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When a crystal is bombarded with X-rays of a fixed wavelength (similar to spacing of the atomic-scale crystal lattice planes)
and at certain incident angles, intense reflected X-rays are produced when the wavelengths of the scattered X-rays interfere
constructively. In order for the waves to interfere constructively, the differences in the travel path must be equal to integer
multiples of the wavelength. When this constructive interference occurs, a diffracted beam of X-rays will leave the crystal at
an angle equal to that of the incident beam.
n λ = 2d sinΘ
where n (an integer) is the "order" of reflection, λ Figure 1. Bragg's Law reflection. The diffracted X-rays exhibit
is the wavelength of the incident X-rays, d is the constructive interference when the distance between paths ABC and
A'B'C' differs by an integer number of wavelengths (λ).
interplanar spacing of the crystal and Θ is the
angle of incidence.
In X-ray diffraction (XRD) the interplanar spacing (d-spacing) of a crystal is used for identification and characterization
purposes. In this case, the wavelength of the incident X-ray is known and measurement is made of the incident angle
(Θ) at which constructive interference occurs. Solving Bragg's Equation gives the d-spacing between the crystal lattice
planes of atoms that produce the constructive interference. A given unknown crystal is expected to have many rational
planes of atoms in its structure; therefore, the collection of "reflections" of all the planes can be used to uniquely
identify an unknown crystal. In general, crystals with high symmetry (e.g. isometric system) tend to have relatively few
atomic planes, whereas crystals with low symmetry (in the triclinic or monoclinic systems) tend to have a large number
of possible atomic planes in their structures.
In the case of wavelength dispersive spectrometry (WDS) or X-ray fluorescence spectroscopy (XRF), crystals of known d-
spacings are used as analyzing crystals in the spectrometer. Because the position of the sample and the detector is fixed
in these applications, the angular position of the reflecting crystal is changed in accordance with Bragg's Law so that a
particular wavelength of interest can be directed to a detector for quantitative analysis. Every element in the Periodic
Table has a discrete energy difference between the orbital "shells" (e.g. K, L, M), such that every element will produce X-
rays of a fixed wavelength. Therefore, by using a spectrometer crystal (with fixed d-spacing of the crystal) and
positioning the crystal at a unique and fixed angle (Θ), it is possible to detect and quantify elements of interest based on
the characteristic X-ray wavelengths produced by each element.
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