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Introduction to
Crystallography
1
2. Fundamental characteristics of crystal
•Anisotropy
2150 g/mm2
Conductivity
1150 g/mm2
2
•Definite sharp melting points 7.1.2 The lattice and unit cell
• Lattice:
T
• A periodic pattern of points in space, such
that each lattice point has identical
t surroundings.
• Can be reproduced by translational
• Symmetry motion along the vector between any two
points.
•X-ray diffraction by crystals
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b. Lattice and its unit in 2D:
T = ma + nb m, n = 0,±1, ± 2 …)
Lattice:
•A periodic pattern of points in space, such that
each lattice point has identical surroundings.
•Can be reproduced by translational motion
•Crystal structure = lattice + structural motif along the vector between any two points.
(basis)
b
a
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Unit Cell Choice
Five 2D lattices
c. Lattices and its unit in 3D:
T = ma + nb + pc (m, n, p = 0, ±1, ± 2, …)
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Unit Cell: Have maximum symmetry and minimum size
1) The axial system should be right handed
2) The basis vectors should coincide as much as possible
c
with directions of highest symmetry
3) Should be the smallest volume that satisfies condition 2
α
4) Of all lattice vectors none is shorter than a
β
a
γ
b 5) Of those not directed along a none is shorter than b
c
7) The three angles between the basis vectors a,b,c are either
all acute or obtuse
Example:
Atomic Coordinates: Fractional coordinates
Cubic unit cell of CsCl,
Fractional coordinates: a=b=c
The positions of atoms inside a α=β=γ=90°
unit cell are specified using 0.5 Cs:(0,0,0)
fractional coordinates(x,y,z). i
These coordinates specify the Cl: (1/2,1/2,1/2)
position as fractions of the unit 0.6
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7.1.3 crystal systems and Bravais Lattices Trigonal 3-fold rotation Rhombohedr D3d
axes al
a. crystal systems a=b=c
α=β=γ<120°
≠90°
Hexagonal D6h
a=b≠c
α=β=90°
γ=120°
Crystal Characteristic Unit cell Choice of axis Lattic Tetragonal 4-fold rotation a=b≠c c // 4-fold axis D4h
systems symmetry parameters Point axes α=β=γ=90°
elements Group Hexagonal 6-fold rotation a=b≠c c // 6-fold axis D6h
Triclinic Nil a≠b≠c Ci axes α=β=90°
α≠β≠γ γ=120°
Monoclinic b // 2-fold axis C2h Cubic Four 3-fold a=b=c Four 3-fold axes Oh
a≠b≠c
rotation axes α=β=γ=90° are parallel to
α=γ=90°≠β the four body
Orthorhombic a≠b≠c a, b, c // 2-fold D2h diagonals of the
α=β=γ=90° axes cube
Orthorhombic
Hexagonal
Monoclinic
Cubic
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Monoclinic Tetragonal
I =C C=P
Monoclinic F = C
a=b=c
α≠ β ≠ γ ≠ 0
P – Rhombohedral
R ( Primitive )
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a.Primitive rhomohedral- b.primitive hexagonal
r-centered hexagonal Bravais Lattices
r-centered rhombohedral
Body-centered orthohombic
( 10)
( 20)
(210)
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Examples of Miller indices hexagonal, four axis (a1,a2,a3,c) (hkil), i=-(h+k)
(110) (1 1 0) (0001) c
c
c a3 90 90
( 1 2 1 0)
b (1 1 00) 120 a2
(111) 120
a b a1
c
(100) a
(10 1 1)
(010) b
c
a
a origin
hexagonal, four axis (a1,a2,-(a1+a2),c)
b [110]
[210]
a [100] b
[1 2 0]
[1 2 0]
a
(111)
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Miller indices (hkl) are used specify the orientation and
d. d-spacing formulae
spacing of a family of planes.
{hkl} are used to specify all symmetry The spacing between adjacent planes in a family is
equivalent sets of planes referred to as a “d-spacing”
Edge dislocation
Screw Dislocation
• Formed by shear stress
• Also linear and along a
dislocation line
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¾ Crystallographers make use of all the symmetry in a
crystal to minimize the number of independent
coordinates
12
The symmetry elements of a cube
Packing objects in 3D space
¾Certain point symmetry Twofold axis
elements are not possible if a Threefold axis
possible an object is to have Fourfold axis
translation symmetry as well
¾For 3D periodicity
--rotation axes, 1,2,3,4,6 only!! 2 3 4 6
--not 5,7,8 etc.. Rotation axis
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c.Screw axes and glide planes: Higher order screw axes
A two fold scew 21
Helical
structure
Screw 32
The direction of such an axis is usually along a unit cell edge, and the Screw 31
translation must be a subintegral fraction of the unit translation in that direction.
Zig-zag structure
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Symbols for symmetry elements 1 Symbols for symmetry elements 2
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Combining symmetry elements
When a crystal possesses more than one of the above 7.2.3 The description and application of crystal structure
symmetry elements, these macroscopic symmetry
Example 1. Crystal of iodine
elements must all pass through a common point. There
are 32 possible combinations of the above symmetry Crystal System orthorhombic
elements that pass through a point and these are the 32
Space group D182h-Cmca
crystallographic point groups.
