars Guldbrand
Department of Physical Chemistry, Arrhenius Laboratory, S-106 91 Stockholm, Sweden
Bo JOnsson
Division of Physical Chemistry 2, Chemical Center, P. O. Box 740, S-220 07 Lund 7, Sweden
HAkan WennerstrOm and Per Linse
Division of Physical Chemistry 1, Chemical Center, P. O. Box 740, S-220 07 Lund, Sweden
J. Chern. Phys. 80 (5). 1 March 1984 0021-9606/84/052221-08$02.10 © 1984 American Institute of Physics 2221
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2222 Guldbrand sf a/. : Electrical double layer forces
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Guldbrand et al. : Electrical double layer forces 2223
charged surfaces [see Fig. l(c)]. The hard wall prevents ions methods of calculatingposm for a couple of cases. The three
from moving from one half to the other, but it is transparent methods agree within the error limits but it is apparent that
to electrical interactions. The configurational integral Z 2N only the method based on Eq. (5) is numerically satisfactory.
for the total 2N particle system is
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2224 Guldbrand sf a/. : Electrical double layer forces
Posm Posm
(mM) (mM)
RT RT
1500 1000
\
\
1000 •, 500
\
500 \ ~ ~
•
\
\
25 a (A)
•"- ..... Pos m (mM)
I
/
...... .- - -I- T
50
:>
a (A)
-sao II
II
RT
50
v
\
\
.- /1
fl
\O.......\z:::l"~
. . . . 8=$i ..
-500 -1000 .,
II
0
/
15 a
I
-50 I
(A)
I
• 0
FIG. 2. The osmotic pressure as a function of the distance 2a between the
charged surfaces for the lamellar system with monovalent counterions. The
solid curve is the PB results, while the symbols represent the MC values of
the total pressure (e) and the attractive term F:-s/area(.). (T = 0.2244 FIG. 3. As in Fig. 2 but for divalent ions. The insert shows MC results for a
Cm- 2 . series of lower (T values: (T = 0.09 C m - 2 (0), (T = 0.08 C m - 2 (0), and
u= 0.07 C m- 2 (V).
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Guldbrand et al : Electrical double layer forces 2225
Posm
RT (mMl
A (kJ/moll
150
4.0
100
50
-. - 3.5
-50
~
•
". -_.- -- -. - - -=---~:=====I=
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2226 Guldbrand st al. : Electrical double layer forces
(kJ/mol)
® ®
0-
CD +CD CD CD CD CD
I
0-
+
+ +
+
+ I +
+
+ + +
-TS 0
+ + 5 "
I + '0_
+ I
I + + A 0_ -0- - --0
-0 - -0- - --0
+ + +
+
I..
Y
A
Y
I
_e
a a
- e-
FIG. 8. The modified planar model system subdivided into six layers paral-
lel to the walls. The forces across the midplane from interactions between
the different layers are calculated in the simulation to determine where the
attraction is predominantly generated.
-TS'
-TS" e--
e-
.--. - -.-----
15
.
between the different slices was computed in the simulation.
The result is summarized in Table II. Counted per charge,
the most important contribution to the force comes from the
parts of the subsystem that is closest to the central wall.
When 0' is increased as in Fig. 5 there is a depletion of ions in
the center 13 reducing the repulsive term but also reducing
the attractive component as indicated by Table II.
FIG. 9. Different contributions to the Helmholtz free energy A (0) for mon-
B. Ion-Ion correlations and the Poisson-Boltzmann ovalent counterions and different wall-wall separations. The entropy term
-TS' (e) arises from the nonuniformity of the one particle distribution, while
approximation -TS" (.) contains the correlation effects. The total entropy term ·TS (0)
In the preceding subsection the correlations between includes an ideal entropy of mixing.
the two halves of the lamellar system were discussed. In the
PB approximation all ion-ion correlations are neglected, 6
In the simulations, contributions from the particle correla-
which means that not only is the attractive force between the
tions also appear leading to a decrease in the entropy. The
two subsystems left out but there also appears errors in the
magnitude of the effect is illustrated in Figs. 9 and 10 for
ion distribution within the subsystems. We have previously
monovalent and divalent ions, respectively. As seen the con-
argued that when the ion-ion correlations are properly con-
tribution from the one particle density dominates but the
sidered this should lead to a contraction of the ion cloud. The
correlations become more important for divalent ions (cf.
present simulations give yet another illustration of this ef-
Ref. 10).
fect, and it is clear that the correlations are more important
The free energy can be determined formally from the
for divalent ions than for monovalent ones. Yet another as-
logarithm of the configuration integral Z 2N [cf. Eq. (4)]. A
pect of the ion correlation can be obtained from the free
dimensionless length scale can be introduced by the transfor-
energy calculations. In the PB approximation the entropy
mation
(considering the dielectric permittivity as temperature inde-
pendent) is determined from the (one) particle density only. x' = kTErEoXlz2e2
TABLE II. The components of the attractive force from the interactions between the ions in the different layers of the subdivided system in Fig. 8 in units of
mM. [.f; = F"/(area·R T)]. The correlation effects are seen in the difference.d.f; between the MC values and the mean field (MF) values using the one particle
distributions from the simulations. A measure of the relative importance of the effect counted per charge is given by.d .f;lC. C/, where C. and C/ are the mean
ion concentrations oflayers k and I, respectively. The total attractive force term from the simulation is F~Bl(area·RT) = 36.7 ± 1.5 mM.
Component
MC MF
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Gulclbrand et al. : Electrical double layer forces 2227
(kJ/mol) for small values ofSl (small separations). If on the other hand
S2 is sufficiently large, there is a qualitative error in the PB
treatment and instead of a repulsion there is an attraction for
small separations. As shown in the insert in Fig. 3 a systema-
tic lowering of S2 leads to a gradual transition to the qualita-
tive behavior of Fig. 2. Of particular interest are the results
for u::::;O.08 C m- 2 showing a nonmonotomic change in
Posm' In a lamellar system with such a behavior of Posm one
5 -TS [J- - [ J - - - -[J- - - -
.....
...-i expects a phase separation with two lamellar phases with
...... different repeat distances .
In Figs. 4 and 5 the value of Sl is kept constant and S2 is
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2228 Guldbrand et al. : Electrical double layer forces
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