Cell parameters a=713.6 pm b= 468.6 pm c = 987.4 pm
Number of molecules per unit cell Z = 4
32 point groups
Atomic coordinate for I x y z
14 Bravais lattices
0 0.15434 0.11741
7 Crystal systems
but only 230 space groups
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X-rays produced by electronic transition between
7.3.1 The source and property of X-ray atomic energy levels
High energy
electron beam
M
L L
radiation
X-ray tube
the wavelengths of X-ray are in the range
K
As for Cu:
of 100-0.01Å
• 1-0.01Å: hard x-ray e Kα1=1.540594Å
• 100 1Å soft x-ray 1.54056Å
• 2.5-0.5Å: used in crystal structure
analysis Kα2=1.544422Å
e
• 1-0.05Å: used in medical perspective,
detection of materials wound IKα1 ≈ 2IKα2
Kα1
Kα2
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SPring-8, at Osaka, Japan. www.spring8.or.jp
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ESRF - European Synchrotron Radiation Facility , Polygone The Advanced Photon Source (APS) at Argonne National
Scientifique Louis Néel - 6, rue Jules Horowitz - 38000 Grenoble Laboratory, http://www.aps.anl.gov/aps.php
- France , http://www.esrf.fr
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2. The Bragg’s Law
Expanded to 3D lattice In the diffraction direction, the
difference between the incident Bragg discovered that you could consider the
a·(s-s0) = a(cosα-cosα0) = hλ and the diffracted beam through diffraction to have arisen from reflection from
any two lattice points must be lattice planes
b·(s-s0) = b(cosβ-cosβ0) = kλ an integral number of s0 s
wavelengths. ∆=AD+DB = 2d(hkl)sinθn
c·(s-s0) = c(cosγ-cosγ0) = lλ
The vector form (000) to (mnp): Condition for diffraction: θ O θ
Tmnp = ma + nb +pc dhkl
2d(hkl) sinθn = nλ (n=1, 2, 3, … ) A B
D
where,
The differences in wavelengths: θn: the angle of reflection
∆ =Tmnp · (s-s0) n: the order of the reflection
a,b,c—lattice parameter
=(ma + nb +pc) ·(s-s0) 2⋅dnhnknl⋅sinθnh,nk,nl=λ
α0,β0,γ0—angle which a makes with s0 (dnhnknl = dhkl/n)
α,β,γ —angle which a makes with s = ma ·(s-s0)+nb ·(s-s0)+pc ·(s-s0)
Reformulated Laue equations:
h,k,l — indices of diffraction, integers =mhλ+ nkλ+plλ
2dhkl ⋅sinθ = λ
=(mh+nk+pl)λ
hkl — reflection indices
3. Reciprocal lattice
diffraction v v v v
crystal planes - v* b × c v cv × av v* a × b
a = b* = c =
Vv V V
(100), (200), … v v v v
(100) (200) (300) r * = ha * + kb * + lc * r * = 1 / d hkl
Families of planes 102 112
101
Lattice plane 111
100 110
directions-(100) (100)
a* 001
c*
b*
000 010
r*
(200)
1 22
1 01 1 11
1 00 1 10
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7.3.3. The intensity of diffraction beam
G QR
r
S 1/dhkl s-s0 r P s
θ 2θ s0 O
A S0 O1 1/λ O
For elastic scattering, each electrons scatters the plane wave
causing a spherical wave (exp2πi(k⋅r)).
The phase difference is: ∆=(r•s - r•so)/
The scattered x-ray: exp2πi[r⋅(s-s0)/λ] or exp2πi[r⋅q/λ]
The contribution of the scattering of all electrons: Supposed that there are N1 N2 N3 periods along a
b c, and all the atoms locate on the position of lattice
points, F(q) can be replace with a constant ‘f’. f is
∫ ρ (r ) exp(2πiq ⋅ r / λ )d
3
r Rn scattering factor of atoms.
For the crystal structure N1 −1 N 2 −1 N 3 −1
ρ (r ) = ∑ ρ cell (r + Rn ) b Amnp = f ∑ ∑ ∑e 2 πi / λ ( n1a + n2 b + n3c )⋅q
n c
n1 = 0 n2 = 0 n3 = 0
A = ∑ ∫ ρ cell (r + Rn ) exp(2πiq ⋅ r / λ )d r 3 a
n
For the case of 1D and f=1,
A= (∫ ρ )
( r ) exp( 2πiq ⋅ r / λ )d r ∑ exp( 2πiq ⋅ Rn / λ )
3
1 − e 2πiNa ⋅q / λ
cell
N −1
AN = ∑ e
n
2πina ⋅q / λ
= F ( q)∑ exp( 2πiq ⋅ Rn / λ ) =
n
n =0 1 − e 2πia⋅q / λ
F(q) --- structure factor
F ( q) = ∫ ρ cell ( r ) exp(2πiq ⋅ r / λ )d 3 r
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The intensity: In the case of 3-D:
πN
sin 2 a ⋅q πN πN πN
λ = sin (πNh )
2
2 sin 2 1 a ⋅ q sin 2 2 b ⋅ q sin 2 3 c ⋅ q
I ∝ AN = AN AN* = λ λ λ
sin 2 (πh ) I ∝ Amnp = f
2 2
π ⋅ ⋅
sin 2 a ⋅ q 2 π 2 π 2 π
λ sin a ⋅ q sin b ⋅ q sin c ⋅ q
λ λ λ
30 |A|2(N=5) 250 |A|2(N=15) Therefore,
200 a⋅S/λ=h b⋅S/λ=k c⋅S/λ=l (h k l should be integer)
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150
or a⋅S=hλ b⋅S=kλ c⋅S=lλ
100
10
50 ----- Laue conditions
0 h 0 h
2 2
-1.0 -0.6 -0.2 0.2 0.6 1.0 -1.0 -0.6 -0.2 0.2 0.6 1.0
I ∝ f N 12 N 22 N 32 I ∝ Fhkl N12 N 22 N 32
j =1
The directions of the diffraction beams are determined
by the cell parameters systematic absence
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Example II. Unit cell has a 21 screw axis along the c axis at
x=y=0 systematic absence
Equivalent position (x,y,z) and ( -x , -y , z+1/2)
Crystal structure which contain centering, glide plane
and screw axis will have systematic absences.
N /2
fjexp2πi[(h x+k y +l(zj+1/2)]
N /2
Fhkl = ∑ fjexp[2πi(hxj+kyj+lzj)]+ ∑ Namely, some reflections will be systematically absent
j =1 j =1
N /2
∑
N /2
F00l= ∑j =1
fjexp2πi (lzj)]+
j =1
fjexp2πi l(zj+1/2)
N /2
= ∑j =1
fjexp2πI (lzj)](1+ exp2πi ·l/2) (x,y,z)
N /2
2 ∑ fjexp2πi (lzj)] (l=2n)
= j =1
0 (l=2n+1)
(x , y , z+1/2)
systematic absence
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Radiation sources
* Powder diffraction Monochromator – e.g.HOPG
X-ray tubes
Monochromatic X-ray Diffraction beam Synchrotron radiation Filter – e.g. Ni for CuKα
poder
2θ Detectors
Incident beam 2θ •Film
- poor sensitivity, high background, low dynamic range
•Scintillation counters
- good sensitivity, low background, high dynamic range
P •Imaging plates
- good sensitivity, low background, good dynamic range, very
Diffraction beam
efficient data collection
Incident beam 2θ
θ
O •CCDs and Multiwire detectors
sample R - fast readout, good sensitivity, low background, good dynamic range,
very efficient data collection
Powder Diffractometer
sin 2 θ = (λ / 2a ) 2 (h 2 + k 2 + l 2 )
Intensity data
sin 2 θ ∝ h 2 + k 2 + l 2 sin 2 θ1 : sin 2 θ 2 : sin 2 θ 31 : sin 2 θ 41 :
collection
Characteristic line sequence in cubic system:
Indexing Crystal system
and Cell P: (hkl) 100, 110, 111, 200, 210, 211, 220, 221, 222, 300, ….
2 parameters
I hkl = K Fhkl h2 k2 l2 ) 1, 2, 3, 4, 5, 6, 8, 9, 10, 11, 12, 13, …
I: (hkl) 100, 110, 111, 200, 210, 211, 220, 221, 222, 300, ….
Phase problem
F ( hkl ) = ∫ ∫ ∫ ρ ( x, y , z )e 2πi ( hx +ky +lz ) dxdydz h2 k2 l2 ) 2, 4, 6, 8, 10, 12, 14, 16 … Æ(1: 2: 3: 4: 5: 6: 7: 8:…)
P: (hkl) 100, 110, 111, 200, 210, 211, 220, 221, 222, 300, ….
ρ ( x, y , z ) = V −1 ∑∑∑ F ( hkl )e −2πi ( hx +ky +lz ) h2 k2 l2 ) 3, 4, 8, 11, 12, 16, 19, 20 …
h k l
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Automated diffractometer method Example for the indexing of cubic system and its applications
Sample: NaCl
Condition: Cu Kα, λ=1.5418Å, R=50mm
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Index cubic pattern and calculation lattice parameter
Line 2θ θ sin2θ sin2θi h2+k2+l2 hkl
b. Applications of powder diffractions
/sin2θ1
1 40.26 20.13 0.1184 1 2 110
Information contained in a Diffraction Pattern
2 28.26 29.13 0.2370 2 4 200
Qualitative Analysis h
λ
2meV
Quantitative Analysis
Lattice Parameter Determination
100 kV ---- 0.00370 nm
Crystallite size / size distribution & Lattice Distortion
Analysis (Non-uniform microstrain)
Crystallinity Analysis a) TEM image of the tip part of one TeO2 nanorod.
(b)Enlarged TEM image. (c) The corresponding
2. Neutron Diffraction electron diffraction pattern.
Residue Stress Analysis
----- Scatterring of atomic nuclear
Structure Solution and Refinement
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